49th Annual (2000) Denver X-ray Conference™
Denver Marriott Tech Center Hotel
Denver, Colorado, U.S.A.
July 31 - August 4
49th
Annual (2000) DXC > Wednesday Sessions - including Plenary (August 2)
Evening Sessions: XRF & XRD(C-1) - XRD(D-1 & D-2) - XRF(F-1)
Plenary Session, Wednesday, 2 August (Evergreen
Ballroom)
8:30 a.m. – 12 noon
X-ray
Analysis in the 21st Century
| Organized by: | R. Jenkins | International Centre for Diffraction Data, Newtown Square, PA |
| P.K. Predecki | University of Denver, Denver, CO |
| 8:30 | Welcoming
Remarks Ron Jenkins, Chairman, Denver X-ray Conference™, International Centre for Diffraction Data, Newtown Square, PA |
| IXAS
Update R.L. Snyder, The Ohio State University, Columbus, OH |
|
Presentation
of Awards
|
|
| Plenary
Session Remarks R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA P.K. Predecki, University of Denver, Denver, CO |
The following are invited papers:
| 9:00 | P-1 | CHALLENGES
FOR X-RAY TECHNIQUES IN THE MICROELECTRONICS
INDUSTRY I.C. Noyan, IBM, Yorktown Heights, NY |
| 9:40 | P-2 | POTENTIAL OF NOVEL X-RAY TECHNIQUES FOR THE SURFACE
EXAMINATION
OF MATERIALS D.K. Bowen, Bede Scientific, Inc., Englewood, CO |
| 10:20 | Break | |
| 10:40 | P-3 | WHAT DOES THE RECENT LITERATURE ON X-RAY EMISSION
ANALYSIS
TELL US ABOUT THE FUTURE? R. van Grieken, University of Antwerp, Antwerp, Belgium |
| 11:20 | P-4 | APPLICATIONS OF FUNDAMENTAL PARAMETERS IN X-RAY
FLUORESCENCE
ANALYSIS B. Vrebos, Philips Analytical, Almelo, The Netherlands |
Sessions, Wednesday p.m.
XRD & XRF (Evergreen A)
Session C-1 PROBLEMS & SOLUTIONS IN XRD/XRF
| Organized by: | V.E. Buhrke | The Buhrke Company, Portola Valley, CA |
| D.K. Smith | Emeritus, The Pennsylvania State University, University Park, PA |
| 1:30 | D-114 | COMPUTATIONAL MATERIALS DESIGN – Invited R.L. Snyder, The Ohio State University, Columbus, OH |
| 2:00 | DATA MINING USING THE NEW ICDD RELATIONAL DATABASE FOR THE
POWDER DIFFRACTION FILE
(PDF) – Invited J. Faber, International Centre for Diffraction Data, Newtown Square, PA |
|
| 2:30 | D-075 | INTERFERENCE OF PARAMETRIC X-RAY AND COHERENT
BREMSSTRAHLUNG RADIATION FROM NONRELATIVISTIC ELECTRONS: APPLICATION TO THE PHASE ANALYSIS I.D. Feranchuk, Belorussian State University, Minsk, Republic of Belarus A. Ulyanenkov, J. Harada, Rigaku Corporation, Tokyo, Japan |
| 2:50 | D-087 | MAJOR PROBLEMS IN THE CHARACTERIZATION OF THIN FILMS R. Ortega, Rigaku/USA, The Woodlands, TX K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan |
| 3:10 | Break | |
| 3:40 | F-03 | FUSION FOR BETTER ANALYTICAL RESULTS M. Davidts, I.C.P.H. Chemical International, Philadelphia, PA |
| 4:00 | F-42 | APPROACHING A UNIVERSAL SAMPLE PREPARATION METHOD FOR
XRF ANALYSIS OF POWDER MATERIALS J. Anzelmo, A. Seyfarth, L. Arias, Bruker AXS, Inc., Madison, WI |
| 4:20 | C-1 | XRD
VERSUS XRF FOR CHEMISTRY BATH CONTROL IN ALUMINUM PRODUCTION S. Kirik, Institute of Chemistry and Chemical Engineering, Krasnoyarsk, Russia I. Yakimov, Academy of Non-ferrous Metals and Gold, Krasnoyarsk, Russia |
XRD (Evergreen B)
Session D-1 RIETVELD ANALYSIS
| Organized by: | R.E. Dinnebier | University of Bayreuth, Bayreuth, Germany |
| co-Chair: | E. Antipov | Moscow State University, Moscow, Russia |
| 1:30 | D-072 | RECENT DEVELOPMENTS OF
FullProf: SUPERSTRUCTURE
ANALYSIS, GENERALIZED
COORDINATES REFINEMENTS, MICROSTRUCTURE MODELS AND FORM FACTORS – Invited J. Rodríguez-Carvajal, Laboratoire Léon Brillouin (CEA-CNRS), Gif-sur-Yvette, France |
| 2:00 | D-113 | SOLVING PROTEIN STRUCTURES FROM POWDER DIFFRACTION
DATA – Invited R.B. Von Dreele, Los Alamos National Laboratory, Los Alamos, NM |
| 2:30 | MICROSTRUCTURAL PROPERTIES FROM RIETVELD REFINEMENT OF
HIGH RESOLUTION POWDER
PATTERNS – Invited P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY |
|
| 3:00 | Break | |
| 3:20 | D-020 | THE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION
IN RIETVELD PATTERN
FITTING WITH SYMMETRIC REFLECTION-OPTICS DIFFRACTION
DATA B. O’Connor, D. Li, Curtin University of Technology, Perth, Australia B. Hunter, Lucas Heights Research Laboratories, Menai, Australia |
| 3:40 | D-081 | X-RAY AND NEUTRON RIETVELD REFINEMENTS OF COMPOUNDS IN
THE Sr-R-Cu-O SYSTEM
(R=LANTHANIDES) W. Wong-Ng, Q. Huang, T. Haugan, I. Levin, National Institute of Standards and Technology, Gaithersburg, MD J. Kaduk, INEOS Technologies, Inc., Naperville, IL J. Dillingham, J. Suh, University of Maryland, College Park, MD R.A. Young, Georgia Institute of Technology, Atlanta, GA |
| 4:00 | D-078 | AB-INITIO STRUCTURE SOLUTION OF Rh
4 Bi 2 O 9.33 FROM STEP INTENSITY DATA WITH TOPAS F. Stowasser, Ruhr-Universität-Bochum, Bochum, Germany C. Renkenberger, Universität Heidelberg, Heidelberg, Germany A. Kern, Bruker AXS GmbH, Karlsruhe, Germany |
| 4:20 | D-006 | TEXTURE CHARACTERIZATION IN X-RAY AND NEUTRON POWDER
DIF-FRACTION DATA USING THE GENERALIZED SPHERICAL-HARMONIC H. Sitepu, National Institute of Standards and Technology, Gaithersburg, MD and SUNY, Stony Brook, NY H.J. Prask, M.D. Vaudin, National Institute of Standards and Technology, Gaithersburg, MD |
| 4:40 | D-026 | MICRO RIETVELD ANALYSIS AND 2D DETECTORS R.G. Tissot, Sandia National Laboratories, Albuquerque, NM D.E. Simon, DES Consulting, Broken Arrow, OK |
| 5:00 | D-059 | TOPAS: A NEW DIMENSION IN XRPD STRUCTURE ANALYSIS A. Kern, A. Coelho, Bruker AXS GmbH, Karlsruhe, Germany |
XRD (Evergreen C)
Session D-2 MESOSTRUCTURE ANALYSIS
| Organized by: | R.L. Snyder | The Ohio State University, Columbus, OH |
| R. Barton, Jr. | DuPont Experimental Station, Wilmington, DE |
| 1:40 | D-030 | X-RAY
DIFFRACTION IMAGING AS A TOOL OF MESOSTRUCTURE ANALYSIS –
Invited J. Fiala, Skoda Research, Ltd., Plze´ n, Czech Republic |
| 2:10 | D-125 | LINE
PROFILE ANALYSIS OF POLYMERIC FIBERS – Invited R. Barton, Jr., DuPont Company–Central Research & Development, Wilmington, DE |
| 2:40 | D-057
APPLYING THE RIETVELD METHOD TO A MINERAL FILLED PPS COMPOUND R.W. Morton, J.F. Geibel, J.J. Gislason, R.L. Heald, Phillips Petroleum Company, Bartlesville, OK D.E. Simon, DES Consulting, Broken Arrow, OK |
|
| 3:00 | Break | |
| 3:30 | D-094 | WHAT CAN
WE LEARN FROM STRAIN ANISOTROPY? – Invited T. Ungár, Eötvös University Budapest, Hungary |
| 4:00 | D-110 | ANALYSIS
OF SIZE-BROADENED PROFILES USING THE MAXIMUM ENTROPY METHOD N. Armstrong, J.P. Cline, National Institute of Standards and Technology, Gaithersburg, MD W. Kalceff, University of Technology, Sydney, Australia |
| 4:20 | D-107 | AN X-RAY
DIFFRACTION STUDY OF TRIPHENYL BASED DISCOTIC LIQUID CRYSTALS T. Blanton, Eastman Kodak Company, Rochester, NY S.H. Chen, J. Mastrangelo, P. Chen, University of Rochester, Rochester, NY |
| 4:40 | D-040 | X-RAY
MICROBEAM DIFFRACTION COMPARISON OF MESOTEXTURES IN PLATES OF
THREE ALUMINUM ALLOYS K. Ignatiev, S.R. Stock, Georgia Institute of Technology, Atlanta, GA Z.U. Rek, Stanford Synchrotron Radiation Laboratory, Stanford, CA |
| 5:00 | D-079 | ANALYSIS
OF STRAIN ANISOTROPHY IN DELTA STABILIZED Pu-Ga ALLOYS L. Morales, A. Lawson, J. Kennison, Los Alamos National Laboratory, Los Alamos, NM |
XRF (Evergreen D)
Session F-1 INDUSTRIAL APPLICATIONS OF XRF I
| Organized by: | R. Wilson | Rigaku/USA, Inc., Danvers, MA |
| D. Broton | Construction Technology Laboratories, Skokie, IL |
| 1:30 | F-34 | SILICON
TO TUNGSTEN RATIO DETERMINATION IN TUNGSTEN SILICIDE USING XRF
– Invited M. Godbole, Dominion Semiconductor LLC, Manassas, VA |
| 2:00 | F-10 | ACCURATE
QUANTIFICATION OF DRIED RESIDUE THIN FILMS USING X-RAY
FLUORESCENCE C.G. Worley, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM |
| 2:20 | F-14 | THICKNESS
AND COMPOSITION ANALYSIS OF BST FILM USING XRF — THE USE OF
A GONIOMETER WITH A BACKGROUND MEASUREMENT MECHANISM S. Fujimura, H. Homma, H. Kobayashi, H. Kohno, Rigaku Industrial Corporation, Japan R. Wilson, Rigaku/USA, Inc., Danvers, MA |
| 2:40 | F-48 | COMPARISON
OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY
EXCITED ELECTRONS: I. THEORY H. Ebel, R. Svagera, M.F. Ebel, W.S.M. Werner, Technische Universität Wien, Wien, Austria |
| 3:00 | Break | |
| 3:20 | F-49 | COMPARISON
OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY
EXCITED ELECTRONS: II. EVALUATION OF LAYER THICKNESSES
DETERMINED BY TOTAL ELECTRON YIELD (TEY) H. Ebel, R. Svagera, M.F. Ebel, W.S.M. Werner, Technische Universität Wien, Wien, Austria |
| 3:40 | THE
CHALLENGES OF SAMPLING AND SPECIMEN PREPARATION OF ALTERNATE
RAW MATERIALS IN THE CEMENT INDUSTRY – Invited D. Broton, Construction Technology Laboratories, Skokie, IL |
|
| 4:10 | F-20 | DEVELOPMENT
OF SRM® 2780 HARD ROCK MINE WASTE – Invited J. Sieber, G. Turk, M. Epstein, C. Beck II, A. Marlow, National Institute of Standards and Technology, Gaithersburg, MD S. Wilson, J. Taggart, United States Geological Survey |
| 4:40 | F-02 | THE
PRESENT STATUS AND FEATURES OF GEOCHEMICAL MAPPING USING X-RAY
FLUORESCENCE SPECTROMETRY IN CHINA G. Ma, G. Liang, L. Luo, National Research Center of Geological Analysis, Beijing, China G. Li, Institute of Geophysical and Geochemical Exploration, Hebei, China |
| 5:00 | F-40 | PORTABLE
XRF INSTRUMENTATION FOR MINING D.J. Watson, T. Howe, D. Kenning, Edax Portable Products Division, Kennewick, WA J. Nicolosi, Edax, Inc., Mahwah, NJ |