Friday Sessions

 
Friday a.m. (Evergreen A)
SESSION C-4 CEMENT ANALYSIS
Organized by: R. Yellepeddi, Thermo ARL, Ecublens, Switzerland
XRD & XRF
8:30 PROCESS AND QUALITY CONTROL IN THE CEMENT INDUSTRY USING X-RAY INSTRUMENTS: CHALLENGES AND SOLUTIONS—Invited

J. Hook, Lehigh Cement Company, Union Bridge, MD

9:00 D089 ADVANCES IN QUANTITATIVE XRD ANALYSIS FOR CLINKER, CEMENT (CEM I, CEM II, CEM III) AND CEMENTITIOUS ADDITIONS—Invited

G. Walenta, Lafarge Central Research Laboratories, France
T. Füllmann, Swiss Federal Institute of Technology, Lausanne, Switzerland

9:30 F48 NON-ROUTINE ANALYSIS IN CEMENT INDUSTRY: ENVIRONMENTAL CONTROL, ALTERNATIVE FUELS AND OTHER CENTRAL LAB APPLICATIONS USING STANDARD-LESS ANALYSIS PROGRAMS—Invited

A. Buman, R. Yellepeddi, Thermo ARL, Dearborn, MI

10:00 Break
10:20 D049 DEVELOPING AN ASTM STANDARD TEST FOR QUANTITATIVE X-RAY POWDER DIFFRACTION ANALYSIS OF PORTLAND CEMENTS AND CLINKER

P. Stutzman, National Institute of Standards & Technology, Gaithersburg, MD

10:40 D050 THE USE OF XRD PATTERNS TO EVALUATE THE COMPRESSIVE STRENGTH OF STABILIZED AGGREGATES

N.N. Khoury, M. Zaman, J.G. Laguros, University of Oklahoma, Norman, OK

11:00 F46 BEADS OR PRESSED PELLETS? WHY NOT USE BOTH!

J.-P. Gagnon, Corporation Scientifique Claisse, Inc., Sainte-Foy, Quebec, Canada
F. Slim, Ciment Quebec, Inc., St-Basile, Quebec, Canada

11:20 D008 EXTERNAL SULFATE ATTACK ON CEMENT EXAMINED BY SPATIALLY RESOLVED ENERGY DISPERSIVE SYNCHROTRON X-RAY DIFFRACTION AND COMPUTED MICROTOMOGRAPHY

A.P. Wilkinson, A.C. Jupe, K.E. Kurtis, N.N. Naik, Georgia Institute of Technology, Atlanta, GA
S.D. Shastri, P.L. Lee, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
S.R. Stock, Northwestern University, Chicago, IL

Friday a.m. (Evergreen B)
SESSION C-5 SOFTWARE (1.4 DAY)
Organized by: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
XRD & XRF
8:30 D104 INDEXING POWDER DIFFRACTION PATTERNS WITH THE DICHOTOMY METHOD, NEW DEVELOPMENTS

D. Louër, Université de Rennes I, Rennes cedex, France
A. Boultif, Université Mentouri de Constantine, Algeria

8:50 D117 FULLPAT: A FULL-PATTERN QUANTITATIVE ANALYSIS PROGRAM AND METHOD FOR X-RAY POWDER DIFFRACTION

S.J. Chipera, D.L. Bish, Los Alamos National Laboratory, Los Alamos, NM

9:10 D098 EVALUATING EXPERIMENTAL METHODS AND TECHNIQUES IN X-RAY DIFFRACTION USING 280,000 DATA SETS IN THE POWDER DIFFRACTION FILE

T.G. Fawcett, S. Kabekkodu, J. Faber, F. Needham, F. McClune, International
Centre for Diffraction Data, Newtown Square, PA

9:30 F39 DIRECTLY FROM EDX SPECTRUM TO CONCENTRATIONS—A NEW APPROACH TO STANDARDLESS ANALYSIS

K. Behrens, Bruker AXS GmbH, Karlsruhe, Germany
B. Burton, Bruker AXS, Inc., Madison, WI

9:50 C01 L SATELLITES IN X-RAY EMISSION SPECTRA OF ELEMENTS 41Nb, 45Rh, 47Ag AND 49In

S. Poonia, Central Arid Zone Research Institute, Rajasthan, India

Friday a.m. (Evergreen B)
SESSION C-6 PHARMACEUTICALS (1.4 DAY)
Organized by: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
XRD & XRF
10:30 D114 NEW APPLICATIONS OF XRD FOR R&D AND QUALITY CONTROL OF PHARMACEUTICAL COMPOUNDS—Invited

A. Kishi, T. Kubo, Rigaku Corporation, Tokyo, Japan

11:00 D135 USE OF X-RAY POWDER DIFFRACTOMETRY TO MONITOR PHASE TRANSITIONS DURING PROCESSING—Invited

R. Suryanarayanan, University of Minnesota, Minneapolis, MN

11:30 D063 PHARMACEUTICAL TABLET MAPPING USING PARALLEL BEAM X-RAY DIFFRACTION

S. Bates, C.H. Russell, Bede Scientific Incorporated, Englewood, CO
D.A. Engers, K.R. Morris, Purdue University, West Lafayette, IN

11:50  D127 STRUCTURE DETERMINATION OF TWO ORGANIC COMPOUNDS FROM LABORATORY X-RAY DATA COLLECTED WITH THE X’CELERATOR DETECTOR

C.A. Reiss, PANalytical, Almelo, The Netherlands
K. Goubitz, H. Schenk, University of Amsterdam, Amsterdam, The Netherlands

Friday a.m. (Evergreen C)
SESSION D-7 CATALYSIS
Organized by: C. Lowe-Ma, Ford Motor Research Labs, Dearborn, MI
Co-chairs: A.Z. Ringwelski, UOP LLC, Des Plaines, IL
A. Drews, Ford Motor Research Labs, Dearborn, MI
XRD
9:00 C14 COMBINATORIAL METHODS IN CATALYSIS RESEARCH: HIGH SPEED CHARACTERIZATION AND TESTING OF MATERIALS—Invited

A.Z. Ringwelski, M.J. Cohn, D.B. Galloway, R.D. Gillespie, UOP LLC,
Des Plaines, IL

9:30 C06  FINDING MATERIAL DESCRIPTORS IN X-RAY DATA OF CATALYSTS

C.K. Lowe-Ma, A.R. Drews, A.E. Chen, Ford Motor Company, Dearborn, MI
C. Gilmore, G. Barr, University of Glasgow, Scotland, United Kingdom

9:50 D091 CHARACTERIZATION OF A Ce/Zr MIXED OXIDE MATERIAL—A COMPARISON OF OFF-LINE AND IN-SITU HIGH TEMPERATURE REDUCTION TREATMENTS— Invited

S.D. Gotshall, D.J. Hetro, D.S. Roehner, P. Shady, Johnson Matthey Catalytic Systems Division—North America, Wayne, PA

10:20 Break
10:40 D004 STRUCTURE OF NANOPHASE CATALYSTS BY THE ATOMIC PAIR DISTRIBUTION FUNCTION TECHNIQUE

V. Petkov, Central Michigan University, Mt. Pleasant, MI

11:00 D124 STATIC AND DYNAMIC NANO-CHARACTERIZATION OF HETEROGENEOUS CATALYSTS—Invited

P.A. Crozier, Arizona State University, Tempe, AZ

Friday a.m. (Evergreen D)
SESSION F-4 PROBLEM SOLVING/INDUSTRIAL APPLICATIONS
Organized by: J. Anzelmo, Bruker AXS, Inc., Madison, WI
XRF
8:30 F12 APPLICATIONS OF XRF IN THE PLASTICS INDUSTRY—Invited

J.T. Henderson, GE Plastics, Mt. Vernon, IN
A. Seyfarth, Bruker AXS, Madison, WI

9:00  F29  MONITORING SOLDER BUMP COMPOSITION ON C4 FLIP CHIP PROCESS LINE FOR THE SEMICONDUCTOR PACKAGING INDUSTRY

T. He, InstroTek, Inc., Raleigh, NC

9:20 F08 USING WDXRF ANALYSIS TO DEVELOP A HIGH-TECH BUSINESS

D.L. Wertz, The University of Southern Mississippi, Hattiesburg, MS
C.D. Deaton, OMNI Instruments, Inc.

9:40 F21 ASSESSING AIR POLLUTION IN MUSEUMS AND CATHEDRALS: THE ROLE OF XRS

R. Van Grieken, L. Bencs, R. Godoi, V. Kontozova, Z. Spolnik, University of Antwerp, Antwerp, Belgium

10:00 F10 MEASURING SOME ENVIRONMENTALLY SENSITIVE ELEMENTS USING WAVELENGTH DISPERSIVE X-RAY SPECTROMETRY

D.L. Wertz, A. Winters, T. Craft, D. Patrick, The University of Southern
Mississippi, Hattiesburg, MS
R.A. Lemire, Mississippi Army National Guard, MS

10:20 Break
10:40 F30  CHARACTERIZATION OF A METAL ALLOY AND THIN FILM COATING USING ELEMENTAL IMAGING BY MICRO X-RAY FLUORESCENCE

G.J. Havrilla, T.C. Miller, Los Alamos National Laboratory, Los Alamos, NM
E. Doering, Rose-Hulman Institute of Technology, Terre Haute, IN

11:00 F40 OPTIMISED PROCEDURES FOR THE XRF ANALYSIS OF LUBRICANTS AND FUELS

A. Bühler, Bruker AXS GmbH, Karlsruhe, Germany

11:20 F42 ON-STREAM XRF ANALYSIS OF PPM CONCENTRATIONS OF HEAVY METALS IN MINERAL SLURRIES

G. Roach, J. Tickner, CSIRO Minerals, Sydney, Australia

 

For more information please contact Denise Zulli - zulli@icdd.com