XRD Poster Session I, Monday, 4 August (Evergreen)
6:30 p.m. - 8:30 p.m., authors present

The XRD Poster Session I will be held in conjunction with the
PANalytical (formerly Philips Analytical) Mixer.
Chairs:  I.C. Noyan, IBM, Yorktown Heights, NY
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred NY

Session chairs will select the two best papers for awards.


Rietveld
D005 CRYSTAL STRUCTURES OF (Ba,Sr)2RTaO6 (R = Nd, Sm, Gd, Tm, and Lu)

J. A. Kaduk, BP Chemicals, Naperville IL
W. Wong-Ng, National Institute of Standards & Technology, Gaithersburg, MD

D003 CRYSTAL STRUCTURES AND HYDROGEN BONDING IN CELLULOSES I, I, and II

J.A. Kaduk, BP Chemicals, Naperville IL
P. Langan, Los Alamos National Laboratory, Los Alamos NM

D129 CRYSTALLITE DOMAIN SIZE OF GRAPHITIC CARBON USING AN X-RAY DIFFRACTOMETER
WITHOUT A PRIMARY MONOCHROMATOR

R.W. Morton, D.E. Simon, J.M. Novak, R.L. Heald, R. Schmidt, ConocoPhillips,
Bartlesville, OK

D130 MONITORING HIGH VOLUME X-RAY DIFFRACTION DATA USING RIETVELD MODELING
WITH PHASE FILTERS

R.W. Morton, D.E. Simon, J.J. Gislason, R. Schmidt, ConocoPhillips,
Bartlesville, OK

D128 A CLOSE LOOK AT ELECTROLYTIC MANGANESE DIOXIDE AND THE y-MnO2 & E-MnO2
PHASES USING RIETVELD MODELING

D.E. Simon, R.W. Morton, J.J. Gislason, ConocoPhillips, Bartlesville, OK

D046 MINIMIZATION OF ERRORS DUE TO MICROABSORPTION OR ABSORPTION CONTRAST

B.M. Pederson, R.S. Winburn, Minot State University, Minot, ND

D138 COMBINED X-RAY/NEUTRON RIETVELD REFINEMENT OF RE-DOPED PZT PEROVSKITES

M.A. Rodriguez, T.J. Boyle, B.A. Tuttle, Sandia National Laboratories,
Albuquerque, NM

 
 Solid State Chemistry
 
D074 IN-SITU XRD TO EVALUATE THE STABILITY OF NOVEL PROTON CONDUCTING MATERIALS

S.A. Speakman, R.D. Carneim, T.R. Armstrong, E.A. Payzant, Oak Ridge National
Laboratory, Oak Ridge, TN

D109 STRUCTURE ANALYSIS OF PEFC ANODE CATALYST BY XRD AND XAFS

H. Yashiro, K. Hoshino, Rigaku Corporation, Tokyo, Japan

D097 STUDY OF MATERIALS IN MUDEJAR BUILDINGS FROM EXTREMADURA (SPAIN)

P. Mogollón, Extremadura University, Cáceres, Spain
J.L. Ferrero, C. Roldán, J. Carballo, Valencia University, Valencia, Spain

D093 X-RAY POWDER DIFFRACTION DATA FOR Na8(AlSiO4)6(ReO4)2

D.E. McCready, J.S. Young, Environmental Molecular Science Laboratory, Richland, WA
S.V. Mattigod, B.P. McGrail, Pacific Northwest National Laboratory, Richland, WA

D064 PRELIMINARY ANALYSIS OF OCEAN FLOOR SEDIMENTS FROM THE VENEZUELAN
ATLANTIC FRONT USING POWDER X-RAY DIFFRACTION TECHNIQUES

C. Cedeño, R. Toro, A. Vivas, D. Rosales, M. Romero, J. Contreras, G. Díaz de Delgado,
J.M. Delgado, Universidad de Los Andes, Mérida, Mérida, Venezuela

Tools
D002 STUDY OF THE POROUS STRUCTURES FRACTAL PROPERTIES BY THE SMALL-ANGLE
X-RAY SCATTERING

L. Skatkov, PCB “Argo”, Beer Sheva, Israel
V. Gomozov, P. Cheremskoy, E. Sobol, O. Sobol, S. Malyhin, A. Panikarsky, Kharkov
Technical University, Ukraine

D073 QUANTIFICATION OF THE CONSEQUENCES OF USING PARALLEL-BEAM OPTICS
COMBINED WITH LINEAR POSITION SENSITIVE DETECTORS

S.A. Speakman, Oak Ridge National Laboratory, Oak Ridge, TN
M.J. Kirkham, The University of Tennessee, Knoxville, TN
C.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TN and The University of
Tennessee, Knoxville, TN

D058 OVERVIEW OF COLLIMATING POLYCAPILLARY OPTICS FOR X-RAY POWDER
DIFFRACTION

H. Huang, W.M. Gibson, P.J. Schields, X-ray Optical Systems, Inc.,
East Greenbush, NY

D006 NOVEL METHODS OF NON-DESTRUCTIVE DEPTH PROFILING

A. Broadhurst, K.D. Rogers, D.W. Lane, T.W. Lowe, Cranfield University,
Wiltshire, UK

D094 RADIOACTIVE GLOVEBOX CONTAINMENT OF A COMMERCIAL X-RAY DIFFRACTOMETER

A.R. Jurgensen, D.M. Missimer, R.L. Rutherford, Westinghouse Savannah River Site,
Aiken, SC

D096 MANAGING THE BACKGROUND IN LINEAR X-RAY DETECTION SYSTEMS

M.J. Fransen, PANalytical, Almelo, The Netherlands

D066 A PHOTONEUTRON SOURCE FOR BULK MATERIAL STUDIES

M.A. Reda, J.F. Harmon, Idaho State University, Pocatello, ID
S.B. Sadineni, University of Nevada, Las Vegas, NV

D010 SAMPLE PREPARATION OF THE HIGHLY RADIOACTIVE SOLID WASTE IN HANFORD
WASTE TANKS

R. W. Warrant, G.A. Cooke, Fluor Hanford, Richland, WA

D137 OPTIMIZED PERFORMANCE OF GRADED MULTILAYER OPTICS FOR X-RAY SINGLE
CRYSTAL DIFFRACTION

J. Wiesmann, C. Hoffmann, A. Oehr, C. Michaelsen, Incoatec GmbH, Geesthacht,
Germany
A.B. Storm, L.J. Seijbel, Bruker Nonius B.V., Delft, The Netherlands

D118 UNIVERSAL THEORY FOR THE DETERMINATION OF BOTH SCREW AND EDGE DISLOCATION DENSITIES FOR GaN AND RELATED MATERIALS USING HIGH RESOLUTION
X-RAY DIFFRACTION

S. Bates, SSCI, Inc., West Lafayette, IN

 
 Theory
D113 STUDY ON MEASUREMENT TECHNIQUE FOR LATTICE SPACING AT STRAIN FREE BY
NEUTRON DIFFRACTION METHOD

N. Minakawa, Y. Morii, Japan Atomic Energy Research Institute, Ibaraki, Japan
T. Saito, Dalian Institute of Light Industry, Dalian, P.R. China
T. Sasaki, Y. Hirose, Kanazawa University, Kanazawa, Japan

D001 NEW MEASUREMENT TECHNOLOGY OF SPATIAL 3-D DETECTING OF SOLITARY OR
DISTANT X-SOURCES BY CORRELATION OF INTENSITY

V.I. Vysotskii, Kiev Shevchenko University, Kiev, Ukraine

D021 DYNAMICAL THEORY OF A THREE-WAVE DOUBLE-CRYSTAL LAUE-INTERFEROMETER

T. Tchen, M.V. Lomonosov Moscow State Academy of Fine Chemical Technology,
Moscow, Russia

D020 ON THE THEORY OF X-RAYS BACKDIFFRACTION BY <<WEAKLY>> CURVED CRYSTALS
WITH TAKING INTO ACCOUNT OF MULTI-WAVE EFFECTS

T. Tchen, M.V. Lomonosov Moscow State Academy of Fine Chemical Technology,
Moscow, Russia

D022 ON THE THEORY OF X-RAY SECONDARY PROCESSES IN BENT CRYSTALS. MULTIWAVE
APPROACH

T. Tchen, M.V. Lomonosov Moscow State Academy of Fine Chemical Technology,
Moscow, Russia

D018 ON THE THEORY OF A THREE-WAVE DYNAMICAL DIFFRACTION OF X-RAYS BY
CRYSTALS WITH EPITAXIAL FILMS

T. Tchen, M.V. Lomonosov Moscow State Academy of Fine Chemical Technology,
Moscow, Russia

D019 DYNAMICAL THEORY OF X-RAY FOCUSING SPECTROMETERS AND MONOCHROMATORS
CURVED TO THE LOGARITHMIC SPIRAL

T. Tchen, M.V. Lomonosov Moscow State Academy of Fine Chemical Technology,
Moscow, Russia

D106 A NEW ANALYSIS METHOD FOR TWO-DIMENSIONAL X-RAY DATA

J.C. Hanan, Bio-Inspired Technologies and Systems, Pasadena, CA and California Institute of
Technology, Pasadena, CA
E. Üstündag, California Institute of Technology, Pasadena, CA
J.D. Almer, U. Lienert, D.R. Haeffner, Argonne National Laboratory, Argonne, IL

D030 CERTIFIED REFERENCES MATERIALS FOR POWDER DIFFRACTOMETERS. APPLICATION
FOR ADJUSTMENT AND PATTERN APPROVED

B.N. Kodess, ICS&E, Denver, CO and VNIIMS, Moscow, Russia
I.L. Kommel, G.V. Guschin, VNIIMS, Moscow, Russia

D125 A PLUG-IN PROGRAM TO PERFORM HANAWALT OR FINK SEARCH INDEXING METHODS
USING ORGANIC ENTRIES IN THE ICDD PDF-4/ORGANICS 2003 DATABASE

J. Faber, C.A. Weth, J. Bridge, International Centre for Diffraction Data, Newtown Square, PA

D044 THE VIRTUAL BLUE BOOK

H. Jones, Pratt & Whitney, East Hartford, CT
J.M. Bennett, Radnor, PA
P. Wallace, Dos Arroyos Enterprises, Oro Valley, AZ
J. Dann, OSRAM Sylvania, Towanda, PA
A. Roberts, Geological Survey of Canada, Ontario, Canada
F. McClune, International Centre for Diffraction Data, Newtown Square, PA

 
 

For more information please contact Denise Zulli - zulli@icdd.com