49th Annual (2000) Denver X-ray Conference™
Denver Marriott Tech Center Hotel
Denver, Colorado, U.S.A.
July 31 - August 4

 

49th Annual (2000) DXC > Tuesday Workshops (August 1)
a.m. workshops: 9:00a.m.-12 noon      p.m. workshops: 2:00p.m.-5:00 p.m.
(unless otherwise noted)


Morning Workshops: XRD(W-9 & W-10) - XRF(W-11 & W-12)
Evening Workshops:  XRD(W-13 & W-14) - XRF(W-15 & W-16)

Workshops, Tuesday a.m.

XRD 
W-9 
Residual Stress Analysis (Evergreen A)

Organizer: I. C. Noyan IBM Research Division, Yorktown Heights, NY
C.C. Goldsmith IBM Microelectronics, Hopewell Junction, NY
Instructors: I. C. Noyan IBM Research Division, Yorktown Heights, NY
C.C. Goldsmith IBM Microelectronics, Hopewell Junction, NY
T. Nunes IBM Microelectronics (retired), Hopewell Junction, NY

This workshop will cover the basic theory of diffraction stress analysis and its application to real problems. Those who attend should be able to evaluate a result to see if it is consistent with applicable theory.

W-10 
Phase Transformation (Evergreen B)

Organizer: H. Jones Pratt & Whitney, East Hartford, CT
Instructors: H. Jones Pratt & Whitney, East Hartford, CT
A. Voskamp SKF Engineering and Research Centre B.V., DT Nieuwegein, The Netherlands
R. England Cummins Engine Company, Columbus, IN

 This workshop will review specific and general applications of X-ray diffraction to the study of phase transformations in metals. Specific applications will be the evaluation of retained austenite in heat treated steels before and after use and sample preparation methods to isolate phases for phase trans-formation studies in nickel superalloys. Wavelength and energy dispersive methods, sample preparation, stability of X-ray tubes, and examples of phase transformations in metal processing will be discussed. Crystal chemistry and use of ICDD products will also be included.

XRF

W-11 
Specimen Preparation – XRF I (8:30 a.m. – 12:00 noon) (Evergreen C)

Organizer: V. Buhrke The Buhrke Company, Portola Valley, CA
Instructors: J. Willis James Willis Consultants, Somerset West, South Africa
D. Broton Construction Technology Laboratories, Inc., Skokie, IL
R. Bostwick SPEX CertiPrep, Inc., Metuchen, NJ
B. Wheeler Rigaku/USA, Inc. (retired), Danvers, MA
L. Creasy TIMET, Morgantown, PA

This full day workshop will cover sample preparation of geological materials; fused bead preparation in the cement industry; cement kiln feed, raw materials and alternate raw materials; pitfalls in the use of sample preparation equipment; the preparation of liquid, small, and irregular shaped specimens; and the preparation of metal specimens for XRF analysis. A question and answer period will follow.

W-12 
Fundamental Parameters (Evergreen D)

Organizer: M. Mantler Vienna University of Technology, Vienna, Austria
Instructors: M. Mantler Vienna University of Technology, Vienna, Austria
B. Vrebos Philips Analytical, Almelo, The Netherlands
W.T. Elam Naval Research Laboratory, Washington, DC  

This workshop will cover: 

  • Atomic ("fundamental") parameters and tube spectra: Definitions, sources (tables, avail-able data files, computed data and related algorithms), accuracy 
  • Theoretical background: Physical-mathematical models for primary and secondary excitation, Coster-Kronig transitions; Conventional equations and Monte-Carlo methods 
  • Software issues: Technical aspects, availability 
  • Fundamental parameters and computed influence coefficients 
  • Thin films, inhomogeneous specimens, light elements 
  • Practical applications 

online support by (noncommercial) fundamental parameter software will be available.

Workshops, Tuesday p.m.

XRD

W-13 
Grazing Incidence (Evergreen B)

Organizer & Instructor: T.C. Huang Emeritus, IBM Almaden Research Center, San Jose, CA
Co-Chair: J. Harada Rigaku Corporation, Tokyo, Japan

This workshop covers the theoretical background, experimental methods and applications of grazing-incidence X-rays for the characterization of surfaces and thin films. Three commonly used grazing-incidence techniques are: the in-plane diffraction, asymmetric Bragg diffraction, and reflectivity. Technical details and the applications of these techniques for characterizing high-tech materials (e.g., high-density magnetic recording media, two-dimensional monolayer, Mo/Si multilayers, etc.) will be given.

W-14 
Texture Analysis (1:30 p.m. – 6:30 p.m.) (Evergreen D)

Organizer: R. De Angelis Visiting Professor, University of Florida, Shalimar, FL
H. Schaeben Freiberg University of Technology and Mining, Freiberg, Germany
Instructors: R. De Angelis Visiting Professor, University of Florida, Shalimar, FL
T. Snyder Union Pacific Railroad, Omaha, NE
H. Schaeben Freiberg University of Technology and Mining, Freiberg, Germany

This workshop covers the application of texture analysis and some of the pitfalls and difficulties encountered. Topics include: X-ray optics in texture determination from flat and slightly curved specimens; how background and defocusing corrections are handled in data analysis in determination of the integrated intensities; intensity data processing to pole figures, inverse pole figures and ODFs using popLA; textures of deformed copper and tantalum and of tapered steel roller bearings; determining fractions of major crystallographic poles texture data along fibers in ODF space. Evaluation of texture goniometer data with the results of scanning the spherical X-ray transform of an orientation density function is considered. A unifying view of texture analysis is presented as applied to spherical tomography.

XRF

W-15
Specimen Preparation – XRF II (1:00 p.m. – 4:45 p.m.) (Evergreen C)

Organizer: V. Buhrke The Buhrke Company, Portola Valley, CA
Instructors: J. Willis James Willis Consultants, Somerset West, South Africa
D. Broton Construction Technology Laboratories, Inc., Skokie, IL
R. Bostwick SPEX CertiPrep, Inc., Metuchen, NJ
B. Wheeler Rigaku/USA, Inc. (retired), Danvers, MA
L. Creasy TIMET, Morgantown, PA

Continuation of W-11.

W-16 
Quantitative Analysis – Standardless Methods (Evergreen A)

Organizer: J.A. Anzelmo Bruker AXS, Inc., Madison, WI
Instructors: J.A. Anzelmo Bruker AXS, Inc., Madison, WI
K.M. Mauser Bruker AXS GmbH, Karlsruhe, Germany
R. Yellepeddi ARL, Ecublens, Switzerland

Two approaches have emerged as the methods of performing so-called Standardless Analysis. The two approaches are 1) scanning, and 2) counting directly on peaks and backgrounds. This workshop will discuss various aspects of the two approaches such as the theory, data collection, data manipulation, calibration, sample preparation, and practical examples.