2001 Denver X-ray Conference™ > The 50th Annual Denver X-ray Conference Summary
The Denver X-ray Conference celebrated its 50th anniversary in the majestic mountains of Steamboat Springs, Colorado. The conference was held 30 July - 3 August and attracted nearly 350 registered attendees and over 200 exhibit personnel.
Workshops:
Conference week began with 15 tutorial workshops, held on Monday and Tuesday. Instructors from all over the world gathered together to share their knowledge and expertise. After 21 years of organizing the "XRF Specimen Preparation" workshop at the DXC, Victor Buhrke, Consultant, The Buhrke Company, decided to pass the tradition on to Don Broton of Construction Technology Labs. Dr. Buhrke will still participate as a member of the DXC Organizing Committee and also as an ICDD member. We would like to thank Dr. Buhrke for his many years of hard work and dedication to this historical XRF workshop.Plenary Session:
The Plenary session "Fifty Years of the Denver X-ray Conference", held on Wednesday morning, gave attendees the opportunity to learn the history of what has grown to become the single most important meeting in the X-ray analysis community. The session included presentations from the pioneers of the DXC - William Mueller, Colorado School of Mines; John B. Newkirk, Colorado Sports Equipment, Inc.; Clay Ruud, The Pennsylvania State University; Paul Predecki, The University of Denver; and Ron Jenkins, Emeritus, International Centre for Diffraction Data. Each speaker highlighted a particular era of the conference, describing the significant endeavors of the time and how those events influenced the DXC. The lectures and lecturers were immensely entertaining and often humorous. The experience was nostalgic for some, enlightening for others, and impressive to all.The Plenary session also included a presentation on the "Names Behind the Denver Awards: L.S. Birks, C.S. Barrett, H.F. McMurdie and J.B. Cohen" given by John V. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC; Dhanesh Chandra, University of Nevada, Reno, NV; Robert L. Snyder, The Ohio State University and I. Cev Noyan, IBM. The final presentation held during the plenary session was the Hanawalt Award Lecture, "Phase Identification Using Electron Backscatter Diffraction in the SEM: A Powerful Tool for Materials Science", presented by Raymond P. Goehner and Joseph R. Michael of Sandia National Laboratories.
Technical Sessions:
Sixteen special sessions filled the remaining two and a half days of the conference. R.A. Young of Georgia Institute of Technology, a longtime member of the ICDD and past Vice Chairman of the ICDD Board of Directors, was honored during the session, "R.A. Young Rietveld Analysis". Stuart Stock of the Georgia Institute of Technology and Robert Snyder of the Ohio State University chaired the session. Both men spoke on behalf of Dr. Young and his invaluable contributions to the Rietveld Method.
A commemorative session was also held in the memory of John Criss who passed away on 8 December 2000. The session, "John Criss Commemorative Session: Quantitative XRF" was chaired by Rene van Grieken of the University of Antwerp and John Gilfrich, Emeritus, SFA, Inc./NRL. An opening lecture from John Gilfrich highlighted John Criss' contributions to the field of XRF analysis and the scientific community. The conference was also privileged to have John's family, his wife Judith and their two children Anne and Brian, present during the session.Awards:
Several awards were presented during the plenary session:The 2001 Barrett Award was presented to David E. Cox, Emeritus, Brookhaven National Laboratory. P.K. Predecki, The University of Denver, presented the award.
The 2001 Jenkins Award was presented to Ron Jenkins, Emeritus, International Centre for Diffraction Data. R.L. Snyder, The Ohio State University, presented the award.
The 2001 Hanawalt Award was presented to Raymond P. Goehner and Joseph R. Michael, Sandia National Laboratories. C.R. Hubbard, Oak Ridge National Laboratories, presented the award.
The 2001 Distinguished Fellows Award was presented to Ron Jenkins, Emeritus, International Centre for Diffraction Data. Julian Messick, International Centre for Diffraction Data, presented the award.
I. Cev Noyan, IBM, Yorktown Heights, NY, chair of the Jerome B. Cohen Student Award Selection Committee, announced that the 2001 Jerome B. Cohen Student Award would not be presented. The selection committee did not believe that any of the papers submitted reflected the quality of work deemed necessary to receive the distinguished award.
Poster Session Awards:
Over 100 papers were presented during the poster sessions, held on Monday, Tuesday and Wednesday evenings. Nine of these were given the distinction of being judged the best. Winners of the 2001 Best Poster Award were:XRD Poster Session Winners:
"Influence of Re-Nitriding for Thermal Fatigue Properties on Nitrided Hot Work Die Steel (H13)"
K. Yatsushiro, M. Sano, M. Hihara, Yamanashi Industrial Technology Center, Yamanashi, Japan, M. Kuramoto, Polytechnic University, Kanagawa, Japan."X-Ray Stress Measurement of Surface Thin Layer by Means of Evanescent Wave with In-Plane Diffraction"
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan, I. Tobita, K. Omote, Rigaku Corporation, Tokyo, Japan."Fatigue Cracks in Aluminum Samples Studied with X-Ray Phase Contrast Imaging and with Absorption Microtomography"
S.R. Stock, K. Ignatiev, Georgia Institute of Technology, Atlanta, GA, G.R. Davies, J.C. Elliott, Queen Mary and Westfield College, London, United Kingdom, K. Fezzaa, W.-K. Lee, Argonne National Laboratory, Argonne, IL"High Temperature X-Ray Diffraction Studies During Hydriding of Zr2Fe"
J. Smith, D. Chandra, University of Nevada, Reno, NV, J.R. Wermer, Los Alamos National Laboratory, Los Alamos, NM, E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN"Simultaneous XRF/XRD with Low-Power X-Ray Tubes"
S. Cornaby, A. Reyes-Mena, P.W. Moody, T. Grow, MOXTEK, Inc., Orem, UT, T. Hughes, A. Stradling, L.V. Knight, Brigham Young University, Provo, UT"Solid State Phase Transitions of NH4NO3-KNO3 Binary System"
W.-M. Chien, D. Chandra, J. Smith, University of Nevada, Reno, NV, C.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TN, A.K. Helmy, TRW Incorporated, Lockwood, NVXRF Poster Session Winners:
"A Windowless Si Anode X-Ray Tube for the Efficient Excitation of Low Z Elements on Si Wafer Surfaces with TXRF"
C. Streli, P. Wobrauschek, K. Proksch, L. Fabry, Atominstitut der Österreichischen Universitäten, Vienna, Austria, S. Pahlke, Wacker Siltronic, Burghausen, Germany"THE ID18F Microprobe Endstation at the European Synchrotron Radiation Facility (ESRF)"
A. Somogyi, L. Vincze, B. Vekemans, F. Adams, University of Antwerp, Antwerp, Belgium, M. Drakopoulos, M. Kocsis, A. Snigirev, European Synchrotron Radiation Facility, Grenoble Cedex, France"Speciation and Surface Analysis of Individual Micrometer Particles using Thin-Window Dual-Energy EPXMA"
R. van Grieken, J. De Hoog, A. Worobiec, University of Antwerp, Antwerp, Belgium, J. Osán, University of Antwerp, Antwerp, Belgium and KFKI Atomic Energy Research Institute, Budapest, Hungary, C.-U. Ro, Hallym University, ChunCheon, Korea, I. Szalóki, University of Antwerp, Antwerp, Belgium and University of Debrecen, HungaryExhibits
Thirty-seven companies exhibited at the conference, displaying their various products and services for X-ray powder diffraction and X-ray fluorescence spectrometry. Companies participating in the exhibit were:
Accelrys (formerly Molecular Simulations, Inc.); AMPTEK, Inc.; ATPS, Inc.; Bede Scientific, Inc.; Blake Industries, Inc.; Bruker AXS, Inc.; Corporation Scientifique Claisse; Diffraction Technology; EDAX, Inc.; F.A.I.R. Corporation; Gresham Scientific Instruments; Herzog Automation Corp.; ICPH Chemical International - Socachim; Inel, Inc.; International Centre for Diffraction Data; John Wiley & Sons, LTD.; Kratos Analytical, Inc.; LND, Inc.; Materials Data, Inc.; MatIdent; MOXTEK, Inc.; Osmic, Inc.; Oxford Instruments; Philips Analytical; Photoelectron Corporation; Premier Lab Supply; Rigaku/MSC; Rocklabs Ltd.; Spectro Analytical Instruments; Spectrum Plus; SPEX CertiPrep, Inc.; Technos International; Thales Components Corporation; Thermo ARL; Thermo NORAN; X-ray Instrumentation Associates and X-ray Optical Systems, Inc.Social Events
Evening receptions were held throughout conference week. Bede Scientific, Inc., Corporation Scientifique Claisse, and SPEX CertiPrep, Inc. sponsored the Sunday evening "Welcoming Reception". The party was held outside, and included an elegant musical performance by Dr. Keith Bowen of Bede Scientific. Tuesday evening's social was sponsored by Materials Data, Inc. and Rigaku/MSC and was also held during the second XRD poster session. Bruker AXS, Inc. was the sole sponsor of the Wednesday evening reception, which also included the XRF poster session.
On Thursday evening, the Denver X-ray Conference threw itself an anniversary shindig to properly celebrate its 50th year. The party was held poolside in the Anniversary tent, and included an anniversary poster session that highlighted special events of the past 50 years in the X-ray analysis community. A prize was given to the ICDD for a poster that they created titled "Denver Conference Briefs". A display case presented the series, Advances in X-ray Analysis, from the very first book all the way to the most current CD-ROM. Contributions were received for the DXC time capsule, which will be opened at the next anniversary party in the year 2026.A special thank you to the ICDD members who participated in this year's conference as organizers, chairs, instructors, and speakers. The continued support of the ICDD membership is one of the reasons that the DXC remains an influential and integral component of the scientific community - even after 50 years!
For more information please contact Denise Flaherty - flaherty@icdd.com
