194 of 2007 DXC abstracts sorted by correspondent author's last name

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ADVANCES IN HANDHELD XRF DESIGNS AND CHALLENGES IN MEETING RoHS/WEEE DIRECTIVES
S. Afshari, P. Bennett, S. Afshari, P. Bennett
SELF ASSEMBLY AND HIGH PRESSURE BEHAVIOR OF NON-LAMELLAR PHOSPHOLIPID PHASES ON SOLID SUPPORTS STUDIED WITH GISAXD
Heinz Amenitsch, Michael Rappolt, Manfred Kriechbaum*, Barbara Sartori, Peter Laggner, Heinz Amenitsch, Michael Rappolt, Manfred Kriechbaum*, Barbara Sartori, Peter Laggner
Milos Steinhart, Milos Steinhart
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dyksqgti, dyksqgti
arhfoqeq, arhfoqeq
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arhfoqeq, arhfoqeq
arhfoqeq, arhfoqeq
arhfoqeq, arhfoqeq
MEASUREMENT OF RESIDUAL STRESSES INSIDE 50 MM INNER DIAMETER PIPES USING A MINIATURE GONIOMETER HEAD
Mohammed Belassel, Mohammed Belassel
James Pineault, James Pineault
Michael Brauss, Michael Brauss
ANISOTROPIC LATTICE-STRAIN EVOLUTION AND PHASE TRANSFORMATION IN A COBALT-BASED SUPERALLOY UNDER UNIAXIAL LOADING
M. L. Benson*, M. L. Benson*
A. D. Stoica, X.-L. Wang, A. D. Stoica, X.-L. Wang
P. K. Liaw, H. Choo, P. K. Liaw, H. Choo
D. W. Brown, D. W. Brown
D. L. Klarstrom, D. L. Klarstrom
NON DESTRUCTIVE TESTING ON SURFACES OF INDUSTRIAL COMPONENTS FROM DISTANCE XRD
G. Berti*, G. Berti*
A. Nicoletta, A. Nicoletta
REMOTE X-RAY DIFFRACTION OF PLANETARY BODIES: WHAT IS MARS REALLY MADE OF?
D. L. Bish, D. L. Bish
D. Blake, D. Blake
P. Sarrazin, P. Sarrazin
D. Vaniman, D. Vaniman
S. Chipera, S. Chipera
X-RAY DIFFRACTION CHARACTERIZATION OF NANOMATERIALS USED IN IMAGING APPLICATIONS
T.N. Blanton, C.L. Barnes, T.N. Blanton, C.L. Barnes
CRYSTALLITE MORPHOLOGY IN GOLD CATALYSTS OBTAINED VIA RIETVELD REFINEMENT
X. Bokhimi, A. Morales, R. Zanella, X. Bokhimi, A. Morales, R. Zanella
PERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES
F.I.G.M Borges*, S.J.C. do Carmo, F.I.G.M Borges*, S.J.C. do Carmo
T.H.V.T. Dias, F.P. Santos, T.H.V.T. Dias, F.P. Santos
F.P.S.C. Gil, A.M.F. Trindade, F.P.S.C. Gil, A.M.F. Trindade
R.M. Curado, C.A.N. Conde, R.M. Curado, C.A.N. Conde
NOVEL SLICON DRIFT DETECTORS WITH ENHANCED RELIABILITY FOR INCREASING REQUIREMENTS OF ANALYTICAL APPLICATIONS
O. Boslau, T. Eggert, J. Kemmer, A. Pahlke, S. Pahlke, R. Stoetter, F. Wiest, O. Boslau, T. Eggert, J. Kemmer, A. Pahlke, S. Pahlke, R. Stoetter, F. Wiest
DEVELOPMENT OF AN X-RAY FLUORESCENCE WORKFLOW FOR HIGH THROUGHPUT CATALYST DISCOVERY PROJECT
L.L. Brehm, W.L. Shen, T.A. Hiller, L.L. Brehm, W.L. Shen, T.A. Hiller
ANALYTICAL METHODS FOR DISCRIMINATING STARDUST IN AEROGEL CAPTURE MEDIA
S. Brennan, K. Luening, K. Ignatyev, P. Pianetta, S. Brennan, K. Luening, K. Ignatyev, P. Pianetta
H.A. Ishii, J.P. Bradley, H.A. Ishii, J.P. Bradley
THE CHANDRA X-RAY OBSERVATORY: OBSERVING THE HIGH ENERGY UNIVERSE
R.J. Brissenden, R.J. Brissenden
In-Situ Neutron Diffraction During Cyclic Deformation : Studying the Reversibility of Deformation Induced Twinning and Phase Transformation
S. R. Agnew, A. Jain, S. R. Agnew, A. Jain
D. W. Brown*, B. Clausen, D. W. Brown*, B. Clausen
R. Vaidyanathan, S. Qiu, R. Vaidyanathan, S. Qiu
DETECTORS FOR DEMANDING X-RAY DIFFRACTION EXPERIMENTS
L. Brügemann, H.-G. Krane, L. Brügemann, H.-G. Krane
Y. Diawara, B. He, Y. Diawara, B. He
ENHANCING XRD2 MICRODIFFRACTION WITH FOCUSING X-RAY MICROLENSES
Christoph, Berthold, Christoph, Berthold
Jens Brechbuehl), Lutz Bruegemann, Jens Brechbuehl), Lutz Bruegemann
IMPROVING THE DETECTION LIMIT IN EDXRF WITH PROPRTIONAL COUNTER
I.A.Brytov, I.A.Brytov
A.D.Goganov, A.D.Goganov
P.I.Plotnikov, P.I.Plotnikov
NEW INSIGHTS INTO THE MINERALIZATION PROCESS OF BONE
C. Burger*, H. Zhou, B.S. Hsiao, B. Chu, C. Burger*, H. Zhou, B.S. Hsiao, B. Chu
L. Graham, M.J. Glimcher, L. Graham, M.J. Glimcher
SAXS FROM POLYMER-CLAY COMPOSITES AND OTHER LAYERED SYSTEMS
C. Burger*, P. Nawani, B.S. Hsiao, B. Chu, C. Burger*, P. Nawani, B.S. Hsiao, B. Chu
M. Gelfer, M. Gelfer
IN SITU MEASUREMENT OF HYDRATION OF MARTIAN SOILS AND ROCKS USING THE SCATTER COMPONENT OF THE XRF SPECTRUM
J.L. Campbell, R. Gellert, C.L. Mallett, J.M. O’Meara, J.A. Maxwell, J.L. Campbell, R. Gellert, C.L. Mallett, J.M. O’Meara, J.A. Maxwell
An Energy Dispersive X-ray Diffractometer for Phase Analysis of Pharmaceuticals
D.F. Carpenter, D.F. Carpenter
NANOSTRUCTURED MATERIALS CHARACTERIZATION BY X-RAY DIFFRACTION
I. Dragomir – Cernatescu, I. Dragomir – Cernatescu
R.L. Snyder, M. Kirkham, R. Yang, Z.L. Wang, R.L. Snyder, M. Kirkham, R. Yang, Z.L. Wang
LOW-POWER MONOCHROMATIC FOCUSED BEAM XRF SYSTEMS USING DOUBLY CURVED CRYSTALS
Z.W. Chen, F. Wei, B. Beumer, D. Li, W.M. Gibson, Z.W. Chen, F. Wei, B. Beumer, D. Li, W.M. Gibson
SOFT-CONFINEMENTS OF CHIRAL SMECTIC PHASES ON CRYSTALLIZATION IN THE MACROSCOPIC MONODOMAINS OF A MAIN-CHAIN NON-RACEMIC LIQUID CRYSTALLINE POLYMER
S.Z. D. Cheng, S. Jin, F.W. Harris, S.Z. D. Cheng, S. Jin, F.W. Harris
X-RAY DIFFRACTION STUDIES OF Li-BASED COMPLEX HYDRIDES AFTER PRESSURE CYCLING
W. Chien, D. Chandra*, J.H. Lamb, W. Chien, D. Chandra*, J.H. Lamb
IN-SITU NEUTRON DIFFRACTION STUDIES OF DEFORMATION-INDUCED PHASE TRANSFORMATION IN AN ULTRAFINE GRAINED TRIP STEEL
H. Choo*, K. Tao, H. Choo*, K. Tao
B. Clausen, B. Clausen
J. E. Jin, Y. K. Lee, J. E. Jin, Y. K. Lee
MICRO- AND NANO-XRD ON POLYMERS
Christian, Riekel, Christian, Riekel
POLYCRYSTALLINE DIFFRACTION IN THE 1 MM SAMPLE SIZE RANGE USING A LOW-COST INTENSIFIED CCD CAMERA AND FOCUSING OPTICS
R.A. Clapp, R.A. Clapp
X-RAYS ON MARS: HOW A HANDFUL OF PHOTONS IS HELPING REVOLUTIONIZE OUR UNDERSTANDING OF THE RED PLANET
B.C. Clark, B.C. Clark
FIELD PORTABLE XRF BEYOND TRADITIONAL HANDHELD ANALYZERS
B. Connors, B. Connors
P. Hardman, P. Hardman
D. Bilodeau, D. Bilodeau
B. Hubbard Nelson, B. Hubbard Nelson
R. Koch, R. Koch
D. Sackett, D. Sackett
DESIGNING SINGLE-BOUNCE MONOCAPILLARY X-RAY OPTICS
Sterling Cornaby, Sterling Cornaby
Thomas Szebenyi, Thomas Szebenyi
Rong Huang, Rong Huang
Donald H. Bilderback, Donald H. Bilderback
DIRECT DETERMINATION OF DOPING LEVEL IN PHOSPHOR MATERIALS FROM X-RAY SIGNAL INTENSITY RATIOS
G. Darsey, G. Darsey
INSIGHTS INTO THE DEFORMATION MECHANISMS OF hcp MATERIALS FROM A COMBINATION OF DIFFRACTION AND MICROMECHANICAL MODELING
M.R. Daymond, F. Xu, S. Cai, R.A. Holt, M.R. Daymond, F. Xu, S. Cai, R.A. Holt
ANALYSIS OF IN-SITU DEFORMATION OF HYDRIDED ZIRCALOY-2 BY SYNCHROTRON X-RAY DIFFRACTION
M. Kerr, M.R. Daymond, R.A. Holt, M. Kerr, M.R. Daymond, R.A. Holt
J.D. Almer, J.D. Almer
TRACE ELEMENTS FOR CHARACTERIZATION ARTIFICIAL AGING PAPER
M.L. Carvalho, M.L. Carvalho
ADVANCED DATA ANALYSIS ON HIGH-THROUGHPUT, HIGH-RESOLUTION XRPD DATA
Thomas Degen, Detlef Beckers, Thomas Degen, Detlef Beckers
EFFECT OF X-RAY TUBE POWER ON INTENSITIES OF Kα X-RAYS OF TRACE ELEMENTS FROM SAMPLES OBTAINED BY USING DIFFERENT SAMPLE PREPARATION METHODS IN WDXRF SPECTROMETER
F. Demir, F. Demir
I. Han, I. Han
G. Budak, G. Budak
L. Demir, L. Demir
A. Gurol, A. Gurol
A. Karabulut, A. Karabulut
DEVELOPING POWDER X-RAY DIFFRACTION (XRD) QUANTITATIVE METHOD FOR OROS® RWJ-333369 POLYMORPHS
Mehdi Varasteh, Mehdi Varasteh
Zhengyu Deng, Zhengyu Deng
Helen Hwang, Helen Hwang
Yoo Joong Kim, Yoo Joong Kim
Geoffrey B. Wong, Geoffrey B. Wong
EXPERIMENTAL STUDY OF X-RAY FLUXES FORMED BY WAVEGUIDE-RESONATORS WITH NONPARALLEL REFLECTORS
E.V. Egorov, E.V. Egorov
MINIMAL USE OF STANDARDS FOR QUANTIFYING TRACE ELEMENTS IN PLASTICS
Bruce Scruggs, Bruce Scruggs
Bob Shen, Bob Shen
Laszlo Herczeg, Laszlo Herczeg
Andrew Lee, Andrew Lee
Joseph Nicolosi, Joseph Nicolosi
Grating-Based High-Resolution Differential Phase Contrast Radiography and Tomography Using Microfocus X-Ray Sources
M. Engelhardt, M. Engelhardt
J. Baumanna, M. Schuster, J. Baumanna, M. Schuster
C. Kottler, F. Pfeiffer, O. Bunk, C. David, C. Kottler, F. Pfeiffer, O. Bunk, C. David
MIKROGAP DETECTOR TECHNOLOGY APPLIED TO SMALL ANGLE X-RAY SCATTERING
Kurt Erlacher, Kurt Erlacher
David Khazins, David Khazins
Roger Durst, Roger Durst
NEW FEATURES IN SIeve+, A PLUG-IN PROGRAM FOR PDF-4+/DDView+: HANAWALT, FINK AND LONG8 SEARCHES BASED ON REDUCED DATA AND NEW FULL PATTERN SEARCH/MATCH
J. Faber, D. Crane, J. Faber, D. Crane
FULL PATTERN COMPARISON OF EXPERIMENTAL AND CALCULATED POWDER PATTERNS USING INTEGRAL INDEX METHODS IN PDF-4+
J. Faber, J. Blanton, J. Faber, J. Blanton
DETERMINATION OF THE DISTRIBUTION OF [001] CRYSTAL DIRECTION IN GRAIN-ORIENTED SILICON STEEL BY ASYMMETRICAL X-RAY DIFFRACTION METHOD
Jianfeng, Fang, Jianfeng, Fang
A REFERENCE DIFFRACTION DATABASE FOR NON-CRYSTALLINE, PARTIALLY CRYSTALLINE AND AMORPHOUS MATERIALS
T.G. Fawcett, J. Faber, S. Kabekkodu, J. Blanton, T.G. Fawcett, J. Faber, S. Kabekkodu, J. Blanton
IMPROVEMENT IN DETECTION OF TRACE HAZARDOUS MATERIALS FOR RoHS DIRECTIVE USING A HIGH EFFICIENCY SILICON DRIFT DETECTOR
L. Feng, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori, L. Feng, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori
APPLICATIONS OF XRF IN THE ALUMINUM INDUSTRY
F.R. Feret, F.R. Feret
Stardust: The Mission and the Critical Role of X-Ray Chemical Analysis
George J. Flynn, George J. Flynn
A MODEL SYSTEM FOR AMYLOID: X-RAY AND NEUTRON SCATTERING OF THE CROSS BETA STRUCTURE OF THE EGGSTALK OF CHRYOSOPA FLAVIS
S. Tiggelaar, S. Tiggelaar
K.H. Gardner, K.H. Gardner
D. Flot, D. Flot
R.C. Denny, R.C. Denny
V.T. Forsyth, V.T. Forsyth
DEVELOPMENT OF AN EFFECTIVE FUSION PROCEDURE FOR CATALYTS
J.-P. Gagnon, J.-P. Gagnon
INTEGRATED SYSTEM OF MONTE CARLO LIBRARY LEAST SQUARE METHOD ON X-RAY ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSIS
Fusheng Li, Fusheng Li
CHARACTERIZATION OF THE STRUCTURE AND COMPOSITION OF GECKO ADHESIVE SETAE: A MICRODIFFRACTION STUDY
N.W. Rizzo, D.L. Hallahan, R. Davidson, J.D. Londono, N.W. Rizzo, D.L. Hallahan, R. Davidson, J.D. Londono
D. Walls, D. Walls
K.H. Gardner, K.H. Gardner
ELASTIC PROPERTIES OF METALLIC THIN FILMS : 2D SYNCHROTRON XRD ANALYSIS AND IN SITU TENSILE TESTING
G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, B. Girault, G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, B. Girault
ELASTIC PROPERTIES OF NANO-STRUCTURED THIN FILMS: CHARACTERIZATION AND MODELING
G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, P. Villain, B. Girault, G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, P. Villain, B. Girault
O. Castelnau, R. Chiron, R. Randriamazaoro, O. Castelnau, R. Chiron, R. Randriamazaoro
D. Thiaudière, D. Thiaudière
MICRO SCANNING XRF, XANES AND XRD STUDIES OF THE DECORATED SURFACE OF ROMAN TERRA SIGILLATA CERAMICS
C. Mirguet, P. Sciau, C. Mirguet, P. Sciau
P. Goudeau, P. Goudeau
A. Metha, P. Pianetta, Z. Liu, A. Metha, P. Pianetta, Z. Liu
N. Tamura, N. Tamura
IN SITU HTXRD OF DIATOM DISPLACEMENT REACTIONS OF VARYING PARTICLE SIZES
Phillip Grahamn, Phillip Grahamn
Kenneth Sandhage, Kenneth Sandhage
Robert L. Snyder, Robert L. Snyder
DETERMINATION OF K TO L VACANCY TRANSFER PROBABILITIES
I. Han, I. Han
F. Demir, F. Demir
L. Demir, L. Demir
G. Budak, G. Budak
Y. Sahin, Y. Sahin
EDXRF ANALYSIS OF OILS,FUELS AND OTHER FLUIDS, ON BOARD MARINE VESSELS
P. Hardman, B.Hubbard-Nelson, B.Connors, I. Rosenberg., P. Hardman, B.Hubbard-Nelson, B.Connors, I. Rosenberg.
COMBINATION OF EPMA AND MICRO-XRF IN AN SEM - STEPS TO A COMPLETE ELEMENTAL ANALYIS?
Michael Haschke, Michael Haschke
Frank Eggert, Frank Eggert
Time W.Elam, Time W.Elam
AEROSOL FILTER ANALYSIS USING SCANNING MICRO X-RAY FLUORESCENCE
George J. Havrilla*, Velma Montoya, Lav Tandon, Stephen Lamont, George J. Havrilla*, Velma Montoya, Lav Tandon, Stephen Lamont
SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE DETERMINATION
Danhong Li*, Zewu Chen, Danhong Li*, Zewu Chen
George J. Havrilla, George J. Havrilla
OXIDATION STATE DETERMINATION USING XANES WITHOUT A SYNCHROTRON
George J. Havrilla*, George J. Havrilla*
Zewu Chen, Danhong Li, Zewu Chen, Danhong Li
UNDERSTANDING ELEMENTAL DISTRIBUTIONS OF TRINITITE USING MICRO X-RAY FLUORESCENCE
Velma Montoya*, Robert Hermes, William Strickfaden, George J. Havrilla, Velma Montoya*, Robert Hermes, William Strickfaden, George J. Havrilla
ANALYSIS OF PIGMENTS USED IN A JAPANESE PAINTING
Y. Hayakawa, S. Shirono, S. Miura, Y. Hayakawa, S. Shirono, S. Miura
T. Matsushima, T. Matsushima
XRD PHASE IDENTIFICATION WITH LINEAR AND AREA DETECTORS
Bob B. He, Bob B. He
MICROSTRUCTURE OF COARSE POWDERS - GRAIN BY GRAIN VIA XRD-ROCKING CURVES
M. Herrmann, M. Herrmann
ORGANIC LED INTERFACES STUDIED WITH RESONAT SOFT X-RAY REFLECTIVITY
A. Hexemer, A. Hexemer
C. Wang*, B. Watt, T. Araki, H. Ade, C. Wang*, B. Watt, T. Araki, H. Ade
A. GARCIA*, T.-Q. NGUYEN, G.C. Bazan, E. J. Kramer, A. GARCIA*, T.-Q. NGUYEN, G.C. Bazan, E. J. Kramer
MICRO-X-RAY FLUORESCENCE AS AN EXTENSION OF THE ANALYTICAL SCANNING ELECTRON MICROSCOPE
D. Hodoroaba, M. Procop, D. Hodoroaba, M. Procop
X-RAY FLUORESCENCE AT CHEMICAL LIME COMPANY - THE LIFE-BLOOD OF OUR QUALITY CONTROL PROGRAM -
D.C. Hoffman, D.C. Hoffman
DEVELOPMENT OF INTERGRANULAR STRAINS IN INCONEL 690
D.A. Durance, D.A. Durance
R.A. Holt, R.A. Holt
E.C. Oliver, E.C. Oliver
R. Rogge, R. Rogge
HIGH PRESISION DEPOSITION AND MULTILAYER X-RAY OPTICS
R. Dietsch, Th. Holz, R. Dietsch, Th. Holz
ANALYTICAL APPLICATIONS OF MULTILAYER X-RAY OPTICS
T.Holz, R.Dietsch, T.Holz, R.Dietsch
N.N., T. Leisegang, D.C. Meyer, N.N., T. Leisegang, D.C. Meyer
THE NEW ENGINEERING NEUTRON DIFFRACTION INSTRUMENT AT HFIR AND ITS APPLICATION TO STUDIES OF THE BEHAVIOR OF STRUCTURAL MATERIALS
C.R. Hubbard, C.R. Hubbard
W.B. Bailey, W.B. Bailey
K. An, K. An
LATTICE STRAIN/STRESS MAPPING AROUND A FATIGUE CRACK DURING THE RETARDATION PERIOD AFTER AN OVERLOAD
Y. Sun, Y. Sun
K. An, K. An
Y.F. Gao, Y.F. Gao
C. R. Hubbard, C. R. Hubbard
H. Choo , H. Choo
P. K. Liaw, P. K. Liaw
ANALYSIS OF FILTER DEBRIS USING ENERGY DISPERSIVE X-RAY FLUORESCENCE
Gary R. Humphrey, Gary R. Humphrey
IN SITU STRESS MEASUREMENT OF BIAXIALLY STRAINED AA5754-O
Mark A. Iadicola, Mark A. Iadicola
Thomas H. Gnaeupel-Herold, Thomas H. Gnaeupel-Herold
USAXS FACILITY AT ADVANCED PHOTON SOURCE FOR ANALYSIS OF MODERN MATERIALS NANOSTRUCTURES
J. Ilavsky, J. Ilavsky
TOWARDS AN UNDERSTANDING OF STRETCH ACTIVATION IN INSECT FLIGHT MUSCLE
T.C. Irving, T.C. Irving
THE NIST TES MICROCALORIMETER, NOW AND IN THE FUTURE
T. Jach, N. Ritchie, T. Jach, N. Ritchie
J. Ullom, J. Ullom
AlGaN Growth Characteristics by HRXRD and Reciprocal Space Mapping
Y.-i. Jang, B.-k. Kim, J.-w. Kim, K.-h. Park, Y.-i. Jang, B.-k. Kim, J.-w. Kim, K.-h. Park
NEW APPROACHES FOR THREE-DIMENSIONAL MICROANALYSIS OF ENVIRONMENTAL AND CULTURAL HERITAGE MATERIALS
K. Janssens, K. Janssens
IN-SITU OBSERVATION OF THE MARTENSITIC TRANSFORMATION OF INDIVIDUAL GRAINS USING A HIGH-ENERGY X-RAY MICROBEAM
E. Jimenez-Melero*, N.H. van Dijk, L. Zhao, J. Sietsma, S.E. Offerman, S. van der Zwaag, E. Jimenez-Melero*, N.H. van Dijk, L. Zhao, J. Sietsma, S.E. Offerman, S. van der Zwaag
J.P. Wright, J.P. Wright
HIGH TEMPERATURE X-RAY DIFFRACTION ANALYSIS OF DEFENSE WASTE PROCESSING FACILITY SLUDGES AND SLURRIES
David M Missimer, Ronny L. Rutherford, David M Missimer, Ronny L. Rutherford
CHARACTERIZATION OF NANOCOMPISITE FILLER MORPHOLOGY USING ULTRA SMALL-ANGLE X-RAY SCATTERING
Ryan S. Justice, Ryan S. Justice
Dale W. Schaefer, Dale W. Schaefer
IN SITU NEUTRON DIFFRACTION STUDY OF B2 ORDERED FeCo UNDER COMPRESSIVE LOADING
Saurabh, Kabra, Saurabh, Kabra
Easo P, George, Easo P, George
Donald W, Brown, Donald W, Brown
AROMATIC CARBOXYLATES. TRIMELLITATES
James A. Kaduk, James A. Kaduk
TRACE PHASE ANALYSIS USING THE CALIBRATION CURVE METHOD UNDER VARIOUS CONDITIONS
Erina Kagami*, Erina Kagami*
Aya Takase, Aya Takase
HIGH-THROUGHPUT SYSTEM FOR SYNCHROTRON X-RAY POWDER DIFFRACTOMETRY
K. Kato*, K. Kato*
M. Takata, M. Takata
T. Ishikawa, T. Ishikawa
HANDY WAVEGUIDE TXRF SPECTROMETER FOR ng SENSITIVITY
J. Kawai, S. Kunimura, J. Kawai, S. Kunimura
TOTAL REFLECTION OF X-RAYS IS AN INTERFERENCE EFFECT
J. Kawai, J. Kawai
PERFORMANCE OF A BOREHOLE XRF SPECTROMETER FOR PLANETARY EXPLORATION
Warren C. Kelliher*, Warren C. Kelliher*
Ingrid A. Carlberg, Ingrid A. Carlberg
W.T.Elam, W.T.Elam
In-situ Structural Analysis of BPDA-PPD Polyimide Thin Film using Two-dimensional Grazing Incidence X-ray Diffraction
J. Kikuma, T. Nayuki, G. Asano, S. Matsuno, J. Kikuma, T. Nayuki, G. Asano, S. Matsuno
FAST XRPD MEASUREMENT OF POWDERS BY USING IMAGE-PLATE AND ROTATING ANODE SOURCE - COMPARISON WITH CONVENTIONAL BRAGG-BRENTANO DIFFRACTOMETER
G. Kimmel, D. Mogilyanski, G. Kimmel, D. Mogilyanski
GONIOMETER INDUCED BIAS IN PEAK POSITION MAP DATA
K.W. Kirchner, K.A. Jones, K.W. Kirchner, K.A. Jones
X-RAY ANALYSIS OF VLS-GROWN, VERTICALLY-ALIGNED ZnO NANORODS
Melanie Kirkham*, Melanie Kirkham*
Xudong Wang, Xudong Wang
Zhong Lin Wang, Zhong Lin Wang
Robert L. Snyder, Robert L. Snyder
TIME-RESOLVED SAXS EXPERIMENTS USING A LABORATORY SOURCE
P. Kotnik, H. Schnablegger, P. Kotnik, H. Schnablegger
Ch. Moitzi, O. Glatter, Ch. Moitzi, O. Glatter
SOLID-SUPPORTED ALIGNED NANOSTRUCTURES PROBED BY SYNCHROTRON AND LABORATORY-GISAXS.
Manfred Kriechbaum*, Heinz Amenitsch and Peter Laggner, Manfred Kriechbaum*, Heinz Amenitsch and Peter Laggner
Milos Steinhart, Milos Steinhart
HYDROSTATIC PRESSURE CELL FOR SMALL-ANGLE X-RAY DIFFRACTION EXPERIMENTS.
M. Kriechbaum*, H. Amenitsch, P. Laggner, M. Kriechbaum*, H. Amenitsch, P. Laggner
M. Steinhart, M. Steinhart
SAMPLING PREPARATION INFLUENCE ON RATIOS OF CLAY MINERALS ACCORDING BY XRD INVESTIGATION
V.V. Krupskaya*, L.A. Levitskaya, V.V. Krupskaya*, L.A. Levitskaya
T. N. Alekseeva, T. N. Alekseeva
V. N. Sokolov, V. N. Sokolov
I. A. Andreeva, A. A. Krylov, I. A. Andreeva, A. A. Krylov
Analysis of \"non-ideal\" samples by EDXRF for Cr, Hg, Pb, Br and Cd in a variety of consumer electronic components
R.Kubicek*, L.Oelofse, E.Villarreal, R.Kubicek*, L.Oelofse, E.Villarreal
VARIOUS APPLICATIONS OF A PORTABLE TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER
Shinsuke KUNIMURA, Shinsuke KUNIMURA
Daisuke WATANABE, Daisuke WATANABE
Jun KAWAI, Jun KAWAI
A Method of X- Ray Hologram Registration for Fresnel Region
A. V. Kuyumchyan, V. V. Aristov , A. V. Kuyumchyan, V. V. Aristov
E. Sarkisian , E. Sarkisian
R.. T Gabrielyan, A. K. Lorsabyan, R.. T Gabrielyan, A. K. Lorsabyan
A.A. Hambardzumyan, A.A. Hambardzumyan
A COMPACT HIGH-BRILLIANCE SAXS/SWAXS/GISAXS-INSTRUMENT FOR LABORATORY USE
Peter Laggner, Manfred Kriechbaum, Peter Laggner, Manfred Kriechbaum
EMPLOYING X-RAY SCATTERING TO CHARACTERIZE MATERIALS WITH GRAIN SIZES IN THE NANO-REGIME
E.A. Laitila, D.E. Mikkola, E.A. Laitila, D.E. Mikkola
THE STRUCTURE OF CELLULOSES
Paul Langan, Paul Langan
HIGH RESOLUTION X-RAY STUDY OF SELF-ORGANIZED InAs/GaSb NANOWIRE ARRAYS
J. Li, A. Tripathi, L. Fields, T. McNulty, J. Li, A. Tripathi, L. Fields, T. McNulty
D. Stokes, K. Bassler, S. Moss, D. Stokes, K. Bassler, S. Moss
CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY OF Ba(R, R’)2CuO5 (R and R’=LANTHANIDES)
G. Liu, W. Wong-Ng, Q. Huang, L.P. Cook, G. Liu, W. Wong-Ng, Q. Huang, L.P. Cook
J.A. Kaduk, J.A. Kaduk
C. Lucas, S. Diwanji, C. Lucas, S. Diwanji
IN-SITU CHARACTERIZATION OF TA THIN FILM RESISTORS FOR THERMAL INK JET DEVICES
Greg S., Long, Greg S., Long
HIGH-PRESSURE STRUCTURAL STUDIES AND THE MAGNETIC PROPERTIES OF Sr2CuOsO6
M.W. Lufaso, M.W. Lufaso
W.R. Gemmill, S. Mugavero, H.-C. zur Loye, W.R. Gemmill, S. Mugavero, H.-C. zur Loye
“Analysis & methodology for improving crystal performance in beamline optics using x-ray topography”
J. A. Maj*, G. J. Waldschmidt, A. T. Macrander, Y.C. Zhong, X. R. Huang , J. A. Maj*, G. J. Waldschmidt, A. T. Macrander, Y.C. Zhong, X. R. Huang
L. D. Maj, L. D. Maj
MONTE-CARLO SIMULATION OF PROJECTIONS IN COMPUTED TOMOGRAPHY
M. Mantler, B. Chyba, M. Mantler, B. Chyba
M. Reiter, M. Reiter
A NOVEL XRD/XRF INSTRUMENT FOR IN SITU ANALYSIS OF PLANETARY SURFACES
L.Marinangeli, A. Baliva, F. Critani, L.Marinangeli, A. Baliva, F. Critani
A. Stevoli, L. Scandelli, A. Stevoli, L. Scandelli
I. Hutchinson, A. Holland, I. Hutchinson, A. Holland
R. Delhez, R. Delhez
N. Nelms, N. Nelms
STRUCTURAL CHARACTERIZATION BY XRD OF ZnXCd1-XS FILMS GROWN BY CHEMICAL BATH DEPOSITION (CBD)
J. Martínez, R. Galeazzi, F. Flores, J. Martínez, R. Galeazzi, F. Flores
O. Portillo-Moreno, H. Lima-Lima, O. Portillo-Moreno, H. Lima-Lima
R. Palomino, R. Palomino
G. Juarez, G. Juarez
DETERMINATION OF THE OXIDATION STATE OF IRON-CONTAMINATIONS ON SILICON WAFER SURFACES WITH K-EDGE TXRF XANES
F. Meirer, C. Streli, P. Wobrauschek, C. Horntrich, F. Meirer, C. Streli, P. Wobrauschek, C. Horntrich
G. Pepponi, G. Pepponi
M.A. Zaitz, M.A. Zaitz
G. Falkenberg, G. Falkenberg
HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES ON THE STABILITY OF NICKEL ALUMINOSILICATE PHASES
Michelene E, Miller*, Michelene E, Miller*
Scott T, Misture, Scott T, Misture
CRYSTALLIZATION AND STABILITY OF GLASS SEALANTS FOR SOLID OXIDE FUEL CELLS
S.T. Misture, S.T. Misture
IN SITU CHARACTERIZATION OF HIGH-TEMPERATURE SHIFT CATALYSTS
A.M. Molenbroek, A.M. Molenbroek
R.E. Johnsen, R.E. Johnsen
K. Ståhl, K. Ståhl
CHARACTERIZATION OF MESOPOROUS MATERIALS USING AREA DETECTOR BY TRANSMISSION XRD
J.A. Montoya , P. del Angel, J.A. Montoya , P. del Angel
NEW ADVANCES IN ELEMENTAL X-RAY IMAGING: THE CHEMICAL FOSSIL
R.W. Morton, K.G. Huntley, J.F. Geibel, R.W. Morton, K.G. Huntley, J.F. Geibel
P.L. Larson, P.L. Larson
U. Bergmann, U. Bergmann
G.J. Havrilla, G.J. Havrilla
N.A. Morton, N.A. Morton
REAL-SPACE STRAIN MAPPING OF SOI FEATURES USING MICROBEAM X-RAY DIFFRACTION
Conal E. Murray, Conal E. Murray
In-Situ Diffraction Studies of Nanotubes Reinforcement in Polyacrylonitirile Fibers
W. Wang, N.S. Murthy, W. Wang, N.S. Murthy
H.G. Chae, S. Kumar, H.G. Chae, S. Kumar
Micellar Structures in Molten Polyethylene-Graft-Poly(Ethylene Oxide) Copolymers, and Crystalline Structures in the Solid Phase
P.R. Mark, N.S. Murthy, P.R. Mark, N.S. Murthy
S. Weigand, S. Weigand
K. Breitenkamp, M. Kade, T. Emrick, K. Breitenkamp, M. Kade, T. Emrick
PHOTOCATALYTIC BEHAVIOR OF MODIFIED AURIVILLIUS CERAMICS
T.A. Nedimyer, H.J. Kim, S.T. Misture, T.A. Nedimyer, H.J. Kim, S.T. Misture
NONDESTRUCTIVE MINERAL IDENTIFICATION OF PIGMENTS IN PERUVIAN POTTERY
J.M. Neil, E. Willis, J. Eerkens, A. Navrotsky, J.M. Neil, E. Willis, J. Eerkens, A. Navrotsky
K. Vaughn, K. Vaughn
High Performance Silicon Drift Detectors with Integrated FET for XRF analysis
A. Niculae*, H. soltau, P. Lechner, A. Liebl, G. Lutz, R. Eckhard, A. Niculae*, H. soltau, P. Lechner, A. Liebl, G. Lutz, R. Eckhard
L. Strüder, G. Schaller, F. Schopper, L. Strüder, G. Schaller, F. Schopper
A SIMPLE METHOD FOR MAKING RANDOM AGGREGATES OF CLAY-BEARING MINERALS FOR X-RAY POWDER DIFFRACTION ANALYSIS
O. Omotoso, O. Omotoso
oorlszbq
nizdnipm, nizdnipm
oorlszbq, oorlszbq
oorlszbq, oorlszbq
oorlszbq, oorlszbq
oorlszbq, oorlszbq
oorlszbq, oorlszbq
TRACKING THE LIQUID PHASE COMPOSITION DURING GLASS MELTING: ANOTHER APPLICATION OF IN-SITU DIFFRACTION
E.A. Ordway, S.T. Misture, E.A. Ordway, S.T. Misture
PHASE STABILITY OF SOFC CATHODE MATERIALS LANTHANUM STRONTIUM COBALT OXIDE AND LANTHANUM STRONTIUM IRON OXIDE UNDER LOW PARTIAL PRESSURES OF OXYGEN
J. Ovenstone, J. White, S.T. Misture, J. Ovenstone, J. White, S.T. Misture
ED-XRF USING MULTILAYER FILTER FOR TUNABLE QUASI-MONOCHROMATIC X-RAYS
Kwon Su Chon, Kwon Su Chon
Jerry Park, Jerry Park
Kwon Ha Yoon, Kwon Ha Yoon
COMPARISON AND APPLICATION OF CONFOCAL MICRO X-RAY FLUORESCENCE AND MICRO X-RAY COMPUTED TOMOGRAPHY TO MATERIALS CHARACTERIZATION
B.M. Patterson*, G.J. Havrilla, B.M. Patterson*, G.J. Havrilla
Development of a High Throughput Vacuum Spectrometer
B.P.Perley*,D.J.Shadoan.M.Van de Water, F.Latora, B.P.Perley*,D.J.Shadoan.M.Van de Water, F.Latora
ATOMIC-SCALE STRUCTURE OF POLYMERS AND COMPOSITES
V. Petkov, V. Petkov
TOTAL SCATTERING: A “COMPLETE” STRUCTURAL FINGERPRINT OF NANOPARTICLES
V. Petkov, V. Petkov
MATERIALS ANALYSIS WITH HANDHELD XRF FOR COMPLIANCE WITH ROHS AND WEEE DIRECTIVES - OPPORTUNITIES AND CHALLENGES
S. Piorek, S. Piorek
MECHANO-SYNTHESIS AND MICROSTRUCTURE CHARACTERIZATION OFNANOCRYSTALLINE TiC
S. K. Pradhan, S. K. Pradhan
B. Ghosh, L.K. Samanta, B. Ghosh, L.K. Samanta
PbZr1-xTixO3 BY SOFT SYNTHESIS: A STRUCTURAL POINT OF VIEW
S.K. Pradhan, S.K. Pradhan
M. Gateshki, V. Petkov, M. Gateshki, V. Petkov
M. Niederberger, M. Niederberger
Y. Ren, Y. Ren
IN-SITU SYNCHROTRON X-RAY STUDIES OF CREEP DAMAGE
Anke Pyzalla, Anke Pyzalla
Augusta Isaac, Augusta Isaac
Federico Sket, Federico Sket
Krzystof Dzieciol, Krzystof Dzieciol
Thomas Buslaps, Thomas Buslaps
Marco di Michiel, Marco di Michiel
CHARACTERIZATION OF CDTE DETECTORS FOR QUANTITATIVE X-RAY SPECTROSCOPY
R. Redus*, J. Pantazis, T. Pantazis, R. Redus*, J. Pantazis, T. Pantazis
B. Cross, B. Cross
Multi-tasking on a CCD and MWPC three-circle X-ray Diffractometer
Joseph H. Reibenspies, Joseph H. Reibenspies
Nattamai Bhuvanesh, Nattamai Bhuvanesh
Combining 2D and point detectors for rapid and high-resolution high-energy x-ray diffraction of powders and single crystals in multiple sample environments
Yang Ren, Yang Ren
METALLIC FILMS ON POLYMER SUBSTRATES CHARACTERIZED BY IN SITU SYNCHROTRON X-RAY SCATTERING COUPLED WITH MECHANICAL TESTS
J. Keckes, K. Martinschitz, G. Maier, M. Feuchter, J. Keckes, K. Martinschitz, G. Maier, M. Feuchter
P. Kotnik, Ch. Resch, Ph. Schwarzl, P. Kotnik, Ch. Resch, Ph. Schwarzl
NEW HIGH-TEMPERATURE SAMPLE STAGE FOR COMBINED REFLECTION- AND TRANSMISSION-PXRD
C. Resch*, P. Hofbauer, P. Schwarzl, C. Resch*, P. Hofbauer, P. Schwarzl
C. Weidenthaler, C. Weidenthaler
COMET MINERALOGY FROM THE STARDUST MISSION: A CHALLENGE
F.J.M. Rietmeijer, F.J.M. Rietmeijer
A BERYLLIUM DOME SPECIMEN HOLDER FOR XRD ANALYSIS OF AIR SENSITIVE MATERIALS
M.A. Rodriguez, T.J. Boyle, P. Yang, M.A. Rodriguez, T.J. Boyle, P. Yang
D.L. Harris, D.L. Harris
INSITU XRD ANALYSIS of (CFx)n BATTERIES: SIGNAL EXTRACTION BY MULTIVARIATE ANALYSIS
M.A. Rodriguez, M.R. Keenan, G. Nagasubramanian, M.A. Rodriguez, M.R. Keenan, G. Nagasubramanian
MICROSTRUCTURE CHARACTERIZATION OF MOLLUSK SHELLS BY XRD USING AN AREA DETECTOR
A.B. Rodriguez-Navarro, A.G. Checa, A.B. Rodriguez-Navarro, A.G. Checa
XRD2DSCAN A NEW SOFTWARE FOR THE AUTOMATIC ANALYSIS OF 2D DIFFRACTION PATTERNS OF POLYCRYSTALLINE MATERIALS
A.B. Rodriguez-Navarro, A.B. Rodriguez-Navarro
TXRF TRACE ELEMENT ANALYSIS APPLIED TO AUTHENTICITY AND PURITY CONTROL OF PHARMACEUTICAL SAMPLES
H. Stosnach, A. Gross*, H. Stosnach, A. Gross*
NANMATERIAL CHARACTERIZATION BY SYNCHROTRON X-RAY POWDER DIFFRACTOMETRY
Challa Kumar, Rusty Louis, Sebastian Mammitzsch, Rohini De Silva, Hitesh Bagaria, Challa Kumar, Rusty Louis, Sebastian Mammitzsch, Rohini De Silva, Hitesh Bagaria
RHOMBOHEDRAL - CUBIC PHASE TRANSITION CHARACTERIZATION OF (Pb,Ge)Te USING HOT-STAGE XRD
J. Sariel*, J. Sariel*
Y. Gelbstein, Y. Gelbstein
I. Dahan, I. Dahan
O. Ben-Yehuda, O. Ben-Yehuda
DEVELOPMENT OF A LABORATORY INSTRUMENT IN SUPPORT OF THE NASA XRD/XRF DEPLOYMENT ON MARS
P. Sarrazin, P. Sarrazin
D. Blake, D. Blake
D. Bish, D. Bish
D. Vaniman, S. Chipera, D. Vaniman, S. Chipera
THE EVALUATION OF PREFERENTIAL ALIGNMENT OF BIOLOGICAL APATITE (BAp) CRYSTALLITES IN BONE USING TRANSMISSION X-RAY DIFFRACTION METHOD
K. Sasaki, K. Sasaki
T. Nakano, Y. Umakoshi , T. Nakano, Y. Umakoshi
T. Sasaki, T. Sasaki
THE DEVELOPMENT OF TWO COLOR MULTI LAYER MIRROR SYSTEM AND IT’s APPLICATION FOR MICRO BEAM X-RAY DIFFRACTOMETRY
K. Sasaki, K. Sasaki
M. Maeyama, M. Maeyama
Y. Hirose, T. Sasaki, Y. Hirose, T. Sasaki
COMPARISON OF SIMULATED AND EXPERIMENTAL XRPD PATTERNS OF Ag WITH TWIN FAULTS USING MAUD AND DIFFAX
P.J. Schields, P.J. Schields
N. Dunwoody, N. Dunwoody
A NOVEL HIGH RESOLUTION TUNABLE X-RAY FLUORESCENCE IMAGING SPECTROMETER FOR MATERIALS ANALYSIS
S.Seshadri, M. Feser, W. Yun, S.Seshadri, M. Feser, W. Yun
BORON IN GLASS DETERMINATIONS USING WD XRF
A. Seyfarth, A. Seyfarth
SAMPLE PREPARATION AND CALIBRATION FOR A ROHS/WEEE COMPLIANT SCREENING METHOD (FOR ED AND WD XRF)
K. Behrens, K. Behrens
A. Seyfarth, A. Seyfarth
J. Sardisco, J. Sardisco
SPECTRA(PLUS) 2.0 WITH TOUCHCONTROL™ BRUKER S8 SERIES WD-XRF APPLICATIONS AND SOFTWARE
K. Behrens, A. Seyfarth, K. Behrens, A. Seyfarth
NEXT GENERATION S2 RANGER XFLASH BENCHTOP ED-XRF SYSTEM
A. Seyfarth, H. Ress, A. Seyfarth, H. Ress
HYPERSPECTRAL NON-DESTRUCTIVE X-RAY ANALYSES OF THE 81P/WILD 2 COMETARY GRAINS
A. Simionovici, A. Simionovici
L. Lemelle, T. Ferroir, P. Gillet, L. Lemelle, T. Ferroir, P. Gillet
J. Borg, F. Grossemy, Z. Djouadi, J. Borg, F. Grossemy, Z. Djouadi
P. Bleuet, J. Susini, P. Bleuet, J. Susini
What we can learn about the structure and dynamics of surfaces and thin films from off-specular scattering
Sunil K Sinha, Sunil K Sinha
In-Situ Neutron Diffraction Measurements during Creep Testing of Beryllium
Don Brown, Don Brown
Mike Prime, Mike Prime
Mike Steinzig, Mike Steinzig
Steve Abeln, Steve Abeln
Brian Smith, Brian Smith
,
GENERATING HIGH BRILLIANCE X-RAY BEAMS FOR X-RAY DIFFRACTION AND SCATTERING APPLICATIONS
P. Boulée, D. Cenda, P. Høghøj, V. Roger, L. Spanos, P. Boulée, D. Cenda, P. Høghøj, V. Roger, L. Spanos
X-ray scattering for the study of deformation and fracture of polymers
M. Stamm, M. Stamm
N. Zafeiropoulos, N. Zafeiropoulos
K. Schneider, K. Schneider
FLEXIBLE FILAMENTOUS VIRUS STRUCTURES FROM FIBER DIFFRACTION
Gerald Stubbs*, Amy Kendall, Michele McDonald, Wen Bian, Ian McCullough, Jian Shi, Phoebe Stewart, Gerald Stubbs*, Amy Kendall, Michele McDonald, Wen Bian, Ian McCullough, Jian Shi, Phoebe Stewart
Esther Bullitt, Esther Bullitt
David Gore, David Gore
Said Ghabrial, Said Ghabrial
Buffer salt crystallization during freezing and freeze drying – quantification by synchrotron X-ray diffractometry (SXRD)
P. Sundaramurthi, R. Suryanarayanan, P. Sundaramurthi, R. Suryanarayanan
E. Shalaev, L.A. Gatlin, , E. Shalaev, L.A. Gatlin,
D. Varshney, D. Varshney
S. Kumar , S. Kumar
S.-W. Kang, S.-W. Kang
NEXT GENERATION X-RAY DETECTOR FOR IN-HOUSE XRD
T. Taguchi, T. Taguchi
C. Broennimann, E.F. Eikenberry, C. Broennimann, E.F. Eikenberry
A new technique for three-dimensional internal structure analysis in metallic materials: coherent x-ray diffraction microscopy
Y. Takahashi, Y. Takahashi
Y. Nishino, T. Ishikawa, Y. Nishino, T. Ishikawa
E. Matsubara, E. Matsubara
PORTABLE XRF WITH A VACUUM BEAM PATH ALLOWS DETECTION OF LIGHTER ELEMENTS
Bridget E. Tannian*, Brad Hubbard-Nelson, Don Sackett, Bridget E. Tannian*, Brad Hubbard-Nelson, Don Sackett
STRESS AND COMPOSITION EVALUATION FOR GRADIENT NITRIDE COATINGS
A. Ulyanenkov, J. Brechbühl, A. Ulyanenkov, J. Brechbühl
V.V. Uglov, V.M. Anishchik, S.V. Zlotski, T.A. Alexeeva, V.V. Uglov, V.M. Anishchik, S.V. Zlotski, T.A. Alexeeva
A.Lazar, A.Lazar
UNIVERSAL SOFTWARE FOR RESIDUAL STRESS EVALUATION FROM 1D AND 2D X-RAY DIFFRACTION DATA
A. Ulyanenkov, A. Ulyanenkov
THE DISLOCATION MODEL OF STRAIN ANISOTROPY
T. Ungár, T. Ungár
INVERSE ANALYSIS OF NEUTRON DIFFRACTION DATA
S.Y. Lee, S.M. Motahari, E. Ustundag*, S.Y. Lee, S.M. Motahari, E. Ustundag*
H. Ceylan, H. Ceylan
L. Li, I.C. Noyan, L. Li, I.C. Noyan
X-RAY DIFFRACTION INVESTIGATION OF FERROELECTRIC CONSTITUTIVE BEHAVIOR AT MULTIPLE LENGTH SCALES
G. Tutuncu, M. Varlioglu, S.M. Motahari, E. Ustundag*, G. Tutuncu, M. Varlioglu, S.M. Motahari, E. Ustundag*
U. Lienert, J. Almer, J. Bernier, D. Haeffner, U. Lienert, J. Almer, J. Bernier, D. Haeffner
AU NANOPARTICLE LIQUIDS, PROTO-ASSEMBLIES AND DISPERSIONS: SAXS STUDY OF GROWTH
R. Vaia, S. Diamanti, R. MacCuspie, K. Park, H. Koerner, R. Naik, R. Vaia, S. Diamanti, R. MacCuspie, K. Park, H. Koerner, R. Naik
XRS, INDOOR AEROSOLS AND HUMAN HEALTH
R. Van Grieken, A. Buczynska, B. Horemans, M. Stranger, A. Worobiec, R. Van Grieken, A. Buczynska, B. Horemans, M. Stranger, A. Worobiec
THREE-DIMENSIONAL NANO-XRF ON COMETARY MATTER RETURNED BY NASA’S STARDUST MISSION
L. Vincze, B. Vekemans, G. Silversmit, T. Schoonjans , L. Vincze, B. Vekemans, G. Silversmit, T. Schoonjans
F. Brenker, S. Schmitz, F. Brenker, S. Schmitz
M. Burghammer, C. Riekel, M. Burghammer, C. Riekel
SOFTWARE FOR ANALYSIS AND REDUCTION OF 2-D DATA
S.C. Vogel, S.C. Vogel
K. Knorr, K. Knorr
CAN NEUTRON DIFFRACTION CONTRIBUTE TO ELUCIDATING HOW THE GREAT PYRAMIDS OF GIZA WERE BUILT?
S.C. Vogel, S.C. Vogel
M.W. Barsoum, M.W. Barsoum
A PAIR-DISTRIBUTION FUNCTION AND RIETVELD ANALYSIS OF AGED U-NB ALLOYS
H.M. Volz, Th. Proffen, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F. Teter, D.J. Thoma, H.M. Volz, Th. Proffen, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F. Teter, D.J. Thoma
M.A. Rodriguez, M.A. Rodriguez
DIFFUSION OF TA AND BI IN FEPT THIN FILMS STUDIED BY GRAZING-INCIDENCE X-RAY FLUORESCENCE
Xiangjun Wei*, Hongjie Xu, Xiangjun Wei*, Hongjie Xu
Qing Xu, Qing Xu
Hongdi Zhang, Hongdi Zhang
Tianmin Wang, Tianmin Wang
MANAGING AN X-RAY DIFFRACTION LABORATORY WITH RESPONSIBILITIES TO RESEARCH, DEVELOPMENT, ENGINEERING AND PRODUCTION
B.R. Wheaton, B.R. Wheaton
MICROFOCUSING X-RAY EQUIPMENT FOR THE LAB DIFFRACTOMETER
J. Wiesmann*, C. Michaelsen, J. Graf, C. Hoffmann, J. Wiesmann*, C. Michaelsen, J. Graf, C. Hoffmann
J. Lange, J. Lange
PEAK INTENSITY PHENOMENON DURING IN-SITU NEUTRON DIFFRACTION EXPERIMETNS ON DUCTILE RARE EARTH INTERMETALLIC YCU
Don Brown, Don Brown
Bjorn Clausen, Bjorn Clausen
Alan Russell, Alan Russell
Karl Gschneidner, Karl Gschneidner
DEVELOPMENT OF A PREDICTIVE LIFE TOOL FOR TAPERED ROLLER BEARINGS USING MEASURED RESIDUAL STRESS AND RETAINED AUSTENITE DATA
B.M. Wilson, B.M. Wilson
M.G. Dick, M.G. Dick
STUDIES ON QUANTIFICATION OF Pb IN BONE IN VIVO USING L-SHELL EXCITATION
B. Pemmer, P. Wobrauschek, C. Streli, B. Pemmer, P. Wobrauschek, C. Streli
TXRF ATTACHMENT MODULE MODIFIED FOR ANALYSIS IN VACUUM
P. Wobrauschek, C. Streli, P. Kregsamer, F. Meirer, P. Wobrauschek, C. Streli, P. Kregsamer, F. Meirer
A. Markowicz, D. Wegrzynek, A. Markowicz, D. Wegrzynek
E. Chinea Cano, E. Chinea Cano
GRAZING INCIDENCE XRF ANALYSIS OF TIN CONCENTRATION OF GLASS SURFACE
Takashi Yamada, Takashi Yamada
Masaru Matsuo, Masaru Matsuo
Naoki Kawahara, Naoki Kawahara
Al Martin, Al Martin
Hisashi Inoue, Hisashi Inoue
TOWARD NANOMETER RESOLUTION FOR STRAIN MAPPING IN SINGLE CRYSTALS: NEW FOCUSING OPTICS AND DYNAMICAL DIFFRACTION ARTIFACTS
H. Yan, H.C. Kang, J. Maser, A.T. Macrander, C. Liu, R. Conley, G.B. Stephenson, H. Yan, H.C. Kang, J. Maser, A.T. Macrander, C. Liu, R. Conley, G.B. Stephenson
I.C. Noyan, O. Kalenci, I.C. Noyan, O. Kalenci
CRYSTAL STRAIN QUANTIFICATION USING X-RAY IMAGING TECHNIQUE
Y. Zhong, Y.S. Chu, A.T. Macrander, Y. Zhong, Y.S. Chu, A.T. Macrander
ELEMENTAL IMAGING IN OSTEOARTHRITIC JOINT BONES
N. Zoeger, C. Streli, F. Meirer, P. Wobrauschek, S. Smolek, A. Maderitsch, N. Zoeger, C. Streli, F. Meirer, P. Wobrauschek, S. Smolek, A. Maderitsch
P. Roschger, P. Roschger
J. Hofstaetter, J. Hofstaetter
G. Falkenberg, G. Falkenberg


 

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