The 2002 Denver X-ray Conference
Antlers Adam's Mark Hotel

(formerly Antlers Doubletree Hotel)
Colorado Springs, Colorado, U.S.A.
29th July - 2nd August 2002

Denver X-ray Conference - sponsored by the International Centre for Diffraction Data
2002 ABSTRACT LIST

MEASUREMENT OF STRESS IN SURFACE ACOUSTIC WAVE FILTERS USING BRAGG ANGLE CONTOUR MAPPING
P.M. Adams, The Aerospace Corporation, Los Angeles, CA

COMBINED SMALL AND WIDE ANGLE SCATTERING MEASUREMENTS USING HIGH-ENERGY X-RAYS
J.D. Almer, U. Lienert, D.R. Haeffner, P. Thiyagarajan, Argonne National Laboratory, Argonne, IL, J. Ilavsky, Univeristy of Maryland at College Park, College Park, MD and National Institute of Standards & Technology, Gaithersburg, MD,

THE USE OF XRF IN SOLVING PROBLEMS RELATED TO THE PRODUCTION OF ACTIVE PHARMACEUTICAL INGREDIENTS (API)
F.J. Antosz, J.W. Manski, Pharmacia Corp., Kalamazoo, MI

S2 RANGER: THE TOTAL SOLUTION FOR EDXRF ANALYSIS
J. Anzelmo, B. Burton, A. Seyfarth, L. Arias, Bruker AXS, Inc., Madison, WI

VORTEX - A HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR X-RAY DIFFRACTION
S. Barkan, J.S. Iwanczyk, B.E. Patt, L. Feng, C.R. Tull, G. Vilkelis, Photon Imaging, Inc., Northridge, CA

THE USE OF X-RAY DIFFRACTION MEASUREMENTS TO DETERMINE THE EFECT OF AGING ON RESIDUAL STRESSES IN UNIDIRECTIONAL AND WOVEN GRAPHITE/POLYIMIDE COMPOSITES
B. Benedikt, M. Gentz, L. Kumosa, P.K. Predecki, M. Kumosa, The University of Denver, Denver, CO

CALIBRATION OF DIFFRACTOMETERS II: INTERNAL CONSISTENCY AND THE BALANCE
G. Berti, U. Bartoli, M. D'Acunto, F. De Marco, University of Pisa, Pisa, Italy

A NEW MOVABLE DIFFRACTOMETER FOR INDUSTRIAL APPLICATIONS OF NDT-XRD FOR IN FIELD MEASUREMENTS
G. Berti, University of Pisa, Pisa, Italy, S. Aldrighetti, Officina Elettrotecnica di Tenno, Italy

APPLICATIONS OF X-RAY DIFFRACTION IN THE IMAGING INDUSTRY
T.N. Blanton, Eastman Kodak Company, Rochester, NY, USA

STRAIN, CRYSTALLITE SIZE AND PHASE COMPOSITION IN NANOCRYSTALLINE SOLIDS
X. Bokhimi, The National University of Mexico (UNAM), Mexico D.F., Mexico

VACANCY-INDUCED CHANGES IN SURFACE MORPHOLOGY DURING Ag HOMOEPITAXY
C.E. Botez, W.C. Elliott, P.F. Miceli, University of Missouri-Columbia, Columbia, MO, P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY

A NOVEL DIGITAL X-RAY TOPOGRAPHY SYSTEM
D.K. Bowen, M. Wormington, P. Feichtinger, C.H. Russell, S. Bates, Bede Scientific Incorporated, Englewood, CO

INVESTIGATION OF LOCAL TEXTURES IN EXTRUDED MAGNESIUM BY SYNCHROTRON RADIATION
H.-G. Brokmeier, A. Gunther, S. Yi, W. Ye, Technical University Clausthal & GKSS-Research Center, Geesthacht, Germany, T. Lippmann, U. Garbe, J. Schneider, HASYLAB at DESY, Hamburg, Germany

DEVELOPMENT OF TEXTURE DURING DEFORMATION OF HEXAGONAL CLOSE PACKED METALS
D.W. Brown, S.R. Agnew, W.R. Blumenthal, T.M. Holden, C. Tome, Los Alamos National Laboratory, Los Alamos, NM

ANALYSIS OF THE FACTORS, INFLUENCING THE PRECISION OF SIMULATED X-RAY DIFFRACTION (REFLECTION) CURVES
A. Ulyanenkov, Bruker AXS, Inc., Karlsruhe, Germany

A SIMPLE GLANCING ANGLE ATTACHMENT FOR A POWDER DIFFRACTOMETER
J.A. Carsello, Northwestern University, Evanston, IL

NOVEL DOUBLY CURVED CRYSTALS WITH LARGE CAPTURE ANGLE
Z. Chen, F. Wei, P. Schields, D. Gibson, X-ray Optical Systems, Inc., Albany, NY

STUDY ON CAPILLARY DISCHARGE SOFT X-RAY LASER IN Ne-LIKE Ar
Q. Wang, Y. Cheng, Y. Zhao, Harbin Institute of Technology, Harbin, China

EFFECT OF REINFORCEMENT PARTICLE FRACTURE ON THE LOAD PARTITIONING IN AN AL-SIC COMPOSITE
B.S. Majumdar, New Mexico Tech, Socorro, NM, H. Choo, University of Tennessee, Knoxville, TN, P. Rangaswamy, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM

LATTICE DILATION IN A HYDROGEN CHARGED STEEL
G.L. Nash, Electro-Motive Division, LaGrange, IL, P. Nash, Illinois Institute of Technology, Chicago, IL, H. Choo, University of Tennessee, Knoxville, TN, L.L. Daemen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM

APPLICATION OF SYNCHROTRON EDXRD STRAIN PROFILING IN SHOT PEENED MATERIALS
M. Croft, I. Zakharchenko, Y. Gulak, T. Tsakalakos, Rutgers University, Piscataway, NJ, Z. Zhong, NSLS, Brookhaven National Laboratory, Upton, NY

SULFUR ANALYSIS USING ASTM D 2622 AT REFINERY LABORATORIES
K.F. Dahnke, R.W. Morton, Phillips Petroleum Company, Bartlesville, OK

TECHNIQUES FOR SAMPLE PREPARATION OF FERRO-ALLOY AND SULFIDES FOR XRF ANALYSIS WITH FUSED BEADS ON AN AUTOMATIC GAS FUSION MACHINE
M. Davidts, I.C.P.H. Chemical International, Philadelphia, PA

THE PRECISION OF DIFFRACTION PEAK LOCATION AND THE OPTIMISED DESIGN OF A STRESS DIFFRACTOMETER
M.R. Daymond, ISIS Facility, Rutherford Appleton Lab., Oxon, United Kingdom

ANNEALING STUDIES OF PURE AND ALLOYED TANTALUM EMPLOYING ROCKING CURVES AND /2 PATTERNS
R.J. De Angelis, University of Florida, Shalimar, FL, D.W. Richards, M.P. Kramer, J.W. House, Air Force Research Laboratory, Eglin AFB, Florida

A HIGH-TEMPERATURE POWDER DIFFRACTION FURNACE
M.D. Dolan, S.I. Zdzieszynski, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY

THE USE OF POLARIZED LIGHT ED-XRF FOR LOW SULFUR CONTENT DETERMINATION IN AUTOMOTIVE FUELS
Mario Van Driessche, ChevronTexaco Technology Gent, Belgium.

NUMERICAL DESCRIPTION OF PHOTOELECTRIC ABSORPTION COEFFICIENTS FOR FUNDAMENTAL PARAMETER PROGRAMS
H. Ebel, R. Svagera, Vienna University of Technology, Vienna, Austria, A. Shaltout, National Research Center, Cairo, Egypt

EXPERIMENTAL EVIDENCE FOR SECONDARY EXCITATION IN X-RAY PHOTOELECTRON SPECTROMETRY
M.F. Ebel, R. Svagera, R. Ashury, H. Ebel, Vienna University of Technology, Vienna, Austria

ACCURACY OF FUNDAMENTAL PARAMETERS CALCULATIONS USING A NEW ATOMIC DATABASE
W.T. Elam, R.B. Shen, B. Scruggs, J. Nicolosi, EDAX, Inc., Mahwah, NJ

OPTIMIZATION STRATEGIES FOR BENCHTOP EDXRF SYSTEMS
A.T. Ellis, Oxford Instruments Analytical Ltd., High Wycombe, United Kingdom

NANOSTRUCTURE ANALYSIS USING 2D SMALL ANGLE X-RAY SCATTERING OPTIMIZED FOR FE-BASED ALLOYS
K. Erlacher, R. Gorgl, Material Center Leoben GmbH, Austria and Austrian Academy of Sciences and University of Leoben, Austria, H. Jakob, Bruker AXS GmbH, Germany, P. Fratzl, Austrian Academy of Sciences and University of Leoben, Austria

IDENTIFICATION OF FORGED WORKS OF ART BY PORTABLE EDXRF SPECTROMETRY
J.L. Ferrero, C. Roldan, D. Juanes, J. Carballo, J. Pereira, J.L. Lluch, Universitat de Valencia (ICMUV), Valencia, Spain, M.E. Pernett, M. Crespo, Museo Nacional de Bellas Artes, Habana, Cuba

DESIGNING POLYCAPILLARY X-RAY OPTICS FOR DIFFRACTION AND FLUORESCENCE
S.P. Formica, X-ray Optical Systems, Inc., Albany, NY and University at Albany, SUNY, Colonie, NY, S.M. Lee,University at Albany, SUNY, Colonie, NY

STRESS ERRORS ASSOCIATED WITH MINIATURIZATION OF PUSAI ASSEMBLY X-RAY STRESS ANALYZER
T. Goto, Fukui University of Technology, Nara, Japan

CRYSTAL STRUCTURE DETERMINATIONS OF THE THREE-LAYER AURIVILLIUS CERAMICS USING A NEW HIGH-RESOLUTION X-RAY POWDER DIFFRACTOMETER
M. Haluska, S. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY

XRF ANALYSIS OF THE DISTRIBUTION OF HEAVY METAL IONS IN CANCEROUS TISSUES
M. Haschke, Rontgenanalytik Mebtechnik GmbH, Taunusstein, Germany, W. Ebert, Berlin, Germany

DUAL-POLYCAPILLARY MICRO X-RAY FLUORESCENCE INSTRUMENT
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, N. Gao, X-ray Optical Systems, Inc., Albany, NY

QUANTITATIVE APPROACHES IN MICRO X-RAY FLUORESCENCE
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

ELEMENTAL IMAGING USING MICRO X-RAY FLUORESCENCE IN ART AND ARCHEOLOGY
G.J. Havrilla, T. Miller, Los Alamos National Laboratory, Los Alamos, NM, K. Trentleman, Detroit Institute of Art, Detroit, MI, R. Morton, Philips Petroleum, Bartlesville, OK

COMPARISON BETWEEN CONVENTIONAL AND TWO-DIMENSIONAL XRD
B.B. He, U. Preckwinkel, K.L. Smith, Bruker AXS, Inc., Madison, WI

POLARIZED BEAM XRF ANALYSIS - PAST AND FUTURE
J. Heckel, SPECTRO A.I., Kleve, Germany

LOW-POWER SYSTEM FOR AN IN-LINE PHASE MONITOR
H. Huang, T. Bievenue, P. Schields, X-ray Optical Systems, Inc., Albany, NY, T. Davis, Purdue University, West Lafayette, IN

MONOCAPILLARY DEVELOPMENTS AND APPLICATIONS AT CHESS
R. Huang, C.S. Zha, A. Kazimirov, E. F. Fontes, Cornell High Energy Synchrotron Source (CHESS), Cornell University, D. H. Bilderback, School of Applied and Engineering Physics, Cornell University

STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA: RELATIONS BETWEEN STRUCTURES AND PHYSICAL PROPERTIES
Q. Huang, National Institute of Standards & Technolgoy, Gaithersburg, MD and University of Maryland, College Park, MD

PULP AND PAPER PLANT MATERIALS ISSUES ADDRESSED BY XRD METHODS
C.R. Hubbard, R.A. Peascoe, J.R. Keiser, Oak Ridge National Laboratory, Oak Ridge, TN

THE THREE-DIMENSIONAL MAPPING OF FATIGUE CRACK POSITION VIA A NOVEL X-RAY PHASE CONTRAST APPROACH
K. Ignatiev, Georgia Institute of Technology, Atlanta, GA, W.-K. Lee, K. Fezzaa, Argonne National Laboratory, Argonne, IL, G.R. Davis, J.C. Elliott, Queen Mary and Westfield College, London, United Kingdom, S.R. Stock, Northwestern University, Chicago, IL

IN-PLANE XRD STUDY OF EPITAXIALLY-GROWN ORGANIC THIN FILMS FOR ELECTROLUMINESCENT DEVICE APPLICATIONS
K. Inaba, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan, M. O'fuji, H. Hoshi, Y. Takanishi, K. Ishikawa, H. Takezoe, Tokyo Institute of Technology, Tokyo, Japan

A NEW SMALL ANGLE X-RAY SCATTERING TECHNIQUE FOR DETERMINING NANO-SCALE PORE/PARTICLE SIZE DISTRIBUTIONS IN THIN FILMS
Y. Ito, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan

HIGH RESOLUTION LOW BACKGROUND BEAM FORMATION SYSTEM AND ITS APPLICATION IN SMALL ANGLE X-RAY SCATTERING
L. Jiang, B. Verman, B. Kim, Y. Platonov, Osmic, Inc., Auburn Hills, MI

THERMAL STABILITY OF STRAINED Si ON RELAXED SiGe: HIGH-RESOLUTION XRD STUDIES
P.M. Mooney, J.L. Jordan-Sweet, S.J. Koester, J.A. Ott, J.O. Chu, K.K. Chan, IBM Research Division, T.J. Watson Research Center

THE ANALYSIS OF GLASS FRIT BY WAVELENGTH-DISPERSIVE X-RAY SPECTROMETRY
A.R. Jurgensen, D.M. Missimer, R.L. Rutherford, Westinghouse Savannah River Site, Aiken, SC

FUNDAMENTAL PARAMETER METHOD FOR LOW ENERGY REGION
N. Kawahara, T. Yamada, Rigaku Corporation, Osaka, Japan, B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany, R. Herbst, M. Mantler, Technische Universitat Wien, Wien, Austria

CONVOLUTION BASED PROFILE FITTING
A. Kern, A.A. Coelho, Bruker AXS GmbH, Karlsruhe, Germany, R.W. Cheary, University of Technology Sydney, Sydney, Australia

INDEXING OF POWDER DIFFRACTION PATTERNS BY ITERATIVE USE OF SINGULAR VALUE DECOMPOSITION
A.A. Coelho, A. Kern, Bruker AXS GmbH, Karlsruhe, Germany

THE PERFORMANCE OF YB66 DOUBLE CRYSTAL MONOCHROMATOR FOR DISPERSING SYNCHROTRON RADIATION AT SPRING-8
M. Kitamura, H. Yoshikawa, V.A. Mihai, A. Nisawa, N. Yagi, M. Okui, M. Kimura, T. Tanaka, S. Fukushima, National Institute for Materials Science, Hyogo, Japan, T. Mochizuki, Japan Synchrotron Radiation Research Institute, Hyogo, Japan

STUDIES OF THE TRANSITION STATE FOR KDP-DKDP SOLID SOLUTION
B.N. Kodess, ICS & E, Denver, CO, A.I. Beskrovny, VNIIMS, Moscow, Russia

MULTI-STEP REFINEMENT OF DIFFRACTION PATTERN WITH OVERLAPPING BRAGG REFLECTIONS
B.N. Kodess, ICS & E, Denver, CO, I.P. Jouravlev, VNIIMS, Moscow, Russia

STRUCTURAL CHEMISTRY OF CARBON DIOXIDE AT HIGH PRESSURES
C. S. Yoo, H. Cynn, Lawrence Livermore National Laboratory, Livermore, CA, M. Nicol, H. Kohlmann, High Pressure Science and Engineering Center, University of Nevada,  Las Vegas, NV 

XRF IN VIVO BONE LEAD ANALYSIS:CORRECTION OF THE CURRENT APPROACH
V.S. Kondrashov, Charles R. Drew University of Medicine & Science, Los Angeles, CA, S.J. Rothenberg, Center for Research in Population Health, Cuernavaca, Morelos, Mexico

IN-SITU HIGH-TEMPERATURE PHASE TRANSFORMATION IN DyNbO4 USING THE THERMAL-IMAGE TECHNIQUE
L. Siah, W.M. Kriven, University of Illinois at Urbana-Champaign, Urbana, IL

IN-SITU, IN AIR, HIGH-TEMPERATURE STUDIES OF OXIDE SYSTEMS USING THE THERMAL-IMAGING TECHNIQUE
L. Siah, W.M. Kriven, University of Illinois at Urbana-Champaign, Urbana, IL

HIGH-PRECISION PARALLEL-BEAM X-RAY DIFFRACTION SYSTEM FOR PHARMACEUTICALS ANALYSIS
T. Kubo, Rigaku Corporation, Osaka, Japan

X-RAY DIFFRACTION ANALYSIS IN THE FORENSIC SCIENCE LABORATORY OF STUTTGART, GERMANY - THE LAST RESORT IN MANY CRIMINAL CASES
W. Kugler, Forensic Science Laboratory, Landeskriminalamt Baden-Wuerttemberg, Stuttgart, Germany

DETERMINATION OF THERMAL RESIDUAL STRESSES IN A FUNCTIONALLY GRADED WC-Co COMPOSITE
C. Larsson, M. Oden, Linkoping University, Linkoping, Sweden

RIETVELD REFINEMENT OF 2-THETA SPLIT RANGES - A METHOD FOR REDUCING ANALYSIS TIME
K. Laursen, T. White, Nanyang Technological University, Singapore

ANISOTROPIC STRAIN-LIKE LINE BROADENING DUE TO INHOMOGENEITIES
A. Leineweber, E.J. Mittemeijer, Max Planck Institute for Metals Research, Stuttgart, Germany

X-RAY ANALYSIS IN THE U.S. CUSTOMS LABORATORIES
M.H. Liberman, U.S. Customs Laboratory, San Francisco, CA

OBSERVATION OF HIGH RESOLUTION DIFFRACTION PROFILES FROM SINGLE GRAINS WITHIN POLYCRYSTALLINE METALS
U. Lienert, J. Almer, Argonne National Laboratory, Argonne, IL, L. Margulies, S. Nielsen, W. Pantleon, H.F. Poulsen, S. Schmidt, Risoe National Laboratory, Roskilde, Denmark

REAL-TIME SYNCHROTRON STUDIES OF PHASE TRANSITIONS
K.F. Ludwig, A.S. Ozcan, X. Wang, Boston University, Boston, Ma, X. Flament, R. Caudron, ONERA, Chatillon, France, C. Lavoie, C. Cabral, Jr., J.M.E. Harper, IBM Research Division, Yorktown Heights, NY

THE DEVELOPMENT OF THE PORTABLE XRF & XRD
S. Maeo, S. Nomura, K. Taniguchi, Osaka Electro-Communication University, Osaka, Japan

ACCURACY OF THEORETICAL INFLUENCE COEFFICIENT METHODS
M. Mantler, Vienna University of Technology, Vienna, Austria

THREE DIMENSIONALLY RESOLVED STUDIES OF PLASTIC DEFORMATION IN METALS
L. Margulies, Riso National Laboratory, Roskilde, Denmark and ESRF, Grenoble Cedex, France, H.F. Poulsen, G. Winter, S. Schmidt, Riso National Laboratory, Roskilde, Denmark

PUSHING THE DETECTION LIMITS OF MICRO X-RAY FLUORESCENCE
T.C. Miller, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

THE EFFECTS OF SINTERING TIME AND ATMOSPHERE ON SURFACE FILM FORMATION IN THREE CERAMIC WASTE FORMS USING X-RAY DIFFRACTION
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, Westinghouse Savannah River Site, Aiken, SC

STABILITY, STRUCTURE, AND IONIC CONDUCTION IN MODIFIED AURIVILLIUS CERAMICS
S. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY

DEVELOPMENT OF WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER USING MULTI-CAPILLARY X-RAY LENS FOR X-RAY DETECTION
Y. Mokuno, Y. Horino, National Institute of Advanced Industrial Science & Technology, Osaka, Japan, T. Narusawa, Kochi University of Technology, Kochi, Japan, S. Kuwabara, Shimadzu Corporation, Kanagawa, Japan, S. Shibata, H. Soejima, Shimadzu Scientific

SYNCHROTRON IN HIGH-RESOLUTION PHASE DETERMINATION
S.L. Morelhao, Universidade de Sao Paulo, Sao Paulo, Brazil, S. Kycia, Laboratorio Nacional de Luz Sincrotron/LNLS, Campinas, Brazil

X-CELL - A NOVEL INDEXING ALGORITHM FOR ROUTINE AND PROBLEM CASES
M.A. Neumann, Accelrys Ltd., Cambridge, United Kingdom

XRD STUDY OF THE DEHYDRATION REACTION OF THEOPHYLLINE MONOHYDRATE: EFFECT OF POLYVINYLPYRROLIDONE
C. Nunes, R. Suryanarayanan, University of Minnesota, Minneapolis, MN, A. Mahendrasingam, Keele University, Staffordshire, United Kingdom

USING LATTICE PARAMETERS AND LINE BROADENING TO MONITOR NEAR-SURFACE STRAIN IN DESIGNING SINTERED CERAMIC MATERIALS - A FORMIDABLE CHALLENGE
S. Pratapa, B. O'Connor, Curtin University of Technology, Perth, Australia

THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF X-RAYS AND ITS EFFECT ON BRAGG PEAK POSITIONS
M.H. Ott, D. Lohe, University of Karlsruhe (TH), Karlsruhe, Germany

TIME-RESOLVED X-RAY DIFFRACTION OF THE KINETICS OF TEXTURE FORMATION IN THE C49-C54 TiSi2 PHASE TRANSFORMATION
A.S. Ozcan, K.F. Ludwig, Jr., Boston University, Boston, MA, C. Lavoie, C. Cabral, Jr., J.M.E. Harper, IBM, T.J. Watson Research Center, Yorktown Heights, NY

RIETVELD REFINEMENTS OF U-NB ALLOYS
E.J. Peterson, W.L. Hults, D.F. Teter, D.W. Brown, J.C. Cooley, A.M. Kelly, L.B. Daulesberg, D.J. Thoma, Los Alamos National Laboratory, Los Alamos, NM

HIGH TEMPERATURE X-RAY DIFFRACTION STUDY OF REACTION RATES IN CERAMICS
M.S. Peterson, II, C.A. Say, S.A. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY

STRUCTURE DETERMINATION OF NANOCRYSTALLINE MATERIALS BY THE ATOMIC PAIR DISTRIBUTION FUNCTION TECHNIQUE
V. Petkov, Michigan State University, East Lansing, MI

TRACE-LEVEL SPECIATION AND MICROANALYSIS BY MEANS OF MONOCHROMATIC AND "PINK" BENDING MAGNET RADIATION FOCUSSED WITH POLYCAPILLARY OPTICS
K. Proost, K. Janssens, L. Vincze, University of Antwerp, Antwerp, Belgium, G. Falkenberg, HASYLAB at DESY, Hamburg, Germany

REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM
J.L. Reeves, V. Selvamanickam, IGC SuperPower, Schenectady, NY, R.L. Snyder, The Ohio State University, Columbus, OH

USE OF X-RAYS IN THE UNITED KINGDOM FORENSIC SCIENCE SERVICE
D.F. Rendle, Forensic Science Service, London, United Kingdom

PORTABLE SIMULTANEOUS XRF/XRD PROTOTYPE INSTRUMENT
S. Cornaby, A. Reyes-Mena, P.W. Moody, M. Moras, MOXTEK, Inc., Orem, UT, T. Hughes, Brigham Young University, Provo, UT, L.V. Knight, MOXTEK, Inc., Orem, UT and Brigham Young University, Provo, UT

DIAGNOSIS OF Ln-DOPED PZT FILMS VIA MICRODIFFRACTION: CORRELATION OF PROPERTIES TO OBSERVED FWHM
M.A. Rodriguez, G. Brennecka, B.A. Tuttle, Sandia National Laboratories, Albuquerque, NM

POLARIZATION FOR BACKGROUND REDUCTION IN EDXRF - THE TECHNIQUE THAT WOULD NOT WORK
R.W. Ryon, Lawrence Livermore National Laboratory, Livermore, CA

X-RAY ABSORPTION FINE STRUCTURE (XAFS) IMAGING WITH A NON-SCANNING X-RAY FLUORESCENCE MICROSCOPE
K. Sakurai, M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan

SYNCHROTRON X-RAY FLUORESCENCE WITH A COMPACT JOHANSSON SPECTROMETER (R=100mm)
K. Sakurai, S. Kuwajima, M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan

DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE FOR SYNCHROTRON RADIATION EXPERIMENT AT PHOTON FACTORY (KEK)
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan, K. Hiratsuka, Polytechnic University, Sagamihara, Japan, Y. Yoshioka, Musashi Institute of Technology

DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF NEUTRON IMAGE PLATE AT JAPAN ATOMIC ENERGY RESEARCH INSTITUTE (JAERI)
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan, K. Hiratsuka, Polytechnic University, Sagamihara, Japan, N. Minakawa, Y. Morii, N. Niimura, Japan Atomic Energy Research Institute

DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE FOR LABORATORY X-RAY EQUIPMENT
K. Hiratsuka, Polytechnic University, Sagamihara, Japan, T. Sasaki, K. Seki, Y. Hirose, Kanazawa University, Kanazawa, Japan

RENDERING OF CRYSTALLOGRAPHIC ORIENTATIONS, ORIENTATION AND POLE PROBABILITY DENSITY FUNCTIONS
H. Schaeben, K.G. van den Boogaart, Freiberg University of Mining and Technology, Freiberg/Saxony, Germany

STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION
F.A. Selim, D.P. Wells, J.F. Harmon, J. Kwofie, R. Spaulding, Idaho State University, Pocatello, ID, G. Erikson, Boise State University, Boise, ID, T. Roney, Idaho National Engineering & Environmental Laboratory, Idaho Falls, ID

DEVELOPMENTS IN HIGH-ENERGY X-RAY OPTICS AT ADVANCED PHOTON SOURCE BEAMLINE 1-ID
S.D. Shastri, K. Fezzaa, D.R. Haeffner, B. Lai, W.-K. Lee, J.M. Maser, Argonne National Laboratory, Argonne, IL

APPLYING THE CONCEPT OF TRUENESS TO ALLOY ANALYSIS USING WDXRF AND BORATE FUSION
J.R. Sieber, National Institute of Standards & Technology, Gaithersburg, MD

QUANTITATIVE PHASE ANALYSIS OF HVOF WC COATINGS USING RIETVELD MODELLING OF X-RAY DIFFRACTION PATTERNS
J. Savarimuthu, D.E. Simon, University of Tulsa, Tusa, OK

BACKGROUND REDUCTION IN PROPORTIONAL COUNTER
H. Sipila, Metorex International, Espoo, Finland

X-RAY INVESTIGATION OF THE SINTERED NIOBIUM POWDER STRUCTURAL INHOMOGENEITIES
L. Skatkov, PCB "Argo", Beer-Sheva, Israel

IN-SITU SYNCHROTRON STUDIES OF CHEMICAL VAPOR DEPOSITION
G.B. Stephenson, D.D. Fong, S.K. Streiffer, J.A. Eastman, O. Auciello, P.F. Fuoss, G.-R. Bai, L. Thompson, Argonne National Laboratory, Argonne, IL, M.E.M. Aanerud, C. Thompson, Northern Illinois University, Dekalb, IL

HIGH RESOLUTION SYNCHROTRON ABSORPTION MICROTOMOGRAPHY AND MICROBEAM DIFFRACTION STUDY OF THE MINERAL PHASE MICROSTRUCTURE IN SEA URCHIN TEETH
S.R. Stock, Northwestern University, Chicago, IL, K. Ignatiev, Georgia Institute of Technology, Atlanta, GA, T. Dahl, J. Barss, A. Veis, Northwestern University Medical School, Chicago, IL, J. Almer, F. DeCarlo, Argonne National Laboratory, Argonne, IL

SYNCHROTRON RADIATION INDUCED TXRF OF LOW Z ELEMENTS: ANALYSIS OF Si WAFER SURFACES AT THE PTB UNDULATOR PGM BEAMLINE AT BESSYII
C. Streli, G. Pepponi, P. Wobrauschek, Atominstitut der Osterreichischen Universitaten, Wien, Austria, B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany, S. Pahlke, L. Fabry, Th. Ehmann, Wacker Siltronic, Burghausen, Germany, B

SYNCHROTRON RADIATION INDUCED TOTAL REFLECTION X-RAY SPECTROMETRY OF LOW Z ELEMENTS ON SI WAFER SURFACES AT SSRL, BEAMLINE 3-3: COMPARISON OF DROPLETS WITH SPIN COATED WAFERS
C. Streli, G. Pepponi, P. Wobrauschek, N. Zoeger, Atominstitut der Osterreichischen Universitaten, Wien, Austria, P. Pianetta, K. Baur, Stanford Synchrotron Radiation Laboratory (SSRL), Stanford, CA, S. Pahlke, L. Fabry, C. Mantler, Wacker Siltronic, B

NEXAFS SPECTROSCOPY OF ORGANIC CONTAMINATION ON Si WAFERS BY TXRF
G. Pepponi, C. Streli, Atominstitut der Osterreichischen Universitaten, Wien, Austria, B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany, T. Ehmann, S. Pahlke, L. Fabry, Wacker Siltronic, Burghausen, Germany

CRYSTAL STRUCTURE OF OXYGEN/NITROGEN-DOPED GeSbTe PHASE-CHANGE MEDIA: INVESTIGATION USING GRAZING INCIDENCE X-RAY DIFFRACTION
A. Takase, G. Fujinawa, Rigaku Corporation, Tokyo, Japan, A. Ebina, Teijin Limited, Hiroshima, Japan

THE ATTEMPT OF ULTRA SENSITIVE X-RAY FLUORESCENCE SPECTROMETRY USING THE MULTI EXCITATION X-RAY TUBE
K. Taniguchi, S. Maeo, C. Uno, H. Nagai, Osaka Electro-Communication University, Osaka, Japan

ANALYTICAL PERFORMANCE OF A NEW GENERATION OF HANDHELD EDXRF SPECTROMETERS
V. Thomsen, D. Schatzlein, Niton Corporation, Billerica, MA

METHODS FOR ANALYZING METAL TRITIDES IN THE X-RAY DIFFRACTION LABORATORY
R. Tissot, M. Eatough, Sandia National Laboratories, Albuquerque, NM

DETECTION OF VERY SMALL PREFERRED ORIENTATION IN THIN FILM LAYERS BY ROCKING-CURVE MEASUREMENT
H. Toraya, H. Hibino, T. Ida, Nagoya Institute of Technology, Tajimi, Japan

SELECTIVE SORBENTS FOR XRF BASED ON CROWN-ETHERS
L.I. Trakhtenberg, G.N. Gerasimov, V.F. Gromov, State Scientific Center, Moscow, Russia, A.P. Morovov, M.G. Vasin, A.E. Lakhtikov, Yu.V. Ignatiev, V.V. Nazarov, V.N. Funin, Russian Federal Nuclear Center, Sarov, Russia

EXPERIMENTAL DETERMINATION AND CHARACTERISATION OF Fe L SPECTRA FROM DIFFERING VALENCE STATES
G. Trudgett, B. Cheary, K. Turner, University of Technology, Sydney, Australia

APPLICATIONS OF MINIATURE X-RAY TUBES FOR PORTABLE X-RAY FLUORESCENCE ANALYSIS
D. Clark Turner, A. Reyes-Mena, C. Jensen, MOXTEK, Inc., Orem, UT

SIMULATION OF X-RAY REFLECTIVITY FROM PERIODICAL SURFACE GRATINGS
A. Ulyanenkov, Bruker AXS, Inc., Karlsruhe, Germany, I. Feranchuk, S. Feranchuk, Belorussian State University, Minsk, Belarus

CONSTITUTIVE BEHAVIOR OF PZT-BASED FERROELECTRIC CERAMICS
R.C. Rogan, E. Ustundag, B. Clausen, California Institute of Technology, Pasadena, CA, M.R. Daymond, Rutherford Appleton Laboratory, Oxon, United Kingdom, C.M. Landis, Rice University, Houston, TX, V. Knoblauch, Robert Bosch GmbH, Stuttgart, Germany

STUDY OF FIBER-REINFORCED COMPOSITES USING X-RAY MICROTOPOGRAPHY
J.C. Hanan, E. Ustundag, C.C. Aydiner, M.A. Brown, G.S. Welsh, G.A. Swift, California Institute of Technology, Pasadena, CA, J.L. Jordan-Sweet, I.C. Noyan, IBM Research Division, Yorktown Heights, NY

HIGH TEMPERATURE ELASTIC STRAIN EVOLUTION IN Si3N4- BASED CERAMICS
G.A. Swift, E. Ustundag, B. Clausen, California Institute of Technology, Pasadena, CA, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM, H.-T. Lin, Oak Ridge National Laboratory, Oak Ridge, TN, C.-W. Li, Honeywell Corporation, Morristown,

EFFECT OF BEAM DIVERGENCE ON STRAIN DATA FROM NEUTRON DIFFRACTION
E. Ustundag, R.A. Karnesky, California Institute of Technology, Pasadena, CA, I.C. Noyan, IBM Research Division, Yorktown Heights, NY, M.A.M. Bourke, D.W. Brown, Los Alamos National Laboratory, Los Alamos, NM

X-RAY STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES
J.C. Hanan, E. Ustundag, G.A. Swift, California Institute of Technology, Pasadena, CA, J.D. Almer, U. Lienert, D.R. Haeffner, Argonne National Laboratory, Argonne, IL

DEFORMATION MECHANISMS OF DUCTILE-PHASE-REINFORCED BULK METALLIC GLASS COMPOSITES
S.-Y. Lee, E. Ustundag, B. Clausen, H. Choi-Yim, California Institute of Technology, Pasadena, CA, D.W. Brown, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM

MEASUREMENT OF STRAIN FIELDS OF INDIVIDUAL DOMAINS IN BaTiO3 USING X-RAY MICRODIFFRACTION
R.C. Rogan, E. Ustundag, G.A. Swift, California Institute of Technology, Pasadena, CA, N. Tamura, Lawrence Berkeley National Laboratory, Berkeley, CA

DIFFRACTION MEASUREMENTS DURING MECHANICAL LOADING IN SUPERELASTIC AND SHAPE-MEMORY ALLOYS
R. Vaidyanathan, University of Central Florida

ACQUIRING THE FUNDAMENTALS : AN ACCREDITED POWDER DIFFRACTION COURSE ON THE INTERNET
M. Vickers, J. K. Cockcroft, P. Barnes, M. P. Attfield and L. M. D. Cranswick, School of Crystallography, Birkbeck College, University of London, U.K.

STUDIES OF SPECTROMETER WITH X-RAY POLYCAPILLARY LENS
A.P. Morovov, M.G. Vasin, A.E. Lakhtikov, V.V. Nazarov, Russian Federal Nuclear Center, Sarov, Russia

SCANNING X-RAY MICROTOPOGRAPHY STUDY OF ELECTROMIGRATION IN INTEGRATED CIRCUITS
P.-C. Wang, IBM Corporation, Hopewell Junction, NY

PORTABLE XRF FOR FORENSIC INVESTIGATIONS
D.C. Ward, Federal Bureau of Investigations, Washington, DC

CHARACTERIZATION OF THE SOLIDS WASTE IN THE HANFORD WASTE TANKS USING A COMBINATION OF XRD, SEM, AND PLM
R.W. Warrant, G.A. Cooke, Fluor Hanford, Richland, WA

RESIDUAL STRESS MEASUREMENTS USING PARALLEL BEAM OPTICS
T.R. Watkins, O.B. Cavin, J. Bai, Oak Ridge National Laboratory, Oak Ridge, TN, J.A. Chediak, University of California - Berkeley, Berkeley, CA

HEAVY MINERAL ANALYSIS OF SANDSTONES BY RIETVELD ANALYSIS
J.R. Webster, R.P. Kight, R.S. Winburn, C.A. Cool, Minot State University, Minot, ND

APPLICATION OF THE BACKSCATTER FUNDAMENTAL PARAMETER METHOD WITH SIMULTANEOUS EXCITATION BY 55FE AND 109CD RADIOISOTOPE SOURCES
D. Wegrzynek, A. Markowicz, E. Chinea-Cano International Atomic Energy Agency, Vienna, Austria, P. Potts, The Open University, Milton Keynes, United Kingdom

DEVELOPMENT OF A TUNABLE, MONO-ENERGETIC X-RAY SOURCE USING LASER-COMPTON SCATTERING (LCS) FROM A 20 MeV ELECTRON BEAM
K. Choufanni, D. Wells, F. Harmon, Idaho State University, Pocatello, ID, J.L. Jones, G. Lancaster, Idaho National Engineering & Environmental Laboratory, Idaho Falls, ID

MINIMIZATION OF MICROABSORPTION EFFECTS ON A COMPLEX SYSTEM
B.M. Pederson, R.S. Winburn, Minot State University, Minot, ND

MINERALOGY OF VOLCANIC ROCKS BY RIETVELD ANALYSIS
R.M. Gonzalez, T.D. Lorbiecke, T. Edwards, J.R. Webster, R.S. Winburn, Minot State University, Minot, ND

RIETVELD QUANTITATIVE X-RAY DIFFRACTION ON COMPLEX MIXTURES - WHAT CAN WE DO?
R.S. Winburn, Minot State University, Minot, ND

THE USE OF VARIOUS PEAK DECONVOLUTION MODELS FOR ED-XRF ANALYSIS OF LAYERED MATERIALS
A. Wittkopp, B. Cross, F. Ferrandino, NeXray Corporation, Ronkonkoma, NY

SI DRIFT DETECTOR VERSUS SI(LI) DETECTOR FOR TXRF APPLICATIONS
P. Wobrauschek, F. Osmic, C. Streli, Atominstitut der Osterreichischen Universitaten, Wien, Austria

COMPARISON OF SR-TXRF EXCITATION-DETECTION GEOMETRIES FOR SAMPLES WITH DIFFERING MATRICES
G. Pepponi, C. Streli, P. Wobrauschek, S. Zamini, N. Zoger, Atominstitut der Osterreichischen Universitaten, Wien, Austria, G. Falkenberg, HASYLAB at DESY, Hamburg, Germany

ALTERED PB/CA CONCENTRATIONS IN DIFFERENT BONE AREAS INVESTIGATED BY SR-XRF
P. Wobrauschek, N. Zoger, G. Pepponi, C. Streli, S. Zamini, Atominstitut der Osterreichischen Universitaten, Wien, Austria, G. Falkenberg, HASYLAB at DESY, Hamburg, Germany, W. Osterode, Universitatsklinik fur Innere Medizin IV, Wien, Austria

MICROANALYSIS WITH A POLYCAPILLARY IN A VACUUM CHAMBER
P. Wobrauschek, N. Marosi, C. Streli, Atominstitut der Osterreichischen Universitaten, Wien, Austria

HIGH TEMPERATURE X-RAY STUDY OF PHASE EVOLUTION OF Ba2YCu3O6+x FILMS USING THE BaF2 PROCESS
W. Wong-Ng, M. Vaudin, I. Levin, L.P. Cook, J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD, R. Feenstra, Oak Ridge National Laboratory, Oak Ridge, TN

X-RAY AND NEUTRON RIETVELD REFINEMENTS OF BaR2CuO5 AND Ba5R8Zn4O21 (R=LANTHANIDES)
W. Wong-Ng, B. Toby, J. Dillingham, W. Greenwood, National Institute of Standards & Technology, Gaithersburg, MD, J. Kaduk, BP-Amoco Research Center, Naperville, IL

ACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM METAL
C.G. Worley, Los Alamos National Laboratory, Los Alamos, NM

NEW MULTILAYER MONOCHROMATOR FOR HEAVY ELEMENTS ANALYSIS IN TXRF
T. Yamada, M. Doi, Rigaku Corporation, Osaka, Japan, Y. Platonov, Osmic, Inc., Auburn Hills, MI

NEW IN-LINE WAFER ANALYZER, VPD INTEGRATED TXRF
M. Yamagami, A. Ikeshita, Y. Onizuka, T. Yamada, Rigaku Corporation, Osaka, Japan

EDXRF AS AN IMPORTANT TOOL IN THE SELECTIVE LEACHING OF URANIUM AND THORIUM FROM CONTAMINATED ZIRCON
M. Yusoff, Malaysian Institute for Nuclear Technology Research, Selangor, Malaysia

METHODOLOGY OF SYNCHROTRON EDXRD STRAIN PROFILING
I. Zakharchenko, Y. Gulak, M. Croft, T. Tsakalakos, Rutgers University, Piscataway, NJ, Z. Zhong, NSLS, Brookhaven National Laboratory, Upton, NY

CRYSTAL STRUCTURE DETERMINATION FROM X-RAY POWDER DIFFRACTION DATA
P.Y. Zavalij, State University of New York at Binghamton, Binghamton, NY