XRF Poster Session, Wednesday, 6 August (Evergreen)
6:30 p.m. - 8:30 p.m., authors present

The XRF Poster Session will be held in conjunction with the Bruker AXS, Inc. Mixer.
Chairs:  G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
M.A. Zaitz, IBM, Hopewell Junction, NY

Session chairs will select the three best papers for awards.


Instrumentation
F06 DEVELOPMENT AND APPLICATION OF LABORATORY X-RAY FLUORESCENCE
HOLOGRAPHY EQUIPMENT

Y. Takahashi, K. Hayashi, E. Matsubara, Tohoku University, Sendai, Miyagi, Japan 

F19 XRF IN THE SEM—HOW AND WHY?

B. Cross, CrossRoads Scientific, El Granada, CA
K. Witherspoon, IXRF Systems, Inc., Houston, TX

F20 STANDING WAVE FIELDS FOR EXCITATION IN XRF—COMPARISON OF TXRF WITH
BRAGG REFLECTION ON MULTILAYERS

Th. Holz, AXO DRESDEN GmbH, Heidenau, Germany
C. Streli, G. Pepponi, P. Wobrauschek, Atominstitut der Österreichischen Universitäten,
Wien, Austria

F28 DUAL-CAPILLARY OPTIC MXRF

G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
N. Gao, X-ray Optical Systems, East Greenbush, NY

F32 WAVEGUIDE-RESONATOR APPLICATION FOR TXRF ANALYSIS OF SURFACE AND FOR
XRF ANALYSIS OF GASEOUS MIXTURES

V.K. Egorov, E.V. Egorov, IPMT RAS, Moscow, Russia
S.E. Egorov, Del Mar Ventures, San Diego, CA

C10 PECULIARITIES OF X-RAY BEAM FORMATION AND PRACTICAL APPLICATION FIELDS
FOR THE COMPOSITE WAVEGUIDE-RESONATOR

V.K. Egorov, E.V. Egorov, IPMT RAS, Moscow, Russia
S.E. Egorov, Del Mar Ventures, San Diego, CA

F34 A NEW TXRF VACUUM CHAMBER WITH SAMPLE CHANGER FOR CHEMICAL ANALYSIS

C. Streli, P. Wobrauschek, N. Zöger, G. Pepponi, Atominstitut der Österreichischen
Universitäten, Wien, Austria

F41 DESIGN OF EDXRF EQUIPMENT FOR THE NONDESTRUCTIVE STUDY OF
ENGRAVINGS

J.L. Ferrero, C. Roldán, J.L. Lluch, Universidad de Valencia, Valencia, Spain
D. Juanes, Desarrollo y Aplicaciones Científicas y Técnológicas S.L. Parque Tecnológico,
Paterna, Spain

 
 Applications 
F38 EDXRF ANALYSIS OF THE HOLY SPIRIT TRIPTYCH FROM THE SAN PEDRO DE
MIRAGAIA CHURCH (PORTO, PORTUGAL)

J.L. Ferrero, C. Roldán, J.L. Lluch, D. Juanes, J. Carballo, Universidad de Valencia,
Valencia, Spain
A. Calvo, M. Aguiar, Universidad Católica Portuguesa Escola das Artes, Porto, Portugal

F02  PORTABLE XRF ANALYSIS OF JAPANESE HISTORICAL OBJECTS
Y. Hayakawa, National Research Institute for Cultural Properties, Tokyo, Japan
F07 DISTRIBUTION AND OVERALL CONTENT OF CHLORINE IN FLAME HYDROLYSIS
QUARTZ USING MICRO-XRF, NEUTRON ACTIVATION ANALYSIS, AND PROMPT
GAMMA ACTIVATION ANALYSIS

W.J. Heward, Y. Gao, F.J. Klug, GE Global Research Center, Niskayuna, NY
H.H. Chen-Mayer, R.L. Paul, National Institute of Standards & Technology, Gaithersburg,
MD

F15 IDENTIFICATION OF HOT PARTICLES IN THE ENVIRONMENT USING SINGLE PARTICLE
X-RAY EMISSION AND ABSORPTION ANALYSIS

S. Török, J. Osán, B. Alföldy, KFKI Atomic Energy Research Institute, Budapest, Hungary
L. Vincze, KFKI Atomic Energy Research Institute and University of Antwerp, Antwerp,
Belgium
M. Betti, Institute for Transuranium Elements, Karlsruhe, Germany
C.A. Pérez, Laboratório Nacional de Luz Síncrotron, Campinas, Brazil
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany

F43 IDENTIFICATION OF COMPLEX COMPOSITION MATERIALS WITH THE HELP OF A
PORTABLE X-RAY SPECTROMETER

I.A. Brytov, R.I. Plotnikov, A.A. Rechinski, M.A. Sokolov, Bourevestnik, Ltd., Saint-
Petersburg, Russia

Miscellaneous
C02 A PRIORI ESTIMATE OF X-RAY ANALYSIS METROLOGICAL PARAMETERS

I.A. Brytov, B.D. Kalinin, R.I. Plotnikov, Bourevestnik, Ltd., Saint-Petersburg, Russia

F11 NANOLITER DRIED SPOTS: A MEANS FOR QUICKER, MORE REPRODUCIBLE SAMPLE
PREPARATION AND ELEMENTAL ANALYSIS

T.C. Miller, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

F31 ELEMENTAL CORRELATIONS AND PHASE IDENTIFICATION USING X-RAY
FLUORESCENCE AND AUTOMATED SPECTRAL IMAGE ANALYSIS SOFTWARE

G.J. Havrilla, T. Miller, Los Alamos National Laboratory, Los Alamos, NM
M. Keenan, P. Kotula, Sandia National Laboratory, Albuquerque, NM

F14 XRF ANALYSIS FOR REFRACTORY SAMPLES BY FUSION BEAD METHOD IN VARIOUS
DILUTION RATIO WITH SYNTHETIC CALIBRATION STANDARDS AND DILUTION
RATIO’S CORRECTION

H. Inoue, S. Shoji, Y. Yamada, Rigaku Industrial Corporation, Osaka, Japan
J.E. Martin, Rigaku/MSC, The Woodlands, TX 

F16 IMPROVED DESCRIPTION OF X-RAY TUBE SPECTRA FOR FUNDAMENTAL PARAMETER
PROGRAMS

H. Ebel, J. Wernisch, W. Dietrich, A. Ghassemi, R. Svagera, M. Waas, Institut für
Festkörperphysik, Vienna University of Technology, Vienna, Austria

F17  A TUNABLE FOCUSING MONOCHROMATOR

H. Ebel, J. Wernisch, R. Dietersdorfer, R. Svagera, M. Waas, Institut für Festkörperphysik,
Vienna University of Technology, Vienna, Austria

F18 QUANTITATIVE TOTAL ELECTRON YIELD (TEY)

H. Ebel, Institut für Festkörperphysik, Vienna University of Technology, Vienna, Austria

F33 EXPERIMENTAL STUDY OF MODE STRUCTURE PECULIARITIES IN X-RAY BEAMS
FORMED BY PLANAR WAVEGUIDE-RESONATORS

V.K. Egorov, E.V. Egorov, IPMT RAS, Moscow, Russia

 
 

 
 

For more information please contact Denise Zulli - zulli@icdd.com