Wednesday Sessions

 
Wednesday p.m. (Evergreen A)
Session C-1 NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION
Organized by: V.E. Buhrke, Consultant, Portola Valley, CA
XRD & XRF
1:30 F49 CHARACTERIZATION TECHNIQUES FOR MINIATURE LOW-POWER X-RAY TUBES

D. Clark Turner, A. Reyes-Mena, M. Moras, C. Jensen, S.D. Liddiard, MOXTEK, Inc., Orem, UT

1:50 D039 RECENT DEVELOPMENTS OF CURVED GRADED MULTILAYERS AND MULTILAYER MONOCHROMATROR SYSTEMS FOR APPLICATION ON POINT AND LINE FOCUS X-RAY SOURCES

T. Holz, R. Dietsch, AXO DRESDEN GmbH, Heidenau, Germany
D. Weißbach, S. Braun, T. Böttger, Fraunhofer IWS, Dresden, Germany

2:10 D009 RETRACTABLE KNIFE-EDGE FOR XRD COMBINATORIAL SCREENING

B.B. He, F.F. Jin, B. Litteer, U. Preckwinkel, K.L. Smith, Bruker AXS, Madison, WI

2:30 D122 X-RAY DIFFRACTION STUDIES OF GRAIN NANOSTRUCTURES IN SINGLE TIN OXIDE NANOBELTS

Z. Cai, Y. Xiao, Argonne National Laboratory, Argonne, IL
Z. Wang, Georgia Institute of Technology, Atlanta, GA

2:50 D047 A HIGH-TEMPERATURE POWDER DIFFRACTION FURNACE II

M.D. Dolan, S. Zdzieszynski, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

3:10 Break
3:30 D080 X-RAY DIFFRACTION METROLOGY TOOL FOR MICROSTRUCTURE CONTROL ON 300MM WAFERS FOR SILICON BASED SEMICONDUCTORS

K.J. Kozaczek, P.R. Moran, D.S. Kurtz, R.I. Martin, L.Y. Huang, A. Stratilatov, HyperNex, Inc., State College, PA

3:50 D068 THREE-DIMENSIONAL X-RAY DIFFRACTION MICROSCOPY OF GRAIN BOUNDARIES

W. Liu, G.E. Ice, W. Yang, J.Z. Tischler, B.C. Larson, Oak Ridge National
Laboratory, Oak Ridge, TN

4:10 D031 FAST X-RAY MAPPING OF LARGE AREA SAMPLES

G. Vittiglio, P. Klinger, J. Heckel, D. Wissman, Spectro Analytical Instrument
GmbH & Co. KG, Kleve, Germany

4:30 D095 TOWARDS SYNCHROTRON-QUALITY X-RAY DIFFRACTION DATA WITH A LABORATORY INSTRUMENT

M.J. Fransen, PANalytical, Almelo, The Netherlands

4:50 F50  X-RAY COINCIDENCE SPECTROMETRY FOR QUANTITATIVE DETERMINATION OF BONE LEAD MEASUREMENT

W. Guo, R.P. Gardner, North Carolina State University, Raleigh, NC

Wednesday p.m. (Evergreen B)
SESSION D-1 RIETVELD APPLICATIONS
Organized by: J.A. Kaduk, BP Chemicals, Naperville, IL
XRD
1:30 D110 COMBINING MULTIPLE OBSERVATIONS FOR POWDER DIFFRACTION CRYSTALLOGRAPHY—Invited

B.H. Toby, National Institute of Standards & Technology, Gaithersburg, MD

2:00 D108 SMART CRYSTALLOGRAPHIC IMAGING FOR CHEMICAL ENGINEERING BY MEM/RIETVELD METHOD—Invited

M.Takata, Nagoya University, Nagoya, Japan and JASRI, Hyougo, Japan
M.Sakata, Nagoya University, Nagoya, Japan

2:30 D007 SOLVING NEIGHBORING ELEMENT PROBLEMS IN TYPE-I CLATHRATES USING RESONANT DIFFRACTION: SUCCESSES AND PROBLEMS—Invited

A.P. Wilkinson, Georgia Institute of Technology, Atlanta, GA
Y. Zhang, P.L. Lee, Argonne National Laboratory, Argonne, IL
G.S. Nolas, University of South Florida, Tampa, FL

3:00 D069 REVEALING STRUCTURAL CHANGE BY THE TEMPERATURE DEPENDENCE OF ATOMIC DISPLACEMENT PARAMETERS—Invited

B.C. Chakoumakos, Oak Ridge National Laboratory, Oak Ridge, TN

3:30 Break
3:50 D120 STRUCTURE-PROPERTY RELATIONSHIPS OF SUPERCONDUCTING AND HEAVY FERMION INTERMETALLICS—Invited

J. Chan, Louisiana State University, Baton Rouge, LA

4:20 D045 RESIDUAL STRAIN DETERMINATION BY RIETVELD REFINEMENT OF TOF NEUTRON-DIFFRACTION MEASUREMENTS ON DEFORMED URANIUM

D. Balzar, G. Stefanic, University of Denver, Denver, CO
S. Vogel, D. Brown, M. Bourke, B. Clausen, Los Alamos National Laboratory, Los Alamos, NM 
N.C. Popa, Joint Institute for Nuclear Research, Dubna, Russia

4:40 D036 COMBINED X-RAY AND NEUTRON DIFFRACTION RIETVELD REFINEMENTS OF THREE-LAYER AURIVILLIUS CERAMICS

M.S. Haluska, S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY

5:00 D040 ROUTINE TEXTURE ANALYSIS OF NEUTRON TOF DATA USING THE RIETVELD METHOD

S. Vogel, R.B. Von Dreele, Los Alamos National Laboratory, Los Alamos, NM
L. Lutterotti, H.-R. Wenk, University of California at Berkeley, Berkeley, CA

Wednesday p.m. (Evergreen C)
SESSION D-2 HIGH RESOLUTION
Organized by: B. Tanner, University of Durham, Durham, United Kingdom
XRD
1:30 D136 X-RAY SCATTERING FOR SEMICONDUCTOR HETEROSTRUCTURE ANALYSIS— Invited

M. Goorsky, UCLA, Los Angeles, CA

2:00 FROM THE LAB TO THE FAB: AUTOMATED HIGH-RESOLUTION X-RAY METROLOGY FOR THE SILICON SEMICONDUCTOR INDUSTRY—Invited

M. Wormington, Bede Scientific, Inc., Denver, CO

2:30 D012 INVESTIGATION OF THE MESOSCOPIC INTERFACE STRUCTURE OF THIN FILMS WITH DIFFUSE X-RAY SCATTERING

J. Stümpel, I. Busch, Physikalisch-Technische Bundesanstalt, Braunschweig,
Germany

2:50 D092  STRUCTURAL CHARACTERIZATION OF SiGe AND SiGe:C HETEROSTRUCTURES USING A COMBINATION OF X-RAY METHODS

J.F. Woitok, PANalytical B.V., Almelo, The Netherlands

3:10 Break
3:40 D121 STRUCTURE INVESTIGATIONS OF THIN FILMS AND LATERAL NANOSTRUCTURES

BY MEANS OF X-RAY GRAZING INCIDENCE DIFFRACTION—Invited
J. Grenzer, U. Pietsch, University of Potsdam, Potsdam, Germany

4:10 D086 HIGH-RESOLUTION GRAZING INCIDENCE IN-PLANE DIFFRACTION IN THE LABORATORY

B.K. Tanner, T.P.A. Hase, University of Durham, Durham, United Kingdom
T.A. Lafford, Bede Scientific Instruments Ltd., Durham, United Kingdom
M.S. Goorsky, UCLA, Los Angeles, CA

4:30 D041 HIGH RESOLUTION X-RAY DIFFRACTION STUDIES OF EPITAXIALLY GROWN GaN/SiC(0001)—GROWTH CONDITIONS, DEFECT DENSITY AND STRESS

N. Faleev, H. Temkin, I. Ahmad, M. Holtz, Texas Tech University, Lubbock, TX
Yu. Melnik, TDI, Inc., Gaithersburg, MD

Wednesday p.m. (Evergreen D)
SESSION F-1 SYNCHROTRON APPLICATIONS
Organized by: K.W. Jones, Brookhaven National Laboratory, Upton, NY
XRF
2:00 F47 PERFORMANCE AND APPLICATION OF MIRROR-BASED X-RAY FLUORESCENCE MICROPROBES AT THE ADVANCED PHOTON SOURCE AND THE NATIONAL SYNCHROTRON LIGHT SOURCE—Invited

S.R. Sutton, M. Newville, P. Eng, M. Rivers, A. Lanzirotti, University of Chicago, Chicago, IL

2:30 F13  APPLICATION OF FLUORESCENT MICROTOMOGRAPHY AND OTHER X-RAY FLUORESCENCE TECHNIQUES—Invited

A. Simionovici, ENS—Lyon, Lyon, France and European Synchrotron Radiation Facility, Grenoble, France
B. Golosio, A. Somogyi, European Synchrotron Radiation Facility, Grenoble, France
L. Lemelle, ENS—Lyon, Lyon, France

3:00 Break
3:30 F52 CHARACTERIZATION OF METALLOPROTEIN METAL SITES: HIGH THROUGHPUT APPROACHES TO BIOLOGICAL X-RAY ABSORPTION SPECTROSCOPY— Invited

J.E. Penner-Hahn, C.P. McClure, T.C. Weng, S. Haldar, The University of Michigan, Ann Arbor, MI

4:00  C03 OBSERVATION OF ATOMIC ARRANGEMENTS IN Si1-xGex CRYSTALS BY X-RAY FLUORESCENCE HOLOGRAPHY

K. Hayashi, Y. Takahashi, E. Matsubara, I. Yonenaga, Tohoku University, Sendai, Japan

4:20 F35 VARIATION OF Pb AND Ca CONCENTRATION IN COMPACT AND SPONGY BONE DETERMINED BY SR-XRF AT HASYLAB, BEAMLINE L

P. Wobrauschek, N. Zöger, G. Pepponi, C. Streli, Atominstitut der Österreichischen Universitäten, Wien, Austria
G. Falkenberg, HASYLAB, Hamburg, Germany
W. Osterode, Universitätsklinik für Innere Medizin IV, Wien, Austria

4:40 D119  FROM BASIC SCIENCE TO NEW FLAT PANEL DISPLAYS: SOLVING THE LC-ALIGNMENT PUZZLE USING NEXAFS SPECTROSCOPY—Invited

J. Lüning, Stanford Synchrotron Radiation Laboratory, Menlo Park, CA

 

 

 

 

 

 

For more information please contact Denise Zulli - zulli@icdd.com