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ADVANCES IN HANDHELD XRF DESIGNS AND CHALLENGES IN MEETING RoHS/WEEE DIRECTIVES S. Afshari, P. Bennett, RMD Instruments, LLC, Watertown, MA |
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SELF ASSEMBLY AND HIGH PRESSURE BEHAVIOR OF NON-LAMELLAR PHOSPHOLIPID PHASES ON SOLID SUPPORTS STUDIED WITH GISAXD Heinz Amenitsch, Michael Rappolt, Manfred Kriechbaum*, Barbara Sartori, Peter Laggner, Institute of Biophysics and Nanosystems Research, Austrian Academy of Sciences, Schmieldstr. 8, 8042 Graz, Austria Milos Steinhart, Academy of Sciences of the Czech Republic, Institute of Macromolecular Chemistry, Prague, Czech Republic |
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MEASUREMENT OF RESIDUAL STRESSES INSIDE 50 MM INNER DIAMETER PIPES USING A MINIATURE GONIOMETER HEAD Mohammed Belassel, Proto Mfg. Ltd. Oldcastle, Ontario, Canada James Pineault, Proto Mfg. Ltd. Oldcastle, Ontario, Canada Michael Brauss, Proto Mfg. Inc. Ypsilanti, MI, USA |
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ANISOTROPIC LATTICE-STRAIN EVOLUTION AND PHASE TRANSFORMATION IN A COBALT-BASED SUPERALLOY UNDER UNIAXIAL LOADING M. L. Benson*, The University of Tennessee, Knoxville, TN, USA A. D. Stoica, X.-L. Wang, Spallation Neutron Source, Oak Ridge, TN, USA P. K. Liaw, H. Choo, The University of Tennessee, Knoxville, TN, USA D. W. Brown, Los Alamos National Laboratory, Los Alamos, NM, USA D. L. Klarstrom, Haynes International, Inc., Kokomo, IN, USA |
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NON DESTRUCTIVE TESTING ON SURFACES OF INDUSTRIAL COMPONENTS FROM DISTANCE XRD G. Berti*, University of Pisa A. Nicoletta, XRD-Tools academic spin off - Pisa University |
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REMOTE X-RAY DIFFRACTION OF PLANETARY BODIES: WHAT IS MARS REALLY MADE OF? D. L. Bish, Indiana University, Bloomington, IN, USA D. Blake, NASA Ames Research Center, Moffett Field, CA, USA P. Sarrazin, inXitu, Palo Alto, CA, USA D. Vaniman, Los Alamos National Laboratory, Los Alamos, NM, USA S. Chipera, Los Alamos National Laboratory, Los Alamos, NM, USA |
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X-RAY DIFFRACTION CHARACTERIZATION OF NANOMATERIALS USED IN IMAGING APPLICATIONS T.N. Blanton, C.L. Barnes, Eastman Kodak Company, Rochester, NY |
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CRYSTALLITE MORPHOLOGY IN GOLD CATALYSTS OBTAINED VIA RIETVELD REFINEMENT X. Bokhimi, A. Morales, R. Zanella, Universidad Nacional Autónoma de México, Mexico D. F., Mexico |
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PERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES F.I.G.M Borges*, S.J.C. do Carmo, Departamento de Fisica, Universidade de Coimbra, P-3004-516 Coimbra, Portugal T.H.V.T. Dias, F.P. Santos, Departamento de Fisica, Universidade de Coimbra, P-3004-516 Coimbra, Portugal F.P.S.C. Gil, A.M.F. Trindade, Departamento de Fisica, Universidade de Coimbra, P-3004-516 Coimbra, Portugal R.M. Curado, C.A.N. Conde, Departamento de Fisica, Universidade de Coimbra, P-3004-516 Coimbra, Portugal |
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NOVEL SLICON DRIFT DETECTORS WITH ENHANCED RELIABILITY FOR INCREASING REQUIREMENTS OF ANALYTICAL APPLICATIONS O. Boslau, T. Eggert, J. Kemmer, A. Pahlke, S. Pahlke, R. Stoetter, F. Wiest, Ketek GmbH |
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DEVELOPMENT OF AN X-RAY FLUORESCENCE WORKFLOW FOR HIGH THROUGHPUT CATALYST DISCOVERY PROJECT L.L. Brehm, W.L. Shen, T.A. Hiller, The Dow Chemical Company, Midland, MI |
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ANALYTICAL METHODS FOR DISCRIMINATING STARDUST IN AEROGEL CAPTURE MEDIA S. Brennan, K. Luening, K. Ignatyev, P. Pianetta, Stanford Synchrotron Radiation Laboratory, SLAC, Stanford, CA H.A. Ishii, J.P. Bradley, Lawrence Livermore National Laboratory, Livermore, CA |
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THE CHANDRA X-RAY OBSERVATORY: OBSERVING THE HIGH ENERGY UNIVERSE R.J. Brissenden, Harvard-Smithsonian Center for Astrophysics, Cambridge, MA |
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In-Situ Neutron Diffraction During Cyclic Deformation : Studying the Reversibility of Deformation Induced Twinning and Phase Transformation S. R. Agnew, A. Jain, University of Virgina D. W. Brown*, B. Clausen, Los Alamos National Lab R. Vaidyanathan, S. Qiu, University of Central Florida |
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DETECTORS FOR DEMANDING X-RAY DIFFRACTION EXPERIMENTS L. Brügemann, H.-G. Krane, Bruker AXS, Karlsruhe, Germany Y. Diawara, B. He, Bruker AXS Inc., Madison, WI |
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ENHANCING XRD2 MICRODIFFRACTION WITH FOCUSING X-RAY MICROLENSES Christoph, Berthold, Institute of Geoscience, University of Tübingen, Germany Jens Brechbuehl), Lutz Bruegemann, |
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IMPROVING THE DETECTION LIMIT IN EDXRF WITH PROPRTIONAL COUNTER I.A.Brytov, Bourevestnic,Inc Sant-Petersburg,Russia A.D.Goganov, P.I.Plotnikov, |
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NEW INSIGHTS INTO THE MINERALIZATION PROCESS OF BONE C. Burger*, H. Zhou, B.S. Hsiao, B. Chu, Stony Brook University, Stony Brook, NY, USA L. Graham, M.J. Glimcher, Harvard Medical School, Boston, MA, USA |
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SAXS FROM POLYMER-CLAY COMPOSITES AND OTHER LAYERED SYSTEMS C. Burger*, P. Nawani, B.S. Hsiao, B. Chu, Stony Brook University, Stony Brook, NY, USA M. Gelfer, Dow Chemcial Co, Freeport, TX, USA |
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IN SITU MEASUREMENT OF HYDRATION OF MARTIAN SOILS AND ROCKS USING THE SCATTER COMPONENT OF THE XRF SPECTRUM J.L. Campbell, R. Gellert, C.L. Mallett, J.M. O’Meara, J.A. Maxwell, Guelph-Waterloo Physics Institute, University of Guelph, Ontario, Canada |
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An Energy Dispersive X-ray Diffractometer for Phase Analysis of Pharmaceuticals D.F. Carpenter, Xstream Systems, Inc., Vero Beach, FL |
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NANOSTRUCTURED MATERIALS CHARACTERIZATION BY X-RAY DIFFRACTION I. Dragomir – Cernatescu, PANalytical Inc., Natick, MA R.L. Snyder, M. Kirkham, R. Yang, Z.L. Wang, Georgia Institute of Technology, Atlanta, GA |
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LOW-POWER MONOCHROMATIC FOCUSED BEAM XRF SYSTEMS USING DOUBLY CURVED CRYSTALS Z.W. Chen, F. Wei, B. Beumer, D. Li, W.M. Gibson, X-Ray Optical Systems, Inc., East Greenbush, NY |
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SOFT-CONFINEMENTS OF CHIRAL SMECTIC PHASES ON CRYSTALLIZATION IN THE MACROSCOPIC MONODOMAINS OF A MAIN-CHAIN NON-RACEMIC LIQUID CRYSTALLINE POLYMER S.Z. D. Cheng, S. Jin, F.W. Harris, The University of Akron, Akron, Ohio |
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X-RAY DIFFRACTION STUDIES OF Li-BASED COMPLEX HYDRIDES AFTER PRESSURE CYCLING W. Chien, D. Chandra*, J.H. Lamb, Metallurgical and Materials Engineering, University of Nevada, Reno, Reno, Nevada, USA |
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IN-SITU NEUTRON DIFFRACTION STUDIES OF DEFORMATION-INDUCED PHASE TRANSFORMATION IN AN ULTRAFINE GRAINED TRIP STEEL H. Choo*, K. Tao, Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA B. Clausen, Los Alamos Neutron Science Center, Los Alamos National Laboratory, Los Alamos, NM, USA J. E. Jin, Y. K. Lee, Metallurgical Engineering, Yonsei University, Seoul, Korea |
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MICRO- AND NANO-XRD ON POLYMERS Christian, Riekel, ESRF, Grenoble, France |
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POLYCRYSTALLINE DIFFRACTION IN THE 1 MM SAMPLE SIZE RANGE USING A LOW-COST INTENSIFIED CCD CAMERA AND FOCUSING OPTICS R.A. Clapp, GBC Scientific Equipment, Melbourne, Australia |
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X-RAYS ON MARS: HOW A HANDFUL OF PHOTONS IS HELPING REVOLUTIONIZE OUR UNDERSTANDING OF THE RED PLANET B.C. Clark, Space Exploration Systems, Lockheed Martin, Denver, CO |
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FIELD PORTABLE XRF BEYOND TRADITIONAL HANDHELD ANALYZERS B. Connors, Innov-X Systems, Inc., Woburn, MA, USA P. Hardman, Innov-X Systems, Inc., Woburn, MA, USA D. Bilodeau, Innov-X Systems, Inc., Woburn, MA, USA B. Hubbard Nelson, Innov-X Systems, Inc., Woburn, MA, USA R. Koch, Innov-X Systems, Inc., Woburn, MA, USA D. Sackett, Innov-X Systems, Inc., Woburn, MA, USA |
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DESIGNING SINGLE-BOUNCE MONOCAPILLARY X-RAY OPTICS Sterling Cornaby, Cornell University, Ithaca, NY, USA Thomas Szebenyi, CHESS, Ithaca, NY, USA Rong Huang, Advanced Photon Source, Argonne, IL, USA Donald H. Bilderback, Cornell University, CHESS, Ithaca, NY, USA |
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DIRECT DETERMINATION OF DOPING LEVEL IN PHOSPHOR MATERIALS FROM X-RAY SIGNAL INTENSITY RATIOS G. Darsey, Cabot Superior MicroPowders, Albuquerque, NM |
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INSIGHTS INTO THE DEFORMATION MECHANISMS OF hcp MATERIALS FROM A COMBINATION OF DIFFRACTION AND MICROMECHANICAL MODELING M.R. Daymond, F. Xu, S. Cai, R.A. Holt, Queen’s University, Ontario, Canada |
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ANALYSIS OF IN-SITU DEFORMATION OF HYDRIDED ZIRCALOY-2 BY SYNCHROTRON X-RAY DIFFRACTION M. Kerr, M.R. Daymond, R.A. Holt, Queen’s University, Ontario, Canada J.D. Almer, APS, Argonne National Laboratory, Argonne, IL |
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TRACE ELEMENTS FOR CHARACTERIZATION ARTIFICIAL AGING PAPER M.L. Carvalho, Centro de Física Atómica da Universidade de Lisboa, Lisboa, Portugal |
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ADVANCED DATA ANALYSIS ON HIGH-THROUGHPUT, HIGH-RESOLUTION XRPD DATA Thomas Degen, Detlef Beckers, PANalytical. B.V., Almelo,The Netherlands |
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EFFECT OF X-RAY TUBE POWER ON INTENSITIES OF Kα X-RAYS OF TRACE ELEMENTS FROM SAMPLES OBTAINED BY USING DIFFERENT SAMPLE PREPARATION METHODS IN WDXRF SPECTROMETER F. Demir, Ataturk University, Erzurum, Turkey I. Han, Ataturk University, Erzurum, Turkey G. Budak, Ataturk University, Erzurum, Turkey L. Demir, Ataturk University, Erzurum, Turkey A. Gurol, Ataturk University, Erzurum, Turkey A. Karabulut, Ataturk University, Erzurum, Turkey |
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DEVELOPING POWDER X-RAY DIFFRACTION (XRD) QUANTITATIVE METHOD FOR OROS® RWJ-333369 POLYMORPHS Mehdi Varasteh, ALZA Corp. Zhengyu Deng, ALZA Corp. Helen Hwang, ALZA Corp. Yoo Joong Kim, ALZA Corp. Geoffrey B. Wong, ALZA Corp. |
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EXPERIMENTAL STUDY OF X-RAY FLUXES FORMED BY WAVEGUIDE-RESONATORS WITH NONPARALLEL REFLECTORS E.V. Egorov, IMT RAS, Chernogolovka, Moscow district, Russia |
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MINIMAL USE OF STANDARDS FOR QUANTIFYING TRACE ELEMENTS IN PLASTICS Bruce Scruggs, EDAX, A Business Unit of Ametek, Inc., Mahwah, NJ USA Bob Shen, EDAX, A Business Unit of Ametek, Inc., Mahwah, NJ USA Laszlo Herczeg, EDAX, A Business Unit of Ametek, Inc., Mahwah, NJ USA Andrew Lee, EDAX, A Business Unit of Ametek, Inc., Mahwah, NJ USA Joseph Nicolosi, EDAX, A Business Unit of Ametek, Inc., Mahwah, NJ USA |
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Grating-Based High-Resolution Differential Phase Contrast Radiography and Tomography Using Microfocus X-Ray Sources M. Engelhardt, Siemens AG, Corporate Technology, München, Germany and Technische Universität München, Garching, Germany J. Baumanna, M. Schuster, Siemens AG, Corporate Technology, München, Germany C. Kottler, F. Pfeiffer, O. Bunk, C. David, Paul Scherrer Institut, Villigen, Switzerland |
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MIKROGAP DETECTOR TECHNOLOGY APPLIED TO SMALL ANGLE X-RAY SCATTERING Kurt Erlacher, Bruker AXS, Madison, WI, USA David Khazins, Bruker AXS, Madison, WI, USA Roger Durst, Bruker AXS, Madison, WI, USA |
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FULL PATTERN COMPARISON OF EXPERIMENTAL AND CALCULATED POWDER PATTERNS USING INTEGRAL INDEX METHODS IN PDF-4+ J. Faber, J. Blanton, International Centre for Diffraction Data, Newtown Square, PA |
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NEW FEATURES IN SIeve+, A PLUG-IN PROGRAM FOR PDF-4+/DDView+: HANAWALT, FINK AND LONG8 SEARCHES BASED ON REDUCED DATA AND NEW FULL PATTERN SEARCH/MATCH J. Faber, D. Crane, International Centre for Diffraction Data, Newtown Square, PA |
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DETERMINATION OF THE DISTRIBUTION OF [001] CRYSTAL DIRECTION IN GRAIN-ORIENTED SILICON STEEL BY ASYMMETRICAL X-RAY DIFFRACTION METHOD Jianfeng, Fang, Central Iron and Steel Research Institute, Beijing, P.R. China |
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A REFERENCE DIFFRACTION DATABASE FOR NON-CRYSTALLINE, PARTIALLY CRYSTALLINE AND AMORPHOUS MATERIALS T.G. Fawcett, J. Faber, S. Kabekkodu, J. Blanton, International Centre for Diffraction Data, Newtown Square, PA |
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IMPROVEMENT IN DETECTION OF TRACE HAZARDOUS MATERIALS FOR RoHS DIRECTIVE USING A HIGH EFFICIENCY SILICON DRIFT DETECTOR L. Feng, C.R. Tull, S. Barkan, V.D. Saveliev, M. Takahashi, N. Matsumori, SII NanoTechnology USA Inc., Northridge, CA |
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APPLICATIONS OF XRF IN THE ALUMINUM INDUSTRY F.R. Feret, Alcan International Limited, Jonquière, Québec, Canada |
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Stardust: The Mission and the Critical Role of X-Ray Chemical Analysis George J. Flynn, Dept. of Physics, SUNY-Plattsburgh, Plattsburgh, NY USA |
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A MODEL SYSTEM FOR AMYLOID: X-RAY AND NEUTRON SCATTERING OF THE CROSS BETA STRUCTURE OF THE EGGSTALK OF CHRYOSOPA FLAVIS S. Tiggelaar, Institut Laue Langevin, Grenoble, France and Vanderbilt University, TN K.H. Gardner, University of Delaware, Newark, DE D. Flot, EMBL Grenoble Outstation, Grenoble, France and European Synchrotron Radiation Facility, Grenoble, France R.C. Denny, Keele University, Staffordshire, UK V.T. Forsyth, Institut Laue Langevin, Grenoble, France and 5European Synchrotron Radiation Facility, Grenoble, France |
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DEVELOPMENT OF AN EFFECTIVE FUSION PROCEDURE FOR CATALYTS J.-P. Gagnon, Claisse,Québec, QC, CA |
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CHARACTERIZATION OF THE STRUCTURE AND COMPOSITION OF GECKO ADHESIVE SETAE: A MICRODIFFRACTION STUDY N.W. Rizzo, D.L. Hallahan, R. Davidson, J.D. Londono, E.I. DuPont de Nemours & Co, Experimental Station, Wilmington, DE D. Walls, University of Delaware, Newark, DE K.H. Gardner, E.I. DuPont de Nemours & Co, Experimental Station, Wilmington, DE and University of Delaware, Newark, DE |
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INTEGRATED SYSTEM OF MONTE CARLO LIBRARY LEAST SQUARE METHOD ON X-RAY ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSIS Fusheng Li, NC State University, Raleigh, NC 27695 |
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ELASTIC PROPERTIES OF METALLIC THIN FILMS : 2D SYNCHROTRON XRD ANALYSIS AND IN SITU TENSILE TESTING G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, B. Girault, Université de Poitiers, Futuroscope, France |
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ELASTIC PROPERTIES OF NANO-STRUCTURED THIN FILMS: CHARACTERIZATION AND MODELING G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, P. Villain, B. Girault, Université de Poitiers, Futuroscope, France O. Castelnau, R. Chiron, R. Randriamazaoro, Université Paris 13, Villetaneuse, France D. Thiaudière, Synchrotron SOLEIL - L'Orme des Merisiers, Gif-sur-Yvette, France |
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MICRO SCANNING XRF, XANES AND XRD STUDIES OF THE DECORATED SURFACE OF ROMAN TERRA SIGILLATA CERAMICS C. Mirguet, P. Sciau, CEMES-CNRS, Toulouse, France P. Goudeau, Université de Poitiers, Futuroscope, France A. Metha, P. Pianetta, Z. Liu, Stanford Synchrotron Radiation Lab, SLAC, Menlo Park, CA N. Tamura, ALS – LBNL, Berkeley, CA |
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IN SITU HTXRD OF DIATOM DISPLACEMENT REACTIONS OF VARYING PARTICLE SIZES Phillip Grahamn, Georgia Institute of Technology Kenneth Sandhage, Georgia Institute of Technology Robert L. Snyder, Georgia Institute of Technology |
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DETERMINATION OF K TO L VACANCY TRANSFER PROBABILITIES I. Han, Atatürk University, Erzurum, Turkey F. Demir, Atatürk University, Erzurum, Turkey L. Demir, Atatürk University, Erzurum, Turkey G. Budak, Atatürk University, Erzurum, Turkey Y. Sahin, Atatürk University, Erzurum, Turkey |
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EDXRF ANALYSIS OF OILS,FUELS AND OTHER FLUIDS, ON BOARD MARINE VESSELS P. Hardman, B.Hubbard-Nelson, B.Connors, I. Rosenberg., Innov-X Systems Inc. Woburn MA USA |
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COMBINATION OF EPMA AND MICRO-XRF IN AN SEM - STEPS TO A COMPLETE ELEMENTAL ANALYIS? Michael Haschke, IfG – Institute for Scientific Instruments GmbH, Berlin, Germany Frank Eggert, Institut für Angewandte Photonik e.V., Berlin, Germany, Time W.Elam, EDAX Inc, Mahwah, New Jersey, USA |
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AEROSOL FILTER ANALYSIS USING SCANNING MICRO X-RAY FLUORESCENCE George J. Havrilla*, Velma Montoya, Lav Tandon, Stephen Lamont, Los Alamos National Laboratory, Los Alamos, NM, USA |
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SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE DETERMINATION Danhong Li*, Zewu Chen, X-ray Optical Systems, Inc., East Greenbush, NY, USA George J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA |
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OXIDATION STATE DETERMINATION USING XANES WITHOUT A SYNCHROTRON George J. Havrilla*, Los Alamos National Laboratory, Los Alamos,NM, USA Zewu Chen, Danhong Li, X-ray Optical Systems, Inc., East Greenbush, NY, USA |
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UNDERSTANDING ELEMENTAL DISTRIBUTIONS OF TRINITITE USING MICRO X-RAY FLUORESCENCE Velma Montoya*, Robert Hermes, William Strickfaden, George J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA |
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ANALYSIS OF PIGMENTS USED IN A JAPANESE PAINTING Y. Hayakawa, S. Shirono, S. Miura, National Research Institute for Cultural Properties, Tokyo, Japan T. Matsushima, Tokyo National University of Fine Arts and Music, Tokyo, Japan |
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XRD PHASE IDENTIFICATION WITH LINEAR AND AREA DETECTORS Bob B. He, Bruker AXS |
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MICROSTRUCTURE OF COARSE POWDERS - GRAIN BY GRAIN VIA XRD-ROCKING CURVES M. Herrmann, Fraunhofer ICT, Pfinztal, Germany |
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ORGANIC LED INTERFACES STUDIED WITH RESONAT SOFT X-RAY REFLECTIVITY A. Hexemer, LBNL, Berkeley, CA, US C. Wang*, B. Watt, T. Araki, H. Ade, NCSU, Raleigh, NC, US A. GARCIA*, T.-Q. NGUYEN, G.C. Bazan, E. J. Kramer, UCSB, Santa Barbara, CA, US |
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MICRO-X-RAY FLUORESCENCE AS AN EXTENSION OF THE ANALYTICAL SCANNING ELECTRON MICROSCOPE D. Hodoroaba, M. Procop, Federal Institute for Materials Research & Testing (BAM), Berlin, Germany |
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X-RAY FLUORESCENCE AT CHEMICAL LIME COMPANY - THE LIFE-BLOOD OF OUR QUALITY CONTROL PROGRAM - D.C. Hoffman, Chemical Lime Company, Fort Worth, Texas |
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DEVELOPMENT OF INTERGRANULAR STRAINS IN INCONEL 690 D.A. Durance, Bruce Power Inc., Kincardine, Ont., Canada R.A. Holt, Queen’s University, Kingston, Ont., Canada E.C. Oliver, Rutherford Appleton Laboratory, Didcot, Chilton, UK R. Rogge, National Research Council of Canada, Chalk River, Ont., Canada |
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HIGH PRESISION DEPOSITION AND MULTILAYER X-RAY OPTICS R. Dietsch, Th. Holz, AXO DRESDEN GmbH, Heidenau, Germany |
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ANALYTICAL APPLICATIONS OF MULTILAYER X-RAY OPTICS T.Holz, R.Dietsch, AXO DRESDEN GmbH, Siegfried-Raedel-Str. 31, D-01809 Heidenau, Germany N.N., T. Leisegang, D.C. Meyer, Dresden University of Technology, Institute of Structure Physics, D-01062 Dresden, Germany |
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THE NEW ENGINEERING NEUTRON DIFFRACTION INSTRUMENT AT HFIR AND ITS APPLICATION TO STUDIES OF THE BEHAVIOR OF STRUCTURAL MATERIALS C.R. Hubbard, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6064 W.B. Bailey, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6064 K. An, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6064 |
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LATTICE STRAIN/STRESS MAPPING AROUND A FATIGUE CRACK DURING THE RETARDATION PERIOD AFTER AN OVERLOAD Y. Sun, Materials Science and Engineering Department, The University of Tennessee, Knoxville, TN 37996 K. An, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Y.F. Gao, Materials Science and Engineering Department, The University of Tennessee, Knoxville, TN 37996 C. R. Hubbard, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 H. Choo , Materials Science and Engineering Department, The University of Tennessee, Knoxville, TN 3 P. K. Liaw, |
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ANALYSIS OF FILTER DEBRIS USING ENERGY DISPERSIVE X-RAY FLUORESCENCE Gary R. Humphrey, Physical Sciences Department, Joint Oil analysis Program Technical Support Center, Pensacola, Fl |
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IN SITU STRESS MEASUREMENT OF BIAXIALLY STRAINED AA5754-O Mark A. Iadicola, Materials Science Engineering Laboratory, The National Institute of Standards and Technology, Gaithersburg, MD, USA Thomas H. Gnaeupel-Herold, NIST Center for Neutron Research, The National Institute of Standards and Technology, Gaithersburg, MD, USA |
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USAXS FACILITY AT ADVANCED PHOTON SOURCE FOR ANALYSIS OF MODERN MATERIALS NANOSTRUCTURES J. Ilavsky, Advanced Photon Source, Argonne National Laboratory, Argonne, IL |
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TOWARDS AN UNDERSTANDING OF STRETCH ACTIVATION IN INSECT FLIGHT MUSCLE T.C. Irving, Illinois Institute of Technology, Chicago, IL |
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THE NIST TES MICROCALORIMETER, NOW AND IN THE FUTURE T. Jach, N. Ritchie, National Institute of Standards and Technology, Gaithersburg, MD J. Ullom, National Institute of Standards and Technology, Boulder, CO |
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AlGaN Growth Characteristics by HRXRD and Reciprocal Space Mapping Y.-i. Jang, B.-k. Kim, J.-w. Kim, K.-h. Park, LG Electronics Institute of Technology, Seoul, Korea |
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NEW APPROACHES FOR THREE-DIMENSIONAL MICROANALYSIS OF ENVIRONMENTAL AND CULTURAL HERITAGE MATERIALS K. Janssens, University of Antwerp, Antwerp, Belgium |
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IN-SITU OBSERVATION OF THE MARTENSITIC TRANSFORMATION OF INDIVIDUAL GRAINS USING A HIGH-ENERGY X-RAY MICROBEAM E. Jimenez-Melero*, N.H. van Dijk, L. Zhao, J. Sietsma, S.E. Offerman, S. van der Zwaag, Delft University of Technology, Delft, The Netherlands J.P. Wright, European Synchrotron Radiation Facility, Grenoble, France |
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HIGH TEMPERATURE X-RAY DIFFRACTION ANALYSIS OF DEFENSE WASTE PROCESSING FACILITY SLUDGES AND SLURRIES David M Missimer, Ronny L. Rutherford, Savannah River National Laboratory, Bldg 773-A, aiken Sc 29808 USA |
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CHARACTERIZATION OF NANOCOMPISITE FILLER MORPHOLOGY USING ULTRA SMALL-ANGLE X-RAY SCATTERING Ryan S. Justice, Air Force Research Laboratoy, WPAFB, OH, USA Dale W. Schaefer, University of Cincinnati, Cincinnati, OH, USA |
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IN SITU NEUTRON DIFFRACTION STUDY OF B2 ORDERED FeCo UNDER COMPRESSIVE LOADING Saurabh, Kabra, Los Alamos National Laboratory, Los Alamos, NM, USA Easo P, George, Oak Ridge National Laboratory, Oak Ridge, TN, USA Donald W, Brown, Los Alamos National Laboratory, Los Alamos, NM, USA |
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AROMATIC CARBOXYLATES. TRIMELLITATES James A. Kaduk, INEOS Technologies |
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TRACE PHASE ANALYSIS USING THE CALIBRATION CURVE METHOD UNDER VARIOUS CONDITIONS Erina Kagami*, Rigaku corporation, Tokyo, Japan Aya Takase, Rigaku corporation, Tokyo, Japan |
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HIGH-THROUGHPUT SYSTEM FOR SYNCHROTRON X-RAY POWDER DIFFRACTOMETRY K. Kato*, RIKEN SPring-8 Center, Sayo-cho, Hyogo, Japan M. Takata, RIKEN SPring-8 Center, Sayo-cho, Hyogo, Japan T. Ishikawa, RIKEN SPring-8 Center, Sayo-cho, Hyogo, Japan |
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HANDY WAVEGUIDE TXRF SPECTROMETER FOR ng SENSITIVITY J. Kawai, S. Kunimura, Kyoto University, Kyoto, Japan |
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TOTAL REFLECTION OF X-RAYS IS AN INTERFERENCE EFFECT J. Kawai, Kyoto University, Kyoto, Japan |
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PERFORMANCE OF A BOREHOLE XRF SPECTROMETER FOR PLANETARY EXPLORATION Warren C. Kelliher*, NASA Langley Research Center, Hampton, VA 23681 Ingrid A. Carlberg, Langley Research Center, Hampton, VA 23681 W.T.Elam, Applied Physics Laboratory, Univ. of Washington, Seattle, WA 98195 |
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In-situ Structural Analysis of BPDA-PPD Polyimide Thin Film using Two-dimensional Grazing Incidence X-ray Diffraction J. Kikuma, T. Nayuki, G. Asano, S. Matsuno, Asahi-KASEI Corporation, Shizuoka, Japan |
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FAST XRPD MEASUREMENT OF POWDERS BY USING IMAGE-PLATE AND ROTATING ANODE SOURCE - COMPARISON WITH CONVENTIONAL BRAGG-BRENTANO DIFFRACTOMETER G. Kimmel, D. Mogilyanski, Ben-Gurion University of the Negev, Beer-Sheva, Israel |
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GONIOMETER INDUCED BIAS IN PEAK POSITION MAP DATA K.W. Kirchner, K.A. Jones, U.S. Army research Laboratory, Adelphi, MD |
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X-RAY ANALYSIS OF VLS-GROWN, VERTICALLY-ALIGNED ZnO NANORODS Melanie Kirkham*, Georgia Institute of Technology, Atlanta, GA, USA Xudong Wang, Georgia Institute of Technology, Atlanta, GA, USA Zhong Lin Wang, Georgia Institute of Technology, Atlanta, GA, USA Robert L. Snyder, Georgia Institute of Technology, Atlanta, GA, USA |
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TIME-RESOLVED SAXS EXPERIMENTS USING A LABORATORY SOURCE P. Kotnik, H. Schnablegger, Anton Paar GmbH, Graz, Austria Ch. Moitzi, O. Glatter, University of Graz, Graz, Austria |
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HYDROSTATIC PRESSURE CELL FOR SMALL-ANGLE X-RAY DIFFRACTION EXPERIMENTS. M. Kriechbaum*, H. Amenitsch, P. Laggner, Institute of Biophysics and Nanosystems Research, Austriam Academy of Sciences, Graz, Austria M. Steinhart, Institute of Macromolecular Chemistry, Czech Academy of Sciences, Prague, Czech Republic |
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SOLID-SUPPORTED ALIGNED NANOSTRUCTURES PROBED BY SYNCHROTRON AND LABORATORY-GISAXS. Manfred Kriechbaum*, Heinz Amenitsch and Peter Laggner, Institute of Biophysics and Nanosystems Research, Austrian Academy of Sciences, Graz, Austria Milos Steinhart, Institute of Macromolecular Chemistry, Czech Academy of Sciences, Prague, Czech Republic |
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SAMPLING PREPARATION INFLUENCE ON RATIOS OF CLAY MINERALS ACCORDING BY XRD INVESTIGATION V.V. Krupskaya*, L.A. Levitskaya, Institute of Ore Deposits, Petrology, Mineralogy and Geochemistry, Russian Academy of Science (IGEM RAS), Moscow, RF T. N. Alekseeva, Shirshov Institute of Oceanology, Russian Academy of Science (IO RAS), Moscow, RF V. N. Sokolov, Moscow State University, Geological Faculty, Moscow, RF I. A. Andreeva, A. A. Krylov, Institute of Geology and Mineral Resources of World Ocean (Okeangeologia), St. Petersburg, RF |
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Analysis of "non-ideal" samples by EDXRF for Cr, Hg, Pb, Br and Cd in a variety of consumer electronic components R.Kubicek*, L.Oelofse, E.Villarreal, Jordan Valley AR Inc. |
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VARIOUS APPLICATIONS OF A PORTABLE TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER Shinsuke KUNIMURA, Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, Japan Daisuke WATANABE, Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, Japan Jun KAWAI, Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, Japan |
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A Method of X- Ray Hologram Registration for Fresnel Region A. V. Kuyumchyan, V. V. Aristov , Institute of Microelectronics Technology RAS, 142432, Chernogolovka, Russia E. Sarkisian , International Academy of Science and Technology, Los Angeles, CA 90041, USA R.. T Gabrielyan, A. K. Lorsabyan, Yerevan State University, Department of Physics, Yerevan 375025, Manookyan Str.1, Armenia A.A. Hambardzumyan, Yerevan State University, Department of Physics, Yerevan 375025, Manookyan Str.1, Armenia |
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A COMPACT HIGH-BRILLIANCE SAXS/SWAXS/GISAXS-INSTRUMENT FOR LABORATORY USE Peter Laggner, Manfred Kriechbaum, HECUS X-ray Systems, Graz, Austria |
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EMPLOYING X-RAY SCATTERING TO CHARACTERIZE MATERIALS WITH GRAIN SIZES IN THE NANO-REGIME E.A. Laitila, D.E. Mikkola, Michigan Technological University, Houghton, MI |
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THE STRUCTURE OF CELLULOSES Paul Langan, Bioscience Division, Los Alamos National Laboratory, Los Alamos, NM, USA and Department of Chemistry, University of Toledo, Toledo, OH 53606, USA |
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HIGH RESOLUTION X-RAY STUDY OF SELF-ORGANIZED InAs/GaSb NANOWIRE ARRAYS J. Li, A. Tripathi, L. Fields, T. McNulty, Rigaku Americas Corp., The Woodlands, TX D. Stokes, K. Bassler, S. Moss, University of Houston, Houston, TX |
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CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY OF Ba(R, R’)2CuO5 (R and R’=LANTHANIDES) G. Liu, W. Wong-Ng, Q. Huang, L.P. Cook, National Institute of Standards and Technology, Gaithersburg, MD J.A. Kaduk, INEOS Technology, Naperville, IL C. Lucas, S. Diwanji, University of Maryland, MD |
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IN-SITU CHARACTERIZATION OF TA THIN FILM RESISTORS FOR THERMAL INK JET DEVICES Greg S., Long, Hewlett Packard Co. Corvallis, OR, USA |
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HIGH-PRESSURE STRUCTURAL STUDIES AND THE MAGNETIC PROPERTIES OF Sr2CuOsO6 M.W. Lufaso, University of North Florida, Jacksonville, FL W.R. Gemmill, S. Mugavero, H.-C. zur Loye, University of South Carolina, Columbia, SC |
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“Analysis & methodology for improving crystal performance in beamline optics using x-ray topography” J. A. Maj*, G. J. Waldschmidt, A. T. Macrander, Y.C. Zhong, X. R. Huang , Argonne National Laboratory, Argonne, IL 60439 L. D. Maj, The University of Chicago, Chicago, IL. 60639 |
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MONTE-CARLO SIMULATION OF PROJECTIONS IN COMPUTED TOMOGRAPHY M. Mantler, B. Chyba, Technische Universität Wien, Austria M. Reiter, Fachhochschule Wels, Austria |
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A NOVEL XRD/XRF INSTRUMENT FOR IN SITU ANALYSIS OF PLANETARY SURFACES L.Marinangeli, A. Baliva, F. Critani, IRSPS, Universita' d'Annunzio, Pescara, Italy A. Stevoli, L. Scandelli, Alcatel Alenia Space Italia, Milan, Italy I. Hutchinson, A. Holland, Brunel University, Uxbridge, United Kingdom R. Delhez, University of Technology, Delft, Netherland N. Nelms, ESA-ESTEC, Netherland |
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STRUCTURAL CHARACTERIZATION BY XRD OF ZnXCd1-XS FILMS GROWN BY CHEMICAL BATH DEPOSITION (CBD) J. Martínez, R. Galeazzi, F. Flores, CIDS-ICUAP, Benemérita Universidad Autónoma de Puebla, Puebla, México. O. Portillo-Moreno, H. Lima-Lima, Facultad de Ciencias químicas, Benemérita Universidad Autónoma de Puebla, Puebla, México. R. Palomino, Facultad de Físico-Matemáticas, Benemérita Universidad Autónoma de Puebla, Puebla, México. G. Juarez, Ingeniería Eléctrica, SEES CINVESTAV, Unidad D. F. México. |
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DETERMINATION OF THE OXIDATION STATE OF IRON-CONTAMINATIONS ON SILICON WAFER SURFACES WITH K-EDGE TXRF XANES F. Meirer, C. Streli, P. Wobrauschek, C. Horntrich, Atominstitut, TU-Wien, Vienna, Austria G. Pepponi, 2 ITC-irst, Povo (Trento), Italy M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY G. Falkenberg, HASYLAB at DESY, Hamburg, Germany |
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HIGH TEMPERATURE X-RAY DIFFRACTION STUDIES ON THE STABILITY OF NICKEL ALUMINOSILICATE PHASES Michelene E, Miller*, Alfred University, Alfred, NY, USA Scott T, Misture, Alfred University, Alfred, NY, USA |
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CRYSTALLIZATION AND STABILITY OF GLASS SEALANTS FOR SOLID OXIDE FUEL CELLS S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY |
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IN SITU CHARACTERIZATION OF HIGH-TEMPERATURE SHIFT CATALYSTS A.M. Molenbroek, Haldor Topsøe A/S, Kgs. Lyngby, Denmark R.E. Johnsen, Haldor Topsøe A/S, Kgs. Lyngby, Denmark and Technical University of Denmark, Denmark K. Ståhl, Technical University of Denmark, Denmark |
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CHARACTERIZATION OF MESOPOROUS MATERIALS USING AREA DETECTOR BY TRANSMISSION XRD J.A. Montoya , P. del Angel, Instituto Mexicano del Petróleo, México D.F, México |
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NEW ADVANCES IN ELEMENTAL X-RAY IMAGING: THE CHEMICAL FOSSIL R.W. Morton, K.G. Huntley, J.F. Geibel, The Children of the Middle Waters Institute, Bartlesville, OK P.L. Larson, Black Hills Institute of Geological Research, Inc., Hill City, SD U. Bergmann, Stanford Linear Accelerator Center, Menlo Park, CA G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM N.A. Morton, Missouri Western State University, St. Joseph, MO |
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REAL-SPACE STRAIN MAPPING OF SOI FEATURES USING MICROBEAM X-RAY DIFFRACTION Conal E. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY 10598 USA |
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In-Situ Diffraction Studies of Nanotubes Reinforcement in Polyacrylonitirile Fibers W. Wang, N.S. Murthy, University of Vermont, Burlington , VT H.G. Chae, S. Kumar, Georgia Institute of Technology, Atlanta , GA |
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Micellar Structures in Molten Polyethylene-Graft-Poly(Ethylene Oxide) Copolymers, and Crystalline Structures in the Solid Phase P.R. Mark, N.S. Murthy, University of Vermont, Burlington, Vermont S. Weigand, Argonne National Laboratory, Argonne, IL and Northwestern University, Evanston, IL K. Breitenkamp, M. Kade, T. Emrick, University of Massachusetts, Amherst, MA |
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PHOTOCATALYTIC BEHAVIOR OF MODIFIED AURIVILLIUS CERAMICS T.A. Nedimyer, H.J. Kim, S.T. Misture, Alfred University, Alfred, NY |
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NONDESTRUCTIVE MINERAL IDENTIFICATION OF PIGMENTS IN PERUVIAN POTTERY J.M. Neil, E. Willis, J. Eerkens, A. Navrotsky, University of California at Davis, Davis, CA K. Vaughn, Purdue University, West Lafayette, IN |
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High Performance Silicon Drift Detectors with Integrated FET for XRF analysis A. Niculae*, H. soltau, P. Lechner, A. Liebl, G. Lutz, R. Eckhard, PNSensor GmbH, Munich, Germany L. Strüder, G. Schaller, F. Schopper, Semiconductor Laboratory of MPI, Munich, Germany |
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A SIMPLE METHOD FOR MAKING RANDOM AGGREGATES OF CLAY-BEARING MINERALS FOR X-RAY POWDER DIFFRACTION ANALYSIS O. Omotoso, CANMET Energy Technology Centre, Alberta, Canada |
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oorlszbq nizdnipm, oorlszbq oorlszbq, oorlszbq oorlszbq, oorlszbq oorlszbq, oorlszbq oorlszbq, oorlszbq oorlszbq, oorlszbq |
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TRACKING THE LIQUID PHASE COMPOSITION DURING GLASS MELTING: ANOTHER APPLICATION OF IN-SITU DIFFRACTION E.A. Ordway, S.T. Misture, Alfred University, Alfred, NY |
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PHASE STABILITY OF SOFC CATHODE MATERIALS LANTHANUM STRONTIUM COBALT OXIDE AND LANTHANUM STRONTIUM IRON OXIDE UNDER LOW PARTIAL PRESSURES OF OXYGEN J. Ovenstone, J. White, S.T. Misture, Kazuo Inamori School of Engineering at Alfred University, Alfred, New York |
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ED-XRF USING MULTILAYER FILTER FOR TUNABLE QUASI-MONOCHROMATIC X-RAYS Kwon Su Chon, IRIS, Wonkwang University,344-2, Shinyong,Iksan,Jeollabuk-do,South korea Jerry Park, IRIS, Wonkwang University,344-2, Shinyong,Iksan,Jeollabuk-do,South korea Kwon Ha Yoon, IRIS, Wonkwang University,344-2, Shinyong,Iksan,Jeollabuk-do,South korea |
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COMPARISON AND APPLICATION OF CONFOCAL MICRO X-RAY FLUORESCENCE AND MICRO X-RAY COMPUTED TOMOGRAPHY TO MATERIALS CHARACTERIZATION B.M. Patterson*, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA |
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Development of a High Throughput Vacuum Spectrometer B.P.Perley*,D.J.Shadoan.M.Van de Water, F.Latora, Crocker Nuclear Laboratory, University of California Davis |
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ATOMIC-SCALE STRUCTURE OF POLYMERS AND COMPOSITES V. Petkov, Central Michigan University, Mt. Pleasant, MI |
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TOTAL SCATTERING: A “COMPLETE” STRUCTURAL FINGERPRINT OF NANOPARTICLES V. Petkov, Central Michigan University, Mt. Pleasant, MI |
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MATERIALS ANALYSIS WITH HANDHELD XRF FOR COMPLIANCE WITH ROHS AND WEEE DIRECTIVES - OPPORTUNITIES AND CHALLENGES S. Piorek, Thermo NITON Analyzers, LLC, Billerica, MA |
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MECHANO-SYNTHESIS AND MICROSTRUCTURE CHARACTERIZATION OFNANOCRYSTALLINE TiC S. K. Pradhan, The University of Burdwan, Burdwan, India and Central Michigan University, Mount Pleasant, MI B. Ghosh, L.K. Samanta, The University of Burdwan, Burdwan, India |
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PbZr1-xTixO3 BY SOFT SYNTHESIS: A STRUCTURAL POINT OF VIEW S.K. Pradhan, The University of Burdwan, Burdwan, India and Central Michigan University, Mount Pleasant, MI M. Gateshki, V. Petkov, Central Michigan University, Mount Pleasant, MI M. Niederberger, Max Planck Institute of Colloids and Interfaces, Potsdam, Germany and ETH Zurich, Zurich, Switzerland Y. Ren, Argonne National Laboratory, Argonne, IL |
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IN-SITU SYNCHROTRON X-RAY STUDIES OF CREEP DAMAGE Anke Pyzalla, MPI fuer Eisenforschung, Duesseldorf, Germany Augusta Isaac, MPI fuer Eisenforschung, Duesseldorf, Germany Federico Sket, MPI fuer Eisenforschung, Duesseldorf, Germany Krzystof Dzieciol, MPI fuer Eisenforschung, Duesseldorf, Germany Thomas Buslaps, ESRF, Grenoble, France Marco di Michiel, ESRF, Grenoble, France |
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CHARACTERIZATION OF CDTE DETECTORS FOR QUANTITATIVE X-RAY SPECTROSCOPY R. Redus*, J. Pantazis, T. Pantazis, Amptek, Inc,, Bedford, MA, USA B. Cross, CrossRoads Scientific, El Granada, CA, USA |
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Multi-tasking on a CCD and MWPC three-circle X-ray Diffractometer Joseph H. Reibenspies, Texas A & M University, College Station, Texas USA Nattamai Bhuvanesh, Texas A & M University, College Station, Texas USA |
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Combining 2D and point detectors for rapid and high-resolution high-energy x-ray diffraction of powders and single crystals in multiple sample environments Yang Ren, X-Ray Science Division/XOR, Argonne National Laboratory, Argonne, IL 60439 |
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METALLIC FILMS ON POLYMER SUBSTRATES CHARACTERIZED BY IN SITU SYNCHROTRON X-RAY SCATTERING COUPLED WITH MECHANICAL TESTS J. Keckes, K. Martinschitz, G. Maier, M. Feuchter, University of Leoben, Leoben, Austria P. Kotnik, Ch. Resch, Ph. Schwarzl, Anton Paar GmbH, Graz, Austria |
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NEW HIGH-TEMPERATURE SAMPLE STAGE FOR COMBINED REFLECTION- AND TRANSMISSION-PXRD C. Resch*, P. Hofbauer, P. Schwarzl, Anton Paar GmbH, Graz, AUSTRIA C. Weidenthaler, Max-Plank-Institut für Kohlenforschung, Mülheim a.d.R., GERMANY |
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COMET MINERALOGY FROM THE STARDUST MISSION: A CHALLENGE F.J.M. Rietmeijer, University of New Mexico, Albuquerque, NM |
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A BERYLLIUM DOME SPECIMEN HOLDER FOR XRD ANALYSIS OF AIR SENSITIVE MATERIALS M.A. Rodriguez, T.J. Boyle, P. Yang, Sandia National Laboratories, Albuquerque, NM D.L. Harris, Brush Wellman Electrofusion Products, Fremont, CA |
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INSITU XRD ANALYSIS of (CFx)n BATTERIES: SIGNAL EXTRACTION BY MULTIVARIATE ANALYSIS M.A. Rodriguez, M.R. Keenan, G. Nagasubramanian, Sandia National Laboratories, Albuquerque, NM |
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MICROSTRUCTURE CHARACTERIZATION OF MOLLUSK SHELLS BY XRD USING AN AREA DETECTOR A.B. Rodriguez-Navarro, A.G. Checa, Universidad de Granada, Granada, Spain |
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XRD2DSCAN A NEW SOFTWARE FOR THE AUTOMATIC ANALYSIS OF 2D DIFFRACTION PATTERNS OF POLYCRYSTALLINE MATERIALS A.B. Rodriguez-Navarro, Universidad de Granada, Granada, Spain |
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TXRF TRACE ELEMENT ANALYSIS APPLIED TO AUTHENTICITY AND PURITY CONTROL OF PHARMACEUTICAL SAMPLES H. Stosnach, A. Gross*, Bruker AXS Microanalysis GmbH, Berlin, Germany |
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NANMATERIAL CHARACTERIZATION BY SYNCHROTRON X-RAY POWDER DIFFRACTOMETRY Challa Kumar, Rusty Louis, Sebastian Mammitzsch, Rohini De Silva, Hitesh Bagaria, CAMD, Louisiana State University, Baton Rouge, Louisiana, USA |
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RHOMBOHEDRAL - CUBIC PHASE TRANSITION CHARACTERIZATION OF (Pb,Ge)Te USING HOT-STAGE XRD J. Sariel*, Nuclear Research Center, Negev, POBox 9001, Beer-Sheva, Israel, 84190 Y. Gelbstein, Dept. of Materials Engineering, Ben-Gurion University of the Negev, Beer-Sheva, Israel, 84105 I. Dahan, Nuclear Research Center, Negev, POBox 9001, Beer-Sheva, Israel, 84190 O. Ben-Yehuda, Dept. of Physics, Ben-Gurion University of the Negev, Beer-Sheva, Israel 84105 |
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DEVELOPMENT OF A LABORATORY INSTRUMENT IN SUPPORT OF THE NASA XRD/XRF DEPLOYMENT ON MARS P. Sarrazin, inXitu, Inc., Mountain View, CA D. Blake, NASA Ames Research Center, Moffett Field, CA D. Bish, Indiana University, Bloomington, IN D. Vaniman, S. Chipera, Los Alamos National Laboratory, Los Alamos, NM |
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THE EVALUATION OF PREFERENTIAL ALIGNMENT OF BIOLOGICAL APATITE (BAp) CRYSTALLITES IN BONE USING TRANSMISSION X-RAY DIFFRACTION METHOD K. Sasaki, Kanazawa University, Kanazawa, Japan and Rigaku Corporation, Akishima, Japan T. Nakano, Y. Umakoshi , Osaka University, Suita, Japan T. Sasaki, Kanazawa University, Kanazawa, Japan |
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THE DEVELOPMENT OF TWO COLOR MULTI LAYER MIRROR SYSTEM AND IT’s APPLICATION FOR MICRO BEAM X-RAY DIFFRACTOMETRY K. Sasaki, Kanazawa University, Kanazawa, Japan and Rigaku Corporation, Akishima, Japan M. Maeyama, Rigaku Corporation, Akishima, Japan Y. Hirose, T. Sasaki, Kanazawa University, Kanazawa, Japan |
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COMPARISON OF SIMULATED AND EXPERIMENTAL XRPD PATTERNS OF Ag WITH TWIN FAULTS USING MAUD AND DIFFAX P.J. Schields, SSCI, Inc, West Lafayette, IN N. Dunwoody, Nucryst Pharmaceuticals, Inc, Wakefield, MA |
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A NOVEL HIGH RESOLUTION TUNABLE X-RAY FLUORESCENCE IMAGING SPECTROMETER FOR MATERIALS ANALYSIS S.Seshadri, M. Feser, W. Yun, Xradia Inc, Concord, CA 94520, USA |
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SAMPLE PREPARATION AND CALIBRATION FOR A ROHS/WEEE COMPLIANT SCREENING METHOD (FOR ED AND WD XRF) K. Behrens, Bruker AXS GmbH Karlsruhe, Germany A. Seyfarth, Bruker AXS Inc. Madison, WI J. Sardisco, Sardisco Enterprises, Baton Rouge LA |
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BORON IN GLASS DETERMINATIONS USING WD XRF A. Seyfarth, Bruker AXS Inc., Madison WI |
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SPECTRA(PLUS) 2.0 WITH TOUCHCONTROL™ BRUKER S8 SERIES WD-XRF APPLICATIONS AND SOFTWARE K. Behrens, A. Seyfarth, Bruker AXS GmbH Karlsruhe, Germany and Bruker AXS Inc., Madison, WI |
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NEXT GENERATION S2 RANGER XFLASH BENCHTOP ED-XRF SYSTEM A. Seyfarth, H. Ress, Bruker AXS Inc., Madison, WI and Bruker AXS GmbH, Karlsruhe, Germany |
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HYPERSPECTRAL NON-DESTRUCTIVE X-RAY ANALYSES OF THE 81P/WILD 2 COMETARY GRAINS A. Simionovici, University of Grenoble, Grenoble, France L. Lemelle, T. Ferroir, P. Gillet, ENS, Lyon, France J. Borg, F. Grossemy, Z. Djouadi, Université Paris XI, Orsay, France P. Bleuet, J. Susini, ESRF, Grenoble, France |
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What we can learn about the structure and dynamics of surfaces and thin films from off-specular scattering Sunil K Sinha, University of California San Diego, La Jolla, CA 92093-0319 |
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In-Situ Neutron Diffraction Measurements during Creep Testing of Beryllium Don Brown, LANL, Los Alamos, NM, USA Mike Prime, LANL, Los Alamos, NM, USA Mike Steinzig, LANL, Los Alamos, NM, USA Steve Abeln, LANL, Los Alamos, NM, USA Brian Smith, LANL, Los Alamos, NM, USA , LANL, Los Alamos, NM, USA |
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GENERATING HIGH BRILLIANCE X-RAY BEAMS FOR X-RAY DIFFRACTION AND SCATTERING APPLICATIONS P. Boulée, D. Cenda, P. Høghøj, V. Roger, L. Spanos, Xenocs SA, Sassenage, France |
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X-ray scattering for the study of deformation and fracture of polymers M. Stamm, Leibniz Institute of Polymer Research Dresden, Germany N. Zafeiropoulos, Leibniz Institute of Polymer Research Dresden, Germany K. Schneider, Leibniz Institute of Polymer Research Dresden, Germany |
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FLEXIBLE FILAMENTOUS VIRUS STRUCTURES FROM FIBER DIFFRACTION Gerald Stubbs*, Amy Kendall, Michele McDonald, Wen Bian, Ian McCullough, Jian Shi, Phoebe Stewart, Vanderbilt University, Nashville, TN, USA Esther Bullitt, Boston University School of Medicine, Boston, MA, USA David Gore, Illinois Institute of Technology, Chicago, IL, USA Said Ghabrial, University of Kentucky, Lexington, KY, USA |
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Buffer salt crystallization during freezing and freeze drying – quantification by synchrotron X-ray diffractometry (SXRD) P. Sundaramurthi, R. Suryanarayanan, University of Minnesota, Minneapolis, MN E. Shalaev, L.A. Gatlin, , Pfizer Groton Laboratories, Groton, CT D. Varshney, Eli-Lilly and Co, Indianapolis, IN S. Kumar , National Science Foundation, Arlington, VA S.-W. Kang, Kent State University, Kent, OH |
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NEXT GENERATION X-RAY DETECTOR FOR IN-HOUSE XRD T. Taguchi, Rigaku Corporation, Tokyo, Japan C. Broennimann, E.F. Eikenberry, DECTRIS Ltd., Switzerland |
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A new technique for three-dimensional internal structure analysis in metallic materials: coherent x-ray diffraction microscopy Y. Takahashi, Osaka University, Suita, Osaka, Japan Y. Nishino, T. Ishikawa, RIKEN SPring-8 Center, Sayo, Hyogo, Japan E. Matsubara, Kyoto University, Sakyo, Kyoto, Japan |
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PORTABLE XRF WITH A VACUUM BEAM PATH ALLOWS DETECTION OF LIGHTER ELEMENTS Bridget E. Tannian*, Brad Hubbard-Nelson, Don Sackett, Innov-X Systems, Inc., Woburn, MA, USA |
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STRESS AND COMPOSITION EVALUATION FOR GRADIENT NITRIDE COATINGS A. Ulyanenkov, J. Brechbühl, Bruker AXS GmbH, Karlsruhe, Germany V.V. Uglov, V.M. Anishchik, S.V. Zlotski, T.A. Alexeeva, Belarussian State University, Minsk, Belarus A.Lazar, 3Institute of Solid State and Semiconductor Physics, Minsk, Belarus |
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UNIVERSAL SOFTWARE FOR RESIDUAL STRESS EVALUATION FROM 1D AND 2D X-RAY DIFFRACTION DATA A. Ulyanenkov, Bruker AXS GmbH, Karlsruhe, Germany |
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THE DISLOCATION MODEL OF STRAIN ANISOTROPY T. Ungár, Eötvös University Budapest, Budapest, Hungary |
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INVERSE ANALYSIS OF NEUTRON DIFFRACTION DATA S.Y. Lee, S.M. Motahari, E. Ustundag*, Iowa State University, Materials Science and Engineering, Ames, IA, U.S.A. H. Ceylan, Iowa State University, Civil, Construction and Environmental Engineering, Ames, IA, U.S.A. L. Li, I.C. Noyan, Applied Physics and Applied Mathematics, Columbia University, New York, NY, U.S.A. |
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X-RAY DIFFRACTION INVESTIGATION OF FERROELECTRIC CONSTITUTIVE BEHAVIOR AT MULTIPLE LENGTH SCALES G. Tutuncu, M. Varlioglu, S.M. Motahari, E. Ustundag*, Iowa State University, Materials Science and Engineering, Ames, IA, U.S.A. U. Lienert, J. Almer, J. Bernier, D. Haeffner, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, U.S.A. |
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AU NANOPARTICLE LIQUIDS, PROTO-ASSEMBLIES AND DISPERSIONS: SAXS STUDY OF GROWTH R. Vaia, S. Diamanti, R. MacCuspie, K. Park, H. Koerner, R. Naik, Air Force Research Laboratory, WPAFB, OH |
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XRS, INDOOR AEROSOLS AND HUMAN HEALTH R. Van Grieken, A. Buczynska, B. Horemans, M. Stranger, A. Worobiec, University of Antwerp, Antwerp, Belgium |
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THREE-DIMENSIONAL NANO-XRF ON COMETARY MATTER RETURNED BY NASA’S STARDUST MISSION L. Vincze, B. Vekemans, G. Silversmit, T. Schoonjans , Ghent University, Ghent, Belgium F. Brenker, S. Schmitz, Johann Wolfgang Goethe University, Frankfurt, Germany M. Burghammer, C. Riekel, European Synchrotron Radiation Facility (ESRF), Grenoble, France |
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CAN NEUTRON DIFFRACTION CONTRIBUTE TO ELUCIDATING HOW THE GREAT PYRAMIDS OF GIZA WERE BUILT? S.C. Vogel, Los Alamos National Laboratory, Los Alamos, NM M.W. Barsoum, Drexel University, Philadelphia, PA |
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SOFTWARE FOR ANALYSIS AND REDUCTION OF 2-D DATA S.C. Vogel, Los Alamos National Laboratory, Los Alamos, NM K. Knorr, Christian-Albrechts-Universität zu Kiel, Kiel, Germany |
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A PAIR-DISTRIBUTION FUNCTION AND RIETVELD ANALYSIS OF AGED U-NB ALLOYS H.M. Volz, Th. Proffen, R.E. Hackenberg, A.M. Kelly, W.L. Hults, A.C. Lawson, R.D. Field, D.F. Teter, D.J. Thoma, Los Alamos National Laboratory, Los Alamos, NM M.A. Rodriguez, Sandia National Laboratory, Albuquerque, NM |
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DIFFUSION OF TA AND BI IN FEPT THIN FILMS STUDIED BY GRAZING-INCIDENCE X-RAY FLUORESCENCE Xiangjun Wei*, Hongjie Xu, Shanghai Institute of Applied Physics, CAS Qing Xu, Institute of High Energy Physics, CAS Hongdi Zhang, Institute of Physics, CAS Tianmin Wang, Beihang University, Beijing, China |
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MANAGING AN X-RAY DIFFRACTION LABORATORY WITH RESPONSIBILITIES TO RESEARCH, DEVELOPMENT, ENGINEERING AND PRODUCTION B.R. Wheaton, Corning Incorporated, Corning, NY, USA |
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MICROFOCUSING X-RAY EQUIPMENT FOR THE LAB DIFFRACTOMETER J. Wiesmann*, C. Michaelsen, J. Graf, C. Hoffmann, Incoatec GmbH, Geesthacht, Germany J. Lange, Bruker AXS GmbH, Karlsruhe, Germany |
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PEAK INTENSITY PHENOMENON DURING IN-SITU NEUTRON DIFFRACTION EXPERIMETNS ON DUCTILE RARE EARTH INTERMETALLIC YCU Don Brown, Los Alamos National Laboratory, LANSCE, Los Alamos, NM 87545, Bjorn Clausen, Los Alamos National Laboratory, LANSCE, Los Alamos, NM 87545, Alan Russell, Ames Laboratory, Ames IA 50011 USA Karl Gschneidner, Ames Laboratory, Ames IA 50011 USA |
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DEVELOPMENT OF A PREDICTIVE LIFE TOOL FOR TAPERED ROLLER BEARINGS USING MEASURED RESIDUAL STRESS AND RETAINED AUSTENITE DATA B.M. Wilson, University of Nebraska, Lincoln, NE M.G. Dick, RSI Materials Engineering, Omaha, NE |
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TXRF ATTACHMENT MODULE MODIFIED FOR ANALYSIS IN VACUUM P. Wobrauschek, C. Streli, P. Kregsamer, F. Meirer, Atominstitut, Vienna Univ. of Technology, Vienna, Austria A. Markowicz, D. Wegrzynek, International Atomic Energy Agency, Vienna, Austria and AGH Univ. of Science & Tech., Krakow, Poland E. Chinea Cano, International Atomic Energy Agency, Vienna, Austria |
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STUDIES ON QUANTIFICATION OF Pb IN BONE IN VIVO USING L-SHELL EXCITATION B. Pemmer, P. Wobrauschek, C. Streli, Atominstitut, Vienna Univ. of Technology, Vienna, Austria |
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GRAZING INCIDENCE XRF ANALYSIS OF TIN CONCENTRATION OF GLASS SURFACE Takashi Yamada, Rigaku Industrial Corp., Takatsuki, Osaka, Japan Masaru Matsuo, Rigaku Industrial Corp., Takatsuki, Osaka, Japan Naoki Kawahara, Rigaku Industrial Corp., Takatsuki, Osaka, Japan Al Martin, Rigaku America Corp., The Woodlands, Texas, USA Hisashi Inoue, Rigaku America Corp., The Woodlands, Texas, USA |
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TOWARD NANOMETER RESOLUTION FOR STRAIN MAPPING IN SINGLE CRYSTALS: NEW FOCUSING OPTICS AND DYNAMICAL DIFFRACTION ARTIFACTS H. Yan, H.C. Kang, J. Maser, A.T. Macrander, C. Liu, R. Conley, G.B. Stephenson, Argonne National Laboratory, Argonne, IL I.C. Noyan, O. Kalenci, Columbia University, New York, NY |
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CRYSTAL STRAIN QUANTIFICATION USING X-RAY IMAGING TECHNIQUE Y. Zhong, Y.S. Chu, A.T. Macrander, APS - Argonne National Laboratory, Argonne, IL |
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ELEMENTAL IMAGING IN OSTEOARTHRITIC JOINT BONES N. Zoeger, C. Streli, F. Meirer, P. Wobrauschek, S. Smolek, A. Maderitsch, Atominstitut, TU-Wien, Vienna, Austria P. Roschger, Ludwig Bolzmann-Institut für Osteologie, Vienna, Austria J. Hofstaetter, Ludwig Bolzmann-Institut für Osteologie, Vienna, Austria and Medical University of Vienna, Vienna, Austria G. Falkenberg, HASYLAB at DESY, Hamburg, Germany |
