The 54th Annual Denver X-ray Conference will be held 1-5 August in Colorado Springs, CO, at the Sheraton Colorado Springs.

Attendees to the World's largest X-ray conference will have access to sessions on the latest advancements in XRD and XRF. Workshops are run by experts who provide TRAINING and EDUCATION on many PRACTICAL APPLICATIONS of X-ray fluorescence and X-ray diffraction techniques for the study of materials. Designed to help attendees (with little or many years of experience), our workshops will solve some of their most difficult problems. As an added benefit, these experts will be available to answer questions and offer suggestions.

DXC 2005 Summary - new!

DXC 2005 Program (PDF)

Schedule

See Call for Papers (PDF Format)

Submit Abstract for DXC 2005 online

Guidelines for Preparing Abstracts

Conference Preregistration Fees

Hotel Information - Make your hotel reservation online

Contributed Papers

View list of the Abstracts

Search the Abstracts

Visa Application Notice

Have an idea for a workshop or session?

Exhibits

Jerome B. Cohen Student Award

Conference Proceedings

2005 Denver X-ray Conference Organizing Committee

Denver X-ray Conference Presentation Guidelines

Exhibit Information - floorplan

The 2005 Denver X-ray Conference would like to thank the following sponsors:

Conference Preregistration Fees*
Full week: exhibits, workshops, sessions† $400
Monday & Tuesday: exhibits, workshops† $350
Wednesday, Thursday & Friday: exhibits, sessions† $350
Session organizers, invited speakers & workshop instructors† $100
Students, unemployed X-ray people, and persons 65 and older:
exhibits, workshops, sessions
$75
*Preregistration fees will only be valid until 5 July 2005. Registration fees will increase after 5 July 2005.
† Includes a copy of Volume 49 of Advances in X-ray Analysis on CD-ROM.

Contributed Papers
Abstracts are hereby solicited for oral presentation in any of the special sessions previously listed, or the XRD and XRF poster sessions. Not all contributed abstracts submitted for oral presentation will be placed in a special session, but rather, will default to poster presentation. Poster sessions will be held on Monday, Tuesday & Wednesday evening of conference week, in conjunction with the evening receptions. Abstracts of more general interest will be placed in oral sessions. The Organizing Committee considers the withdrawal of an abstract after it has been accepted and advertised as highly nonprofessional (except in special circumstances). Please try to secure travel funding and approvals before submitting your abstract.

Visa Application Notice
Obtaining a Visa is the sole responsibility of the attendee. The Denver X-ray Conference is not permitted to mediate with either the U.S. Embassy abroad or with the State Department on behalf of any conference attendee. However, if you need an invitation letter to the conference to submit with your application, please e-mail your request to: zulli@icdd.com. Please include your name, mailing address, fax number, and the title(s) of any abstract(s) that you have submitted for the conference. A copy of the letter will be faxed and airmailed to you.

Have an idea for a workshop or session?
Visit: the DXC Suggestion Form Page

Exhibits
Vendors—don’t miss this opportunity to display your company’s products and services to this elite crowd of scientists.
Applications for exhibit space will be available on 1 March 2005. Contact Denise Zulli: zulli@icdd.com,
610.325.9814, to add your name to the mailing list.

Jerome B. Cohen Student Award
This award, instituted in the memory of Professor Jerome B. Cohen, one of the leaders in the field of X-ray analysis and in the training of students in this art, is intended to recognize the outstanding achievements of student research in this field. All students, graduate or undergraduate, who are working in any aspect of X-ray analysis, can submit their work. The research must be original, of high quality and must be primarily the work of the student. The papers submitted for this competition must be received in electronic form by 1 July 2005 in final publication form. The winner will be selected by a committee of researchers in the field, announced at the Plenary Session of the conference and listed in the proceedings. The award for the year 2005 will be in the amount of $1,000. Students interested in participating in this year’s competition must submit their papers and a certification form to dxc@icdd.com by the due date. More Cohen Award information and the certification form .

Conference Proceedings
Don’t miss this opportunity to showcase your research by submitting your presented paper in the conference proceedings, Advances in X-ray Analysis. Select papers will also be published in Powder Diffraction. Advances in X-ray Analysis is distributed throughout the world, and the complete manuscripts of past volumes can also be viewed on the ICDD website. In the interest of releasing the conference proceedings, Advances in X-ray Analysis, as early as possible after the conclusion of the conference, we are encouraging authors to submit their manuscripts for publication during the conference at the conference registration desk. If you are unable to bring your manuscript with you at that time, please mail it no later than 3 September 2005 to:
Denise Zulli
ICDD
12 Campus Boulevard
Newtown Square, PA 19073-3273 U.S.A.

Note: To be acceptable for publication, papers should describe either new methods, theory and applications, improvements in methods or instrumentation, or other advances in the state of the art. Papers emphasizing commercial aspects are discouraged. Information for preparing manuscripts will be mailed after abstracts have been received.

2005 Denver X-ray Conference Organizing Committee
John Anzelmo Anzelmo & Associates, Inc. , Madison, WI
Randolph Barton, Jr. Emeritus - DuPont Experimental Station, Wilmington, DE
Victor E. Buhrke Chair, Consultant - The Buhrke Company, Portola Valley, CA
W. Tim Elam EDAX/University of Washington , Redmond , WA
John V. Gilfrich Emeritus, SFA Inc,/NRL, Washington, DC 
George Havrilla Los Alamos National Lab, Los Alamos, NM
Ting C. Huang Emeritus, IBM, San Jose, CA
James A. Kaduk BP Amoco Chemicals, Naperville, IL
Terry Maguire Conference Administrator, ICDD, Newtown Square, PA
Scott Misture NYS College of Ceramics at Alfred University, Alfred, NY
I. Cev Noyan Columbia University , New York , NY
Robert L. Snyder Georgia Institute of Technology, Atlanta, GA
Mary Ann Zaitz IBM Microelectronics, Hopewell Junction, NY

For more information please contact Denise Zulli - zulli@icdd.com

 

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