2010 Denver X-ray Conference Information:

Program

Thermo Scientific

Chemplex

Sponsors Polymer Workshop

Blake Industries, Inc.

Bruker AXS, Inc.

PANalytical Inc.

Rigaku Americas Corporation

Cultural Heritage

 

2010 Denver X-ray Conference Information:

call for papers 2010

SESSIONS WEDNESDAY, THURSDAY & FRIDAY 4–6 AUGUST.
THE CONFERENCE ENDS AT 12 NOON ON FRIDAY, 6 AUGUST

 

WEDNESDAY AM–—EVERGREEN BALLROOM
PLENARY SESSION

THE GREENING OF X-RAYS: X-RAYS AND RENEWABLE ENERGY
Chairs: R.L. Snyder
, Georgia Institute of Technology, Atlanta, GA
B. Toby, APS, Argonne National Laboratory, Argonne, IL
8:15   Chairman of the Denver X-ray Conference Opening Remarks
Robert L. Snyder, Georgia Institute of Technology, Atlanta, GA
PRESENTATION OF AWARDS
    2010 Birks Award
Presented to Victor Buhrke, Consultant, Portola Valley, CA
Presented by Tim Elam, Ametek/EDAX Research Group and the University of Washington APL, Seattle, WA
    2010 Jerome B. Cohen Award (winner announced at the Plenary Session)
Presented by Cev Noyan, Columbia University, New York, NY
PLENARY SESSION REMARKS BY THE CHAIRS
8:30 D-52 Investigations of the Defect Structure of Transparent Conductors Using X-ray and Neutron Scattering Techniques
Gabriela B. González Avilés, DePaul University, Chicago, IL
T.O. Mason, J.S. Okasinski, O. Warschkow, D.E. Ellis, Northwestern University, Evanston, IL
J.P. Hodges, Oak Ridge National Laboratory, Oak Ridge, TN
T. Buslaps, V. Honkimäki, European Synchrotron Radiation Facility, Grenoble, France
9:15 D-76 Insights into Thermoelectric Materials: New Structures and Properties
Paul Zschack, Argonne National Laboratory, Argonne, IL
C. Heideman, Q. Lin, N. Nguyen, M. Smeller, C. Mortensen, D.C. Johnson, University of Oregon, Eugene, OR
10:00 Break  
10:30 D-35 In-Situ Diffraction: An Important Tool for the Development of Renewable Energy Technologies
Mark A. Rodriguez, Sandia National Laboratories, Albuquerque, NM
11:15 D-91 Unraveling the Inner Workings of Energy-Related Materials Using In-Situ X-ray Absorption Techniques
Faisal M. Alamgir, Georgia Institute of Technology, Atlanta, GA
12:00 F-36 FP-Based EDXRF Characterization of Thin Film Solar Cells
Volker Rößiger, J. Kessler, Helmut Fischer GmbH, Sindelfingen, Germany
M. Haller, Fischer Technology, Inc., Windsor, CT

WEDNESDAY PM

XRD AND XRF

NEW DEVELOPMENTS IN XRD & XRF INSTRUMENTATION - EVERGREEN D
Chair: T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA
1:00 C-2 The Latest Development of Microfocusing Source Based Beam Modules and Their Applications
B. Kim, B. Verman, D. Wilcox, R. Samokyszyn, M. Young, L. Jiang, Rigaku Innovative Technologies, Inc., Auburn Hills, MI
1:15 D-5 A New Geometry for 21st Century Diffraction
K.D. Rogers, J. Rogers, A. Dicken, Cranfield University, Cranfield, Bedfordshire, UK
P. Evans, J.W. Chan, X. Wang, Nottingham Trent University, Nottingham, UK
1:30 D-15 A New Approach to High Throughput Diffraction Analysis
S. Roncallo, S.A. Ansari, D.W. Lane, Cranfield University, Shrivenham, Swindon, Wiltshire, UK
O. Karimi, K.D. Rogers, Cranfield University, Cranfield, Bedfordshire, UK
J.M. Gregoire, Cornell University, Ithaca, NY
1:45 D-24 Design and Development of Compound X-ray Optical Systems
B. Verman, D. Wilcox, B. Kim, R. Samokyszyn, M. Young, Y. Hua, L. Jiang, Rigaku Innovative Technologies, Inc., Auburn Hills, MI
T. Ozawa, R. Matsuo, K. Omote, T. Osakabe, M. Aoyagi, K. Sumii,
Rigaku Cooperation, Tokyo, Japan
2:00 D-44 X-ray Source, Optic and Detector for Two-Dimensional XRD
B.B. He, Bruker AXS, Madison, WI
2:15 D-45 Development of In Situ X-ray Diffraction System for Hydrothermal Reaction and Its Application to Autoclaved Aerated Concrete Formation
J. Kikuma, M. Tsunashima, T. Ishikawa, S. Matsuno, Asahi-KASEI Corporation, Fuji, Shizuoka, Japan
K. Matsui, A. Ogawa, Asahi-KASEI Construction Materials Corporation, Sakai, Ibaraki, Japan
2:30 D-61 New Instrumentation for X-ray Material Research
H.R. Ress, B.B. He, B. Jones, Bruker AXS, Madison, WI
G. Vanhoyland, Bruker AXS, Karlsruhe, Germany
2:45 D-62 Clever Diffractometers with the Incoatec Microfocus Source
T. Samtleben, C. Michaelsen, B. Hasse, J. Graf, J. Wiesmann, Incoatec GmbH, Geesthacht, Germany
3:00 D-66 High Brilliance Microfocus Sources with Scatterless Collimation for Improved SAXS
S. Rodrigues, P. Panine, V. Roger, P. Høghøj, Xenocs, Sassenage, France
3:15 Break  
3:45 D-86 Empyrean—The World of X-ray Diffraction Is No Longer Flat
M. Fransen, PANalytical, Almelo, The Netherlands
4:00 F-9 Combined X-ray Imaging and Spectroscopy—A Low Cost Solution
D. Lane, J. Lyons, Cranfield University, Shrivenham, Swindon, UK
4:15 F-10 High Speed 2D and 3D MXRF—Imaging with Bench Top Technology
U. Waldschlaeger, M. Haschke, Bruker Nano GmbH, Berlin, Germany
4:30 F-16 Readout ASICs for Silicon Drift Detectors
L. Bombelli, C. Fiorini, A. Celani, A. Longoni, Politecnico di Milano - DEI - , Milano, Italy
R. Alberti, T. Frizzi, R. Nava, XGLab S.R.L., Milano, Italy
4:45 F-51 Bruker EDXRF New Product Releases and News 2010
A. Seyfarth, Bruker AXS Inc., Madison, WI
A. Gross, Bruker AXS Microanalysis, Berlin, Germany
J. Patterson, B. Kaiser, Bruker Elemental, Inc., Kennewick, WA
5:00 F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation
A. Niculae, A. Liebel, A. Simsek, O. Jaritschin, PNDetector GmbH, Munich, Germany
H. Soltau, A. Liebel, R. Eckhardt, G. Lutz, S. Jeschke, P. Lechner, PNSensor GmbH, Munich, Germany
L. Strüder, F. Schopper, G. Schaller, MPI Semiconductor Laboratory, Munich, Germany
C. Fiorini, Politecnico di Milano, Milano, Italy
5:15 F-70 Ultrathin Multi-Element Layer Stacks – A New Type of Reference Samples for μ-XRF and TXRF
M. Kraemer, T. Holz, R. Dietsch, D. Weissbach, AXO Dresden GmbH, Heidenau, Germany
G. Falkenberg, Hasylab at DESY, Hamburg, Germany
R. Simon, FZ Karlsruhe, Eggerstein, Germany
U. Fittschen, T. Krugmann, Universität Hamburg, Hamburg, Germany
B. Beckhoff, PTB Berlin, Berlin, Germany
5:30 F-73 High-Definition XRF – Multiple Monochromatic Beams EDXRF – For Consumer Product Analysis
Z.W. Chen, S. Nayar, X-ray Optical Systems, Inc., East Greenbush, NY
     

XRD

POLYMERS/SAXS (SUPPORTED BY BRUKER, PANALYTICAL AND RIGAKU) - EVERGREEN A
Chairs: S. Murthy, Rutgers University, Piscataway, NJ
B. Landes, Dow Chemical Company, Midland, MI
1:30 D-94 Invited—In-Situ and Time Resolved Small-Angle X-ray Scattering
B.G. Landes, B.J. Kern, T.J. Hermel-Davidock, M. Demirors, J.D. Weinhold, G.R. Marchand, K. Nanjundiah,R.E. Drumright, The Dow Chemical Company, Midland, MI
S.J. Weigand, Northwestern University, DND-CAT, Chicago, IL
2:00 D-84 Invited—The Structure and Hydrogen Bonding of a Highly Disordered Fiber
J.D. Londono, A.D. English, DuPont Company, Wilmington, DE
P. Langan, Los Alamos National Laboratory, Los Alamos, NM
Y. Nishiyama, CNRS, Grenoble, France
T. Forsyth, ILL/Keele University, Staffordshire, UK
2:30 D-29 Investigation of Microstructural Changes in Impacted Polyurea Coatings Using Small-Angle X-ray Scattering (SAXS)
E. Balizer, J. Fedderly, G. Lee, NSWCCD, Bethesda, MD
S. Bartyczak, W. Mock, NSWCDD, Dahlgren, VA
3:00 Break    
3:20 D-53 Invited—Analysis of the Equatorial Streak in Small-Angle X-ray Scattering Patterns: Investigation of Deformation in Carbon Nanotube-Reinforced Polyacrylonitrille Fibers
N.S. Murthy, Rutgers University, Piscataway, NJ
W. Wang, University of Vermont, Burlington, VT
3:50 D-68 Invited—Transient Microstructure of Thermoplastic Polyurethane Nanocomposites Under Uniaxial Deformation
H. Koerner, R. Vaia, Air Force Research Lab, WPAFB, OH
4:20 D-75 Preferred Orientation in Polymer Fibers
C. Burger, B.S. Hsiao, B. Chu, Stony Brook University, Stony Brook, NY
4:40 D-11 Polymer-Oriented Tools in the Irena Package for Small-Angle Scattering Data Analysis
J. Ilavsky, APS- Argonne National Laboratory, Argonne, IL
5:00 D-99 Relaxation Behaviors of Nanoparticles in Polymer Composites: Influence of Local Frictions by Polymer Chains
B. Lee, P. Thiyagarajan, S. Narayanan, A. Sandy, C.-T. Lo, V. Pol, D. Bohnsack, Argonne National Laboratory, Argonne, IL
     

XRD

HANAWALT AWARD SESSION
NANOSTRUCTURE STUDIES USING THE ATOMIC PAIR DISTRIBUTION FUNCTION - EVERGREEN C
Chair: E. Bozin, Brookhaven National Laboratory, Upton, NY
All presentations are invited
1:20   Presentation of the 2010 Hanawalt Award
Presented to Takeshi Egami, University of Tennessee, Knoxville, TN and Simon Billinge, Columbia University, New York, NY
Presented by Robert L. Snyder, Chairman of the Denver X-ray Conference
1:30 D-87 Recent Advances in the PDF Technique (2)
T. Egami, University of Tennessee, Knoxville, TN
2:15 D-100 Structure at the Nanoscale: Atomic Pair Distribution Function Analysis of Nanostructured Materials
S. Billinge, Columbia University, New York, NY
3:00 Break    
3:30 D-92 Structure of Crystallographically Challenged Hydrogen Storage Materials
H.J. Kim, Los Alamos National Laboratory, Los Alamos, NM
3:55 D-97 PDF Analysis of Glassy and Nanocrystalline Metallic Materials
W. Dmowski, Y. Iwashita, T. Egami, University of Tennessee, Knoxville, TN
S.H. Overbury, ORNL, Oak Ridge, TN
4:20 D-89 Force Measurement of DNA with Pair Distribution Function
X. Qiu, National Institutes of Health, Bethesda, MD
4:45 D-83 Element-Specific Structure of Nanosized Materials by High-Energy Resonant X-ray Diffraction and Differential Atomic Pair Distribution Functions
V. Petkov, Central Michigan University, Mt. Pleasant, MI
S. Shastri, APS- Argonne National Laboratory, Argonne, IL
5:10 D-98 Progress with the GSAS-II Software Package for Crystallography
B.H. Toby, R.B. Von Dreele, APS - Argonne National Lab, Argonne, IL
     

XRF

FUSION AND INDUSTRIAL APPLICATIONS OF XRF EVERGREEN B
Chair: J.A. Anzelmo
, Anzelmo & Associates, Inc., Madison, WI
2:00 F-1 Invited—Applications of X-ray Fluorescence in the Titanium Dioxide Industry
L. Ottmar, Millennium Inorganic Chemicals, Glen Burnie, MD
2:30 F-27 Global Cement and Raw Materials Fusion/XRF Analytical Solution: Part 2
M. Bouchard, J. Anzelmo, S. Rivard, Corporation Scientifique Claisse, Quebec, Canada
A. Seyfarth, L. Arias, Bruker-AXS, Madison, WI
K. Behrens, S. Durali-Müller, Bruker-AXS GmbH, Karlsruhe, Germany
2:50 F-24 Advancing Photovoltaics: New Methods for the Determination of Czts Stoichiometry
W. Brubaker, DuPont Central Research and Development, Wilmington, DE
3:10 Break    
3:40 F-23 Invited—Applications of XRF in CRM Development at the National Institute of Standards and Technology
J.R. Sieber, NIST, Gaithersburg, MD
4:10 F-2 Certifying Lead Content in Child-Accessible Products, a New Generation of Calibration and Certified Reference Materials
J.B. Sardisco, K.A. Perrin, J.S. Crnko, Analytical Services, Inc., The Woodlands, TX
4:30 F-14 Waste Reduction Process Improvements in the Analysis of Plutonium by X-ray Fluorescence: Results from Multiple Data Sets
C.G. Worley, C.B. Soderberg, L.E. Townsend, Los Alamos National Laboratory, Los Alamos, NM
4:50 F-8 Combining CdTe and Si Detectors for Energy-Dispersive X-ray Fluorescence
R. Redus, T. Pantazis, J. Pantazis, A. Huber, Amptek, Inc., Bedford, MA
B. Cross, CrossRoads Scientific, El Granada, CA
 

THURSDAY AM

XRD

RIETVELD ANALYSIS I - EVERGREEN C
Chairs: J. Kaduk, Poly Crystallography Inc., Naperville, IL
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
9:00 D-54 Invited—Synchrotron Powder X-ray Diffraction Study of the Structure and Dehydration Behaviors of Sepiolite and Palygorskite
J.E. Post, Smithsonian Institution, Washington, DC
P.J. Heaney, Pennsylvania State University, University Park, PA
9:30 D-58 Invited—Applications of Time-Resolved Synchrotron X-ray Diffraction to Mineral-Fluid Reactions
P.J. Heaney, T.B. Fischer, C.R. Fleeger, D.R. Hummer, K.M. Peterson, A.J. Wall, Penn State University, University Park, PA
J.E. Post, Smithsonian Institution, Washington, DC
10:00 D-14 Synthesis and Characterization of Ettringites
H. Poellmann, University of Halle, Halle, Germany
10:20 D-33 Oxygen Octahedral Environments in Three-Layer Aurivillius Phases via Combined X-ray and Neutron Powder Diffraction
E.J. Nichols, S.T. Misture, Alfred University, Alfred, NY
10:40 Break    
11:10 D-95 Bond Length Evolution in 312 and 211 Max Phases from High Temperature Neutron Diffraction and Rietveld Analysis
N.J. Lane, M.W. Barsoum, Drexel University, Philadelphia, PA
S.C. Vogel
, Los Alamos National Laboratory, Los Alamos, NM
11:30 D-12 Quantifying the Extent to which Experimental Pole Intensity Data Determine an Orientation Density Function Explaining the Data
R. Hielscher, Technische Universitaet Chemnitz, Germany
H. Schaeben, Technische Universitaet Bergakademie Freiberg, Germany
     

XRF

ENVIRONMENTAL AND HANDHELD XRF - EVERGREEN B
Chairs: J.A. Anzelmo
, Anzelmo & Associates, Inc., Madison, WI
R. Van Grieken, University of Antwerp, Antwerp, Belgium
8:30   Invited—Title to be announced
J. Gearheart, Ecology Center, Ann Arbor, MI
9:00 F-32 Invited—Assessing the Environment with X-ray Fluorescence
J. Boman, J.B.C. Pettersson, University of Gothenburg, Gothenburg, Sweden
M. Gatari, University of Nairobi, Nairobi, Kenya
A. Wagner, Chalmers University of Technology, Gothenburg, Sweden
P. Molnár, Sahlgrenska University Hospital & University of Gothenburg, Gothenburg, Sweden
9:30 F-47 Invited—X-ray Fluorescence Spectrometry in the Environmental Field: A Review of Some Recent Investigations and Applications
E. Margui, I. Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain
M. Hidalgo
, University of Girona, Girona, Spain
R. Van Grieken, University of Antwerp, Antwerp, Belgium
10:00 F-7 Characterization of Silicon Drift Detectors for EDXRF
R. Redus, T. Pantazis, J. Pantazis, A. Huber, Amptek, Inc., Bedford, MA
10:20 Break  
10:50 F-39 Invited—Micro-XRF Analysis of Metal Alloys: From the Laboratory Calibration Towards In-Situ Analyses
A.G. Karydas, International Atomic Energy Agency (IAEA), Seibersdorf Laborarories, Seibersdorf, Austria and Institute of Nuclear Physics, NCSR Demokritos, Athens, Greece
V. Kantarelou, D. Sokaras, Institute of Nuclear Physics, NCSR Demokritos, Athens, Greece
D. Wegrzynek, E-Chinea-Cano, A. Markowicz, International Atomic Energy Agency (IAEA), Seibersdorf, Austria
P. Wobrauschek, C. Streli, TU Wien Atominstitut, Vienna, Austria
K. Uhlir, M. Griesser, Kunsthistrorisches Museum, Wien, Austria
11:20 F-55 Indoor Air Quality in Brazilian Schools Nearby Industries: The Case of Curitiba
R.H.M. Godoi, A.F.L. Godoi, M.G. Arantes, S.J. Gonçalves Jr, L.C. Stroppa, R. Alves, J.E. Ferreira da Costa Gardolinski, J. Manoel dos Reis Neto, Federal University of Parana - UFPR, Curitiba – PR, Brazil
E.M. Fortunato de Lucena Reynaldo, Red Cross Hospital – Paraná, Curitiba, Brazil
B. Alfody, KFKI Atomic Energy Research Institute, Budapest, Hungary
Y. Makarovska, R. Van Grieken, University of Antwerp, Antwerp, Belgium
11:40 F-60 XRS for Preventive Conservation of Cultural Heritage
R. Van Grieken, University of Antwerp, Antwerp, Belgium
     

XRF

QUANTITATIVE ANALYSIS - EVERGREEN D
Chair: T. Elam
, Ametek/EDAX Research Group and Univ. of Washington APL, Seattle, WA
8:30 F-18 Invited—Analytical Strategy for Compositional and Layer Thickness Analysis of Copper-Indium-Gallium-Selenium on Molybdenum Coated Glass Substrates
L.L. Brehm, T.T. Hasan, D.A. Libby, T.R. Bryden, The Dow Chemical Company, Midland, MI
9:00 C-4 XANES Based Quantitative Phase Analysis in Cu2ZnSnS4
H.D. Rosenfeld, E.I. DuPont de Nemours & Co., Wilmington, DE
9:20 F-4 Quantification of Two-Polymeric Phases in Paint Formulation by X-ray Fluorescence and X-ray Photoelectron Spectroscopy
P. Ricou, R. Gupta, Arkema Inc., King of Prussia, PA
9:40 F-11 Glancing Versus Normal XRF Excitation with Monochromatic and Polychromatic Radiation for the Composition Analysis of SmCo Based Films on Silicon Wafers
F.J. Cadieu, I. Vander, R.W. Zuneska, Queens College of CUNY, Flushing, NY
10:00 F-61 Depth-Resolved Speciation of Buried Nanolayers
B. Pollakowski, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
10:20 Break  
10:40 F-66 Investigation of Spin-Coated Inorganic Contamination on Si Surfaces by Various Analytical Techniques
B. Beckhoff, M. Kolbe, M. Müller, Physikalisch Technische Bundesanstalt, Berlin, Germany
A. Nutsch, R. Altmann, Fraunhofer IISB, Erlangen, Germany
G. Borionetti, C. Pello, MEMC Electronic Materials SpA, Novara, Italy
M.L. Polignano, D. Codegoni, S. Grasso, E. Cazzini, Numonyx, Via Olivetti, Milan, Italy
M. Bersani, P. Lazzeri, S. Gennaro, Fondazione Bruno Kessler, Trento, Italy
P. Kregsamer, F. Posch, Atominstitut, TU Wien, Vienna, Austria
11:00 F-41 X-ray Fluorescence Analysis of Palladium in Non-Homogeneous Organics and Slurries via Gel Suspensions
D.W. Burns, Y. Yang, Dow Chemical, Freeport, TX
S. Yusuf, Dow Chemical, Midland, MI
D.G. Coler, PANalytical, Westborough, MA
11:20 F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities
W.T. Elam, B. Scruggs, F. Eggert, J. Nicolosi, EDAX, a unit of Ametek Inc., Mahwah, NJ
11:40 F-54 Development of Quantification Method Using Fundamental Parameter Method for EDXRF
S. Hara, N. Kawahara, T. Matsuo, M. Doi, Rigaku Corporation, Osaka, Japan
12:00 F-59 Characterization of Gemstones by Multiple Excitation EDXRF
M. Haller, Fischer Technology, Windsor, CT
V. Rößiger, Helmut Fischer GmbH, Sindelfingen, Germany
A. Peretti, Gemresearch Swisslab AG, Lucerne, Switzerland
D. Günther, ETH Zürich, Switzerland
     

THURSDAY PM

XRD & XRF

CULTURAL HERITAGE I (SUPPORTED BY BRUKER) - EVERGREEN A
Chairs: M. Walton
, Getty Conservation Institute, Los Angeles, CA
K. Eremin, Harvard Art Museum, Cambridge, MA
2:00 F-19 Invited—Analysis of Meissen Ceramics from the Hoffmeister Collection by HH-XRF
A.J. Shortland, K. Domoney, Cranfield University, Swindon, UK
S. Kuhn, Bonham’s Auctioneers, London, UK
2:30 C-8 Invited—Analyzing Stratigraphy with a Dual XRD/ XRF Instrument
G. Chiari, Getty Conservation Institute, Los Angeles, CA
3:00 D-3 An Archaeologist’s Dilemma
K.D. Rogers, S. Beckett, S. Kuhn, Cranfield University, Swindon, Wiltshire, UK
A. Chamberlain, Sheffield University, Sheffield, UK
J. Clement, University of Melbourne, Melbourne, Australia
3:20 Break    
3:50 F-50 Invited—Incorporating the Concept of Secondary Targets in Handheld X-ray Fluorescence to Increase Sensitivity of Minor Elements
C. McGlinchey, The Museum of Modern Art, NY, NY
B. Kaiser, T. Howe, Bruker Elemental, Kennewick, WA
4:20 F-79 Characterization of Silver Gelatin Fiber Based Photographic Papers using X-ray Fluorescence Spectroscopy
A. Martins, C. McGlinchey, L.A. Daffner, Museum of Modern Art, New York, NY
P. Messier, LLC, Boston, MA
A. Chapman, University of Delaware Program in Art Conservation, Winterthur, DE
     

XRD

RIETVELD ANALYSIS II EVERGREEN C
Chairs: J. Kaduk
, Poly Crystallography Inc., Naperville, IL
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
2:00 D-74 Invited—High-Resolution Powder X-ray Diffraction Study of Complex Minerals
S.M. Antao, University of Calgary, Calgary, Alberta, Canada
2:30 D-22 Crystal Structures of BaSrR4Zn2O10, R = La, Nd, Sm, Eu
J.A. Kaduk, Poly Crystallography, Naperville, IL
W. Wong-Ng, NIST, Gaithersburg, MD
2:50 D-60 Detection and Quantification of Passivation Layers in Electrochemical Inert Anodes by In-Situ and Ex-Situ Diffraction
M.R. Rowles, K. McGregor, G.A. Snook, CSIRO Process Science and Engineering/CSIRO Light Metals Flagship, Victoria, Australia
I.C. Madsen, N.V.Y. Scarlett, M. Lanyon, A. Urban, CSIRO Process Science and Engineering, Victoria, Australia
M.J. Styles, D.P. Riley, The University of Melbourne, Victoria, Australia
3:10 Break  
3:40 C-6 Characterization of X-ray Powder Diffraction Data of BaxSr1-xSO4 (0≤ x≤1) by Rietveld Refinement
S.R. Zaidi, H. Sitepu, S. Shen, N. Al-Yami, Saudi ARAMCO, Dhahran, Saudi Arabia
4:00 D-77 XRD Anisotropic Broadening of Nano-Particles
Y. Wang, S.L.I. Chan, Y.R. Shen, R. Amal, K. Kiatkittipong, University of New South Wales, Australia

4:20 D-19 Differences between Near-Surface and Bulk Preferred Orientation with Powder Diffraction Data of Molybdite (MoO3) and Calcite (CaCO3)
H. Sitepu, Curtin University of Technology, Perth, Australia and Saudi ARAMCO, Dhahran, Saudi Arabia
B.H. O’Connor, D. Li, Curtin University of Technology, Perth, Australia
4:40 D-13 Computational Texture Analysis with MTEX
R. Hielscher, Technische Universitaet Chemnitz, Germany
F. Bachmann, H. Schaeben, Technische Universitaet Bergakademie Freiberg, Germany
     

XRD

MICRO DIFFRACTION EVERGREEN D
Chair: C. Murray
, IBM, T.J. Watson Research Center, Yorktown Heights, NY
2:00 D-20 Invited—Three Dimensional X-ray Diffraction Microscopy
L. Margulies, Brookhaven National Laboratory, Upton, NY
H.F. Poulsen, S. Schmidt, D.J. Jensen, Risoe National Lab, Roskilde, Denmark
G. Vaughan, J. Wright, ESRF, Grenoble, France
2:30 D-30 Invited—Nanoscale Scanning Probe Diffraction Microscopy at the Hard X-ray Nanoprobe Beamline
M. Holt, S. Hruszkewycz, R. Winarski, V. Rose, J. Maser, Argonne National Laboratory, Argonne, IL
3:00 D-81 Multi-Dimensional X-ray Investigation of Materials—Ranging from Classical Bragg-Brentano Type Diffraction Phase Analysis to 3 Dimensional CT Microstructure Analysis
H. Pöllmann, University of Halle/Mineralogy, Halle, Germany
R. Maier, U. Riedl, G. Blaj, PANalytical, Almelo, The Netherlands
     

XRD

MILE HIGH RESOLUTION XRD - EVERGREEN D
Chair: K. Evans-Lutterodt
, Brookhaven National Laboratory, Upton, NY
3:50 D-73 High Resolution X-ray Diffraction of III-Nitride Wide Bandgap Semiconductors
Q. Sun, B. Leung, J. Han, Yale University, New Haven, CT
4:10 D-17 High-Resolution Reciprocal Space Mapping of InGaAs/GaAs Structures: From Pseudomorphic to Fully Relaxed State
A. Ulyanenkov, Bruker AXS GmbH, Karlsruhe, Germany
F. Rinaldi, S. Menzel, Ulm University, Ulm, Germany
A. Benediktovich, A. Zhilik, I. Feranchuk, Belarussian State University, Minsk, Belarus
K. Saito, Bruker AXS K.K., Yokohama, Japan
4:30 D-36 In-Plane Diffraction Analysis for Twist/Twin Structure of Non-Polar A-Plane GaN
Y.-i. Jang, K.-h. Park, K.-h. Bang, LG Advanced Research Institute, Seoul, Korea
4:50 D-1 Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of Silver Indium Selenide Films Prepared by Laser Ablation
D. Pathak, R.K. Bedi, Guru Nanak Dev University, Amritsar, India
D. Kaur, Indian Institute of Technology, Roorkee, India
     

XRF

X-RAY IMAGING - EVERGREEN B
Chair: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
2:00 F-22 Invited—X-ray Absorption Imaging for Analysis of Gas Discharges in Energy-Efficient Lighting
J.J. Curry, NIST, Gaithersburg, MD
2:30 F-3 STXM Imaging of Organic Coatings on Grains in Primitive Interplanetary Dust: Implications for Formation of Pre-Biotic Organic Matter and Grain Sticking in the Early Solar System
G.J. Flynn, SUNY-Plattsburgh, Plattsburgh, NY
S. Wirick, C. Jacobsen, SUNY- Stony Brook, Stony Brook, NY
L.P. Keller, NASA Johnson Space Center, Houston, TX
S.A. Sandford, NASA Ames Research Center, Moffett Field, CA
2:50 F-37 Macroscopic X-ray Fluorescence Capability for Large-Scale Elemental Mapping
H.M. Volz, G.J. Havrilla, R.M. Aikin, Jr., V.M. Montoya, A.N. Duffield, Los Alamos National Laboratory, Los Alamos, NM
3:10 F-29 Overlay of Laboratory-Based 3D X-ray Imaging Systems
B.M. Patterson, G.J. Havrilla, B. Jackson, Los Alamos National Laboratory, Los Alamos, NM
3:30 Break  
4:00 F-26 Invited—X-ray Chemical Imaging in Scanning and Projection Modes in the Laboratory
K. Tsuji, K. Nakano, Osaka City University, Osaka, Japan
4:30 D-28 High Speed 3D Diffraction Imaging
J.P.O. Evan, J.W. Chan, S.X. Godber, I. Peatfield, Nottingham Trent University, Nottingham, UK
K.D. Rogers, A. Dicken, J. Rogers, Cranfield University, Cranfield, Bedfordshire, UK
4:50 F-34 Selecting the Appropriate X-ray Optic for the Right Application
G.J. Havrilla, V. Montoya, Los Alamos National Laboratory, Los Alamos, NM
     

FRIDAY AM

XRD & XRF

CULTURAL HERITAGE II - EVERGREEN A
Chairs: M. Walton
, Getty Conservation Institute, Los Angeles, CA
K. Eremin, Harvard Art Museum, Cambridge, MA
8:30 C-10 Invited—Going Beyond XRF: Use of Micro-Fluorescence and Diffraction to Understand How a Cultural Heritage Object Was Made and How It Ages and Degrades
M. Walton, Getty Conservation Institute, Los Angeles, CA
E.J. Schofield, University of Kent, Canterbury, UK
R. Sarangi, S. Webb, A. Mehta, SSRL/SLAC Nat Accd. Lab, Menlo Park, CA
F. Meirer, Technische Universität Wien, Vienna, Austria
9:00 F-28 XRF Line and Area Scans in the Examination of Works of Art
K. Trentelman, Getty Conservation Institute, Los Angeles, CA
9:20 F-38 The Challenges of XRF Analysis of Cultural Heritage Glass Objects
B.J. Kaiser, Bruker Elemental, Kennewick, WA
R. Brill, Corning Glass Museum, Corning, NY
9:40 F-12 Glancing Incidence XRF for the Analysis of Early Chinese Bronze Mirrors
R.W. Zuneska, J. Rong, I. Vander, F.J. Cadieu, Queens College of CUNY, Flushing, NY
10:00 Break  
10:20 F-17 Invited—The Photo-Oxidative Degradation of Matisse’s Le Bonheur De Vivre (1905-6): X-ray-Based Methods for Degradation Mechanism Identification
J.L. Mass, Winterthur Museum, Winterthur, DE
B. Buckley, M. Little, The Barnes Foundation, Merion, PA
10:50 F-68 Visualizing the 17th Century Underpainting Using Mobile and Synchrotron-Based Scanning Macro-XRF
M. Alfeld, K. Janssens, University of Antwerp, Antwerp, Belgium
J. Dik, Delft University of Technology, Delft, The Netherlands
P.D. Siddons, Brookhaven National Laboratory, NSLS, Brookhaven, NY
E. van de Wetering, Rembrandt Research Project, Amsterdam, The Netherlands
11:10 C-9 Medieval Microfabrication: X-ray Tomographic and Laminographic Visualization of Religious Artwork
J. Dik, J. Blaas, Delft University of Technology, Delft, The Netherlands
A. Wallert, Rijksmuseum, Amsterdam, The Netherlands
P. Reischig, L. Helfen, A. Bravin, European Synchrotron Radiation Facility, Grenoble, France
     

XRD

STRESS ANALYSIS - EVERGREEN B
Chairs: C. Goldsmith
, IBM, Hopewell Junction, NY
T. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
8:30 D-50 Invited—Thermo-Mechanical Behavior of Thin Films and Small Structures Characterized by Synchrotron X-ray Diffraction
J. Keckes, University Leoben and Austrian Academy of Sciences, Leoben, Austria
9:00 D-48 XRD Stress Analyses on Surfaces with Curvature Radius below 1mm, a New Challenge!
A. Haase, M. Klatt, A. Schafmeister, R. Stabenow, GE Sensing & Inspection Technologies GmbH, Ahrensburg, Germany
9:20 D-101 Invited—A Next Generation Neutron Diffraction Strain Scanner for Steady-State Sources
R.B. Rogge, Canadian Neutron Beam Centre, National Research Council, Canada
9:50 Break  
10:10 D-16 Invited—Commissioning Results and New Scientific Opportunities at Vulcan—The SNS Materials Science and Engineering Diffractometor
K. An, X.-L. Wang, A.D. Stoica, H. Skorpenske, D. Ma, C.R. Hubbard, Oak Ridge National Laboratory, Oak Ridge, TN
T.M. Holden, Northern Stress Technology, Deep River, Canada
P.K. Liaw, H. Choo, University of Tennessee, Knoxville, TN 25
10:40 D-96 In-Situ Neutron Diffraction Study of Residual Stress in Steel Ammonia Nurse Tank Welds
T.A. Sisneros, D.W. Brown, Los Alamos National Laboratory, Los Alamos, NM
A. Russel, Ames National Laboratory, Ames, IA
S. Chumbley, A. Becker, Iowa State University, Ames, IA
     

XRF

TRACE ANALYSIS - EVERGREEN C
Chair: P. Wobrauschek
, Atominstitut, Vienna University of Technology, Vienna, Austria
8:30 F-72 Invited—TXRF-A Versatile Tool for Trace Element Analysis: A Review
P. Wobrauschek, Atominstitut, Vienna Univ. of Technology, Vienna, Austria
9:00 F-31 Discovering the Selenium Metabolism and Its Impact for Health Prevention by TXRF
A. Gross, H. Stosnach, Bruker Nano GmbH, Berlin, Germany
K. Renko, T. Behrends, L. Schomburg, Charité Berlin, Berlin, Germany
9:20 F-76 Invited—Different Applications of Polycapillaries to X-ray Spectroscopy
H.J. Sánchez, R.D. Pérez, Universidad Nacional de Córdoba, Argentina
C.A. Pérez, Laboratório Nacional de Luz Síncrotron, Campinas, Brasil
9:50 F-33 Trace Element Detection Using Monochromatic Wavelength Dispersive X-ray Fluorescence
G.J. Havrilla, M. Collins, V. Montoya, Los Alamos National Laboratory, Los Alamos, NM
Z. Chen, F. Wei, X-ray Optical Systems, East Greenbush, NY
10:10 Break  
10:30 F-74 Invited—Analysis of Indoor Fine Dust
U.E.A. Fittschen, A. Rehmers, University of Hamburg, Hamburg, Germany
M. Santen, Greenpeace Hamburg, Hamburg, Germany
M. Wesselmann, Bauinstitut Hamburg, Hamburg, Germany
11:00 F-62 Characterization of Nanoparticles with X-ray Spectrometry under Grazing Incidence Conditions
F. Reinhardt, B. Beckhoff, B. Pollakowski, Physikalisch-Technische Bundesanstalt, Berlin, Germany
H. Bresch, S. Seeger, Bundesanstalt für Materialforschung und –prüfung, Berlin, Germany
11:20 F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions
P. Hönicke, B. Beckhoff, M. Kolbe, Physikalisch-Technische Bundesanstalt, Berlin, Germany
D. Giuberton, G. Pepponi, Fondazione Bruno Kessler, Trento, Italy
J. van den Berg, University of Salford, Salford, UK
11:40 F-49 Comparison of X-ray and Mass Spectroscopy Based Analytical Methods for Detection of Organic Contamination
A. Nutsch, A. Leibold, L. Pfitzner, M. Otto, Fraunhofer IISB, Erlangen, Germany
B. Beckhoff, M .Müller, Physikalisch-Technische Bundesanstalt, Berlin, Germany
G. Bedana, G. Borionetti, G. Guerinoni, MEMC Electronic Materials SpA, Novara, Italy
M.-L. Polignano, D. Codegoni, S. Grasso, D. De Simone, Numonyx, Milan, Italy