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49th
Annual (2000) DXC > Tuesday Poster Sessions (August 1)
XRD Poster Session I, Tuesday, 1 August (Evergreen
Ballroom)
6:30 p.m. – 8:30 p.m., authors present
The XRD Poster Session II will be held in
conjunction with the MDI and Rigaku/USA mixer.
Session chairs will select the two best papers for awards.
| Chairs: |
B.H. O’Connor
|
Curtin
University of Technology, Perth, Australia |
|
P.K.
Predecki
|
The
University of Denver, Denver, CO |
Strain and Stress
Analysis
| D-064 |
FUNDAMENTAL
EXPERIMENT ON NEUTRON STRESS MEASUREMENT USING NEUTRON
IMAGE PLATE |
|
T.
Sasaki, Y. Hirose, Kanazawa
University, Kanazawa, Japan
N. Minakawa, Y. Morii, N. Niimura, Japan
Atomic Energy Research Institute, Ibaraki-ken, Japan |
| D-033 |
THE
DEVELOPMENT OF MEASUREMENT TECHNIQUE FOR THE UNSTRESSED VALUE BY NEUTRON
DIFFRACTION METHOD |
|
N. Minakawa, Y.
Morii, Japan
Atomic Energy Research Institute, Ibaraki, Japan
T. Saito, T. Sasaki, Y. Hirose, Kanazawa
University, Kanazawa, Japan |
| D-034 |
NON-DESTRUCTIVE
MEASUREMENT OF RESIDUAL STRESS VERSUS DEPTH USING SYNCHROTRON
RADIATION |
|
R.D.
England, Cummins
Engine Company, Columbus, IN
T.R. Watkins, Oak
Ridge National Laboratory, Oak Ridge, TN
N. Jayaraman, University
of Cincinnati, Cincinnati, OH |
| D-042 |
ANALYSIS
OF RESIDUAL STRESS STATE IN SPEED GEARS FOR AUTOMOTIVE VEHICLES |
|
T. Gurova, J.R. Teodósio,
Universidade
Federal do Rio de Janeiro, Rio de Janeiro, Brasil
V. Monine, Instituto
Politécnico do Rio de Janeiro, Nova Friburgo, Brasil |
| D-021 |
MICROSTRAIN
ANALYSIS WITH SUB-m DEPTH RESOLUTION IN SURFACE NITRIDED
STAINLESS STEEL |
|
S. Grigull, Å.
Kvick, European
Synchrotron Radiation Facility, Grenoble, France
S. Parascandola, Institut
für Ionenstrahlphysik und Materialforschung, Dresden, Germany |
| D-062 |
STUDY
ON EVALUATION OF RESIDUAL PHASE STRESS OF THE DUAL PHASE STAINLESS STEEL |
|
H.
Hirose, Kinjo
Junior College, Matto, Japan
H. Hashi, T. Sasaki, Kanazawa
University, Kanazawa, Japan |
| D-063 |
STUDY
ON FRACTURE ANALYSIS OF (+)
DUAL PHASE STAINLESS STEEL USING X-RAY
DIFFRACTION |
|
H.
Hirose, Kinjo
Junior College, Matto, Japan
T. Hamagami, T. Sasaki, Kanazawa
University, Kanazawa, Japan |
| D-069 |
EFFECT
OF X-RAY RESIDUAL STRESS IN SHOT-PEENED STAINLESS STEELS |
|
S.
Takahashi, T. Murotani, Y. Hirose, Kanazawa
University, Kanazawa, Japan
M. Hashimoto, Sumitomo
Heavy Industries, LTD., Aichi, Japan |
| D-060 |
A
NEUTRON DIFFRACTION STUDY OF RESIDUAL STRAINS IN TWO MMC
SYSTEMS; Ti/SiC
AND W/Fe |
|
P. Rangaswamy, H. Choo, M.A.M. Bourke,
Los
Alamos National Laboratory, Los Alamos,
NM
A. Saigal, Tufts
University, Medford, MA |
| D-068 |
MEASUREMENT
OF RESIDUAL PHASE STRESS OF THE METAL MATRIX COMPOSITE MATERIAL
USING SYNCHROTRON RADIATION |
|
S. Takago, T. Sasaki, Y. Hirose,
Kanazawa
University, Kanazawa, Japan
K. Akita, Tokyo
Metropolitan University, Tokyo, Japan
Y. Yoshioka, Musashi
Institute of Technology, Tokyo, Japan |
| D-071 |
FABRICATION
AND EVALUATION OF RESIDUAL STRESS FOR DISKSHAPED SYM-METRIC FUNCTIONALLY GRADED
MATERIALS OF Ni/Al2O3
SYSTEM |
|
K.
Kikuchi, Y.-S. Kang, A. Kawasaki, Tohoku
University, Sendai, Japan
T. Sasaki, Kanazawa
University, Kanazawa, Japan |
| D-065 |
X-RAY
STRESS DETERMINATION OF COLD-ROLLED STEEL SHEET USING ORIENTATION
DISTRIBUTION FUNCTION |
|
S. Ejiri, Y. Shirasuna,
Seisen
Jogakuin College, Nagano, Japan
T. Sasaki, Y. Hirose, Kanazawa
University, Kanazawa, Japan
H. Inoue, University
of Osaka Prefecture, Osaka, Japan |
| D-067 |
COMPOSITION
DEPENDENCE OF X-RAY ELASTIC CONSTANT OF TITANIUM ALUMINIDE
INTERMETALLIC COMPOUND |
|
T. Kondoh, T. Goto, Aichi
Institute of Technology, Toyota, Japan
T. Sasaki, Y. Hirose, Kanazawa
University, Kanazawa, Japan |
| D-070 |
X-RAY
ELASTIC CONSTANTS AND MECHANICAL ELASTIC CONSTANTS OF POLYCRYSTALLINE
MATERIALS WITH ARBITRARY CRYSTAL STRUCTURES |
|
Z.
Lin, J. He, T. Sasaki, Y. Hirose, Kanazawa
University, Kanazawa, Japan |
X-ray
Reflectometry
| D-076 |
APPLICATION
OF GIXR TO SOME INDUSTRIAL MATERIALS |
|
H.J.
Holland, Corning
Inc., Corning, NY |
| D-023 |
THE
USE OF X-RAY REFLECTOMETRY FOR SINGLE FILM THICKNESS ANALYSIS IN GMR MULTILAYER
STACKS |
|
C. Schug, B. York, J. Marien, H.-R. Blank,
IBM
Storage Technology Division |
|