50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat Springs, Colorado, U.S.A.
30 July – 3 August

2001 Denver X-ray Conference™ > Wednesday XRF Poster Session
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001

XRF Poster Session, Wednesday, 1 August (Sunshine Peak)
6:30 p.m. – 8:30 p.m., authors present
The XRF Poster Session will be held in conjunction with the Bruker AXS, Inc. mixer.

Chairs: 
J. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC
G. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

Session chairs will select the two best papers for awards.

XRF INSTRUMENTATION

F-01 DISCOVERY OF LIGHT EMISSION FROM XRF SOURCES
M.A. Padmanabha Rao, New Delhi, India

F-15 NANOSTAR: A IN SITU COMBINATION OF SMALL-ANGLE X-RAY SCATTERING (SAXS) AND X-RAY FLUORESCENCE (XRF)
R. Görgl, K. Erlacher, Material Center Leoben GmbH, Leoben, Austria and Erich Schmid Institute, Austrian Academy of Sciences & University of Leoben, Austria
P. Doppler, Anton-Paar GmbH, Graz, Austria
H.F. Jakob, Bruker AXS GmbH, Karlsruhe, Germany
P. Fratzl, Erich Schmid Institute, Austrian Academy of Sciences & University of Leoben, Austria
P. Wobrauschek, C. Streli, Atominstitute of the Austrian Universities, Vienna, Austria

F-03 USABILITY OF PORTABLE X-RAY SPECTROMETERS FOR DISCRIMINATION OF VALENCE STATES
I.A. Brytov, R.I. Plotnikov, B.D. Kalinin, Bourevestnik Research & Manufacturing Co., St. Petersburg, Russia

F-02 DEEP MULTILAYER GRATINGS WITH ADJUSTABLE BANDPASS FOR XRF SPECTROSCOPY
V.V. Martynov, Yu. Platonov, Osmic, Inc., Troy, MI

F-58 OPTICS FOR ANGULAR FILTERING OF X-RAYS IN 2 DIMENSIONS 
J. P. Nicolich, D.M. Gibson, X-ray Optical Systems, Inc., Albany, NY

F-16 A XRF METHOD BASED ON SELECTIVE EXCITATION AND INTEGRAL COUNTING OF THE SAMPLE EMISSION PHOTON
R.F. Saavedra, Universidad de La Frontera, Temuco, Chile

F-55 A WINDOWLESS Si ANODE X-RAY TUBE FOR THE EFFICIENT EXCITATION OF LOW Z ELEMENTS ON Si WAFER SURFACES WITH TXRF
C. Streli, P. Wobrauschek, K. Proksch, L. Fabry, Atominstitut der Österreichischen Universitäten, Vienna, Austria
S. Pahlke, Wacker Siltronic, Burghausen, Germany

F-49 X-RAY FOCUSING CRYSTAL VON HAMOS SPECTROMETER WITH A CCD LINEAR ARRAY AS A DETECTOR
A. Antonov, I. Grigorieva, Y. Kasyanov, A. Shevelko, O. Yakushev, P.N. Lebedev, Physical Institute of the Russian Academy of Sciences, Moscow, Russia
L. Knight, Q. Wang, Brigham Young University, Provo, UT

F-45 NON-DESTRUCTIVE 3D STRUCTURAL STUDIES BY X-RAY MICROTOMOGRAPHY
G.R. Davis, S.E.P. Dowker, P. Anderson, H.S. Wassif, University of London, London,
United Kingdom
A. Boyde, University College, London, United Kingdom
S.R. Stock, Georgia Institute of Technology, Atlanta, GA

F-61 HIGH CONTRAST IMAGING WITH POLYCAPILLARY OPTICS
C.A. MacDonald, W.M. Gibson, University of Albany, Albany, NY

F-24 QUANTITATIVE X-RAY FLUORESCENCE ANALYSIS AT THE ESRF ID18F MICROPROBE
B. Vekemans, L. Vincze, A. Somogyi, L. Kempenaers, F. Adams, MiTAC, University of Antwerp, Wilrijk, Belgium
M. Drakopoulos, A. Snigirev, ID22 European Synchrotron Radiation Facility, Grenoble Cedex, France

F-23 THE ID18F MICROPROBE ENDSTATION AT THE EUROPEAN SYNCHROTRON RADIATION FACILITY (ESRF)
A. Somogyi, L. Vincze, B. Vekemans, F. Adams, University of Antwerp, Antwerp, Belgium
M. Drakopoulos, M. Kocsis, A. Snigirev, European Synchrotron Radiation Facility, Grenoble Cedex, France

F-10 PRODUCTION OF HIGH ENERGY X-RAY MICRO-BEAM AND AN EXAMPLE OF MICRO-X-RAY FLUORESCENCE APPLICATION AT SPring-8 UNDULATOR BEAM LINE
N. Kamijo, SPring-8, Hyogo, Japan and Kansai Medical University, Osaka, Japan
Y. Suzuki, M. Awaji, A. Takeuchi, H. Takano, SPring-8, Hyogo, Japan
T. Ninomiya, Forensic Science Laboratory of Hyogo Prefecture Plolice, Koube, Japan
S. Tamura, Osaka National Research Institute, Osaka, Japan

XRF APPLICATION

F-62 ANALYSIS OF SODIUM AND SULFUR IN A PORTLAND CEMENT BY XRF WITH FUSED BEADS ON AN AUTOMATIC GAS FUSION MACHINE
M. Davidts, I.C.P.H. Chemical International, Philadelphia, PA

F-31 QUANTITATIVE EVALUATION OF Ni CONCENTRATION ON AMORPHOUS Si AT THE PPB LEVEL USING MICROSAMPLE X-RAY ANALYSIS
H.J. Kwon, K.H. Park, J.S. Lee, LG Electronics Institute of Technology, Seoul, Korea
B. Kim, LG. Philips LCD Research Center, Anyang, Korea
H.R. Yun, G. Lee, Alpha Science Corp., Seoul, Korea
J.R. Bogert, D. Leland, Thermo NORAN, Middleton, WI

F-05 APPLICATION OF X-RAY SPECTROMETRY FOR ANALYSIS OF WASTE WATER
L.P. Eksperiandova, A.B. Blank, Y.N. Makarovskaya, Institute for Single Crystals, National Academy of Sciences of Ukraine, Kharkov, Ukraine

F-33 CHEMICAL INFORMATION FROM X-RAY EMISSION SPECTRA
W.T. Elam, University of Washington Engineered Biomaterials Center, Seattle, WA
J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD
A.L. Ankudinov, J.J. Rehr, University of Washington, Seattle, WA

F-44 QUANTIFICATION OF CADMIUM, MERCURY AND LEAD IN AQUEOUS SAMPLE BY ENERGY K X-RAY FLUORESCENCE SPECTROSCOPY
P. Suwanathada, T.A. DeVol, Clemson University, Anderson, SC

F-47 TRACE ELEMENT ANALYSIS OF Nb AND RARE EARTH ELEMENTS IN METAL ALLOYS: COMPARISON OF Sr-TXRF WITH Sr-XRF ON THIN FILMS (AP1™)
G. Pepponi, P. Wobrauschek, C. Streli, C. Jokubonis, Atominstitut der Österreichischen Universitäten, Vienna, Austria
F. Hegedüs, P. Winkler, EPFL-CRPP, Villigen PSI, Switzerland
G. Falkenberg, HASYLAB, DESY, Hamburg, Germany

F-26 FUNDAMENTAL PARAMETERS ALGORITHM FOR SEICXRF METHOD APPLIED TO BINARY AND TERNARY SAMPLES
M. García, R. Figueroa, R. Rivera, La Frontera University, Temuco, Chile

F-51 BACKGROUND SUBTRACTION FOR TRACE-ELEMENT ANALYSIS—ANALYTICAL COMPARISON OF METHODS
R.A. Couture, Washington University, St. Louis, MO

F-57 QUANTITATIVE CHARACTERIZATION OF ELECTROSORPTION OF Cr SPECIES ON POLYCRYSTALLINE GOLD WITH X-RAY SPECTROMETRY
I. Szalóki, University of Debrecen, Debrecen, Hungary
K. Varga, University of Veszprém, Veszprém, Hungary
R. van Grieken, University of Antwerp, Antwerp, Belgium

F-36 THE LINE OVERLAP CORRECTION BY THEORETICAL INTENSITY
J.E. Martin, A. Martin, Rigaku/MSC, The Woodlands, TX
Y. Yamada, N. Kawahara, Y. Kataoka, H. Kohno, Rigaku Industrial Corporation, Osaka, Japan

F-56 TXRF-XANES TRACE ANALYSIS OF ORGANIC AND LOW Z COMPOUNDS ON Si WAFER SURFACES EXCITED BY MONOCHROMATISED UNDULATOR RADIATION
G. Pepponi, Atominstitut der Österreichischen Universitäten, Vienna, Austria
B. Beckhoff, G. Ulm, R. Fliegauf, J. Weser, Physikalisch-Technische Bundesanstalt, Berlin, Germany
T. Ehmann, Wacker Siltronic AG, Burghausen, Germany

F-07 RAPID WHOLE-SURFACE ANALYSIS OF SEMICONDUCTORS BY THE USE OF TXRF 
Y. Mori, K. Uemura, Nippon Steel Corporation, Yamaguchi, Japan
Y. Iizuka, The University of Tokyo, Tokyo, Japan

F-59 MONITORING OF PHOSPHOROUS LEVELS IN VARIOUS PROCESS STEPS BY TXRF IN SEMICONDUCTOR MANUFACTURING
A.R. Ghatak-Roy, D. Kulik, M. McBride, T. Z. Hossain, Advanced Micro Devices, Inc., Austin, TX

F-20 QUANTITATIVE ANALYSIS OF LOW-Z ELEMENTS IN TOTAL REFLECTION X-RAY
FLUORESCENCE SPECTROSCOPY
M. Doi, M. Yamagami, T. Shoji, T. Yamada, Rigaku Corporation, Osaka, Japan

F-63 TXRF TO MONITOR FOR HIGH K DIELECTRIC MATERIAL CONTAMINATION IN A SEMICONDUCTOR FAB
C. Sparks, International SEMATECH, Austin, TX

F-41 INVESTIGATION OF THE INFLUENCE OF PARTICLE SIZE ON THE QUANTITATIVE ANALYSIS OF GLASSES BY ENERGY-DISPERSIVE MICRO X-RAY FLUORESCENCE SPECTROMETRY
T.C. Roedel, H. Bronk, Technical University of Berlin, Germany
M. Haschke, Röntgenanalytik Messtechnik GmbH, Taunusstein, Germany

F-46 APPLICATIONS OF PCFPW FUNDAMENTAL PARAMETERS SOFTWARE IN CORPORATE R&D AND QUALITY CONTROL ANALYTICAL LABORATORIES
L. Brehm, M. Buchmann, B. Haskins, Dow Analytical Sciences, Midland, MI
D. Burns, S. Chaudhary, Dow Analytical Sciences, Freeport, TX
K. Dunker, Dow Automotive, Auburn Hills, MI

For more information please contact Denise Zulli - zulli@icdd.com