2002 Denver X-ray Conference > Sessions >  Wednesday 31 July 2002 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home Session, Wednesday p.m. (Carson) Session C-1 NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION (Commercial) Organized by: V.E. Buhrke, Consultant, Portola Valley, CA XRD & XRF 1:40 1:40 THE ATTEMPT OF ULTRA SENSITIVE X-RAY FLUORESCENCE SPECTROMETRY USING THE MULTI EXCITATION X-RAY TUBE K. Taniguchi, S. Maeo, C. Uno, H. Nagai, Osaka Electro-Communication University, Osaka, Japan 2:00 D-094 DEVELOPMENT OF A TUNABLE, MONO-ENERGETIC X-RAY SOURCE USING LASER - COMPTON SCATTERING (LCS) FROM A 20 MeV ELECTRON BEAM K. Choufanni, D. Wells, F. Harmon, Idaho State University, Pocatello, ID J.L. Jones, G. Lancaster, Idaho National Engineering & Environmental Laboratory, Idaho Falls, ID 2:20 F-27 APPLICATIONS OF MINIATURE X-RAY TUBES FOR PORTABLE X-RAY FLUORESCENCE ANALYSIS D. Clark Turner, A. Reyes-Mena, C. Jensen, MOXTEK, Inc., Orem, UT 2:40 D-025 VORTEX - A HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR X-RAY DIFFRACTION S. Barkan, J.S. Iwanczyk, B.E. Patt, L. Feng, C.R. Tull, G. Vilkelis, Photon Imaging, Inc., Northridge, CA 3:00 Break   3:20 D-088 A NOVEL DIGITAL X-RAY TOPOGRAPHY SYSTEM D.K. Bowen, M. Wormington, P. Feichtinger, C.H. Russell, S. Bates, Bede Scientific Incorporated, Englewood, CO 3:40 D-033 A HIGH-TEMPERATURE POWDER DIFFRACTION FURNACE M.D. Dolan, S.I. Zdzieszynski, S.T. Misture, New York State College of Ceramics atAlfred University, Alfred, NY 4:00 F-06 ANALYTICAL PERFORMANCE OF A NEW GENERATION OF HANDHELD EDXRF SPECTROMETERS V. Thomsen, D. Schatzlein, Niton Corporation, Billerica, MA 4:20 F-31 OPTIMIZATION STRATEGIES FOR BENCHTOP EDXRF SYSTEMS A.T. Ellis, Oxford Instruments Analytical Ltd., High Wycombe, UK 4:40 F-47 USE OF COMPACT, OPTIMIZED WD-XRF INSTRUMENT IN SPECIFIC APPLICATION AREAS D. Bonvin, R. Yellepeddi, K. Juchli, Thermo ARL, Ecublens, Switzerland 5:00 F-50 S2 RANGER: THE TOTAL SOLUTION FOR EDXRF ANALYSIS J. Anzelmo, B. Burton, A. Seyfarth, L. Arias, Bruker AXS, Inc., Madison, WI Session, Wednesday p.m. (Summit II) SESSION C-2 SYNCHROTRON APPLICATIONS I Organized by: C. Lavoie, IBM, Yorktown Heights, NY Co-chair: K. Ludwig, Boston University, Boston, MA XRD & XRF 2:00 C-06 REAL-TIME SYNCHROTRON STUDIES OF PHASE TRANSITIONS -  Invited K.F. Ludwig, A.S. Özcan, X. Wang, Boston University, Boston, MA X. Flament, R. Caudron, ONERA, Chatillon, France C. Lavoie, C. Cabral, Jr., J.M.E. Harper, IBM Research Division, Yorktown Heights, NY 2:30 D-090 COMBINED SMALL AND WIDE ANGLE SCATTERING MEASUREMENTS USING HIGH-ENERGY X-RAYS J.D. Almer, U. Lienert, D.R. Haeffner, P. Thiyagarajan, Argonne National Laboratory, Argonne, IL J. Ilavsky, Univeristy of Maryland at College Park, College Park, MD and National Institute of Standards & Technology, Gaithersburg, MD 2:50 D-042 THREE DIMENSIONALLY RESOLVED STUDIES OF PLASTIC DEFORMATION IN METALS L. Margulies, Risø National Laboratory, Roskilde, Denmark and ESRF, Grenoble Cedex, France H.F. Poulsen, G. Winter, S. Schmidt, Risø National Laboratory, Roskilde, Denmark 3:10 Break   3:30 C-07 THE THREE-DIMENSIONAL MAPPING OF FATIGUE CRACK POSITION VIA A NOVEL X-RAY PHASE CONTRAST APPROACH K. Ignatiev, Georgia Institute of Technology, Atlanta, GA W.-K. Lee, K. Fezzaa, Argonne National Laboratory, Argonne, IL G.R. Davis, J.C. Elliott, Queen Mary and Westfield College, London, UK S.R. Stock, Northwestern University, Chicago, IL 3:50 D-035 SYNCHROTRON IN HIGH-RESOLUTION PHASE DETERMINATION S.L. Morelhão, Universidade de São Paulo, São Paulo, Brazil S. Kycia, Laboratório Nacional de Luz Síncrotron/LNLS, Campinas, Brazil 4:10 D-022 INVESTIGATION OF LOCAL TEXTURES IN EXTRUDED MAGNESIUM BY SYNCHROTRON RADIATION H.-G. Brokmeier, A. Günther, S. Yi, W. Ye, Technical University Clausthal & GKSS-Research Center, Geesthacht, Germany T. Lippmann, U. Garbe, HASYLAB at DESY, Hamburg, Germany 4:30 D-071 METHODOLOGY OF SYNCHROTRON EDXRD STRAIN PROFILING I. Zakharchenko, Y. Gulak, M. Croft, T. Tsakalakos, Rutgers University, Piscataway, NJ Z. Zhong, NSLS, Brookhaven National Laboratory, Upton, NY Session, Wednesday p.m. (Fremont) SESSION D-1 RIETVELD APPLICATIONS I Organized by: J.A. Kaduk, BP Amoco, Naperville, IL XRD 1:30 D-016 STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA: RELATIONS BETWEEN STRUCTURES AND PHYSICAL PROPERTIES - Invited Q. Huang, National Institute of Standards & Technolgoy, Gaithersburg, MD and University of Maryland, College Park, MD 2:00 D-067 X-RAY AND NEUTRON RIETVELD REFINEMENTS OF BaR2CuO5 AND Ba5R8Zn4O21 (R=LANTHANIDES) W. Wong-Ng, B. Toby, J. Dillingham, W. Greenwood, National Institute of Standards & Technology, Gaithersburg, MD J. Kaduk, BP-Amoco Research Center, Naperville, IL 2:20 D-028 RIETVELD REFINEMENTS OF U-NB ALLOYS E.J. Peterson, W.L. Hults, D.F. Teter, D.W. Brown, J.C. Cooley, A.M. Kelly, L.B. Daulesberg, D.J. Thoma, Los Alamos National Laboratory, Los Alamos, NM 2:40 D-066 CRYSTAL STRUCTURE DETERMINATION FROM X-RAY POWDER DIFFRACTION DATA P.Y. Zavalij, State University of New York at Binghamton, Binghamton, NY 3:00 D-080 IN SITU HIGH-TEMPERATURE PHASE TRANSFORMATION IN DyNbO4 USING THE THERMAL-IMAGE TECHNIQUE L. Siah, W.M. Kriven, University of Illinois at Urbana-Champaign, Urbana, IL 3:20 Break   3:40 D-018 STRAIN, CRYSTALLITE SIZE AND PHASE COMPOSITION IN NANOCRYSTALLINE SOLIDS - Invited X. Bokhimi, The National University of Mexico (UNAM), México D.F., Mexico 4:10 D-023 ANISOTROPIC STRAIN-LIKE LINE BROADENING DUE TO INHOMOGENEITIES A. Leineweber, E.J. Mittemeijer, Max Planck Institute for Metals Research, Stuttgart, Germany 4:30 D-061 RIETVELD QUANTITATIVE X-RAY DIFFRACTION ON COMPLEX MIXTURES - WHAT CAN WE DO? - Invited R.S. Winburn, Minot State University, Minot, ND 5:00 D-020 QUANTITATIVE PHASE ANALYSIS OF HVOF WC COATINGS USING RIETVELD MODELLING OF X-RAY DIFFRACTION PATTERNS J. Savarimuthu, D.E. Simon, University of Tulsa, Tusa, OK Session, Wednesday p.m. (Summit I) SESSION D-2 THIN FILMS Organized by: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA XRD 1:50 D-092 IN-PLANE XRD STUDY OF EPITAXIALLY-GROWN ORGANIC THIN FILMS FOR ELECTROLUMINESCENT DEVICE APPLICATIONS - Invited K. Inaba, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan M. O’fuji, H. Hoshi, Y. Takanishi, K. Ishikawa, H. Takezoe, Tokyo Institute of Technology, Tokyo, Japan 2:20 D-064 THERMAL STABILITY OF STRAINED Si ON RELAXED SiGe: HIGH-RESOLUTION XRD STUDIES P.M. Mooney, J.L. Jordan-Sweet, S.J. Koester, J.A. Ott, J.O. Chu, K.K. Chan, IBM Research Division, T.J. Watson Research Center, Yorktown Heights, NY 2:40 D-072 TIME-RESOLVED X-RAY DIFFRACTION OF THE KINETICS OF TEXTURE FORMATION IN THE C49-C54 TiSi2 PHASE TRANSFORMATION A.S. Özcan, K.F. Ludwig, Jr., Boston University, Boston, MA C. Lavoie, C. Cabral, Jr., J.M.E. Harper, IBM, T.J. Watson Research Center, Yorktown Heights, NY 3:00 D-102 ANALYSIS OF THE SURFACE MORPHOLOGY OF CVD-GROWN DIAMOND FILMS WITH X-RAY DIFFRACTION M.J. Fransen, J. te Nijenhuis, J.H.A. Vasterink, Philips Analytical, Almelo, The Netherlands 3:20 Break   3:40 D-024 DETECTION OF VERY SMALL PREFERRED ORIENTATION IN THIN FILM LAYERS BY ROCKING-CURVE MEASUREMENT H. Toraya, H. Hibino, T. Ida, Nagoya Institute of Technology, Tajimi, Japan 4:00 D-040 A NEW SMALL ANGLE X-RAY SCATTERING TECHNIQUE FOR DETERMINING NANO-SCALE PORE/PARTICLE SIZE DISTRIBUTIONS IN THIN FILMS Y. Ito, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan 4:20 D-013 VACANCY-INDUCED CHANGES IN SURFACE MORPHOLOGY DURING Ag HOMOEPITAXY C.E. Botez, W.C. Elliott, P.F. Miceli, University of Missouri-Columbia, Columbia, MO P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY 4:40 D-068 HIGH-TEMPERATURE X-RAY STUDY OF PHASE EVOLUTION OF Ba2YCu3O6+x FILMS USING THE BaF2 PROCESS W. Wong-Ng, M. Vaudin, I. Levin, L.P. Cook, J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD R. Feenstra, Oak Ridge National Laboratory, Oak Ridge, TN