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Friday Sessions
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Friday
a.m. (Evergreen A)
SESSION C-4 CEMENT ANALYSIS
Organized by: R. Yellepeddi, Thermo ARL, Ecublens, Switzerland
XRD & XRF |
| 8:30 |
|
PROCESS AND
QUALITY CONTROL IN THE CEMENT INDUSTRY USING X-RAY INSTRUMENTS: CHALLENGES
AND SOLUTIONS—Invited
J. Hook, Lehigh Cement Company, Union Bridge, MD |
|
9:00
|
D089 |
ADVANCES IN
QUANTITATIVE XRD ANALYSIS FOR CLINKER, CEMENT (CEM I, CEM II, CEM III) AND
CEMENTITIOUS ADDITIONS—Invited
G. Walenta, Lafarge Central Research
Laboratories, France
T. Füllmann, Swiss Federal Institute of Technology, Lausanne, Switzerland |
|
9:30
|
F48 |
NON-ROUTINE
ANALYSIS IN CEMENT INDUSTRY: ENVIRONMENTAL CONTROL, ALTERNATIVE FUELS AND
OTHER CENTRAL LAB APPLICATIONS USING STANDARD-LESS ANALYSIS PROGRAMS—Invited
A. Buman, R. Yellepeddi, Thermo ARL, Dearborn, MI |
|
10:00
|
Break |
|
|
10:20
|
D049 |
DEVELOPING
AN ASTM STANDARD TEST FOR QUANTITATIVE X-RAY POWDER DIFFRACTION ANALYSIS
OF PORTLAND CEMENTS AND CLINKER
P. Stutzman, National Institute of Standards
& Technology, Gaithersburg, MD |
|
10:40
|
D050 |
THE USE OF
XRD PATTERNS TO EVALUATE THE COMPRESSIVE STRENGTH OF STABILIZED AGGREGATES
N.N. Khoury, M. Zaman, J.G. Laguros, University
of Oklahoma, Norman, OK |
|
11:00
|
F46 |
BEADS OR
PRESSED PELLETS? WHY NOT USE BOTH!
J.-P. Gagnon, Corporation Scientifique Claisse,
Inc., Sainte-Foy, Quebec, Canada
F. Slim, Ciment Quebec, Inc., St-Basile, Quebec, Canada |
|
11:20
|
D008 |
EXTERNAL
SULFATE ATTACK ON CEMENT EXAMINED BY SPATIALLY RESOLVED ENERGY DISPERSIVE
SYNCHROTRON X-RAY DIFFRACTION AND COMPUTED MICROTOMOGRAPHY
A.P. Wilkinson, A.C. Jupe, K.E. Kurtis, N.N. Naik,
Georgia Institute of Technology, Atlanta, GA
S.D. Shastri, P.L. Lee, Advanced Photon Source, Argonne National
Laboratory, Argonne, IL
S.R. Stock, Northwestern University, Chicago, IL |
Friday
a.m. (Evergreen B)
SESSION C-5 SOFTWARE (1.4 DAY)
Organized by: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose,
CA
XRD & XRF |
| 8:30 |
D104 |
INDEXING
POWDER DIFFRACTION PATTERNS WITH THE DICHOTOMY METHOD, NEW DEVELOPMENTS
D. Louër, Université de Rennes I, Rennes cedex,
France
A. Boultif, Université Mentouri de Constantine, Algeria |
|
8:50
|
D117 |
FULLPAT: A
FULL-PATTERN QUANTITATIVE ANALYSIS PROGRAM AND METHOD FOR X-RAY POWDER
DIFFRACTION
S.J. Chipera, D.L. Bish, Los Alamos National
Laboratory, Los Alamos, NM |
|
9:10
|
D098 |
EVALUATING
EXPERIMENTAL METHODS AND TECHNIQUES IN X-RAY DIFFRACTION USING 280,000
DATA SETS IN THE POWDER DIFFRACTION FILE
T.G. Fawcett, S. Kabekkodu, J. Faber, F. Needham,
F. McClune, International
Centre for Diffraction Data, Newtown Square, PA |
|
9:30
|
F39 |
DIRECTLY
FROM EDX SPECTRUM TO CONCENTRATIONS—A NEW APPROACH TO STANDARDLESS
ANALYSIS
K. Behrens, Bruker AXS GmbH, Karlsruhe, Germany
B. Burton, Bruker AXS, Inc., Madison, WI |
|
9:50
|
C01 |
L SATELLITES IN X-RAY EMISSION SPECTRA OF
ELEMENTS 41Nb, 45Rh, 47Ag AND 49In
S. Poonia, Central Arid Zone Research Institute,
Rajasthan, India
|
Friday
a.m. (Evergreen B)
SESSION C-6 PHARMACEUTICALS (1.4 DAY)
Organized by: T.C. Huang, Emeritus, IBM Almaden Research Center, San Jose,
CA
XRD & XRF |
| 10:30 |
D114 |
NEW
APPLICATIONS OF XRD FOR R&D AND QUALITY CONTROL OF PHARMACEUTICAL
COMPOUNDS—Invited
A. Kishi, T. Kubo, Rigaku Corporation, Tokyo,
Japan |
| 11:00 |
D135 |
USE OF X-RAY
POWDER DIFFRACTOMETRY TO MONITOR PHASE TRANSITIONS DURING PROCESSING—Invited
R. Suryanarayanan, University of Minnesota,
Minneapolis, MN |
| 11:30 |
D063 |
PHARMACEUTICAL
TABLET MAPPING USING PARALLEL BEAM X-RAY DIFFRACTION
S. Bates, C.H. Russell, Bede Scientific
Incorporated, Englewood, CO
D.A. Engers, K.R. Morris, Purdue University, West Lafayette, IN |
| 11:50 |
D127 |
STRUCTURE
DETERMINATION OF TWO ORGANIC COMPOUNDS FROM LABORATORY X-RAY DATA
COLLECTED WITH THE X’CELERATOR DETECTOR
C.A. Reiss, PANalytical, Almelo, The Netherlands
K. Goubitz, H. Schenk, University of Amsterdam, Amsterdam, The Netherlands
|
Friday
a.m. (Evergreen C)
SESSION D-7 CATALYSIS
Organized by: C. Lowe-Ma, Ford Motor Research Labs, Dearborn, MI
Co-chairs: A.Z. Ringwelski, UOP LLC, Des Plaines, IL
A. Drews, Ford Motor Research Labs, Dearborn, MI
XRD |
| 9:00 |
C14 |
COMBINATORIAL
METHODS IN CATALYSIS RESEARCH: HIGH SPEED CHARACTERIZATION AND TESTING OF
MATERIALS—Invited
A.Z. Ringwelski, M.J. Cohn, D.B. Galloway, R.D.
Gillespie, UOP LLC,
Des Plaines, IL |
| 9:30 |
C06 |
FINDING
MATERIAL DESCRIPTORS IN X-RAY DATA OF CATALYSTS
C.K. Lowe-Ma, A.R. Drews, A.E. Chen, Ford Motor
Company, Dearborn, MI
C. Gilmore, G. Barr, University of Glasgow, Scotland, United Kingdom |
| 9:50 |
D091 |
CHARACTERIZATION
OF A Ce/Zr MIXED OXIDE MATERIAL—A COMPARISON OF OFF-LINE AND IN-SITU
HIGH TEMPERATURE REDUCTION TREATMENTS— Invited
S.D. Gotshall, D.J. Hetro, D.S. Roehner, P.
Shady, Johnson Matthey Catalytic Systems Division—North America, Wayne,
PA |
| 10:20 |
Break |
|
| 10:40 |
D004 |
STRUCTURE OF
NANOPHASE CATALYSTS BY THE ATOMIC PAIR DISTRIBUTION FUNCTION TECHNIQUE
V. Petkov, Central Michigan University, Mt.
Pleasant, MI |
| 11:00 |
D124 |
STATIC AND
DYNAMIC NANO-CHARACTERIZATION OF HETEROGENEOUS CATALYSTS—Invited
P.A. Crozier, Arizona State University, Tempe, AZ |
Friday
a.m. (Evergreen D)
SESSION F-4 PROBLEM SOLVING/INDUSTRIAL APPLICATIONS
Organized by: J. Anzelmo, Bruker AXS, Inc., Madison, WI
XRF |
| 8:30 |
F12 |
APPLICATIONS
OF XRF IN THE PLASTICS INDUSTRY—Invited
J.T. Henderson, GE Plastics, Mt. Vernon, IN
A. Seyfarth, Bruker AXS, Madison, WI |
| 9:00 |
F29 |
MONITORING
SOLDER BUMP COMPOSITION ON C4 FLIP CHIP PROCESS LINE FOR THE SEMICONDUCTOR
PACKAGING INDUSTRY
T. He, InstroTek, Inc., Raleigh, NC |
| 9:20 |
F08 |
USING WDXRF
ANALYSIS TO DEVELOP A HIGH-TECH BUSINESS
D.L. Wertz, The University of Southern
Mississippi, Hattiesburg, MS
C.D. Deaton, OMNI Instruments, Inc. |
| 9:40 |
F21 |
ASSESSING
AIR POLLUTION IN MUSEUMS AND CATHEDRALS: THE ROLE OF XRS
R. Van Grieken, L. Bencs, R. Godoi, V. Kontozova,
Z. Spolnik, University of Antwerp, Antwerp, Belgium |
| 10:00 |
F10 |
MEASURING
SOME ENVIRONMENTALLY SENSITIVE ELEMENTS USING WAVELENGTH DISPERSIVE X-RAY
SPECTROMETRY
D.L. Wertz, A. Winters, T. Craft, D. Patrick, The
University of Southern
Mississippi, Hattiesburg, MS
R.A. Lemire, Mississippi Army National Guard, MS |
| 10:20 |
Break |
|
| 10:40 |
F30 |
CHARACTERIZATION
OF A METAL ALLOY AND THIN FILM COATING USING ELEMENTAL IMAGING BY MICRO
X-RAY FLUORESCENCE
G.J. Havrilla, T.C. Miller, Los Alamos National
Laboratory, Los Alamos, NM
E. Doering, Rose-Hulman Institute of Technology, Terre Haute, IN |
| 11:00 |
F40 |
OPTIMISED
PROCEDURES FOR THE XRF ANALYSIS OF LUBRICANTS AND FUELS
A. Bühler, Bruker AXS GmbH, Karlsruhe, Germany |
| 11:20 |
F42 |
ON-STREAM
XRF ANALYSIS OF PPM CONCENTRATIONS OF HEAVY METALS IN MINERAL SLURRIES
G. Roach, J. Tickner, CSIRO Minerals, Sydney,
Australia
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For more
information please contact Denise Flaherty - flaherty@icdd.com
|
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