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Wednesday Sessions
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Wednesday p.m. (Evergreen A)
Session C-1 NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION
Organized by: V.E. Buhrke, Consultant, Portola Valley, CA
XRD & XRF |
| 1:30 |
F49 |
CHARACTERIZATION
TECHNIQUES FOR MINIATURE LOW-POWER X-RAY TUBES
D. Clark Turner, A. Reyes-Mena, M. Moras, C. Jensen, S.D. Liddiard, MOXTEK,
Inc., Orem, UT |
|
1:50 |
D039 |
RECENT DEVELOPMENTS OF CURVED GRADED MULTILAYERS AND
MULTILAYER MONOCHROMATROR SYSTEMS FOR APPLICATION ON POINT AND LINE FOCUS X-RAY SOURCES
T. Holz, R. Dietsch, AXO DRESDEN GmbH, Heidenau, Germany
D. Weißbach, S. Braun, T. Böttger, Fraunhofer IWS, Dresden, Germany |
|
2:10 |
D009 |
RETRACTABLE KNIFE-EDGE FOR XRD COMBINATORIAL SCREENING
B.B. He, F.F. Jin, B. Litteer, U. Preckwinkel, K.L. Smith, Bruker AXS,
Madison, WI |
|
2:30 |
D122 |
X-RAY DIFFRACTION STUDIES OF GRAIN NANOSTRUCTURES IN SINGLE TIN
OXIDE NANOBELTS
Z. Cai, Y. Xiao, Argonne National Laboratory, Argonne, IL
Z. Wang, Georgia Institute of Technology, Atlanta, GA |
|
2:50 |
D047 |
A HIGH-TEMPERATURE POWDER DIFFRACTION FURNACE II
M.D. Dolan, S. Zdzieszynski, S.T. Misture, NYS College of Ceramics at
Alfred University, Alfred, NY |
|
3:10 |
Break |
|
|
3:30 |
D080 |
X-RAY DIFFRACTION METROLOGY TOOL FOR MICROSTRUCTURE CONTROL
ON 300MM WAFERS FOR SILICON BASED SEMICONDUCTORS
K.J. Kozaczek, P.R. Moran, D.S. Kurtz, R.I. Martin, L.Y. Huang, A.
Stratilatov, HyperNex, Inc., State College, PA |
|
3:50 |
D068 |
THREE-DIMENSIONAL X-RAY DIFFRACTION MICROSCOPY OF GRAIN
BOUNDARIES
W. Liu, G.E. Ice, W. Yang, J.Z. Tischler, B.C. Larson, Oak Ridge National
Laboratory, Oak Ridge, TN |
|
4:10 |
D031 |
FAST X-RAY MAPPING OF LARGE AREA SAMPLES
G. Vittiglio, P. Klinger, J. Heckel, D. Wissman, Spectro Analytical
Instrument
GmbH & Co. KG, Kleve, Germany |
|
4:30 |
D095 |
TOWARDS SYNCHROTRON-QUALITY X-RAY DIFFRACTION DATA WITH A
LABORATORY INSTRUMENT
M.J. Fransen, PANalytical, Almelo, The Netherlands |
|
4:50 |
F50 |
X-RAY COINCIDENCE SPECTROMETRY FOR QUANTITATIVE DETERMINATION
OF BONE LEAD MEASUREMENT
W. Guo, R.P. Gardner, North Carolina State University, Raleigh, NC
|
Wednesday p.m.
(Evergreen B)
SESSION D-1 RIETVELD APPLICATIONS
Organized by: J.A. Kaduk, BP Chemicals, Naperville, IL
XRD |
| 1:30 |
D110 |
COMBINING MULTIPLE
OBSERVATIONS FOR POWDER DIFFRACTION CRYSTALLOGRAPHY—Invited
B.H. Toby, National Institute of Standards & Technology, Gaithersburg,
MD |
|
2:00 |
D108 |
SMART CRYSTALLOGRAPHIC IMAGING FOR CHEMICAL ENGINEERING BY
MEM/RIETVELD METHOD—Invited
M.Takata, Nagoya University, Nagoya, Japan and
JASRI, Hyougo, Japan
M.Sakata, Nagoya University, Nagoya, Japan |
|
2:30 |
D007 |
SOLVING NEIGHBORING ELEMENT PROBLEMS IN TYPE-I CLATHRATES USING
RESONANT DIFFRACTION: SUCCESSES AND PROBLEMS—Invited
A.P. Wilkinson, Georgia Institute of Technology, Atlanta, GA
Y. Zhang, P.L. Lee, Argonne National Laboratory, Argonne, IL
G.S. Nolas, University of South Florida, Tampa, FL |
|
3:00 |
D069 |
REVEALING STRUCTURAL CHANGE BY THE TEMPERATURE DEPENDENCE OF
ATOMIC DISPLACEMENT PARAMETERS—Invited
B.C. Chakoumakos, Oak Ridge National Laboratory, Oak Ridge, TN |
|
3:30 |
Break |
|
|
3:50 |
D120 |
STRUCTURE-PROPERTY RELATIONSHIPS OF
SUPERCONDUCTING AND HEAVY FERMION INTERMETALLICS—Invited
J. Chan, Louisiana State University, Baton Rouge, LA |
|
4:20 |
D045 |
RESIDUAL STRAIN DETERMINATION BY RIETVELD REFINEMENT OF TOF
NEUTRON-DIFFRACTION MEASUREMENTS ON DEFORMED URANIUM
D. Balzar, G. Stefanic, University of Denver, Denver, CO
S. Vogel, D. Brown, M. Bourke, B. Clausen, Los Alamos National Laboratory,
Los Alamos, NM
N.C. Popa, Joint Institute for Nuclear Research, Dubna, Russia |
|
4:40 |
D036 |
COMBINED X-RAY AND NEUTRON DIFFRACTION RIETVELD REFINEMENTS OF
THREE-LAYER AURIVILLIUS CERAMICS
M.S. Haluska, S.T. Misture, NYS College of Ceramics at Alfred University,
Alfred, NY |
|
5:00 |
D040 |
ROUTINE TEXTURE ANALYSIS OF NEUTRON TOF DATA USING THE RIETVELD
METHOD
S. Vogel, R.B. Von Dreele, Los Alamos National Laboratory, Los Alamos, NM
L. Lutterotti, H.-R. Wenk, University of California at Berkeley, Berkeley,
CA
|
Wednesday
p.m. (Evergreen C)
SESSION D-2 HIGH RESOLUTION
Organized by: B. Tanner, University of Durham, Durham, United Kingdom
XRD |
| 1:30 |
D136 |
X-RAY
SCATTERING FOR SEMICONDUCTOR HETEROSTRUCTURE ANALYSIS— Invited
M. Goorsky, UCLA, Los Angeles, CA |
| 2:00 |
|
FROM THE LAB
TO THE FAB: AUTOMATED HIGH-RESOLUTION X-RAY METROLOGY FOR THE SILICON
SEMICONDUCTOR INDUSTRY—Invited
M. Wormington, Bede Scientific, Inc., Denver, CO |
| 2:30 |
D012 |
INVESTIGATION
OF THE MESOSCOPIC INTERFACE STRUCTURE OF THIN FILMS WITH DIFFUSE X-RAY
SCATTERING
J. Stümpel, I. Busch, Physikalisch-Technische
Bundesanstalt, Braunschweig,
Germany |
| 2:50 |
D092 |
STRUCTURAL
CHARACTERIZATION OF SiGe AND SiGe:C HETEROSTRUCTURES USING A COMBINATION
OF X-RAY METHODS
J.F. Woitok, PANalytical B.V., Almelo, The
Netherlands |
| 3:10 |
Break |
|
| 3:40 |
D121 |
STRUCTURE
INVESTIGATIONS OF THIN FILMS AND LATERAL NANOSTRUCTURES
BY MEANS OF X-RAY GRAZING INCIDENCE DIFFRACTION—Invited
J. Grenzer, U. Pietsch, University of Potsdam, Potsdam, Germany |
| 4:10 |
D086 |
HIGH-RESOLUTION
GRAZING INCIDENCE IN-PLANE DIFFRACTION IN THE LABORATORY
B.K. Tanner, T.P.A. Hase, University of Durham,
Durham, United Kingdom
T.A. Lafford, Bede Scientific Instruments Ltd., Durham, United Kingdom
M.S. Goorsky, UCLA, Los Angeles, CA |
| 4:30 |
D041 |
HIGH
RESOLUTION X-RAY DIFFRACTION STUDIES OF EPITAXIALLY GROWN GaN/SiC(0001)—GROWTH
CONDITIONS, DEFECT DENSITY AND STRESS
N. Faleev, H. Temkin, I. Ahmad, M. Holtz, Texas
Tech University, Lubbock, TX
Yu. Melnik, TDI, Inc., Gaithersburg, MD |
Wednesday
p.m. (Evergreen D)
SESSION F-1 SYNCHROTRON APPLICATIONS
Organized by: K.W. Jones, Brookhaven National Laboratory, Upton, NY
XRF |
| 2:00 |
F47 |
PERFORMANCE
AND APPLICATION OF MIRROR-BASED X-RAY FLUORESCENCE MICROPROBES AT THE
ADVANCED PHOTON SOURCE AND THE NATIONAL SYNCHROTRON LIGHT SOURCE—Invited
S.R. Sutton, M. Newville, P. Eng, M. Rivers, A.
Lanzirotti, University of Chicago, Chicago, IL |
| 2:30 |
F13 |
APPLICATION
OF FLUORESCENT MICROTOMOGRAPHY AND OTHER X-RAY FLUORESCENCE TECHNIQUES—Invited
A. Simionovici, ENS—Lyon, Lyon, France and
European Synchrotron Radiation Facility, Grenoble, France
B. Golosio, A. Somogyi, European Synchrotron Radiation Facility, Grenoble,
France
L. Lemelle, ENS—Lyon, Lyon, France |
| 3:00 |
Break |
|
| 3:30 |
F52 |
CHARACTERIZATION
OF METALLOPROTEIN METAL SITES: HIGH THROUGHPUT APPROACHES TO BIOLOGICAL
X-RAY ABSORPTION SPECTROSCOPY— Invited
J.E. Penner-Hahn, C.P. McClure, T.C. Weng, S.
Haldar, The University of Michigan, Ann Arbor, MI |
| 4:00 |
C03 |
OBSERVATION
OF ATOMIC ARRANGEMENTS IN Si1-xGex CRYSTALS BY X-RAY FLUORESCENCE
HOLOGRAPHY
K. Hayashi, Y. Takahashi, E. Matsubara, I.
Yonenaga, Tohoku University, Sendai, Japan |
| 4:20 |
F35 |
VARIATION OF
Pb AND Ca CONCENTRATION IN COMPACT AND SPONGY BONE DETERMINED BY SR-XRF
AT HASYLAB, BEAMLINE L
P. Wobrauschek, N. Zöger, G. Pepponi, C. Streli,
Atominstitut der Österreichischen Universitäten, Wien, Austria
G. Falkenberg, HASYLAB, Hamburg, Germany
W. Osterode, Universitätsklinik für Innere Medizin IV, Wien, Austria |
| 4:40 |
D119 |
FROM BASIC
SCIENCE TO NEW FLAT PANEL DISPLAYS: SOLVING THE LC-ALIGNMENT PUZZLE USING
NEXAFS SPECTROSCOPY—Invited
J. Lüning, Stanford Synchrotron Radiation
Laboratory, Menlo Park, CA |
For more
information please contact Denise Flaherty - flaherty@icdd.com
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