50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat Springs, Colorado, U.S.A.
30 July – 3 August

2001 Denver X-ray Conference™ > Friday Sessions
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001

Session, Friday a.m. (Buddy’s Run)
XRD & XRF

Session C-4 Microbeam Analysis
Organized by: K. Janssens, University of Antwerp (UIA), Antwerp, Belgium

8:00 D-151 DESKTOP X-RAY TOMOGRAPHY: INSTRUMENTATION AND APPLICATIONS – Invited
D. Van Dyck, University of Antwerp, Antwerp, Belgium
8:30 F-34 POLYCAPILLARY OPTICS BASED NEUTRON FOCUSING FOR SMALL SAMPLE
NEUTRON CRYSTALLOGRAPHY
W.M. Gibson, R. Youngman, X-ray Optical Systems, Inc., Albany, NY
H.H. Chen-Mayer, D.F.R. Mildner, H.J. Prask, T. Gnäupel-Herold, National
Institute of Standards & Technology, Gaithersburg, MD
A.J. Schultz, M.E. Miller, R. Vitt, Argonne National Laboratory, Argonne, IL
8:50 D-133 INVESTIGATION OF FIBER/MATRIX INTERFACES USING X-RAY
MICROTOPOGRAPHY
J.C. Hanan, E. Ustundag, C.C. Aydiner, G.A. Swift, California Institute of
Technology, Pasadena, CA
S.K. Kaldor, I.C. Noyan, T.J. Watson Research Center, Yorktown Heights, NY
9:10 F-30 COMPARISON OF STANDARDS OF PERFORMANCE FOR MONOLITHIC
POLYCAPILLARY FOCUSING OPTICS
S. Formica, X-ray Optical Systems, Inc., Albany, NY and University at Albany,
Albany, NY
D. Gibson, X-ray Optical Systems, Inc., Albany, NY
S.M. Lee, University at Albany, Albany, NY
9:30 C-02 MONOCHROMATIC MICRO X-RAY BEAM USING DOUBLY CURVED CRYSTAL
OPTICS
Z.W. Chen, X-ray Optical Systems, Inc., Albany, NY
9:50 D-028 PREDICTING FATIGUE FAILURE USING TWO DIMENSIONAL X-RAY DETECTORS
M.O. Eatough, R.G. Tissot, R.P. Goehner, Sandia National Labs, Albuquerque, NM
10:10  BREAK BREAK
10:30 F-13 QUANTITATIVE ANALYSIS USING MICRO X-RAY FLUORESCENCE – Invited
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
11:00 D-111 MONOCAPILLARY SYSTEMS FOR QUANTITATIVE LAB MICRODIFFRACTION –
Invited
D.X. Balaic, Australian X-ray Capillary Optics Pty. Ltd., Parkville, Australia
11:30 C-06 FOCUSING OF HARD X-RAY RADIATION BY FRESNEL MODIFIED ZONE PLATES
V.V. Aristov, A.A. Isoyan, A.V. Kuyumchyan, E.V. Shulakov, M.V. Grigor’ev,
Russian Academy of Science, Moscow District, Russia   

  

Session, Friday a.m. (Rainbow)
XRD

Session D-7 Stress Analysis II
Organized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY
co-Chair: T. Sasaki, Kanazawa University, Kanazawa, Japan

8:20 D-074 A STUDY OF TWINNING EVOLUTION IN ZIRCONIUM BY NEUTRON
DIFFRACTION AND POLYCRYSTALLINE MODELING
P. Rangaswamy, D.W. Brown, G.C. Kaschner, C. Tome, M.A.M. Bourke,
M.G. Stout
, Los Alamos National Laboratory, Los Alamos, NM
8:40 D-097 UNIAXIAL TENSILE DEFORMATION OF URANIUM 6 WEIGHT PERCENT
NIOBIUM; A NEUTRON DIFFRACTION STUDY OF DEFORMATION TWINNING
D.W. Brown, M.A.M. Bourke, P.S. Dunn, R.D. Field, M.G. Stout, D.J.
Thoma
, Los Alamos National Laboratory, Los Alamos, NM
9:00 D-001 THE USE OF XRD RESIDUAL STRESS DETERMINATION TECHNIQUE FOR
HYDROGEN EMBRITTLEMENT DETECTION ON HIGH-STRENGTH STEEL
AND SHOT-PEENING TREATMENTS EVALUATION ON Ti-6Al-4V ALLOY
R. Capriotti, M. Colavita, F. De Paolis, Italian Air Force, Pratica di Mare (RM), Italy
9:20 D-082 STRAIN AND TEXTURE MEASUREMENTS USING HIGH-ENERGY X-RAYS
J. Almer, U. Lienert, D. Haeffner, Argonne National Laboratory, Argonne, IL
M. Oden, Linkoping University, Linkoping, Sweden
9:40 BREAK BREAK
10:00 D-032 ANALYSIS OF STEEP STRESS GRADIENT BY USING SYNCHROTRON RADIATION
K. Akita, H. Suzuki, Tokyo Metropolitan University, Tokyo, Japan
Y. Yoshioka, Musashi Institute of Technology, Tokyo, Japan
10:20 D-026 A NEW REGULARIZATION METHOD TO DETERMINE STRAINS/STRESS DEPTH
PROFILES FROM DIFFRACTION EXPERIMENTS
H. Wern, P. Klein, G. Marchand, HTW des Saarlandes, Saarbrücken, Germany
10:40 D-145 BENDING TECHNIQUES FOR X-RAY ELASTIC CONSTANTS DETERMINATION –
Invited
I.C. Noyan, IBM, Yorktown Heights, NY
S.K. Kaldor, Columbia University, New York, NY

     

Session, Friday a.m. (Twilight)
XRD

Session D-8 General Optics & High Resolution XRD
Organized by C.-C. Kao, Brookhaven National Laboratory, NSLS, Upton, NY
D. Haeffner, Argonne National Laboratory, Argonne, IL
J. Harada, Rigaku Corporation, Tokyo, Japan
co-Chair: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA

8:00 D-155 X-RAY PHASE CONTRAST IMAGING – Invited
W.-K. Lee, Argonne National Laboratory, Argonne, IL
8:30 D-154 X-RAY OPTICS FOR A 3-D X-RAY CRYSTAL MICROSCOPE: SUBMICRON POLYCHROMATIC DIFFRACTION FROM POLYCRYSTALLINE MATERIALS – Invited
G. Ice, Oak Ridge National Laboratory, Oak Ridge, TN
9:00 D-076 DEVELOPMENT OF INTERFEROMETRIC X-RAY IMAGING AT THE ADVANCED
PHOTON SOURCE
K. Fezzaa, W.-K. Lee, Argonne National Laboratory, Argonne, IL
9:20 D-049 SAGITTAL FOCUSING OF HIGH-ENERGY X-RAYS – Invited
Z. Zhong, D.P. Siddons, C.C. Kao, J.B. Hastings, NSLS, Brookhaven National
Laboratory, Upton, NY
N. Zhong, Medical Dept., Brookhaven National Laboratory, Upton, NY
9:50 D-017 COLLIMATING AND FOCUSING POLYCAPILLARY OPTICS FOR POWDER
DIFFRACTION
H. Huang, C.A. MacDonald, University at Albany, Albany, NY
W.M. Gibson, I. Ponomarev, X-ray Optical Systems, Inc., Albany, NY
J. Chik, A. Parsegian, National Institutes of Health, Bethesda, MD
10:10 BREAK BREAK
10:30 D-080 XRD CHARACTERIZATION AND MODELLING OF EPITAXIAL PEROVSKITE
Pb(ZrxTil-x)O3 FILMS GROWN UNDER HYDROTHERMAL CONDITIONS

K. Mikulka-Bolen, M. Oledzka, W. Suchanek, W. Mayo, R. Riman, Rutgers University, Piscataway, NJ
T. Ryan
, Emcore, Inc., Somerset, NJ
V. Kogan,
Philips Analytical, Almelo, Netherlands
L. McCandlish,
Ceremaré Corp., Highland Park, NJ
10:50 D-013 HIGH RESOLUTION POWDER DIFFRACTOMETER INSTALLED ON SPring-8 –
Invited
M. Takata, E. Nishibori, K. Kato, M. Sakata, Nagoya University, Nagoya, Japan
Y. Kubota, Osaka Women’s University, Osaka, Japan
Y. Kuroiwa, Okayama University, Okayama, Japan
11:20 D-005 HIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENT
OF SUB-SURFACE DAMAGE BELOW POLISHED SURFACES OF CERAMICS
B.K. Tanner, T.P.A. Hase, University of Durham, Durham, United Kingdom
H.Z. Wu, University of Oxford, Oxford, United Kingdom
11:40 D-043 X-RAY DIFFRACTION STUDIES OF HETEROEPITAXIAL GROWTH OF RARE
EARTH FLUORIDE FILMS
K. Inaba, J. Harada, K. Omote, Rigaku Corporation, Tokyo, Japan
J.M. Ko, A. Yoshikawa, Tohoku University, Sendai, Japan
12:00 D-046 DIFFUSE X-RAY SCATTERING FROM GaAs/AlAs SUPERLATTICES: NEW
THEORETICAL APPROACH FOR DATA INTERPRETATION
A. Ulyanenkov, H. Ress, Bruker AXS, Karlsruhe, Germany
I. Feranchuk, A. Minkevich, Belorussian State University, Minsk, Belarus
J. Grenzer, Potsdam University, Potsdam, Germany

         

Session, Friday a.m. (Sunshine Peak)
XRF

Session F-4 Industrial Applications — XRF
Organized by: D. Broton, Construction Technology Labs, Skokie, IL

8:00 C-07 XRF AND XRD APPLICATIONS IN IRON AND STEEL INDUSTRY – Invited
R. Yellepeddi, ARL SA, Ecublens, Switzerland
8:30   HIGH FREQUENCY ON-LINE XRF ANALYSIS FOR RAW FEED CONTROL IN
CEMENT PLANTS – Invited
J. Kemmerer, FLS Automation, Hunt Valley, MD
9:00 F-54 Sr-XRF INVESTIGATION OF HUMAN BONE
P. Wobrauschek, G. Pepponi, C. Streli, C. Jokubonis, Atominstitut der
Österreichischen Universitäten, Vienna, Austria
G. Falkenberg, HASYLAB, DESY, Hamburg, Germany
W. Osterode, Universitätsklinik für Innere Medizin IV, Vienna, Austria
9:20 F-18 XRF ANALYSIS OF AUTOMOTIVE CATALYSTS BY FLUX/FUSION
A.R. Drews, Ford Research Laboratories, Dearborn, MI
9:40 F-27 COMPOSITION MEASUREMENTS OF SnPb SOLDER BUMP ON C4 FLIP CHIP
INTERCONNECTION FOR SEMICONDUCTOR PACKAGE INDUSTRY
T. He, CMI International Corporation, Elk Grove Village, IL
10:00 BREAK BREAK
10:20 F-21 ANALYSIS OF LEAD IN CANDLE PARTICULATE EMISSIONS BY XRF USING
UNIQUANT 4
S.J. Wasson, Z. Guo, U.S. EPA, Research Triangle Park, NC
10:40 F-06 A SAFE, QUICK AND RELIABLE FUSION METHOD FOR SILICON AND
FERROSILICON
J. Blanchette, Corporation Scientifique Claisse, Inc., Sainte-Foy (Québec), Canada
11:00 F-42 USE OF MICRO-BEAM X-RAY FLUORESCENCE AS AN EFFECTIVE
ANALYTICAL TOOL FOR COMBINATORIAL CHEMISTRY
M. Haschke, Röntgenanalytik Messtechnik GmbH, Taunusstein, Germany
J. Klein, U. Vietze, W. Stichert, HTE GmbH, Heidelberg, Germany