The 2002 Denver X-ray Conference
Antlers Adam's Mark Hotel

(formerly Antlers Doubletree Hotel)
Colorado Springs, Colorado, U.S.A.
29th July - 2nd August 2002

Denver X-ray Conference - sponsored by the International Centre for Diffraction Data
Sessions

APPLICATIONS OF X-RAY ANALYSIS TO FORENSIC MATERIALS
8:30 a.m -12:30 p.m.

 

Plenary Session, Wednesday, 31 July

(Summit III)

Organized by:

D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK
R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA

8:30 Welcoming Remarks
T. Fawcett, Executive Director, International Centre for Diffraction Data, Newtown Square, PA
V. Buhrke, Chairman, Denver X-ray Conference, Consultant, Portola Valley, CA
Presentation of Awards
  • 2002 Birks Award to Michael Mantler, Vienna University of Technology, Vienna, Austria
    presented by: Y. Gohshi, National Institute for Environmental Studies, Tsukuba, Japan
  • Announcement of the 2002 Jerome B. Cohen Student Award
    presented by: I. Cev Noyan, IBM, Yorktown Heights, NY
  • Announcement of the 2002 McMurdie Award
    presented by: R.L. Snyder, The Ohio State University, Columbus, OH

Plenary Session Remarks
D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK
R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA

The following are the invited papers to be presented during the plenary session:
9:00 P-5 X-RAY ANALYSIS IN THE U.S. CUSTOMS LABORATORIES
M.H. Liberman, US Customs Laboratory, San Francisco, CA
9:30 P-6 UNDERKARAT JEWELRY: THE PERFECT CRIME? INVESTIGATIONS AND
ANALYSIS OF JEWELRY USING XRF
D. Kloos, Industry Consultant, Westminster, CA
10:00 P-1 X-RAY DIFFRACTION ANALYSIS IN THE FORENSIC SCIENCE LABORATORY OF
STUTTGART, GERMANY¡ªTHE LAST RESORT IN MANY CRIMINAL CASES
W. Kugler, Forensic Science Laboratory, Landeskriminalamt Baden-Wuerttemberg,
Stuttgart, Germany
10:30  Break
11:00 P-2 PORTABLE XRF FOR FORENSIC INVESTIGATIONS
D.C. Ward, Federal Bureau of Investigation, Microanalysis Laboratory, Washington, DC
11:30 P-3 USE OF X-RAYS IN THE UNITED KINGDOM FORENSIC SCIENCE SERVICE
D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK
12:00 P-4 XRD AT THE FBI: THE THREE C¡¯S OF FORENSIC SCIENCE
M.C. Bottrell, Federal Bureau of Investigation, Geologist/Forensic Examiner,
Washington, DC


 

Session, Wednesday p.m. (Carson)
Session C-1 NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION (Commercial)
Organized by: V.E. Buhrke, Consultant, Portola Valley, CA
XRD & XRF

1:40 1:40 THE ATTEMPT OF ULTRA SENSITIVE X-RAY FLUORESCENCE SPECTROMETRY USING THE MULTI EXCITATION X-RAY TUBE
K. Taniguchi, S. Maeo, C. Uno, H. Nagai, Osaka Electro-Communication
University, Osaka, Japan
2:00 D-094 DEVELOPMENT OF A TUNABLE, MONO-ENERGETIC X-RAY SOURCE USING LASER - COMPTON SCATTERING (LCS) FROM A 20 MeV ELECTRON BEAM
K. Choufanni, D. Wells, F. Harmon, Idaho State University, Pocatello, ID
J.L. Jones, G. Lancaster, Idaho National Engineering & Environmental Laboratory, Idaho Falls, ID
2:20 F-27 APPLICATIONS OF MINIATURE X-RAY TUBES FOR PORTABLE X-RAY
FLUORESCENCE ANALYSIS
D. Clark Turner, A. Reyes-Mena, C. Jensen, MOXTEK, Inc., Orem, UT
2:40 D-025 VORTEX - A HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR X-RAY DIFFRACTION
S. Barkan, J.S. Iwanczyk, B.E. Patt, L. Feng, C.R. Tull, G. Vilkelis, Photon Imaging, Inc., Northridge, CA
3:00 Break  
3:20 D-088 A NOVEL DIGITAL X-RAY TOPOGRAPHY SYSTEM
D.K. Bowen, M. Wormington, P. Feichtinger, C.H. Russell, S. Bates, Bede Scientific Incorporated, Englewood, CO
3:40 D-033 A HIGH-TEMPERATURE POWDER DIFFRACTION FURNACE
M.D. Dolan, S.I. Zdzieszynski, S.T. Misture, New York State College of Ceramics atAlfred University, Alfred, NY
4:00 F-06 ANALYTICAL PERFORMANCE OF A NEW GENERATION OF HANDHELD
EDXRF SPECTROMETERS
V. Thomsen, D. Schatzlein, Niton Corporation, Billerica, MA
4:20 F-31 OPTIMIZATION STRATEGIES FOR BENCHTOP EDXRF SYSTEMS
A.T. Ellis, Oxford Instruments Analytical Ltd., High Wycombe, UK
4:40 F-47 USE OF COMPACT, OPTIMIZED WD-XRF INSTRUMENT IN SPECIFIC
APPLICATION AREAS
D. Bonvin, R. Yellepeddi, K. Juchli, Thermo ARL, Ecublens, Switzerland
5:00 F-50 S2 RANGER: THE TOTAL SOLUTION FOR EDXRF ANALYSIS
J. Anzelmo, B. Burton, A. Seyfarth, L. Arias, Bruker AXS, Inc., Madison, WI

Session, Wednesday p.m. (Summit II)
SESSION C-2 SYNCHROTRON APPLICATIONS I
Organized by: C. Lavoie, IBM, Yorktown Heights, NY
Co-chair: K. Ludwig, Boston University, Boston, MA
XRD & XRF

2:00 C-06 REAL-TIME SYNCHROTRON STUDIES OF PHASE TRANSITIONS -  Invited
K.F. Ludwig, A.S. Özcan, X. Wang, Boston University, Boston, MA
X. Flament, R. Caudron, ONERA, Chatillon, France
C. Lavoie, C. Cabral, Jr., J.M.E. Harper, IBM Research Division, Yorktown Heights, NY
2:30 D-090 COMBINED SMALL AND WIDE ANGLE SCATTERING MEASUREMENTS
USING HIGH-ENERGY X-RAYS
J.D. Almer, U. Lienert, D.R. Haeffner, P. Thiyagarajan, Argonne National
Laboratory, Argonne, IL
J. Ilavsky, Univeristy of Maryland at College Park, College Park, MD and National Institute of Standards & Technology, Gaithersburg, MD
2:50 D-042 THREE DIMENSIONALLY RESOLVED STUDIES OF PLASTIC DEFORMATION IN METALS
L. Margulies, Risø National Laboratory, Roskilde, Denmark and ESRF, Grenoble Cedex, France
H.F. Poulsen, G. Winter, S. Schmidt, Risø National Laboratory, Roskilde, Denmark
3:10 Break  
3:30 C-07 THE THREE-DIMENSIONAL MAPPING OF FATIGUE CRACK POSITION VIA
A NOVEL X-RAY PHASE CONTRAST APPROACH
K. Ignatiev, Georgia Institute of Technology, Atlanta, GA
W.-K. Lee, K. Fezzaa, Argonne National Laboratory, Argonne, IL
G.R. Davis, J.C. Elliott, Queen Mary and Westfield College, London, UK
S.R. Stock, Northwestern University, Chicago, IL
3:50 D-035 SYNCHROTRON IN HIGH-RESOLUTION PHASE DETERMINATION
S.L. Morelhão, Universidade de São Paulo, São Paulo, Brazil
S. Kycia, Laboratório Nacional de Luz Síncrotron/LNLS, Campinas, Brazil
4:10 D-022 INVESTIGATION OF LOCAL TEXTURES IN EXTRUDED MAGNESIUM BY
SYNCHROTRON RADIATION
H.-G. Brokmeier, A. Günther, S. Yi, W. Ye, Technical University Clausthal &
GKSS-Research Center, Geesthacht, Germany
T. Lippmann, U. Garbe, HASYLAB at DESY, Hamburg, Germany
4:30 D-071 METHODOLOGY OF SYNCHROTRON EDXRD STRAIN PROFILING
I. Zakharchenko, Y. Gulak, M. Croft, T. Tsakalakos, Rutgers University, Piscataway, NJ
Z. Zhong, NSLS, Brookhaven National Laboratory, Upton, NY

Session, Wednesday p.m. (Fremont)
SESSION D-1 RIETVELD APPLICATIONS I
Organized by: J.A. Kaduk, BP Amoco, Naperville, IL
XRD

1:30 D-016 STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA:
RELATIONS BETWEEN STRUCTURES AND PHYSICAL PROPERTIES - Invited
Q. Huang, National Institute of Standards & Technolgoy, Gaithersburg, MD and University of Maryland, College Park, MD
2:00 D-067 X-RAY AND NEUTRON RIETVELD REFINEMENTS OF BaR2CuO5 AND
Ba5R8Zn4O21 (R=LANTHANIDES)
W. Wong-Ng, B. Toby, J. Dillingham, W. Greenwood, National Institute of
Standards & Technology, Gaithersburg, MD
J. Kaduk, BP-Amoco Research Center, Naperville, IL
2:20 D-028 RIETVELD REFINEMENTS OF U-NB ALLOYS
E.J. Peterson, W.L. Hults, D.F. Teter, D.W. Brown, J.C. Cooley, A.M. Kelly, L.B. Daulesberg, D.J. Thoma, Los Alamos National Laboratory, Los Alamos, NM
2:40 D-066 CRYSTAL STRUCTURE DETERMINATION FROM X-RAY POWDER
DIFFRACTION DATA
P.Y. Zavalij, State University of New York at Binghamton, Binghamton, NY
3:00 D-080 IN SITU HIGH-TEMPERATURE PHASE TRANSFORMATION IN DyNbO4 USING THE THERMAL-IMAGE TECHNIQUE
L. Siah, W.M. Kriven, University of Illinois at Urbana-Champaign, Urbana, IL
3:20 Break  
3:40 D-018 STRAIN, CRYSTALLITE SIZE AND PHASE COMPOSITION IN
NANOCRYSTALLINE SOLIDS - Invited
X. Bokhimi, The National University of Mexico (UNAM), México D.F., Mexico
4:10 D-023 ANISOTROPIC STRAIN-LIKE LINE BROADENING DUE TO
INHOMOGENEITIES
A. Leineweber, E.J. Mittemeijer, Max Planck Institute for Metals Research,
Stuttgart, Germany
4:30 D-061 RIETVELD QUANTITATIVE X-RAY DIFFRACTION ON COMPLEX
MIXTURES - WHAT CAN WE DO? - Invited
R.S. Winburn, Minot State University, Minot, ND
5:00 D-020 QUANTITATIVE PHASE ANALYSIS OF HVOF WC COATINGS USING
RIETVELD MODELLING OF X-RAY DIFFRACTION PATTERNS
J. Savarimuthu, D.E. Simon, University of Tulsa, Tusa, OK

Session, Wednesday p.m. (Summit I)
SESSION D-2 THIN FILMS
Organized by: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
XRD

1:50 D-092 IN-PLANE XRD STUDY OF EPITAXIALLY-GROWN ORGANIC THIN FILMS FOR ELECTROLUMINESCENT DEVICE APPLICATIONS - Invited
K. Inaba, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan
M. O’fuji, H. Hoshi, Y. Takanishi, K. Ishikawa, H. Takezoe, Tokyo Institute of
Technology, Tokyo, Japan
2:20 D-064 THERMAL STABILITY OF STRAINED Si ON RELAXED SiGe:
HIGH-RESOLUTION XRD STUDIES
P.M. Mooney, J.L. Jordan-Sweet, S.J. Koester, J.A. Ott, J.O. Chu, K.K. Chan, IBM Research Division, T.J. Watson Research Center, Yorktown Heights, NY
2:40 D-072 TIME-RESOLVED X-RAY DIFFRACTION OF THE KINETICS OF TEXTURE
FORMATION IN THE C49-C54 TiSi2 PHASE TRANSFORMATION
A.S. Özcan, K.F. Ludwig, Jr., Boston University, Boston, MA
C. Lavoie, C. Cabral, Jr., J.M.E. Harper, IBM, T.J. Watson Research Center,
Yorktown Heights, NY
3:00 D-102 ANALYSIS OF THE SURFACE MORPHOLOGY OF CVD-GROWN DIAMOND
FILMS WITH X-RAY DIFFRACTION
M.J. Fransen, J. te Nijenhuis, J.H.A. Vasterink, Philips Analytical, Almelo, The Netherlands
3:20 Break  
3:40 D-024 DETECTION OF VERY SMALL PREFERRED ORIENTATION IN THIN FILM
LAYERS BY ROCKING-CURVE MEASUREMENT
H. Toraya, H. Hibino, T. Ida, Nagoya Institute of Technology, Tajimi, Japan
4:00 D-040 A NEW SMALL ANGLE X-RAY SCATTERING TECHNIQUE FOR DETERMINING NANO-SCALE PORE/PARTICLE SIZE DISTRIBUTIONS IN THIN FILMS
Y. Ito, K. Omote, J. Harada, Rigaku Corporation, Tokyo, Japan
4:20 D-013 VACANCY-INDUCED CHANGES IN SURFACE MORPHOLOGY DURING Ag
HOMOEPITAXY
C.E. Botez, W.C. Elliott, P.F. Miceli, University of Missouri-Columbia, Columbia, MO
P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY
4:40 D-068 HIGH-TEMPERATURE X-RAY STUDY OF PHASE EVOLUTION OF Ba2YCu3O6+x FILMS USING THE BaF2 PROCESS
W. Wong-Ng, M. Vaudin, I. Levin, L.P. Cook, J.P. Cline, National Institute of
Standards & Technology, Gaithersburg, MD
R. Feenstra, Oak Ridge National Laboratory, Oak Ridge, TN

Session, Thursday a.m. (Summit II)
SESSION C-3 SYNCHROTRON APPLICATIONS II
Organized by: C. Lavoie, IBM, Yorktown Heights, NY
Co-chair: K. Ludwig, Boston University, Boston, MA
XRD & XRF

9:00 C-08 IN SITU SYNCHROTRON STUDIES OF CHEMICAL VAPOR DEPOSITION -
Invited
G.B. Stephenson, D.D. Fong, S.K. Streiffer, J.A. Eastman, O. Auciello, P.F. Fuoss, G.-R. Bai, L. Thompson, Argonne National Laboratory, Argonne, IL
M.E.M. Aanerud, C. Thompson, Northern Illinois University, Dekalb, IL
9:30 F-10 TRACE-LEVEL SPECIATION AND MICROANALYSIS BY MEANS OF
MONOCHROMATIC AND “PINK” BENDING MAGNET RADIATION
FOCUSSED WITH POLYCAPILLARY OPTICS
K. Proost, K. Janssens, L. Vincze, University of Antwerp, Antwerp, Belgium
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany
9:50 F-12 X-RAY ABSORPTION FINE STRUCTURE (XAFS) IMAGING WITH A
NONSCANNING X-RAY FLUORESCENCE MICROSCOPE
K. Sakurai, M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan
10:10 Break
10:30 F-13 SYNCHROTRON X-RAY FLUORESCENCE WITH A COMPACT JOHANSSON SPECTROMETER (R=100mm)
K. Sakurai, S. Kuwajima, M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan
10:50 D-076 HIGH-RESOLUTION SYNCHROTRON ABSORPTION MICROTOMOGRAPHY AND MICROBEAM DIFFRACTION STUDY OF THE MINERAL PHASE MICROSTRUCTURE IN SEA URCHIN TEETH
S.R. Stock, Northwestern University, Chicago, IL
K. Ignatiev, Georgia Institute of Technology, Atlanta, GA
T. Dahl, J. Barss, A. Veis, Northwestern University Medical School, Chicago, IL
J. Almer, F. DeCarlo, Argonne National Laboratory, Argonne, IL
11:10 F-46 ALTERED PB/CA CONCENTRATIONS IN DIFFERENT BONE AREAS
INVESTIGATED BY SR-XRF
P. Wobrauschek, N. Zöger, G. Pepponi, C. Streli, S. Zamini, Atominstitut der Österreichischen Universitäten, Wien, Austria
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany
W. Osterode, Universitätsklinik für Innere Medizin IV, Wien, Austria

Session, Thursday a.m. (Fremont)
Session D-3 Rietveld Applications II
Organized by: J.A. Kaduk, BP Amoco, Naperville, IL
XRD

9:00 CRYSTAL STRUCTURES OF ORGANIC/PHARMACEUTICAL COMPOUNDS - Invited
P.W. Stephens, SUNY Stony Brook, Stony Brook, NY
9:30 D-078 MONOPOTASSIUM DIHYDROGEN CITRATES
J.A. Kaduk, BP Chemicals, Naperville, IL
9:50 D-038 INDEXING OF POWDER DIFFRACTION PATTERNS BY ITERATIVE USE OF
SINGULAR VALUE DECOMPOSITION
A.A. Coelho, A. Kern, Bruker AXS GmbH, Karlsruhe, Germany
10:10 Break
10:30 D-026 X-CELL - A NOVEL INDEXING ALGORITHM FOR ROUTINE AND PROBLEM
CASES
M.A. Neumann, Accelrys Ltd., Cambridge, UK
10:50 D-083 RIETVELD REFINEMENT OF 2-THETA SPLIT RANGES—A METHOD FOR
REDUCING ANALYSIS TIME
K. Laursen, T. White, Nanyang Technological University, Singapore
11:10 D-037 CONVOLUTION BASED PROFILE FITTING
A. Kern, A.A. Coelho, Bruker AXS GmbH, Karlsruhe, Germany
R.W. Cheary, University of Technology Sydney, Sydney, Australia
11:30 D-100 BAYESIAN/MAXIMUM ENTROPY ANALYSIS OF BIMODAL SIZE-DISTRIBUTIONS FROM NANOPARTICLE-BROADENED LINE PROFILES
N. Armstrong, W. Kalceff, University of Technology, Sydney, Australia
J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD
11:50 D-001 STRUCTURE DETERMINATION OF NANOCRYSTALLINE MATERIALS BY THE ATOMIC PAIR DISTRIBUTION FUNCTION TECHNIQUE
V. Petkov, Michigan State University, East Lansing, MI

Session, Thursday a.m. (Summit III)
SESSION D-4 INDUSTRIAL APPLICATIONS OF XRD I
Organized by: R.L. Snyder, The Ohio State University, Columbus, OH
C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN
XRD

8:30 D-070 APPLICATION OF SYNCHROTRON EDXRD STRAIN PROFILING IN SHOT
PEENED MATERIALS
M. Croft, I. Zakharchenko, Y. Gulak, T. Tsakalakos, Rutgers University, Piscataway, NJ
Z. Zhong, NSLS, Brookhaven National Laboratory, Upton, NY
8:50 D-112 ZINC/IRON PHASE TRANSFORMATION STUDIES ON GALVANNEALED
STEEL SHEET COATINGS BY X-RAY DIFFRACTION
S. Wienströer, M. Genenger, C. Nazikkol, H. Mittelstädt, ThyssenKrupp Stahl AG, Duisburg, Germany
M.J. Fransen, Philips Analytical, Almelo, The Netherlands
9:10 D-101 REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM
J.L. Reeves, V. Selvamanickam, IGC SuperPower, Schenectady, NY
R.L. Snyder, The Ohio State University, Columbus, OH
9:30 D-055 USING LATTICE PARAMETERS AND LINE BROADENING TO MONITOR
NEAR-SURFACE STRAIN IN DESIGNING SINTERED CERAMIC MATERIALS - A FORMIDABLE CHALLENGE
S. Pratapa, B. O’Connor, Curtin University of Technology, Perth, Australia
9:50 D-032 CRYSTAL STRUCTURE DETERMINATIONS OF THE THREE-LAYER
AURIVILLIUS CERAMICS USING A NEW HIGH-RESOLUTION X-RAY
POWDER DIFFRACTOMETER
M. Haluska, S. Speakman, S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY
10:10 Break
10:30 D-115 APPLICATIONS OF X-RAY DIFFRACTION IN THE DIESEL ENGINE INDUSTRY -  Invited
R. England, Cummins, Inc., Columbus, IN
T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
11:00 D-119 A TEXTURE MEASUREMENT INSTRUMENT FOR INDUSTRIAL PROCESS
CONTROL  -  Invited
H. Weiland, Alcoa Technical Center, Alcoa Center, PA
11:30 D-104 ANNEALING STUDIES OF PURE AND ALLOYED TANTALUM EMPLOYING
ROCKING CURVES AND /2 PATTERNS
R.J. De Angelis, University of Florida, Shalimar, FL
D.W. Richards, M.P. Kramer, J.W. House, Air Force Research Laboratory, Eglin AFB, Florida

Session, Thursday a.m. (Summit I)
Session F-1 Quantitative XRF
Organized by: J. Gilfrich, Emeritus, SFA, Inc./NRL, Washington, DC
Co-chair: B. Vrebos, Philips Analytical, Almelo, The Netherlands
XRF

9:00 F-22 ACCURACY OF THEORETICAL INFLUENCE COEFFICIENT METHODS - Invited
M. Mantler, Vienna University of Technology, Vienna, Austria
9:30 F-36 QUANTITATIVE APPROACHES IN MICRO X-RAY FLUORESCENCE  - Invited
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
10:00 F-08 ACCURACY OF FUNDAMENTAL PARAMETERS CALCULATIONS USING A
NEW ATOMIC DATABASE
W.T. Elam, R.B. Shen, B. Scruggs, J. Nicolosi, EDAX, Inc., Mahwah, NJ
10:20 Break
10:40  F-23 NUMERICAL DESCRIPTION OF PHOTOELECTRIC ABSORPTION
COEFFICIENTS FOR FUNDAMENTAL PARAMETER PROGRAMS
H. Ebel, R. Svagera, Vienna University of Technology, Vienna, Austria
A. Shaltout, National Research Center, Cairo, Egypt
11:00 F-01 ACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY
FLUORESCENCE: GALLIUM IN PLUTONIUM METAL
C.G. Worley, Los Alamos National Laboratory, Los Alamos, NM
11:20 F-21 APPLYING THE CONCEPT OF TRUENESS TO ALLOY ANALYSIS USING
WDXRF AND BORATE FUSION
J.R. Sieber, National Institute of Standards & Technology, Gaithersburg, MD
11:40 F-33  APPLICATION OF THE BACKSCATTER FUNDAMENTAL PARAMETER
METHOD WITH SIMULTANEOUS EXCITATION BY 55Fe AND 109Cd
RADIOISOTOPE SOURCES
D. Wegrzynek, A. Markowicz, E. Chinea-Cano, International Atomic Energy
Agency, Vienna, Austria
P. Potts, The Open University, Milton Keynes, UK
12:00 F-43 THE USE OF VARIOUS PEAK DECONVOLUTION MODELS FOR ED-XRF
ANALYSIS OF LAYERED MATERIALS
A. Wittkopp, B. Cross, F. Ferrandino, NeXray Corporation, Ronkonkoma, NY

Session, Thursday p.m. (Summit II)
Session C-4 Microbeam Analysis (Combinatorial & Robotic Applications)
Organized by: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
XRD & XRF 

1:30  C-05  SCANNING X-RAY MICROTOPOGRAPHY STUDY OF ELECTROMIGRATION IN INTEGRATED CIRCUITS - Invited
P.-C. Wang, IBM Corporation, Hopewell Junction, NY
2:00 F-26 1, 2 AND 3D MICRO-ANALYSIS USING SR-BASED SPECTROSCOPY AND
IMAGING - Invited
A. Simionovici, ESRF, Grenoble, France
2:30 F-53 QUANTITATIVE ASPECTS OF MICROBEAM X-RAY ANALYSIS - Invited
L. Vincze, University of Antwerp, Antwerp, Belgium
3:00 F-05 PUSHING THE DETECTION LIMITS OF MICRO X-RAY FLUORESCENCE
T.C. Miller, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
3:20 Break
3:40 F-41  MICROANALYSIS WITH A POLYCAPILLARY IN A VACUUM CHAMBER
P. Wobrauschek, N. Marosi, C. Streli, Atominstitut der Österreichischen
Universitäten, Wien, Austria
4:00 F-37 ELEMENTAL IMAGING USING MICRO X-RAY FLUORESCENCE IN ART AND ARCHEOLOGY
G.J. Havrilla, T. Miller, Los Alamos National Laboratory, Los Alamos, NM
K. Trentleman, Detroit Institute of Art, Detroit, MI
R. Morton, Philips Petroleum, Bartlesville, OK
4:20 D-099 DIAGNOSIS OF Ln-DOPED PZT FILMS VIA MICRODIFFRACTION:
CORRELATION OF PROPERTIES TO OBSERVED FWHM
M.A. Rodriguez, G. Brennecka, B.A. Tuttle, Sandia National Laboratories,
Albuquerque, NM
4:40 D-111 MEASUREMENT OF STRAIN FIELDS OF INDIVIDUAL DOMAINS IN BaTiO3
USING X-RAY MICRODIFFRACTION
R.C. Rogan, E. Üstündag, G.A. Swift, California Institute of Technology, Pasadena, CA
N. Tamura, Lawrence Berkeley National Laboratory, Berkeley, CA
5:00 D-105 STUDY OF FIBER-REINFORCED COMPOSITES USING X-RAY
MICROTOPOGRAPHY
J.C. Hanan, E. Üstündag, C.C. Aydiner, M.A. Brown, G.S. Welsh, G.A. Swift,
California Institute of Technology, Pasadena, CA
J.L. Jordan-Sweet, I.C. Noyan, IBM Research Division, Yorktown Heights, NY

Session, Thursday p.m. (Summit III)
Session D-5 INDUSTRIAL APPLICATIONS OF XRD II
Organized by: R.L. Snyder, The Ohio State University, Columbus, OH
C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN
XRD

1:30  D-097 METHODS FOR ANALYZING METAL TRITIDES IN THE X-RAY DIFFRACTION LABORATORY
R. Tissot, M. Eatough, Sandia National Laboratories, Albuquerque, NM
1:50 D-116 APPLICATIONS OF X-RAY DIFFRACTION IN THE IMAGING INDUSTRY —
Invited
T.N. Blanton, Eastman Kodak Company, Rochester, NY
2:20 D-103 APPLICATIONS OF X-RAY POWDER DIFFRACTION IN THE PHARMACEUTICAL INDUSTRY - Invited
G.A. Stephenson, Eli Lilly & Company, Indianapolis, IN
2:50 D-096 PULP AND PAPER PLANT MATERIALS ISSUES ADDRESSED BY XRD METHODS
C.R. Hubbard, R.A. Peascoe, J.R. Keiser, Oak Ridge National Laboratory, Oak Ridge, TN
3:10 Break
3:30 D-079 HIGH-PRECISION PARALLEL-BEAM X-RAY DIFFRACTION SYSTEM FOR
PHARMACEUTICALS ANALYSIS
T. Kubo, Rigaku Corporation, Osaka, Japan
3:50 D-086 A NEW MOVABLE DIFFRACTOMETER FOR INDUSTRIAL APPLICATIONS OF NDT-XRD FOR IN FIELD MEASUREMENTS
G. Berti, University of Pisa, Pisa, Italy
S. Aldrighetti, Officina Elettrotecnica di Tenno, Italy
4:10 D-011 COMPARISON BETWEEN CONVENTIONAL AND TWO-DIMENSIONAL XRD
B.B. He, U. Preckwinkel, K.L. Smith, Bruker AXS, Inc., Madison, WI
4:30 D-077 ADVENTURES IN CORROSION DEPOSITS - Invited
J.A. Kaduk, BP Chemicals, Naperville, IL
5:00 D-065 CHARACTERIZATION OF THE SOLIDS WASTE IN THE HANFORD WASTE
TANKS USING A COMBINATION OF XRD, SEM, AND PLM
R.W. Warrant, G.A. Cooke, Fluor Hanford, Richland, WA

Session, Thursday p.m. (Fremont)
SESSION D-6 NEUTRON DIFFRACTION
Organized by: E. Üstündag, California Institute of Technology, Pasadena, CA
M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos,
XRD

1:30  D-012  THE PRECISION OF DIFFRACTION PEAK LOCATION AND THE OPTIMISED DESIGN OF A STRESS DIFFRACTOMETER - Invited
M.R. Daymond, ISIS Facility, Rutherford Appleton Lab., Oxon, UK
2:00 D-036 DIFFRACTION MEASUREMENTS DURING MECHANICAL LOADING IN
SUPERELASTIC AND SHAPE-MEMORY ALLOYS - Invited
R. Vaidyanathan, University of Central Florida, Orlando, FL
2:30 D-085 DEVELOPMENT OF TEXTURE DURING DEFORMATION OF HEXAGONAL
CLOSE PACKED METALS
D.W. Brown, S.R. Agnew, W.R. Blumenthal, T.M. Holden, C. Tomé, Los Alamos National Laboratory, Los Alamos, NM
2:50 D-057 LATTICE DILATION IN A HYDROGEN CHARGED STEEL
G.L. Nash, Electro-Motive Division, LaGrange, IL
P. Nash, Illinois Institute of Technology, Chicago, IL
H. Choo, University of Tennessee, Knoxville, TN
L.L. Daemen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
3:10 Break
3:30 D-108 EFFECT OF BEAM DIVERGENCE ON STRAIN DATA FROM NEUTRON
DIFFRACTION
E. Üstündag, R.A. Karnesky, California Institute of Technology, Pasadena, CA
I.C. Noyan, IBM Research Division, Yorktown Heights, NY
M.A.M. Bourke, D.W. Brown, Los Alamos National Laboratory, Los Alamos, NM
3:50 D-110  DEFORMATION MECHANISMS OF DUCTILE-PHASE-REINFORCED BULK
METALLIC GLASS COMPOSITES
S.-Y. Lee, E. Üstündag, B. Clausen, H. Choi-Yim, California Institute of
Technology, Pasadena, CA
D.W. Brown, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
4:10 D-062 EFFECT OF REINFORCEMENT PARTICLE FRACTURE ON THE LOAD
PARTITIONING IN AN AL-SIC COMPOSITE
B.S. Majumdar, New Mexico Tech, Socorro, NM
H. Choo, University of Tennessee, Knoxville, TN
P. Rangaswamy, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
4:30 D-106  HIGH TEMPERATURE ELASTIC STRAIN EVOLUTION IN Si3N4- BASED
CERAMICS
G.A. Swift, E. Üstündag, B. Clausen, California Institute of Technology, Pasadena, CA
M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
H.-T. Lin, Oak Ridge National Laboratory, Oak Ridge, TN
C.-W. Li, Honeywell Corporation, Morristown, NJ
4:50  D-107  CONSTITUTIVE BEHAVIOR OF PZT-BASED FERROELECTRIC CERAMICS
R.C. Rogan, E. Üstündag, B. Clausen, California Institute of Technology, Pasadena, CA
M.R. Daymond, Rutherford Appleton Laboratory, Oxon, UK
C.M. Landis, Rice University, Houston, TX
V. Knoblauch, Robert Bosch GmbH, Stuttgart, Germany


Session, Thursday p.m. (Summit I)
SESSION F-2 POLARIZED X-RAY OPTICS
Organized by: B. Chappell, Macquarie University, Sydney, Australia
Co-chair: R.W. Ryon, Emeritus, Lawrence Livermore National Laboratories, Livermore, CA
XRF

2:00  POLARIZED BEAM XRF ANALYSIS OF GEOLOGIC MATERIALS - Invited
B. Chappell, Macquarie University, Sydney, Australia
2:30 F-29 POLARIZED BEAM XRF ANALYSIS - PAST AND FUTURE - Invited
J. Heckel, SPECTRO A.I., Kleve, Germany
3:00 Break
3:20 F-30 POLARIZATION FOR BACKGROUND REDUCTION IN EDXRF—THE
TECHNIQUE THAT WOULD NOT WORK - Invited
R.W. Ryon, Lawrence Livermore National Laboratory, Livermore, CA
3:50  F-48 THE USE OF POLARIZED LIGHT ED-XRF FOR LOW SULFUR CONTENT
DETERMINATION IN AUTOMOTIVE FUELS
M. Van Driessche, ChevronTexaco Technology Gent, Gent, Belgium

 

Session, Friday a.m. (Summit II)
Session C-5 X-RAY OPTICS
Organized by: N. Gao, X-ray Optical Systems, Inc., Albany, NY
Co-chair: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
XRD & XRF

8:30 F-35 DUAL-POLYCAPILLARY MICRO X-RAY FLUORESCENCE INSTRUMENT -
Invited
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
N. Gao, X-ray Optical Systems, Inc., Albany, NY
9:00 D-117 XRD THIN FILM ANALYSIS USING POLYCAPILLARY COLLIMATING OPTICS - Invited
Q. Xiao, B. York, H. Zadoori, IBM Storage Technology Division, San Jose, CA
9:30 F-51 NOVEL DOUBLY CURVED CRYSTALS WITH LARGE CAPTURE ANGLE
Z. Chen, F. Wei, P. Schields, D. Gibson, X-ray Optical Systems, Inc., Albany, NY
9:50 D-114 LOW-POWER SYSTEM FOR AN IN-LINE PHASE MONITOR
H. Huang, T. Bievenue, P. Schields, X-ray Optical Systems, Inc., Albany, NY
T. Davis, Purdue University, West Lafayette, IN
10:10 Break
10:30 C-02 DESIGNING POLYCAPILLARY X-RAY OPTICS FOR DIFFRACTION AND
FLUORESCENCE
S.P. Formica, X-ray Optical Systems, Inc., Albany, NY and University at Albany, SUNY, Colonie, NY
S.M. Lee, University at Albany, SUNY, Colonie, NY
10:50 D-095 DEVELOPMENTS IN HIGH-ENERGY X-RAY OPTICS AT ADVANCED PHOTON SOURCE BEAMLINE 1-ID
S.D. Shastri, K. Fezzaa, D.R. Haeffner, B. Lai, W.-K. Lee, J.M. Maser, Argonne National Laboratory, Argonne, IL
11:10 F-15 DEVELOPMENT OF WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER USING MULTICAPILLARY X-RAY LENS FOR X-RAY DETECTION
Y. Mokuno, Y. Horino, National Institute of Advanced Industrial Science &
Technology, Osaka, Japan
T. Narusawa, Kochi University of Technology, Kochi, Japan
S. Kuwabara, Shimadzu Corporation, Kanagawa, Japan
S. Shibata, H. Soejima, Shimadzu Scientific Research, Kyoto, Japan
11:30 D-069 HIGH-RESOLUTION LOW BACKGROUND BEAM FORMATION SYSTEM AND ITS APPLICATION IN SMALL ANGLE X-RAY SCATTERING
L. Jiang, B. Verman, B. Kim, Y. Platonov, Osmic, Inc., Auburn Hills, MI
11:50 C-01 WAVEGUIDE-RESONANCE MECHANISM FOR AN X-RAY BEAM
PROPAGATION, PHYSICS AND PRACTICAL SIGNIFICANCE
V.K. Egorov, E.V. Egorov, IPMT Russian Academy of Science, Chernogolovka, Russia

Session, Friday a.m. (Fremont)
Session D-7 Stress Analysis
Organized by: C.C. Goldsmith, IBM Microelectronics, Hopewell Junction, NY
XRD

8:30 D-098 RESIDUAL STRESS MEASUREMENTS USING PARALLEL BEAM OPTICS -
Invited
T.R. Watkins, O.B. Cavin, J. Bai, Oak Ridge National Laboratory, Oak Ridge, TN
J.A. Chediak, University of California - Berkeley, Berkeley, CA
9:00 D-073 STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION
F.A. Selim, D.P. Wells, J.F. Harmon, J. Kwofie, R. Spaulding, Idaho State University, Pocatello, ID
G. Erikson, Boise State University, Boise, ID
T. Roney, Idaho National Engineering & Environmental Laboratory, Idaho Falls, ID
9:20 D-043 THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF
X-RAYS AND ITS EFFECT ON BRAGG PEAK POSITIONS
M.H. Ott, D. Löhe, University of Karlsruhe (TH), Karlsruhe, Germany
9:40 D-082 OBSERVATION OF HIGH-RESOLUTION DIFFRACTION PROFILES FROM
SINGLE GRAINS WITHIN POLYCRYSTALLINE METALS
U. Lienert, J. Almer, Argonne National Laboratory, Argonne, IL
L. Margulies, S. Nielsen, W. Pantleon, H.F. Poulsen, S. Schmidt, Risoe National Laboratory, Roskilde, Denmark
10:00 Break
10:20 D-109 X-RAY STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC
UNIDIRECTIONAL FIBER COMPOSITES
J.C. Hanan, E. Üstündag, G.A. Swift, California Institute of Technology, Pasadena, CA
J.D. Almer, U. Lienert, D.R. Haeffner, Argonne National Laboratory, Argonne, IL
10:40 D-074 THE USE OF X-RAY DIFFRACTION MEASUREMENTS TO DETERMINE THE EFFECT OF AGING ON RESIDUAL STRESSES IN UNIDIRECTIONAL AND WOVEN GRAPHITE/POLYIMIDE COMPOSITES
B. Benedikt, M. Gentz, L. Kumosa, P.K. Predecki, M. Kumosa, The University of Denver, Denver, CO
11:00 D-041 DETERMINATION OF THERMAL RESIDUAL STRESSES IN A FUNCTIONALLY GRADED WC-Co COMPOSITE
C. Larsson, M. Odén, Linköping University, Linköping, Sweden
11:20 D-014 STRESS ERRORS ASSOCIATED WITH MINIATURIZATION OF PUSAI
ASSEMBLY X-RAY STRESS ANALYZER
T. Goto, Fukui University of Technology, Nara, Japan
11:40 D-008 COMPACT X-RAY DIFFRACTION TECHNIQUE
A. Mozelev, Small Scale Research & Production Company RADICAL,
Friedrichsdorf, Germany

Session, Friday a.m. (Summit I)
SESSION F-3 PROBLEM SOLVING / INDUSTRIAL APPLICATIONS OF XRF
Organized by: D. Broton, Construction Technology Labs, Skokie, IL
XRF

8:30 F-07 THE USE OF XRF IN SOLVING PROBLEMS RELATED TO THE PRODUCTION OF ACTIVE PHARMACEUTICAL INGREDIENTS (API) -Invited
F.J. Antosz, J.W. Manski, Pharmacia Corp., Kalamazoo, MI
9:00 F-20 CEMENT CONTENT OF HARDENED PORTLAND CEMENT CONCRETE
USING XRF, A NOVEL APPROACH — Invited
D. Broton, Construction Technology Laboratories, Skokie, IL
9:30 F-28 SPECTRAL INTERFERENCES IN X-RAY FLUORESCENCE ANALYSIS
F.R. Feret, H. Hamouche, Y. Boissonneault, Alcan International Ltd., Québec, Canada
9:50 F-34 SULFUR ANALYSIS USING ASTM D 2622 AT REFINERY LABORATORIES
K.F. Dahnke, R.W. Morton, Phillips Petroleum Company, Bartlesville, OK
10:10 Break
10:30 F-42 EXPERIMENTAL DETERMINATION AND CHARACTERIZATION OF Fe L
SPECTRA FROM DIFFERING VALENCE STATES
G. Trudgett, B. Cheary, K. Turner, University of Technology, Sydney, Australia
10:50 F-49 FORENSIC ENVIRONMENTAL GEOCHEMISTRY, EVIDENCE OF
SEDIMENTARY POLLUTION FROM MINE TAILINGS ACCIDENT
USING BULK AND SINGLE PARTICLE XRS AND XANES
S. Török, B. Alföldy, S. Kurunczi, J. Osán, KFKI Atomic Energy Research Institute, Budapest, Hungary
11:10 F-09 XRF ANALYSIS OF THE DISTRIBUTION OF HEAVY METAL IONS IN
CANCEROUS TISSUES
M. Haschke, Röntgenanalytik Meßtechnik GmbH, Taunusstein, Germany
W. Ebert, Berlin, Germany