2009 Denver X-ray Conference Information:

Program

DXC Sponsors:

Chemplex

Panalytical

Media Sponsors:

Ios Press

Materials Today

 

 

 

 

The 58th Annual DXC will be held 27-31 July 2009, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.

TUESDAY, 28 JULY—XRD POSTER SESSION
SUMMIT BALLROOM, 5:30 P.M. – 7:30 P.M.

Chemplex

The Tuesday evening Poster session will be held in conjunction with a Wine and Cheese Reception, sponsored by Chemplex.

Chairs: I. Nakai, Tokyo University of Science, Tokyo, Japan
D. Cohen, Australian Nuclear Science and Technology Organisation, Menai, Australia

Session chairs will select the three best posters for awards.


F-1 CHARACTERISTICS OF CAPILLARY X-RAY OPTICS FOR CONFOCAL THREE-DIMENSIONAL MICRO-XRF TECHNOLOGY
T. Sun, Y. Li, Z. Liu, X. Lin, P. Luo, Q. Pan, X. Ding, Beijing Normal University, Beijing, China
F-3 NEW VORTEX® SDD DEVELOPMENT FOR LOW ENERGY X-RAY DETECTION
V.D. Saveliev, L. Feng, C.R. Tull, S. Barkan, M. Takahashi, E.V. Damron, SII NanoTechnology USA, Inc., Northridge, CA
F-6 USING NON-MONOCHROMATIC X-RAYS IS MORE EFFECTIVE FOR HIGHLY SENSITIVE ANALYSIS IN THE TXRF ANALYSIS
S. Kunimura, J. Kawai, Kyoto University, Kyoto, Japan
F-11 WASTE REDUCTION AND PROCESS IMPROVEMENTS IN THE ANALYSIS OF PLUTONIUM BY X-RAY FLUORESCENCE
C.G. Worley, C.B. Soderberg, L.E. Townsend, Los Alamos National Laboratory, Los Alamos, NM
F-12 SULPHUR ANALYSIS IN BIOFUELS, X-RAY FLUORESCENCE APPROACH IN EUROPE
C.-P. Lienemann, L. Burte, E. Roche, IFP-LYON, Solaize, France
V. Uricanu, H. Smit, PANalytical, Almelo, The Netherlands
F-14 X-RAY FLUORESCENCE ANALYSIS OF METAL CONTAMINATION IN THE NORTH RIVER DRAINAGE BASIN
M. Jennings, Innov-X Systems, Inc., Woburn, MA
D. Allen, J. Pyburn, Salem State College, Salem, MA
F-16 NEXT GENERATION X-RAY SPECTROMETRY INSTRUMENTS FOR SPACE EXPLORATION
W.T. Elam, M.P. McCarthy, University of Washington, Seattle, WA
W.C. Kelliher, I.A. Carlberg, NASA Langley Research Center, Hampton, VA
R.L. Shuler, NASA Johnson Space Center, Houston, TX
S.M. McLennan, SUNY, Stony Brook, NY
F-19 RADIATION GATHERING POWER INCREASING OF PLANAR X-RAY WAVE GUIDE-RESONATORS
E.V. Egorov, V.K. Egorov, IMT RAS, Chernogolovka, Russia
M.S. Afanas’ev, MIREA, Moscow, Russia
F-20 FABRICATION OF HIGH-PRECISION CURVED CRYSTAL SUBSTRATE FOR JOHANSSON-TYPE DOUBLY CURVED CRYSTAL BY NUMERICALLY CONTROLLED LOCAL WET ETCHING
K. Yamamura, K. Ueda, M. Nagano, N. Zettsu, Osaka University, Suita, Osaka, Japan
S. Maeo, S. Shimada, Osaka Electro-Communication University, Neyagawa, Osaka, Japan
T. Utaka, K. Taniguchi, Institute of X-ray Technologies Co. Ltd, Osaka, Osaka, Japan
F-23 WHAT ARE THE USEFUL QUALITY METRICS FOR MINIATURE X-RAY TUBES?
S. Cornaby, N. Palmer, K. Decker, C. Jensen, Moxtek, Inc., Orem, UT
D.J. Caruso, M. Dinsmore, TWX, LLC., Concord, MA
F-30 WITHDRAWN - APPLICATIONS OF COMPTON PEAK CORRECTION METHOD IN QUANTITATIVE XRF ANALYSIS
Y. Shi, L. Brehm, S. Yusuf, The Dow Chemical Company, Midland, MI
F-35 CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY
B. Chyba, M. Mantler, H. Ebel, R. Svagera, Technische Universität Wien, Wien, Austria
F-38 COMPARATIVE MEASUREMENTS OF SECONDARY STANDARDS FOR PAINT LAYERS ON PLASTIC AND GLASS SUBSTRATES
A.G. Vershinin, M. Cusack, D. Li, W. Gibson, X-ray Optical Systems, Inc., East Greenbush, NY
K. McIntosh, State University of New York at Albany, Albany, NY
P. J. Parsons, State University of New York at Albany, Albany, NY and New York State Department of Health, Albany, NY
B. Altkorn, Intertek Group plc, Oak Brook, IL
N. Chan, Intertek Group plc, Shenzhen, China
F-40 STRUCTURE ANALYSIS OF SODIUM CATION IN AQUEOUS SOLUTION BY SOFT X-RAY ABSORPTION SPECTRA AND THEIR MOLECULAR ORBITAL CALCULATION
T. Kurisaki, H. Wakita, Fukuoka University, Fukuoka, Japan
F-41 NANOMETER THIN FILMS AS XRF REFERENCE SAMPLES
M. Krämer, R. Dietsch, D. Weißbach, AXO Dresden GmbH, Heidenau, Germany
G. Falkenberg, HASYLAB at DESY, Hamburg, Germany
R. Simon, FZ Karlsruhe, Eggenstein, Germany
U. Fittschen, University of Hamburg, Hamburg, Germany
F-55 TRACE ANALYSIS ON SOLAR CELL MATERIALS WITH BENCH-TOP TXRF
Y. Shimizu, T. Yamada, H. Kobayashi, H. Kohno, Rigaku Corporation, Osaka, Japan
F-62 PORTABLE GPS-XRF FOR REAL-TIME, ON-SITE METAL MAPPING
K. Russell, Innov-X Systems, Inc. Woburn, MA
F-63 PORTABLE XRF FOR COST-EFFECTIVE PROJECT MANAGEMENT OF ENVIRONMENTAL SITE INVESTIGATIONS
K. Russell, Innov-X Systems, Inc., Woburn, MA
F-65 L3M- RADIATIVE RESONANT RAMAN SCATTERINGMEASUREMENTS IN 59PR
N. Singh, V. Sharma, S. Kumar, Panjab University, Chandigarh, India
F-70 SPECTROMETER FOR GRAZING INCIDENCE XRF: CHARACTERIZATION OF AS IMPLANTS AND HF LAYERS
D. Ingerle, N. Zoeger, P. Wobrauschek, C. Streli, Atominstitut, Vienna University of Technology, Vienna, Austria
F. Meirer, Atominstitut, Vienna University of Technology, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
G. Pepponi, Fondazione Bruno Kessler, Povo, Italy
F-71 SI WAFER ANALYSIS OF LIGHT ELEMENTS BY TXRF – CHAMBER ADAPTION TO FIT 6" AND 8" WAFERS
S. Sasamori, N. Zöger, C. Streli, P. Kregsamer, S. Smolek, P. Wobrauschek, Atominstitut, Vienna University of Technology, Vienna, Austria
F. Meirer, Atominstitut, Vienna University of Technology, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
C. Mantler, Siltronic AG, Freiberg, Germany
F-72 MICRO X-RAY FLUORESCENCE SPECTROMETER WITH LOW POWER TUBE FOR LIGHT ELEMENT ANALYSIS
S. Smolek, C. Streli, N. Zöger, P. Wobrauschek, Atominstitut, Vienna University of Technology, Vienna, Austria
F. Meirer, Atominstitut, Vienna University of Technology, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
F-73 PART II (PORTABLE ART ANALYZER) – DEVELOPMENT OF A PORTABLEMICRO X-RAY FLUORESCENCE SPECTROMETER ADAPTED FOR THE SPECIAL NEEDS FOR THE STUDY OF ARTWORKS IN THE KUNSTHISTORISCHESMUSEUM, VIENNA
G. Buzanich, C. Streli, P. Wobrauschek, Atominstitut, Vienna University of Technology, Vienna, Austria
A. Markowicz, D. Wegrzynek, International Atomic Energy Agency, Seibersdorf, Austria
E. Chinea-Cano, International Atomic Energy Agency, Seibersdorf, Austria
M. Griesser, K. Uhlir, Kunsthistorisches Museum, Vienna, Austria
F-74 IMPROVEMENT OF CALIBRATION PROCESSES IN TXRF OF WAFER SURFACE ANALYSIS: INVESTIGATION OF SATURATION EFFECTS IN TXRF BY COMPARING PICODROPLETS AND MICRODROPLETS
C. Horntrich, S. Sasamori, C. Streli, Atominstitut, Vienna University of Technology, Wien, Austria
F. Meirer, Atominstitut, Vienna University of Technology, Wien, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
U.E.A. Fittschen, Los Alamos National Laboratory, Los Alamos, NM and University of Hamburg, Hamburg, Germany
G. Pepponi, FBK-irst, Povo, Italy
G. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
Post Deadline Abstracts:

 

C-17

X-RAY ANALYSIS OF THE POLYCRYSTALLINE COMPOUNDS CU[CR2-XVX]SE4
E. Malicka, B. Zawisza*, R. Sitko, Silesian University, Katowice, Poland
A. Gągor, Polish Academy of Sciences, Wrocław, Poland

F-81 INTEGRATING SPECTRUM ANALYSIS AND FUNDAMENTAL PARAMETER QUANTIFICATION
W. Malzer, R. Tagle, M. Haschke, Bruker AXS Microanalysis GmbH, Berlin, Germany
F82 THE XRAYLIB LIBRARY FOR X-RAY MATTER INTERACTION CROSS SECTIONS: NEW DEVELOPMENTS AND APPLICATIONS
T. Schoonjans, L. Vincze, Ghent University, Gent, Belgium
M. Sanchez del Rio, European Synchrotron Radiation Facility, Grenoble, France
F-84 THE RESPONSE FUNCTION OF SOLID STATE DETECTORS AND ITS IMPORTANCE IN INPUT RATE CALCULATION
T. Papp, Cambridge Scientific, Guelph, Ontario, Canada and Institute of Nuclear Research of the Hungarian Academy of Sciences, Debrecen, Hungary
F-85 MEASURING LEAD CONTENT IN CHILDREN'S TOYS: COMPARING XRF WITH OTHER ATOMIC SPECTROMETRIC TECHNIQUES
K. McIntosh*, State University of New York at Albany, Albany, NY
J. Orsini, P.J. Parsons, New York State Department of Health, Albany, NY
M. Cusack, Z.W. Chen, W.M. Gibson, X-Ray Optical Systems, Inc., East Greenbush NY
F-86 ENERGY-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS OF MONO- AND POLYCRYSTALS OF SELENIDE SPINELS BY FUNDAMENTAL PARAMETER METHOD
R. Sitko*, B. Zawisza, E. Malicka, Silesian University, Katowice, Poland