The 2002 Denver X-ray Conference
Antlers Adam's Mark Hotel

(formerly Antlers Doubletree Hotel)
Colorado Springs, Colorado, U.S.A.
29th July - 2nd August 2002

Denver X-ray Conference - sponsored by the International Centre for Diffraction Data
Poster Sessions

Monday 29 July
6:30 p.m.–8:30 p.m., authors present
The XRD Poster Session I will be held in conjunction with the Philips Analytical mixer.

XRD Poster Session I, Monday, 29 July

(Summit)

Session chairs will select the two best papers for awards.
Chairs:

I.C. Noyan, IBM, Yorktown Heights, NY
D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK

Software & Theory

D-113 MANAGING THE BACKGROUND PROFILE USING THE NEW X’CELERATOR DETECTOR
R.W. Morton, D.E. Simon, J.J. Gislason, Phillips Petroleum Company, Bartlesville, OK
D-087 CALIBRATION OF DIFFRACTOMETERS II: INTERNAL CONSISTENCY AND THE BALANCE
G. Berti, U. Bartoli, M. D’Acunto, F. De Marco, University of Pisa, Pisa, Italy
D-005 THEORY OF X-RAYS BACKSCATTERING BY WEAKLY AND STRONGLY BENT CRYSTALS
T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia
D-015 SIMULATION OF X-RAY REFLECTIVITY FROM PERIODICAL SURFACE GRATINGS
A. Ulyanenkov, Bruker AXS, Inc., Karlsruhe, Germany
I. Feranchuk, S. Feranchuk, Belorussian State University, Minsk, Belarus
D-045 ANALYSIS OF THE FACTORS, INFLUENCING THE PRECISION OF SIMULATED X-RAY
DIFFRACTION (REFLECTION) CURVES
A. Ulyanenkov, Bruker AXS, Inc., Karlsruhe, Germany
D-031 MULTI-STEP REFINEMENT OF DIFFRACTION PATTERN WITH OVERLAPPING BRAGG
REFLECTIONS
B.N. Kodess, ICS & E, Denver, CO
I.P. Jouravlev, VNIIMS, Moscow, Russia
D-059 MINIMIZATION OF MICROABSORPTION EFFECTS ON A COMPLEX SYSTEM
B.M. Pederson, R.S. Winburn, Minot State University, Minot, ND
D-010 RENDERING OF CRYSTALLOGRAPHIC ORIENTATIONS, ORIENTATION AND POLE PROBABILITY DENSITY FUNCTIONS
H. Schaeben, K.G. van den Boogaart, Freiberg University of Mining and Technology,
Freiberg/Saxony, Germany

Hardware/Instruments

C-03 HE DEVELOPMENT OF THE PORTABLE XRF & XRD
S. Maeo, S. Nomura, K. Taniguchi, Osaka Electro-Communication University, Osaka,
Japan
C-04 PORTABLE SIMULTANEOUS XRF/XRD PROTOTYPE INSTRUMENT
S. Cornaby, A. Reyes-Mena, P.W. Moody, M. Moras, MOXTEK, Inc., Orem, UT
T. Hughes, Brigham Young University, Provo, UT
L.V. Knight, MOXTEK, Inc., Orem, UT and Brigham Young University, Provo, UT
D-003 X-RAY FOCUSING OPTICS OF DOUBLE-CRYSTAL SYSTEMS
T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia
 D-004 DIFFRACTIONAL TRAP FOR THERMAL NEUTRONS
T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia
D-006 SPECTROMETERS FOR HARD X-RAYS ON THE BASIS OF CURVED CRYSTALS
T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia
D-009  THE PERFORMANCE OF YB66 DOUBLE CRYSTAL MONOCHROMATOR FOR
DISPERSING SYNCHROTRON RADIATION AT SPRING-8
M. Kitamura, H. Yoshikawa, V.A. Mihai, A. Nisawa, N. Yagi, M. Okui, M. Kimura,
T. Tanaka, S. Fukushima
, National Institute for Materials Science, Hyogo, Japan
T. Mochizuki, Japan Synchrotron Radiation Research Institute, Hyogo, Japan
D-017 FRESNEL COMPOSITE ZONE PLATES FOR HARD X-RAY FOCUSING
V.V. Aristov, A.V. Kuyumchyan, A.A. Isoyan, E.V. Shulakov, M.V. Grigorev, IMT of the
Russian Academy of Science, Moscow District, Russia
S. Kuznetsov, I. Snigireva, A. Snigirev, ESRF, Grenoble, France
K.G. Trouny, Yerevan State University, Yerevan, Armenia
D-056 HIGH STABILITY MICROFOCUS X-RAY SOURCE FOR ANALYTICAL APPLICATION
M. Ito, T. Inazuru, M. Iguchi, Hamamatsu Photonics K.K., Shizuoka, Japan
D-063 A SIMPLE GLANCING ANGLE ATTACHMENT FOR A POWDER DIFFRACTOMETER
J.A. Carsello, Northwestern University, Evanston, IL

Structure

D-007 X-RAY INVESTIGATION OF THE SINTERED NIOBIUM POWDER STRUCTURAL
INHOMOGENEITIES
L. Skatkov, PCB “Argo”, Beer-Sheva, Israel
D-021 THE EFFECTS OF SINTERING TIME AND ATMOSPHERE ON SURFACE FILM
FORMATION IN THREE CERAMIC WASTE FORMS USING X-RAY DIFFRACTION
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, Westinghouse Savannah River Site,
Aiken, SC
D-027 STABILITY, STRUCTURE, AND IONIC CONDUCTION IN MODIFIED AURIVILLIUS
CERAMICS
S. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University,
Alfred, NY
D-091 NEUTRON POWDER DIFFRACTION STUDIES OF HEXACELSIAN WITH AND
WITHOUT MgO AND TiO2 ADDITIONS
C.J. Rawn, B.C. Chakoumakos, Oak Ridge National Laboratory, Oak Ridge, TN
H.J. Holland, J.T. Kohli, Corning, Inc., Corning, NY
D-019 CRYSTAL STRUCTURE OF OXYGEN/NITROGEN-DOPED GeSbTe PHASE-CHANGE
MEDIA: INVESTIGATION USING GRAZING INCIDENCE X-RAY DIFFRACTION
A. Takase, G. Fujinawa, Rigaku Corporation, Tokyo, Japan
A. Ebina, Teijin Limited, Hiroshima, Japan

 

Tuesday 30 July
6:30 p.m.–8:30 p.m., authors present
The XRD Poster Session II will be held in conjunction with the MDI and Rigaku/MSC, Inc. mixer.

 

XRD Poster Session I, Tuesday, 30 July

(Summit)

Session chairs will select the two best papers for awards.
Chairs:

T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
R. Barton, Jr., Emeritus, DuPont Experimental Station, Wilmington, DE

Quantitative Analysis

D-060 MINERALOGY OF VOLCANIC ROCKS BY RIETVELD ANALYSIS
R.M. Gonzalez, T.D. Lorbiecke, T. Edwards, J.R. Webster, R.S. Winburn, Minot State
University, Minot, ND
D-058 HEAVY MINERAL ANALYSIS OF SANDSTONES BY RIETVELD ANALYSIS
J.R. Webster, R.P. Kight, R.S. Winburn, C.A. Cool, Minot State University, Minot, ND

 
Non-Ambient 

D-075 XRD STUDY OF THE DEHYDRATION REACTION OF THEOPHYLLINE MONOHYDRATE: EFFECT OF POLYVINYLPYRROLIDONE
C. Nunes, R. Suryanarayanan, University of Minnesota, Minneapolis, MN
A. Mahendrasingam, Keele University, Staffordshire, UK
D-039 HIGH-TEMPERATURE X-RAY DIFFRACTION STUDY OF REACTION RATES IN CERAMICS
M.S. Peterson, II, C.A. Say, S.A. Speakman, S.T. Misture, New York State College of
Ceramics at Alfred University, Alfred, NY
D-030 STUDIES OF THE TRANSITION STATE FOR KDP-DKDP SOLID SOLUTION
B.N. Kodess, ICS & E, Denver, CO
A.I. Beskrovny, VNIIMS, Moscow, Russia
D-044 HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES USING A TWO-DIMENSIONAL
DETECTOR
J. Brechbühl, H.-G. Krane, F. Stowasser, L. Brügemann, Bruker AXS GmbH, Karlsruhe,
Germany
D-081 IN SITU, IN AIR, HIGH-TEMPERATURE STUDIES OF OXIDE SYSTEMS USING THE
THERMAL-IMAGING TECHNIQUE
L. Siah, W.M. Kriven, University of Illinois at Urbana-Champaign, Urbana, IL

Stress/Strain 

D-029 NANOSTRUCTURE ANALYSIS USING 2D SMALL ANGLE X-RAY SCATTERING OPTIMIZED FOR Fe-BASED ALLOYS
K. Erlacher, R. Görgl, Material Center Leoben GmbH, Austria and Austrian Academy of
Sciences and University of Leoben, Austria
H. Jakob, Bruker AXS GmbH, Germany
P. Fratzl, Austrian Academy of Sciences and University of Leoben, Austria
D-034 MEASUREMENT OF STRESS IN SURFACE ACOUSTIC WAVE FILTERS USING BRAGG
ANGLE CONTOUR MAPPING
P.M. Adams, The Aerospace Corporation, Los Angeles, CA
D-047 AN EXPERIMENTAL STUDY ON X-RAY RESIDUAL STRESSES INDUCED BY SHOT
PEENING PROCESS OF AUSTENITE STAINLESS STEEL
S. Takahashi, T. Murotani, Y. Hirose, Kanazawa University, Kanazawa, Japan
K. Hiratsuka, Polytechnic University, Sagamihara, Japan
D-050 PLASTIC STRAIN OF ROLLED DUPLEX / STAINLESS
H. Hirose, Kinjo University, Ishikawa, Japan
S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan
M. Tone, T. Sasaki, Kanazawa University, Kanazawa, Japan
M. Saka, Tohoku University, Miyagi, Japan
D-051 DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE
FOR SYNCHROTRON RADIATION EXPERIMENT AT PHOTON FACTORY (KEK)
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan
K. Hiratsuka, Polytechnic University, Sagamihara, Japan
Y. Yoshioka, Musashi Institute of Technology
D-052 DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF NEUTRON
IMAGE PLATE AT JAPAN ATOMIC ENERGY RESEARCH INSTITUTE (JAERI)
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan
K. Hiratsuka, Polytechnic University, Sagamihara, Japan
N. Minakawa, Y. Morii, N. Niimura, Japan Atomic Energy Research Institute
D-053 DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE
FOR LABORATORY X-RAY EQUIPMENT
K. Hiratsuka, Polytechnic University, Sagamihara, Japan
T. Sasaki, K. Seki, Y. Hirose, Kanazawa University, Kanazawa, Japan
D-054 THERMAL FATIGUE PROPERTIES OF LASER PEENED HOT WORK DIE STEEL (H13)
K. Yatsushiro, M. Sano, Yamanashi Industrial Technology Center, Yamanashi, Japan
M. Kuramoto, Polytechnic University, Kanagawa, Japan
D-118 MICROSTRUCTURE ANALYSIS OF STRAIN-FREE Y2O3 NANOPOWDERS FROM
PATTERN DECOMPOSITION AND WHOLE PATTERN FITTING APPROACHES
D. Louër, T. Bataille, T. Roisnel, Université de Rennes I, Rennes Cedex, France

Thin Films

D-084 USING X-RAY MAPPING TECHNIQUES TO CORRELATE SUBSTRATE AND FILM PROPERITIES WITH DEVICE PERFORMANCE
K.W. Kirchner, K.A. Jones, Army Research Lab, Adelphi, MD
D-002 BACKSCATTERING OF X-RADIATION BY CURVED BICRYSTALS AND CRYSTALS WITH THIN EPITAXIAL FILMS
T. Tchen, Moscow State Academy of Fine Chemical Technology, Moscow, Russia
D-046 EFFECT OF THE RESIDUAL STRESS ON THE MECHANICAL STRENGTH OF THE THIN FILMS
M. Gotoh, T. Sasaki, Y. Hirose, Kanazawa University, Ishikawa, Japan
S. Takago, Industrial Research Institute of Ishikawa, Ishikawa, Japan
D-048 PREPARATION OF INTERMETALLIC COMPOUNDS COATING BY Ni-Al MIXED POWDER SPLAYING AND LATER HEAT TREATMENT
T. Murotani, T. Taguchi, Y. Hirose, Kanazawa University, Kanazawa, Japan
A. Ikenaga, Osaka Prefecture University, Sakai, Japan
D-049 EFFECT OF PULSE TIMING ON RESIDUAL STRESS OF CRACK FREE CHROMIUM LAYER DEPOSITED BY PULSE PLATING
Y. Kobayashi, J. Nagasawa, Tokico Ltd., Kawasaki, Japan
K. Watanabe, Atotech Japan K.K., Yokohama, Japan
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan
D-089 A COMPARISON OF ANALYTICAL TECHNIQUES FOR HYDROGEN CONTENTS IN DLC FILMS FORMED BY PBII METHOD
H. Yasui, Y. Hirose, T. Sasaki, Kanazawa University, Kanazawa, Japan
K. Awazu, Industrial Research Institute of Ishikaway, Kanazawa, Japan
H. Naramoto, Japan Atomic Energy Research Institute, Takasaki, Japan

Wednesday 31 July
6:30 p.m.–8:30 p.m., authors present
The XRF Poster Session will be held in conjunction with the Bruker AXS, Inc. mixer.

 

XRD Poster Session I, Wednesday, 31 July

(Summit)

Session chairs will select the three best papers for awards.
Chairs:

M.A. Zaitz, IBM–EF Microelectronics, Hopewell Junction, NY
K. Taniguchi, Osaka Electro-Communication University, Osaka, Japan

EDXRF

F-25 IDENTIFICATION OF FORGED WORKS OF ART BY PORTABLE EDXRF SPECTROMETRY
J.L. Ferrero, C. Roldán, D. Juanes, J. Carballo, J. Pereira, J.L. Lluch, Universitat de
València (ICMUV), València, Spain
M.E. Pernett, M. Crespo, Museo Nacional de Bellas Artes, Habana, Cuba
F-18 EDXRF AS AN IMPORTANT TOOL IN THE SELECTIVE LEACHING OF URANIUM
AND THORIUM FROM CONTAMINATED ZIRCON
M. Yusoff, Malaysian Institute for Nuclear Technology Research, Selangor, Malaysia

TXRF

F-17 NEW IN-LINE WAFER ANALYZER, VPD INTEGRATED TXRF
M. Yamagami, A. Ikeshita, Y. Onizuka, T. Yamada, Rigaku Corporation, Osaka, Japan
F-39 SYNCHROTRON RADIATION INDUCED TXRF OF LOW Z ELEMENTS: ANALYSIS OF
Si WAFER SURFACES AT THE PTB UNDULATOR PGM BEAMLINE AT BESSYII
C. Streli, G. Pepponi, P. Wobrauschek, Atominstitut der Österreichischen Universitäten,
Wien, Austria
B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany
S. Pahlke, L. Fabry, Th. Ehmann, Wacker Siltronic, Burghausen, Germany
B. Kanngießer, W. Malzer, Technische Universitäten Berlin, Berlin, Germany
F-44  NEXAFS SPECTROSCOPY OF ORGANIC CONTAMINATION ON Si WAFERS BY TXRF
G. Pepponi, C. Streli, Atominstitut der Österreichischen Universitäten, Wien, Austria
B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany
T. Ehmann, S. Pahlke, L. Fabry, Wacker Siltronic, Burghausen, Germany
F-45 COMPARISON OF SR-TXRF EXCITATION-DETECTION GEOMETRIES FOR SAMPLES
WITH DIFFERING MATRICES
G. Pepponi, C. Streli, P. Wobrauschek, S. Zamini, N. Zöger, Atominstitut der
Österreichischen Universitäten, Wien, Austria
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany
F-16 NEW MULTILAYER MONOCHROMATOR FOR HEAVY ELEMENTS ANALYSIS IN
TXRF
T. Yamada, M. Doi, Rigaku Corporation, Osaka, Japan
Y. Platonov, Osmic, Inc., Auburn Hills, MI
F-40 SYNCHROTRON RADIATION INDUCED TOTAL REFLECTION X-RAY
SPECTROMETRY OF LOW Z ELEMENTS ON Si WAFER SURFACES AT SSRL,
BEAMLINE 3-3: COMPARISON OF DROPLETS WITH SPIN COATED WAFERS
C. Streli, G. Pepponi, P. Wobrauschek, N. Zoeger, Atominstitut der Österreichischen
Universitäten, Wien, Austria
P. Pianetta, K. Baur, Stanford Synchrotron Radiation Laboratory (SSRL), Stanford, CA
S. Pahlke, L. Fabry, C. Mantler, Wacker Siltronic, Burghausen, Germany
B. Kanngießer, W. Malzer, Technische Universitäten Berlin, Berlin, Germany
F-38 Si DRIFT DETECTOR VERSUS Si(Li) DETECTOR FOR TXRF APPLICATIONS
P. Wobrauschek, F. Osmic, C. Streli, Atominstitut der Österreichischen Universitäten,
Wien, Austria

Miscellaneous

F-11 FUNDAMENTAL PARAMETER METHOD FOR LOW ENERGY REGION
N. Kawahara, T. Yamada, Rigaku Corporation, Osaka, Japan
B. Beckhoff, G. Ulm, Physikalisch-Technische Bundesanstalt, Berlin, Germany
R. Herbst, M. Mantler, Technische Universität Wien, Wien, Austria
F-14 THE ANALYSIS OF GLASS FRIT BY WAVELENGTH-DISPERSIVE X-RAY SPECTROMETRY
A.R. Jurgensen, D.M. Missimer, R.L. Rutherford, Westinghouse Savannah River Site,
Aiken, SC
F-04  BACKGROUND REDUCTION IN PROPORTIONAL COUNTER
H. Sipilä, Metorex International, Espoo, Finland
F-52 STUDY ON CAPILLARY DISCHARGE SOFT X-RAY LASER IN Ne-LIKE Ar
Q. Wang, Y. Cheng, Y. Zhao, Harbin Institute of Technology, Harbin, China
F-02 STUDIES OF SPECTROMETER WITH X-RAY POLYCAPILLARY LENS
A.P. Morovov, M.G. Vasin, A.E. Lakhtikov, V.V. Nazarov, Russian Federal Nuclear Center,
Sarov, Russia
F-32 TECHNIQUES FOR SAMPLE PREPARATION OF FERRO-ALLOY AND SULFIDES FOR
XRF ANALYSIS WITH FUSED BEADS ON AN AUTOMATIC GAS FUSION MACHINE
M. Davidts, I.C.P.H. Chemical International, Philadelphia, PA
F-24 EXPERIMENTAL EVIDENCE FOR SECONDARY EXCITATION IN X-RAY
PHOTOELECTRON SPECTROMETRY
M.F. Ebel, R. Svagera, R. Ashury, H. Ebel, Vienna University of Technology, Vienna,
Austria
F-03 SELECTIVE SORBENTS FOR XRF BASED ON CROWN-ETHERS
L.I. Trakhtenberg, G.N. Gerasimov, V.F. Gromov, State Scientific Center, Moscow, Russia
A.P. Morovov, M.G. Vasin, A.E. Lakhtikov, Yu.V. Ignatiev, V.V. Nazarov, V.N. Funin,
Russian Federal Nuclear Center, Sarov, Russia