2001 Denver X-ray Conference™ > Friday Sessions Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001 2001 DXC - Quick Links Choose One DXC 2001 Home 2001 DXC Summary Accommodations and Travel Registration Information Exhibitor Information Evening Technical Sessions and Social Functions General Information Monday Workshops Tuesday Workshops Monday XRD Poster Session I Tuesday XRD Poster Session II Wednesday XRF Poster Session Thursday 50th Anniversary Poster Session Wednesday Sessions - including Plenary Thursday Sessions Friday Sessions Summer Activities in Steamboat Springs Directions to Sheraton Steamboat Resort Hotel Layout and Local Maps Travel Form Program at a Glance DXC Main Home Session, Friday a.m. (Buddy’s Run) XRD & XRF Session C-4 Microbeam Analysis Organized by: K. Janssens, University of Antwerp (UIA), Antwerp, Belgium 8:00 D-151 DESKTOP X-RAY TOMOGRAPHY: INSTRUMENTATION AND APPLICATIONS – Invited D. Van Dyck, University of Antwerp, Antwerp, Belgium 8:30 F-34 POLYCAPILLARY OPTICS BASED NEUTRON FOCUSING FOR SMALL SAMPLE NEUTRON CRYSTALLOGRAPHY W.M. Gibson, R. Youngman, X-ray Optical Systems, Inc., Albany, NY H.H. Chen-Mayer, D.F.R. Mildner, H.J. Prask, T. Gnäupel-Herold, National Institute of Standards & Technology, Gaithersburg, MD A.J. Schultz, M.E. Miller, R. Vitt, Argonne National Laboratory, Argonne, IL 8:50 D-133 INVESTIGATION OF FIBER/MATRIX INTERFACES USING X-RAY MICROTOPOGRAPHY J.C. Hanan, E. Ustundag, C.C. Aydiner, G.A. Swift, California Institute of Technology, Pasadena, CA S.K. Kaldor, I.C. Noyan, T.J. Watson Research Center, Yorktown Heights, NY 9:10 F-30 COMPARISON OF STANDARDS OF PERFORMANCE FOR MONOLITHIC POLYCAPILLARY FOCUSING OPTICS S. Formica, X-ray Optical Systems, Inc., Albany, NY and University at Albany, Albany, NY D. Gibson, X-ray Optical Systems, Inc., Albany, NY S.M. Lee, University at Albany, Albany, NY 9:30 C-02 MONOCHROMATIC MICRO X-RAY BEAM USING DOUBLY CURVED CRYSTAL OPTICS Z.W. Chen, X-ray Optical Systems, Inc., Albany, NY 9:50 D-028 PREDICTING FATIGUE FAILURE USING TWO DIMENSIONAL X-RAY DETECTORS M.O. Eatough, R.G. Tissot, R.P. Goehner, Sandia National Labs, Albuquerque, NM 10:10  BREAK BREAK 10:30 F-13 QUANTITATIVE ANALYSIS USING MICRO X-RAY FLUORESCENCE – Invited G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM 11:00 D-111 MONOCAPILLARY SYSTEMS FOR QUANTITATIVE LAB MICRODIFFRACTION – Invited D.X. Balaic, Australian X-ray Capillary Optics Pty. Ltd., Parkville, Australia 11:30 C-06 FOCUSING OF HARD X-RAY RADIATION BY FRESNEL MODIFIED ZONE PLATES V.V. Aristov, A.A. Isoyan, A.V. Kuyumchyan, E.V. Shulakov, M.V. Grigor’ev, Russian Academy of Science, Moscow District, Russia       Session, Friday a.m. (Rainbow) XRD Session D-7 Stress Analysis II Organized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY co-Chair: T. Sasaki, Kanazawa University, Kanazawa, Japan 8:20 D-074 A STUDY OF TWINNING EVOLUTION IN ZIRCONIUM BY NEUTRON DIFFRACTION AND POLYCRYSTALLINE MODELING P. Rangaswamy, D.W. Brown, G.C. Kaschner, C. Tome, M.A.M. Bourke, M.G. Stout, Los Alamos National Laboratory, Los Alamos, NM 8:40 D-097 UNIAXIAL TENSILE DEFORMATION OF URANIUM 6 WEIGHT PERCENT NIOBIUM; A NEUTRON DIFFRACTION STUDY OF DEFORMATION TWINNING D.W. Brown, M.A.M. Bourke, P.S. Dunn, R.D. Field, M.G. Stout, D.J. Thoma, Los Alamos National Laboratory, Los Alamos, NM 9:00 D-001 THE USE OF XRD RESIDUAL STRESS DETERMINATION TECHNIQUE FOR HYDROGEN EMBRITTLEMENT DETECTION ON HIGH-STRENGTH STEEL AND SHOT-PEENING TREATMENTS EVALUATION ON Ti-6Al-4V ALLOY R. Capriotti, M. Colavita, F. De Paolis, Italian Air Force, Pratica di Mare (RM), Italy 9:20 D-082 STRAIN AND TEXTURE MEASUREMENTS USING HIGH-ENERGY X-RAYS J. Almer, U. Lienert, D. Haeffner, Argonne National Laboratory, Argonne, IL M. Oden, Linkoping University, Linkoping, Sweden 9:40 BREAK BREAK 10:00 D-032 ANALYSIS OF STEEP STRESS GRADIENT BY USING SYNCHROTRON RADIATION K. Akita, H. Suzuki, Tokyo Metropolitan University, Tokyo, Japan Y. Yoshioka, Musashi Institute of Technology, Tokyo, Japan 10:20 D-026 A NEW REGULARIZATION METHOD TO DETERMINE STRAINS/STRESS DEPTH PROFILES FROM DIFFRACTION EXPERIMENTS H. Wern, P. Klein, G. Marchand, HTW des Saarlandes, Saarbrücken, Germany 10:40 D-145 BENDING TECHNIQUES FOR X-RAY ELASTIC CONSTANTS DETERMINATION – Invited I.C. Noyan, IBM, Yorktown Heights, NY S.K. Kaldor, Columbia University, New York, NY       Session, Friday a.m. (Twilight) XRD Session D-8 General Optics & High Resolution XRD Organized by C.-C. Kao, Brookhaven National Laboratory, NSLS, Upton, NY D. Haeffner, Argonne National Laboratory, Argonne, IL J. Harada, Rigaku Corporation, Tokyo, Japan co-Chair: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA 8:00 D-155 X-RAY PHASE CONTRAST IMAGING – Invited W.-K. Lee, Argonne National Laboratory, Argonne, IL 8:30 D-154 X-RAY OPTICS FOR A 3-D X-RAY CRYSTAL MICROSCOPE: SUBMICRON POLYCHROMATIC DIFFRACTION FROM POLYCRYSTALLINE MATERIALS – Invited G. Ice, Oak Ridge National Laboratory, Oak Ridge, TN 9:00 D-076 DEVELOPMENT OF INTERFEROMETRIC X-RAY IMAGING AT THE ADVANCED PHOTON SOURCE K. Fezzaa, W.-K. Lee, Argonne National Laboratory, Argonne, IL 9:20 D-049 SAGITTAL FOCUSING OF HIGH-ENERGY X-RAYS – Invited Z. Zhong, D.P. Siddons, C.C. Kao, J.B. Hastings, NSLS, Brookhaven National Laboratory, Upton, NY N. Zhong, Medical Dept., Brookhaven National Laboratory, Upton, NY 9:50 D-017 COLLIMATING AND FOCUSING POLYCAPILLARY OPTICS FOR POWDER DIFFRACTION H. Huang, C.A. MacDonald, University at Albany, Albany, NY W.M. Gibson, I. Ponomarev, X-ray Optical Systems, Inc., Albany, NY J. Chik, A. Parsegian, National Institutes of Health, Bethesda, MD 10:10 BREAK BREAK 10:30 D-080 XRD CHARACTERIZATION AND MODELLING OF EPITAXIAL PEROVSKITE Pb(ZrxTil-x)O3 FILMS GROWN UNDER HYDROTHERMAL CONDITIONS K. Mikulka-Bolen, M. Oledzka, W. Suchanek, W. Mayo, R. Riman, Rutgers University, Piscataway, NJ T. Ryan, Emcore, Inc., Somerset, NJ V. Kogan, Philips Analytical, Almelo, Netherlands L. McCandlish, Ceremaré Corp., Highland Park, NJ 10:50 D-013 HIGH RESOLUTION POWDER DIFFRACTOMETER INSTALLED ON SPring-8 – Invited M. Takata, E. Nishibori, K. Kato, M. Sakata, Nagoya University, Nagoya, Japan Y. Kubota, Osaka Women’s University, Osaka, Japan Y. Kuroiwa, Okayama University, Okayama, Japan 11:20 D-005 HIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENT OF SUB-SURFACE DAMAGE BELOW POLISHED SURFACES OF CERAMICS B.K. Tanner, T.P.A. Hase, University of Durham, Durham, United Kingdom H.Z. Wu, University of Oxford, Oxford, United Kingdom 11:40 D-043 X-RAY DIFFRACTION STUDIES OF HETEROEPITAXIAL GROWTH OF RARE EARTH FLUORIDE FILMS K. Inaba, J. Harada, K. Omote, Rigaku Corporation, Tokyo, Japan J.M. Ko, A. Yoshikawa, Tohoku University, Sendai, Japan 12:00 D-046 DIFFUSE X-RAY SCATTERING FROM GaAs/AlAs SUPERLATTICES: NEW THEORETICAL APPROACH FOR DATA INTERPRETATION A. Ulyanenkov, H. Ress, Bruker AXS, Karlsruhe, Germany I. Feranchuk, A. Minkevich, Belorussian State University, Minsk, Belarus J. Grenzer, Potsdam University, Potsdam, Germany           Session, Friday a.m. (Sunshine Peak) XRF Session F-4 Industrial Applications — XRF Organized by: D. Broton, Construction Technology Labs, Skokie, IL 8:00 C-07 XRF AND XRD APPLICATIONS IN IRON AND STEEL INDUSTRY – Invited R. Yellepeddi, ARL SA, Ecublens, Switzerland 8:30   HIGH FREQUENCY ON-LINE XRF ANALYSIS FOR RAW FEED CONTROL IN CEMENT PLANTS – Invited J. Kemmerer, FLS Automation, Hunt Valley, MD 9:00 F-54 Sr-XRF INVESTIGATION OF HUMAN BONE P. Wobrauschek, G. Pepponi, C. Streli, C. Jokubonis, Atominstitut der Österreichischen Universitäten, Vienna, Austria G. Falkenberg, HASYLAB, DESY, Hamburg, Germany W. Osterode, Universitätsklinik für Innere Medizin IV, Vienna, Austria 9:20 F-18 XRF ANALYSIS OF AUTOMOTIVE CATALYSTS BY FLUX/FUSION A.R. Drews, Ford Research Laboratories, Dearborn, MI 9:40 F-27 COMPOSITION MEASUREMENTS OF SnPb SOLDER BUMP ON C4 FLIP CHIP INTERCONNECTION FOR SEMICONDUCTOR PACKAGE INDUSTRY T. He, CMI International Corporation, Elk Grove Village, IL 10:00 BREAK BREAK 10:20 F-21 ANALYSIS OF LEAD IN CANDLE PARTICULATE EMISSIONS BY XRF USING UNIQUANT 4 S.J. Wasson, Z. Guo, U.S. EPA, Research Triangle Park, NC 10:40 F-06 A SAFE, QUICK AND RELIABLE FUSION METHOD FOR SILICON AND FERROSILICON J. Blanchette, Corporation Scientifique Claisse, Inc., Sainte-Foy (Québec), Canada 11:00 F-42 USE OF MICRO-BEAM X-RAY FLUORESCENCE AS AN EFFECTIVE ANALYTICAL TOOL FOR COMBINATORIAL CHEMISTRY M. Haschke, Röntgenanalytik Messtechnik GmbH, Taunusstein, Germany J. Klein, U. Vietze, W. Stichert, HTE GmbH, Heidelberg, Germany For more information please contact Denise Flaherty - flaherty@icdd.com 2001 DXC Home | Call for Papers | CfP in Adobe PDF Form   Guidelines for Preparing Abstracts | Submitted Abstracts Listing