2002 Denver X-ray Conference > Poster Sessions > Monday 29 July 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home 6:30 p.m.–8:30 p.m., authors present The XRD Poster Session I will be held in conjunction with the Philips Analytical mixer. XRD Poster Session I, Monday, 29 July (Summit) Session chairs will select the two best papers for awards. Chairs: I.C. Noyan, IBM, Yorktown Heights, NY D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK Software & Theory D-113 MANAGING THE BACKGROUND PROFILE USING THE NEW X’CELERATOR DETECTOR R.W. Morton, D.E. Simon, J.J. Gislason, Phillips Petroleum Company, Bartlesville, OK D-087 CALIBRATION OF DIFFRACTOMETERS II: INTERNAL CONSISTENCY AND THE BALANCE G. Berti, U. Bartoli, M. D’Acunto, F. De Marco, University of Pisa, Pisa, Italy D-005 THEORY OF X-RAYS BACKSCATTERING BY WEAKLY AND STRONGLY BENT CRYSTALS T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia D-015 SIMULATION OF X-RAY REFLECTIVITY FROM PERIODICAL SURFACE GRATINGS A. Ulyanenkov, Bruker AXS, Inc., Karlsruhe, Germany I. Feranchuk, S. Feranchuk, Belorussian State University, Minsk, Belarus D-045 ANALYSIS OF THE FACTORS, INFLUENCING THE PRECISION OF SIMULATED X-RAY DIFFRACTION (REFLECTION) CURVES A. Ulyanenkov, Bruker AXS, Inc., Karlsruhe, Germany D-031 MULTI-STEP REFINEMENT OF DIFFRACTION PATTERN WITH OVERLAPPING BRAGG REFLECTIONS B.N. Kodess, ICS & E, Denver, CO I.P. Jouravlev, VNIIMS, Moscow, Russia D-059 MINIMIZATION OF MICROABSORPTION EFFECTS ON A COMPLEX SYSTEM B.M. Pederson, R.S. Winburn, Minot State University, Minot, ND D-010 RENDERING OF CRYSTALLOGRAPHIC ORIENTATIONS, ORIENTATION AND POLE PROBABILITY DENSITY FUNCTIONS H. Schaeben, K.G. van den Boogaart, Freiberg University of Mining and Technology, Freiberg/Saxony, Germany Hardware/Instruments C-03 HE DEVELOPMENT OF THE PORTABLE XRF & XRD S. Maeo, S. Nomura, K. Taniguchi, Osaka Electro-Communication University, Osaka, Japan C-04 PORTABLE SIMULTANEOUS XRF/XRD PROTOTYPE INSTRUMENT S. Cornaby, A. Reyes-Mena, P.W. Moody, M. Moras, MOXTEK, Inc., Orem, UT T. Hughes, Brigham Young University, Provo, UT L.V. Knight, MOXTEK, Inc., Orem, UT and Brigham Young University, Provo, UT D-003 X-RAY FOCUSING OPTICS OF DOUBLE-CRYSTAL SYSTEMS T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia  D-004 DIFFRACTIONAL TRAP FOR THERMAL NEUTRONS T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia D-006 SPECTROMETERS FOR HARD X-RAYS ON THE BASIS OF CURVED CRYSTALS T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia D-009  THE PERFORMANCE OF YB66 DOUBLE CRYSTAL MONOCHROMATOR FOR DISPERSING SYNCHROTRON RADIATION AT SPRING-8 M. Kitamura, H. Yoshikawa, V.A. Mihai, A. Nisawa, N. Yagi, M. Okui, M. Kimura, T. Tanaka, S. Fukushima, National Institute for Materials Science, Hyogo, Japan T. Mochizuki, Japan Synchrotron Radiation Research Institute, Hyogo, Japan D-017 FRESNEL COMPOSITE ZONE PLATES FOR HARD X-RAY FOCUSING V.V. Aristov, A.V. Kuyumchyan, A.A. Isoyan, E.V. Shulakov, M.V. Grigorev, IMT of the Russian Academy of Science, Moscow District, Russia S. Kuznetsov, I. Snigireva, A. Snigirev, ESRF, Grenoble, France K.G. Trouny, Yerevan State University, Yerevan, Armenia D-056 HIGH STABILITY MICROFOCUS X-RAY SOURCE FOR ANALYTICAL APPLICATION M. Ito, T. Inazuru, M. Iguchi, Hamamatsu Photonics K.K., Shizuoka, Japan D-063 A SIMPLE GLANCING ANGLE ATTACHMENT FOR A POWDER DIFFRACTOMETER J.A. Carsello, Northwestern University, Evanston, IL Structure D-007 X-RAY INVESTIGATION OF THE SINTERED NIOBIUM POWDER STRUCTURAL INHOMOGENEITIES L. Skatkov, PCB “Argo”, Beer-Sheva, Israel D-021 THE EFFECTS OF SINTERING TIME AND ATMOSPHERE ON SURFACE FILM FORMATION IN THREE CERAMIC WASTE FORMS USING X-RAY DIFFRACTION D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, Westinghouse Savannah River Site, Aiken, SC D-027 STABILITY, STRUCTURE, AND IONIC CONDUCTION IN MODIFIED AURIVILLIUS CERAMICS S. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY D-091 NEUTRON POWDER DIFFRACTION STUDIES OF HEXACELSIAN WITH AND WITHOUT MgO AND TiO2 ADDITIONS C.J. Rawn, B.C. Chakoumakos, Oak Ridge National Laboratory, Oak Ridge, TN H.J. Holland, J.T. Kohli, Corning, Inc., Corning, NY D-019 CRYSTAL STRUCTURE OF OXYGEN/NITROGEN-DOPED GeSbTe PHASE-CHANGE MEDIA: INVESTIGATION USING GRAZING INCIDENCE X-RAY DIFFRACTION A. Takase, G. Fujinawa, Rigaku Corporation, Tokyo, Japan A. Ebina, Teijin Limited, Hiroshima, Japan