2002 Denver X-ray Conference > Sessions > Friday 2 August 2002 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home Session, Friday a.m. (Summit II) Session C-5 X-RAY OPTICS Organized by: N. Gao, X-ray Optical Systems, Inc., Albany, NY Co-chair: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM XRD & XRF 8:30 F-35 DUAL-POLYCAPILLARY MICRO X-RAY FLUORESCENCE INSTRUMENT - Invited G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM N. Gao, X-ray Optical Systems, Inc., Albany, NY 9:00 D-117 XRD THIN FILM ANALYSIS USING POLYCAPILLARY COLLIMATING OPTICS - Invited Q. Xiao, B. York, H. Zadoori, IBM Storage Technology Division, San Jose, CA 9:30 F-51 NOVEL DOUBLY CURVED CRYSTALS WITH LARGE CAPTURE ANGLE Z. Chen, F. Wei, P. Schields, D. Gibson, X-ray Optical Systems, Inc., Albany, NY 9:50 D-114 LOW-POWER SYSTEM FOR AN IN-LINE PHASE MONITOR H. Huang, T. Bievenue, P. Schields, X-ray Optical Systems, Inc., Albany, NY T. Davis, Purdue University, West Lafayette, IN 10:10 Break 10:30 C-02 DESIGNING POLYCAPILLARY X-RAY OPTICS FOR DIFFRACTION AND FLUORESCENCE S.P. Formica, X-ray Optical Systems, Inc., Albany, NY and University at Albany, SUNY, Colonie, NY S.M. Lee, University at Albany, SUNY, Colonie, NY 10:50 D-095 DEVELOPMENTS IN HIGH-ENERGY X-RAY OPTICS AT ADVANCED PHOTON SOURCE BEAMLINE 1-ID S.D. Shastri, K. Fezzaa, D.R. Haeffner, B. Lai, W.-K. Lee, J.M. Maser, Argonne National Laboratory, Argonne, IL 11:10 F-15 DEVELOPMENT OF WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER USING MULTICAPILLARY X-RAY LENS FOR X-RAY DETECTION Y. Mokuno, Y. Horino, National Institute of Advanced Industrial Science & Technology, Osaka, Japan T. Narusawa, Kochi University of Technology, Kochi, Japan S. Kuwabara, Shimadzu Corporation, Kanagawa, Japan S. Shibata, H. Soejima, Shimadzu Scientific Research, Kyoto, Japan 11:30 D-069 HIGH-RESOLUTION LOW BACKGROUND BEAM FORMATION SYSTEM AND ITS APPLICATION IN SMALL ANGLE X-RAY SCATTERING L. Jiang, B. Verman, B. Kim, Y. Platonov, Osmic, Inc., Auburn Hills, MI 11:50 C-01 WAVEGUIDE-RESONANCE MECHANISM FOR AN X-RAY BEAM PROPAGATION, PHYSICS AND PRACTICAL SIGNIFICANCE V.K. Egorov, E.V. Egorov, IPMT Russian Academy of Science, Chernogolovka, Russia Session, Friday a.m. (Fremont) Session D-7 Stress Analysis Organized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY XRD 8:30 D-098 RESIDUAL STRESS MEASUREMENTS USING PARALLEL BEAM OPTICS - Invited T.R. Watkins, O.B. Cavin, J. Bai, Oak Ridge National Laboratory, Oak Ridge, TN J.A. Chediak, University of California - Berkeley, Berkeley, CA 9:00 D-073 STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION F.A. Selim, D.P. Wells, J.F. Harmon, J. Kwofie, R. Spaulding, Idaho State University, Pocatello, ID G. Erikson, Boise State University, Boise, ID T. Roney, Idaho National Engineering & Environmental Laboratory, Idaho Falls, ID 9:20 D-043 THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF X-RAYS AND ITS EFFECT ON BRAGG PEAK POSITIONS M.H. Ott, D. Löhe, University of Karlsruhe (TH), Karlsruhe, Germany 9:40 D-082 OBSERVATION OF HIGH-RESOLUTION DIFFRACTION PROFILES FROM SINGLE GRAINS WITHIN POLYCRYSTALLINE METALS U. Lienert, J. Almer, Argonne National Laboratory, Argonne, IL L. Margulies, S. Nielsen, W. Pantleon, H.F. Poulsen, S. Schmidt, Risoe National Laboratory, Roskilde, Denmark 10:00 Break 10:20 D-109 X-RAY STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES J.C. Hanan, E. Üstündag, G.A. Swift, California Institute of Technology, Pasadena, CA J.D. Almer, U. Lienert, D.R. Haeffner, Argonne National Laboratory, Argonne, IL 10:40 D-074 THE USE OF X-RAY DIFFRACTION MEASUREMENTS TO DETERMINE THE EFFECT OF AGING ON RESIDUAL STRESSES IN UNIDIRECTIONAL AND WOVEN GRAPHITE/POLYIMIDE COMPOSITES B. Benedikt, M. Gentz, L. Kumosa, P.K. Predecki, M. Kumosa, The University of Denver, Denver, CO 11:00 D-041 DETERMINATION OF THERMAL RESIDUAL STRESSES IN A FUNCTIONALLY GRADED WC-Co COMPOSITE C. Larsson, M. Odén, Linköping University, Linköping, Sweden 11:20 D-014 STRESS ERRORS ASSOCIATED WITH MINIATURIZATION OF PUSAI ASSEMBLY X-RAY STRESS ANALYZER T. Goto, Fukui University of Technology, Nara, Japan 11:40 D-008 COMPACT X-RAY DIFFRACTION TECHNIQUE A. Mozelev, Small Scale Research & Production Company RADICAL, Friedrichsdorf, Germany Session, Friday a.m. (Summit I) SESSION F-3 PROBLEM SOLVING / INDUSTRIAL APPLICATIONS OF XRF Organized by: D. Broton, Construction Technology Labs, Skokie, IL XRF 8:30 F-07 THE USE OF XRF IN SOLVING PROBLEMS RELATED TO THE PRODUCTION OF ACTIVE PHARMACEUTICAL INGREDIENTS (API) -Invited F.J. Antosz, J.W. Manski, Pharmacia Corp., Kalamazoo, MI 9:00 F-20 CEMENT CONTENT OF HARDENED PORTLAND CEMENT CONCRETE USING XRF, A NOVEL APPROACH — Invited D. Broton, Construction Technology Laboratories, Skokie, IL 9:30 F-28 SPECTRAL INTERFERENCES IN X-RAY FLUORESCENCE ANALYSIS F.R. Feret, H. Hamouche, Y. Boissonneault, Alcan International Ltd., Québec, Canada 9:50 F-34 SULFUR ANALYSIS USING ASTM D 2622 AT REFINERY LABORATORIES K.F. Dahnke, R.W. Morton, Phillips Petroleum Company, Bartlesville, OK 10:10 Break 10:30 F-42 EXPERIMENTAL DETERMINATION AND CHARACTERIZATION OF Fe L SPECTRA FROM DIFFERING VALENCE STATES G. Trudgett, B. Cheary, K. Turner, University of Technology, Sydney, Australia 10:50 F-49 FORENSIC ENVIRONMENTAL GEOCHEMISTRY, EVIDENCE OF SEDIMENTARY POLLUTION FROM MINE TAILINGS ACCIDENT USING BULK AND SINGLE PARTICLE XRS AND XANES S. Török, B. Alföldy, S. Kurunczi, J. Osán, KFKI Atomic Energy Research Institute, Budapest, Hungary 11:10 F-09 XRF ANALYSIS OF THE DISTRIBUTION OF HEAVY METAL IONS IN CANCEROUS TISSUES M. Haschke, Röntgenanalytik Meßtechnik GmbH, Taunusstein, Germany W. Ebert, Berlin, Germany