49th Annual (2000) Denver X-ray Conference™ Denver Marriott Tech Center Hotel  Denver, Colorado, U.S.A. July 31 - August 4 49th Annual (2000) DXC > Summary Report Technical Program - Awards Presented The 49th Annual Denver X-ray Conference visited the mile high city 31 July – 4 August 2000, at the Denver Marriott Tech Center Hotel, Denver, Colorado, U.S.A. The conference hosted 350 attendees and 210 exhibitors who represented 35 companies. Forty-nine exhibit booths, which vendors displayed products and services relating to X-ray powder diffraction and X-ray fluorescence spectrometry, were available to the attendees throughout the week. Technical Program Following the traditional format, the conference offered two days of tutorial workshops, followed by three days of special and contributed sessions on a variety of topics. XRF and XRD poster sessions were also held on Monday, Tuesday and Wednesday evening. The Workshops included:  XRD & XRF XRD XRF W-1 New Methods of Beam Conditioning (Faber/Bowen) W-2 Hands On Rietveld Analysis I (Dinnebier/Antipov) W-3 Alignment & Standards (Cline/Cheary) W-4 Practical TXRF (Zaitz/Wobrauschek/Streli)   W-5 Hands On Rietveld Analysis II (Dinnebier/Antipov) W-6 Analysis of Micron Size Specimens (Goehner) W-7 Introduction to XRF (Jenkins/Croke) W-8 Analysis of Layered Materials by XRF (Dirken)     W-9 Residual Stress Analysis – Cancelled (Noyan/Goldsmith) W-10 Phase Transformation (Jones) W-11 Specimen Preparation XRF I (Buhrke) W-12 Fundamental Parameters (Mantler)   W-13 Grazing Incidence (Huang/Harada) W- 14 Texture Analysis (De Angelis/Schaeben) W-15 Specimen Preparation XRF II (Buhrke) W-16 Quantitative Analysis – Standardless Methods (Anzelmo) The Plenary Session, "X-ray Analysis in the 21st Century", began this year’s technical sessions. Chaired by Ron Jenkins, International Centre for Diffraction Data, Newtown Square, PA and Paul Predecki, University of Denver, Denver CO, the plenary session included the following invited presentations: CHALLENGES FOR X-RAY TECHNIQUES IN THE MICROELECTRONICS INDUSTRY I.C. Noyan, IBM, Yorktown Heights, NY (presentation given by C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY) POTENTIAL OF NOVEL X-RAY TECHNIQUES FOR THE SURFACE EXAMINATION OF MATERIALS D.K. Bowen, Bede Scientific, Inc., Englewood, CO WHAT DOES THE RECENT LITERATURE ON X-RAY EMISSION ANALYSIS TELL US ABOUT THE FUTURE? R. van Grieken, University of Antwerp, Antwerp, Belgium APPLICATIONS OF FUNDAMENTAL PARAMETERS IN X-RAY FLUORESCENCE ANALYSIS B. Vrebos, Philips Analytical, Almelo, The Netherlands Other technical sessions included: XRD & XRF XRD XRF C-1 Problems & Solutions in XRD/XRF (Buhrke/Smith)   D-1 Rietveld Analysis (Dinnebier/Antipov) D-2 Mesostructure Analysis (Snyder/Barton) F-1 Industrial Applications of XRF I (Wilson/Broton) C-2 Microbeam Techniques I (Ice/Noyan)   D-3 Jerome B. Cohen: Stress Analysis I (Fiala/Winholtz) D-4 Phase Transformations and Reactions I (Üstündag/Bourke) F-2 New Developments in XRF I (Buhrke/Zaitz) C-3 Microbeam Techniques II (Ice/Noyan) D-5 Jerome B. Cohen: Stress Analysis II (Predecki/Sasaki) D-6 Phase Transformations and Reactions II (Üstündag /Bourke) D-7 New Developments in XRD Instrumentation I (Misture/Ungár) F-3 New Developments in XRF II (Zaitz/Buhrke)   D-8 New Developments in XRD Instrumentation II (Misture/O’Connor) D-9 Thin Films Analysis XRD (Huang/Lin/Harada) F-4 Industrial Applications of XRF II (Baker/Havrilla) F-5 Quantitative XRF & Software (Mantler/van Grieken)   Awards Presented: As the most recent recipient of the Birks Award, Host Ebel presented the 2000 Birks Award to Yohichi Gohshi of the National Institute for Environmental Studies, Tsukuba, Japan. The Birks Award was established to recognize outstanding contributions to the field of X-ray spectrometry. Robert L. Snyder presented the 2000 McMurdie Award, new this year, to Gregory J. McCarthy of North Dakota State University, Fargo, ND. The purpose of the McMurdie Award is to recognize distinguished work, which improves the Powder Diffraction File in its purpose of identifying and characterizing inorganic solids. The Jerome B. Cohen Student Award was created this year by the Denver X-ray Conference Organizing Committee in honor of Dr. Cohen, a leader in the field of X-ray analysis and in the training of students in this art. Paul Predecki presented the award to Sven Vogel, a student from Kiel University, Kiel, Germany. Sven Vogel received the award for his paper entitled "Non-destructive In-situ Real Time Measurements of Structural Phase Transition Using Neutron Transmission". Paul Predecki presented an award to the ICDD acknowledging its many years of service to the X-ray analysis community. Contributions from the community were solicited by Vic Buhrke for this award. Cam Hubbard accepted the award on behalf of the ICDD.