50th Annual (2001) Denver X-ray Conference™
Sheraton Steamboat Resort
Steamboat Springs, Colorado, U.S.A.
30 July – 3 August

2001 Denver X-ray Conference™ >Wednesday Sessions - including Plenary
Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001

Plenary Session and Sessions - Wednesday, 1 August (Steamboat Grand Hotel)

FIFTY YEARS OF THE DENVER X-RAY CONFERENCE
8:30 a.m. – 12:30 p.m.

Organized by:
R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA
J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

8:30 Welcoming Remarks
Ron Jenkins, Chairman, Denver X-ray Conference, Emeritus, International Centre for
Diffraction Data, Newtown Square, PA

Presentation of Awards

  • 2001 Barrett Award to David E. Cox, Emeritus, Brookhaven National Laboratory,
    Upton, NY
    presented by: P.K. Predecki, The University of Denver, Denver, CO
  • 2001 Jenkins Award to Ron Jenkins, Emeritus, International Centre for Diffraction
    Data, Newtown Square, PA
    presented by: R.L. Snyder, The Ohio State University, Columbus, OH
  • Announcement of the 2001 Jerome B. Cohen Student Award
    presented by: I. Cev Noyan, IBM, Yorktown Heights, NY
  • Announcement of the 2001 Hanawalt Award
    presented by: C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN
  • 2001 Distinguished Fellows Award to Ron Jenkins, Emeritus, International Centre for
    Diffraction Data, Newtown Square, PA
    presented by: Julian Messick, International Centre for Diffraction Data, Newtown
    Square, PA

Plenary Session Remarks
R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA
J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

The following are the invited papers to be presented during the plenary session:
9:00 P–1 THE VERY EARLY YEARS OF THE DENVER X-RAY CONFERENCE
W. Mueller, Colorado School of Mines, Golden, CO
9:20 P–5 THE DENVER X-RAY CONFERENCE: 1966-1979
J.B. Newkirk, Colorado Sports Equipment, Inc., Evergreen, CO
9:40 P–3 THE CHANGING YEARS
C. Ruud, The Pennsylvania State University, University Park, PA
P.K. Predecki, The University of Denver, Denver, CO
10:20 Break
10:50 P–4 THE MODERN DENVER CONFERENCE
R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA
11:10 NAMES BEHIND THE DENVER AWARDS: L.S. BIRKS, C.S. BARRETT, H.F. McMURDIE AND J.B. COHEN
J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC
D. Chandra, University of Nevada, Reno, NV
R.L. Snyder, The Ohio State University, Columbus, OH
I. Cev Noyan, IBM, Yorktown Heights, NY
11:50  HANAWALT AWARD LECTURE

Session, Wednesday p.m. (Buddy’s Run)
XRD & XRF

Session C-1 NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION (Commercial)
Organized by: V.E. Buhrke, The Buhrke Company, Portola Valley, CA

1:30 F-37 BENCHTOP SEQUENTIAL WDX SPECTROMETER –ZSXmini–
J.E. Martin, Rigaku/MSC, The Woodlands, TX
H. Inoue, T. Moriyama, S. Kojima, K. Toda, Rigaku Industrial Corporation, Osaka, Japan
1:50 D-040 THE INNOVATION OF IN-LABORATORY XAFS APPARATUS
T. Taguchi, J. Harada, Rigaku Corporation, Tokyo, Japan
T. Kazuyuki, S. Kohzo, Rigaku Corporation, Miyagi, Japan
2:10 D-114 D4 ENDEAVOR - THE NEW PARTNER FOR X-RAY DIFFRACTION ANALYSIS
L. Bruegemann, Bruker AXS GmbH, Karlsruhe, Germany
2:30 D-059 DHS 900 DOMED HOT STAGE - HEATING ATTACHMENT FOR FOUR-CIRCLE
GONIOMETERS
R. Resel, E. Tamas, Graz University of Technology, Austria
J. Keckes, University Leoben, Austria
P. Hofbauer, Anton Paar GmbH, Graz, Austria
2:50 D-057 A HIGH PERFORMANCE COLLIMATOR FOR SMALL ANGLE X-RAY SCATTERING
USING A MONOCAPILLARY WITH A PARABOLOIDAL PROFILE
R.A. Clapp, Diffraction Technology, Pty. Ltd., Canberra, Australia
3:10 BREAK BREAK
3:40 D-079 X-RAY OPTICS FOR TWO-DIMENSIONAL DIFFRACTION
B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI
4:00 C-05 RAPID X-RAY REFLECTOMETRY USING DOUBLY CURVED CRYSTALS
Z.W. Chen, X-ray Optical Systems, Inc., Albany, NY
4:20 D-105 THE X’CELERATOR: THE REVOLUTION IN POWDER DIFFRACTOMETRY
T. Bor, M. Fransen, J. Vasterink, K. Brandt, R. Verbruggen, Philips Analytical, Almelo, The Netherlands
4:40 D-095 DATA PROCESSING AND STRESS MEASUREMENTS BY NEW PORTABLE
DIFFRACTOMETER
J.T. Assis, V.I. Monin, F.R. Pereira, P.S. Souza, Instituto Politécnico/UERJ, Rio
de Janeiro, Brazil
T. Gurova, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil

  
    

Session, Wednesday p.m. (Sunshine Peak)
XRD

Session D-1 R.A. YOUNG RIETVELD ANALYSIS
Organized by: S.R. Stock, Georgia Institute of Technology, Atlanta, GA
R.L. Snyder, The Ohio State University, Columbus, OH

1:50   OPENING REMARKS
S.R. Stock, Georgia Institute of Technology, Atlanta, GA
2:00 D-141 THE DEVELOPMENT OF THE X-RAY RIETVELD METHOD – Invited
R.A. Young, Georgia Institute of Technology, Atlanta, GA
R.L. Snyder, The Ohio State University, Columbus, OH
2:30 D-069 APATITE STRUCTURES – Invited
J.C. Elliott, R.M. Wilson, S.E.P. Dowker, University of London, London, United
Kingdom
3:00 D-113 X-RAY MICROTOMOGRAPHY OF NEONATAL MOUSE BONE
S.R. Stock, Georgia Institute of Technology, Atlanta, GA
K. Igarashi, P.H. Stern, Northwestern University Medical School, Chicago, IL
3:20 BREAK BREAK
3:40 D-030 RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES:
SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTS
M.A. Rodriguez, D. Ingersoll, D.H. Doughty, Sandia National Laboratories,
Albuquerque, NM
4:00 D-130 APPLICATION OF THE RIETVELD METHOD TO DETERMINE THE STRUCTURE
OF BULK METALLIC GLASSES
D. Dragoi, E. Ustundag, California Institue of Technology, Pasadena, CA
I. Halevy, Negev Nuclear Research Center, Beer-Sheva, Israel
M.S. Somayazulu, J. Hu, Geophysical Laboratory of Carnegie Institution of
Washington, Washington, DC
4:20 D-009 IMPROVED MODELING OF RESIDUAL STRAIN/STRESS AND CRYSTALLITESIZE
DISTRIBUTION IN RIETVELD REFINEMENT
D. Balzar, N.C. Popa, National Institute of Standards & Technology, Boulder, CO
4:40 D-015 IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS
BY AN ORDER OF MAGNITUDE
B. O’Connor, S. Pratapa, Curtin University of Technology, Perth, Australia

 

Session, Wednesday p.m. (Rainbow)
XRD

Session D-2 Pharmaceuticals & Combinatorial
Organized by: C. Kidd, Glaxo Wellcome, Research Triangle Park, NC

2:00 D-063 SEARCHING FOR NEW POLYMORPHS BY PARALLEL CRYSTALLIZATION AND HIGH-THROUGHPUT X-RAY DIFFRACTION SCREENING – Invited
C.W. Lehmann, MPI fuer Kohlenforschung, Muelheim, Germany
2:30 D-078 RAPID XRD SCREENING FOR COMBINATORIAL CHEMISTRY ON THE
MILLISECOND TIME SCALE
J.B. Litteer, U. Preckwinkel, B. Nechkash, B.B. He, K. Smith, Bruker AXS,
Inc., Madison, WI
2:50 D-115  USE OF GLANCING ANGLE XRD TO EVALUATE PHASE TRANSITIONS
OCCURRING DURING DISSOLUTION
S. Debnath, R. Suryanarayanan, University of Minnesota, Minneapolis, MN
P.K. Predecki, University of Denver, Denver, CO
3:10 BREAK BREAK
3:30 D-036 INVESTIGATION OF THE STRUCTURAL STABILITY OF MAGNESIUM
STEARATE BY TEMPERATURE AND HUMIDITY CONTROLLED X-RAY
DIFFRACTION
D. Beckers, S. Prugovecki, Philips Analytical, Almelo, The Netherlands
E. Me¢strovi´c, University of Zagreb, Croatia
3:50 D-010 STRUCTURE SOLUTION FROM POWDER DIFFRACTION — EXPERIENCE AND FUTURE DEVELOPMENTS
S.J. Maginn, J.C. Cole, R. Taylor, W.D. Samuel Motherwell, J. Luo,
Cambridge Crystallographic Data Centre, Cambridge, United Kingdom
W.I.F. David, K. Shankland, CLRC Rutherford Appleton Laboratory, Oxon, UK
H. Nowell, University of Cambridge, Cambridge, United Kingdom
P.J. Cox, Robert Gordon University, Aberdeen, United Kingdom
4:10 D-098 STRUCTURE DETERMINATION OF [(4-cod)Pt(N3)2)] FROM X-RAY POWDER DIFFRACTION DATA
F. Stowasser, Bruker AXS GmbH, Karlsruhe, Germany
N. Oberbeckmann, M. Winter, K. Merz, R.A. Fischer, Ruhr-Universitaet
Bochum, Germany
4:30 D-007 RECENT ADVANCES IN STRUCTURE SOLUTION FROM POWDER DIFFRACTION DATA
C. Liang, Molecular Simulations, Inc., San Diego, CA
M.A. Neumann, F.J.J. Leusen, G.E. Engel, S. Wilke, C. Conesa-Moratilla,
Molecular Simulations, Ltd., Cambridge, United Kingdom
4:50 D-139 INVESTIGATIONS OF SAMPLES UNDER DIFFERENT TEMPERATURE AND
HUMIDITY CONDITIONS
L. Bruegemann, S. Haaga, F. Stowasser, Bruker AXS, Karlsruhe, Germany
H. Leitz, mri, Karlsruhe, Germany
U. Brotzeller, ANSYCO, Karlsruhe, Germany

    

Session, Wednesday p.m. (Twilight)
XRF

Session F-1 John Criss Commemorative Session: Quantitative XRF
Organized by: R. van Grieken, University of Antwerp, Antwerp, Belgium
co-Chair: J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC

1:55   OPENING REMARKS
J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC
2:10    AN OVERVIEW OF THE APPLICATION OF FUNDAMENTAL PARAMETERS IN XRF – Invited
B. Vrebos, Philips Analytical, Almelo, The Netherlands
2:40 F-40 A VERSATILE XRF SOFTWARE IN THE TRACKS OF JOHN CRISS
F. Claisse, Corporation Scientifique Claisse, Inc., Quebec, Canada
3:00 F-25 ACCURACY AND TRACEABILITY IN X-RAY FLUORESCENCE MEASUREMENTS
V. Roessiger, Helmut Fischer GmbH & Co., Sindelfingen, Germany
M. Haller, Fischer Technology, Inc., Windsor, CT
3:20 BREAK BREAK
3:50 F-04 MATRIX-INDEPENDENT XRF METHODS FOR CERTIFICATION OF STANDARD REFERENCE MATERIALS – Invited
J.R. Sieber, National Institute of Standards & Technology, Gaithersburg, MD
4:20 F-38 FUNDAMENTAL PARAMETER METHOD FOR LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION
N. Kawahara, T. Shoji, T. Yamada, Y. Kataoka, Rigaku Corporation, Osaka, Japan
B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany
M. Mantler, Technische Universität Wien, Wien, Austria
4:40 F-32 QUANTIFICATION OF GALLIUM IN DRIED RESIDUE SAMPLES BY XRF: AN IMPROVED SAMPLE PREPARATION METHOD FOR ANALYZING PLUTONIUM METAL
C.G. Worley, Los Alamos National Laboratory, Los Alamos, NM

For more information please contact Denise Zulli - zulli@icdd.com