Search the Abstract PDF files click here
|
ADVANCES IN HANDHELD XRF DESIGNS AND CHALLENGES IN MEETING RoHS/WEEE DIRECTIVES S. Afshari, P. Bennett, S. Afshari, P. Bennett |
|
SELF ASSEMBLY AND HIGH PRESSURE BEHAVIOR OF NON-LAMELLAR PHOSPHOLIPID PHASES ON SOLID SUPPORTS STUDIED WITH GISAXD Heinz Amenitsch, Michael Rappolt, Manfred Kriechbaum*, Barbara Sartori, Peter Laggner, Heinz Amenitsch, Michael Rappolt, Manfred Kriechbaum*, Barbara Sartori, Peter Laggner Milos Steinhart, Milos Steinhart |
|
arhfoqeq dyksqgti, dyksqgti arhfoqeq, arhfoqeq arhfoqeq, arhfoqeq arhfoqeq, arhfoqeq arhfoqeq, arhfoqeq arhfoqeq, arhfoqeq |
|
MEASUREMENT OF RESIDUAL STRESSES INSIDE 50 MM INNER DIAMETER PIPES USING A MINIATURE GONIOMETER HEAD Mohammed Belassel, Mohammed Belassel James Pineault, James Pineault Michael Brauss, Michael Brauss |
|
ANISOTROPIC LATTICE-STRAIN EVOLUTION AND PHASE TRANSFORMATION IN A COBALT-BASED SUPERALLOY UNDER UNIAXIAL LOADING M. L. Benson*, M. L. Benson* A. D. Stoica, X.-L. Wang, A. D. Stoica, X.-L. Wang P. K. Liaw, H. Choo, P. K. Liaw, H. Choo D. W. Brown, D. W. Brown D. L. Klarstrom, D. L. Klarstrom |
|
NON DESTRUCTIVE TESTING ON SURFACES OF INDUSTRIAL COMPONENTS FROM DISTANCE XRD G. Berti*, G. Berti* A. Nicoletta, A. Nicoletta |
|
REMOTE X-RAY DIFFRACTION OF PLANETARY BODIES: WHAT IS MARS REALLY MADE OF? D. L. Bish, D. L. Bish D. Blake, D. Blake P. Sarrazin, P. Sarrazin D. Vaniman, D. Vaniman S. Chipera, S. Chipera |
|
X-RAY DIFFRACTION CHARACTERIZATION OF NANOMATERIALS USED IN IMAGING APPLICATIONS T.N. Blanton, C.L. Barnes, T.N. Blanton, C.L. Barnes |
|
CRYSTALLITE MORPHOLOGY IN GOLD CATALYSTS OBTAINED VIA RIETVELD REFINEMENT X. Bokhimi, A. Morales, R. Zanella, X. Bokhimi, A. Morales, R. Zanella |
|
PERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES F.I.G.M Borges*, S.J.C. do Carmo, F.I.G.M Borges*, S.J.C. do Carmo T.H.V.T. Dias, F.P. Santos, T.H.V.T. Dias, F.P. Santos F.P.S.C. Gil, A.M.F. Trindade, F.P.S.C. Gil, A.M.F. Trindade R.M. Curado, C.A.N. Conde, R.M. Curado, C.A.N. Conde |
|
NOVEL SLICON DRIFT DETECTORS WITH ENHANCED RELIABILITY FOR INCREASING REQUIREMENTS OF ANALYTICAL APPLICATIONS O. Boslau, T. Eggert, J. Kemmer, A. Pahlke, S. Pahlke, R. Stoetter, F. Wiest, O. Boslau, T. Eggert, J. Kemmer, A. Pahlke, S. Pahlke, R. Stoetter, F. Wiest |
|
DEVELOPMENT OF AN X-RAY FLUORESCENCE WORKFLOW FOR HIGH THROUGHPUT CATALYST DISCOVERY PROJECT L.L. Brehm, W.L. Shen, T.A. Hiller, L.L. Brehm, W.L. Shen, T.A. Hiller |
|
ANALYTICAL METHODS FOR DISCRIMINATING STARDUST IN AEROGEL CAPTURE MEDIA S. Brennan, K. Luening, K. Ignatyev, P. Pianetta, S. Brennan, K. Luening, K. Ignatyev, P. Pianetta H.A. Ishii, J.P. Bradley, H.A. Ishii, J.P. Bradley |
|
THE CHANDRA X-RAY OBSERVATORY: OBSERVING THE HIGH ENERGY UNIVERSE R.J. Brissenden, R.J. Brissenden |
|
In-Situ Neutron Diffraction During Cyclic Deformation : Studying the Reversibility of Deformation Induced Twinning and Phase Transformation S. R. Agnew, A. Jain, S. R. Agnew, A. Jain D. W. Brown*, B. Clausen, D. W. Brown*, B. Clausen R. Vaidyanathan, S. Qiu, R. Vaidyanathan, S. Qiu |
|
DETECTORS FOR DEMANDING X-RAY DIFFRACTION EXPERIMENTS L. Brügemann, H.-G. Krane, L. Brügemann, H.-G. Krane Y. Diawara, B. He, Y. Diawara, B. He |
|
ENHANCING XRD2 MICRODIFFRACTION WITH FOCUSING X-RAY MICROLENSES Christoph, Berthold, Christoph, Berthold Jens Brechbuehl), Lutz Bruegemann, Jens Brechbuehl), Lutz Bruegemann |
|
IMPROVING THE DETECTION LIMIT IN EDXRF WITH PROPRTIONAL COUNTER I.A.Brytov, I.A.Brytov A.D.Goganov, A.D.Goganov P.I.Plotnikov, P.I.Plotnikov |
|
NEW INSIGHTS INTO THE MINERALIZATION PROCESS OF BONE C. Burger*, H. Zhou, B.S. Hsiao, B. Chu, C. Burger*, H. Zhou, B.S. Hsiao, B. Chu L. Graham, M.J. Glimcher, L. Graham, M.J. Glimcher |
|
SAXS FROM POLYMER-CLAY COMPOSITES AND OTHER LAYERED SYSTEMS C. Burger*, P. Nawani, B.S. Hsiao, B. Chu, C. Burger*, P. Nawani, B.S. Hsiao, B. Chu M. Gelfer, M. Gelfer |
|
IN SITU MEASUREMENT OF HYDRATION OF MARTIAN SOILS AND ROCKS USING THE SCATTER COMPONENT OF THE XRF SPECTRUM J.L. Campbell, R. Gellert, C.L. Mallett, J.M. O’Meara, J.A. Maxwell, J.L. Campbell, R. Gellert, C.L. Mallett, J.M. O’Meara, J.A. Maxwell |
|
An Energy Dispersive X-ray Diffractometer for Phase Analysis of Pharmaceuticals D.F. Carpenter, D.F. Carpenter |
|
NANOSTRUCTURED MATERIALS CHARACTERIZATION BY X-RAY DIFFRACTION I. Dragomir – Cernatescu, I. Dragomir – Cernatescu R.L. Snyder, M. Kirkham, R. Yang, Z.L. Wang, R.L. Snyder, M. Kirkham, R. Yang, Z.L. Wang |
|
LOW-POWER MONOCHROMATIC FOCUSED BEAM XRF SYSTEMS USING DOUBLY CURVED CRYSTALS Z.W. Chen, F. Wei, B. Beumer, D. Li, W.M. Gibson, Z.W. Chen, F. Wei, B. Beumer, D. Li, W.M. Gibson |
|
SOFT-CONFINEMENTS OF CHIRAL SMECTIC PHASES ON CRYSTALLIZATION IN THE MACROSCOPIC MONODOMAINS OF A MAIN-CHAIN NON-RACEMIC LIQUID CRYSTALLINE POLYMER S.Z. D. Cheng, S. Jin, F.W. Harris, S.Z. D. Cheng, S. Jin, F.W. Harris |
|
X-RAY DIFFRACTION STUDIES OF Li-BASED COMPLEX HYDRIDES AFTER PRESSURE CYCLING W. Chien, D. Chandra*, J.H. Lamb, W. Chien, D. Chandra*, J.H. Lamb |
|
IN-SITU NEUTRON DIFFRACTION STUDIES OF DEFORMATION-INDUCED PHASE TRANSFORMATION IN AN ULTRAFINE GRAINED TRIP STEEL H. Choo*, K. Tao, H. Choo*, K. Tao B. Clausen, B. Clausen J. E. Jin, Y. K. Lee, J. E. Jin, Y. K. Lee |
|
MICRO- AND NANO-XRD ON POLYMERS Christian, Riekel, Christian, Riekel |
|
POLYCRYSTALLINE DIFFRACTION IN THE 1 MM SAMPLE SIZE RANGE USING A LOW-COST INTENSIFIED CCD CAMERA AND FOCUSING OPTICS R.A. Clapp, R.A. Clapp |
|
X-RAYS ON MARS: HOW A HANDFUL OF PHOTONS IS HELPING REVOLUTIONIZE OUR UNDERSTANDING OF THE RED PLANET B.C. Clark, B.C. Clark |
|
FIELD PORTABLE XRF BEYOND TRADITIONAL HANDHELD ANALYZERS B. Connors, B. Connors P. Hardman, P. Hardman D. Bilodeau, D. Bilodeau B. Hubbard Nelson, B. Hubbard Nelson R. Koch, R. Koch D. Sackett, D. Sackett |
|
DESIGNING SINGLE-BOUNCE MONOCAPILLARY X-RAY OPTICS Sterling Cornaby, Sterling Cornaby Thomas Szebenyi, Thomas Szebenyi Rong Huang, Rong Huang Donald H. Bilderback, Donald H. Bilderback |
|
DIRECT DETERMINATION OF DOPING LEVEL IN PHOSPHOR MATERIALS FROM X-RAY SIGNAL INTENSITY RATIOS G. Darsey, G. Darsey |
|
INSIGHTS INTO THE DEFORMATION MECHANISMS OF hcp MATERIALS FROM A COMBINATION OF DIFFRACTION AND MICROMECHANICAL MODELING M.R. Daymond, F. Xu, S. Cai, R.A. Holt, M.R. Daymond, F. Xu, S. Cai, R.A. Holt |
|
ANALYSIS OF IN-SITU DEFORMATION OF HYDRIDED ZIRCALOY-2 BY SYNCHROTRON X-RAY DIFFRACTION M. Kerr, M.R. Daymond, R.A. Holt, M. Kerr, M.R. Daymond, R.A. Holt J.D. Almer, J.D. Almer |
|
TRACE ELEMENTS FOR CHARACTERIZATION ARTIFICIAL AGING PAPER M.L. Carvalho, M.L. Carvalho |
|
ADVANCED DATA ANALYSIS ON HIGH-THROUGHPUT, HIGH-RESOLUTION XRPD DATA Thomas Degen, Detlef Beckers, Thomas Degen, Detlef Beckers |
|
EFFECT OF X-RAY TUBE POWER ON INTENSITIES OF Kα X-RAYS OF TRACE ELEMENTS FROM SAMPLES OBTAINED BY USING DIFFERENT SAMPLE PREPARATION METHODS IN WDXRF SPECTROMETER F. Demir, F. Demir I. Han, I. Han G. Budak, G. Budak L. Demir, L. Demir A. Gurol, A. Gurol A. Karabulut, A. Karabulut |
|
DEVELOPING POWDER X-RAY DIFFRACTION (XRD) QUANTITATIVE METHOD FOR OROS® RWJ-333369 POLYMORPHS Mehdi Varasteh, Mehdi Varasteh Zhengyu Deng, Zhengyu Deng Helen Hwang, Helen Hwang Yoo Joong Kim, Yoo Joong Kim Geoffrey B. Wong, Geoffrey B. Wong |
|
EXPERIMENTAL STUDY OF X-RAY FLUXES FORMED BY WAVEGUIDE-RESONATORS WITH NONPARALLEL REFLECTORS E.V. Egorov, E.V. Egorov |
|
MINIMAL USE OF STANDARDS FOR QUANTIFYING TRACE ELEMENTS IN PLASTICS Bruce Scruggs, Bruce Scruggs Bob Shen, Bob Shen Laszlo Herczeg, Laszlo Herczeg Andrew Lee, Andrew Lee Joseph Nicolosi, Joseph Nicolosi |
|
Grating-Based High-Resolution Differential Phase Contrast Radiography and Tomography Using Microfocus X-Ray Sources M. Engelhardt, M. Engelhardt J. Baumanna, M. Schuster, J. Baumanna, M. Schuster C. Kottler, F. Pfeiffer, O. Bunk, C. David, C. Kottler, F. Pfeiffer, O. Bunk, C. David |
|
MIKROGAP DETECTOR TECHNOLOGY APPLIED TO SMALL ANGLE X-RAY SCATTERING Kurt Erlacher, Kurt Erlacher David Khazins, David Khazins Roger Durst, Roger Durst |
|
FULL PATTERN COMPARISON OF EXPERIMENTAL AND CALCULATED POWDER PATTERNS USING INTEGRAL INDEX METHODS IN PDF-4+ J. Faber, J. Blanton, J. Faber, J. Blanton |
|
NEW FEATURES IN SIeve+, A PLUG-IN PROGRAM FOR PDF-4+/DDView+: HANAWALT, FINK AND LONG8 SEARCHES BASED ON REDUCED DATA AND NEW FULL PATTERN SEARCH/MATCH J. Faber, D. Crane, J. Faber, D. Crane |
|
DETERMINATION OF THE DISTRIBUTION OF [001] CRYSTAL DIRECTION IN GRAIN-ORIENTED SILICON STEEL BY ASYMMETRICAL X-RAY DIFFRACTION METHOD Jianfeng, Fang, Jianfeng, Fang |
|
A REFERENCE DIFFRACTION DATABASE FOR NON-CRYSTALLINE, PARTIALLY CRYSTALLINE AND AMORPHOUS MATERIALS T.G. Fawcett, J. Faber, S. Kabekkodu, J. Blanton, T.G. Fawcett, J. Faber, S. Kabekkodu, J. Blanton |
|
IMPROVEMENT IN DETECTION OF TRACE HAZARDOUS MATERIALS FOR RoHS DIRECTIVE USING A HIGH EFFICIENCY SILICON DRIFT DETECTOR L. Feng, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori, L. Feng, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori |
|
APPLICATIONS OF XRF IN THE ALUMINUM INDUSTRY F.R. Feret, F.R. Feret |
|
Stardust: The Mission and the Critical Role of X-Ray Chemical Analysis George J. Flynn, George J. Flynn |
|
A MODEL SYSTEM FOR AMYLOID: X-RAY AND NEUTRON SCATTERING OF THE CROSS BETA STRUCTURE OF THE EGGSTALK OF CHRYOSOPA FLAVIS S. Tiggelaar, S. Tiggelaar K.H. Gardner, K.H. Gardner D. Flot, D. Flot R.C. Denny, R.C. Denny V.T. Forsyth, V.T. Forsyth |
|
DEVELOPMENT OF AN EFFECTIVE FUSION PROCEDURE FOR CATALYTS J.-P. Gagnon, J.-P. Gagnon |
|
CHARACTERIZATION OF THE STRUCTURE AND COMPOSITION OF GECKO ADHESIVE SETAE: A MICRODIFFRACTION STUDY N.W. Rizzo, D.L. Hallahan, R. Davidson, J.D. Londono, N.W. Rizzo, D.L. Hallahan, R. Davidson, J.D. Londono D. Walls, D. Walls K.H. Gardner, K.H. Gardner |
|
INTEGRATED SYSTEM OF MONTE CARLO LIBRARY LEAST SQUARE METHOD ON X-RAY ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSIS Fusheng Li, Fusheng Li |
|
ELASTIC PROPERTIES OF METALLIC THIN FILMS : 2D SYNCHROTRON XRD ANALYSIS AND IN SITU TENSILE TESTING G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, B. Girault, G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, B. Girault |
|
ELASTIC PROPERTIES OF NANO-STRUCTURED THIN FILMS: CHARACTERIZATION AND MODELING G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, P. Villain, B. Girault, G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, P. Villain, B. Girault O. Castelnau, R. Chiron, R. Randriamazaoro, O. Castelnau, R. Chiron, R. Randriamazaoro D. Thiaudière, D. Thiaudière |
|
MICRO SCANNING XRF, XANES AND XRD STUDIES OF THE DECORATED SURFACE OF ROMAN TERRA SIGILLATA CERAMICS C. Mirguet, P. Sciau, C. Mirguet, P. Sciau P. Goudeau, P. Goudeau A. Metha, P. Pianetta, Z. Liu, A. Metha, P. Pianetta, Z. Liu N. Tamura, N. Tamura |
|
IN SITU HTXRD OF DIATOM DISPLACEMENT REACTIONS OF VARYING PARTICLE SIZES Phillip Grahamn, Phillip Grahamn Kenneth Sandhage, Kenneth Sandhage Robert L. Snyder, Robert L. Snyder |
|
DETERMINATION OF K TO L VACANCY TRANSFER PROBABILITIES I. Han, I. Han F. Demir, F. Demir L. Demir, L. Demir G. Budak, G. Budak Y. Sahin, Y. Sahin |
|
EDXRF ANALYSIS OF OILS,FUELS AND OTHER FLUIDS, ON BOARD MARINE VESSELS P. Hardman, B.Hubbard-Nelson, B.Connors, I. Rosenberg., P. Hardman, B.Hubbard-Nelson, B.Connors, I. Rosenberg. |
|
COMBINATION OF EPMA AND MICRO-XRF IN AN SEM - STEPS TO A COMPLETE ELEMENTAL ANALYIS? Michael Haschke, Michael Haschke Frank Eggert, Frank Eggert Time W.Elam, Time W.Elam |
|
AEROSOL FILTER ANALYSIS USING SCANNING MICRO X-RAY FLUORESCENCE George J. Havrilla*, Velma Montoya, Lav Tandon, Stephen Lamont, George J. Havrilla*, Velma Montoya, Lav Tandon, Stephen Lamont |
|
SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE DETERMINATION Danhong Li*, Zewu Chen, Danhong Li*, Zewu Chen George J. Havrilla, George J. Havrilla |
|
OXIDATION STATE DETERMINATION USING XANES WITHOUT A SYNCHROTRON George J. Havrilla*, George J. Havrilla* Zewu Chen, Danhong Li, Zewu Chen, Danhong Li |
|
UNDERSTANDING ELEMENTAL DISTRIBUTIONS OF TRINITITE USING MICRO X-RAY FLUORESCENCE Velma Montoya*, Robert Hermes, William Strickfaden, George J. Havrilla, Velma Montoya*, Robert Hermes, William Strickfaden, George J. Havrilla |
|
ANALYSIS OF PIGMENTS USED IN A JAPANESE PAINTING Y. Hayakawa, S. Shirono, S. Miura, Y. Hayakawa, S. Shirono, S. Miura T. Matsushima, T. Matsushima |
|
XRD PHASE IDENTIFICATION WITH LINEAR AND AREA DETECTORS Bob B. He, Bob B. He |
|
MICROSTRUCTURE OF COARSE POWDERS - GRAIN BY GRAIN VIA XRD-ROCKING CURVES M. Herrmann, M. Herrmann |
|
ORGANIC LED INTERFACES STUDIED WITH RESONAT SOFT X-RAY REFLECTIVITY A. Hexemer, A. Hexemer C. Wang*, B. Watt, T. Araki, H. Ade, C. Wang*, B. Watt, T. Araki, H. Ade A. GARCIA*, T.-Q. NGUYEN, G.C. Bazan, E. J. Kramer, A. GARCIA*, T.-Q. NGUYEN, G.C. Bazan, E. J. Kramer |
|
MICRO-X-RAY FLUORESCENCE AS AN EXTENSION OF THE ANALYTICAL SCANNING ELECTRON MICROSCOPE D. Hodoroaba, M. Procop, D. Hodoroaba, M. Procop |
|
X-RAY FLUORESCENCE AT CHEMICAL LIME COMPANY - THE LIFE-BLOOD OF OUR QUALITY CONTROL PROGRAM - D.C. Hoffman, D.C. Hoffman |
|
DEVELOPMENT OF INTERGRANULAR STRAINS IN INCONEL 690 D.A. Durance, D.A. Durance R.A. Holt, R.A. Holt E.C. Oliver, E.C. Oliver R. Rogge, R. Rogge |
|
HIGH PRESISION DEPOSITION AND MULTILAYER X-RAY OPTICS R. Dietsch, Th. Holz, R. Dietsch, Th. Holz |
|
ANALYTICAL APPLICATIONS OF MULTILAYER X-RAY OPTICS T.Holz, R.Dietsch, T.Holz, R.Dietsch N.N., T. Leisegang, D.C. Meyer, N.N., T. Leisegang, D.C. Meyer |
|
THE NEW ENGINEERING NEUTRON DIFFRACTION INSTRUMENT AT HFIR AND ITS APPLICATION TO STUDIES OF THE BEHAVIOR OF STRUCTURAL MATERIALS C.R. Hubbard, C.R. Hubbard W.B. Bailey, W.B. Bailey K. An, K. An |
|
LATTICE STRAIN/STRESS MAPPING AROUND A FATIGUE CRACK DURING THE RETARDATION PERIOD AFTER AN OVERLOAD Y. Sun, Y. Sun K. An, K. An Y.F. Gao, Y.F. Gao C. R. Hubbard, C. R. Hubbard H. Choo , H. Choo P. K. Liaw, P. K. Liaw |
|
ANALYSIS OF FILTER DEBRIS USING ENERGY DISPERSIVE X-RAY FLUORESCENCE Gary R. Humphrey, Gary R. Humphrey |
|
IN SITU STRESS MEASUREMENT OF BIAXIALLY STRAINED AA5754-O Mark A. Iadicola, Mark A. Iadicola Thomas H. Gnaeupel-Herold, Thomas H. Gnaeupel-Herold |
|
USAXS FACILITY AT ADVANCED PHOTON SOURCE FOR ANALYSIS OF MODERN MATERIALS NANOSTRUCTURES J. Ilavsky, J. Ilavsky |
|
TOWARDS AN UNDERSTANDING OF STRETCH ACTIVATION IN INSECT FLIGHT MUSCLE T.C. Irving, T.C. Irving |
|
THE NIST TES MICROCALORIMETER, NOW AND IN THE FUTURE T. Jach, N. Ritchie, T. Jach, N. Ritchie J. Ullom, J. Ullom |
|
AlGaN Growth Characteristics by HRXRD and Reciprocal Space Mapping Y.-i. Jang, B.-k. Kim, J.-w. Kim, K.-h. Park, Y.-i. Jang, B.-k. Kim, J.-w. Kim, K.-h. Park |
|
NEW APPROACHES FOR THREE-DIMENSIONAL MICROANALYSIS OF ENVIRONMENTAL AND CULTURAL HERITAGE MATERIALS K. Janssens, K. Janssens |
|
IN-SITU OBSERVATION OF THE MARTENSITIC TRANSFORMATION OF INDIVIDUAL GRAINS USING A HIGH-ENERGY X-RAY MICROBEAM E. Jimenez-Melero*, N.H. van Dijk, L. Zhao, J. Sietsma, S.E. Offerman, S. van der Zwaag, E. Jimenez-Melero*, N.H. van Dijk, L. Zhao, J. Sietsma, S.E. Offerman, S. van der Zwaag J.P. Wright, J.P. Wright |
|
HIGH TEMPERATURE X-RAY DIFFRACTION ANALYSIS OF DEFENSE WASTE PROCESSING FACILITY SLUDGES AND SLURRIES David M Missimer, Ronny L. Rutherford, David M Missimer, Ronny L. Rutherford |
|
CHARACTERIZATION OF NANOCOMPISITE FILLER MORPHOLOGY USING ULTRA SMALL-ANGLE X-RAY SCATTERING Ryan S. Justice, Ryan S. Justice Dale W. Schaefer, Dale W. Schaefer |
|
IN SITU NEUTRON DIFFRACTION STUDY OF B2 ORDERED FeCo UNDER COMPRESSIVE LOADING Saurabh, Kabra, Saurabh, Kabra Easo P, George, Easo P, George Donald W, Brown, Donald W, Brown |
|
AROMATIC CARBOXYLATES. TRIMELLITATES James A. Kaduk, James A. Kaduk |
|
TRACE PHASE ANALYSIS USING THE CALIBRATION CURVE METHOD UNDER VARIOUS CONDITIONS Erina Kagami*, Erina Kagami* Aya Takase, Aya Takase |
|
HIGH-THROUGHPUT SYSTEM FOR SYNCHROTRON X-RAY POWDER DIFFRACTOMETRY K. Kato*, K. Kato* M. Takata, M. Takata T. Ishikawa, T. Ishikawa |
|
HANDY WAVEGUIDE TXRF SPECTROMETER FOR ng SENSITIVITY J. Kawai, S. Kunimura, J. Kawai, S. Kunimura |
|
TOTAL REFLECTION OF X-RAYS IS AN INTERFERENCE EFFECT J. Kawai, J. Kawai |
|
PERFORMANCE OF A BOREHOLE XRF SPECTROMETER FOR PLANETARY EXPLORATION Warren C. Kelliher*, Warren C. Kelliher* Ingrid A. Carlberg, Ingrid A. Carlberg W.T.Elam, W.T.Elam |
|
In-situ Structural Analysis of BPDA-PPD Polyimide Thin Film using Two-dimensional Grazing Incidence X-ray Diffraction J. Kikuma, T. Nayuki, G. Asano, S. Matsuno, J. Kikuma, T. Nayuki, G. Asano, S. Matsuno |
|
FAST XRPD MEASUREMENT OF POWDERS BY USING IMAGE-PLATE AND ROTATING ANODE SOURCE - COMPARISON WITH CONVENTIONAL BRAGG-BRENTANO DIFFRACTOMETER G. Kimmel, D. Mogilyanski, G. Kimmel, D. Mogilyanski |
|
GONIOMETER INDUCED BIAS IN PEAK POSITION MAP DATA K.W. Kirchner, K.A. Jones, K.W. Kirchner, K.A. Jones |
|
X-RAY ANALYSIS OF VLS-GROWN, VERTICALLY-ALIGNED ZnO NANORODS Melanie Kirkham*, Melanie Kirkham* Xudong Wang, Xudong Wang Zhong Lin Wang, Zhong Lin Wang Robert L. Snyder, Robert L. Snyder |
|
TIME-RESOLVED SAXS EXPERIMENTS USING A LABORATORY SOURCE P. Kotnik, H. Schnablegger, P. Kotnik, H. Schnablegger Ch. Moitzi, O. Glatter, Ch. Moitzi, O. Glatter |
|
HYDROSTATIC PRESSURE CELL FOR SMALL-ANGLE X-RAY DIFFRACTION EXPERIMENTS. M. Kriechbaum*, H. Amenitsch, P. Laggner, M. Kriechbaum*, H. Amenitsch, P. Laggner M. Steinhart, M. Steinhart |
|
SOLID-SUPPORTED ALIGNED NANOSTRUCTURES PROBED BY SYNCHROTRON AND LABORATORY-GISAXS. Manfred Kriechbaum*, Heinz Amenitsch and Peter Laggner, Manfred Kriechbaum*, Heinz Amenitsch and Peter Laggner Milos Steinhart, Milos Steinhart |
|
SAMPLING PREPARATION INFLUENCE ON RATIOS OF CLAY MINERALS ACCORDING BY XRD INVESTIGATION V.V. Krupskaya*, L.A. Levitskaya, V.V. Krupskaya*, L.A. Levitskaya T. N. Alekseeva, T. N. Alekseeva V. N. Sokolov, V. N. Sokolov I. A. Andreeva, A. A. Krylov, I. A. Andreeva, A. A. Krylov |
|
Analysis of \"non-ideal\" samples by EDXRF for Cr, Hg, Pb, Br and Cd in a variety of consumer electronic components R.Kubicek*, L.Oelofse, E.Villarreal, R.Kubicek*, L.Oelofse, E.Villarreal |
|
VARIOUS APPLICATIONS OF A PORTABLE TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER Shinsuke KUNIMURA, Shinsuke KUNIMURA Daisuke WATANABE, Daisuke WATANABE Jun KAWAI, Jun KAWAI |
|
A Method of X- Ray Hologram Registration for Fresnel Region A. V. Kuyumchyan, V. V. Aristov , A. V. Kuyumchyan, V. V. Aristov E. Sarkisian , E. Sarkisian R.. T Gabrielyan, A. K. Lorsabyan, R.. T Gabrielyan, A. K. Lorsabyan A.A. Hambardzumyan, A.A. Hambardzumyan |
|
A COMPACT HIGH-BRILLIANCE SAXS/SWAXS/GISAXS-INSTRUMENT FOR LABORATORY USE Peter Laggner, Manfred Kriechbaum, Peter Laggner, Manfred Kriechbaum |
|
EMPLOYING X-RAY SCATTERING TO CHARACTERIZE MATERIALS WITH GRAIN SIZES IN THE NANO-REGIME E.A. Laitila, D.E. Mikkola, E.A. Laitila, D.E. Mikkola |
|
THE STRUCTURE OF CELLULOSES Paul Langan, Paul Langan |
|
HIGH RESOLUTION X-RAY STUDY OF SELF-ORGANIZED InAs/GaSb NANOWIRE ARRAYS J. Li, A. Tripathi, L. Fields, T. McNulty, J. Li, A. Tripathi, L. Fields, T. McNulty D. Stokes, K. Bassler, S. Moss, D. Stokes, K. Bassler, S. Moss |
|
CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY OF Ba(R, R’)2CuO5 (R and R’=LANTHANIDES) G. Liu, W. Wong-Ng, Q. Huang, L.P. Cook, G. Liu, W. Wong-Ng, Q. Huang, L.P. Cook J.A. Kaduk, J.A. Kaduk C. Lucas, S. Diwanji, C. Lucas, S. Diwanji |
|
IN-SITU CHARACTERIZATION OF TA THIN FILM RESISTORS FOR THERMAL INK JET DEVICES Greg S., Long, Greg S., Long |
|
HIGH-PRESSURE STRUCTURAL STUDIES AND THE MAGNETIC PROPERTIES OF Sr2CuOsO6 M.W. Lufaso, M.W. Lufaso W.R. Gemmill, S. Mugavero, H.-C. zur Loye, W.R. Gemmill, S. Mugavero, H.-C. zur Loye |
|
“Analysis & methodology for improving crystal performance in beamline optics using x-ray topography” J. A. Maj*, G. J. Waldschmidt, A. T. Macrander, Y.C. Zhong, X. R. Huang , J. A. Maj*, G. J. Waldschmidt, A. T. Macrander, Y.C. Zhong, X. R. Huang L. D. Maj, L. D. Maj |
|
MONTE-CARLO SIMULATION OF PROJECTIONS IN COMPUTED TOMOGRAPHY M. Mantler, B. Chyba, M. Mantler, B. Chyba M. Reiter, M. Reiter |
|
A NOVEL XRD/XRF INSTRUMENT FOR IN SITU ANALYSIS OF PLANETARY SURFACES L.Marinangeli, A. Baliva, F. Critani, L.Marinangeli, A. Baliva, F. Critani A. Stevoli, L. Scandelli, A. Stevoli, L. Scandelli I. Hutchinson, A. Holland, I. Hutchinson, A. Holland R. Delhez, R. Delhez N. Nelms, N. Nelms |
|
STRUCTURAL CHARACTERIZATION BY XRD OF ZnXCd1-XS FILMS GROWN BY CHEMICAL BATH DEPOSITION (CBD) J. Martínez, R. Galeazzi, F. Flores, J. Martínez, R. Galeazzi, F. Flores O. Portillo-Moreno, H. Lima-Lima, O. Portillo-Moreno, H. Lima-Lima R. Palomino, R. Palomino G. Juarez, G. Juarez |
|
DETERMINATION OF THE OXIDATION STATE OF IRON-CONTAMINATIONS ON SILICON WAFER SURFACES WITH K-EDGE TXRF XANES F. Meirer, C. Streli, P. Wobrauschek, C. Horntrich, F. Meirer, C. Streli, P. Wobrauschek, C. Horntrich G. Pepponi, G. Pepponi M.A. Zaitz, M.A. Zaitz G. Falkenberg, G. Falkenberg |
|
HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES ON THE STABILITY OF NICKEL ALUMINOSILICATE PHASES Michelene E, Miller*, Michelene E, Miller* Scott T, Misture, Scott T, Misture |
|
CRYSTALLIZATION AND STABILITY OF GLASS SEALANTS FOR SOLID OXIDE FUEL CELLS S.T. Misture, S.T. Misture |
|
IN SITU CHARACTERIZATION OF HIGH-TEMPERATURE SHIFT CATALYSTS A.M. Molenbroek, A.M. Molenbroek R.E. Johnsen, R.E. Johnsen K. Ståhl, K. Ståhl |
|
CHARACTERIZATION OF MESOPOROUS MATERIALS USING AREA DETECTOR BY TRANSMISSION XRD J.A. Montoya , P. del Angel, J.A. Montoya , P. del Angel |
|
NEW ADVANCES IN ELEMENTAL X-RAY IMAGING: THE CHEMICAL FOSSIL R.W. Morton, K.G. Huntley, J.F. Geibel, R.W. Morton, K.G. Huntley, J.F. Geibel P.L. Larson, P.L. Larson U. Bergmann, U. Bergmann G.J. Havrilla, G.J. Havrilla N.A. Morton, N.A. Morton |
|
REAL-SPACE STRAIN MAPPING OF SOI FEATURES USING MICROBEAM X-RAY DIFFRACTION Conal E. Murray, Conal E. Murray |
|
In-Situ Diffraction Studies of Nanotubes Reinforcement in Polyacrylonitirile Fibers W. Wang, N.S. Murthy, W. Wang, N.S. Murthy H.G. Chae, S. Kumar, H.G. Chae, S. Kumar |
|
Micellar Structures in Molten Polyethylene-Graft-Poly(Ethylene Oxide) Copolymers, and Crystalline Structures in the Solid Phase P.R. Mark, N.S. Murthy, P.R. Mark, N.S. Murthy S. Weigand, S. Weigand K. Breitenkamp, M. Kade, T. Emrick, K. Breitenkamp, M. Kade, T. Emrick |
|
PHOTOCATALYTIC BEHAVIOR OF MODIFIED AURIVILLIUS CERAMICS T.A. Nedimyer, H.J. Kim, S.T. Misture, T.A. Nedimyer, H.J. Kim, S.T. Misture |
|
NONDESTRUCTIVE MINERAL IDENTIFICATION OF PIGMENTS IN PERUVIAN POTTERY J.M. Neil, E. Willis, J. Eerkens, A. Navrotsky, J.M. Neil, E. Willis, J. Eerkens, A. Navrotsky K. Vaughn, K. Vaughn |
|
High Performance Silicon Drift Detectors with Integrated FET for XRF analysis A. Niculae*, H. soltau, P. Lechner, A. Liebl, G. Lutz, R. Eckhard, A. Niculae*, H. soltau, P. Lechner, A. Liebl, G. Lutz, R. Eckhard L. Strüder, G. Schaller, F. Schopper, L. Strüder, G. Schaller, F. Schopper |
|
A SIMPLE METHOD FOR MAKING RANDOM AGGREGATES OF CLAY-BEARING MINERALS FOR X-RAY POWDER DIFFRACTION ANALYSIS O. Omotoso, O. Omotoso |
|
oorlszbq nizdnipm, nizdnipm oorlszbq, oorlszbq oorlszbq, oorlszbq oorlszbq, oorlszbq oorlszbq, oorlszbq oorlszbq, oorlszbq |
|
TRACKING THE LIQUID PHASE COMPOSITION DURING GLASS MELTING: ANOTHER APPLICATION OF IN-SITU DIFFRACTION E.A. Ordway, S.T. Misture, E.A. Ordway, S.T. Misture |
|
PHASE STABILITY OF SOFC CATHODE MATERIALS LANTHANUM STRONTIUM COBALT OXIDE AND LANTHANUM STRONTIUM IRON OXIDE UNDER LOW PARTIAL PRESSURES OF OXYGEN J. Ovenstone, J. White, S.T. Misture, J. Ovenstone, J. White, S.T. Misture |
|
ED-XRF USING MULTILAYER FILTER FOR TUNABLE QUASI-MONOCHROMATIC X-RAYS Kwon Su Chon, Kwon Su Chon Jerry Park, Jerry Park Kwon Ha Yoon, Kwon Ha Yoon |
|
COMPARISON AND APPLICATION OF CONFOCAL MICRO X-RAY FLUORESCENCE AND MICRO X-RAY COMPUTED TOMOGRAPHY TO MATERIALS CHARACTERIZATION B.M. Patterson*, G.J. Havrilla, B.M. Patterson*, G.J. Havrilla |
|
Development of a High Throughput Vacuum Spectrometer B.P.Perley*,D.J.Shadoan.M.Van de Water, F.Latora, B.P.Perley*,D.J.Shadoan.M.Van de Water, F.Latora |
|
ATOMIC-SCALE STRUCTURE OF POLYMERS AND COMPOSITES V. Petkov, V. Petkov |
|
TOTAL SCATTERING: A “COMPLETE” STRUCTURAL FINGERPRINT OF NANOPARTICLES V. Petkov, V. Petkov |
|
MATERIALS ANALYSIS WITH HANDHELD XRF FOR COMPLIANCE WITH ROHS AND WEEE DIRECTIVES - OPPORTUNITIES AND CHALLENGES S. Piorek, S. Piorek |
|
MECHANO-SYNTHESIS AND MICROSTRUCTURE CHARACTERIZATION OFNANOCRYSTALLINE TiC S. K. Pradhan, S. K. Pradhan B. Ghosh, L.K. Samanta, B. Ghosh, L.K. Samanta |
|
PbZr1-xTixO3 BY SOFT SYNTHESIS: A STRUCTURAL POINT OF VIEW S.K. Pradhan, S.K. Pradhan M. Gateshki, V. Petkov, M. Gateshki, V. Petkov M. Niederberger, M. Niederberger Y. Ren, Y. Ren |
|
IN-SITU SYNCHROTRON X-RAY STUDIES OF CREEP DAMAGE Anke Pyzalla, Anke Pyzalla Augusta Isaac, Augusta Isaac Federico Sket, Federico Sket Krzystof Dzieciol, Krzystof Dzieciol Thomas Buslaps, Thomas Buslaps Marco di Michiel, Marco di Michiel |
|
CHARACTERIZATION OF CDTE DETECTORS FOR QUANTITATIVE X-RAY SPECTROSCOPY R. Redus*, J. Pantazis, T. Pantazis, R. Redus*, J. Pantazis, T. Pantazis B. Cross, B. Cross |
|
Multi-tasking on a CCD and MWPC three-circle X-ray Diffractometer Joseph H. Reibenspies, Joseph H. Reibenspies Nattamai Bhuvanesh, Nattamai Bhuvanesh |
|
Combining 2D and point detectors for rapid and high-resolution high-energy x-ray diffraction of powders and single crystals in multiple sample environments Yang Ren, Yang Ren |
|
METALLIC FILMS ON POLYMER SUBSTRATES CHARACTERIZED BY IN SITU SYNCHROTRON X-RAY SCATTERING COUPLED WITH MECHANICAL TESTS J. Keckes, K. Martinschitz, G. Maier, M. Feuchter, J. Keckes, K. Martinschitz, G. Maier, M. Feuchter P. Kotnik, Ch. Resch, Ph. Schwarzl, P. Kotnik, Ch. Resch, Ph. Schwarzl |
|
NEW HIGH-TEMPERATURE SAMPLE STAGE FOR COMBINED REFLECTION- AND TRANSMISSION-PXRD C. Resch*, P. Hofbauer, P. Schwarzl, C. Resch*, P. Hofbauer, P. Schwarzl C. Weidenthaler, C. Weidenthaler |
|
COMET MINERALOGY FROM THE STARDUST MISSION: A CHALLENGE F.J.M. Rietmeijer, F.J.M. Rietmeijer |
|
A BERYLLIUM DOME SPECIMEN HOLDER FOR XRD ANALYSIS OF AIR SENSITIVE MATERIALS M.A. Rodriguez, T.J. Boyle, P. Yang, M.A. Rodriguez, T.J. Boyle, P. Yang D.L. Harris, D.L. Harris |
|
INSITU XRD ANALYSIS of (CFx)n BATTERIES: SIGNAL EXTRACTION BY MULTIVARIATE ANALYSIS M.A. Rodriguez, M.R. Keenan, G. Nagasubramanian, M.A. Rodriguez, M.R. Keenan, G. Nagasubramanian |
|
MICROSTRUCTURE CHARACTERIZATION OF MOLLUSK SHELLS BY XRD USING AN AREA DETECTOR A.B. Rodriguez-Navarro, A.G. Checa, A.B. Rodriguez-Navarro, A.G. Checa |
|
XRD2DSCAN A NEW SOFTWARE FOR THE AUTOMATIC ANALYSIS OF 2D DIFFRACTION PATTERNS OF POLYCRYSTALLINE MATERIALS A.B. Rodriguez-Navarro, A.B. Rodriguez-Navarro |
|
TXRF TRACE ELEMENT ANALYSIS APPLIED TO AUTHENTICITY AND PURITY CONTROL OF PHARMACEUTICAL SAMPLES H. Stosnach, A. Gross*, H. Stosnach, A. Gross* |
|
NANMATERIAL CHARACTERIZATION BY SYNCHROTRON X-RAY POWDER DIFFRACTOMETRY Challa Kumar, Rusty Louis, Sebastian Mammitzsch, Rohini De Silva, Hitesh Bagaria, Challa Kumar, Rusty Louis, Sebastian Mammitzsch, Rohini De Silva, Hitesh Bagaria |
|
RHOMBOHEDRAL - CUBIC PHASE TRANSITION CHARACTERIZATION OF (Pb,Ge)Te USING HOT-STAGE XRD J. Sariel*, J. Sariel* Y. Gelbstein, Y. Gelbstein I. Dahan, I. Dahan O. Ben-Yehuda, O. Ben-Yehuda |
|
DEVELOPMENT OF A LABORATORY INSTRUMENT IN SUPPORT OF THE NASA XRD/XRF DEPLOYMENT ON MARS P. Sarrazin, P. Sarrazin D. Blake, D. Blake D. Bish, D. Bish D. Vaniman, S. Chipera, D. Vaniman, S. Chipera |
|
THE EVALUATION OF PREFERENTIAL ALIGNMENT OF BIOLOGICAL APATITE (BAp) CRYSTALLITES IN BONE USING TRANSMISSION X-RAY DIFFRACTION METHOD K. Sasaki, K. Sasaki T. Nakano, Y. Umakoshi , T. Nakano, Y. Umakoshi T. Sasaki, T. Sasaki |
|
THE DEVELOPMENT OF TWO COLOR MULTI LAYER MIRROR SYSTEM AND IT’s APPLICATION FOR MICRO BEAM X-RAY DIFFRACTOMETRY K. Sasaki, K. Sasaki M. Maeyama, M. Maeyama Y. Hirose, T. Sasaki, Y. Hirose, T. Sasaki |
|
COMPARISON OF SIMULATED AND EXPERIMENTAL XRPD PATTERNS OF Ag WITH TWIN FAULTS USING MAUD AND DIFFAX P.J. Schields, P.J. Schields N. Dunwoody, N. Dunwoody |
|
A NOVEL HIGH RESOLUTION TUNABLE X-RAY FLUORESCENCE IMAGING SPECTROMETER FOR MATERIALS ANALYSIS S.Seshadri, M. Feser, W. Yun, S.Seshadri, M. Feser, W. Yun |
|
SAMPLE PREPARATION AND CALIBRATION FOR A ROHS/WEEE COMPLIANT SCREENING METHOD (FOR ED AND WD XRF) K. Behrens, K. Behrens A. Seyfarth, A. Seyfarth J. Sardisco, J. Sardisco |
|
BORON IN GLASS DETERMINATIONS USING WD XRF A. Seyfarth, A. Seyfarth |
|
SPECTRA(PLUS) 2.0 WITH TOUCHCONTROL™ BRUKER S8 SERIES WD-XRF APPLICATIONS AND SOFTWARE K. Behrens, A. Seyfarth, K. Behrens, A. Seyfarth |
|
NEXT GENERATION S2 RANGER XFLASH BENCHTOP ED-XRF SYSTEM A. Seyfarth, H. Ress, A. Seyfarth, H. Ress |
|
HYPERSPECTRAL NON-DESTRUCTIVE X-RAY ANALYSES OF THE 81P/WILD 2 COMETARY GRAINS A. Simionovici, A. Simionovici L. Lemelle, T. Ferroir, P. Gillet, L. Lemelle, T. Ferroir, P. Gillet J. Borg, F. Grossemy, Z. Djouadi, J. Borg, F. Grossemy, Z. Djouadi P. Bleuet, J. Susini, P. Bleuet, J. Susini |
|
What we can learn about the structure and dynamics of surfaces and thin films from off-specular scattering Sunil K Sinha, Sunil K Sinha |
|
In-Situ Neutron Diffraction Measurements during Creep Testing of Beryllium Don Brown, Don Brown Mike Prime, Mike Prime Mike Steinzig, Mike Steinzig Steve Abeln, Steve Abeln Brian Smith, Brian Smith , |
|
GENERATING HIGH BRILLIANCE X-RAY BEAMS FOR X-RAY DIFFRACTION AND SCATTERING APPLICATIONS P. Boulée, D. Cenda, P. Høghøj, V. Roger, L. Spanos, P. Boulée, D. Cenda, P. Høghøj, V. Roger, L. Spanos |
|
X-ray scattering for the study of deformation and fracture of polymers M. Stamm, M. Stamm N. Zafeiropoulos, N. Zafeiropoulos K. Schneider, K. Schneider |
|
FLEXIBLE FILAMENTOUS VIRUS STRUCTURES FROM FIBER DIFFRACTION Gerald Stubbs*, Amy Kendall, Michele McDonald, Wen Bian, Ian McCullough, Jian Shi, Phoebe Stewart, Gerald Stubbs*, Amy Kendall, Michele McDonald, Wen Bian, Ian McCullough, Jian Shi, Phoebe Stewart Esther Bullitt, Esther Bullitt David Gore, David Gore Said Ghabrial, Said Ghabrial |
|
Buffer salt crystallization during freezing and freeze drying – quantification by synchrotron X-ray diffractometry (SXRD) P. Sundaramurthi, R. Suryanarayanan, P. Sundaramurthi, R. Suryanarayanan E. Shalaev, L.A. Gatlin, , E. Shalaev, L.A. Gatlin, D. Varshney, D. Varshney S. Kumar , S. Kumar S.-W. Kang, S.-W. Kang |
|
NEXT GENERATION X-RAY DETECTOR FOR IN-HOUSE XRD T. Taguchi, T. Taguchi C. Broennimann, E.F. Eikenberry, C. Broennimann, E.F. Eikenberry |
|
A new technique for three-dimensional internal structure analysis in metallic materials: coherent x-ray diffraction microscopy Y. Takahashi, Y. Takahashi Y. Nishino, T. Ishikawa, Y. Nishino, T. Ishikawa E. Matsubara, E. Matsubara |
|
PORTABLE XRF WITH A VACUUM BEAM PATH ALLOWS DETECTION OF LIGHTER ELEMENTS Bridget E. Tannian*, Brad Hubbard-Nelson, Don Sackett, Bridget E. Tannian*, Brad Hubbard-Nelson, Don Sackett |
|
STRESS AND COMPOSITION EVALUATION FOR GRADIENT NITRIDE COATINGS A. Ulyanenkov, J. Brechbühl, A. Ulyanenkov, J. Brechbühl V.V. Uglov, V.M. Anishchik, S.V. Zlotski, T.A. Alexeeva, V.V. Uglov, V.M. Anishchik, S.V. Zlotski, T.A. Alexeeva A.Lazar, A.Lazar |
|
UNIVERSAL SOFTWARE FOR RESIDUAL STRESS EVALUATION FROM 1D AND 2D X-RAY DIFFRACTION DATA A. Ulyanenkov, A. Ulyanenkov |
|
THE DISLOCATION MODEL OF STRAIN ANISOTROPY T. Ungár, T. Ungár |
|
INVERSE ANALYSIS OF NEUTRON DIFFRACTION DATA S.Y. Lee, S.M. Motahari, E. Ustundag*, S.Y. Lee, S.M. Motahari, E. Ustundag* H. Ceylan, H. Ceylan L. Li, I.C. Noyan, L. Li, I.C. Noyan |
|
X-RAY DIFFRACTION INVESTIGATION OF FERROELECTRIC CONSTITUTIVE BEHAVIOR AT MULTIPLE LENGTH SCALES G. Tutuncu, M. Varlioglu, S.M. Motahari, E. Ustundag*, G. Tutuncu, M. Varlioglu, S.M. Motahari, E. Ustundag* U. Lienert, J. Almer, J. Bernier, D. Haeffner, U. Lienert, J. Almer, J. Bernier, D. Haeffner |
|
AU NANOPARTICLE LIQUIDS, PROTO-ASSEMBLIES AND DISPERSIONS: SAXS STUDY OF GROWTH R. Vaia, S. Diamanti, R. MacCuspie, K. Park, H. Koerner, R. Naik, R. Vaia, S. Diamanti, R. MacCuspie, K. Park, H. Koerner, R. Naik |
|
XRS, INDOOR AEROSOLS AND HUMAN HEALTH R. Van Grieken, A. Buczynska, B. Horemans, M. Stranger, A. Worobiec, R. Van Grieken, A. Buczynska, B. Horemans, M. Stranger, A. Worobiec |
|
THREE-DIMENSIONAL NANO-XRF ON COMETARY MATTER RETURNED BY NASA’S STARDUST MISSION L. Vincze, B. Vekemans, G. Silversmit, T. Schoonjans , L. Vincze, B. Vekemans, G. Silversmit, T. Schoonjans F. Brenker, S. Schmitz, F. Brenker, S. Schmitz M. Burghammer, C. Riekel, M. Burghammer, C. Riekel |
|
CAN NEUTRON DIFFRACTION CONTRIBUTE TO ELUCIDATING HOW THE GREAT PYRAMIDS OF GIZA WERE BUILT? S.C. Vogel, S.C. Vogel M.W. Barsoum, M.W. Barsoum |
|
SOFTWARE FOR ANALYSIS AND REDUCTION OF 2-D DATA S.C. Vogel, S.C. Vogel K. Knorr, K. Knorr |
|
A PAIR-DISTRIBUTION FUNCTION AND RIETVELD ANALYSIS OF AGED U-NB ALLOYS H.M. Volz, Th. Proffen, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F. Teter, D.J. Thoma, H.M. Volz, Th. Proffen, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F. Teter, D.J. Thoma M.A. Rodriguez, M.A. Rodriguez |
|
DIFFUSION OF TA AND BI IN FEPT THIN FILMS STUDIED BY GRAZING-INCIDENCE X-RAY FLUORESCENCE Xiangjun Wei*, Hongjie Xu, Xiangjun Wei*, Hongjie Xu Qing Xu, Qing Xu Hongdi Zhang, Hongdi Zhang Tianmin Wang, Tianmin Wang |
|
MANAGING AN X-RAY DIFFRACTION LABORATORY WITH RESPONSIBILITIES TO RESEARCH, DEVELOPMENT, ENGINEERING AND PRODUCTION B.R. Wheaton, B.R. Wheaton |
|
MICROFOCUSING X-RAY EQUIPMENT FOR THE LAB DIFFRACTOMETER J. Wiesmann*, C. Michaelsen, J. Graf, C. Hoffmann, J. Wiesmann*, C. Michaelsen, J. Graf, C. Hoffmann J. Lange, J. Lange |
|
PEAK INTENSITY PHENOMENON DURING IN-SITU NEUTRON DIFFRACTION EXPERIMETNS ON DUCTILE RARE EARTH INTERMETALLIC YCU Don Brown, Don Brown Bjorn Clausen, Bjorn Clausen Alan Russell, Alan Russell Karl Gschneidner, Karl Gschneidner |
|
DEVELOPMENT OF A PREDICTIVE LIFE TOOL FOR TAPERED ROLLER BEARINGS USING MEASURED RESIDUAL STRESS AND RETAINED AUSTENITE DATA B.M. Wilson, B.M. Wilson M.G. Dick, M.G. Dick |
|
TXRF ATTACHMENT MODULE MODIFIED FOR ANALYSIS IN VACUUM P. Wobrauschek, C. Streli, P. Kregsamer, F. Meirer, P. Wobrauschek, C. Streli, P. Kregsamer, F. Meirer A. Markowicz, D. Wegrzynek, A. Markowicz, D. Wegrzynek E. Chinea Cano, E. Chinea Cano |
|
STUDIES ON QUANTIFICATION OF Pb IN BONE IN VIVO USING L-SHELL EXCITATION B. Pemmer, P. Wobrauschek, C. Streli, B. Pemmer, P. Wobrauschek, C. Streli |
|
GRAZING INCIDENCE XRF ANALYSIS OF TIN CONCENTRATION OF GLASS SURFACE Takashi Yamada, Takashi Yamada Masaru Matsuo, Masaru Matsuo Naoki Kawahara, Naoki Kawahara Al Martin, Al Martin Hisashi Inoue, Hisashi Inoue |
|
TOWARD NANOMETER RESOLUTION FOR STRAIN MAPPING IN SINGLE CRYSTALS: NEW FOCUSING OPTICS AND DYNAMICAL DIFFRACTION ARTIFACTS H. Yan, H.C. Kang, J. Maser, A.T. Macrander, C. Liu, R. Conley, G.B. Stephenson, H. Yan, H.C. Kang, J. Maser, A.T. Macrander, C. Liu, R. Conley, G.B. Stephenson I.C. Noyan, O. Kalenci, I.C. Noyan, O. Kalenci |
|
CRYSTAL STRAIN QUANTIFICATION USING X-RAY IMAGING TECHNIQUE Y. Zhong, Y.S. Chu, A.T. Macrander, Y. Zhong, Y.S. Chu, A.T. Macrander |
|
ELEMENTAL IMAGING IN OSTEOARTHRITIC JOINT BONES N. Zoeger, C. Streli, F. Meirer, P. Wobrauschek, S. Smolek, A. Maderitsch, N. Zoeger, C. Streli, F. Meirer, P. Wobrauschek, S. Smolek, A. Maderitsch P. Roschger, P. Roschger J. Hofstaetter, J. Hofstaetter G. Falkenberg, G. Falkenberg |