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49th Annual (2000) DXC > Wednesday Sessions - including Plenary (August 2)
Evening Sessions: XRF & XRD(C-1) - XRD(D-1 & D-2) - XRF(F-1)

Plenary Session, Wednesday, 2 August (Evergreen Ballroom)
8:30 a.m. – 12 noon
X-ray Analysis in the 21st Century

Organized by: R. Jenkins International Centre for Diffraction Data, Newtown Square, PA
P.K. Predecki University of Denver, Denver, CO
 
8:30 Welcoming Remarks
Ron Jenkins, Chairman, Denver X-ray Conference™, International Centre for Diffraction Data, Newtown Square, PA
  IXAS Update
R.L. Snyder, The Ohio State University, Columbus, OH
  Presentation of Awards
  • 2000 Birks Award to Yohichi Gohshi, National Institute for Environmental Studies,Tsukuba, Japan
    Presented by:     Horst Ebel, Technische Universität Wien, Austria
  • 2000 McMurdie Award to Gregory J. McCarthy, North Dakota State University, Fargo, ND 
    Presented by:     Robert L. Snyder, Ohio State University, Columbus, OH.
  • Announcement of the 2000 Jerome B. Cohen Student Award
    Presented by:     I. Cev Noyan, IBM, Yorktown Heights, NY
  Plenary Session Remarks
R. Jenkins, International Centre for Diffraction Data, Newtown Square, PA
P.K. Predecki, University of Denver, Denver, CO

The following are invited papers: 

9:00 P-1 CHALLENGES FOR X-RAY TECHNIQUES IN THE MICROELECTRONICS INDUSTRY
I.C. Noyan, IBM, Yorktown Heights, NY
9:40 P-2 POTENTIAL OF NOVEL X-RAY TECHNIQUES FOR THE SURFACE EXAMINATION OF MATERIALS
D.K. Bowen, Bede Scientific, Inc., Englewood, CO
10:20 Break
10:40 P-3 WHAT DOES THE RECENT LITERATURE ON X-RAY EMISSION ANALYSIS TELL US ABOUT THE FUTURE?
R. van Grieken, University of Antwerp, Antwerp, Belgium
11:20 P-4 APPLICATIONS OF FUNDAMENTAL PARAMETERS IN X-RAY FLUORESCENCE ANALYSIS
B. Vrebos, Philips Analytical, Almelo, The Netherlands
 

Sessions, Wednesday p.m.

XRD & XRF (Evergreen A)
Session C-1 PROBLEMS & SOLUTIONS IN XRD/XRF   

Organized by: V.E. Buhrke The Buhrke Company, Portola Valley, CA
D.K. Smith Emeritus, The Pennsylvania State University, University Park, PA

 

1:30 D-114 COMPUTATIONAL MATERIALS DESIGN – Invited
R.L. Snyder, The Ohio State University, Columbus, OH
2:00 DATA MINING USING THE NEW ICDD RELATIONAL DATABASE FOR THE POWDER DIFFRACTION FILE (PDF) – Invited
J. Faber, International Centre for Diffraction Data, Newtown Square, PA
2:30 D-075 INTERFERENCE OF PARAMETRIC X-RAY AND COHERENT BREMSSTRAHLUNG RADIATION FROM NONRELATIVISTIC ELECTRONS: APPLICATION TO THE PHASE ANALYSIS
I.D. Feranchuk, Belorussian State University, Minsk, Republic of Belarus
A. Ulyanenkov, J. Harada, Rigaku Corporation, Tokyo, Japan
2:50 D-087 MAJOR PROBLEMS IN THE CHARACTERIZATION OF THIN FILMS
R. Ortega, Rigaku/USA, The Woodlands, TX
K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan
3:10 Break
3:40 F-03 FUSION FOR BETTER ANALYTICAL RESULTS
M. Davidts, I.C.P.H. Chemical International, Philadelphia, PA
4:00 F-42 APPROACHING A UNIVERSAL SAMPLE PREPARATION METHOD FOR XRF ANALYSIS OF POWDER MATERIALS
J. Anzelmo, A. Seyfarth, L. Arias, Bruker AXS, Inc., Madison, WI
4:20 C-1 XRD VERSUS XRF FOR CHEMISTRY BATH CONTROL IN ALUMINUM PRODUCTION
S. Kirik, Institute of Chemistry and Chemical Engineering, Krasnoyarsk, Russia
I. Yakimov, Academy of Non-ferrous Metals and Gold, Krasnoyarsk, Russia

XRD (Evergreen B)
Session D-1 RIETVELD ANALYSIS

Organized by: R.E. Dinnebier University of Bayreuth, Bayreuth, Germany
co-Chair: E. Antipov Moscow State University, Moscow, Russia

 

1:30 D-072 RECENT DEVELOPMENTS OF FullProf: SUPERSTRUCTURE ANALYSIS, GENERALIZED COORDINATES REFINEMENTS, MICROSTRUCTURE  MODELS AND FORM FACTORS – Invited
J. Rodríguez-Carvajal, Laboratoire Léon Brillouin (CEA-CNRS), Gif-sur-Yvette, France
2:00 D-113 SOLVING PROTEIN STRUCTURES FROM POWDER DIFFRACTION DATA – Invited
R.B. Von Dreele, Los Alamos National Laboratory, Los Alamos, NM
2:30 MICROSTRUCTURAL PROPERTIES FROM RIETVELD REFINEMENT OF HIGH RESOLUTION POWDER PATTERNS – Invited
P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY
3:00  Break
3:20 D-020 THE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS DIFFRACTION DATA
B. O’Connor, D. Li, Curtin University of Technology, Perth, Australia
B. Hunter, Lucas Heights Research Laboratories, Menai, Australia
3:40 D-081 X-RAY AND NEUTRON RIETVELD REFINEMENTS OF COMPOUNDS IN THE Sr-R-Cu-O SYSTEM (R=LANTHANIDES)
W. Wong-Ng, Q. Huang, T. Haugan, I. Levin, National Institute of Standards and Technology, Gaithersburg, MD
J. Kaduk, INEOS Technologies, Inc., Naperville, IL
J. Dillingham, J. Suh, University of Maryland, College Park, MD
R.A. Young, Georgia Institute of Technology, Atlanta, GA
4:00 D-078 AB-INITIO STRUCTURE SOLUTION OF Rh 4 Bi 2 O 9.33 FROM STEP INTENSITY DATA WITH TOPAS
F. Stowasser, Ruhr-Universität-Bochum, Bochum, Germany
C. Renkenberger, Universität Heidelberg, Heidelberg, Germany
A. Kern, Bruker AXS GmbH, Karlsruhe, Germany
4:20 D-006 TEXTURE CHARACTERIZATION IN X-RAY AND NEUTRON POWDER DIF-FRACTION DATA USING THE GENERALIZED SPHERICAL-HARMONIC
H. Sitepu, National Institute of Standards and Technology, Gaithersburg, MD and SUNY, Stony Brook, NY
H.J. Prask, M.D. Vaudin, National Institute of Standards and Technology, Gaithersburg, MD
4:40 D-026 MICRO RIETVELD ANALYSIS AND 2D DETECTORS
R.G. Tissot, Sandia National Laboratories, Albuquerque, NM
D.E. Simon, DES Consulting, Broken Arrow, OK
5:00 D-059 TOPAS: A NEW DIMENSION IN XRPD STRUCTURE ANALYSIS
A. Kern, A. Coelho, Bruker AXS GmbH, Karlsruhe, Germany
 

XRD (Evergreen C)
Session D-2 MESOSTRUCTURE ANALYSIS

Organized by: R.L. Snyder The Ohio State University, Columbus, OH
R. Barton, Jr. DuPont Experimental Station, Wilmington, DE

 

1:40 D-030 X-RAY DIFFRACTION IMAGING AS A TOOL OF MESOSTRUCTURE ANALYSIS – Invited
J. Fiala, Skoda Research, Ltd., Plze´ n, Czech Republic
2:10 D-125 LINE PROFILE ANALYSIS OF POLYMERIC FIBERS – Invited
R. Barton, Jr., DuPont Company–Central Research & Development, Wilmington, DE
2:40 D-057 APPLYING THE RIETVELD METHOD TO A MINERAL FILLED PPS COMPOUND
R.W. Morton, J.F. Geibel, J.J. Gislason, R.L. Heald, Phillips Petroleum Company, Bartlesville, OK
D.E. Simon, DES Consulting, Broken Arrow, OK
3:00  Break
3:30 D-094 WHAT CAN WE LEARN FROM STRAIN ANISOTROPY? – Invited
T. Ungár, Eötvös University Budapest, Hungary
4:00 D-110 ANALYSIS OF SIZE-BROADENED PROFILES USING THE MAXIMUM ENTROPY METHOD
N. Armstrong, J.P. Cline, National Institute of Standards and Technology, Gaithersburg, MD
W. Kalceff, University of Technology, Sydney, Australia
4:20 D-107 AN X-RAY DIFFRACTION STUDY OF TRIPHENYL BASED DISCOTIC LIQUID CRYSTALS
T. Blanton, Eastman Kodak Company, Rochester, NY
S.H. Chen, J. Mastrangelo, P. Chen, University of Rochester, Rochester, NY
4:40 D-040 X-RAY MICROBEAM DIFFRACTION COMPARISON OF MESOTEXTURES IN PLATES OF THREE ALUMINUM ALLOYS
K. Ignatiev, S.R. Stock, Georgia Institute of Technology, Atlanta, GA
Z.U. Rek, Stanford Synchrotron Radiation Laboratory, Stanford, CA
5:00 D-079 ANALYSIS OF STRAIN ANISOTROPHY IN DELTA STABILIZED Pu-Ga ALLOYS
L. Morales, A. Lawson, J. Kennison, Los Alamos National Laboratory, Los Alamos, NM

XRF (Evergreen D)
Session F-1 INDUSTRIAL APPLICATIONS OF XRF I

Organized by: R. Wilson Rigaku/USA, Inc., Danvers, MA
D. Broton Construction Technology Laboratories, Skokie, IL

 
1:30 F-34 SILICON TO TUNGSTEN RATIO DETERMINATION IN TUNGSTEN SILICIDE USING XRF – Invited
M. Godbole, Dominion Semiconductor LLC, Manassas, VA
2:00 F-10 ACCURATE QUANTIFICATION OF DRIED RESIDUE THIN FILMS USING X-RAY FLUORESCENCE
C.G. Worley, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
2:20 F-14 THICKNESS AND COMPOSITION ANALYSIS OF BST FILM USING XRF — THE USE OF A GONIOMETER WITH A BACKGROUND MEASUREMENT MECHANISM
S. Fujimura, H. Homma, H. Kobayashi, H. Kohno, Rigaku Industrial Corporation, Japan
R. Wilson, Rigaku/USA, Inc., Danvers, MA
2:40  F-48 COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS: I. THEORY
H. Ebel, R. Svagera, M.F. Ebel, W.S.M. Werner, Technische Universität Wien, Wien, Austria
3:00 Break
3:20 F-49 COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS: II. EVALUATION OF LAYER THICKNESSES DETERMINED BY TOTAL ELECTRON YIELD (TEY)
H. Ebel, R. Svagera, M.F. Ebel, W.S.M. Werner, Technische Universität Wien, Wien, Austria
3:40 THE CHALLENGES OF SAMPLING AND SPECIMEN PREPARATION OF ALTERNATE RAW MATERIALS IN THE CEMENT INDUSTRY – Invited
D. Broton, Construction Technology Laboratories, Skokie, IL
4:10 F-20 DEVELOPMENT OF SRM® 2780 HARD ROCK MINE WASTE – Invited
J. Sieber, G. Turk, M. Epstein, C. Beck II, A. Marlow, National Institute of Standards and Technology, Gaithersburg, MD
S. Wilson, J. Taggart, United States Geological Survey
4:40 F-02 THE PRESENT STATUS AND FEATURES OF GEOCHEMICAL MAPPING USING X-RAY FLUORESCENCE SPECTROMETRY IN CHINA
G. Ma, G. Liang, L. Luo, National Research Center of Geological Analysis, Beijing, China
G. Li, Institute of Geophysical and Geochemical Exploration, Hebei, China
5:00 F-40 PORTABLE XRF INSTRUMENTATION FOR MINING
D.J. Watson, T. Howe, D. Kenning, Edax Portable Products Division, Kennewick, WA
J. Nicolosi, Edax, Inc., Mahwah, NJ