2010 Denver X-ray Conference Information:

Program

Thermo Scientific

Chemplex

Sponsors Polymer Workshop

Blake Industries, Inc.

Bruker AXS, Inc.

PANalytical Inc.

Rigaku Americas Corporation

Cultural Heritage

 

2010 Denver X-ray Conference Information:

call for papers 2010

TUESDAY, 3 AUGUST 2010 – XRF/XRD POSTER SESSION

The Tuesday evening Poster Session will be held in the exhibit hall (Rocky Mountain Event Center) and the atrium outside the exhibit hall, in conjunction with exhibits and a Wine & Cheese Reception sponsored by Chemplex Industries, Inc.

Chemplex

CHAIRS: D. Rosenfeld, E.I. DuPont de Nemours & Co., Wilmington, DE
R. Van Grieken, University of Antwerp, Antwerp, Belgium
F-69 Investigation of the Element Distribution in TXRF Samples Using Sr μXRF
C. Horntrich, S. Smolek, A. Maderitsch, P. Kregsamer, C. Streli, Atominstitut, Vienna University of Technology, Vienna, Austria
R. Simon, Forschungszentrum Karlsruhe, Institut für Synchrotronstrahlung, Eggenstein-Leopoldshafen, Germany
A. Nutsch, Fraunhofer Institute for Integrated Systems and Device Technology, Erlangen, Germany
M. Knoerr, Fraunhofer Institute for Integrated Systems and Device Technology (ZKLM), Nürnberg, Germany
F-75 Grazing Incidence X-ray Absorption Applied to the Characterization of As Shallow Implants in Si
G. Pepponi, D. Giubertoni, S. Gennaro, E. Demenev, M. Bersani, MiNALab, CMM–Irst, Trento, Italy
F. Meirer, C. Streli, ATI, TU Wien, Vienna, Austria
M.A. Sahiner, Seton Hall University, South Orange, NJ
M.A. Foad, Applied Materials Inc., Santa Clara, CA
P. Pianetta, SSRL, Menlo Park, CA
F-21 Quantification of Sulfur Content in Polymer Films of Varying Thicknesses Using X-ray Fluorescence
P. Ricou, D. Mountz, Arkema Inc., King of Prussia, PA
F-64 Investigation of XSW Related Effects on Reference-Free Quantitation of Nanoparticles
J. Osán, S. Török, KFKI Atomic Energy Research Institute, Budapest, Hungary
F. Reinhardt, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
A.E. Pap, Hungarian Academy of Sciences, Budapest, Hungary
F-63 Non-Destructive Chemical Speciation of Buried Interfaces by Absorption Spectroscopy at Grazing Incidence Conditions
R. Unterumsberger, B. Pollakowski, M. Müller, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
W. Ensinger, P. Hoffmann, T. Adler, A. Klein, Technische Universität Darmstadt, Darmstadt, Germany
F-71 Levels and Spatial Distribution of Trace Elements in Bone Following Strontium Treatment in Calcium Deficient Rats
F. Meirer, Atominstitut, Technische Universitaet Wien, Vienna, Austria and Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
J.G. Hofstaetter, Hanusch Hospital, Vienna, Austria and Vienna General Hospital, Vienna, Austria
S. Smolek, B. Pemmer, P. Wobrauschek, C. Streli, Atominstitut, Technische Universitaet Wien, Vienna, Austria
R. Simon, Forschungszentrum Karlsruhe GmbH, Eggenstein-Leopoldshafen, Germany
R.K. Fuchs, M.R. Allen, K.W. Condon, S. Reinwald, D.B. Burr, Indiana University, Indianapolis, IN
D. McClenathan, B. Keck, R.J. Phipps, Proctor and Gamble Pharmaceuticals, Mason, OH
F-46 Determination of Elemental Impurities in Active Pharmaceutical Ingredients According to Current Legislation by Using X-ray Fluorescence Spectrometry
E. Marguí, I. Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain
C. Fontàs, M. Hidalgo, University of Girona, Girona, Spain
K. Van Meel, R. Van Grieken, University of Antwerp, Antwerp, Belgium
F-45 Preconcentration Procedures Leading to Solid Thin Layers for Metal Determination in Liquid Analysis by X-ray Fluorescence Spectrometry
E. Marguí, I. Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain
C. Fontàs, M. Hidalgo, University of Girona, Girona, Spain
K. Van Meel, R. Van Grieken, University of Antwerp, Antwerp, Belgium
F-35 Analysis of Plant Leaves Related To Remediation Studies in Post-Mining Areas by Laboratory Based Micro-XRF Spectrometry
S. Smolek, C. Streli, Atominstitut TU Wien, Wien, Austria
E. Marguí, I. Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain
P. Kregsamer
, Atominstitut TU Wien, Wien, Austria
F-67 High-Resolution Soft X-ray Emission Spectrometry Employed for the Determination of Atomic Fundamental Parameters Related to the Ni L- Fluorescence Process
M. Müller, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
B. Kanngießer, TU Berlin, Berlin, Germany
F-42 Measurements of XRP Cross Sections and Li (i=1,2) Sub-Shell Fluorescence Yields For Ho at 22.6 keV Incident Photon Energy
A. Kumar, S. Puri, Punjabi University, Punjab, India
F-58 Light Element Analysis by Portable XRF in Mining Applications
M. Cameron, Bruker Elemental, Kennewick, WA
D. Cordier, USGS, Reston, VA
F-53 Trace Element Analysis Using EDXRF with Polarized Optics
T. Moriyama, S. Ikeda, M. Doi, Rigaku Corporation, Osaka, Japan
S. Fess, Applied Rigaku Technologies, Inc., Austin, TX
F-43 The Device for Determination of Effective Atomic Number Materials
I.A. Brytov, R.I. Plotnikov, A.D. Goganov, Saint Petersburg Electrotechnical University, Saint Petersburg, Russia
F-25 Analytical Performance of Newly Developed 2D/3D-XRF Instruments
T. Nakazawa, K. Nakano, K. Tsuji, Osaka City University, Osaka, Japan
F-6 50 mm2 Silicon Drift Detector in Compact TO8 Housing
A. Pahlke, T. Eggert, R. Fojt, L. Hoellt, J. Knobloch, S. Pahlke, O. Scheid, R. Stoetter, F. Wiest, KETEK GmbH, Munich, Germany
C-7 Magnetic Focusing Achieves Sub-100 mm Spots with Mini X-ray Tubes
S. Cornaby, Moxtek, Inc., Orem, UT
J. Steele, M. Hadley, O. Johnson, P. Jepsen, S. Rose, Brigham Young University, Provo, UT
   
Post Deadline Abstracts:
F-77 New Advances in Standardless Analysis for XRF: Improvements for the Quantification of Challenging Industrial Samples
K. Halkiotis, D. Coler, G. Wortman, PANalytical Inc., Westborough, MA
F-78 Analysis of Fused Metal Alloys by WDXRF using MOXI, a Wide-Ranging-Oxide Application for Metals
G. Wortman, D. Coler, K. Halkiotis, PANalytical Inc., Westborough, MA
C-11 X-ray Absorption Spectroscopy of Changes in Ti Sites During Li Insertion in Nanostructured Anatase
R. Apps, G. Mountjoy, University of Kent, Canterbury, Kent, UK
U. Lafont, TU Delft, Delft, The Netherlands
F-80 X-ray Fluorescence (XRF) Analysis of Soil Heavy Metal Pollution from an Industrial Area - A Case Study of “Suame- Magazine” in Kumasi, Ghana
K. Kodom, K. Preko, Kwame Nkrumah University of Science and Technology, Kumasi, Ghana
D. Boamah, Geological Survey Department, Accra, Ghana 
F-81 Quantitative Speciation of Phosphate in Ternary Mineral Systems Using P K-XANES
N. Khare, University of Wyoming, Laramie, WY
F-82 The Determination of Copper Speciation in Breast Tumor Tissue Using a Compact, Short Focal Distance Bent Crystal Laue Analyzer
N. Kujala, R. Barrea, BioCAT, Illinois Institute of Technology, Chicago, IL
C. Karanfil, Mugla University, Kotekli-Mugla, Turkey
D. Chen, Q.P. Dou, Wayne State University, Detroit, MI
C-12 Collector Optics for the “Water Window”
S. Yulin, V. Nesterenko, T. Feigl, N. Kaiser, Fraunhofer Institute for Applied Optics and Precision Engineering, Jena, Germany
F-84 XRF SPECTROSCOPY ASSESSMENT OF TRACE METAL POLLUTION AND DISTRIBUTION IN SURFACE SOILS CAUSED BY ANTHROPOGENIC ACTIVITIES
K. Kodom, K. Preko, B. Kwakye-Awuah,  Kwame Nkrumah University of Science and Technology, Kumasi, Ghana
D. Boamah,  Geological Survey Department, Accra, Ghana<
D-123 IN-PLANE AND CONVENTIONAL POLE FIGURE MEASUREMENTS
E. Kagami, A. Takase, Rigaku Corporation, Tokyo, Japan
D-124 NEW HIGH-PRESSURE AND HIGH-TEMPERATURE XRD SAMPLE STAGE FOR IN-SITU STUDIES OF SOLID-GAS INTERACTIONS
C. Resch, J. Gautsch, J. Frühwirth, Anton Paar GmbH, Graz, Austria
A.Teresiak, K. Güth, O. Gutfleisch, Leibniz Institute for Solid State and Material Research Dresden, IFW Dresden, Germany
F-87 ANALYZING THE GROWTH PROCESS OF SINGLE-WALLED CARBON NANOTUBES BY X-RAY SPECTROMETRY
B. Pollakowski, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
L. Rispal, U. Schwalke, Technische Universität Darmstadt, Darmstadt, Germany
F-88 IMPROVING XRF ANALYSIS OF ATMOSPHERIC PARTICULATE MATTER SAMPLES: CALIBRATION BY IDEAL REFERENCE MATERIALS AND INVESTIGATING INTERFERENCES
H. Indresand, W. White, X. Cheng, K. Trzepla-Nabaglo, B. Perley, A.M. Dillner, University of California Davis, Davis, CA
X. Cheng, Zhejiang University, Hangzhou, P.R. China
F-91 ACHIEVEMENT OF 1 MCPS OUTPUT RATE FROM A LARGE AREA SILICON DRIFT DETECTOR
L. Feng, V.D. Saveliev, M. Takahashi, S. Barkan, E.V. Damron, C.R. Tull, SII NanoTechnology USA, Northridge, CA
F-94 SINGLE- AND FOUR-ELEMENT LARGE AREA SILICON DRIFT DETECTOR X-RAY SPECTROMETERS FOR XRF APPLICATIONS
V.D. Saveliev, L. Feng, C.R. Tull, S. Barkan, M. Takahashi, E.D. Damron, SII NanoTechnology USA, Inc., Northridge, CA
C-13 IN SITU SYNCHRONOUS XAFS/DRIFTS STUDY OF CO ADSORPTION ON AL2O3-SUPPORTED PT
Q. Wang, N. Marinkovic, University of Delaware, Newark DE
L. Barrio, Brookhaven National Laboratory, Upton, NY
C. Cooper, A. Frenkel, Yeshiva University, New York, NY