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An Approach to Quantitative Interpretation of XRD Patterns of Clay Mixtures Using Clay Mineral Society Clays and Their FWHM in the Glycolated Difractograms D. Alaygut*, B. Canga, Turkish Petroleum Corporation, Research Center, Ankara, TURKEY |
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Biomechanics Studies at APS Using High-Energy X-Rays J. Almer, Argonne National Laboratory, Argonne, IL S. Stock, Northwestern University, Chicago, IL |
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PORTABLE XRF FOR FDA FIELD INVESTIGATORS: A REVIEW OF SOME RECENT INVESTIGATIONS AND APPLICATIONS P.E. Baker, R.R. Jacobs, U.S. Food and Drug Administration P.T. Palmer, San Francisco State University |
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THE TOXIC EFFECTS OF CALIFORNIA’S GOLD RUSH LEGACY: PROFILING A MAJOR NORTHERN CALIFORNIA WATERSHED FOR ARSENIC USING HAND-HELD XRF Peter E Baker, San Francisco State Univ., San Francisco, CA USA Peter T. Palmer, San Francisco State Univ., San Francisco, CA USA |
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TRACE ELEMENT ANALYSIS OF MICRO-XRF BY PINPOINT CONCENTRATION METHOD Hitomi Ono, Kosuke Tsujita, Hiroshi Uchihara, HORIBA, Ltd, Kyoto, Japan |
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ANALYSIS OF HIERARCHICAL DISLOCATION ARRANGEMENTS AT DIFFERENT LENGTH SCALES R.I. Barabash, G.E. Ice, Oak Ridge National Laboratory,TN,USA |
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New Product for Borate Fusion L. Bérubé, Corporation Scientifique Claisse, Quebec, Canada |
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UTILIZING THE DEBYE EQUATION IN NANOMATERIAL LINE PROFILE ANALYSIS K. Beyerlein*, R.L. Snyder, Georgia Institute of Technology, Atlanta, GA, USA P. Scardi, University of Trento, Trento, TN, Italy |
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REGISTRATION OF STRUCTURAL DISORDER PROFILE OF CRYSTALLINE MATERIAL WITH PARTICLE-INDUCED DAMAGED DOMAINS VIA GRAZING-ANGLE INCIDENCE HARD X-RAY NANOSCOPE H.P. Bezirganyan*, V Group, Inc., 33 Wood Ave S., Iselin, NJ 08830, USA S.E. Bezirganyan, Yerevan State Medical Univ. after Mkhitar Heratsi, 2, Koryuni St., Yerevan 0025, Armenia |
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X-RAY IMAGING ON BIOLOGICAL MODEL ORGANISMS USING MICRO AND NANO X-RAY FLUORESCENCE B. De Samber*, F. Vanhaecke, L. Vincze, Department of Analytical Chemistry, Ghent University K. De Schamphelaere, S. Vanblaere, C. Janssen, Laboratory of Environmental Toxicology and Aquatic Ecology, Ghent University B. Masschaele, L. Van Hoorebeke, Department of Subatomic and Radiation Physics, Ghent University G. Falkenberg, Hamburger Synchrotronstrahlungslabor, Hamburg S. Bohic, G. Martinez-Criado, R. Tuculou, P. Cloetens, European Synchrotron Radiation Facility, Grenoble |
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NIST STANDARD REFERENCE MATERIAL SRM 640D FOR X-RAY METROLOGY D.R. Black, J.P. Cline, D. Windover, D.L. Gil, A. Henins, E. Kessler, NIST, Gaithersburg, MD |
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CRYSTAL STRUCTURE DETERMINATION OF THE SILVER CARBOXYLATE DIMER [Ag(O2C22H43)]2, SILVER BEHENATE, USING POWDER X-RAY DIFFRACTION METHODS Thomas N. Blanton, Eastman Kodak Company, Research Laboratories, Rochester, New York 14650-2106, USA Manju Rajeswaran, Eastman Kodak Company, Research Laboratories, Rochester, New York 14650-2106, USA Peter W. Stephens, Stony Brook University, Department of Physics and Astronomy, Stony Brook, New York 11794-3800, USA David R. Whitcomb, Carestream Health, 1 Imation Way, Oakdale, MN 55128, USA Scott T. Misture, Alfred University, New York State College of Ceramics, Alfred, NY 14802, USA James A. Kaduk, INEOS Technologies, Analytical Science Research Services, Naperville, IL 60563, USA |
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SYNCHROTRON BASED SPECTRO-MICROSCOPY FOR CELL BIOLOGY S. Bohic, INSERM U-836, Grenoble, France and X-ray Imaging Group ESRF, Grenoble, France R. Tucoulou, G. Martinez-Criado, S. Labouré, M. Salomé, P. Cloetens, X-ray Imaging Group ESRF, Grenoble, France |
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Global Cement and Raw Materials Fusion/XRF Analytical Solution M. Bouchard, S. Rivard, J. Anzelmo, Corporation Scientifique Claisse, Quebec, Canada A. Seyfarth, L. Arias, Bruker-AXS, Madison, WI K. Behrens, Bruker-AXS GmbH, Karlsruhe, Germany |
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MICROSTRUCTURE AND GROWTH STRESSES OF NANOSTRUCTURED OXIDE LAYERS DEVELOPING ON IRON ALUMINIDES P. Brito, H. Pinto, Max-Planck-Institut für Eisenforschung, Germany M. Klaus, Ch. Genzel, A. Pyzalla, Helmholtz-Zentrum Berlin für Materialien und Energie, Germany |
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Synchrotron X-ray Studies of Deformation of Hexagonal Metals D.W. Brown, W.R. Blumenthal, B. Clausen,T.A. Sisneros, C.N. Tomé, S.C. Vogel, Los Alamos National Laboratory, Los Alamos, NM S.R. Agnew, University of Virginia, Charlottesville, VA |
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TOWARDS SUB-100 NM X-RAY MICROSCOPY FOR TOMOGRAPHIC APPLICATIONS P. Bruyndonckx, A. Sasov, B. Pauwels, SkyScan, Kontich, Belgium |
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ABSOLUTE THICKNESS DETERMINATION OF SmCo FILMS ON SILICON SUBSTRATES UTILIZING X-RAY DIFFRACTION AND THEIR COMPOSITION MEASUREMENTS BY EXRF I. Vander, Physics Dept, Queens College CUNY, Flushing, NY, USA F. J. Cadieu*, Physics Dept, Queens College CUNY, Flushing, NY, USA |
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Residual Stress Analysis of A Co-Extruded Solid Oxide Fuel Cell Platform Iuliana Cernatescu, PANalytical, Westborough, MA, USA Raymond Oh, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA Joe Cochran, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA Sandeep Rekhi, PANalytical, Westborough, MA, USA Robert L. Snyder, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA |
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SULPHUR ANALYSIS IN BIOFUELS, X -RAY FLUORESCENCE APPROACH IN EUROPE Lienemann Charles-Philippe, IFP-LYON, 69360 Solaize, France Burte Lionel, IFP-LYON, 69360 Solaize, France Roche Estelle, IFP-LYON, 69360 Solaize, France Uricanu Violetta, EMEA Application Laboratory , PANalytical, Almelo, The Netherlands Smit Huub, EMEA Application Laboratory , PANalytical, Almelo, The Netherlands |
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MONOCHROMATIC Rh K-ALPHA X-BEAM FOR TRACE XRF ANALYSIS F. Wei, Z.W. Chen, XOS, East Greenbush, NY M. Collings, G.J. Havrilla, LANL, Los Alamos, NM |
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QUANTITATIVE ANALYSIS OF LOW LEVEL TOXIC ELEMENTS IN SURFACE LAYER USING HDXRF Z. W. Chen, X-Ray Opttical Systems, East Greenbush, NY, USA Danhong Li, X-Ray Opttical Systems, East Greenbush, NY, USA Kai Xin, X-Ray Opttical Systems, East Greenbush, NY, USA Alex Verchinine, X-Ray Opttical Systems, East Greenbush, NY, USA W. M. Gibson, X-Ray Opttical Systems, East Greenbush, NY, USA |
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X-RAY AND RAMAN SPECTRA STUDIES ON THERMAL ENERGY STORAGE MATERIALS - TRIS(HYDROXYMETHYL)AMINOMETHANE W. Chien*, V. K. Kamisetti, J.C. Fallas, D. Chandra, Metallurgical and Materials Engineering /MS388, University of Nevada, Reno, Reno, NV 89557, USA E.D. Emmons, U.S. Army Edgewood Chemical Biological Center, Aberdeen Proving Ground, MD 21010, USA A.M. Covington, Department of Physics /MS220, University of Nevada, Reno, Reno, NV 89557, USA R.S. Chellappa, Carnegie/DOE Alliance Center, Geophysical Laboratory, Carnegie Institution of Washington, Washington, DC 20015, USA S. Clark, Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA |
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X-RAY DIFFRACTION AND STRUCTURAL BEHAVIOR STUDIES OF Li-BASED HYDRIDES W. Chien*, J.H., Lamb, D. Chandra, Uinversity of Nevada, Reno, Reno, NV, USA |
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Structural Investigation of Combinatorial Ge-Co-Mn Epitaxial Thin-Film System Using Synchrotron X-ray Microprobe Y.S. Chu, Argonne National Laboratory, Argonne, IL and Brookhaven National Laboratory, Upton, NY B.A. Collins, L. He, F. Tsui, University of North Carolina, Chapel Hill, NC |
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Characterizing x-ray mirrors in reciprocal space: Results from the NIST X-ray Optics Evaluation Double-Crystal Diffractometer D.L. Gil, D. Windover, A. Henins, J. Cline, National Institute of Standards and Technology, Gaithersburg, MD |
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Addressing the Amorphous Content Issue in Quantitative Phase Analysis: The Certification of NIST SRM 676a J.P. Cline, J.J. Filliben, NIST, Gaithersburg, MD R.B. Von Dreele, Argonne National Laboratory, Argonne, IL R. Winburn, Minot State University, Minot, ND P.W. Stephens, State University of New York at Stony Brook, Stony Brook, NY |
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SIMULTANEOUS X-RAY AND ION BEAM TECHNIQUES FOR THE CHARACTERISATION AND FINGERPRINTING OF FINE PARTICLE AIR POLLUTION AND ITS SOURCES IN THE ASIAN REGION David D. Cohen, ANSTO, Menai, NSW, 2234, Australia |
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QUANTITATIVE ANALYSIS OF PHASES WITH PARTIAL OR NO KNOWN CRYSTAL STRUCTURE Holger Cordes, Alexander Seyfarth, Bruker-AXS, Madison, Wi, USA Arnt Kern, Karsten Knorr, Bruker-AXS, Karlsruhe, Wi, USA |
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PREDICTION AND XRD MEASURING OF RESIDUAL STRESSES IN MACHINED WELDED PARTS I.Dahan, G. Refaelov, J. Sariel, Nuclear research Center of the Negev, Israel M. Santo, I. Gilad, 1 Ben-Gurion University of the Negev, Beer-Sheva, Israel |
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A MAJOR UPDATE OF X’PERT HIGHSCORE PLUS T. Degen *, J. v. d. Oever, PANalytical B.V., Lelyweg1, 7603 EA Almelo, The Netherlands |
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Nanometer thin films as XRF reference samples M. Kraemer, R. Dietsch, D. Weissbach, AXO Dresden GmbH, Heidenau, Germany G. Falkenberg, HASYLAB at DESY, Hamburg, Germany R. Simon, Institute for Synchrotron Radiation, FZ Karlsruhe, Germany U. Fittschen, Institute for Applied Chemistry, University of Hamburg, Germany |
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Performance of beam shaping X-ray optics in combination with laboratory X-ray sources Reiner Dietsch*, Th. Holz, M. Kraemer, D. Weissbach, AXO Dresden GmbH, Heidenau, Germany St. Braun, Fraunhofer IWS Dresden, Germany |
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Radiation gathering power increasing of planar x-ray waveguide-resonators Evgeniy Egorov, IMT RAS, Chernogolovka, Russia Michail Afanas'ev, MIREA, Moscow, Russia Vladimir Egorov, IMT RAS, Chernogolovka, Russia |
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NEXT GENERATION X-RAY SPECTROMETRY INSTRUMENTS FOR SPACE EXPLORATION W. T. Elam*, Univ. of Washington, Seattle, WA 98105-6698 USA Warren C. Kelliher, NASA Langley Research Center, Hampton, VA 23681-0001 Michael P. McCarthy, Univ. of Washington, Seattle, WA 98105-6698 Robert L. Shuler, NASA Johnson Space Center, Houston, TX 77058 Scott M. McLennan, SUNY, Stony Brook, NY 11794-2100 Ingrid A. Carlberg, NASA Langley Research Center, Hampton, VA 23681-0001 |
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COMBINED MULTIPLE-EXCITATION FP METHOD FOR MICRO-XRF ANALYSIS OF DIFFICULT SAMPLES W. T. Elam, EDAX, a unit of Ametek Inc. Mahwah, NJ 07430 Bruce Scruggs, EDAX, a unit of Ametek Inc. Mahwah, NJ 07430 Joseph Nicolosi, EDAX, a unit of Ametek Inc. Mahwah, NJ 07430 |
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Application of X-Ray Diffraction for Residential Stress Analysis on Canadian Naval Platforms S.P. Farrell, L.W. MacGregor, Dockyard Laboratory Atlantic, Defence Research & Development Canada - Atlantic, Dartmouth, NS, Canada |
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WATER ANALYSIS USING A PROTOTYPE MONOCHROMATIC MICROFOCUS GRAZING INCIDENCE X-RAY FLUORESCENCE DEVICE COMPARING PICOLITER AND NANOLITER DEPOSITION AS SAMPLE PREPARATION APPROACH U.E.A. Fittschen, G. J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA |
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STRUCURAL STABILITY STUDY FOR ULTRA-THIN HFO2 FILMS BASED ON GIXRR AND GIXRD Wei-En Fu*, Yong-Qing Chang, Yi-Ching Chen, Center for Measurement Standards, Industrial Technology Research Institute, Hsinchu, Taiwan |
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MULTI-LENGTH-SCALE X-RAY COMPUTED TOMOGRAPHY WITH SUB-50 NM RESOLUTION FOR NON-DESTRUCTIVE 3D VISUALIZATION AND ANALYSIS J. Gelb*, A. Tkachuk, M. Feser, H. Chang, S. Chen, T. Fong, L. Hunter, I. Goldberger, S. H. Lau, W. Yun, Xradia, Inc., Concord, CA, USA |
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Nanostructurin of Biomaterials - A Pathway to Optimizing Bone Grafting Th. Gerber, University of Rostock, Germany |
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DESIGNING AN X-RAY REFLECTOMETRY STANDARD REFERENCE MATERIAL: EFFECTS OF SURFACE CONTAMINATION AND DATA QUALITY D.L. Gil, D. Windover, A. Henins, J.P. Cline, NIST, Gaithersburg, MD |
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Biomineral Ultrastructures Revealed by Synchrotron Spectromicroscopy P. Gilbert, R. Metzler, C.E. Killian, S.N. Coppersmith, Y. Ma, Y. Politi, S. Weiner, L. Addadi, University of Wisconsin, Madison, WI |
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Generating D-Spacing-Intensity Lists from Full Profile Refinements of Raw Data A. Gindhart, M. Carr, J. Reid, ICDD, Newtown Square, PA |
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HIGH-PERFORMANCE XRPD WITH A NEW CHROMIUM MICRO FOCUS SOURCE H.E. Goebel, U. Hermeking-Goebel, LabXA, Munich, Germany B. Hasse, Incoatec GmbH, Geesthacht, Germany M. Honal, Siemens AG, Munich, Germany |
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High Energy XRD/XRF for High-Throughput Analysis of Composition Spread Thin Films J.M. Gregoire, R.B. van Dover, Cornell University, NY |
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LATEST DEVELOPMENTS IN MICRO AND NANO TOMOGRAPHY AT PETRA III Astrid Haibel, Felix Beckmann, Thomas Dose, Julia Herzen, Sven Utcke, Andreas Schreyer, Institute of Materials Research, GKSS Research Centre Geesthacht, Germany |
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THE NEW ORBIS MICRO-EDXRF ELEMENTAL ANALYZER J. Hardy, B. Scruggs, EDAX, a unit of Ametek, Inc., Mahwah, NJ |
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Investigation of surface structures by powder diffraction: A differential Pair Distribution Function (PDF) study into arsenate sorption on ferrihydrite. Richard Harrington*, John Parise, Department of Geosciences, State University of New York at Stony Brook, Stony Brook, NY, USA Doug Hausner, Dan Strongin, Department of Chemistry, Temple University, Philadelphia, PA, USA Peter Chupas, Karena Chapman, Advanced Photon Source, Argonne National Laboratory, IL, USA Derek Middlemiss, Department of Chemistry, State University of New York at Stony Brook, Stony Brook, NY, USA |
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Micro-X-ray Fluorescence with the M4 Tornado M. Haschke, W. Malzer, U. Rossek, U. Waldschläger, H. Wagenknecht, Bruker AXS Microanalysis GmbH, Berlin, Germany |
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THE VERSATILITY OF THE INCOATEC MICROFOCUS SOURCE IN X-RAY DIFFRACTOMETRY B. Hasse*, J. Wiesmann, J. Graf, C. Michaelsen, Incoatec GmbH, Geesthacht, Germany |
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XRD Study of Sol-Gel Preparation of the Materials with Radioluminescent Properties D. Havlicek, J. Ruzicka, D. Niznansky, Charles University of Prague, Praha 2, Czech Republic |
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DEVELOPMENT OF A 3D ELEMENTAL REFERENCE MATERIAL FOR CONFOCAL MICRO X-RAY FLUORESCENCE George J. Havrilla*, Ursula E. Fittschen, Los Alamos National Laboratory, Los Alamos, NM USA |
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FILTERED TWO COLOR X-RAY MICROBEAMS FOR ENHANSEMENT IN SENSITIVITY OF LIGHT ELEMENTS Shinjiro Hayakawa, Kazuya Izawa, Takeshi Hirokawa, Hiroshima University, Higashi-hiroshima, Hiroshima, Japan |
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MICROFOCUS LIQUID-METAL-JET X-RAY TUBES AND APPLICATIONS Oscar Hemberg, Excillum AB, Roslagstullsbacken 21, SE – 006 91 Stockholm, Sweden Mikael Otendal, Excillum AB, Roslagstullsbacken 21, SE – 006 91 Stockholm, Sweden Tomi Tuohimaa, Excillum AB, Roslagstullsbacken 21, SE – 006 91 Stockholm, Sweden |
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Spatially Resolved Determination of Stress in Thin Films and Devices from Curvature Measurements N. Herres, Interstate University of Applied Sciences, Buchs, Switzerland |
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THE COSUBSTITUTION REACTION OF IN2O3 BY ZNO AND SNO2 AS CHARACTERIZED WITH X-RAY SPECTROSCOPY C.A. Hoel*, K.R. Poeppelmeier, Department of Chemistry, Northwestern University, Evanston, IL, USA J.-F. Gaillard, Department of Civil and Environmental Engineering, Northwestern University, Evanston, IL, USA |
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Oxidic Calibration Using WDXRF-MultiScat®: Applications Shown for Minerals, Ore Concentrates and Slags S. Bäckman, I. Bernhardsson, Degerfors Laboratorium AB, Degerfors, Sweden |
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Traditional Empirical WDXRF Calibration Compared with Using the Calibration Tool MultiScat®: Applications Shown on for Metal Bases S. Bäckman, I. Bernhardsson, Degerfors Laboratorium AB, Degerfors, Sweden |
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BENDING ZnO NANOWIRES WITH ATOMIC BOMBARDMENT J.I. Hong*, Y. Shen, Z.L. Wang, R.L. Snyder, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, USA |
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DEVELOPMENT OF X-RAY INSPECTION TECHNOLOGY FOR TURBINE BLADES Alex Verchinine, X-ray Optic Systems, Inc. East Greenbush, NY, USA Matthew Cusack, X-ray Optic Systems, Inc. East Greenbush, NY, USA Walter Gibson, X-ray Optic Systems, Inc. East Greenbush, NY, USA |
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DEVELOPMENT OF XRD BASED ON-LINE CHARACTERIZATION OF SEMICRYSTALLINE PLASTICS Alex Verchinine, X-ray Optic Systems, Inc. East Greenbush, NY, USA Matthew Cusack, X-ray Optic Systems, Inc. East Greenbush, NY, USA Walter Gibson, X-ray Optic Systems, Inc. East Greenbush, NY, USA |
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Residual Stresses Around Holes Cut in Steel Railsides for Truck Frames Camden R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064 Joaquin Del Prado Villasana & Sean Fleming, Metalsa Roanoke, Inc., Roanoke, VA 24019 |
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GETTING THE LEAD OUT – AGAIN: LEAD IN FDA REGULATED PRODUCTS R. Jacobs, FDA, San Francisco District Laboratory, Alameda, CA P.T. Palmer, San Francisco State University, San Francisco, CA |
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X-RAY FLUORESCENCE ANALYSIS OF METAL CONTAMINATION IN THE NORTH RIVER DRAINAGE BASIN M. Jennings*, Innov-X Systems, Woburn, MA, USA D. Allen, J. Pyburn, Department of Geological Sciences, Salem State College, Salem, MA USA |
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BRIDGING THE PRICE / PERFORMANCE GAP BETWEEN SILICON DRIFT AND SILICON PIN DIODE DETECTORS D. Hullinger*, K. Decker, J. Smith, C. Carter, Moxtek, Inc., Orem, UT, USA |
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WHAT ARE THE USEFUL QUALITY METRICS FOR MINIATURE X-RAY TUBES? S. Cornaby*, N. Palmer, K. Decker, C. Jensen, Moxtek, Inc., Orem, UT, USA D.J. Caruso, M. Dinsmore, twX LLC, Concord, MA, USA |
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MINIATURE X-RAY SOURCES AND THE EFFECTS OF SPOT SIZE ON SYSTEM PERFORMANCE D.J. Caruso*, M. Dinsmore, twX, LLC, Concord, MA, USA S. Cornaby*, S. Liddiard, M. Heber, C. Jensen, Moxtek, Orem, UT, USA |
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Micro-structural analysis of high manganese steels using multiple line profile analysis Jaesuk, Joung, POSTECH, Pohang, Gyunbuk, Korea Yang-Mo, Koo, P |
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QUANTITATIVE ANALYSIS OF SAMPLES INCLUDING UNKNOWN TRACE PHASES - COMPARISON OF THE RIETVELD AND CALIBRATION CURVE METHODS Erina Kagami*, Aya Takase, Rigaku Corporation, Akishima, Tokyo, JAPAN |
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PHASE EQUILIBRIA DETERMINATION OF TRIS(HYDROXYMETHYL)AMINOMETHANE AND 2-AMINO-2METHYL-1,3-PROPANEDIOL BINARY SYTEM V. K. Kamisetty*, W. Chien, D. Chandra, Uinversity of Nevada, Reno, Reno, NV, USA |
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PORTABLE TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER: COMPARISON BETWEEN NON-MONOCHROMATIC AND MONOCHROMATIC X-RAY SOURCES Jun Kawai*, Y. Ueda, Y. Morikawa, Nobuharu Sasaki, Shinsuke Kunimura, T. Yamamoto, Kyoto University, Kyoto, Japan |
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CHARGE-FLIPPING STRUCTURE SOLUTION FROM SINGLE CRYSTAL AND POWDER DIFFRACTION DATA A. Kern*, A. Coelho, Bruker AXS, Karlsruhe, Germany |
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Impact of Zirconium Hydride Precipitates on Fracture of a Zirconium Alloy M. Kerr, M.R. Daymond, R.A. Holt, Queen’s University, Kingston, Ontario, Canada S. Stafford, Kinectrics Inc. J.D. Almer, APS - Argonne National Laboratory, Argonne, IL |
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CLASSES OF MATERIALS (COM) - A TOOL FOR ANALYSIS AND MATERIAL IDENTIFICATION J. Kessler, V. Roessiger, Helmut Fischer GmbH+Co.KG, Sindelfingen, Germany M. Haller, Fischer Technology, Windsor, CT |
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STRUCTURAL INFORMATION ON THE FERROELECTRIC TRANSITION IN YMNO3 BY RIETVELD METHOD J.Y.Kim*, Y.M. Koo, Dept. of MSE, Pohang University of Science and Technology (POSTECH) N.S. Shin, Pohang Accelerator Laboratory |
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WHY YOU SHOULD CARE ABOUT AREA DETECTORS-AN INTRODUCTION K.W. Kirchner*, K.A. Jones, ARL, Adelphi, Maryland, USA |
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SOIL HEAVY METAL POLLUTION ALONG SUBIN RIVER IN KUMASI, GHANA; USING X-RAY FLUORESCENCE (XRF) ANALYSIS. J.Wiafe-Akenten, K. Kodom*, *Department of Physics, Kwame Nkrumah University of Science and Technology, Kumasi, Ghana. D. Boamah, Geochemistry & Laboratories, Geological Survey Department, Accra, Ghana. |
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TIME-RESOLVED STRUCTURAL STUDIES: STRATEGIES FOR RAPIDLY IMAGING AND ANALYZING LARGE DATA SETS M. J. Kramer, Ames Laboratory/Iowa State University, Ames IA USA |
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HYDROSTATIC PRESSURE CELL INTEGRATED IN A LABORATORY BASED SAXS SYSTEM M. Kriechbaum, P. Herrnegger, P. Laggner, Austrian Academy of Sciences, Graz, Austria and Hecus X-ray Systems GmbH, Graz, Austria S. Bodner, Hecus X-ray Systems GmbH, Graz, Austria H. Amenitsch, Austrian Academy of Sciences, Graz, Austria |
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Thermal stability and crystallization of amorphous and nanocrystalline TiO2 thin films and powders studied by X R. Kužel*, Z. Matej, L. Nichtova, Charles University in Prague, Faculty of Mathematics and Physics, Prague, Czech Republic |
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USING NON-MONOCHROMATIC X-RAYS IS MORE EFFECTIVE FOR HIGHLY SENSITIVE ANALYSIS IN THE TXRF ANALYSIS S. Kunimura*, J. Kawai, Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan |
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Utilization of Synchrotron Radiation in Neurochemical Research M. Szczerbowska-Boruchowska, J. Chwiej, S. Wójcik, Z. Stęgowski, M. Lankosz, AGH-University of Science and Technology, Kraków, Poland D. Adamek, A. Krygowska-Wajs, B. Tomik, Z. Setkowicz, Jagiellonian University, Kraków, Poland K. Rickers , D. Zajac, HASYLAB-DESY, Hamburg, Germany J. Susini, European Synchrotron Radiation Facility, Grenoble, France |
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DIFFERENT ASPECTS OF MICROSTRAIN BROADENING A. Leineweber, Max Planck Institute for Metals Research, Stuttgart, Germany E.J. Mittemeijer, Max Planck Institute for Metals Research, Stuttgart, Germany |
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High Energy X-ray Optics for Synchrotron Radiation B. Lengeler, Institut fuer Physik IIB, RWTH Aachen University, Aaachen Germany |
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High-Energy Micro-Focusing by Meridionally-Bent Laue Crystals U. Lienert, Argonne National Laboratory, Argonne, IL |
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SINGLE GRAIN DEFORMATION EXPERIMENTS AT THE APS 1-ID BEAMLINE Ulrich Lienert, Argonne National Laboratory, Argonne, IL, USA |
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OBSERVATIONS OF RETAINED AUSTENITE STABILITY AND STRESS PARTITIONING IN TRANSFORMATION-INDUCED PLASTICITY STEEL DURING IN SITU TENSILE TESTING USING SYNCHROTRON X-RAY DIFFRACTION Klaus-Dieter Liss*, Ulf Garbe, Australian Nuclear Science and Technology Organisation, Lucas Heights, NSW, Australia Laichang Zhang, Thomas Schambron, Elena V. Pereloma, School of mechanical, Materials and Mechatronic Engineering, University of Wollongong, Wollongong, NSW, Australia Jonathan Almer, Advanced Photon Source, Argonne, Illinois, USA |
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IN-SITU OBSERVATION OF DYNAMIC RECRYSTALLIZATION AND RELATED PHENOMENA IN THE BULK OF ZIRCONIUM ALLOY Klaus-Dieter Liss*, Ulf Garbe, Huijun Li, Kun Yan, Australian Nuclear Science and Technology Organisation, Lucas Heights, NSW, Australia Kun Yan, Thomas Schambron, University of Wollongong, Wollongong, NSW, Australia Jonathan Almer, Advanced Photon Source, Argonne, Illinois, USA |
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Do Q! K.-D. Liss, Australian Nuclear Science and Technology Organisation, NSW, Australia |
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Transition in Crystal Structure of Ethylene-Octene Fiber during Heat Treatment L.-Z. Liu, R. Paradkar, S. Bensason, D. Chiu, The Dow Chemical Company, Freeport, TX |
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DISTRIBUTION AND CHARACTERISTICS OF TOXIC ELEMENTS IN SOIL AND MINERALS BASED ON X-RAY ANALYTICAL TECHNIQUES L. Luo*, B. Chu, X. Wang and Y. Liu, National Research Center of Geoanalysis |
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X-RAY DIFFARACTION STUDIES OF INDIAN COALS SUDIP MAITY, Central Institute of Mining and Fuel Research, FRI, DHANBAD, JHARKHAND, INDIA |
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X-ray topography for evaluation of x-ray mirrors that function by means of total-external-reflection J. Maj, A. Macrander, A. Khounsary, M. Martens, Argonne National Laboratory, Argonne, IL. USA |
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INTEGRATING SPECTRUM ANALYSIS AND FUNDAMENTAL PARAMETER QUANTIFICATION Wolfgang Malzer, Bruker AXS Roald Tagle, Bruker AXS Michael Haschke, Bruker AXS |
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SOLVING FORENSICS MYSTERIES WITH THE XRF MICROSCOPE. S. Mamedov*, F. Adar, E. Lee, A. Whitley, J. Goldey, G. Setola, Y. Yokota, Horiba Jobin Yvon Inc. New Jersey, USA D. Ward., xk, Inc. Oregon, USA |
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CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY B. Chyba*, M. Mantler, H. Ebel, R. Svagera, Vienna University of Technology, Vienna, Austria |
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MONTE-CARLO SIMULATIONS FOR EVALUATION OF DIFFERENT INFLUENCES ON PROJECTIONS IN COMPUTED TOMOGRAPHY B. Chyba, M. Mantler, Vienna University of Technology, Vienna, Austria M. Reiter, Upper Austria University of Applied Sciences |
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Nanotechnology and the Structure of Edible Fats Alejandro G. Marangoni, University of Guelph, Guelph, ON, Canada Nuria Acevedo, University of Guelph, Guelph, ON, Canada Maria F. Peyronel, University of Guelph, Guelph, ON, Canada |
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HIGH-TEMPERATURE X-RAY DIFFRACTION OF ASTM A743 GRADE CA6NM CAST MARTENSITIC STAINLESS STEEL J. Rojas, A. Toro, National University of Colombia, Antioquia, Columbia |
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EVALUATION OF SAMPLING METHODS FOR MEASUREMENT OF ELEMENTS DEFINED BY THE ROHS/WEEE DIRECTIVES J.E. Martin*, L.L. Anderson-Smith, Spex SamplePrep, Metuchen, NJ |
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MEASURING LEAD CONTENT IN CHILDREN'S TOYS: COMPARING XRF WITH OTHER ATOMIC SPECTROMETRIC TECHNIQUES K. McIntosh*, State University of New York at Albany, Albany, NY, USA J. Orsini, P.J. Parsons, Wadsworth Center, New York State Department of Health, Albany, NY, USA M. Cusack, Z.W. Chen, W.M. Gibson, X-Ray Optical Systems, Inc., East Greenbush NY, USA |
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TXRF-XANES and GI-XAS: X-Ray Absorption Spectroscopy in Trace Analysis F. Meirer, C. Streli, P. Wobrauschek, Atominstitut, Vienna University of Technology, 1020 Vienna, Austria G. Pepponi, D. Giubertoni, Fondazione Bruno Kessler, 38050 Povo (Trento) Italy F. Meirer, P. Pianetta, Stanford Synchrotron Radiation Lightsource, Menlo Park, CA 94025, USA |
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MEASURING AND MODELING DEFORMATION PARTITIONING IN TITANIUM ALLOYS M.P. Miller, C. Efstathiou, P.R. Dawson, D.E. Boyce, Cornell University, Ithaca, NY, USA U. Lienert, Argonne National Lab., Argonne, IL, USA |
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High Temperature X-ray Diffraction (HT-XRD) Analysis of Simulated Defense Waste Process Facility (DWPF) Glasses D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, Savannah River National Laboratory, Aiken, SC |
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STRUCTURE SOLUTION AND REFIENEMENT APPROACHES FOR OXIDE CERAMICS S.T. Misture, Alfred University, Alfred, NY USA |
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Observations of Shocked Metallic Surfaces with Single-pulse X-ray Diffraction Dane V. Morgan, NSTec, LLC, Los Alamos, NM USA Mike Grover, NSTec, LLC, Santa Barbara, CA USA Don Macy, NSTec, LLC, Los Alamos, NM USA Mike Madlener, NSTec, LLC, Albuquerque, NM USA Gerald Stevens, NSTec, LLC, Santa Barbara, CA USA William D. Turley, NSTec, LLC, Santa Barbara, CA USA |
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NANOSCALE STRAIN CHARACTERIZATION IN MICROELECTRONIC MATERIALS USING X-RAY DIFFRACTION Conal E. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY, USA |
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SEM-EDS Analysis of Forensic/Environmental Samples by Utilizing Transition-Edge Sensor Microcalorimeter Detector I. Nakai, Y. Ono, R. Suzuki, Q. Li, Tokyo University of Science, Tokyo, Japan K. Tanaka, S. Nakayama, H. Takahashi, SII NanoTechnology Inc., Shizuoka, Japan |
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TXRF Analysis of Multiple Droplet Residues K. Nakano, Osaka City University, Osaka, Japan and JST-Innovation Plaza, Osaka, Japan M. Kawamata, K. Tsuji, Osaka City University, Osaka, Japan |
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CRYSTAL STRUCTURE REFINEMENTS OF THE THREE-LAYER AURIVILLIUS PHASE BI2LNTI3O12 (LN = LA2, LAPR, LAND, PR2, PRND, ND2) UTILIZING COMBINED X-RAY AND NEUTRON POWDER DIFFRACTION E.J. Nichols, S.T.Misture*, Alfred University, Alfred, NY, USA |
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Six Ways of Determining Film Thickness from High Resolution XRD Data A.J. Ying, I.C. Noyan, Columbia University, New York, NY C.E. Murray, IBM T. J. Watson Research Laboratory, Yorktown Heights, NY |
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DEFORMATION MECHANISMS IN AMORPHOUS AND NANOCRYSTALLINE METALS MEAURED BY IN SITU X-RAY DIFFRACTION Ryan T, Ott, Ames Laboratory (USDOE), Ames, IA, USA |
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COMPARISON OF VARIOUS XRF QUANTITATIVE METHODS FOR DETERMINATION OF TOXIC ELEMENTS IN SUPPLEMENTS P.T. Palmer, J. Hamdani, San Francisco State University, San Francisco, CA R. Jacobs, FDA, San Francisco District Laboratory |
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The response function of solid state detectors and its importance in input rate calculation Tibor Papp, Cambridge Scientific, Guelph, Ontario, Canada; Institute of Nuclear Research of the Hungarian Academy of Sciences, Debrecen, Hungary |
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Human exposure to lead and new evidence of adverse health effects: implications for analytical measurements. Patrick J. Parsons, New York State Dept of Health, Albany, NY, USA |
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OPTIMIZING XRF CALIBRATION PROTOCOLS FOR ELEMENTAL QUANTIFICATION OF MINERAL SOLIDS FROM ATHABASCA OIL SANDS B. Patarachao*, P.H.J. Mercier, J. Kung, J.R. Woods, L.S. Kotlyar, T. McCracken, Institute for Chemical Process and Environmental Technology, National Research Council Canada, 1200 Montreal Road, Ottawa, ON, Canada K1A 0R6 B.D. Sparks, V. Bede Technical Associates, 614 Laverendrye Drive, Ottawa, ON, Canada K1J 7C4 |
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X-RAYS IN 3D B. M. Patterson, G. J. Havrilla, K.A. Defriend Obrey, J. M. Campbell, Los Alamos National Laboratory, Los Alamos, NM, USA |
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Principles of Microstress Equilibrium in Textured Metal Materials Y. Perlovich, M. Isaenkova, V. Fesenko, Moscow Engineering Physics Institute (State University), Moscow, Russia |
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REDISTRIBUTION OF MICROSTRESSES IN SHEETS FROM Zr-BASED ALLOYS UNDER ANNEALING M. Isaenkova, Y. Perlovich, Moscow Engineering Physics Institute, Moscow, Russia |
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DISTRIBUTION OF RESIDUAL MICROSTRESSES IN ROLLED Ti-Ni SINGLE CRYSTALS Y. Perlovich, M. Isaenkova, V. Fesenko, Moscow Engineering Physics Institute, Moscow, Russia |
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Nature-made nanocrystals: PDF study on bacterial and fungal MnO V. Petkov, Physics, CMU |
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THE TRUTHS AND MYTHS OF TOYS’ TESTING FOR LEAD – XRF TO THE RESCUE S. Piorek, Thermo NITON Analyzers LLC, Billerica, MA |
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Lattice Distortions, Strain and Stress in Biologically Formed Crystals B. Pokroy, Harvard University, Cambridge MA |
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SYNCHROTRON-BASED RADIOSCOPY WITH SPATIO-TEMPORAL MICRO-RESOLUTION USING HARD X-RAYS Alexander Rack*, European Synchrotron Radiation Facility, Grenoble, France Francisco García-Moreno, John Banhart, Helmholtz Centre Berlin , Germany Oliver Betz, Christian Schmidt, Zoologisches Institut, Universität Tübingen, Germany Simon Zabler, Technische Universität Berlin, Germany Tilo Baumbach, Lukas Helfen, Forschungszentrum Karlsruhe GmbH – ANKA, Karlsruhe, Germany |
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STUDYING OXIDES, ALLOYS, GAS HYDRATES, BOROHYDRIDES, AND METAL-ORGANIC-FRAMEWORK STRUCTURES USING THE RIETVELD METHOD Claudia Rawn, Oak Ridge National Laboratory/University of Tennessee |
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NEW INSTRUMENTATION FOR X-RAY POWDER DIFFRACTION Heiko R. Ress, Bruker AXS Inc. Madison, WI USA Kern*, Karsten Knorr*, Rainer Schmid*, Bruker AXS GmbH Karlsruhe Germany |
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3D Measurements of Polycrystal Response to Annealing C.M. Hefferan, Carnegie Mellon University, Pittsburgh, PA USA S.F. Li, Carnegie Mellon University, Pittsburgh, PA USA U. Lienert, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois USA R.M. Suter, Carnegie Mellon University, Pittsburgh, PA USA |
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MULTILAYER OPTICS FOR NANOSTRUCTURE INVESTIGATION IN THE LAB, THE EXAMPLE OF HIGH Z ELEMENTS V. Roger, P. Panine, P. Hoghoj, XENOCS SA, Sassenage, France O. Diat, ICSM, Bagnols sur Céze, France |
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ASPHERIC MULTILAYER OPTICS FOR MICRO XRF APPLICATIONS S, RODRIGUES, XENOCS, SASSENAGE, FRANCE P, Panine, XENOCS, SASSENAGE, FRANCE P, Høghøj, XENOCS, SASSENAGE, FRANCE B, Lantz, XENOCS, SASSENAGE, FRANCE |
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NEW LANTANUM TANTALATE PHASES INVESTIGATED BY HIGH TEMPERATURE XRD AND HIGH RESOLUTION POWDER DIFFRACTION M.A. Rodriguez, M.D. Nyman, Sandia National Laboratories, Albuquerque, NM |
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INSITU ANALYSIS OF LiFePO4 BATTERIES: SIGNAL EXTRACTION BY MULTIVARIATE ANALYSIS Mark A Rodriguez*, Sandia National Laboratories, Albuquerque, NM, USA |
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PORTABLE GPS-XRF FOR REAL-TIME, ON-SITE METAL MAPPING K. Russell, Innov-X Systems, Inc. Woburn, MA |
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PORTABLE XRF FOR COST-EFFECTIVE PROJECT MANAGEMENT OF ENVIRONMENTAL SITE INVESTIGATIONS K. Russell, Innov-X Systems, Inc. Woburn, MA |
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Application of Different Methods for Residual Stress Measurement of a Casting Component of an EN-AC 44000 Alloy S.M. Sadrossadat, S. Johansson, R.L. Peng, Linköping University, Linköping, Sweden |
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CHEMICAL TAILORING OF BIOLOGICALLY-ASSEMBLED 3-D NANOSTRUCTURED 3-D MICROASSEMBLIES: THE POTENTIAL FOR GENETICALLY ENGINEERED MATERIALS AND MICRODEVICES (GEMS) K.H. Sandhage*, Z. Bao, S. Shian, S. Davis, M. R. Weatherspoon, Y. Fang, Y. Cai, G. Wang, S. C. Jones, S. R. Marder, Georgia Institute of Technology, Atlanta, GA, USA |
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HYBRID X-RAY DIFFRACTION FOR ANALYSIS OF UNPREPARED SAMPLES IN PLANETARY EXPLORATION P. Sarrazin, inXitu, Inc., Mountain View, CA P. Dera, Argonne National Laboratory, Argonne, IL R.T. Downs, University of Arizona, Tucson, AZ D. Blake, NASA Ames Research Center, Moffett Field, CA D.L. Bish, Indiana University, Bloomington, IN M. Gailhanou, Université Paul Cézanne, Marseille, France |
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COMPACT MICRO-CT/MICRO-XRF SYSTEM FOR NON-DESTRUCTIVE 3D ANALYSIS OF INTERNAL CHEMICAL COMPOSITION A. Sasov, SkyScan, Kontich, Belgium X. Liu, SkyScan, Kontich, Belgium P. Bruyndonckx, SkyScan, Kontich, Belgium J. VanGeert, SkyScan, Kontich, Belgium |
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CHARACTERIZATION OF AGING BEHAVIOR OF PRECIPITATES AND DISLOCATIONS IN COPPER-BASED ALLOYS S.Sato*, K.Wagatsuma, Institute for Materials Research, Tohoku University, Sendai, Miyagi, Japan Y.Takahashi, Research Department, NISSAN ARC, LTD., Yokosuka, Kanagawa, Japan S.Suzuki, Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi, Japan |
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NEW VORTEX® SDD DEVELOPMENT FOR LOW ENERGY X-RAY DETECTION V.D. Saveliev*, SII NanoTechnology USA, Inc., Northridge, CA, USA L.Feng, SII NanoTechnology USA, Inc., Northridge, CA, USA C.R.Tull, SII NanoTechnology USA, Inc., Northridge, CA, USA S.Barkan, SII NanoTechnology USA, Inc., Northridge, CA, USA M.Takahashi, SII NanoTechnology USA, Inc., Northridge, CA, USA E.V.Damron, SII NanoTechnology USA, Inc., Northridge, CA, USA |
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Stardust cometary matter analyzed by synchrotron nano-XRF: New results and developments T. Schoonjans, B. Vekemans, G. Silversmit, L. Vincze, Ghent University, Gent, Belgium S. Schmitz, F. Brenker, Institut für Geowissenschaften, Frankfurt, Germany |
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THE XRAYLIB LIBRARY FOR X-RAY MATTER INTERACTION CROSS SECTIONS: NEW DEVELOPMENTS AND APPLICATIONS Tom Schoonjans, Department of Analytical Chemistry, Ghent University, Gent, Belgium Manuel Sanchez del Rio, SciSoft division, European Synchrotron Radiation Facility (ESRF), Grenoble, France Laszlo Vincze, Department of Analytical Chemistry, Ghent University, Gent, Belgium |
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Applications of X-Ray Fluorescence (XRF) in the Glass Industry L.M. Schurter, Owens Corning, Science and Technology Center, Granville, OH |
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Grating Based X-Ray Phase Contrast Imaging using Laboratory X-ray Sources M. Schuster, Siemens AG, Corporate Technology, Munich, Germany |
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TRACE ELEMENT ANALYSIS OF DIETARY SUPPLEMENTS AND NUTRIENTS BY TXRF Hagen Stosnach, Bruker AXS Microanalysis GmbH, Berlin, Germany Arkady Buman, Bruker AXS Inc., Madison, WI, USA Michael Rider, Bruker AXS Inc., Madison, WI, USA James Neil-Kababick, Flora Research, Grants Pass, OR, USA |
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THE NEW BRUKER S8 LION MULTICHANNEL XRF Arkady Buman, Bruker AXS Inc., Madison ,WI, USA Kai Behrens, Bruker AXS GmbH,Karlsruhe, Germany |
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DIFFRACTION GEOMETRY AND THE DETERMINATION OF STRAIN FREE LATTICE PARAMETERS FOR RESIDUAL STRESS MEASUREMENTS J M Shackleton *, Materials Science Centre, University of Manchester, MANCHESTER, UK Prof. P J Withers, Materials Science Centre, University of Manchester, MANCHESTER, UK Dr M Preuss, Materials Science Centre, University of Manchester, MANCHESTER, UK |
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ANALYSIS OF IRON ORE USING X –RAY FLUORESCENCE SPECTROMETER P.Sharma*,N.C.Lakshman,B.K.Choudhary,N.K.Nanda, R&D Centre, NMDC Limited, Hydrabad, INDIA |
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L shell x-ray fluorescence cross-sections for elements with 33 ≤ Z ≤ 50 V. Sharma, N. Singh, S. Kumar, Panjab University, Chandigarh, India |
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High-Energy X-Ray Optics at the Advanced Photon Source S. D. Shastri, Argonne National Laboratory, Argonne, IL, USA |
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Overview of X-ray Imaging at NSLS-II Q. Shen, NSLS, Brookhaven National Laboratory, Upton, NY |
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ELEMENTAL ANALYSIS BY COMPTON PEAK CORRECTION Ying Shi, Dow Chemical, Midland, MI, USA |
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ASTM D 6247 Determination Elemental Content of Polyolefins by X-Ray Fluorescence Spectrometry - Validation of the Revised Standard J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD |
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SRM 2855 Additive Elements in Polyethylene J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD |
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MOLYBDENUM CONCENTRATES - BORATE FUSION WITH NIOBIUM INTERNAL STANDARD J. R. Sieber, Nat. Inst. Stand. Tech., Gaithersburg, MD, USA |
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Protrusions in a painting of Max Beckmann examined with confocal XRF R. Simon*, Forschungszentrum Karlsruhe/ISS, Karlsruhe, Germany W. Faubel, Forschungszentrum Karlsruhe/IFG, Karlsruhe, Germany H. Becker, Kunsthalle Mannheim, Mannheim, Germany W. Schmidt, Landesmuseum für Technik und Arbeit Mannheim, Germany |
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NEW DETECTOR ACHITECTURES WITH SILICON DRIFT DETECTORS FOR XRF APPLICATIONS A. Simsek*, O. Jaritschin, A. Liebel, P. Lechner, G. Lutz, PNDetector GmbH, Munich, Germany A. Bechteler, A. Niculae, H. Soltau, R. Echkardt, K. Hermenau, PNSensor GmbH, Munich, Germany F. Schopper, L. Strueder, MPI Semiconductor Laboratory, Munich, Germany |
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L3M- radiative resonant Raman scattering measurements in 59Pr N. Singh, V. Sharma, S. Kumar, Panjab University, Chandigarh, India |
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ENERGY-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS OF MONO- AND POLYCRYSTALS OF SELENIDE SPINELS BY FUNDAMENTAL PARAMETER METHOD R. Sitko*, B. Zawisza, E. Malicka, Institute of Chemistry, Silesian University, Katowice, Poland |
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FoM proposals for indexing powder diffraction patterns of high-symmetry lattices Olga Smirnova, Kyoto University, Kyoto, Japan |
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EXPANSION OF MFI ZEOLITE CRYSTALS AS A FUNCTION OF ADSORBATE LOADING AND ITS EFFECT ON MEMBRANE PERMEATION S.G. Sorenson*, J.L. Falconer, R.D. Noble, University of Colorado, Boulder, CO, USA E.A. Payzant, Oak Ridge National Laboratories, Oak Ridge, TN, USA |
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PART II (Portable ART Analyzer) – Development of a Portable Micro X-ray Fluorescence Spectrometer Adapted for the Special Needs for the Study of Artworks in the Kunsthistorisches Museum, Vienna G. Buzanich, C. Streli, P. Wobrauschek, Vienna University of Technology, Atominstitut, Vienna, Austria A. Markowicz, D. Wegrzynek, International Atomic Energy Agency, Seibersdorf, Austria E. Chinea-Cano, International Atomic Energy Agency, Seibersdorf, Austria M. Griesser, K. Uhlir, Kunsthistorisches Museum, Vienna, Austria |
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Spectrometer for Grazing Incidence XRF: Characterization of As Implants and Hf Layers D. Ingerle, N. Zoeger, P. Wobrauschek, C.Streli, Atominstitut, Vienna University of Technology, Vienna, Austria F. Meirer, Atominstitut, Vienna University of Technology, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA G. Pepponi, Fondazione Bruno Kessler, Povo, Italy |
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Improvement of Calibration Processes in TXRF of Wafer Surface Analysis: Investigation of Saturation Effects in TXRF by Comparing Picodroplets and Microdroplets C. Horntrich, S. Sasamori, C. Streli, Atominstitut, Vienna University of Technology, Wien, Austria F. Meirer, Atominstitut, Vienna University of Technology, Wien, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA U.E.A. Fittschen, Los Alamos National Laboratory, Los Alamos, NM and University of Hamburg, Hamburg, Germany G. Pepponi, FBK-irst, Povo, Italy G. Havrilla, Los Alamos National Laboratory, Los Alamos, NM |
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Establishing Performance Criteria for an ASTM XRF Standard Test Method For Portland Cements P. Stutzman, National Institute of Standards and Technology, Gaithersburg, MD |
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SYNCHROTRON POWDER DIFFRACTION SIMPLIFIED: A NEW MAIL-IN SERVICE FOR THE 11-BM HIGH-RESOLUTION DIFFRACTOMETER AT THE ADVANCED PHOTON SOURCE Brian H. Toby, Lynn Ribaud, Matthew R. Suchomel*, Jennifer Doebbler and Robert B. Von Dreele, Argonne National Laboratory, Argonne IL, USA |
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Characteristics of Capillary X-ray Optics for Confocal Three-dimensional Micro-XRF Technology T. Sun*, Y. Li, Z. Liu, X. Lin, P. Luo, Q. Pan, X. Ding, Beijing Normal University, Beijing, China |
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X-ray diffraction spot observation of Tl2Ba2CuOx using focusing coherent synchrotron beam with a magnetic field change Takuya Suzuki, Kitakyushu Univ., Kitakyushu, Fukuoka, Japan Daisuke Miyamoto, Kitakyushu Univ., Kitakyushu, Fukuoka, Japan Takashi Oba, Kitakyushu Univ., Kitakyushu, Fukuoka, Japan Akihisa Takeuchi, JASRI, Hyougo, Japan Hidekazu Takano, Hyogo , Hyougo, Japan Yoshio Suzuki, JASRI, Hyougo, Japan |
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GRAZING INCIDENCE DIFFRACTION STUDY OF EPITAXIAL FILMS USING EXTENDED ROCKING CURVE ANALYSIS Aya Takase, Rigaku Americas Corporation, The Woodlands, TX, USA Kazuhiko Omote, Rigaku Corporation, Tokyo, Japan |
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High-throughput XRD and Analysis for Rapid Determination of Phase Distribution Across Combinatorial Libraries I. Takeuchi, University of Maryland, College Park, MD |
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Dislocation Generation Related to Microcracks in Si-Wafer: In-situ Study at High Temperature with White Beam X-Ray Topography A. Danilewsky, J. Wittge, A. Hess, A. Cröll, University Freiburg, Freiburg, Germany D. Allen, P. McNally, Dublin City University, Dublin, Ireland P. Vagovic, A. Cecilia, Z. Li, T. Baumbach, Research Centre Karlsruhe/Institut für Synchrotronstrahlung, Karlsruhe, Germany E. Gorostegui–Colinas, J. Garagorri, M.R. Elizalde, Centro de Estudios e Investigaciones Tecnicas de Gipuzkoa, San Sebastian, Spain D. Jacques, Jordan Valley Semiconductor, Durham, UK M.C.Fossati, D.K. Bowen, B.K. Tanner, Durham University, Durham, UK |
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Grazing Incidence In-plane X-ray Diffraction from Epitaxial Fe/MgO/Fe and Fe/Au/MgO/Fe Tunnel Junctions D.S. Eastwood, M. Abes, B.K. Tanner, University of Durham, Durham, United Kingdom T.P.A. Hase, University of Warwick, Coventry, United Kingdom B.J. Hickey, M. Ali, University of Leeds, Leeds, United Kingdom |
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OPTICS FOR NUCLEAR RESONANT SCATTERING AT HIGH ENERGIES Thomas S. Toellner, Advanced Photon Sorce, ANL, Argonne, IL, USA |
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TXRF ANALYSIS OF ULTRAFINE ATMOSPHERIC PARTICLES FROM MOBILE SOURCES J. Osán, KFKI Atomic Energy Research Institute, Budapest, Hungary S. Török, KFKI Atomic Energy Research Institute, Budapest, Hungary |
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TXRF AND MICRO-XRF ANALYSIS OF PLASTIC TOYS AND SOILS K. Tsuji, M. Kawamata, Osaka City University, Osaka, Japan K. Nakano, Osaka City University, Osaka, Japan and JST Innovation Plaza, Osaka, Japan |
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HIGH-RESOLUTION X-RAY DIFFRACTION DATA ANALYSIS FROM THE PARTLY RELAXED SEMICONDUCTOR STRUCTURES A. Ulyanenkov, Bruker AXS GmbH, Karlsruhe, Germany A. Benediktovitch, I. Feranchuk, Belarussian State University, Minsk, Belarus B. He, H. Ress, Bruker AXS, Inc., Madison, WI |
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Microstructure Evolution in Cold Rolled Nanocrystalline Ni-Fe Alloys Determined by Synchrotron X-ray Diffraction L. Li, G.J. Fan, H. Choo, P.K. Liaw, The University of Tennessee, Knoxville, TN T. Ungar, G. Tichy, J. Lendvai, Eötvös University, Budapest, Hungary Y. D. Wang, N. Jia, Y.L. Yang, Northeastern University, Shenyang, P.R. China Y. Ren, Argonne National Laboratory, Argonne, IL |
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SINGLE-GRAIN MICROSTRUCTURE FROM POLYCRYSTALLINE SPECIMENS Tamás, Ungár, Eötvös University Budapest, Hungary |
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Considerations on Calibration and Prediction in Quantitative X-ray Fluorescence Analysis P. Van Espen, University of Antwerp, Antwerp, Belgium |
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MICROXRD AND XPS STUDY OF THE DYNAMIC NATURE OF CERIUM OXIDE NANOPARTICLES – INFLUENCE OF AGING AND CHEMICAL ENVIRONMENT Tamas Varga, Ponnusamy Nachimuthu, Satyanarayana V.N.T. Kuchibhatla, PNNL, EMSL, Richland, WA, United States Charles F. Windisch Jr., PNNL, Richland, WA, United States Ajay S. Karakoti, University of Central Florida, Orlando, FL, United States Sudipta Seal, University of Central Florida, Orlando, FL, United States Suntharampillai Thevuthasan, PNNL, EMSL, Richland, WA, United States Donald R. Baer, PNNL, EMSL, Richland, WA, United States |
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POLYCAPILLARY BASED CONFOCAL DETECTION SCHEMES FOR XRF MICRO AND NANO-SPECTROSCOPY B. Vekemans, B. De Samber, T. Schoonjans, G. Silversmit, L. Vincze, R. Evens, K. De Schamphelaere, C.R. Janssen, B. Masschaele, L. Van Hoorebeeke, Ghent University, Ghent, Belgium S. Schmitz, F. Brenker, JWG University, Frankfurt, Germany R. Tucoulou, P. Cloetens, M. Burghammer, J. Susini, C. Riekel, ESRF, Grenoble, France |
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Comparative Measurements of Secondary Standards for Paint Layers on Plastic and Glass Substrates A.G.Vershinin, M. Cusack, D. Li, W.Gibson, X-Ray Optical Systems, Inc., East Greenbush NY K.McIntosh,P. J. Parsons, Department of Environmental Health Sciences, School of Public Health, State University of New York at Albany, Albany NY P. J. Parsons, Wadsworth Center, New York State Dept of Health, Albany, NY B. Altkorn, Intertek Group plc, Oak Brook, IL N. Chan, Intertek Group plc, Shenzhen, China |
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POWDER DIFFRACTION FOR CHARACTERIZATION AND DEVELOPMENT OF OXIDE FUELS H.M. Volz, C.R. Stanek, E.P. Luther, J.T. Dunwoody, R.M. Dickerson,K.J. McClellan, S.C. Vogel, D.A. Weldon, D.R. Coughlin, D.D. Byler, Los Alamos National Laboratory, Los Alamos, NM |
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STRUCTURE ANALYISS OF SODIUM CATION IN AQUEOUS SOLUTION BY SOFT X-RAY ABSORPTION SPECTRA AND THEIR MOLECULAR ORBITAL CALCULATION Hisanobu, Wakita, Fukuoka University, Fukuoka, Japn Tsutomu, Kurisaki, Fukuoka University, Fukuoka, Japn |
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A New Promising Scintillation Crystal YBa3B9O18: Structure, Crystal Growth and Its Properties W.Y. Wang, M. He, X.L. Chen, Chinese Academy of Sciences, Beijing, PR China |
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Comparison of Retained Austenite Standards using XRD and OIM T.R. Watkins, E.A. Kenik, Oak Ridge National Laboratory, Oak Ridge, TN O.B. Cavin, The University of Tennessee, Knoxville, TN J.A. Cooke, Graham High School, Bluefield, VA K.M. Everett, Bath County High School, Hot Springs, VA J.L. Leisner, Bald Eagle Area High School, Wingate, PA Y. Picazo, West Carter High School, Olive Hill, KY |
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Crystal structures of the minerals stichtite and woodallite using Rietveld refinement P.S. Whitfield*, National Research Council Canada, 1200 Montreal Road, Ottawa ON, CANADA S.A. Wilson, S.J. Mills, G.M. Dipple, M. Raudsepp, Mineral Deposit Research Unit, University of British Columbia, Vancouver BC, CANADA |
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STATE-OF-THE-ART MULTILAYER OPTICS FOR X-RAY ANALYTICS Joerg Wiesmann, Incoatec GmbH, Geesthacht, Germany Bernd Hasse, Incoatec GmbH, Geesthacht, Germany Carsten Michaelsen, Incoatec GmbH, Geesthacht, Germany Frank Hertlein, Incoatec GmbH, Geesthacht, Germany |
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NANOTOMOGRAPHY AT THE ARGONNE HARD X-RAY NANOPROBE BEAMLINE R. P. Winarski, Center for Nanoscale Materials, Argonne National Laboratory , Illinois USA M. V. Holt, Center for Nanoscale Materials, Argonne National Laboratory , Illinois USA V. Rose, Advanced Photon Source, Argonne National Laboratory , Illinois USA F. DeCarlo, Advanced Photon Source, Argonne National Laboratory , Illinois USA J. Maser, Center for Nanoscale Materials, Argonne National Laboratory , Illinois USA |
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NIST SRM 2000 - A HIGH RESOLUTION X-RAY DIFFRACTION STANDARD REFERENCE MATERIAL D, Windover, Ceramics Division, NIST, Gaithersburg, MD, USA DL, Gil, Ceramics Division, NIST, Gaithersburg, MD, USA A, Henins, Ceramics Division, NIST, Gaithersburg, MD, USA JP, Cline, Ceramics Division, NIST, Gaithersburg, MD, USA |
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Si Wafer Analysis of Light Elements by TXRF – Chamber Adaption to Fit 6“ and 8“ Wafers S. Sasamori, N. Zöger, C. Streli, P. Kregsamer, S. Smolek, P. Wobrauschek, Vienna University of Technology, Atominstitut, Vienna, Austria F. Meirer, Vienna University of Technology, Atominstitut, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA C. Mantler, Siltronic AG, Freiberg, Germany |
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Micro X-ray Fluorescence Spectrometer with Low Power Tube for Light Element Analysis S. Smolek, C. Streli, N. Zoeger, P. Wobrauschek, Vienna University of Technology, Atominstitut, Vienna, Austria F. Meirer, Vienna University of Technology, Atominstitut, Vienna, Austria and 2 Stanford Synchrotron Radiation Lightsource, Menlo Park, CA |
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HIGH-RESOLUTION X_RAY SCATTERING METHODS FOR THE STRUCTURAL CHARACERTIZATION OF EPITAXIAL NITRIDE STRUCTURES Joachim F. Woitok, PANalytical B.V., Almelo, Netherlands |
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WASTE REDUCTION AND PROCESS IMPROVEMENTS IN THE ANALYSIS OF PLUTONIUM BY X-RAY FLUORESCENCE C.G. Worley, C.B. Soderberg, L.E. Townsend, Los Alamos National Laboratory, Los Alamos, NM, USA |
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Depth Analysis with Bench-Top TXRF Instrument T. Yamada, Y. Shimizu, H. Kobayashi, H. Kohno, Rigaku Corporation, Osaka, Japan |
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Trace Analysis on Solar Cell Materials with Bench-Top TXRF Y. Shimizu, T. Yamada, H. Kobayashi, H. Kohno, Rigaku Corporation, Osaka, Japan |
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FABRICATION OF HIGH-PRECISION CURVED CRYSTAL SUBSTRATE FOR JOHANSSON-TYPE DOUBLY CURVED CRYSTAL BY NUMERICALLY CONTROLLED LOCAL WET ETCHING K. Yamamura*, K. Ueda, M. Nagano, N. Zettsu, Osaka University, Suita, Osaka, Japan S. Maeo, S. Shimada, Osaka Electro-Communication University, Neyagawa, Osaka, Japan T. Utaka, K. Taniguchi, Institute of X-ray Technologies Co. Ltd, Osaka, Osaka, Japan |
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FROM SINGLE GRAINS TO TEXTURE Kun Yan, Klaus-Dieter Liss, Ulf Garbe, The Bragg Institute, Australia Nuclear Science and Technology Organization, NSW, Australia Kun Yan, Rian Dippenaar, University of Wollongong, NSW, Australia John Daniels, European Synchrotron Radiation Facility, Grenoble, France |
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RECENT DEVELOPMENT OF HARD X-RAY TRANSMISSION MICROSCOPY AT THE 32ID BEAMLINE AT THE APS JaeMock Yi*, Yong S. Chu, Wah-Keat Lee, Francesco De Carlo, Argonne National Laboratory, Argonne, IL, USA Wenbing Yun, Xradia Inc., Concord, CA, USA Yeukuang Hwu, Academia Sinica, Taipei, Taiwan |
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CAPABILITIES OF 50 MICRON MONO-CAPILLARY Y. Yokota*, S. Mamedov, A. Whitley, HORIBA Jobin Yvon Inc., Edison, NJ, USA S. Ohzawa, HORIBA, Ltd., Kyoto, Japan |
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Residual stress analysis in cubic textured polycrystalline materials by XRD R. Yokoyama*, J. Harada, Rigaku Corporation, Akishima, Tokyo , Japan Y. Akiniwa, Yokohama National University,Yokohama , Japan |
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LABORATORY-BASED CHARACTERIZATION OF HETEROEPITAXIAL STRUCTURES: ADVANCED EXPERIMENTS NOT NEEDING SYNCHROTRON RADIATION Peter Zaumseil, IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany |
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X-RAY ANALYSIS OF THE POLYCRYSTALLINE COMPOUNDS Cu[Cr2-xVx]Se4 B. Zawisza*, E. Malicka, R. Sitko, Institute of Chemistry, Silesian University, Katowice, Poland A. Gągor, Institute of Low Temperature and Structure Research, Polish Academy of Sciences, Wrocław, Poland |
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Sagittal Focusing of High-Energy x-rays By Sagittally Bent Laue Crystals: Design and Performance at NSLS X7B Beamline Z. Zhong *, D. M. Connor, A. Lenhard, H. Zhong, National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 J. Hanson, Chemistry Department, Brookhaven National Laboratory, Upton, NY 11973 |