2003 DXC Summary

The 52nd Annual Denver X-ray Conference (DXC) was held in Denver, Colorado at the Denver Marriott Tech Center. The conference ran from 4-8 August, attracting 300 registered attendees and over 200 exhibit personnel. Most of the attendees present were long-time supporters of the conference, however, approximately 10% of the attendees were first-time participants. Victor Buhrke, Chairman of the Denver X-ray Conference, Portola Valley, CA, welcomed the new attendees to the conference during a brief orientation on Tuesday evening. Dr. Buhrke received feedback regarding their general background and major interests. The orientation was so successful, that it will now become a standard component of the conference program.

Conference week began with 16 tutorial workshops, held on Monday and Tuesday. Instructors from all over the world gathered together to share their wisdom and skills. Topics included: Technical Communication, Optics, Rietveld Applications, Specimen Preparation - XRF, Alignment & Standards, Working Close to Detection Limits - XRF, Two-Dimensional XRD, Backscatter Electron Diffraction, Fundamentals of XRF, Quantitative Analysis, High Resolution - XRD and Basic TXRF.

Seventeen special sessions filled the remaining two and a half days of the conference, and were organized by many of the top minds in the field of X-ray analysis. Subjects included: New Developments in XRD & XRF Instrumentation, Rietveld Applications, High Resolution - XRD, Synchrotron Applications - XRF, Detectors & Sources, Synchrotron Applications XRD & Scattering, Stress Analysis, TXRF, X-ray Optics, Industrial Applications XRD, Quantitative XRF, Cement Analysis, Software, Pharmaceuticals, Catalysis and Problem Solving/Industrial Applications - XRF.

The Plenary Session, "X-ray Studies of Art & Archaeological Objects", was organized by Dr. Michael Mantler, of the Vienna University of Technology, Vienna, Austria. Attendees were intrigued by the four invited talks on the use of X-rays in the fascinating world of art and archaeology. Koen Janssens, University of Antwerp, Antwerp, Belgium, gave a talk on "Use of Conventional and Synchrotron X-ray Micro Beams for Non-Destructive Characterization of Archaeological and Artists Materials". Manfred R. Schreiner, Academy of Fine Arts, Vienna, Austria spoke of "X-rays in Art and Archaeology - History, Present State and Perspectives". M.C. Corbeil, Canadian Conservation Institute, Ottawa, Canada, gave a presentation on "Applications of X-ray Diffraction in Conservation Science and Archaeometry", and Philip J. Potts, The Open University, Milton Keynes, United Kingdom, wrapped up the session with his talk on "Portable X-ray Fluorescence Analysis of Neolithic Stone Axes - Opening a Window on Prehistory". All four lecturers gave exceptional presentations, and conveyed a great deal of knowledge and expertise to the extremely satisfied attendees.

An awards presentation also took place during the Plenary Session to honor a variety of important contributions to the field of materials analysis. The 2003 Barrett Award was presented to Hugo M. Rietveld, Alkmaar, The Netherlands, founder of the world famous Rietveld Method. Rietveld Analysis has been a popular topic at the DXC as both a session and a workshop, and the Organizing Committee considered Dr. Rietveld's presence at the conference to be a great honor. John V. Gilfrich, Emeritus, SFA, Inc./NRL, Bethesda, MD was awarded the 2003 Jenkins Award, named after his good friend and colleague, Dr. Ron Jenkins. John received the prestigious tribute for his lifetime achievements in the advancement of the use of X-rays for material analysis. The 2003 Jerome B. Cohen Student Award was presented to Yukio Takahashi, Tohoku University, Sendai, Japan. Yukio received the award for a paper that he submitted, "Development and Application of Laboratory X-ray Fluorescence Holography Equipment". The award winning paper was presented during the XRF Poster Session. Frank McClune, International Centre for Diffraction Data (ICDD), Newtown Square, PA was the proud recipient of the 2003 Distinguished Fellows Award. The award was presented to Frank for his long and meritorious service to the ICDD.

Poster sessions were held on Monday, Tuesday and Wednesday evening of conference week. Judges were appointed each night to select the best posters. The following posters were selected as the best: "Minimization of Errors Due to Microabsorption or Absorption Contrast", B.M. Pederson, R.S. Winburn, Minot State University, Minot, ND; "X-ray Micro-Diffraction Study of the Half-V Shaped Switching Ferroelectric Liquid Crystal", K. Takada, T. Noma, T. Togano, T. Mukaide, Canon Research Center, Atsugi, Kanagawa, Japan, A. Iida, Institute of Materials Structure Science, Tsukuba, Ibaraki, Japan; "Carbon-Nanotube Field Emission X-ray Tube for Space Exploration XRD/XRF Instrument", P. Sarrazin, D. Blake, L. Delzeit, M. Meyyappan, NASA Ames Research Center, Moffett Field, CA, B. Boyer, S. Snyder, X-ray Technologies, Inc., Scotts Valley, CA, B. Espinosa, Microwave Power Technology, Campbell, CA; "Identification of Hot Particles in the Environment using Single Particle X-ray Emission and Absorption Analysis", S. Török, J. Osán, B. Alfödy, KFKI Atomic Energy Research Institute, Budapest, Hungary, L. Vincze, KFKI Atomic Energy Research Institute and University of Antwerp, Antwerp, Belgium, M. Betti, Institute for Transuranium Elements, Karlsruhe, Germany, C.A. Pérez, Laboratório Nacional de Luz Síncrotron, Campinas, Brazil, G. Falkenberg, HASYLAB at Desy, Hamburg, Germany; "Elemental Correlations and Phase Identification using X-ray Fluorescence and Automated Spectral Image Analysis Software", G.J. Havrilla, T. Miller, Los Alamos National Laboratory, Los Alamos, NM, M. Keenan, P. Kotula, Sandia National Laboratory, Albuquerque, NM; "Analysis of Art Objects and Other Delicate Samples: Is XRF Really Non-Destructive?", M. Mantler, Vienna University of Technology, Vienna, Austria.

Exhibits at the conference ran from Monday to Thursday where 41 companies displayed their various products and services for X-ray powder diffraction and X-ray fluorescence spectrometry. The following companies participated at the exhibits: AMPTEK, Inc.; ATPS, Inc.; Bede Scientific Incorporated; Blake Industries, Inc.; Bruker AXS, Inc.; Chemplex Industries, Inc.; Corporation Scientifique Claisse, Inc.; Del Power Conversion Group; EDAX, Inc.; F.A.I.R. Corp. (Fusion & Analytical Instrument Resources)/Spectrum Plus; GBC Scientific Equipment Pty Ltd.; Gresham Scientific Instruments LTD; Handley Analytical Services; Herzog Automation Corporation; Inel, Inc.; Initiative Scientific Products Australia Pty Ltd; Innov-x Systems, Inc.; International Centre for Diffraction Data (ICDD); Jordan Valley; Kratos Analytical, Inc.; Materials Data, Inc. (MDI); MOXTEK, Inc.; Osmic, Inc.; Oxford Cryosystems; Oxford Instruments; PANalytical (formerly Philips Analytical); Rigaku/MSC, Inc.; Rocklabs Ltd.; Soft Imaging System Corp.; Spectro Analytical Instruments, Inc.; SPEX CertiPrep, Inc.; Technical Associates; Thales Components Corporation; Thermo ARL; Thermo Electron Corporation; Varian X-ray Products; Wiley; Xenocs; X-ray & Specialty Instruments, Inc.; X-ray Instrumentation Associates; X-ray Optical Systems, Inc. For contact information, a description of products and services, and a direct link to each exhibitor's website, please visit the Denver X-ray Conference web page: www.dxcicdd.com.

Fortunately, conference week was not all work and no play. Attendees and their families enjoyed vendor-sponsored socials Sunday through Wednesday evening. Not only was there plenty of food and drink for everyone's delight, but the socials were also held in conjunction with the poster sessions. Attendees had the opportunity to sip their drinks and peruse the various presentations, speaking one-on-one with the lead authors. Combining science and socialization, the evening socials were a huge success. A special thank you goes out to the vendors who sponsored evening receptions: Bede Scientific, Bruker AXS, Corporation Scientifique Claisse, Materials Data, Inc., PANalytical, Rigaku/MSC and SPEX CertiPrep.


For more information please contact Denise Zulli - zulli@icdd.com