2010 Denver X-ray Conference Information:


Thermo Scientific


Sponsors Polymer Workshop

Blake Industries, Inc.

Bruker AXS, Inc.

PANalytical Inc.

Rigaku Americas Corporation

Cultural Heritage


2010 Denver X-ray Conference Information:

call for papers 2010


The Monday evening Poster Session will be held in the exhibit hall (Rocky Mountain Event Center) and the atrium outside the exhibit hall, in conjunction with exhibits and a Wine & Cheese Reception sponsored by Thermo Scientific and ICDD.


CHAIRS: J.A. Kaduk, Poly Crystallography, Inc., Naperville, IL
T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
D-40 ‘Calculated’ Reference Patterns & ‘Measured’ Reference Scans: New Database Possibilities
T. Degen, PANalytical B.V., Almelo, The Netherlands
D-70 An Inexpensive Stage for Reflection Geometry Variable Temperature Diffraction Using an Off-The-Shelf Peltier Device
A. Drews, Ford Research and Advanced Engineering, Dearborn, MI
D-67 Fast Diffraction Studies with Microfocus Sources
P. Panine, S. Rodrigues, B. Lantz, P. Høghøj, Xenocs SA, Sassenage, France
D-63 High Brilliance Laboratory Sources for Small X-ray Beams
C. Michaelsen, T. Samtleben, B. Hasse, J. Wiesmann, U. Heidorn, S. Kroth, F. Hertlein, Incoatec GmbH, Geesthacht, Germany
D-79 SAXS Investigations of Solid Samples Using the New Multi-Purpose Variostage
H. Santner, C. Resch, Anton Paar GmbH, Graz, Austria
D-56 Polymers Characterized using In Situ Laboratory SAXS/WAXS Coupled with Mechanical Tests
M. Feuchter, University of Leoben, Leoben, Austria
J. Keckes, Austrian Academy of Sciences and University of Leoben, Leoben, Austria
G.A. Maier, Materials Center Leoben, Leoben, Austria
D-37 Your Synchrotron Powder Diffraction Instrument: 11-BM at the Advanced Photon Source
B.H. Toby, M.R. Suchomel, R.B. Von Dreele, L. Ribaud, APS - Argonne National Laboratory, Argonne, IL
D-6 An Alternative Voyage through Reciprocal Space
K.D. Rogers, J. Rogers, A. Dicken, Cranfield University, Cranfield, Bedfordshire, UK
P. Evans, J.W. Chan, X. Wang, Nottingham Trent University, Nottingham, UK
D-82 Functional Multilayer Optics – Graded Nanometer Multilayers as Polarizers and Bandpass Filters with Tunable Energy and Angular Resolution
Th. Holz, R. Dietsch, M. Kraemer, D. Weissbach, AXO Dresden GmbH, Heidenau, Germany
D-25 New X-ray Imaging Camera Gives Insight into X-ray Source Characteristics
L. Pina, M. Horvath, Rigaku Innovative Technologies Europe, S.R.O., Prague, Czech Republic
N. Grupido, B. Ehlers, B. Kim, Rigaku Innovative Technologies, Inc., Auburn Hills, MI
D-23 Topography as a Method to Evaluate X-ray Mirrors
J.A. Maj, P. Fernandez, K. Lazarski, X. Huang, Argonne National Laboratory, Argonne, IL
D-8 Scatter Enhanced X-ray Imaging
A. Dicken, K. Rogers, J. Rogers, Cranfield Health, Cranfield University, Shrivenham, Swindon, UK
P. Evans, J.W. Chan, Nottingham Trent University, Nottingham, UK
D-55 A Novel Sample Pressing Technique to Reduce Preferred Orientation Using the Back-Pressed Presentation Method
N.A. Raftery, Queensland University of Technology, Brisbane, Australia
D-34 Synchrotron X-ray Scattering Studies of Thin Film Interface Evolution
A.P. Warren, T. Sun, B. Yao, K.R. Coffey, University of Central Florida, Orlando, FL
K. Barmak, Carnegie Mellon University, Pittsburgh, PA
M.F. Toney, Stanford Synchrotron Radiation Laboratory, Menlo Park, CA
D-32 Evolution of Texture and Dislocations of High-Ductile Twip Steel During Deformation
S. Sato, T. Yoshimura, K. Wagatsuma, S. Suzuki, Tohoku University, Sendai, Miyagi, Japan
N. Yamada, Bruker AXS K. K., Yokohama, Kanagawa, Japan
D-64 Experimental Study of Minerals from Kimberlite of Yakutia
O.E. Kovalchuk, L.V. Liskovaya, A.Ya. Rotman, ALROSA Co. Ltd., Mirny, Russia
D-21 Theoretical Derivation of the X-ray Diffraction Line Profile Based on its Absorption
K. Liu, H. Chen, Shanghai Institute of Tech, Shanghai, China
D-18 Calculation of X-ray Stress Factors on the Basis of SO(3) Vector Parametrization
A. Ulyanenkov, Bruker AXS, Karlsruhe, Germany
A. Benediktovich, A. Zhilik, I. Feranchuk, Belarussian State University, Minsk, Belarus
T. Ulyanenkova, University of Karlsruhe, Karlsruhe, Germany
D-72 X-ray Diffraction Techniques for Characterization of Thin Film Solar Cells
I. Cernatescu, B. Litteer, S. Rekhi, PANalytical, Westborough, MA
J. Woitok, PANalytical, Almelo, The Netherlands
D-71 Strain-Induced Texture Development in the Magnesium Alloy AZ31
S. Huang, Shanghai Jiao Tong University, Shanghai, China
A. Drews, M. Li, J. Allison, Ford Research and Advanced Engineering, Dearborn, MI
D-69 Low-Temperature XRD Studies of Lithium Battery Electrolytes Based on Ethylene Carbonate— Dimethyl Carbonate Mixtures
A. Drews, J. Adams, M. Karulkar, R. Kudla, C. Paik, Ford Research and Advanced Engineering, Dearborn, MI
D-65 The Phase Diagram Studies on the 2-Amino-2-methyl-1, 3-propanediol(AMPL) and tris (hydroxymethyl) aminomethane(TRIS) Binary System
V.K. Kamisetty, D. Chandra, W.M. Chien, University of Nevada, Reno, NV
D-57 Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
J. Keckes, M. Bartosik, University Leoben, Leoben, Austria
G. Maier, Materials Centre Leoben, Leoben, Austria
M. Burghammer, ESRF, Grenoble, France
D-46 In Situ Time-Resolved X-ray Diffraction of Tobermorite Formation Process Under Hydrothermal Condition: Influence of Reactive Al Compound
K. Matsui, A. Ogawa, Asahi-KASEI Construction Materials Corporation, Sakai, Ibaraki, Japan
J. Kikuma, M. Tsunashima, T. Ishikawa, S. Matsuno, Asahi-KASEI Corporation, Fuji, Shizuoka, Japan
D-38 High Temperature X-ray Diffraction Analyses of Monosodium Titanate & Sodium Peroxotitanate Resins
D.M. Missimer, A.R. Jurgensen, R.L. Rutherford, Savannah River National Laboratory, Aiken, SC
D-31 Refinement of Garnet Structure from Kimberlite of Yakutia
L.V. Liskovaya, O.E. Kovalchuk, A.C. Ivanov, ALROSA Co. Ltd., Mirny, Russia
D-9 Multialiquot Cell Approach for the SDPD of High Symmetry Compounds
O.A. Smirnova, Kyoto University, Kyoto, Japan
D-4 A Stepwise Approach for the X-ray Diffraction Data in Rietveld Refinement
O.A. Smirnova, Kyoto University, Kyoto, Japan
D-26 Species Identification of Bone Fragments: Development of a New Combined Method of Heat Treatment and X-ray Diffraction Analysis
S. Beckett, K.D. Rogers, Cranfield University, Shrivenham, UK
J.G. Clement, The University of Melbourne, Melbourne, Australia
D-27 XRD Winning Smiles: Analysis of Dental Calculus in Bioarchaeology
S. Beckett, C. Greenwood, S. Ralph, K.D. Rogers, Cranfield University, Shrivenham, UK
K. Hardy, BioArch, University of York, York, UK
J.G. Clement, The University of Melbourne, Melbourne, Australia
Post Deadline Abstracts:
D-102 Effect of Heat Treatment on Structure and Phase Transformation of RE2Zr2O7 Powders Intended for Plasma Spraying of Ceramic Layers
G. Moskal, T. Rzychon, B. Witala, A. Rozmysłowska, Silesian University of Technology, Katowice, Poland
G. Dercz, University of Silesia, Katowice, Poland
D-103 XRD Residual Stress Characterization of Air Plasma Sprayed Re-Zirconates Type of Ceramic Coatings
G. Moskal, T. Rzychon, B. Witala, A. Rozmysłowska, Silesian University of Technology, Katowice, Poland
G. Dercz, University of Silesia, Katowice, Poland
D-104 Characterization of Biomedical Materials Using Low-Angle X-ray Scattering (LAXS) System
N.A. Hussein, Garyounis University, Benghazi, Libya
A. Shukri, A.A. Tajuddin, Universiti Sains Malaysia, Penang, Malaysia
D-105 Systematic Neutron Scattering Investigation of Structural Evolution in Pyrochlores at Low and High Temperatures
A.S. Losko, S.C. Vogel, M. Patel, J. Rhyne, Los Alamos National Laboratory, Los Alamos, NM
D-106 Small-Angle X-ray Scattering of Composite Polypropylene Films
D.E. Temnov, E.E. Fomicheva, Herzen State Pedagogical University, Saint-Petersburg, Russia
B.A. Fedorov, A.V. Smirnov, Saint-Petersburg State University of Information Technologies, Saint-Petersburg, Russia
D-107 In Situ High Temperature X-ray Diffraction Characterization of Silver Sulfide, Ag2S
T.N. Blanton, N. Dontula, Eastman Kodak Company, Rochester, NY
S.T. Misture, Alfred University, Alfred, NY
D-108 Effects of Cycling Hydrogen and Nitrogen Mixed Gases on Lithium Nitride Based Hydrogen Storage Materials
W. Chien, J. Lamb, N.K. Pal, D. Chandra, University of Nevada, Reno, Reno, NV
D-110 Nanoparticle Size Analysis Using SAXS and XRD Techniques
A. Takase, Rigaku Americas Corporation, The Woodlands, TX
D-111 X-ray Diffraction from Al Powder Using Energy Dispersive Technique
I.S. Elyaseery, University of Garyounis, Benghazi, Libya
D-112 X-ray Structural Studies of Li-Ion and Li-Air Battery Materials
N.K. Karan, Y. Ren, M. Balasubramanian, APS, Argonne National Laboratory, IL
L. Trahey, D.P. Abraham, C.S. Johnson, M.M. Thackeray, Chemical Science and Engineering Division, Argonne National Laboratory, IL
D-113 Temperature-Programmed X-ray Diffraction Studies on Phase Transitions of Modified ZMS-5 Catalysts for C4-Olefin Cracking Reactions
H. Wang, Y. Ji, X. Zeng, Beijing Research Institute of Chemical Industry, SINOPEC, Beijing, China
D-115 In-Situ Phase and Texture Characterization of Solution Deposited PZT Thin Films during Crystallization
K. Nittala, University of Florida, Gainesville, FL
G.L. Brennecka, Sandia National Laboratories, Albuquerque, NM
J.L. Jones, University of Florida, Gainesville, FL
D-116 Temperature Controlled Humidity Study of Trehalose Using X-ray Powder Diffraction
H. van Weeren, C.A. Reiss, PANalytical B.V., Almelo, The Netherlands
C. Resch, Anton Paar GmbH, Graz, Austria
D-117 The Wave Theory of the Crystalline Phase
O.A. Smirnova,  Kyoto University, Kyoto, Japan

Multiple Diffraction Peak Spectra Resulting From Single Crystal Substrates
T.R. Watkins, E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN


J. Okasinski, Argonne National Laboratory, Advanced Photon Source, Argonne, IL
G. González Avilés, DePaul University, Department of Physics, Chicago, IL

J.-D Su, A. R. Sandy, Argonne National Laboratory, Argonne, IL
J. Mohanty, Department of Physics, Technical University, Berlin, Germany
O. G. Shpyrko, University of California, San Diego, La Jolla, CA
M. Sutton, McGill University, Montreal, Quebec, Canada
T.P. Ntsoane, Necsa, Pretoria, North West Province, South Africa
M. Topic, R. Bucher, iThemba LABS, Cape Town, Western Cape, South Africa
U. Konig, PANalytical B.V., Almelo, Netherlands
J. Anderson, K. Macchiarola, PANalytical, Westborough, MA
L. Gobbo, PANalytical, Sao Paulo, Brazil