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XRF Poster Session, Wednesday, 6 August (Evergreen)
6:30 p.m. - 8:30 p.m., authors present
The XRF Poster Session will be
held in conjunction with the Bruker AXS, Inc. Mixer.
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Chairs: |
G.J.
Havrilla, Los Alamos National Laboratory, Los Alamos, NM
M.A. Zaitz, IBM, Hopewell Junction, NY |
Session chairs will select the three best papers for awards.
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Instrumentation
| F06 |
DEVELOPMENT
AND APPLICATION OF LABORATORY X-RAY FLUORESCENCE
HOLOGRAPHY EQUIPMENT
Y. Takahashi, K. Hayashi, E. Matsubara, Tohoku
University, Sendai, Miyagi, Japan |
| F19 |
XRF IN THE
SEM—HOW AND WHY?
B. Cross, CrossRoads Scientific, El Granada, CA
K. Witherspoon, IXRF Systems, Inc., Houston, TX |
| F20 |
STANDING
WAVE FIELDS FOR EXCITATION IN XRF—COMPARISON OF TXRF WITH
BRAGG REFLECTION ON MULTILAYERS
Th. Holz, AXO DRESDEN GmbH, Heidenau, Germany
C. Streli, G. Pepponi, P. Wobrauschek, Atominstitut der Österreichischen
Universitäten,
Wien, Austria |
| F28 |
DUAL-CAPILLARY
OPTIC MXRF
G.J. Havrilla, Los Alamos National Laboratory,
Los Alamos, NM
N. Gao, X-ray Optical Systems, East Greenbush, NY |
| F32 |
WAVEGUIDE-RESONATOR
APPLICATION FOR TXRF ANALYSIS OF SURFACE AND FOR
XRF ANALYSIS OF GASEOUS MIXTURES
V.K. Egorov, E.V. Egorov, IPMT RAS, Moscow,
Russia
S.E. Egorov, Del Mar Ventures, San Diego, CA |
| C10 |
PECULIARITIES
OF X-RAY BEAM FORMATION AND PRACTICAL APPLICATION FIELDS
FOR THE COMPOSITE WAVEGUIDE-RESONATOR
V.K. Egorov, E.V. Egorov, IPMT RAS, Moscow,
Russia
S.E. Egorov, Del Mar Ventures, San Diego, CA |
| F34 |
A NEW TXRF
VACUUM CHAMBER WITH SAMPLE CHANGER FOR CHEMICAL ANALYSIS
C. Streli, P. Wobrauschek, N. Zöger, G. Pepponi,
Atominstitut der Österreichischen
Universitäten, Wien, Austria |
| F41 |
DESIGN OF
EDXRF EQUIPMENT FOR THE NONDESTRUCTIVE STUDY OF
ENGRAVINGS
J.L. Ferrero, C. Roldán, J.L. Lluch, Universidad
de Valencia, Valencia, Spain
D. Juanes, Desarrollo y Aplicaciones Científicas y Técnológicas S.L.
Parque Tecnológico,
Paterna, Spain |
Applications
| F38 |
EDXRF
ANALYSIS OF THE HOLY SPIRIT TRIPTYCH FROM THE SAN PEDRO DE
MIRAGAIA CHURCH (PORTO, PORTUGAL)
J.L. Ferrero, C. Roldán, J.L. Lluch, D. Juanes,
J. Carballo, Universidad de Valencia,
Valencia, Spain
A. Calvo, M. Aguiar, Universidad Católica Portuguesa Escola das Artes,
Porto, Portugal |
| F02 |
PORTABLE XRF
ANALYSIS OF JAPANESE HISTORICAL OBJECTS
Y. Hayakawa, National Research Institute for Cultural Properties, Tokyo,
Japan |
| F07 |
DISTRIBUTION
AND OVERALL CONTENT OF CHLORINE IN FLAME HYDROLYSIS
QUARTZ USING MICRO-XRF, NEUTRON ACTIVATION ANALYSIS, AND PROMPT
GAMMA ACTIVATION ANALYSIS
W.J. Heward, Y. Gao, F.J. Klug, GE Global
Research Center, Niskayuna, NY
H.H. Chen-Mayer, R.L. Paul, National Institute of Standards &
Technology, Gaithersburg,
MD |
| F15 |
IDENTIFICATION
OF HOT PARTICLES IN THE ENVIRONMENT USING SINGLE PARTICLE
X-RAY EMISSION AND ABSORPTION ANALYSIS
S. Török, J. Osán, B. Alföldy, KFKI Atomic
Energy Research Institute, Budapest, Hungary
L. Vincze, KFKI Atomic Energy Research Institute and University of
Antwerp, Antwerp,
Belgium
M. Betti, Institute for Transuranium Elements, Karlsruhe, Germany
C.A. Pérez, Laboratório Nacional de Luz Síncrotron, Campinas, Brazil
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany |
| F43 |
IDENTIFICATION
OF COMPLEX COMPOSITION MATERIALS WITH THE HELP OF A
PORTABLE X-RAY SPECTROMETER
I.A. Brytov, R.I. Plotnikov, A.A. Rechinski, M.A.
Sokolov, Bourevestnik, Ltd., Saint-
Petersburg, Russia |
Miscellaneous
| C02 |
A PRIORI
ESTIMATE OF X-RAY ANALYSIS METROLOGICAL PARAMETERS
I.A. Brytov, B.D. Kalinin, R.I. Plotnikov,
Bourevestnik, Ltd., Saint-Petersburg, Russia |
| F11 |
NANOLITER
DRIED SPOTS: A MEANS FOR QUICKER, MORE REPRODUCIBLE SAMPLE
PREPARATION AND ELEMENTAL ANALYSIS
T.C. Miller, G.J. Havrilla, Los Alamos National
Laboratory, Los Alamos, NM |
| F31 |
ELEMENTAL
CORRELATIONS AND PHASE IDENTIFICATION USING X-RAY
FLUORESCENCE AND AUTOMATED SPECTRAL IMAGE ANALYSIS SOFTWARE
G.J. Havrilla, T. Miller, Los Alamos National
Laboratory, Los Alamos, NM
M. Keenan, P. Kotula, Sandia National Laboratory, Albuquerque, NM |
| F14 |
XRF ANALYSIS
FOR REFRACTORY SAMPLES BY FUSION BEAD METHOD IN VARIOUS
DILUTION RATIO WITH SYNTHETIC CALIBRATION STANDARDS AND DILUTION
RATIO’S CORRECTION
H. Inoue, S. Shoji, Y. Yamada, Rigaku Industrial
Corporation, Osaka, Japan
J.E. Martin, Rigaku/MSC, The Woodlands, TX |
| F16 |
IMPROVED
DESCRIPTION OF X-RAY TUBE SPECTRA FOR FUNDAMENTAL PARAMETER
PROGRAMS
H. Ebel, J. Wernisch, W. Dietrich, A. Ghassemi,
R. Svagera, M. Waas, Institut für
Festkörperphysik, Vienna University of Technology, Vienna, Austria |
| F17 |
A TUNABLE
FOCUSING MONOCHROMATOR
H. Ebel, J. Wernisch, R. Dietersdorfer, R.
Svagera, M. Waas, Institut für Festkörperphysik,
Vienna University of Technology, Vienna, Austria |
| F18 |
QUANTITATIVE
TOTAL ELECTRON YIELD (TEY)
H. Ebel, Institut für Festkörperphysik, Vienna
University of Technology, Vienna, Austria |
| F33 |
EXPERIMENTAL
STUDY OF MODE STRUCTURE PECULIARITIES IN X-RAY BEAMS
FORMED BY PLANAR WAVEGUIDE-RESONATORS
V.K. Egorov, E.V. Egorov, IPMT RAS, Moscow,
Russia |
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For more
information please contact Denise Flaherty - flaherty@icdd.com
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