| Sun. eve.: 5:30-7:30 Welcoming
Reception Sponsored by: Bede Scientific, SPEX CertiPrep & Claisse
Scientifique (SP) |
| Day & Time |
XRD & XRF |
XRD |
XRF |
MON. am:
Workshops |
W-1 Cement Analysis
(Broton/Anzelmo) (TWI)
|
W-2 Small Angle
Scattering
(Londono) (RB) |
W-3 Intro to XRF
(Jenkins/Croke) (SP)
W-4 Total Reflection
(Zaitz/Wobrauschek) (BR) |
MON. pm:
Workshops |
W-5 Absorption
Analysis
(Rosenfeld) (RB)
W-6 Use of the Web as a
Resource
(Kottenhahn) (BR)
|
|
W-7 Maintenance and
Calibration of X-ray
Fluorescence Spectrometers
(Croke/Jenkins) (SP)
W-8 Fundamental Parameters
(Mantler) (TW) |
| Mon.
eve.: 6:30-8:30 XRD Poster Session I (Cox, Snyder) (SP) |
TUE. am:
Workshops
|
|
W-9 Industrial
Rietveld Applications
(Morton/Simon) (SP)
W-10 Two-Dimensional XRD
(Blanton/He) (TW)
W-11 Neutron Diffraction of Polymers
(Gardner) (RB)
|
W-12 Specimen
Preparation I
(Broton/Anzelmo) (BR) |
TUE. pm:
Workshops
|
|
W-13 Maintenance,
Alignment & Standards
(Noyan) (SP)
W-14 High Resolution XRD
(Tanner) (TW)
|
W-15 Specimen
Preparation II
(Broton/Anzelmo) (BR) |
| Tue.
eve.: 6:30-8:30 MDI and Rigaku/USA Reception and
XRD Poster Session II
(Huang, Predecki). Sponsored by: MDI and Rigaku/USA (SP) |
| Wed.
am:
8:30-12:30 Plenary Session: “Fifty Years of the Denver X-ray Conference”
(Jenkins/Gilfrich) (SGH) |
WED. pm:
Sessions
|
C-1 New Developments
in
XRD & XRF Instrumentation
(Commercial)
(Buhrke) (BR) |
D-1 R.A. Young
Rietveld Analysis
(Stock/Snyder) (SP)
D-2 Pharmaceuticals & Combinatorial
(Kidd) (RB) |
F-1 John Criss
Commemorative Session:
Quantitative XRF
(van Grieken/Gilfrich) (TW) |
| Wed.
eve:
6:30 – 8:30 Bruker AXS, Inc. Reception and
XRF Poster Session (Gilfrich/Havrilla).
Sponsored by: Bruker AXS, Inc. (SP) |
THURS. am:
Sessions
|
C-2 Synchrotron
Applications
(Macrander) (SP) |
D-3 Industrial
Applications – XRD
(Chung) (BR)
D-4 Polymers I: Multi-Probe Studies
(Gardner/Murthy) (TW)
|
F-2 Capillary Optics
(Havrilla) (RB) |
THURS. pm:
Sessions
|
C-3 Electron Beam
(Goehner) (SP) |
D-5 Stress Analysis I
(Goldsmith/Sasaki) (RB)
D-6 Polymers II: 2DWAXS & SAXS Data
Analysis/In Situ Struc. Dev.
(Barton/Londono) (TW) |
F-3 TXRF
(Zaitz) (BR) |
| Thurs.
eve: 50th Anniversary Poster Session and
Reception. Sponsored by the
Denver X-ray Conference (Poolside/Anniversary Tent) |
FRI. am:
Sessions
|
C-4 Microbeam Analysis
(Janssens) (BR) |
D-7 Stress Analysis II
(Goldsmith/Sasaki) (RB)
D-8 General Optics & High Resolution
(Kao/Haeffner/Harada/Huang) (TW) |
F-4 Industrial
Applications – XRF
(Broton) (SP) |