186 of 2006 DXC abstracts sorted by correspondent author's last name

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BEYOND THE LIMITS – EXPANDING THE ANALYTICAL PERFORMANCE OF WDXRF WITH NOVEL DEVELOPMENTS
L. Arias*, A. Larsen, K. Behrens, L. Arias*, A. Larsen, K. Behrens
INVESTIGATION OF NANO-SCALE DEFORMATION MECHANISMS IN METALLIC MULTILAYERS BY IN-SITU SYNCHROTRON X-RAY DIFFRACTION
C.C. Aydiner, D.W. Brown, S. Vogel, Y.C. Wang, A. Misra, C.C. Aydiner, D.W. Brown, S. Vogel, Y.C. Wang, A. Misra
J. Almer, J. Almer
X-RAY DIFFRACTION MEASUREMENT FOR CHARACTERIZATION OF ENERGETIC MATERIALS
Bartlomiej J Benedikt, Bartlomiej J Benedikt
Mathew W Lewis, Mathew W Lewis
Partha Rangaswamy, Partha Rangaswamy
MICRO X-RAY POWDER DIFFRACTION. AB-INITIO STRUCTURE DETERMINATION FROM MICROGRAM SAMPLES
Nattamai Bhuvanesh, Nattamai Bhuvanesh
Joseph Reibenspies, Joseph Reibenspies
AN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN PHOTOTHERMOGRAPHIC FILMS
T.N. Blanton, T.N. Blanton
D.R. Whitcomb, D.R. Whitcomb
S.T. Misture, S.T. Misture
MEDICAL APPLICATIONS OF X-RAY FLUORESCENCE: A STATUS REPORT RELATED TO TRACE ELEMENT RESEARCH
J. Börjesson, J. Börjesson
S. Matsson, S. Matsson
ARRAYS OF LARGE-AREA SLICON DRIFT DETECTORS FOR ADVANCED ANALYTICAL TECHNIQUES
O. Boslau, A. Pahlke, S. Pahlke, J. Kemmer, F. Wiest, T. Eggert, R. Stoetter, P. Goldstrass, O. Boslau, A. Pahlke, S. Pahlke, J. Kemmer, F. Wiest, T. Eggert, R. Stoetter, P. Goldstrass
M. Mikhailov, M. Mikhailov
THE RATIO OF LINES INTENSITIES AS AN ANALYTICAL PARAMETER IN XRF.
I.A.Brytov,R.I.PlotnikovI, I.A.Brytov,R.I.PlotnikovI
S.L.Dudik,B.D.Kalinin, S.L.Dudik,B.D.Kalinin
NEW DEVELOPMENTS IN X-RAY TECHNOLOGY FROM THERMO ELECTRON
A. Buman, S. Pomerantz, R. Yellepeddy, A. Buman, S. Pomerantz, R. Yellepeddy
OPTIMIZED PROCEDURES FOR TRACE ANALYSIS IN LIQUID OR LOOSE POWDER SAMPLES OF LIGHT MATRICES
Bob Burton, Larry Arias, Daniel Pecard, Bob Burton, Larry Arias, Daniel Pecard
SIMULTANEOUS PIXE AND XRF: PROCESSING THE SPECTRA FROM THE MARS EXPLORATION ROVERS
J.L. Campbell, C.L. Mallett, J.M. O’Meara, J.A. Maxwell, J.L. Campbell, C.L. Mallett, J.M. O’Meara, J.A. Maxwell
AT-LINE BIOSENSOR PRODUCTION MONITORING USING XRF SPECTROMETRY
S.E. Carpenter, T.A. Rey, H.G. Spradlin, S.E. Carpenter, T.A. Rey, H.G. Spradlin
X-RAY DIFFRACTION STUDIES OF ALIGNED ZnO NANOBELTS
I. Dragomir-Cernatescu, J.P. Nicolich, I. Dragomir-Cernatescu, J.P. Nicolich
R. Yang, Z.L. Wang, R.L. Snyder, R. Yang, Z.L. Wang, R.L. Snyder
Neutron and Synchrotron Structure Evaluation of Li3N during Hydriding and dehydriding
Wen-Ming Chien, Wen-Ming Chien
Dhanesh Chandra, Dhanesh Chandra
Ashfia Huq, Ashfia Huq
James Richardson Jr and Evan Maxey2, , , James Richardson Jr and Evan Maxey2, ,
Martin Kunz3, Martin Kunz3
Sirine Fakra3, Sirine Fakra3
A Method For Cell Gap Measurement Of Reflective Twisted Nematic Liquid Crystal Display
C.-F. Chang , Y.-C. Chan , Z.-n. Wan, C.-F. Chang , Y.-C. Chan , Z.-n. Wan
RESIDUAL STRESS STATES OF HYDROXYAPATITE GRADED COATING ON CERAMIC SUBSTRATE
Lei CHE, Lei CHE
Masahide GOTOH, Masahide GOTOH
Lin YANG, Lin YANG
Yukio HIROSE, Yukio HIROSE
DETERMINATION OF POISSON\'S RATIO AND YOUNG\'S MODULUS OF NITRIDE THIN FILMS
Hong-Ying Chen*, Hong-Ying Chen*
Jui-Hong Chen, Fu-Hsing Lu, Jui-Hong Chen, Fu-Hsing Lu
TRACE ELEMENT DETECTION USING DOUBLY CURVED CRYSTAL OPTICS
Z. W. Chen, Z. W. Chen
Walter Gibson, Walter Gibson
FIRST EXPERIMENT OF A STRUCTURAL STUDIES BEAMLINE BL15 OF A COMPACT SYNCHROTRON LIGHT SOURCE (SAGA-LS) NEWLY CONSTRUCTED WITH HIGH COST PERFORMANCE
Yoshinori Chikaura1, Toshihiro Okajima2, Yuji Soejima3, Kazuhiro Hara4, Yoshinori Chikaura1, Toshihiro Okajima2, Yuji Soejima3, Kazuhiro Hara4
Yoshifumi Suzuki1, Nobuyasu Hiramatsu5, Atsushi Kohno5, K. Nagata5, Yoshifumi Suzuki1, Nobuyasu Hiramatsu5, Atsushi Kohno5, K. Nagata5
Hiroyuki Setoyama2, Daisuke Yoshimura2 and Masaaki Tabata6, Hiroyuki Setoyama2, Daisuke Yoshimura2 and Masaaki Tabata6
,
,
,
THE CLAISSE-CALCULATOR FOR THE DETERMINATION OF ACIDITY INDEXES AND \"OPTIMAL FLUX\" IN BORATE FUSION
F. Claisse, F. Claisse
TRANSMISSION X-RAY POWDER DIFFRACTION WITH A CONFOCAL GRADED d-SPACING MIRROR OPTIC - A NEW TECHNIQUE FOR DEPOSITED THIN FILMS AND CAPILLARY SAMPLES
R.A. Clapp, R.A. Clapp
MICRODIFFRACTION WITH A NEW INTENSIFIED CCD CAMERA AND FOCUSSING MONOCAPILLARY OPTIC ON A CONVENTIONAL POWDER DIFFRACTOMETER
R.A. Clapp, R.A. Clapp
XRF ANALYSIS USING LOW-DILUTION GRAPHITE FUSIONS AND A 4 KW WAVELENGTH DISPERSIVE SPECTROMETER: A SINGLE METHOD FOR NEARLY ALL EARTH MATERIALS
R.M. Conrey, D.J. Cornelius, J.A. Wolff, R.M. Conrey, D.J. Cornelius, J.A. Wolff
Design of Single-bounce Monocapillary X-ray Optics
Sterling Cornaby, Sterling Cornaby
Thomas Szebenyi, Thomas Szebenyi
Rong Huang, Rong Huang
Don Bilderback, Don Bilderback
STANDARDLESS EDS ANALYSIS - THE INFLUENCE OF X-RAY DETECTOR MODELS
B.J. Cross, B.J. Cross
Certified Reference Materials: The Heart of Accurate XRF Analysis
Dan Geist, Bill Britt, Paul Dalager, Dan Geist, Bill Britt, Paul Dalager
THE BENEFITS OF AN INTEGRATED FULL PATTERN PXRD ANALYSIS APPROACH
Thomas Degen, Thomas Degen
USAGE OF AN ADVANCED FULLPAT METHOD TO QUANTIFY AMORPHOUS MATERIAL
Thomas Degen, Thomas Degen
ANALYTICAL APPLICATION OF MULTILAYER X-RAY OPTICS
R.Dietsch*, Th.Holz, R.Dietsch*, Th.Holz
St.Braun, St.Braun
T.Leisegang, D.C.Meyer, T.Leisegang, D.C.Meyer
CHLORARTINITE: A VOLCANIC EXHALATION PRODUCT AS AN INDICA-TOR FOR PROBLEMATIC MAGNESIA FLOOR PAVEMENTS
Kunihisa, Sugimoto, Kunihisa, Sugimoto
Robert, Dinnebier, Robert, Dinnebier
Thomas, Schlecht, Thomas, Schlecht
BENCHTOP WDXRF ULTRA-LOW SULFUR ANALYSER FOR FUEL OIL
M. Doi, N. Yamashita, Y. Kataoka, S. Gonsui, H. Kohno, M. Doi, N. Yamashita, Y. Kataoka, S. Gonsui, H. Kohno
A. Martin, H. Inoue, A. Martin, H. Inoue
COMBINING HTXRD WITH MASS SPECTROMETRY FOR CHARACTERIZATION OF DESORPTION MECHANISMS IN HYDROGEN STORAGE MATERIALS
A. R. Drews, A. Sudik, J. Yang and C. Wolverton, A. R. Drews, A. Sudik, J. Yang and C. Wolverton
APPLICATION OF TOTAL REFLECTION MIRRORS FOR RADIATION GATHERING IMPROVEMENT OF X-RAY PLANAR WAVEGUIDE-RESONATOR
V.Egorov, V.Egorov
E.Egorov, E.Egorov
DESIGN OF A BOREHOLE XRF SPECTROMETER FOR THE MARS REGOLITH
W. T. Elam, W. T. Elam
Warren C. Kelliher , Warren C. Kelliher
Ingrid A. Carlberg, Ingrid A. Carlberg
ESTIMATING THE HYDROCARBON OR OXIDE FRACTION OF BULK SAMPLES USING SCATTERED RADIATION
W. T. Elam, W. T. Elam
Bob Shen, Bob Shen
Bruce Scruggs, Bruce Scruggs
Joseph Nicolosi, Joseph Nicolosi
FUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS
W. T. Elam, W. T. Elam
Bob Shen, Bob Shen
Bruce Scruggs, Bruce Scruggs
Joseph Nicolosi, Joseph Nicolosi
X-ray Diffraction XRD analysis is used in smelters to measure the acidity of the Hall bath.
L. Espinoza-Nava, L. Espinoza-Nava
TRACE ELEMENT ANALYSIS AT HASYLAB
G. Falkenberg, G. Falkenberg
DETECTION OF TRACE HEAVY ELEMENTS IN THE 20-40 KEV ENERGY RANGE USING A THICK SILICON MULTI-CATHODE DETECTOR
L. Feng*, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori, L. Feng*, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori
J.S. Iwanczyk, J.S. Iwanczyk
NON DESTRUCTIVE EDXRF ANALYSIS OF ARCHAEOLOGICAL SAMPLES
J.L..Ferrero Calabuig*,C.Roldan García,S.Murcia Mascarós, J.L..Ferrero Calabuig*,C.Roldan García,S.Murcia Mascarós
ANALYSIS OF ATMOSPHERIC AEROSOLS AND CELL CULTURES WITH SR-TXRF: NEW DIRECT CALIBRATION USING PICO-DROPLETS (pL) GENERATED BY INK-JET PRINTERS AND SPECIATION OF IRON WITH SR-TXRF XANES
U. Fittschen*,J. Broekaert, S. Hauschild, D. Rehder, S. Förster, , U. Fittschen*,J. Broekaert, S. Hauschild, D. Rehder, S. Förster,
C. Streli, P. Wobrauschek, C. Jokubonis, F. Meirer, C. Streli, P. Wobrauschek, C. Jokubonis, F. Meirer
G. Pepponi, G. Pepponi
G. Lammel, G. Lammel
G. Falkenberg, G. Falkenberg
CONTROLLED-TEMPERATURE DIFFRACTION EXPERIMENTS ON SAMPLES IN GLASS CAPILLARIES
R. Glazer, R. Glazer
J. van Mechelen, J. van Mechelen
AUTOMATIC SAMPLE HEIGHT CORRECTION FOR NON-AMBIENT EXPERIMENTS
Ch. Resch, Ch. Resch
G. Artioli, G. Artioli
INTERACTIVE DATA LANGUAGE VISUALIZATIONS AND CALCULATIONS FROM FULL DATASETS
Colleen S. Frazer*, Mark A. Rodriguez, Ralph G. Tissot, Colleen S. Frazer*, Mark A. Rodriguez, Ralph G. Tissot
HAVE YOU EVER GOT BETTER PRECISION WITH LIME SAMPLES?
Jean-Philippe Gagnon, Jean-Philippe Gagnon
DETERMINATION OF LOCAL STRAIN FIELD IN SOI LINES USING HIGH RESOLUTION X-RAY DIFFRACTION
A. Loubens, M. Gailhanou*, O. Thomas, A. Loubens, M. Gailhanou*, O. Thomas
J.S Micha, J.S Micha
R. Fortunier, R. Fortunier
B. Charlet, B. Charlet
USING A MONOCHROMATIC-EXCITATION EDXRF ANALYZER TO MEASURE TRACE ELEMENTS IN AIR PARTICULATES
N. Gao*, Z. Chen, W.M. Gibson, N. Gao*, Z. Chen, W.M. Gibson
RECENT DEVELOPMENTS OF POLYCAPILLARY X-RAY OPTICS AND ITS INDUSTRIAL APPLICATIONS
N. Gao*, I. Ponomarev, Y. He, N. Gao*, I. Ponomarev, Y. He
PARALLEL PULSE-HEIGHT X-RAY SPECTROMETER
Fletcher J. Goldin, Fletcher J. Goldin
Steve Mitchel, Steve Mitchel
SHOT PEENING EFFICIENCY FOR FINE GRAIN STEEL
Y. Horimoto, M. Gotoh*, L. Che, Y. Hirose, Y. Horimoto, M. Gotoh*, L. Che, Y. Hirose
TIME-RESOLVED X-RAY MICRODIFFRACTION IMAGING OF NANOSECOND STRUCTURAL TRANSFORMATIONS IN THIN FERROELECTRIC FILMS
Alexei Grigoriev, Dal-Hyun Do, Dong Min Kim, Chang-Beom Eom, Paul G. Evans, Alexei Grigoriev, Dal-Hyun Do, Dong Min Kim, Chang-Beom Eom, Paul G. Evans
Bernhard Adams, Eric M. Dufresne,, Bernhard Adams, Eric M. Dufresne,
\'Galaxy XRD\' - INSPECTION OF SINGLE CRYSTAL TURBINE BLADES
A. Haase, A. Haase
IN SITU HTXRD ANALYSIS OF DISPLACEMENT REACTIONS USING GRAPHITE REACTION VESSELS
M.S. Haluska, M.S. Haluska
4-D XRD FOR STRAIN IN MANY GRAINS USING TRIANGULATION
Hrishikesh A. Bale, Jay C. Hanan, Hrishikesh A. Bale, Jay C. Hanan
Nobumichi Tamura, Nobumichi Tamura
DAMAGE AND INTERFACE STRESS IN DENTAL RECONSTRUCTION MATERIALS FROM COMBINED TOMOGRAPHY AND DIFFRACTION
Jay C. Hanan, Hrishikesh Bale, Jay C. Hanan, Hrishikesh Bale
Yong S. Chu, Francesco DeCarlo, Yong S. Chu, Francesco DeCarlo
CARBON NANOTUBE ELEMENTAL CHARACTERIZATION USING MICRO X-RAY FLUORESCENCE
Velma Montoya*, Satish B. Chikkannanavar, Stephen K. Doorn, George J. Havrilla, Velma Montoya*, Satish B. Chikkannanavar, Stephen K. Doorn, George J. Havrilla
X-RAY OPTICS ENABLING NEW CAPABILITIES IN MATERIALS CHARACTERIZATION
George J. Havrilla, George J. Havrilla
NON-DESTRUCTIVE ANALYSIS OF A PAINTING, NATIONAL TREASURE IN JAPAN
Y. Hayakawa , S. Shirono, S. Miura, Y. Hayakawa , S. Shirono, S. Miura
T. Matsushima, T. Matsushima
T. Uchida, T. Uchida
PERFORMANCE LIMITATIONS IN EDPXRF USING SDD’S
Joachim Heckel, Joachim Heckel
ELEMENTAL ANALYSIS OF SOILS BY X-RAY FLUORESCENCE USING GLASS DISKS
Z. Zhang*, P.A. Helmke, Z. Zhang*, P.A. Helmke
GENERATING HIGH BRILLIANCE X-RAY BEAMS FOR ANALYTICAL AND METROLOGY APPLICATIONS
P. Boulee, D. Cenda, P. Hoghoj, P. Boulee, D. Cenda, P. Hoghoj
CAPTURING AND SHAPING X-RAYS WITH FREE-FORM MULTILAYER OPTICS
E. Dova, E. Cela, S. Hedacq, B. Lantz, C. Montcalm, P. Hoghoj, E. Dova, E. Cela, S. Hedacq, B. Lantz, C. Montcalm, P. Hoghoj
XRF USE IN THE PHOSPHATE INDUSTRY
T. Holland, T. Holland
NEW DEVELOPMENT OF IN-SITU, COMPACT, LOW-POWER XRD SYSTEMS
H. Huang, W.M. Gibson, H. Huang, W.M. Gibson
ANALYSIS AND EVALUATION ON RESIDUAL STRESS OF FINE GRAIN STEEL USING X-RAY
Z.J.Huang, Z.J.Huang
M.Gotoh, M.Gotoh
Y.Hirose, Y.Hirose
PERFORMANCE AND INDUSTRIAL STUDIES AT THE NEW NEUTRON RESIDUAL STRESS MAPPING FACILITY
Camden R. Hubbard , Camden R. Hubbard
William B. Bailey, William B. Bailey
Fei Tang, Fei Tang
Ke An, Ke An
Andrew Payzant, Andrew Payzant
Tom Watkins, Tom Watkins
Tube-based Portable XRF for RoHS/WEEE Compliance
B. Connors, B. Connors
*B. Hubbard-Nelson, *B. Hubbard-Nelson
R. Koch, R. Koch
D. Sackett, D. Sackett
B. Tannian, B. Tannian
G. Waksman, G. Waksman
FILTER DEBRIS ANALYSIS BY ENERGY DISPERSIVE X-RAY FLUORESCENCE APPLIED TO J52 ENGINES
Gary R. Humphrey, Gary R. Humphrey
HYPOTHESES TEST USING Nσ
Jörg Ihringer, Jörg Ihringer
QUANTITATIVE ANALYSIS ON AN ELECTRON PROBE WITH THE NIST TRANSITION EDGE SENSOR MICROCALORIMETER X-RAY DETECTOR
T. Jach, N. Ritchie,, T. Jach, N. Ritchie,
J. Ullom, J. Beall, J. Ullom, J. Beall
APPLICATION OF EDXRF TO RAPID SCREENING FOR TOXIC ELEMENTS IN FOODS AND ASIAN PATENT MEDICINES
R. Jacobs, R. Jacobs
P.T Palmer, P.T Palmer
CHARACTERIZATION AND OPTICAL PROPERTIES OF CdS:Cu NANOCRYSTALS PREPARED BY CHEMICAL SYNTHESIS.
O. Portillo-Moreno, H. Lima-Lima, O. Portillo-Moreno, H. Lima-Lima
R. Lozada-Morales, R. Lozada-Morales
J. Martínez, J. Martínez
E. Rosendo1b, H. Juárez1b, and T. Díaz1b, E. Rosendo1b, H. Juárez1b, and T. Díaz1b
G. Juárez, G. Juárez
O. Zelaya-Ange, O. Zelaya-Ange
COMPARING RIETVELD XRD PROGRAMS IN THE CEMENT INDUSTRY AND EVALUATING AUTOMATED SAMPLE PREPARATION
I. Juel, I. Juel
New Iron Fluoride Crystal Strutcures
SIMULTANEOUS ANALYSIS OF NICKEL ALLOYS AND HIGH ALLOY STEELS USING THE FUNDAMENTAL PARAMETER METHOD
Y. Kataoka, E. Furusawa, H. Kohno, T. Arai, Y. Kataoka, E. Furusawa, H. Kohno, T. Arai
A. Martin, H. Inoue, A. Martin, H. Inoue
M. Mantler, M. Mantler
A NEW TENSILE STAGE FOR IN-SITU X-RAY SCATTERING EXPERIMENTS COMBINED WITH MECHANICAL TESTS
K.J. Martinschitz , E. Eiper, J. Keckes , K.J. Martinschitz , E. Eiper, J. Keckes
P. Boesecke , P. Boesecke
P. Schwarzl , P. Hofbauer, P. Schwarzl , P. Hofbauer
RESIDUAL STRESSES IN THIN FILMS CHARACTERIZED BY THE COMBINATION OF sin2 AND CURVATE METHODS: POSSIBILITIES AND LIMITATIONS
J. Keckes, J. Keckes
K. J. Martinschitz, K. J. Martinschitz
E. Eiper, E. Eiper
TEXTURE CHANGES IN CYCLICALLY DEFORMED CELLULOSICS CHARACTERIZED BY IN-SITU SYNCHROTRON DIFFRACTION COUPLED WITH TENSILE TESTS
K.J. Martinschitz, K.J. Martinschitz
P. Boesecke, P. Boesecke
W. Gindl, W. Gindl
J. Keckes, J. Keckes
RAPID DETERMINATION OF STRESS FACTORS AND RESIDUAL STRESSES IN ANISOTROPIC THIN FILMS
K. J. Martinschitz, K. J. Martinschitz
E. Eiper, E. Eiper
J. Keckes, J. Keckes
SIZE EFFECT IN METALLIC THIN FILMS CHARACTERIZED BY LOW-TEMPERATURE X-RAY DIFFRACTION
E. Eiper, E. Eiper
K.J. Martisnchitz, K.J. Martisnchitz
G. Dehm, G. Dehm
J. Keckes, J. Keckes
NEW LEVELS OF PERFORMANCE IN BENCHTOP EDPXRF
N. Kirkpatrick, J.Heckel, D. Wissmann, N. Kirkpatrick, J.Heckel, D. Wissmann
SYSTEM FOR SPATIALLY RESOLVED HRXRD
V.A.Kogan, V.A.Kogan
A.V.Kharchenko, A.V.Kharchenko
X-RAY TUBE WITH IMPROVED FOCAL SPOT SHAPE
V.A.Kogan, V.A.Kogan
G.E.van Dorssen, G.E.van Dorssen
M.J.Fransen, M.J.Fransen
EPITAXIAL GROWTH OF SEXIPHENYL DETERMINED BY SURFACE CORRUGATION
M. Koini, T. Haber, O. Werzer, R. Resel, M. Koini, T. Haber, O. Werzer, R. Resel
M. Oehzelt, G. Koller, B. Winter, M. Ramsey, M. Oehzelt, G. Koller, B. Winter, M. Ramsey
TIME/TEMPERATURE VARIATIONS IN THE REDUCED DISTRIBUTION FUNCTION OF LIQUID METALS AND METALLIC GLASSES
THE COMPARATIVE INVESTIGATIONS OF SURFACE RESIDUAL STRESSES IN STEEL AFTER STATIC AND CYCLIC DEFORMATION
An analysis of the stress distribution based on measurements carried out using X-ray incidence method
Barbara Kucharska, Barbara Kucharska
SMALL-ANGLE X-RAY SCATTERING AT HIGH BRILLIANCE EUROPEAN SYNCHROTRONS FOR BIO- AND NANO-TECHNOLOGY (PROJECT SAXIER)
H. Amenitsch, P. Laggner, H. Amenitsch, P. Laggner
C. Riekel, O. Konovalov, C. Riekel, O. Konovalov
J. Perez, J. Perez
J.G. Grossmann, S. Hasnain, J.G. Grossmann, S. Hasnain
M. Petoukhov, M. Roessle, D. Svergun, M. Petoukhov, M. Roessle, D. Svergun
MONITORING CRYSTALLIZATION FROM SOLUTIONS AND AMORPHOUS SOLIDS BY LABORATORY-BASED TR-SWAXS
P. Laggner, M. Kriechbaum, P. Laggner, M. Kriechbaum
Luigia Volpe, Luigia Volpe
S. Bhattacharya, R. Suryanarayanan, S. Bhattacharya, R. Suryanarayanan
GISAXS AT LABORATORY SAXS INSTRUMENT FOR QUALITY ASSESSMENT OF MESOPOROUS THIN FILMS
H. Amenitsch, B. Sartori, H. Amenitsch, B. Sartori
P. Laggner, P. Laggner
A LABORATORY SAXS INSTRUMENT FOR SECOND-TIME RESOLUTION OF ANISOTROPIC FLOW PATTERNS
P. Laggner, M. Kriechbaum, P. Laggner, M. Kriechbaum
DEVELOPMENT OF A QUANTITATIVE EDXRF METHOD FOR DETERMINING THE CONCENTRATION OF PALLADIUM APPLIED TO TOBACCO
J. Lipscomb, M. Chang, T. Danielson, C. Connell, S. Zimmermann, J. Lipscomb, M. Chang, T. Danielson, C. Connell, S. Zimmermann
DATING PETROGLYPHS WITH XRF: DEVELOPMENT OF THE TECHNIQUE AND INITIAL RESULTS
F.W. Lytle, F.W. Lytle
N.E. Pingitore, N.E. Pingitore
Stress Mitigation of x-ray Beamline Monochromators Using Topography Test Unit
J. Maj*, G. Waldschmidt, I. Koshelew, R. Huang, P. Baldo, and A. Macrander, J. Maj*, G. Waldschmidt, I. Koshelew, R. Huang, P. Baldo, and A. Macrander
L.Maj, L.Maj
FORENSICS APPLICATIONS OF X-RAY FLUORESCENCE SPECTROSCOPY IN COMBINATION WITH ADVANCED LIGHT SOURCE SAMPLE DISCOVERY
S. Mamedov, J. Goldey, A. Whitley, N. Verzard, S. Mamedov, J. Goldey, A. Whitley, N. Verzard
PROBING THE DEFECT STRUCTURE OF NATURAL NANOPARTICLES WITH MICROMETER-SIZED SYNCHROTRON X-RAY BEAMS
Alain, Manceau, Alain, Manceau
Photoelectric absorption in Al, Ca and Cu in the photon energy range 0.1keV<E<10keV
H. Ebel, M. Mantler, H. Ebel, M. Mantler
RECENT DEVELOPMENTS IN TRACE ELEMENT- AND MICRO-ANALYSIS AT THE IAEA XRF LABORATORY
A.Markowicz*, D.Wegrzynek, S.Bamford, E.Chinea-Cano, A.Markowicz*, D.Wegrzynek, S.Bamford, E.Chinea-Cano
WELCOME TO THE NEW WORLD OF MINI X-RAY SYSTEMS
T. McNulty, S. Bird, A. Martin, L. Daniels, T. McNulty, S. Bird, A. Martin, L. Daniels
ZSX 400 - A New WDXRF Spectrometer by Rigaku
A. Martin, A. Martin
High Sensitivity, Nondestructive Determination of Toxic Trace Heavy Metals in Food by EDXRF Using a High Throughput Silicon Multi-Cathode Detector
Y. Matoba*, T. Fukai, K. Tamura, Y. Matoba*, T. Fukai, K. Tamura
M.Takahashi, M.Takahashi
HIGH RESOLUTION X-RAY DIFFRACTOMETRY AND REFLECTOMETRY IN MODERN SEMICONDUCTOR MANUFACTURING
R.J. Matyi, R.J. Matyi
IN VIVO MEASUREMENT OF TOXIC ELEMENTS USING X-RAY FLUORESCENCE ANALYSIS
F.E. McNeill, D.R. Chettle, L. Nie, M. Popovic, R.C.N. Studinski, F.E. McNeill, D.R. Chettle, L. Nie, M. Popovic, R.C.N. Studinski
J.M. O\'Meara, J.M. O\'Meara
DEVELOPMENT AND APPLICATION OF A FUSION-XRF METHOD USING A THULIUM© BASED INTERNAL STANDARD FOR HIGH ACCURACY NICKEL ANALYSIS.
Shane Reeves, Shane Reeves
David Brown, David Brown
Jorg Metz, Jorg Metz
Using high energy x rays and in situ loading to understand crystal stresses in polycrystalline metals
M.P. Miller*, J.-S. Park, M.P. Miller*, J.-S. Park
A. Kazimirov, P. Revesz, A. Kazimirov, P. Revesz
J.V. Bernier, J.V. Bernier
WHAT LIES BENEATH &#150; A 3D LOOK AT A DECONTAMINATION PROCESS
E.M. Minogue, G.J. Havrilla, V. Montoya, E.M. Minogue, G.J. Havrilla, V. Montoya
HIGH TEMPERATURE X-RAY DIFFRACTION ANALYSIS OF DEFENSE WASTE PROCESSING FACILITY GLASS FRITS
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, D.M. Missimer, A.R. Jurgensen, R.L. Rutherford
PHASE INSTABILITY OF SRXLA1-XCOO3-D : A HIGH TEMPERATURE DIFFRACTION STUDY
S.T. Misture*, S.T. Misture*
J.S. White, J.S. White
X. Chen, X. Chen
S.B. Adler, S.B. Adler
HIGH TEMPERATURE DIFFRACTION TO DEVELOP SOLID OXIDE FUEL CELL SEALING GLASSES
M.D. Dolan, M.D. Dolan
J.S. White, J.S. White
E.I. Henriques, E.I. Henriques
K.B. Stallone, K.B. Stallone
S.T. Misture*, S.T. Misture*
X-RAY DIFFRACTION STUDIES OF POLY(ETHYLENE TEREPHTHALATE) –REACTIVE SYSTEMS
Nitin Moghe *, Kunj Tandon ,A. Dhanabalan, Nitin Moghe *, Kunj Tandon ,A. Dhanabalan
Formation of Tantalum Oxy-Nitride from ALD TaN Studied by XRR/XRD and XPS
P. Mrozek, P. Mrozek
N. Ramaswamy, N. Ramaswamy
D.F. Allgeyer, D.F. Allgeyer
M.F. Rocklein, M.F. Rocklein
MECHANICS OF MICROELECTRONIC STRUCTURES AS REVEALED BY X-RAY DIFFRACTION
AN ENVIRONMENTAL STAGE FOR IN-SITU STUDIES OF BIOPOLYMERS IN HIGH PRESSURE CO2
A. Victoria Nawaby, A. Victoria Nawaby
Pamela Whitfield, Pamela Whitfield
Xia Liao, Xia Liao
ANALYSIS OF VERY SMALL SAMPLES WITH A PSEUDOPARALLEL GEOMETRY DIFFRACTION SYSTEM
John M. Neil *, John M. Neil *
Optimization of the Peak-to-Background Ratio and the Low Energy Response of Silicon Drift Detectors for High Resolution X-ray Spectroscopy
A. Niculae*, H. Soltau, P. Lechner, A. Liebl, R. Eckhardt, A. Niculae*, H. Soltau, P. Lechner, A. Liebl, R. Eckhardt
G. Lutz, L. Strueder, F. Schopper, G. Schaller, G. Lutz, L. Strueder, F. Schopper, G. Schaller
APPLICATIONS OF X-RAY REFLECTIVITY TO DEVELOP AND MONITOR FEOL AND BEOL PROCESSES FOR SUB-65NM TECHNOLOGY NODES
E. Nolot, E. Nolot
DEPTH-RESOLVED STRAIN DETERMINATION OF HYDROXYAPATITE COATINGS USING HIGH ENERGY X-RAY DIFFRACTION
T.P. Ntsoane, T.P. Ntsoane
M.Topic, M.Topic
T.Thovhogi, M. Härting, T.Thovhogi, M. Härting
D. Robinson, D. Robinson
R.B. Heimann, R.B. Heimann
GRAIN NUCLEATION AND GRAIN GROWTH DURING PHASE TRANSFORMATIONS IN STEEL
S.E. Offerman*, N.H. van Dijk, J. Sietsma, S. van der Zwaag, S.E. Offerman*, N.H. van Dijk, J. Sietsma, S. van der Zwaag
E.M. Lauridsen, L. Margulies, H.F. Poulsen, E.M. Lauridsen, L. Margulies, H.F. Poulsen
X-RAY STRESS ANALYSIS EMPLOYING THE LATTICE PARAMETER ELLIPSOID
R.E. Ogilvie, R.E. Ogilvie
Properties and the General Use of the X-Ray Elastic Factors
B. Ortner, B. Ortner
A REVIEW OF TWO U.S. SILICA IN-HOUSE XRF ANALYTICAL ROUTINE ASSESSMENTS
M.L. Paige, M.L. Paige
INFLUENCE OF SAMARIUM ON THE CRYSTAL STRUCTURE AND MICROSTRUCTURE OF PHOTOLUMESCENT SrTiO3
M.G.S. Costa, M.M. Jesus, A.B. Campos, E. Longo, J.A. Varela, C.O. Paiva-Santos*, M.G.S. Costa, M.M. Jesus, A.B. Campos, E. Longo, J.A. Varela, C.O. Paiva-Santos*
EVALUATION OF ANALYTICAL FIGURES OF MERIT FOR RAPID SCREENING OF TOXIC ELEMENTS IN FOOD VIA EDXRF
P.T. Palmer, P.T. Palmer
K. Yamamoto, K. Yamamoto
S. Webber, S. Webber
K. Ferguson, K. Ferguson
R. Jacobs, R. Jacobs
STUDIES OF LOCAL AND INTERMEDIATE RANGE STRUCTURE IN CRYSTALLINE, NANOCRYSTALLINE AND AMORPHOUS MATERIALS AT HIGH PRESSURE USING HIGH-ENERGY X-RAYS
J.B. Parise, S. Antao, F.M. Michel, C.D. Martin, L. Ehm, J.B. Parise, S. Antao, F.M. Michel, C.D. Martin, L. Ehm
P.L. Lee, P.J. Chupas, S.D. Shastri, P.L. Lee, P.J. Chupas, S.D. Shastri
CONFOCAL MICRO X-RAY FLUORESCENCE: 3-DIMENSIONAL DENSITY MAPPING
B. M. Patterson*, G. J. Havrilla, K. Defriend, B. M. Patterson*, G. J. Havrilla, K. Defriend
ARSENIC SPECIATION IN CUCUMBER (Cucumis sativus L.) XYLEM SAP BY K-EDGE TXRF-XANES
G. Pepponi, G. Pepponi
F. Meirer, C. Streli, P. Wobrauschek, F. Meirer, C. Streli, P. Wobrauschek
V.G. Mihucz, G. Zaray, V. Czech, V.G. Mihucz, G. Zaray, V. Czech
J. Broekaert, U. Fittschen, J. Broekaert, U. Fittschen
G. Falkenberg, G. Falkenberg
SPECIATION OF TRACES BY MEANS OF X-RAY ABSORPTION SPECTROSCOPY WITH TOTAL REFLECTION X-RAY FLUORESCENCE ACQUISITION
G. Pepponi, G. Pepponi
THREE-DIMENSIONAL STRUCTURE OF NANOPHASE MATERIALS FROM HIGH-ENERGY X-RAY DIFFRACTION AND ATOMIC PAIR DISTRIBUTION FUNCTION ANALYSIS
Surface and Bulk Internal Stresses in Li2O-2SiO2 Glass-Ceramics
H. Pinto*, A. Pyzalla, H. Pinto*, A. Pyzalla
L. Ito, M. Crovace, E.B. Ferreira, E. D. Zanotto, L. Ito, M. Crovace, E.B. Ferreira, E. D. Zanotto
F. Fauth, F. Fauth
T. Wroblewski, T. Wroblewski
Improved Beam Collimation in Portable XRF Analyzer for Analysis of Small Electronic Components
Stanislaw Piorek, Stanislaw Piorek
MEASUREMENT OF COEFFICIENT OF THERMAL EXPANSION BY X-RAY DIFFRACTION: A METHOD FOR ACCURATE FITTING OF LATTICE CONSTANT DATA
S.M. Polvino, C. Wiggins, I.C. Noyan, S.M. Polvino, C. Wiggins, I.C. Noyan
E. Yaschin, C.E. Murray, E. Yaschin, C.E. Murray
VISUALIZING THE DYNAMICS OF GRAINS AND DISLOCATIONS STRUCTURES
H.F. Poulsen, H.F. Poulsen
RADIATION DAMAGE IN POWDER SAMPLES PREPARED WITH BINDER
V. Radovi&#263;, F. Šafar, V. Radovi&#263;, F. Šafar
N. Radovi&#263;, N. Radovi&#263;
ANOMALOUS SCATTERING FROM SINGLE CRYSTAL SUBSTRATE
L K Bekessy*, N A Raftery, S Russell, L K Bekessy*, N A Raftery, S Russell
ANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION
N A Raftery*, L K Bekessy, J Bowpitt, N A Raftery*, L K Bekessy, J Bowpitt
HIGH-ENERGY X-RAY METHODS FOR STUDYING BURIED INTERFACES
TEMPERATURE ACCURACY IN HIGH TEMPERATURE XRD
C. Resch, C. Resch
DHS1100 - A NEW HIGH TEMPERATURE ATTACHMENT FOR MULTIPURPOSE 4-CIRCLE X-RAY GONIOMETERS
R. Resel, R. Resel
M. Koini, M. Koini
T. Haber, T. Haber
J. Keckes , J. Keckes
P. Hofbauer, P. Hofbauer
UNIT CELL EXPANSION IN ErT2 FILMS
M.A. Rodriguez, J.F. Browning, C.S. Snow, C.S. Frazer, R.G. Tissot, M.A. Rodriguez, J.F. Browning, C.S. Snow, C.S. Frazer, R.G. Tissot
CANCER DIAGNOSIS USING SAXS IMAGING
C.J. Hall, C.J. Hall
S. Wilkinson, S. Wilkinson
A. Round, A. Round
APPLICATIONS OF SYNCHROTRON X-RAY FLUORESCENCE MICROPROBE AT KARLSRUHE RESEARCH CENTER
R. Simon, U. Kerdpin, R. Simon, U. Kerdpin
F. Friedrich, W. Faubel, P. Weidler, R. Nüesch, F. Friedrich, W. Faubel, P. Weidler, R. Nüesch
M. Grosse, M. Grosse
NEED FOR NEW X-RAY FLUORESCENCE STANDARDS
J.B. Sardisco, B.H. Clampitt, J.B. Sardisco, B.H. Clampitt
REFINEMENT OF NASA’S MARS XRD INSTRUMENT USING RAY TRACING AND COMBINATORIAL OPTIMIZATION
M. Gailhanou, M. Gailhanou
P. Sarrazin, P. Sarrazin
D. Blake, D. Blake
D. Bish, D. Bish
S. Collins, S. Collins
D. Vaniman, S. Chipera, D. Vaniman, S. Chipera
IN-SITU & IN-PLANT APPLICATIONS OF XRD IN THE MINERALS INDUSTRY
Nicola V.Y. Scarlett*, Ian C. Madsen, Nicola V.Y. Scarlett*, Ian C. Madsen
CT IMAGING APPLIED TO CAPILLARY WATER ABSORPTION IN SICILIAN SEDIMENTARY ROCKS USED IN CULTURAL HERITAGES
T. Schillaci*, M. Brai, D. Cascio, F. Fauci, G. Raso, T. Schillaci*, M. Brai, D. Cascio, F. Fauci, G. Raso
A. Lo Casto, F. Sorrentino, A. Lo Casto, F. Sorrentino
CRYSTAL STRUCTURE EVOLUTION IN HIGH-Kappa ZIRCONIA THIN FILMS FOR HIGH ENERGY DENSITY MIM CAPACITORS
G. Sethi, M.T. Lanagan, M. W. Horn, G. Sethi, M.T. Lanagan, M. W. Horn
RESIDUAL STRESS MEASUREMENTS ON CURVED SPECIMENS USING THE SIN2PSI METHOD
Judith Shackleton*, Judith Shackleton*
George Bibby, George Bibby
APPLICATION OF POWDER DIFFRACTION FOR SOLVING CRYSTAL STRUCTURES CONTAINING LIGHT ELEMENTS
R.V. Shpanchenko, R.V. Shpanchenko
VALIDATION OF AN ALKALI REACTION, BORATE FUSION X-RAY FLUORESCENCE METHOD FOR SILICON METAL
J. R. Sieber*, E. A. Mackey, A. F. Marlow, R. Paul, J. R. Sieber*, E. A. Mackey, A. F. Marlow, R. Paul
S. D. Leigh, S. D. Leigh
R. Martin, R. Martin
DUAL UV/X-RAY SOURCE TECHNOLOGY FOR PORTABLE BIO-DECONTAMINATION
J.R. Smith, R.E. Treece, J.R. Smith, R.E. Treece
D.F. Gorzen, D.F. Gorzen
EVALUATION OF THE CONTAMINATION MAPPING CAPABILITIES WITH A TXRF
Chris M. Sparks*, Angela Martinez, Chris M. Sparks*, Angela Martinez
Diane K. Michelson, Diane K. Michelson
IN-SITU TENSILE LOADING STUDY OF GRAIN SIZE EFFECT ON DEFORMATION MECHANISM IN NICKEL
X. -L. Wang, X. -L. Wang
J. Almer, J. Almer
C. T. Liu, C. T. Liu
D. Ma, D. Ma
Y. Ren, Y. Ren
X-RAY PHASE-CONTRAST TOMOGRAPHY OF MALARIA TRANSMITTING MOSQUITOES FOR MORPHOLOGY STUDIES
D. Wegrzynek, A. Markowicz, D. Wegrzynek, A. Markowicz
E. Chinea-Cano, S. Bamford, B. Knols, M. Helinski,, E. Chinea-Cano, S. Bamford, B. Knols, M. Helinski,
P. Wobrauschek, C. Streli, N. Zoeger, P. Wobrauschek, C. Streli, N. Zoeger
R. Simon, T. Weitkamp, C. Frieh, R. Simon, T. Weitkamp, C. Frieh
DETERMINATION OF LOW Z ELEMENTS WITH TXRF IN BIOFILMS DIRECTLY CULTIVATED ON QUARTZ CARRIER PLATES
H. Hoefler, C. Streli, P. Wobrauschek, H. Hoefler, C. Streli, P. Wobrauschek
M. Óvári, Gy. Záray, M. Óvári, Gy. Záray
STRUCTURE ANALYSIS OF COPPER THIN FILMS USING IN-SITU IN-PLANE X-RAY DIFFRACTION
A. Takase, T. Konya, R. Matsuo, Y. Ito, A. Takase, T. Konya, R. Matsuo, Y. Ito
SALT FOR OIL: QUANTITATIVE X-RAY DIFFRACTION AND UNDERGROUND PETROLEUM STORAGE
R.G. Tissot, S.J. Bauer, R.G. Tissot, S.J. Bauer
NEW SYNCHROTRON INSTRUMENTS + NEW DETECTORS = NEW SCIENCE
RIETVELD ANALYSIS: CHOOSING X-RAY POWDER DIFFRACTION DATA OBTAINED FROM PARALLEL AND FOCUSING BEAM GEOMETRY
Akhilesh Tripathi*, Thomas F. McNulty, Akhilesh Tripathi*, Thomas F. McNulty
Micro-XRF Analysis using Needle-Type Collimators
K. Tsuji, A. Matsuda, K. Tsuji, A. Matsuda
BORON X-RAY DETECTION WITH A SILICON MULTI-CATHODE DETECTOR
C.R. Tull, S. Barkan, V.D. Saveliev, L. Feng, M. Takahashi, N. Matsumori, C.R. Tull, S. Barkan, V.D. Saveliev, L. Feng, M. Takahashi, N. Matsumori
D.E. Newbury, J. A. Small, D.E. Newbury, J. A. Small
J.S. Iwanczyk, J.S. Iwanczyk
IMPROVING AND STREAMLINING THE SAMPLE PREPARATION AND HANDLING PROCESS OF ASSAY SAMPLES PRIOR TO XRF ANALYSIS, USING AUTOMATION AND ROBOTICS
J. Tully, , J. Tully,
A. Nicholson, A. Nicholson
INVESTIGATION OF STRAIN, RELAXATION DEGREE, INTERFACE ROUGHNESS AND POROSITY OF SiGe/Si MODFET HETEROSTRUCTURES
A. Ulyanenkov, A. Ulyanenkov
M. Myronov, Y. Shiraki, M. Myronov, Y. Shiraki
K. Saito, K. Saito
Domain Switching in Crack-Tip Process Zones of Ferroelectric Ceramics
E. Ustundag*, J. Jones, E. Ustundag*, J. Jones
HIGH ENERGY X-RAY DIFFRACTION INVESTIGATION OF FERROELECTRIC CONSTITUTIVE BEHAVIOR
G. Tütüncü, E. Üstündag, R.C. Rogan, X. Tan, G. Tütüncü, E. Üstündag, R.C. Rogan, X. Tan
D. Robinson, D. Robinson
DIRECT HIGH-ACCURACY DETERMINATION OF PRECIOUS METALS IN AUTOMOTIVE CATALYSTS USING HIGH-ENERGY POLARIZED-BEAM EDXRF
R.Van Grieken*, K. Van Meel, Y. Makarovska, R.Van Grieken*, K. Van Meel, Y. Makarovska
A. Smekens, M. Behets, P. Kazandjian, A. Smekens, M. Behets, P. Kazandjian
THREE DIMENSIONAL TRACE ELEMENT MICROANALYSIS BY X-RAY FLUORESCENCE TOMOGRAPHY AND CONFOCAL XRF IMAGING
Laszlo, Vincze, Laszlo, Vincze
LCOATING ADSORBED HYDROGEN MOLECULES IN Cu2(btc)4/3 BY POWDER NEUTRON DIFFRACTION
Sven Vogel*, Jesse Rowsell, Juergen Eckert, Sven Vogel*, Jesse Rowsell, Juergen Eckert
HIGH PRESSURE DEFORMATION STUDY OF ZIRCONIUM
S.C. Vogel, D.W. Brown, H. Reiche, T.A. Sisneros, H. M. Volz, J. Zhang, Y. Zhao, S.C. Vogel, D.W. Brown, H. Reiche, T.A. Sisneros, H. M. Volz, J. Zhang, Y. Zhao
N. Nishiyama, Y. Wang, N. Nishiyama, Y. Wang
ANALYSIS OF X-RAY DIFFRACTION DATA FROM AGED U-NB ALLOYS
H.M. Volz, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F. Teter, D.J. Thoma, H.M. Volz, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F. Teter, D.J. Thoma
MICRO- AND LOCAL BASED XRF ANALYSIS IN CULTURAL HERITAGE
A. von Bohlen, A. von Bohlen
APPLICATION OF LOW-POWER ENERGY-DISPERSIVE X-RAY FLUORESCENCE SPECTROMETERS TO ANALYSIS OF SOILS AND OTHER MATERIALS OF GEOLOGICAL ORIGIN
Mark N. Ingham, Mark N. Ingham
Bruno A. R. Vrebos *, Bruno A. R. Vrebos *
Leian Grimsley, Leian Grimsley
PHASE TRANSFORMATION IN FERROMAGNETIC SHAPE-MEMORY ALLOYS
Y.D. Wang, Y.D. Wang
Y. Ren, Y. Ren
Y.D. Liu, L. Zuo, Y.D. Liu, L. Zuo
D. Brown, D. Brown
M. L. Benson, H. Choo, P. K. Liaw, M. L. Benson, H. Choo, P. K. Liaw
X-RAY CHARACTERIZATION OF WC SURFACE COATINGS
T.R. Watkins, P.G. Engleman, C.A. Blue, T.R. Watkins, P.G. Engleman, C.A. Blue
O.B. Cavin, O.B. Cavin
SIMULTANEOUS REFINEMENTS WITH COMPLEX COMPOSITIONAL CONSTRAINTS - EXAMPLE OF SINGULAR VALUE DECOMPOSITION TO DIAGNOSE POOR MATRIX CONDITIONING
P.S. Whitfield*, I.J. Davidson, P.H.J. Mercier, Y. Le Page, P.S. Whitfield*, I.J. Davidson, P.H.J. Mercier, Y. Le Page
L.D. Mitchell, L.D. Mitchell
P.W. Stephens, P.W. Stephens
L.M.D Cranswick, I.P. Swainson, L.M.D Cranswick, I.P. Swainson
STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA OF SOME MOISTURE-SENSITIVE, NETWORK COORDINATION COMPOUNDS
P.S. Whitfield*, A. Abouimrane, I.J. Davidson, P.S. Whitfield*, A. Abouimrane, I.J. Davidson
COMPARISON OF THE RIETVELD METHOD AND STANDARD METHOD OF INTENSITY RATIOS FOR MEASUREMENT OF RETAINED AUSTENITE IN BEARING STEEL SAE 52100
D.B. Witkin, D.B. Witkin
INITIAL RESULTS FROM MOLECULAR IMAGING TOMOGRAPHY FROM A BIOLOGICAL PHANTOM
Steven J. Wilkinson, Steven J. Wilkinson
Keith D. Rogers, Keith D. Rogers
Chris J. Hall, Chris J. Hall
Adam. r. Round, Adam. r. Round
CORRECTING FOR MICROABSORPTION - BRINDLEY REVISITED
A. Brayko*, R.S. Winburn, A. Brayko*, R.S. Winburn
A REVIEW: XRF ANALYSIS OF PB IN BONE
P. Wobrauschek, P. Wobrauschek
PORTABLE XRF SYSTEM INCLUDING LIGHT ELEMENT ANALYSIS WITH POLYCAPILLARY OPTICS FOR THE INVESTIGATION OF ART OBJECTS
G. Buzanich, P. Wobrauschek, C. Streli, G. Buzanich, P. Wobrauschek, C. Streli
A. Markowicz, D. Wegrzynek, E. Chinea-Cano, S. Bamford, A. Markowicz, D. Wegrzynek, E. Chinea-Cano, S. Bamford
KINETICS AND PHASE EQUILIBRIA OF THE INTERACTIONS OF THE Ba2YCu3O6+x SUPERCONDUCTOR WITH CeO2 BUFFER LAYER
W. Wong-Ng, Z. Yang, L.P. Cook, I. Levin, Q. Huang, J. Frank, W. Wong-Ng, Z. Yang, L.P. Cook, I. Levin, Q. Huang, J. Frank
HIGH-TEMEPRATURE X-RAY STUDIES OF TRANSIENT PHASES IN COATED CONDUCTORS USING THE “BaF2 PROCESS”
W. Wong-Ng, I. Levin, L.P. Cook, W. Wong-Ng, I. Levin, L.P. Cook
R. Feenstra, R. Feenstra
IN-SITU TIME-RESOLVED NEUTRON DIFFRACTION MEASUREMENT OF TRANSIENT MATERIAL STATES DURING A THERMO-MECHANICAL PROCESS BASED ON QUASI-STEADY STATE PRINCIPLE
W. Woo, W. Woo
OPTIMIZATION OF A DRIED RESIDUE SPECIMEN PREPARATION METHOD FOR QUANTIFYING ANALYTES IN PLUTONIUM METAL USING WDXRF
Christopher G. Worley, Christopher G. Worley
Lisa P. Colletti, Lisa P. Colletti
MINUTE FOREIGN MATERIAL ANALYSIS USING MONO-CAPILLARY WITH 10-MICROMETER SPATIAL RESOLUTION
Y.Yokota*, S.Ohzawa, D.Matsunaga, S.Komatani, K.Obori, Y.Yokota*, S.Ohzawa, D.Matsunaga, S.Komatani, K.Obori
A.Whitley, S.Mamedov, A.Whitley, S.Mamedov
LEAD IN HUMAN CARTILAGE: IMAGING AND SPECIATION BY MICRO-XRF AND MICRO-XANES
N. Zoeger, P. Wobrauschek, C.Streli, N. Zoeger, P. Wobrauschek, C.Streli
G. Pepponi, G. Pepponi
P. Roschger, P. Roschger
G. Falkenberg, G. Falkenberg
A. Tampieri, A. Tampieri


 

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