49th Annual (2000) Denver X-ray Conference™
Denver Marriott Tech Center Hotel
Denver, Colorado, U.S.A.
July 31 - August 4

49th Annual (2000) DXC > Tuesday Poster Sessions (August 1)

XRD Poster Session I, Tuesday, 1 August (Evergreen Ballroom)
6:30 p.m. – 8:30 p.m., authors present

The XRD Poster Session II will be held in conjunction with the MDI and Rigaku/USA mixer.
Session chairs will select the two best papers for awards.

 

Chairs: B.H. O’Connor Curtin University of Technology, Perth, Australia
P.K. Predecki The University of Denver, Denver, CO

Strain and Stress Analysis

D-064 FUNDAMENTAL EXPERIMENT ON NEUTRON STRESS MEASUREMENT USING NEUTRON IMAGE PLATE
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

N. Minakawa, Y. Morii, N. Niimura, Japan Atomic Energy Research Institute, Ibaraki-ken, Japan

 

D-033 THE DEVELOPMENT OF MEASUREMENT TECHNIQUE FOR THE UNSTRESSED VALUE BY NEUTRON DIFFRACTION METHOD
N. Minakawa, Y. Morii, Japan Atomic Energy Research Institute, Ibaraki, Japan

T. Saito, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

 

D-034 NON-DESTRUCTIVE MEASUREMENT OF RESIDUAL STRESS VERSUS DEPTH USING SYNCHROTRON RADIATION
R.D. England, Cummins Engine Company, Columbus, IN

T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN

N. Jayaraman, University of Cincinnati, Cincinnati, OH

 

D-042 ANALYSIS OF RESIDUAL STRESS STATE IN SPEED GEARS FOR AUTOMOTIVE VEHICLES
T. Gurova, J.R. Teodósio, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brasil

V. Monine, Instituto Politécnico do Rio de Janeiro, Nova Friburgo, Brasil

 

D-021 MICROSTRAIN ANALYSIS WITH SUB-m DEPTH RESOLUTION IN SURFACE NITRIDED STAINLESS STEEL
S. Grigull, Å. Kvick, European Synchrotron Radiation Facility, Grenoble, France

S. Parascandola, Institut für Ionenstrahlphysik und Materialforschung, Dresden, Germany

 

D-062 STUDY ON EVALUATION OF RESIDUAL PHASE STRESS OF THE DUAL PHASE STAINLESS STEEL
H. Hirose, Kinjo Junior College, Matto, Japan

H. Hashi, T. Sasaki, Kanazawa University, Kanazawa, Japan

 

D-063 STUDY ON FRACTURE ANALYSIS OF (+) DUAL PHASE STAINLESS STEEL USING X-RAY DIFFRACTION
H. Hirose, Kinjo Junior College, Matto, Japan

T. Hamagami, T. Sasaki, Kanazawa University, Kanazawa, Japan

 

D-069 EFFECT OF X-RAY RESIDUAL STRESS IN SHOT-PEENED STAINLESS STEELS
S. Takahashi, T. Murotani, Y. Hirose, Kanazawa University, Kanazawa, Japan

M. Hashimoto, Sumitomo Heavy Industries, LTD., Aichi, Japan

 

D-060 A NEUTRON DIFFRACTION STUDY OF RESIDUAL STRAINS IN TWO MMC SYSTEMS; Ti/SiC AND W/Fe
P. Rangaswamy, H. Choo, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM

A. Saigal, Tufts University, Medford, MA

 

D-068 MEASUREMENT OF RESIDUAL PHASE STRESS OF THE METAL MATRIX COMPOSITE MATERIAL USING SYNCHROTRON RADIATION
S. Takago, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

K. Akita, Tokyo Metropolitan University, Tokyo, Japan

Y. Yoshioka, Musashi Institute of Technology, Tokyo, Japan

 

D-071 FABRICATION AND EVALUATION OF RESIDUAL STRESS FOR DISKSHAPED SYM-METRIC FUNCTIONALLY GRADED MATERIALS OF Ni/Al2O3 SYSTEM
K. Kikuchi, Y.-S. Kang, A. Kawasaki, Tohoku University, Sendai, Japan

T. Sasaki, Kanazawa University, Kanazawa, Japan

 

D-065 X-RAY STRESS DETERMINATION OF COLD-ROLLED STEEL SHEET USING ORIENTATION DISTRIBUTION FUNCTION
S. Ejiri, Y. Shirasuna, Seisen Jogakuin College, Nagano, Japan

T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

H. Inoue, University of Osaka Prefecture, Osaka, Japan

 

D-067 COMPOSITION DEPENDENCE OF X-RAY ELASTIC CONSTANT OF TITANIUM ALUMINIDE INTERMETALLIC COMPOUND
T. Kondoh, T. Goto, Aichi Institute of Technology, Toyota, Japan

T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

 

D-070 X-RAY ELASTIC CONSTANTS AND MECHANICAL ELASTIC CONSTANTS OF POLYCRYSTALLINE MATERIALS WITH ARBITRARY CRYSTAL STRUCTURES
Z. Lin, J. He, T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

X-ray Reflectometry

D-076 APPLICATION OF GIXR TO SOME INDUSTRIAL MATERIALS
H.J. Holland, Corning Inc., Corning, NY

 

D-023 THE USE OF X-RAY REFLECTOMETRY FOR SINGLE FILM THICKNESS ANALYSIS IN GMR MULTILAYER STACKS
C. Schug, B. York, J. Marien, H.-R. Blank, IBM Storage Technology Division