2002 Denver X-ray Conference > Poster Sessions > Wednesday 31 July 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home 6:30 p.m.–8:30 p.m., authors present The XRF Poster Session will be held in conjunction with the Bruker AXS, Inc. mixer.   XRD Poster Session I, Wednesday, 31 July (Summit) Session chairs will select the three best papers for awards. Chairs: M.A. Zaitz, IBM–EF Microelectronics, Hopewell Junction, NY K. Taniguchi, Osaka Electro-Communication University, Osaka, Japan EDXRF F-25 IDENTIFICATION OF FORGED WORKS OF ART BY PORTABLE EDXRF SPECTROMETRY J.L. Ferrero, C. Roldán, D. Juanes, J. Carballo, J. Pereira, J.L. Lluch, Universitat de València (ICMUV), València, Spain M.E. Pernett, M. Crespo, Museo Nacional de Bellas Artes, Habana, Cuba F-18 EDXRF AS AN IMPORTANT TOOL IN THE SELECTIVE LEACHING OF URANIUM AND THORIUM FROM CONTAMINATED ZIRCON M. Yusoff, Malaysian Institute for Nuclear Technology Research, Selangor, Malaysia TXRF F-17 NEW IN-LINE WAFER ANALYZER, VPD INTEGRATED TXRF M. Yamagami, A. Ikeshita, Y. Onizuka, T. Yamada, Rigaku Corporation, Osaka, Japan F-39 SYNCHROTRON RADIATION INDUCED TXRF OF LOW Z ELEMENTS: ANALYSIS OF Si WAFER SURFACES AT THE PTB UNDULATOR PGM BEAMLINE AT BESSYII C. Streli, G. Pepponi, P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Wien, Austria B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany S. Pahlke, L. Fabry, Th. Ehmann, Wacker Siltronic, Burghausen, Germany B. Kanngießer, W. Malzer, Technische Universitäten Berlin, Berlin, Germany F-44  NEXAFS SPECTROSCOPY OF ORGANIC CONTAMINATION ON Si WAFERS BY TXRF G. Pepponi, C. Streli, Atominstitut der Österreichischen Universitäten, Wien, Austria B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany T. Ehmann, S. Pahlke, L. Fabry, Wacker Siltronic, Burghausen, Germany F-45 COMPARISON OF SR-TXRF EXCITATION-DETECTION GEOMETRIES FOR SAMPLES WITH DIFFERING MATRICES G. Pepponi, C. Streli, P. Wobrauschek, S. Zamini, N. Zöger, Atominstitut der Österreichischen Universitäten, Wien, Austria G. Falkenberg, HASYLAB at DESY, Hamburg, Germany F-16 NEW MULTILAYER MONOCHROMATOR FOR HEAVY ELEMENTS ANALYSIS IN TXRF T. Yamada, M. Doi, Rigaku Corporation, Osaka, Japan Y. Platonov, Osmic, Inc., Auburn Hills, MI F-40 SYNCHROTRON RADIATION INDUCED TOTAL REFLECTION X-RAY SPECTROMETRY OF LOW Z ELEMENTS ON Si WAFER SURFACES AT SSRL, BEAMLINE 3-3: COMPARISON OF DROPLETS WITH SPIN COATED WAFERS C. Streli, G. Pepponi, P. Wobrauschek, N. Zoeger, Atominstitut der Österreichischen Universitäten, Wien, Austria P. Pianetta, K. Baur, Stanford Synchrotron Radiation Laboratory (SSRL), Stanford, CA S. Pahlke, L. Fabry, C. Mantler, Wacker Siltronic, Burghausen, Germany B. Kanngießer, W. Malzer, Technische Universitäten Berlin, Berlin, Germany F-38 Si DRIFT DETECTOR VERSUS Si(Li) DETECTOR FOR TXRF APPLICATIONS P. Wobrauschek, F. Osmic, C. Streli, Atominstitut der Österreichischen Universitäten, Wien, Austria Miscellaneous F-11 FUNDAMENTAL PARAMETER METHOD FOR LOW ENERGY REGION N. Kawahara, T. Yamada, Rigaku Corporation, Osaka, Japan B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany R. Herbst, M. Mantler, Technische Universität Wien, Wien, Austria F-14 THE ANALYSIS OF GLASS FRIT BY WAVELENGTH-DISPERSIVE X-RAY SPECTROMETRY A.R. Jurgensen, D.M. Missimer, R.L. Rutherford, Westinghouse Savannah River Site, Aiken, SC F-04  BACKGROUND REDUCTION IN PROPORTIONAL COUNTER H. Sipilä, Metorex International, Espoo, Finland F-52 STUDY ON CAPILLARY DISCHARGE SOFT X-RAY LASER IN Ne-LIKE Ar Q. Wang, Y. Cheng, Y. Zhao, Harbin Institute of Technology, Harbin, China F-02 STUDIES OF SPECTROMETER WITH X-RAY POLYCAPILLARY LENS A.P. Morovov, M.G. Vasin, A.E. Lakhtikov, V.V. Nazarov, Russian Federal Nuclear Center, Sarov, Russia F-32 TECHNIQUES FOR SAMPLE PREPARATION OF FERRO-ALLOY AND SULFIDES FOR XRF ANALYSIS WITH FUSED BEADS ON AN AUTOMATIC GAS FUSION MACHINE M. Davidts, I.C.P.H. Chemical International, Philadelphia, PA F-24 EXPERIMENTAL EVIDENCE FOR SECONDARY EXCITATION IN X-RAY PHOTOELECTRON SPECTROMETRY M.F. Ebel, R. Svagera, R. Ashury, H. Ebel, Vienna University of Technology, Vienna, Austria F-03 SELECTIVE SORBENTS FOR XRF BASED ON CROWN-ETHERS L.I. Trakhtenberg, G.N. Gerasimov, V.F. Gromov, State Scientific Center, Moscow, Russia A.P. Morovov, M.G. Vasin, A.E. Lakhtikov, Yu.V. Ignatiev, V.V. Nazarov, V.N. Funin, Russian Federal Nuclear Center, Sarov, Russia