49th Annual (2000) Denver X-ray Conference™
Denver Marriott Tech Center Hotel
Denver, Colorado, U.S.A.
July 31 - August 4

 

49th Annual (2000) DXC > Thursday Sessions (August 3)
Morning Sessions: XRF & XRD(C-2) - XRD(D-3 & D-4) - XRF(F-2)
Evening Sessions: XRF & XRD(C-3) - XRD(D-5 & D-6 & D-7) - XRF(F-3)

Sessions, Thursday a.m.

XRD & XRF (Evergreen E & F)
Session C-2 MICROBEAM TECHNIQUES I  

Organized by: G.E. Ice Oak Ridge National Laboratory, Oak Ridge, TN
I.C. Noyan IBM, Yorktown Heights, NY

 

8:40   D-108 WHITE AND MONOCHROMATIC X-RAY MICROBEAM INVESTIGATIONS OF MATERIALS MICROSTRUCTURE AND TRI-AXIAL STRESS/STRAIN ON MESOSCOPIC LENGTH SCALES – Invited
B.C. Larson, Oak Ridge National Laboratory, Oak Ridge, TN
9:10  HARD X-RAY MICROSCOPY: COMBINATION OF MICRODIFFRACTION, MICROSPECTROSCOPY AND PHASE CONTRAST IMAGING – Invited
A. Snigirev, European Synchrotron Radiation Facility, Grenoble, France
9:40   F-09 CAPILLARY MICRO X-RAY FLUORESCENCE OF PARTICLES USING LABORATORY X-RAY TUBES
J.R. Swider, T. Jach, E. Steel, National Institute of Standards and Technology, Gaithersburg, MD
10:00  Break
10:30   F-28 APPLICATIONS OF IN SITU MICRO-EDXRF IN PHILATELY
G.S. Hall, Rutgers University, Piscataway, NJ
B. Scruggs, EDAX International
10:50  F-30  SMALL SPOT X-RAY ANALYSIS WITH CCD MAPPING CAPABILITIES
H. Inoue, Y. Yamada, M. Inoue, K. Okuda, Rigaku Industrial Corp., Osaka, Japan
G. Hamill, J. Martin, Rigaku/USA, Inc., Danvers, MA
11:10   F-37 ELEMENTAL SCREENING OF COMBINATORIAL CHEMICAL LIBRARIES USING MICRO X-RAY FLUORESCENCE
G.J. Havrilla, G. Mann, B. Warner, Los Alamos National Laboratory, Los Alamos, NM
11:30   C-2 RECENT DEVELOPMENTS IN X-RAY OPTICS FOR XRD & XRF INSTRUMENTATION
M. Haller, Z. Chen, N. Gao, M. McColgan, J. Nicolich, X-ray Optical Systems, Inc., Albany, NY

XRD (Evergreen B)
Session D-3 JEROME B. COHEN COMMEMORATIVE SESSION I: STRESS ANALYSIS BY DIFFRACTION METHODS I AND TEXTURE
 

Organized by: J. Fiala SKODA Research, Ltd., Plze´ n, Czech Republic
co-Chair: R.A. Winholtz University of Missouri, Columbia, MO

 

8:30 Introduction by Aaron Krawitz, University of Missouri, Columbia, MO, former student of Jerome Cohen
9:00  D-012  X-RAY STRESS ANALYSIS IN PRESENCE OF GRADIENTS AND TEXTURE – Invited
Ch. Genzel, Hahn-Meitner-Institut, Berlin, Germany
9:30   D-017 PROGRESS IN THE X-RAY DIFFRACTION OF THE RESIDUAL MACRO-STRESSES DETERMINATION RELATED TO SURFACE LAYER GRADIENTS AND ANISOTROPY – Invited
S.J. Skrzypek, A. Baczma´nski, University of Mining and Metallurgy-AGH, Kraków, Poland
10:00 Break
10:20  D-119  CALCULATION OF MAJOR CRYSTALLOGRAPHIC POLES ALONG ODF FIBERS PARALLEL TO THE GAMMA FIBER – Invited
S.H. Magner, B.M. Wilson, University of Nebraska, Lincoln, NE
R.J. De Angelis, University of Florida, Shalimar, FL
10:50 D-090  STRESS ANALYSIS OF THIN FILMS OF IRON AND COBALT STEEL ALLOYS USING A 4x10 mm 2 MONOCHROMATIC Cr K BEAM FROM A 100 mm LONG PARABOLIC MULTILAYER OPTIC
H. Zadoori, B.R. York, Q.-F. Xiao, IBM Materials Laboratory, San Jose, CA
Z. Al-Mosheky, L. Jiang, Osmic, Inc., Troy, MI
11:10 D-051  STRESS AND TEXTURE ANALYSIS WITH TWO-DIMENSIONAL DETECTORS
B.B. He, U. Preckwinkel, K. Smith, Bruker Analytical X-ray Systems, Madison, WI
11:30 D-037 THERMAL EXPANSION MEASUREMENTS OF LATTICE PARAMETERS USING PARALLEL-BEAM POWDER DIFFRACTOMETRY
T. Mitsunaga, M. Saigo, G. Fujinawa, J. Harada, Rigaku Corporation, Tokyo, Japan
11:50  D-019  INFLUENCE OF TEXTURE AND ANISOTROPHY ON MICROSTRESSES AND FLOW BEHAVIOR IN A DUPLEX STAINLESS STEEL DURING LOADING
J. Johansson Moverare, M. Odén, Linkoping University, Linköping, Sweden
12:10 D-106  RESIDUAL STRESSES IN TUNGSTEN/BULK METALLIC GLASS COMPOSITES
D. Dragoi, E. Üstündag, California Institute of Technology, Pasadena, CA
B. Clausen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
J.W. Richardson, Jr., Argonne National Laboratory, Argonne, IL

XRD (Evergreen C)
Session D-4 PHASE TRANSFORMATIONS AND REACTIONS I
 

Organized by: E. Üstündag California Institute of Technology, Pasadena, CA
co-Chair: M.A.M. Bourke Los Alamos National Laboratory, Los Alamos, NM

 

8:30  D-109  HIGH TEMPERATURE, DISPLACIVE TRANSFORMATIONS IN OXIDE CERAMICS – Invited
W.M. Kriven, University of Illinois at Urbana-Champaign, Urbana, IL
9:00  D-115

PHASE RELATIONSHIPS IN Sr-Fe-Co-O PEROVSKITE-BASED CERAMIC MEMBRANES – Invited
J.W. Richardson, Jr., B.J. Mitchell, C.D. Murphy, G. Ma, Argonne National Laboratory, Argonne, IL

9:30  D-104  INVESTIGATION OF THE REDUCTION OF NiAl 2 O 4
D. Dragoi, E. Üstündag, J.C. Hanan, California Institute of Technology, Pasadena, CA
B. Clausen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
J.W. Richardson, Jr., Argonne National Laboratory, Argonne, IL
9:50  D-105  EFFECT OF PRESSURE ON THE STRUCTURE OF NiAl 2 O 4
I. Halevy, E. Üstündag, J.C. Hanan, D. Dragoi, California Institute of Technology, Pasadena, CA
J. Hu, NSLS, Brookhaven National Laboratory, Upton, NY
10:10 Break
10:40   D-031 STUDY AND SIMULATION OF ORDER-DISORDER TRANSITIONS IN BROWNMILLERITE-TYPE CONDUCTING CERAMICS
S.A. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY
11:00  D-027  FERROELECTRIC PHASE TRANSITIONS IN Nb-doped KTiOPO 4
S.A. Ivanov, S.Yu. Stefanovich, Karpov’ Institute of Physical Chemistry, Moscow, Russia
S.-G. Eriksson, University of Gothenburg, Studsvik, Sweden
V.I. Voronkova, T.Yu. Losevskaya, V.K. Yanovskii, Moscow State University, Moscow, Russia
R. Tellgren, H. Rundlöf, Uppsala University, Uppsala, Sweden
11:20  D-102  CORRELATIONS BETWEEN BOEHMITE CRYSTAL SIZE AND ALUMINA PROPERTIES
X. Bokhimi, M.L. Guzmán-Castillo, F. Hernández-Beltrán, J. Salmones-Blásquez, A. Toledo, Instituto Mexicano del Petróleo, Mexico
11:40 D-055 INVESTIGATION OF GLASS BATCH REACTIONS AT RAPID HEATING RATES USING AN IN SITU DIFFRACTION FURNACE
M. Kolb, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY

XRF (Evergreen D)
Session F-2 NEW DEVELOPMENTS IN XRF I 

Organized by: V.E. Buhrke The Buhrke Company, Portola Valley, CA
co-Chair: M.A. Zaitz IBM Microelectronics, Hopewell Junction, NY

  

9:00  F-27   LIMITS OF SENSITIVITY FOR SYNCHROTRON RADIATION TXRF – Invited
P. Pianetta, K. Baur, S. Brennan, A. Singh, Stanford Synchrotron Radiation Laboratory, Stanford, CA
9:30 F-43  TXRF – TRENDS AND DEVELOPMENTS – Invited
A. Aiginger, C. Streli, P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna, Austria
10:00  Break
10:30   F-51 SYNCHROTRON RADIATION INDUCED TXRF OF "LAM" STEEL SAMPLES
P. Wobrauschek, G. Pepponi, C. Streli, N. Zöger, Atominstitut der Österreichischen Universitäten, Vienna, Austria
F. Hegedüs, C. Hegedüs, X-ray Consulting c/o EPFL-CRPP, Villigen PSI, Switzerland
10:50  F-45  SYNCHROTRON RADIATION INDUCED TXRF OF LOW Z ELEMENTS AT SSRL AND AT THE PTB BEAMLINE AT BESSY2
C. Streli, P. Wobrauschek, P. Kregsamer, G. Pepponi, Atominstitut der Österreichischen Universitäten, Vienna, Austria
B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany
P. Pianetta, Stanford Synchrotron Radiation Laboratory, Stanford, CA
S. Pahlke, L. Fabry, Wacker Siltronic AG, Burghausen, Germany
11:10  F-13  CONTAMINATION ANALYSIS OF Cu INTERCONNECT PROCESS SAMPLES BY TXRF
H. Kohno, M. Matsuo, H. Kohno, Rigaku Industrial Corporation
R. Wilson, Rigaku/USA, Inc., Danvers, MA
11:30  F-04  TRACE ELEMENTS IN LIGHT MATRICES USING XRF: COMPARISON OF DIFFERENT ANALYTICAL METHODS AND INSTRUMENTS
D. Bonvin, A. Kohler, R. Yellepeddi, ARL Applied Research Laboratories SA, Ecublens, Switzerland

Sessions, Thursday p.m.

XRD & XRF (Evergreen E & F)
Session C-3 MICROBEAM TECHNIQUES II
 

Organized by: G.E. Ice Oak Ridge National Laboratory, Oak Ridge, TN
  I.C. Noyan IBM, Yorktown Heights, NY

  

2:00 D-073 THREE VIEWS OF THE MOSAIC STRUCTURE IN RELAXED SiGe/Si HET-EROSTRUCTURES
J.L. Jordan-Sweet, P.M. Mooney, I.C. Noyan, S.K. Kaldor, IBM Research Division, Yorktown Heights, NY
P.-C. Wang, IBM Microelectronics Division, Hopewell Junction, NY
B. Lai, Z. Cai, P. Illinski, D. Legnini, W. Rodrigues, Argonne National Laboratory, Argonne, IL
C. Stagarescu, X. Su, G. Xu, D.E. Eastman, University of Chicago, Chicago, IL
2:20 D-058 COMPARISON OF LABORATORY-BASED X-RAY MICRODIFFRACTION AND ELECTRON BACKSCATTER DIFFRACTION FOR PHASE IDENTIFICATION
J.R. Verkouteren, J.A. Small, National Institute of Standards and Technology, Gaithersburg, MD
2:40 D-028 MICRO-DIFFRACTION WITH MONO-CAPILLARIES
M.J. Fransen, J.H.A. Vasterink, J. te Nijenhuis, Philips Analytical, Almelo, The Netherlands
3:00 Break
3:30 D-025 IN SITU STUDIES OF POLYCRYSTALLINE DEFORMATION USING HIGH ENERGY FOCUSED X-RAYS
L. Margulies, RISØ National Laboratory, Roskilde, Denmark and ESRF, Grenoble, France
H.F. Poulsen, D.J. Jensen, T. Lorentzen, RISØ National Laboratory, Roskilde, Denmark
U. Lienert, A. Kvick, ESRF, Grenoble, France
3:50 D-100 TEXTURE MEASUREMENTS IN Cu DAMASCENE INTERCONNECT LINES FOR NEW LOGIC TECHNOLOGIES USING AN IMAGE PLATE
D. Winter, Rigaku/USA, Inc., The Woodlands, TX
Q.-T. Jiang, International Sematech, Austin, TX
P. Besser, Motorola-AMD Alliance Technology
4:10 D-099 MECHANICAL STRESS IN Al AND Cu DAMASCENE INTERCONNECT LINES USING IN SITU HIGH TEMPERATURE MICRO-BEAM TECHNIQUES
D. Winter, Rigaku/USA, Inc., The Woodlands, TX
P. Besser, Motorola-AMD Alliance Technology
Q.-T. Jiang, International Sematech, Austin, TX
4:30 D-117 RESIDUAL STRESSES IN Ti-SiC COMPOSITES 
J.C. Hanan, D. Dragoi, E. Üstündag, California Institute of Technology, Pasadena, CA
I.C. Noyan, IBM, Yorktown Heights, NY

XRD (Evergreen B)
Session D-5 JEROME B. COHEN COMMEMORATIVE SESSION II: STRESS ANALYSIS BY DIFFRACTION METHODS II
 

Organized by: P.K. Predecki University of Denver, Denver, CO

  

2:00 D-116 ENGINEERING APPLICATIONS OF X-RAY STRESS ANALYSIS – Invited N. Ganev, I. Kraus, Czech Technical University, Prague, Czech Republic
2:30 D-112 MODELING FATIGUE CRACK PROPAGATION IN THE PRESENCE OF RESIDUAL STRESS – Invited
R.A. Winholtz, University of Missouri, Columbia, MO
3:00 D-084 VAMAS STANDARDS DEVELOPMENT FOR NEUTRON DIFFRACTION STRAIN MAPPING
X.-L. Wang, D. Wang, S. Spooner, C.R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN
3:20 Break
3:50 D-005 NUMERICAL SIMULATION OF THE X-RAY STRESS ANALYSIS TECHNIQUE IN POLYCRYSTALLINE MATERIALS WITH HEXAGONAL CRYSTAL SYMMETRY
H. Wern, T. Maas, N. Koch, HTW des Saarlandes, Saarbrücken, Germany
4:10 D-016 AN ELASTIC CONSTANTS DATABASE AND XEC CALCULATOR FOR USE IN XRD RESIDUAL STRESS ANALYSIS
A.C. Vermeulen, Philips Analytical, Almelo, The Netherlands
4:30 D-035 EVALUATION OF RESIDUAL STRESSES IN COMPOSITE TUBING UNDER THERMAL LOADING WITH MECHANICAL CONSTRAINT USING NEUTRON DIFFRACTION AND FINITE ELEMENT METHODS
T. Ely, X.-L. Wang, G. Sarma, C. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN
4:50   D-052 RESIDUAL STRAINS IN WELDED Be RINGS
D.W. Brown, R. Varma, M.A.M. Bourke, P. Burgardt, F. Guerra, Los Alamos National Laboratory, Los Alamos, NM
5:10 D-043  STUDY AND SERVICE CONTROL OF STRESS STATE OF HIGH-STRENGTH STEEL CABLES, USED IN PRESTRESSED CONCRETE STRUCTURES
V. Monine, Instituto Politécnico do Rio de Janeiro, Nova Friburgo, Brasil
T. Gurova, J.R. Teodósio, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brasil

XRD (Evergreen C)
Session D-6 PHASE TRANSFORMATIONS AND REACTIONS II
 

Organized by: E. Üstündag California Institute of Technology, Pasadena, CA
co-Chair: R.A. Winholtz Los Alamos National Laboratory, Los Alamos, NM

   

2:00 D-045 STRAIN, TEXTURE AND PHASE-FRACTION MEASUREMENTS DURING STRESS-INDUCED TRANSFORMATIONS IN SHAPE-MEMORY MATERIALS – Invited
R. Vaidyanathan, Massachusetts Institute of Technology, Cambrige, MA
D.C. Dunand, Department of Materials Science & Engineering, Northwestern University
M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
2:30 D-046 NON-DESTRUCTIVE IN SITU REAL-TIME MEASUREMENTS OF STRUCTUR-AL PHASE TRANSITIONS USING NEUTRON TRANSMISSION – Invited
S. Vogel, H.-G. Priesmeyer, Christian-Albrechts-Universität Kiel, Kiel, Germany
M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
E. Üstündag, California Institute of Technology, Pasadena, CA
3:00 Break
3:20 D-103 INVESTIGATION OF REACTION KINETICS USING NEUTRON SCATTERING
E. Üstündag, J.C. Hanan, D. Dragoi, California Institute of Technology, Pasadena, CA
B. Clausen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
J.W. Richardson, Jr., Argonne National Laboratory, Argonne, IL
S. Vogel, Christian-Albrechts-Universität Kiel, Germany
3:40 D-047 AUTOMATED RIETVELD-ANALYSIS OF LARGE NUMBERS OF DATASETS
S. Vogel, H.-G. Priesmeyer, Christian-Albrechts-Universität Kiel, Kiel, Germany
4:00 D-054 SYNCHROTRON X-RAY POWDER DIFFRACTION STUDIES OF MORDENITE CATALYSTS
C.E. Crowder, A. Kuperman, The Dow Chemical Company, Midland, MI
4:20 D-007 BULK MODULUS AND HIGH PRESSURE CRYSTAL STRUCTURES OF C(Si(CH 3 ) 3 ) 4 DETERMINED BY X-RAY POWDER DIFFRACTION
R.E. Dinnebier, S. van Smaalen, University of Bayreuth, Bayreuth, Germany
S. Carlson, ESRF, Grenoble, France
4:40  D-013  REAL-TIME SYNCHROTRON X-RAY POWDER DIFFRACTION STUDY OF THE STRUCTURE AND DEHYDRATION OF TODOROKITE
J.E. Post, Smithsonian Institution, Washington, DC
P.J. Heaney, The Pennsylvania State University, University Park, PA and Brookhaven National Laboratory, Upton, NY
5:00 D-074 THE ELECTRON DENSITY DISTRIBUTION OF TETRAGONAL BaTiO 3 OBTAINED BY THE MAXIMUM ENTROPY METHOD
J. Harada, K. Yugami, Rigaku Corporation, Tokyo, Japan
M. Sakata, E. Nishibori, M. Takata, Nagoya University, Nagoya, Japan
Y. Akishige, T. Nakata, Shimane University, Matsue, Japan
Y. Kuroiwa, Okayama University, Okayama, Japan

XRD (Evergreen A)
Session D-7 NEW DEVELOPMENTS IN XRD INSTRUMENTATION I
 

Organized by: S.T. Misture New York State College of Ceramics at Alfred University, Alfred, NY
co-Chair: T. Ungár Eötvös University Budapest, Hungary

  

1:30 D-111 HIGH ACCURACY LATTICE PARAMETER MEASUREMENTS – Invited
J.P. Cline, R.D. Deslattes, J.-L. Staudenmann, E.G. Kessler, L.T. Hudson, A. Henins, National Institute of Standards and Technology, Gaithersburg, MD
R.W. Cheary, University of Technology, Sydney, Australia
2:00 D-029  WHAT CAN YOUR DIFFRACTOMETER DO FOR YOU? CROSS TECHNIQUE MATERIAL ANALYSIS WITH ONE MACHINE
C.H. Russell, S.M. Owens, R.D. Deslattes, National Institute of Standards and Technology, Gaithersburg, MD
2:20 D-089 LATEST DEVELOPMENT OF MULTILAYER COLLIMATING AND FOCUSING OPTICS
B. Verman, L. Jiang, B. Kim, S. Seshadri, D. Wilcox, N. Grupido, Osmic, Inc., Troy, MI
2:40 D-077 TOROIDAL FOCUSING OPTIC FOR µXRD STRESS MEASUREMENTS
Q.-F. Xiao, B. York, H. Zadoori, IBM Materials Laboratory, San Jose, CA
Z. Chen, X-ray Optical Systems, Albany, NY
3:00  Break
3:30 D-014 CHARACTERIZATION OF X-RAY DIFFRACTION SYSTEM WITH A MICRO-FOCUS X-RAY SOURCE AND A POLYCAPILLARY OPTIC
M. Gubarev, M. Joy, NASA/Marshall Space Flight Center, Huntsville, AL
E. Ciszak, NASA/Marshall Space Flight Center, Huntsville, AL and Universities Space Research Association, Huntsville, AL
I. Ponomarev, X-ray Optical Systems, Inc., Albany, NY
3:50 D-093 A PARALLEL BEAM GEOMETRY FOR ACCURATE PHASE ANALYSIS
J. te Nijenhuis, V.A. Kogan, Philips Analytical, Almelo, The Netherlands
4:10  D-086 IMAGING PLATE SYSTEMS FOR DIFFRACTION D/MAX-Rapid, R/AXIS-Rapid
R. Ortega, Rigaku/USA, The Woodlands, TX
K. Masuda, J. Harada, Rigaku Corporation, Tokyo, Japan
4:30 D-044 NEW REFLECTION METHOD FOR THE DETERMINATION OF A COMPLETE POLE FIGURE
R. Yokoyama, K. Oguiso, Rigaku Corporation, Tokyo, Japan
4:50 D-053 XRD RAPID SCREENING SYSTEM FOR COMBINATORIAL CHEMISTRY
B.B. He, J. Anzelmo, P. LaPuma, U. Preckwinkel, K. Smith, Bruker Analytical X-ray Systems, Madison, WI

XRF (Evergreen D)
Session F-3 NEW DEVELOPMENTS IN XRF II
 

Organized by: V.E. Buhrke The Buhrke Company, Portola Valley, CA
  M.A. Zaitz IBM Microelectronics, Hopewell Junction, NY

  

2:00 F-08 BRAGG POLARIZATION OPTICS IN EDXRF
J. Heckel, SPECTRO A.I., Kleve, Germany
2:20 F-22

EXAMINATION OF POLYCAPILLARY LENSES FOR MICRO-XRF
M. Haschke, P. Pfannekuch, Röntgenanalytik Messtechnik GmbH, Germany
B. Scruggs, EDAX, Inc.

2:40  F-38  MICRO X-RAY FLUORESCENCE WITH MONOLITHIC POLYCAPILLARY OPTICS
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
3:00  Break
3:30 F-47 DOUBLY CURVED CRYSTAL OPTICS AND THEIR APPLICATIONS
Z.W. Chen, J.P. Nicolich, X-ray Optical Systems, Inc., Albany, NY
3:50 C-4 INNOVATIVE PRODUCTS FOR XRF AND XRD SAMPLE PREPARATION
M. Dessureault, Corporation Scientifique Claisse, Inc., Quebec, Canada
R. Bostwick, SPEX CertiPrep, Inc., Metuchen, NJ
4:10 F-52 THE NEW COMPACT "PLUG AND PLAY" WDXRF CONCEPT
J.A. Anzelmo, Bruker AXS, Inc., Madison, WI
4:30 F-23 A COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS
H. Soejima, Shimadzu Scientific Research, Kyoto, Japan
T. Narusawa, Kochi University of Technology, Kochi, Japan