2002 Denver X-ray Conference > Workshops > Tuesday, 30 July a.m. workshops: 9:00 a.m.–12:00 noon • p.m. workshops: 2:00 p.m.–5:00 p.m. 2002 DXC - Quick Links Choose One DXC 2002 Home DXC 2002 At-a-Glance Monday Workshops Tuesday Workshops Monday Poster Tuesday Poster Wednesday Poster Wednesday Plenary Wednesday Sessions Thursday Sessions Friday Sessions Dates to Remember Hotel Information Find a Roommate Presented Papers Contributed Papers Jerome B. Cohen Student Award DXC Main Home Workshops, Tuesday a.m. XRD & XRF W-9 Optics (Carson) Organized by: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM Z. Al-Mosheky, Osmic, Inc., Troy, MI Instructors: S. Formica, SUNY at Albany, Albany, NY D.K. Bowen, Bede Scientific, Inc., Englewood, CO L. Jiang, Osmic, Inc., Troy, MI D. Gibson, Z. Chen, X-ray Optical Systems, Inc., Albany, NY This workshop provides the basic knowledge about some selected X-ray optics including total reflection- based ellipsoidal optics, polycapillary optics, crystal optics and multilayer optics. One objective is to help users understand the basic working principles and performance characteristics of these optics. The other objective is to further help users understand the function of an optical system in an X-ray instrument. XRD W-10 Rietveld Applications I (Summit III) Organized by: J.A. Kaduk, BP Chemicals, Naperville IL Instructors: J.A. Kaduk, BP Chemicals, Naperville, IL, kadukJA@BP.com R.W. Morton, D.E. Simon, Phillips Petroleum Company, Bartlesville, OK, rwmorton@ppco.com, desimon@ppco.com M.A. Rodriguez, Sandia National Laboratory, Albuquerque, NM, marodri@sandia.gov This workshop is an introduction to using the Rietveld method to solve practical problems, with emphasis on the approaches, thought processes, and potential pitfalls. The emphasis will be on concepts, not details of the programs (though GSAS, Fullprof, and RIQAS will be illustrated). Topics covered will include data collection, quantitative analysis, the accuracy and precision of structural and analytical quantities, and application of the method in high-throughput production applications. The main instruction will be through working examples in real time (not hands on), and discussing how the analyst decides “what to do next”. The intention is to distribute a CD-ROM containing (some) programs and the raw data for the examples. Attendees are invited to submit their own data (in advance!) to one of the instructors for possible discussion. XRF W-11 Specimen Preparation II (Summit I & II) Organized by: D. Broton, Construction Technology Labs, Skokie, IL Instructors: D. Broton, S. Nettles, Construction Technology Labs, Skokie, IL J. Anzelmo, Bruker AXS, Inc., Madison, WI V. Kocman, A.S.O. Design, Quebec, Canada Continuation of W-7. W-12 Mathematical Methods of Quantitative XRF (Fremont) Organized by: M. Mantler, Vienna University of Technology, Vienna, Austria Instructors: M. Mantler, Vienna University of Technology, Vienna, Austria B. Vrebos, Philips Analytical, Almelo, The Netherlands W.T. Elam, University of Washington, Seattle, WA This workshop will cover: 1. Empirical and theoretical methods of quantitative XRF 2. Basic interactions and atomic (“fundamental”) parameters 3. Sources and accuracy of atomic parameters and tube spectra 4. Classical fundamental parameter methods 5. Computed (theoretical) influence coefficients 6. Software issues 7. Special cases and methods (Thin films, inhomogeneous specimens, light elements) Workshops Tuesday p.m. XRD W-13 Rietveld Applications II (Summit III) Organized by: J.A. Kaduk, BP Chemicals, Naperville IL Instructors: J.A. Kaduk, BP Chemicals, Naperville, IL R.W. Morton, D.E. Simon, Phillips Petroleum Company, Bartlesville, OK M.A. Rodriguez, Sandia National Laboratory, Albuquerque, NM Continuation of W-10. W-14 Line Broadening (Carson) Organized by: J.D. Makinson, RSI Materials Engineering, Omaha, NE Instructors: J.D. Makinson, RSI Materials Engineering, Omaha, NE R.J. De Angelis, University of Florida, Shalimar, FL This workshop covers the theory and application of line broadening as well as some of the pitfalls and difficulties encountered. Techniques of line broadening measurements will be discussed along with the limitations of each method. Applications will include line broadening of two-phase steels with regard to processing, thermal history, carbon content, and service history. XRF W-15 Quantitative Analysis – Standardless Methods (Summit I & II) Organized by: J.A. Anzelmo, Bruker AXS, Inc., Madison, WI Instructors: J.A. Anzelmo, Bruker AXS, Inc., Madison, WI K.-E. Mauser, Bruker AXS GmbH, Karlsruhe, Germany D. Bonvin, Applied Research Laboratories, Ecublens, Switzerland Two approaches have emerged as the methods for performing so-called Standardless Analysis. The two approaches are 1) scanning, and 2) counting directly on peaks and backgrounds. This workshop will discuss various aspects of the two approaches such as the theory, data collection, data manipulation, calibration, sample preparation, and practical examples. W-16 TXRF (Learning Center) Organized by: M.A. Zaitz, IBM – EF Microelectronics, Hopewell Junction, NY Instructors: M.A. Zaitz, IBM – EF Microelectronics, Hopewell Junction, NY P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna, Austria This workshop will cover the basics of total reflection X-ray fluorescence, as well as instrumentation, calibration, and applications.