49th Annual (2000) DXC > Monday Poster Sessions (July 31)
XRD Poster Session I, Monday, 31 July (Evergreen Ballroom)
(6:30 p.m. – 8:30 p.m., authors present)The XRD Poster Session will be held in conjunction with the Philips Analytical mixer.
Session chairs will select the two best papers for awards.
Chairs: T.C. Huang Emeritus, IBM Almaden Research Center, San Jose, CA R.L. Snyder The Ohio State University, Columbus, OH ICDD Grant-in-Aid Program, Standard Reference Materials
D-001 ICDD GRANT-IN-AID PROGRAM T. Kahmer, R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA
D-082 STANDARD REFERENCE MATERIAL (SRM 1990) FOR SINGLE CRYSTAL DIFFRACTOMETER ALIGNMENT W. Wong-Ng, J. Armstrong, M. Levenson, L.P. Cook, National Institute of Standards and Technology, Gaithersburg, MD T. Siegrist, Lund University, Sweden
G. DeTitta, Hauptman-Woodward Medical Research Institute, Buffalo, NY
L. Finger, Geophysical Laboratory, Washington, DC
H. Evans, U.S. Geological Survey, Reston, VA
E. Gabe, G. Enright, SIMS, Ottawa, Canada
C.R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN
Structure Investigations
D-024 NEUTRON VERIFICATION OF X-RAY DERIVED THERMAL PARAMETERS IN Ni SUBSTITUTED CuAuI ALLOYS R. Kumar, East Carolina University, Greenville, NC W.B. Yelon, University of Missouri Research Reactor
D-015 PREDICTION OF THE CRYSTAL STRUCTURE OF BINARY AND TERNARY INORGANIC COMPOUNDS USING SYMMETRY RESTRICTIONS AND POWDER DIFFRACTION DATA L. Reinaudi, P. Serra, E.P.M. Leiva, R.E. Carbonio, Universidad Nacional de Córdoba, Córdoba, Argentina
D-010 A CONTINUOUS ELECTRON DENSITY APPROACH IN RIETVELD ANALYSIS FOR STRUCTURE INVESTIGATIONS OF THE MESOPOROUS SILICATE MATERIALS L.A. Solovyov, S.D. Kirik, Institute of Chemistry and Chemical Engineering, Krasnoyarsk,Russia A.N. Shmakov, V.N. Romannikov, Boreskov Institute of Catalysis, Novosibirsk, Russia
D-009 MESOPOROS SILICATE MATERIALS: LOOK INSIDE WITH HELP OF X-RAY DIFFRACTION S.D. Kirik, L.A. Solovyov, Institute of Chemistry and Chemical Engineering, Krasnoyarsk, Russia V.N. Romannikov, A.N. Shmakov, Boreskov Institute of Catalysis, Novosibirsk, Russia
D-008 IN SITU X-RAY DIFFRACTION STUDIES OF YbCo THICK FILM CRYSTALLIZATION A. Puig-Molina, H. Graafsma, European Synchrotron Radiation Facility, ESRF, Grenoble, France T. Puig, S. Piñol, X. Obradors, Institut de Ciencia de Materials de Barcelona, Bellaterra, Spain
D-032 CHARACTERISTICS OF THE CRYSTAL STRUCTURE AND MICROSTRUCTURE OF THE MgNb2O6 and PbMg1/3Nb2/3O3 PREPARED VIA CHEMICAL ROUTES C.O. Paiva-Santos, A.A. Cavalheiro, M.A. Zaghete, M. Cilense, J.A. Varela, UNESP.Araraquara, SP Brazil M.T. Silva Giotto, UFSCar. São Carlos, SP Brazil
Y.P. Mascarenhas, USP. São Carlos, SP Brazil
D-056 X-RAY MICRODIFFRACTION ON A SMALL PIECE OF SKIN OF THE WORLD-FAMOUS "OETZI" (TYROLEAN MUMMIFIED GLACIERMAN) BY USING THE D8 DISCOVER WITH GADDS J. Brechbuehl, A. Kern, H. Jakob, Bruker AXS GmbH, Karlsruhe, Germany R. Tessadri, University of Innsbruck, Innsbruck, Austria
C-3 QUANTIFICATION OF CLINKER AND CEMENT PHASES WITH THE HIGHEST SPEED AND ACCURACY USING XRD A. Kern, Bruker AXS GmbH, Karlsruhe, Germany
D-123 CRYSTAL STRUCTURE OF A NEW POLYMORPH OF SULFABENZAMIDE J.A. Kaduk, INEOS Technologies, Inc. , Naperville, IL S.J. Maginn, J. Cole, Cambridge Crystallographic Data Centre, Cambridge, United Kingdom
K.M. Shankland, CLRC Rutherford Appleton Laboratory, Oxon, United Kingdom
XRD Instrumentation,Texture
D-002 NON-TRADITIONAL EQUIPMENT FOR THE MEASUREMENT OF POWDER PATTERNS J. Faber, G. Grosse, S. Kabekkodu, R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA
D-003 TRADITIONAL EQUIPMENT FOR THE MEASUREMENT OF POWDER PATTERNS R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA
D-085 SHUTTER FAILURE RADIATION MONITOR SAFETY SYSTEM C.R. Hubbard, T.R. Watkins, G.K. Schulze, Oak Ridge National Laboratory, Oak Ridge, TN
D-022 ANGLE MEASURING DEVICE FOR X-RAY COMPORATOR I.A. Brytov, G.D. Dmitriev, V.N. Ivanov, Bourevestnik, Inc., St. Petersburg, Russia
D-066 COMPLETE POLE FIGURE MEASUREMENT BY ONLY BACK REFLECTION METHOD USING IMAGING PLATE AND APPLICATION TO THREE DIMENSIONAL ANALYSIS OF TEXTURE T. Goto, T. Kondoh, Aichi Institute of Technology, Toyota, Japan H. Hirose, Kinjyo College, Mattou, Japan
T. Sasaki, Kanazawa University, Kanazawa, Japan
D-096 QUANTITATIVE TEXTURE ANALYSIS WITH AN AREA DETECTOR K.J. Kozaczek, R.I. Martin, P.R. Moran, D.S. Kurtz, HyperNex, Inc., State College, PA High-Temperature and Non-Ambient Applications
D-083 PHASE TRANSITION AND DEHYDRATION BEHAVIOR OF ALPHA, ALPHA-TREHALOSE DIHYDRATE MEASURED BY XRD-DSC S. Munekawa, A. Kishi, M. Shiro, Rigaku Corporation, Tokyo, Japan
D-049 HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES OF PHASE FORMATION IN PORCELAINS D.I. Seymour, W.M. Carty, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY
D-048 USING RELATIVE THERMAL EXPANSION AS A TEMPERATURE CALIBRATION METHOD FOR HTXRD A.R. Drews, Ford Research Laboratories, Dearborn, MI
D-126 HIGH TEMPERATURE POWDER DIFFRACTION STUDY OF PHASE TRANSFORMATIONS IN THE BISMUTH CALCIUM OXIDE SYSTEM A. Payzant, S. Nunn, W. Porter, R. Peascoe, Oak Ridge National Laboratory, Oak Ridge, TN Applications, Miscellaneous
D-036 CHARACTERIZATION OF A COMBINATORIAL EPITAXIAL THIN-FILM LIBRARY USING A CONVERGENT-BEAM X-RAY DIFFRACTION SYSTEM T. Kikuchi, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan M. Kawasaki, A. Ohtomo, M. Ohtani, T. Ohnishi, D. Komiyama, H. Koinuma, Tokyo Institute of Technology, Yokohama, Japan
D-098 RIETVELD ANALYSIS IN QUANTIFICATION OF METASTABLE POLYMORPHS OF ALUMINA M. Shumsky, D. Winter, Rigaku/USA, Inc., The Woodlands, TX
D-124 ADVENTURES IN CORROSION DEPOSITS J.A. Kaduk, INEOS Technologies, Inc. , Naperville, IL
D-120 ACTIVITIES OF THE ICDD EDUCATION SUBCOMMITTEE S. Quick, Chair of the ICDD Education Subcommittee, The Pennsylvania State University, University Park, PA
D-121 ICDD ACTIVITY IN RUSSIA E. Antipov, ICDD Regional co-Chair, Moscow State University, Moscow, Russia
D-122 POLYMER DIFFRACTION AT ICDD S. Murthy, Chair of the ICDD Polymer Subcommittee, Allied Signal, Inc., Morristown, NJ
