2001 Denver X-ray Conference™ > Wednesday Sessions - including Plenary Steamboat Springs, Colorado, USA - 30th July - 3rd August 2001 2001 DXC - Quick Links Choose One DXC 2001 Home 2001 DXC Summary Accommodations and Travel Registration Information Exhibitor Information Evening Technical Sessions and Social Functions General Information Monday Workshops Tuesday Workshops Monday XRD Poster Session I Tuesday XRD Poster Session II Wednesday XRF Poster Session Thursday 50th Anniversary Poster Session Wednesday Sessions - including Plenary Thursday Sessions Friday Sessions Summer Activities in Steamboat Springs Directions to Sheraton Steamboat Resort Hotel Layout and Local Maps Travel Form Program at a Glance DXC Main Home Plenary Session and Sessions - Wednesday, 1 August (Steamboat Grand Hotel) FIFTY YEARS OF THE DENVER X-RAY CONFERENCE 8:30 a.m. – 12:30 p.m. Organized by: R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC 8:30 Welcoming Remarks Ron Jenkins, Chairman, Denver X-ray Conference, Emeritus, International Centre for Diffraction Data, Newtown Square, PA Presentation of Awards 2001 Barrett Award to David E. Cox, Emeritus, Brookhaven National Laboratory, Upton, NY presented by: P.K. Predecki, The University of Denver, Denver, CO 2001 Jenkins Award to Ron Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA presented by: R.L. Snyder, The Ohio State University, Columbus, OH Announcement of the 2001 Jerome B. Cohen Student Award presented by: I. Cev Noyan, IBM, Yorktown Heights, NY Announcement of the 2001 Hanawalt Award presented by: C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN 2001 Distinguished Fellows Award to Ron Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA presented by: Julian Messick, International Centre for Diffraction Data, Newtown Square, PA Plenary Session Remarks R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC The following are the invited papers to be presented during the plenary session: 9:00 P–1 THE VERY EARLY YEARS OF THE DENVER X-RAY CONFERENCE W. Mueller, Colorado School of Mines, Golden, CO 9:20 P–5 THE DENVER X-RAY CONFERENCE: 1966-1979 J.B. Newkirk, Colorado Sports Equipment, Inc., Evergreen, CO 9:40 P–3 THE CHANGING YEARS C. Ruud, The Pennsylvania State University, University Park, PA P.K. Predecki, The University of Denver, Denver, CO 10:20 Break 10:50 P–4 THE MODERN DENVER CONFERENCE R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA 11:10 NAMES BEHIND THE DENVER AWARDS: L.S. BIRKS, C.S. BARRETT, H.F. McMURDIE AND J.B. COHEN J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC D. Chandra, University of Nevada, Reno, NV R.L. Snyder, The Ohio State University, Columbus, OH I. Cev Noyan, IBM, Yorktown Heights, NY 11:50  HANAWALT AWARD LECTURE Session, Wednesday p.m. (Buddy’s Run) XRD & XRF Session C-1 NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION (Commercial) Organized by: V.E. Buhrke, The Buhrke Company, Portola Valley, CA 1:30 F-37 BENCHTOP SEQUENTIAL WDX SPECTROMETER –ZSXmini– J.E. Martin, Rigaku/MSC, The Woodlands, TX H. Inoue, T. Moriyama, S. Kojima, K. Toda, Rigaku Industrial Corporation, Osaka, Japan 1:50 D-040 THE INNOVATION OF IN-LABORATORY XAFS APPARATUS T. Taguchi, J. Harada, Rigaku Corporation, Tokyo, Japan T. Kazuyuki, S. Kohzo, Rigaku Corporation, Miyagi, Japan 2:10 D-114 D4 ENDEAVOR - THE NEW PARTNER FOR X-RAY DIFFRACTION ANALYSIS L. Bruegemann, Bruker AXS GmbH, Karlsruhe, Germany 2:30 D-059 DHS 900 DOMED HOT STAGE - HEATING ATTACHMENT FOR FOUR-CIRCLE GONIOMETERS R. Resel, E. Tamas, Graz University of Technology, Austria J. Keckes, University Leoben, Austria P. Hofbauer, Anton Paar GmbH, Graz, Austria 2:50 D-057 A HIGH PERFORMANCE COLLIMATOR FOR SMALL ANGLE X-RAY SCATTERING USING A MONOCAPILLARY WITH A PARABOLOIDAL PROFILE R.A. Clapp, Diffraction Technology, Pty. Ltd., Canberra, Australia 3:10 BREAK BREAK 3:40 D-079 X-RAY OPTICS FOR TWO-DIMENSIONAL DIFFRACTION B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI 4:00 C-05 RAPID X-RAY REFLECTOMETRY USING DOUBLY CURVED CRYSTALS Z.W. Chen, X-ray Optical Systems, Inc., Albany, NY 4:20 D-105 THE X’CELERATOR: THE REVOLUTION IN POWDER DIFFRACTOMETRY T. Bor, M. Fransen, J. Vasterink, K. Brandt, R. Verbruggen, Philips Analytical, Almelo, The Netherlands 4:40 D-095 DATA PROCESSING AND STRESS MEASUREMENTS BY NEW PORTABLE DIFFRACTOMETER J.T. Assis, V.I. Monin, F.R. Pereira, P.S. Souza, Instituto Politécnico/UERJ, Rio de Janeiro, Brazil T. Gurova, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil         Session, Wednesday p.m. (Sunshine Peak) XRD Session D-1 R.A. YOUNG RIETVELD ANALYSIS Organized by: S.R. Stock, Georgia Institute of Technology, Atlanta, GA R.L. Snyder, The Ohio State University, Columbus, OH 1:50   OPENING REMARKS S.R. Stock, Georgia Institute of Technology, Atlanta, GA 2:00 D-141 THE DEVELOPMENT OF THE X-RAY RIETVELD METHOD – Invited R.A. Young, Georgia Institute of Technology, Atlanta, GA R.L. Snyder, The Ohio State University, Columbus, OH 2:30 D-069 APATITE STRUCTURES – Invited J.C. Elliott, R.M. Wilson, S.E.P. Dowker, University of London, London, United Kingdom 3:00 D-113 X-RAY MICROTOMOGRAPHY OF NEONATAL MOUSE BONE S.R. Stock, Georgia Institute of Technology, Atlanta, GA K. Igarashi, P.H. Stern, Northwestern University Medical School, Chicago, IL 3:20 BREAK BREAK 3:40 D-030 RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES: SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTS M.A. Rodriguez, D. Ingersoll, D.H. Doughty, Sandia National Laboratories, Albuquerque, NM 4:00 D-130 APPLICATION OF THE RIETVELD METHOD TO DETERMINE THE STRUCTURE OF BULK METALLIC GLASSES D. Dragoi, E. Ustundag, California Institue of Technology, Pasadena, CA I. Halevy, Negev Nuclear Research Center, Beer-Sheva, Israel M.S. Somayazulu, J. Hu, Geophysical Laboratory of Carnegie Institution of Washington, Washington, DC 4:20 D-009 IMPROVED MODELING OF RESIDUAL STRAIN/STRESS AND CRYSTALLITESIZE DISTRIBUTION IN RIETVELD REFINEMENT D. Balzar, N.C. Popa, National Institute of Standards & Technology, Boulder, CO 4:40 D-015 IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE B. O’Connor, S. Pratapa, Curtin University of Technology, Perth, Australia   Session, Wednesday p.m. (Rainbow) XRD Session D-2 Pharmaceuticals & Combinatorial Organized by: C. Kidd, Glaxo Wellcome, Research Triangle Park, NC 2:00 D-063 SEARCHING FOR NEW POLYMORPHS BY PARALLEL CRYSTALLIZATION AND HIGH-THROUGHPUT X-RAY DIFFRACTION SCREENING – Invited C.W. Lehmann, MPI fuer Kohlenforschung, Muelheim, Germany 2:30 D-078 RAPID XRD SCREENING FOR COMBINATORIAL CHEMISTRY ON THE MILLISECOND TIME SCALE J.B. Litteer, U. Preckwinkel, B. Nechkash, B.B. He, K. Smith, Bruker AXS, Inc., Madison, WI 2:50 D-115  USE OF GLANCING ANGLE XRD TO EVALUATE PHASE TRANSITIONS OCCURRING DURING DISSOLUTION S. Debnath, R. Suryanarayanan, University of Minnesota, Minneapolis, MN P.K. Predecki, University of Denver, Denver, CO 3:10 BREAK BREAK 3:30 D-036 INVESTIGATION OF THE STRUCTURAL STABILITY OF MAGNESIUM STEARATE BY TEMPERATURE AND HUMIDITY CONTROLLED X-RAY DIFFRACTION D. Beckers, S. Prugovecki, Philips Analytical, Almelo, The Netherlands E. Me¢strovi´c, University of Zagreb, Croatia 3:50 D-010 STRUCTURE SOLUTION FROM POWDER DIFFRACTION — EXPERIENCE AND FUTURE DEVELOPMENTS S.J. Maginn, J.C. Cole, R. Taylor, W.D. Samuel Motherwell, J. Luo, Cambridge Crystallographic Data Centre, Cambridge, United Kingdom W.I.F. David, K. Shankland, CLRC Rutherford Appleton Laboratory, Oxon, UK H. Nowell, University of Cambridge, Cambridge, United Kingdom P.J. Cox, Robert Gordon University, Aberdeen, United Kingdom 4:10 D-098 STRUCTURE DETERMINATION OF [(4-cod)Pt(N3)2)] FROM X-RAY POWDER DIFFRACTION DATA F. Stowasser, Bruker AXS GmbH, Karlsruhe, Germany N. Oberbeckmann, M. Winter, K. Merz, R.A. Fischer, Ruhr-Universitaet Bochum, Germany 4:30 D-007 RECENT ADVANCES IN STRUCTURE SOLUTION FROM POWDER DIFFRACTION DATA C. Liang, Molecular Simulations, Inc., San Diego, CA M.A. Neumann, F.J.J. Leusen, G.E. Engel, S. Wilke, C. Conesa-Moratilla, Molecular Simulations, Ltd., Cambridge, United Kingdom 4:50 D-139 INVESTIGATIONS OF SAMPLES UNDER DIFFERENT TEMPERATURE AND HUMIDITY CONDITIONS L. Bruegemann, S. Haaga, F. Stowasser, Bruker AXS, Karlsruhe, Germany H. Leitz, mri, Karlsruhe, Germany U. Brotzeller, ANSYCO, Karlsruhe, Germany      Session, Wednesday p.m. (Twilight) XRF Session F-1 John Criss Commemorative Session: Quantitative XRF Organized by: R. van Grieken, University of Antwerp, Antwerp, Belgium co-Chair: J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC 1:55   OPENING REMARKS J.V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC 2:10    AN OVERVIEW OF THE APPLICATION OF FUNDAMENTAL PARAMETERS IN XRF – Invited B. Vrebos, Philips Analytical, Almelo, The Netherlands 2:40 F-40 A VERSATILE XRF SOFTWARE IN THE TRACKS OF JOHN CRISS F. Claisse, Corporation Scientifique Claisse, Inc., Quebec, Canada 3:00 F-25 ACCURACY AND TRACEABILITY IN X-RAY FLUORESCENCE MEASUREMENTS V. Roessiger, Helmut Fischer GmbH & Co., Sindelfingen, Germany M. Haller, Fischer Technology, Inc., Windsor, CT 3:20 BREAK BREAK 3:50 F-04 MATRIX-INDEPENDENT XRF METHODS FOR CERTIFICATION OF STANDARD REFERENCE MATERIALS – Invited J.R. Sieber, National Institute of Standards & Technology, Gaithersburg, MD 4:20 F-38 FUNDAMENTAL PARAMETER METHOD FOR LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION N. Kawahara, T. Shoji, T. Yamada, Y. Kataoka, Rigaku Corporation, Osaka, Japan B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany M. Mantler, Technische Universität Wien, Wien, Austria 4:40 F-32 QUANTIFICATION OF GALLIUM IN DRIED RESIDUE SAMPLES BY XRF: AN IMPROVED SAMPLE PREPARATION METHOD FOR ANALYZING PLUTONIUM METAL C.G. Worley, Los Alamos National Laboratory, Los Alamos, NM For more information please contact Denise Flaherty - flaherty@icdd.com 2001 DXC Home | Call for Papers | CfP in Adobe PDF Form   Guidelines for Preparing Abstracts | Submitted Abstracts Listing