Conference Preregistration Fees*
|Full week: exhibits, workshops, sessions†
|Monday & Tuesday: exhibits, workshops†
|Wednesday, Thursday & Friday: exhibits, sessions†
|Session organizers, invited speakers & workshop instructors†
|Students, unemployed X-ray people, and persons 65 and older:
exhibits, workshops, sessions
|*Preregistration fees will only be valid until 5 July 2005.
will increase after 5 July 2005.
|† Includes a copy of Volume 49 of Advances
in X-ray Analysis on
Abstracts are hereby solicited for oral presentation in any of the special
sessions previously listed, or the XRD and XRF
poster sessions. Not all contributed abstracts submitted for oral presentation
will be placed in a special session, but
rather, will default to poster presentation. Poster sessions will be held
on Monday, Tuesday & Wednesday evening of conference
week, in conjunction with the evening receptions. Abstracts of more general
interest will be placed in oral sessions.
The Organizing Committee considers the withdrawal of an abstract after
it has been accepted and advertised as
highly nonprofessional (except in special circumstances). Please try to
secure travel funding and approvals before submitting
Visa Application Notice
Obtaining a Visa is the sole responsibility of the attendee. The Denver X-ray
Conference is not permitted to mediate with
either the U.S. Embassy abroad or with the State Department on behalf of
any conference attendee. However, if you need
an invitation letter to the conference to submit with your application, please
e-mail your request to: email@example.com.
Please include your name, mailing address, fax number, and the title(s) of
any abstract(s) that you have submitted for
the conference. A copy of the letter will be faxed and airmailed to you.
Have an idea for a workshop or session?
Visit: the DXC Suggestion Form Page
Vendors—don’t miss this opportunity to display your company’s
products and services to this elite crowd of scientists.
Applications for exhibit space will be available on 1
March 2005. Contact
Denise Zulli: firstname.lastname@example.org,
610.325.9814, to add your name to the mailing list.
Jerome B. Cohen Student Award
This award, instituted in the memory of Professor Jerome B. Cohen, one of the
leaders in the field of X-ray analysis and
in the training of students in this art, is intended to recognize the outstanding
achievements of student research in this
field. All students, graduate or undergraduate, who are working in any aspect
of X-ray analysis, can submit their work.
The research must be original, of high quality and must be primarily the work
of the student.
The papers submitted for this competition must be received in electronic form
by 1 July 2005 in final publication form.
The winner will be selected by a committee of researchers in the field, announced
at the Plenary Session of the conference
and listed in the proceedings. The award for the year 2005 will be in the amount
Students interested in participating in this year’s competition must
submit their papers and a certification form to
email@example.com by the due date.
More Cohen Award information and the certification form .
Don’t miss this opportunity to showcase your research by submitting
your presented paper in the conference proceedings, Advances in X-ray
Analysis. Select papers will also be published in Powder
Diffraction. Advances in X-ray Analysis is distributed throughout the world, and the
complete manuscripts of past volumes can also be viewed on the ICDD website. In the interest of releasing
the conference proceedings, Advances
in X-ray Analysis, as early as possible after the conclusion of the conference,
we are encouraging authors to submit their
manuscripts for publication during the conference at the conference registration
desk. If you are unable to bring your
manuscript with you at that time, please mail it no later than 3
September 2005 to:
12 Campus Boulevard
Newtown Square, PA 19073-3273 U.S.A.
Note: To be acceptable for publication, papers should describe
either new methods, theory and applications, improvements
in methods or instrumentation, or other advances in the state of the art.
Papers emphasizing commercial
aspects are discouraged. Information for preparing manuscripts will be
mailed after abstracts have been received.
2005 Denver X-ray Conference Organizing Committee
||Anzelmo & Associates, Inc. , Madison, WI
|Randolph Barton, Jr.
|| Emeritus - DuPont Experimental Station, Wilmington, DE
|Victor E. Buhrke
||Chair, Consultant - The Buhrke Company, Portola Valley, CA
|W. Tim Elam
|| EDAX/University of Washington , Redmond , WA
|John V. Gilfrich
||Emeritus, SFA Inc,/NRL, Washington, DC
||Los Alamos National Lab, Los Alamos, NM
|Ting C. Huang
||Emeritus, IBM, San Jose, CA
|James A. Kaduk
||BP Amoco Chemicals, Naperville, IL
|| Conference Administrator, ICDD, Newtown Square, PA
||NYS College of Ceramics at Alfred University, Alfred, NY
|I. Cev Noyan
|| Columbia University , New York , NY
|Robert L. Snyder
||Georgia Institute of Technology, Atlanta, GA
|Mary Ann Zaitz
||IBM Microelectronics, Hopewell Junction, NY
For more information please contact Denise Zulli - firstname.lastname@example.org