50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat Springs, Colorado, U.S.A.
30 July – 3 August

2001 Denver X-ray Conference™ > Monday XRD Poster Session I
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001

XRD Poster Session I, Monday, 30 July (Sunshine Peak)
(6:30 p.m. – 8:30 p.m., authors present)

Chairs:
D.E. Cox, Emeritus, Brookhaven National Laboratory, Upton, NY
R.L. Snyder, The Ohio State University, Columbus, OH

Session chairs will select the two best papers for awards.

THEORY

D-045 CALCULATION OF ATOMIC SCATTERING AND DEBYE-WALLER FACTORS: STEP TOWARD ACCURATE ESTIMATION FOR X-RAY POLARIZABILITY
A. Ulyanenkov, Bruker AXS, Karlsruhe, Germany
L.I. Komarov, I. Feranchuk, Belorussian State University, Minsk, Belarus

D-033 THE EFFECT OF POINT DEFECTS ON X-RAY DIFFRACTION LINE INTENSITIES
S. Grigull, European Synchrotron Radiation Facility, Grenoble Cedex, France

SOFTWARE

D-011 SNAP-1D: SOFTWARE FOR FULL-PROFILE POWDER DIFFRACTION PATTERN MATCHING AND QUANTITATIVE ANALYSIS
G. Barr, C.J. Gilmore, J. Paisley, University of Glasgow, Glasgow, United Kingdom

D-012 AUTOMATED PROCESSING OF 2D POWDER DIFFRACTION DATA
S. Vogel, Los Alamos National Laboratory, Los Alamos, NM
L. Ehm, K. Knorr, Christian Albrechts-Universität zu Kiel, Kiel, Germany

D-037 ESTIMATION OF ERRORS IN THE MEASUREMENT OF UNIT-CELL PARAMETERS: STATISTICAL UNCERTAINTIES OF PEAK POSITIONS OF POWDER DIFFRACTION LINES DETERMINED BY INDIVIDUAL PROFILE FITTING
H. Toraya, Nagoya Institute of Technology, Tajimi, Japan

D-122 BAYESIAN/MAXIMUM ENTROPY ANALYSIS OF NANOPARTICLE-BROADENED LINE PROFILES
N. Armstrong, National Institute of Standards & Technology, Gaithersburg, MD and University of Technology, Sydney, Australia
J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD
W. Kalceff, University of Technology, Sydney, Australia

D-144 FULL-PATTERN PROFILE ANALYSIS OF DIFFRACTION SCANS FROM SEMICRYSTALLINE POLYMERS
D. Agnihotri, R. Ortega, D. Winter, AMIA Laboratories, Austin, TX
N.S. Murthy, Honeywell Laboratories, Morristown, NJ

INSTRUMENTS & STANDARDS

D-008 NEW X-RAY DIFFRACTION STATION AT NIST-BOULDER
D. Balzar, D. Fitting, D. McColskey, N.C. Popa, R. Santoyo, T. Siewert, P. Spagnol, National Institute of Standards & Technology, Boulder, CO

D-016 DEVELOPMENT OF MgO CERAMIC STANDARDS FOR X-RAY AND NEUTRON LINE BROADENING ASSESSMENTS
S. Pratapa, B. O’Connor, Curtin University of Technology, Perth, Australia

D-054 A DIFFRACTOMETER FOR X-RAY DIFFRACTION STUDIES OF BOND COATS BENEATH THERMAL BARRIER COATINGS
K. Vaidyanathan, D. Pease, E. Jordan, M. Gell, University of Connecticut, Storrs, CT
H. Canistraro, University of Hartford, Hartford, CT
T. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN

D-084 CHARACTERIZATION OF MINIATURE LOW-POWER X-RAY TUBES
A. Reyes-Mena, D.C. Turner, S. Voronov, S. Cornaby, P. Moody, MOXTEK, Inc., Orem, UT
L.V. Knight, Brigham Young University, Provo, UT

D-085 ASPECTS OF A SIMULTANEOUS XRD/XRF INSTRUMENT DESIGN
P. Moody, A. Reyes-Mena, S. Cornaby, T. Grow, MOXTEK, Inc., Orem, UT
A. Stradling, T. Hughes, L.V. Knight, Brigham Young University, Provo, UT

C-03 SIMULTANEOUS XRF/XRD WITH LOW-POWER X-RAY TUBES
S. Cornaby, A. Reyes-Mena, P.W. Moody, T. Grow, MOXTEK, Inc., Orem, UT
T. Hughes, A. Stradling, L.V. Knight, Brigham Young University, Provo, UT

D-146 EVALUATION OF SPECIMEN DISPLACEMENT ERRORS IN HIGH TEMPERATURE POWDER DIFFRACTION FURNACES
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
C.R. Hubbard, X.L. Wang, Oak Ridge National Laboratory, Oak Ridge, TN

D-153 RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER AND POLYCAPILLARY OPTICS
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

IN SITU

D-101 USE OF IN-SITU XRD TO DEVELOP CONDUCTING CERAMICS WITH THE AURIVILLIUS CRYSTAL STRUCTURE
S. Speakman, M.S. Haluska, V.B. Modi, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

D-100 IN-SITU XRD TO OPTIMIZE POWDER SYNTHESIS OF AURIVILLIUS PHASES
M.S. Haluska, S. Speakman, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

D-052 STUDIES OF THERMAL EXPANSION OF CALCIUM ALUMINATES USING HIGH TEMPERATURE SYNCHROTRON X-RAY DIFFRACTION
Y. Gao, B. Nyiri, General Electric Corporate Research & Development, Schenectady, NY
J.Y. Kim, J. Hanson, J.Z. Larese, Brookhaven National Laboratory, Upton, NY

D-065 THE ANALYSIS OF INCONEL 690 OXIDATION PRODUCTS AND MEASUREMENT OF THEIR GROWTH RATES AS A FUNCTION OF TEMPERATURE USING X-RAY
DIFFRACTION
A.R. Jurgensen, D.M. Missimer, K.J. Imrich, M.E. Summer, Westinghouse Savannah River Site, Aiken, SC

D-120 THERMAL EXPANSION AND HYDRATION OF NaAlO2
R.A. Peascoe, C.R. Hubbard, J.R. Keiser, Oak Ridge National Laboratory, Oak Ridge, TN
J.P. Gorog, Weyerhaeuser Company, Tacoma, WA

D-128 HIGH TEMPERATURE X-RAY DIFFRACTION STUDY OF PHASE TRANSFORMATIONS IN SrZrO3
E.A. Payzant, B.C. Chakoumakos, Oak Ridge National Laboratory, Oak Ridge, TN

D-142 IN-SITU HIGH TEMPERATURE XRD ANALYSIS OF HTSC TAPES
K. Pathak, M.B. Dickerson, K.H. Sandhage, R.L. Snyder, The Ohio State University, Columbus, OH

QUANTITATIVE

D-024 QUANTITATIVE ANALYSIS OF HYDROXYLAPATITE-ZIRCONIA BIOMATERIAL USING THE RIETVELD METHOD
A.V.C. Andrade, UNESP - Instituto de Química de Araraquara, São Paulo, Brazil and DEFIS-CIPP-Universidade Estadual de Ponta Grossa, Paraná, Brazil
J. Caetano Zurita, D.A. Barbato, DEFIS-CIPP—Universidade Estadual de Ponta Grossa, Paraná, Brazil
C.O. Paiva-Santos, J.A. Varela, J.L. Amaral, R.D. Adati, UNESP—Instituto de Química de Araraquara, São Paulo, Brazil

D-050 IDENTIFICATION AND QUANTIFICATION OF A NOVEL FLY ASH COATING, STEKLITE, BY RIETVELD QUANTITATIVE X-RAY DIFFRACTION
T.D. Lorbiecke, R.M. Gonzalez, B.W. McIntyre, R.S. Winburn, Minot State University, Minot, ND
J.D. Cathcart, M. Brownfield, U.S. Geological Survey, Denver, CO

D-051 FACTORS INFLUENCING QUANTITATIVE RESULTS FOR COAL COMBUSTION BY-PRODUCTS USING THE RIETVELD METHOD
R.M. Gonzalez, T.D. Lorbiecke, B.W. McIntyre, R.S. Winborn, Minot State University, Minot, ND

INORGANIC MATERIALS

D-023 X-RAY POWDER DIFFRACTION CHARACTERIZATION OF THE SEMICONDUCTING COMPOUNDS Ag2FeSnS4 AND Ag2FeSn3S8
G. Delgado, J.M. Delgado, Laboratorio Nacional de Difracción de Rayos-X and Universidad de Los Andes, Mérida, Venezuela
E. Quintero, R. Tovar, M. Quintero, Universidad de Los Andes, Mérida, Venezuela

D-025 RIETVELD ANALYSIS OF PEROVSKITE AND PYROCHLORE Me DOPED PZN (Me=Ba or Ti)
A.V.C. Andrade, UNESP—Instituto de Química de Araraquara, São Paulo, Brazil and DEFIS-CIPP—Universidade Estadual de Ponta Grossa, Parana, Brazil
C.O. Paiva-Santos, M.A. Zaghete, J.A. Varela, UNESP—Instituto de Química de Araraquara, São Paulo, Brazil

D-034 RIETVELD REFINEMENT ANALYSIS OF EMD XRD POWDER PATTERNS AND A STRUCTURAL INTERPRETATION
D.E. Simon, DES Consulting, Broken Arrow, OK
T. Andersen, C.D. Elliott, Kerr McGee Chemical LLC, Oklahoma City, OK

D-060 USE OF AN ACCURATE STRUCTURE DATA FROM X-RAY POWDER DIFFRACTION TO SIMULATE THE MAGNETIC PROPERTIES OF RARE EARTHS
J. Hölsä, University of Turku, Turku, Finland and ENSCP, CNRS, Paris, France
M. Lahtinen, J. Valkonen, University of Jyväskylä, Jyväskylä, Finland
M. Lastusaari, J. Nittykoski, University of Turku, Turku, Finland and Graduate School of Materials Research, Turku, Finland
P. Porcher, ENSCP, CNRS, Paris, France
R.S. Puche, Ciudad Universitaria, Madrid, Spain

D-042 CRYSTAL STRUCTURE OF AgRSb2 (R=Pr, Nd, Gd, Dy, Ho, Er)
L. Zeng, X. Xie, Guangxi University, Guangxi, P.R. of China
H.F. Franzen, Iowa State University, Ames, IA

D-093 X-RAY DIFFRACTOMETRY STUDIES ON 5-AMINOTETRAZOLE-Fe2O3-KNO3 SYSTEM
D. Chandra, W.-M. Chien, University of Nevada, Reno, NV
C.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TN
A.K. Helmy, TRW Incorporated, Lockwood, NV

D-055 SOLID STATE PHASE TRANSITIONS OF NH4NO3-KNO3 BINARY SYSTEM
W.-M. Chien, D. Chandra, J. Smith, University of Nevada, Reno, NV
C.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TN
A.K. Helmy, TRW Incorporated, Lockwood, NV

For more information please contact Denise Zulli - zulli@icdd.com