2002 Denver X-ray Conference > Plenary Session > Wednesday 31, July 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home APPLICATIONS OF X-RAY ANALYSIS TO FORENSIC MATERIALS 8:30 a.m -12:30 p.m.   Plenary Session, Wednesday, 31 July (Summit III) Organized by: D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA 8:30 Welcoming Remarks T. Fawcett, Executive Director, International Centre for Diffraction Data, Newtown Square, PA V. Buhrke, Chairman, Denver X-ray Conference, Consultant, Portola Valley, CA Presentation of Awards 2002 Birks Award to Michael Mantler, Vienna University of Technology, Vienna, Austria presented by: Y. Gohshi, National Institute for Environmental Studies, Tsukuba, Japan Announcement of the 2002 Jerome B. Cohen Student Award presented by: I. Cev Noyan, IBM, Yorktown Heights, NY Announcement of the 2002 McMurdie Award presented by: R.L. Snyder, The Ohio State University, Columbus, OH Plenary Session Remarks D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK R. Jenkins, Emeritus, International Centre for Diffraction Data, Newtown Square, PA The following are the invited papers to be presented during the plenary session: 9:00 P-5 X-RAY ANALYSIS IN THE U.S. CUSTOMS LABORATORIES M.H. Liberman, US Customs Laboratory, San Francisco, CA 9:30 P-6 UNDERKARAT JEWELRY: THE PERFECT CRIME? INVESTIGATIONS AND ANALYSIS OF JEWELRY USING XRF D. Kloos, Industry Consultant, Westminster, CA 10:00 P-1 X-RAY DIFFRACTION ANALYSIS IN THE FORENSIC SCIENCE LABORATORY OF STUTTGART, GERMANY¡ªTHE LAST RESORT IN MANY CRIMINAL CASES W. Kugler, Forensic Science Laboratory, Landeskriminalamt Baden-Wuerttemberg, Stuttgart, Germany 10:30  Break 11:00 P-2 PORTABLE XRF FOR FORENSIC INVESTIGATIONS D.C. Ward, Federal Bureau of Investigation, Microanalysis Laboratory, Washington, DC 11:30 P-3 USE OF X-RAYS IN THE UNITED KINGDOM FORENSIC SCIENCE SERVICE D.F. Rendle, The Forensic Science Service, Metropolitan Laboratory, London, UK 12:00 P-4 XRD AT THE FBI: THE THREE C¡¯S OF FORENSIC SCIENCE M.C. Bottrell, Federal Bureau of Investigation, Geologist/Forensic Examiner, Washington, DC