Providing a unique mixture of sessions on training, education, and applications and papers containing details about state-of-the-art techniques and future developments in X-ray analysis.

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Program

DXC 2011 Program Cover

 

WORKSHOPS MONDAY & TUESDAY, 1–2 AUGUST

am Workshops / 9:00 am – 12:00 noon    pm Workshops / 1:30 pm – 4:30 pm


MONDAY am XRD

Specimen Preparation XRD / Pikes Peak 1 & 2

Organizer & Instructors:
T.J. Fawcett, International Centre for diffraction Data, Newtown Square, PA, fawcett@icdd.com
N. Bhuvanesh, Texas A&M University, College Station, TX
S. Quick, The Pennsylvania State University, University Park, PA
M.A. Rodriguez, Sandia National Laboratories, Albuquerque, NM

Specimen preparation is often the limiting step for obtaining good results in a diffraction experiment. Preparation methods can infl uence the accuracy and precision of peak positions, intensities and profile. These are the basic measurements required for qualitative and quantitative analysis. The presentation will focus on crystallite and particle effects, orientation and texture, particle statistics and how various preparation methods can reduce or eliminate these influences. We will also focus on “tricks of the trade” for the preparation of micro specimens, air and moisture sensitive specimens, and thin films. The presentation will cover a range of preparation techniques used with common instruments.

Two-Dimensional Detectors / Pikes Peak 3 & 4

Organizers & Instructors:
T.N. Blanton, Eastman Kodak Company, Rochester, NY, thomas.blanton@kodak.com
B.B. He, Bruker AXS Inc., Madison, WI, bob.he@bruker-axs.com
B. Toby, Argonne National Laboratory, Argonne, IL
S. Speakman, Massachusetts Institute of Technology, Cambridge, MA

Two-dimensional diffraction data contain abundant information about the atomic arrangement, microstructure, and defects of a solid or liquid material. In recent years, the use of two-dimensional detectors has dramatically increased in academic, government and industrial laboratories. This workshop covers recent progress in two-dimensional X-ray diffraction in terms of detector technology, data collection strategy, data evaluation algorithms and software, and instrument confi gurations. Various application examples, such as phase ID, texture, stress, crystallinity, ombinational screening and thin film analysis will be discussed.

X-ray Metrology / Centennial

Organizers & Instructors:
J.P. Cline, National Institute of Standards & Technology, Gaithersburg, MD, jcline@nist.gov
D. Windover, National Institute of Standards & Technology, Gaithersburg, MD, windover@nist.gov
D.L. Gil, Princeton University, Princeton, NJ, dgil@princeton.edu

The workshop will explore the various methods for alignment, setup, qualifi cation and use of laboratory diffraction equipment suitable for powder diffraction and thin film diffraction and refl ectometry. A range of optical confi gurations will be discussed: conventional divergent beam, Johansson, graded parabolic mirrors, channel-cut symmetric and asymmetric monochromators and channel-cut analyzers. The methods for use of NIST SRMs to qualify and calibrate diffraction instruments will be covered using advanced methods of data analysis. These will include: for powder diffraction—the Rietveld method and the fundamental parameters approach; for high resolution and refl ectometry—differential evolution and Monte-Carlo methods. Certification methods for SI-traceable NIST SRMs will also be discussed.

MONDAY am XRF

Basic XRF / Gold Camp

Organizer & Instructors:
T. Elam, University of Washington APL, Seattle, WA, wtelam@apl.washington.edu
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM

This workshop provides a basic introduction to the principles of XRF, and is specifically aimed at those new to the field. It will start with a general overview of the technique, followed by more specific details of the basic principles. The emphasis will be on understanding how to use XRF and what its capabilities are. In the second half of the workshop, a few selected applications will be presented. The focus of this segment will be to provide an understanding of how the basic principles affect actual practice.

X-ray Optics / Centennial

Organizer & Instructor: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, havrilla@lanl.gov

There are many X-ray optics available to spatially restrict X-rays for use in X-ray spectrometry. Each optic has its own characteristics, capabilities, advantages and disadvantages and unique application niches. This workshop will provide basic knowledge about X-ray optics, specifically multi layer optics, polycapillary optics, doubly curved crystal optics, and monocapillary optics. One of the objectives in this workshop is to help users understand the basic working principles and performance characteristics of these optics. Attendees will learn the function of an X-ray optical system in selected applications and their capabilities.

MONDAY pm XRD

Rietveld Analysis / Pikes Peak 1 & 2

Organizers & Instructors:
S.T. Misture, New York State College of Ceramics at Alfred University, misture@alfred.edu
J.A. Kaduk, Poly Crystallography Inc. and Illinois Institute of Technology, Naperville, IL, kaduk@polycrystallography.com

This workshop will cover the theory (briefl y) and applications of Rietveld analysis. A broad range of applications will be covered, including: crystal structure and unit cell refinement, quantitative analysis, size and microstrain determination, texture analysis, and handling partially amorphous specimens. The instructors will provide not only traditional lectures but also will show live demonstrations of refinements, and will be happy to field questions during the demonstrations.

Materials Characterization by Combining X-ray Analytical with 3D X-ray Imaging Techniques / Gold Camp

Organizer & Instructors:
I. Cernatescu, Pratt and Whitney, iuliana.cernatescu@pw.utc.com
S.R. Stock, Northwestern University, Chicago, IL
G. Blaj, CERN, Genève, Switzerland
J. Gelb, Xradia, Pleasanton, CA

While X-Ray diffraction (XRD) is sensitive to variation of structure, phases, orientation, and microstructure of crystallite materials, Computed Tomography (CT) is sensitive to electron density variation, independent of whether the material is crystalline or not. Each technique is a very powerful characterization tool on its own, however a more complete story can be given when the results from both techniques are combined. The aim of this workshop is to give the attendees an overview of X-Ray diffraction (XRD) and X-Ray Computed Tomography (CT) and introduce the combination of both techniques for materials characterization. Both synchrotron- and laboratory-based techniques, instrumentation, and examples will be described.

MONDAY pm XRF

Trace Analysis / Pikes Peak 3 & 4

Organizers & Instructors:
C. Streli, TU Wien, Atominstitut, Wien, Austria, streli@ati.ac.at
P. Wobrauschek, TU Wien, Atominstitut, Wien, Austria, wobi@ati.ac.at
R. Van Grieken, University of Antwerp, Antwerp, Belgium
E. Margui, University of Girona, Girona, Spain
G. Pepponi, Fondazione Bruno Kessler, Trento, Italy
A. Martin, Thermo Fisher Scientific, Sugar Land, TX

This year´s trace analysis workshop will provide an introduction of basic fundamentals interesting for both beginners and experienced X-ray spectroscopists. Main topics to be covered are presentations of most modern techniques and instrumentation for trace element analysis. Physical methods to improve minimum detection limits in XRF by background reduction; for example, as use of sources of polarized radiation (Bragg- Barkla polarizers and synchrotron radiation), selective excitation, monochromatization will be presented. Taking secondary targets in orthogonal geometry or simple filtering of the primary radiation as a means of improving detection limits is discussed. Introduction to total refl ection XRF (TXRF) and actual instrumentation including portable TXRF is another point of interest and will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range. Applications from interesting scientific fields as environment, microelectronics, forensic, and life science will show the successful use of the importance of the various XRF spectrometric techniques.

TUESDAY am XRD & XRF

NEW! Technical Communication / Pikes Peak 1 & 2

Organizer & Instructor:
L. Rosenstein, Georgia Institute of Technology, Atlanta, GA, lr3@ce.gatech.edu

Writing: Creating Paragraph Coherence
One of the most common criticisms levied against people’s writing is that “it just doesn’t flow.” Consequently, the first half of the workshop will address the issue of paragraph coherence.    We will discuss the theory of information flow, and I will present specific strategies to create logical flow within paragraphs. Finally, participants will have a chance to collectively evaluate and edit several example paragraphs.

Speaking: Talking an Audience through Graphical Evidence
One of the most common deficiencies in technical presentations is the speaker’s inability to effectively describe and explain visuals.  Consequently, I will address the specific skill of talking an audience through graphical evidence.  After my presentation, participants will have the opportunity to practice the skills presented and are therefore encouraged (not required) to bring their own examples of graphical evidence (graphs, tables, schematics, photographs) on a flash drive.

Nanostructure by Atomic PDF Analysis I / Pikes Peak 3 & 4

Organizer & Instructor:
V. Petkov, Central Michigan University, Mt. Pleasant, MI, petkov@phy.cmich.edu

This full day workshop will start with a brief introduction and continue with a hands–on training on the atomic PDF analysis from XRD data reduction into atomic PDFs to structure determination based on atomic PDFs.

Attendees should install the following free software:

RAD: www.phy.cmich.edu/people/petkov/software.html
PDFgui: www.diff py.org/download.shtml
DISCUS: www.sourceforge.net/projects/discus/files

and come to the workshop with their laptops. Attendees are also encouraged to bring data sets of their own.

TUESDAY am XRF

Fundamentals of Digital Signal Processing and X-ray Detectors / Gold Camp

Organizer & Instructors:
S. Hayakawa, Hiroshima University, Hiroshima, Japan, hayakawa@hiroshima-u.ac.jp
J. Kawai, Kyoto University, Kyoto, Japan
S. Terada, X-Bridge Technologies, Kyoto, Japan
T. Papp, Cambridge Scientific, Ontario, Canada

This workshop will introduce various X-ray detectors (Si, Ge, and CdTe SSD, SDD, Si-PIN, proportional counter) and then what is done in the digital signal processors of X-ray spectrometers is explained. The workshop covers (1) basics of DSP (digital signal processor) and digital oscilloscope, (2) deadtime correction, (3) peak stability and calibration, (4) linear and non-linear response, (5) low energy tail, (6) trade-off s among energy resolution, throughput and eff ective area, (7) escape peaks, sum peaks, and pile-up signals, (8) Fano factor, (9) how to determine the best set of parameters, and (10) near room temperature operation.

Quantitative Analysis I / Centennial

Organizer & Instructors:
M. Mantler, Rigaku Corporation, Purkersdorf, Austria, michael.mantler@rigaku.com
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, University of Washington APL, Seattle, WA

Morning: Basic methods of quantitative analysis:
1. Theoretical and mathematical foundation: Classical fundamental parameter models.
2. Practical application: Working curves and infl uence coeffi cients, compensation methods.

Nanostructure by Atomic PDF Analysis II / Pikes Peak 3 & 4

Organizer & Instructor:
V. Petkov, Central Michigan University, Mt. Pleasant, MI, petkov@phy.cmich.edu

Continuation of Part I.

TUESDAY pm XRD

In-situ High Temperature XRD / Pikes Peak 1 & 2

Organizer & Instructors:
A. Payzant, Oak Ridge National Laboratories, Oak Ridge, TN, payzanta@ornl.gov
A. Drews, Ford Motor Co., Research & Advanced Engineering, Dearborn, MI
S. Speakman, Massachusetts Institute of Technology, Cambridge, MA
M. Kramer, Iowa State Univ., Ames Lab, Ames, IA

High-temperature XRD is particularly useful for determining lattice thermal expansion, structure of materials at high temperatures, for following reaction pathways and kinetics in single phase and multiphase materials. However, there are many issues that can trip up the unwary, such as thermal gradients, unwanted reactions, specimen volatility, systematic errors, etc. In addition to discussing these issues, with practical examples from the instructors’ labs, this workshop will also provide recommendations on how to collect HTXRD data on laboratory instruments, and additionally provide information on potentially useful synchrotron and neutron beamlines for high-temperature studies.

TUESDAY pm XRF

Sampling Theory, Practice and Quality Control / Gold Camp

Organizers & Instructors:
J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI, jaanzelmo@aol.com
M.A. Zaitz, IBM, Hopewell Junction, NY, zaitz@us.ibm.com
F. Pitard, Francis Pitard Sampling Consultants, LLC, Broomfield, CO
J. Tully, Retsch Corporation, Newtown, PA

Previous workshops have concentrated on specimen preparation, assuming correct sampling theory and practice. This workshop will concentrate on the theory and practice of the sampling process that ultimately strives to provide a representative sample to the laboratory for specimen preparation. Fundamental statistics, common sampling errors at mines, shipping, and exploration, and monitoring the results of analysis in the laboratories will be discussed. The equipment used during the sampling process will also be discussed.

Quantitative Analysis II / Centennial

Organizer & Instructors:
M. Mantler, Rigaku Corporation, Purkersdorf, Austria, michael.mantler@rigaku.com
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, University of Washington APL, Seattle, WA

Afternoon: Advanced methods of quantitative analysis:
1. Non-ideal samples (inhomogeneous samples, rough surfaces).

 

POSTER SESSIONS

Monday, 1 August – XRD Poster Session

The Monday evening XRD Poster Session will be held 5:00–7:00 pm in the Summit Ballroom on the 4th floor of the hotel, in conjunction with a Wine & Cheese

Reception sponsored by PANalytical and ICDD.

D-3:

An In-Situ X-ray Diffraction Study of Reduction of Nickel Oxide by Hydrogen
J.H. Li, A. Tripathi, A. Takase, L. Fields, T. McNulty, Rigaku Americas Corporation, The Woodlands, TX

D-6:

High-Efficiency Laboratory SAXS/GISAXS/WAXS Instrument for Nanomaterials Characterization
L. Fan, M. Degen, S. Bendle, P. Pennartz, N. Grupido, Rigaku Innovative Technologies Inc., Auburn Hills, MI

D-11:

Application of Line Profile Analysis to Evaluation of Microstructural Recovery Accompanied with Precipitation in Aged Alloys
S. Sato, A. Hasegawa, K. Wagatsuma, S. Suzuki, Tohoku University, Sendai, Japan
Y. Takahashi, Nissan Arc, Ltd., Yokosuka, Japan

D-12:

Is Onset of Gamma-Alumina Recrystallization Dependent on Crystallite Size? A Comparison of In-Situ Calcinations by High Temperature XRD and Conventional Ex-Situ Calcinations with Standard Powder XRD
C.L. Nicholas, C.K. Costello, A.Z. Ringwelski, M.A. Vanek, UOP LLC, A Honeywell Company, Des Plaines, IL

D-15:

Synchrotron Powder Diffraction Simplifi ed: The High-Resolution Diffractometer 11-BM at the Advanced Photon Source
L. Ribaud, M.R. Suchomel, R.B. Von Dreele, B.H. Toby, Argonne National Laboratory, Argonne, IL

D-18:

X-ray Diffraction Characterization of New Ternary Yttrium–Rare Earth Oxides Formed By the Sol–Gel Technique
G. Rafailov, Z. Porat, I. Dahan, Nuclear Research Center, Negev, Beer-Sheva, Israel
Z. Porat, J. Zabicky, D. Moglyanski, K. Rechav, G. Kimmel, Ben-Gurion University of the Negev, Beer-Sheva, Israel

D-23:

The Development and Evaluation of a New SAXS System for Biological Samples
K. Sasaki, A. Criswell, J. Ferrara, Rigaku Americas Corporation, The Woodlands, TX
N. Suzuki, Chiba University, Chiba, Japan
L. Jiang, M. Degen, Rigaku Innovative Technologies, Auburn Hills, MI

D-24:

Raman and X-ray Diffraction Studies on BaReH9: High Volumetric Capacity Hydrogen Storage Material
W.K. Wanene, D. Chandra, University of Nevada, Reno, Nevada
M. Somayazulu, S.A. Gramsch, R.J. Hemley, Carnegie Institution of Washington, Washington, DC
R.S. Chellappa, Los Alamos National Laboratory, Los Alamos, NM
S.V. Raju, S.M. Clark, Lawrence Berkeley National Laboratory, Berkeley, CA

D-26:

The Crystal-Structure of Mn-doped LiFePO4: A Combined Neutron and X-ray Diffraction Study
N. Sharma, V.K. Peterson, The Bragg Institute, Kirrawee, Australia
C. Feng, H. Li, Hubei University, Wuhan, China
G. Du, Z. Guo, H. Liu, University of Wollongong, Australia

D-27:

Microstructure of Plastic Bonded Explosives PBX
M. Herrmann, P.B. Kempa, U. Förter-Barth, Fraunhofer Institute Chemical Technology ICT, Pfi nztal, Germany
W. Arnold, MBDA-TDW, Schrobenhausen, Germany

D-28:

Powder X-ray Diffractometer wiTheasily Mount/Dismountable K 1 Optics Unit
T. Konya, T. Osakabe, K. Nagao, T. Kubo, Y. Ueji, R. Matsuo, T. Ozawa, Rigaku Corporation, Tokyo, Japan
L. Jiang, B. Verman, Rigaku Innovative Technologies, Inc., Auburn Hills, MI

D-32:

Synchrotron X-ray Microbeam Characterization of Liquid Crystal
A. Iida, Institute of Materials Structure Science, Tsukuba, Ibaraki, Japan
Y. Takanishi, Kyoto University, Sakyo, Kyoto, Japan

D-33:

Nano-Beam X-ray Diffraction Reveals Structural Properties in Graded Nano-Crystalline Ti1-XAlxN Thin Films at Different Stages of Spinodal Decomposition
M. Bartosik, A. Gaitzenauer, J. Keckes, Austrian Academy of Sciences, Austria
R. Daniel, C. Mitterer, Montanuniversität Leoben and Christian Doppler Laboratory for Advanced Hard Coatings, Austria
M. Burghammer, European Synchrotron Radiation Facility, Grenoble, France

D-36:

Multilayer Optics for X-ray Analytics
A. Kleine, B. Hasse, C. Michaelsen, J. Wiesmann, A. Hembd, U. Heidorn, S. Kroth, F. Hertlein, Incoatec GmbH, Geesthacht, Germany

D-44:

Rietveld Quantitative Analysis of Super Duplex Stainless Steel
J.L. Garin, R.L. Mannheim, Universidad de Santiago de Chile, Santiago, Chile
M.A. Camus, Universidad de Antofagasta, Antofagasta, Chile

D-48:

The Grey Goo‘on Chocolate: Fat-Bloom Characterization by GISAXS
P. Laggner, M. Kriechbaum, IBN, Austrian Academy of Sciences, Graz, Austria
M. Weygand, Hecus X-ray Systems GmbH, Graz, Austria

D-51:

Sorption and Nanostructure – Pressure-Scanning SAXS on Porous Materials
P. Laggner, M. Schmuck, IBN, Austrian Academy of Sciences, Graz, Austria
M. Kriechbaum, IBN, Austrian Academy of Sciences, Austria and Hecus X-ray Systems GmbH, Austria

D-52:

Investigating the Detection Limits of a Rotating Anode X-ray Diffractometer for Oil Sands Samples
M.R. Afara, R.J. Mikula, Natural Resources Canada, Devon, AB, Canada

D-53:

A Means for Assessing the Effectiveness of the Shot Peening Process as It Relates to Fatigue Performance
D.J. Snoha, S.M. Grendahl, U.S. Army Research Laboratory, MD
B.S. Matlock, Technology for Energy Corporation, Knoxville, TN

D-78:

Development of a New Diffractometer for the Evaluation of a Very Micro Area
M. Maeyama, S. Yasukawa, D. Iino, K. Itoh, T. Yoshida, H. Kawasaki, S. Yoshihara, K. Wakasaya, Rigaku Corporation, Tokyo, Japan

D-81:

Effect of Systematic Errors on Lattice Parameter Refinement
A. Takase, Rigaku Americas Corp., The Woodlands, TX

D-89:

Addressing Industrial Problems Using X-ray Diffraction at the Advanced Photon Source
J. Okasinski, M. Suchomel, J. Almer, L. Ribaud, B.H. Toby, Argonne National Laboratory, Argonne, IL

D-91:

X-ray Analysis of Pulsed Laser Deposition of Bi2Te3 Thin Film Layer
L.S. Faraji, R.P. Singh, Oklahoma State University, Tulsa, OK

D-95:

Rietveld Refinement with a Model That Considers Crystallite Size Distribution and Anisotropic Crystallite Shape
O. Ovalle, X. Bokhimi, Instituto de Física, Universidad Nacional Autónoma de México, Mexico

D-96:

An Approach to Quantitative Interpretation of XRD Patterns of Mineral Mixtures Using Standard Reference Minerals and Their FWHM in the PXRD-Whole Rock Difractograms
D. Alaygut, B. Canga, Turkish Petroleum Corp. Research Center, Ankara, Turkey

D-99:

X-ray Diffraction Measurement of Residual Stress in the Damaged Blade Sample of Gas Turbine Engine
S. Shen, A.H. Mustafa, I. Taie, G. Alabedi, S.R. Zaidi, Saudi Aramco, Dhahran, Saudi Arabia

D-102:

The Effect of Grain Size on the Semiconducting, Electrical, and Structural Properties of Zinc Oxide
R. Mansourian, G.B. González Avilés, DePaul University, Chicago, IL

D-103:

Multivariate Statistical Analysis of Micro-XRF Spectral Images from a Bruker M4 Tornado System
M.A. Rodriguez, P.G. Kotula, D.E. Wesolowski, J.E. Heath, S.J. Bauer, Sandia National Laboratories, Albuquerque, NM

D-112:

Searching For a Refi nable Model of a Nanocrystal
B.F. Palosz, Polish Academy of Sciences, Warsaw, Poland

D-113:

Surface Relaxation in Nano-Diamonds Examined with Application of Real and Reciprocal Space Methods
S. Stelmakh, E. Grzanka, S. Gierlotka, B. Palosz, Polish Academy of Sciences, Warsaw, Poland

D-116:

Experiment Verification for the Dependence of the X-ray Diffraction Line Profile with the Absorption of Sample
K. Liu, H. Chen, Shanghai Institute of Technology, Shanghai, China

D-117:

Novel Acoustic Emission and XRD In-Situ Cell for Characterization of Lithium Ion Batteries
K. Rhodes, C. Daniel, University of Tennessee, Knoxville, TN
M.J. Kirkham, R.A. Meisner, E.A. Payzant, N. Dudney, C. Daniel, Oak Ridge National Laboratory, Oak Ridge, TN

D-118:

X-ray Scattering Analysis of Petroleum Micro-Crystalline Wax (MCW)
B.K. Saikia, R. Prajapati, Indian Oil Corporation Ltd., Haldia Refinery, Haldia, India
A. Gogoi, R.K. Boruah, North-east Institute of Science & Technology (CSIR), Jorhat, India

D-119:

The Study of Micronization Induced Disorder and Environmental Annealing of an Active Pharmaceutical Ingredient (API) by XRPD Line Broadening Analyses
G.R. Williams, J. Brum, GlaxoSmithKline, King of Prussia, PA

D-120:

Minimizing the Effects of Preferred Orientation in X-ray Powder Diffraction
G.R. Williams, F. Kang, GlaxoSmithKline, King of Prussia, PA
B. Litteer, R. Kerstens, PANalytical, Inc., Westborough, MA
J. Smith, PANalytical, Inc., Richboro, PA

D-121:

Coherent and Incoherent X-ray Scattering From Partly Relaxed Semiconductor Structures Possessing Dislocations
A. Ulyanenkov, T. Ulyanenkova, Rigaku Europe SE, Berlin, Germany
A. Benediktovitch, A. Zhilik, I. Feranchuk, Belarusian State University, Minsk, Belarus
K. Saito, Rigaku Corporation, Tokyo, Japan


POSTER SESSIONS

Tuesday, 2 August – XRF and Core Shell Spectroscopy Poster Session

The Tuesday evening XRF Poster Session will be held 5:00 – 7:00 pm in the Summit Ballroom on the 4th fl oor of the hotel, in conjunction with a Wine & Cheese

Reception sponsored by Chemplex Industries, Inc.

C-2:

Development of a Quasi-Monochromatic X-ray Source Based On an Electrostatic Ion Accelerator
V. Yu. Storizhko, S.O. Vershynskyi, V.L. Denysenko, Institute of Applied Physics, Sumy, Ukraine

C-8:

Non-Destructive Fingerprinting of Pharmaceutical Compounds with a Low-Cost, Small Footprint Bench-Top XRD System, the BTX
J. Brum, Olympus Innov-X Systems, Inc., Woburn, MA

C-9:

The BTX Bench-Top XRD Analysis for Feed & Fertilizer Formulations
J. Brum, Olympus Innov-X Systems, Inc., Woburn, MA

F-8:

Comparison of Sample Preparation Approaches for TXRF using Different pL Pipetting Systems
M. Menzel, U.E.A. Fittschen, University of Hamburg, Hamburg, Germany
G. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
U. Waldschläger, Bruker Nano GmbH, Berlin, Germany

F-12:

Combined Phase and X-ray Fluorescence Imaging at the Sub-Cellular Level
E. Kosior, P. Cloetens, ESRF, Grenoble, France
S. Bohic, ESRF, Grenoble, France and INSERUM U-836, Grenoble, France

F-16:

Re-Configurable Digital Pulse Processor for High-Rate High-Resolution X-ray Spectroscopy
R. Alberti, T. Frizzi, S. Moser, XGLab SRL, Milano, Italy
A. Abba, L. Bombelli, A. Geraci, Politecnico di Milano, Dip. Elettronica e Informazione, Milano, Italy

F-17:

Handheld XRF Screening for Dangerously High Levels of Toxic Metals in Developing Countries
K. Russell, Olympus Innov-X, Woburn, MA

F-18:

Handheld XRF Soil Analysis for Precision Agriculture and Peri-Urban Farming Applications
K. Russell, Olympus Innov-X, Woburn, MA

F-26:

Quantitative Combined XRF and EPMA Analysis in the SEM
B.J. Cross, CrossRoads Scientific, El Granada, CA
K.C. Witherspoon, IXRF Systems, Inc., Houston, TX

F-28:

Evaluating XRF Na and Cl Measurements in Particulate Matter Samples
H. Indresand, A.M. Dillner, University of California, Davis, CA

F-30:

Application of Fusion Bead Correction in XRF Analysis of Powders
H. Homma, H. Inoue, Y. Kataoka, Rigaku Corporation, Osaka, Japan
M. Feeney, L. Oelofse, L.A. Fields, Rigaku Americas Corporation, The Woodlands, TX

F-39:

Analysis of TCLP Extracts by X-ray Fluorescence
D.S. Kendall, B.A. Burns, J.A. Suggs, U.S. EPA, Denver, CO

F-41:

Miniature Tube and Detector Modeling of Portable XRF Instrumentation
D. Couto, Olympus Innov-X, Woburn, MA

F-44:

X-ray Fluorescence Analysis of Mexican Varieties of Dried Chili Peppers
E. Romero-Dávila, Eton School, Mexico
J. Miranda, Instituto de Física, Universidad Nacional Autónoma de Mexico, Mexico

F-45:

Elemental Analysis of Fresh and Waste Water From Industrial Sources Using Total Refl ection X-ray Fluorescence (TXRF) Spectroscopy
M. Beauchaine, Bruker AXS Inc., Madison, WI

F-46:

On the Use of Monte Carlo Based Methods to EDXRF Qualitative Analysis
F. Li, Baker Hughes, Houston, TX
J. Wang, R. Gardner, North Carolina State University, Raleigh, NC

F-48:

A Noise Reduction Algorithm for Digital Signal Processers
Y. Nakaye, J. Kawai, Kyoto University, Kyoto, Japan

F-52:

Improvement of Detection Limits of a Portable TXRF by Reducing Electrical Noise
S. Imashuku, D.P. Tee, Y. Nakae, J. Kawai, Kyoto University, Kyoto, Japan

F-53:

Influence of the Excitation Energy on Absorption Effects in TXRF Analysis
C. Horntrich, P. Kregsamer, S. Smolek, A. Maderitsch, P. Wobrauschek, C. Streli, Atominstitut, Vienna, Austria
R. Simon, Karlsruhe Institute of Technology, Eggenstein-Leopoldshafen, Germany
A. Nutsch, Fraunhofer Institute for Integrated Systems and Device Technology, Erlangen, Germany
M. Knoerr, Fraunhofer Institute for Integrated Systems and Device Technology, Nürnberg, Germany

F-54:

Improvement of Calibration Processes in TXRF of Wafer Surface Analysis: Investigation of Saturation Effects in TXRF by Comparing Different Sample Shapes
C. Horntrich, P. Kregsamer, S. Smolek, A. Maderitsch, P. Wobrauschek, C. Streli, Atominstitut, Vienna, Austria
R. Simon, Karlsruhe Institute of Technology, Eggenstein- Leopoldshafen, Germany
A. Nutsch, Fraunhofer Institute for Integrated Systems and Device Technology, Erlangen, Germany

F-62:

Differential Accumulation of Lead in Double-Tidemarks in Articular Cartilage of Osteoarthritic Human Joints
A. Roschger, B. Pemmer, P. Wobrauschek, C. Streli, Atominstitut, Vienna, Austria
A. Roschger, J.G. Hofstaetter, P. Roschger, K. Klaushofer, Hanusch Hospital, Vienna, Austria
J.G. Hofstaetter, Hanusch Hospital, Austria and Medical Univ. of Vienna, Austria
R. Simon, Karlsruhe Institute of Technology, Eggenstein-Leopoldshafen, Germany

F-63:

Trace Element Distribution in Trabecular and Cortical Bone of Fractured Femoral Necks of Postmenopausal Osteoporotic Women: A Synchrotron Micro X-ray Fluorescence Imaging Study
B. Pemmer, A. Roschger, P. Wobrauschek, C. Streli, Atominstitut, Vienna, Austria
A. Roschger, J.G. Hofstaetter, P. Roschger, K. Klaushofer, Hanusch Hospital, Vienna, Austria
J.G. Hofstaetter, Hanusch Hospital, Austria and Medical Univ. of Vienna, Austria
R. Simon, Karlsruhe Institute of Technology, Eggenstein-Leopoldshafen, Germany

F-64:

Analytical Possibilities of Total Refl ection X-ray Spectrometry (TXRF) for Trace Selenium Determination in Soils and Leaching Solutions
E. Margui, G.H. Floor, M. Hidalgo, G. Roman-Ross, University of Girona, Girona, Spain
C. Streli, Atominstitut, Vienna, Austria
I. Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain

F-65:

Determination of Catalyst Residues in Active Pharmaceutical Ingredients by Means of Total Refl ection X-ray Spectrometry (TXRF)
E. Margui, M. Hidalgo, University of Girona, Girona, Spain
P. De Pape, Bruker AXS GmbH, Karlsruhe, Germany
I. Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain

F-66:

Speciation of Pb at the Tidemark of Articular Cartilage and in Trabecular Bone
B. Pemmer, N. Zoeger, C. Streli, Atominstitut, Vienna, Austria
G. Pepponi, MiNALab, Trento, Italy
F. Meirer, Atominstitut, Vienna, Austria and MiNALab, Trento, Italy
J. Goettlicher, R. Steininger, S. Mangold, Karlsruhe Institute of Technology, Eggenstein- Leopoldshafen, Germany
A. Tampieri, S. Sprio, Istituto di Scienza e Tecnologia dei Materiali Ceramici CNR, Faenca, Italy
P. Roschger, K. Klaushofer, Hanusch Hospital, Vienna, Austria
J.G. Hofstaetter, Hanusch Hospital, Austria and Medical Univ. of Vienna, Austria

F-67:

Moving To High Detection Efficiency, Low Background Silicon Drift Detectors
A. Niculae, J. Herrmann, M. Bornschlegl, O. Jaritschin, PNDetector GmbH, Munich, Germany
R. Eckhardt, S. Jeschke, P. Lechner, L. Mungenast, B. Schweinfest, H. Soltau, PNSensor GmbH, Munich, Germany
L. Andricek, L. Strüder, MPI Halbleiterlabor, Munich, Germany

F-68:

X-ray Fluorescence Analysis of Round Robin Samples: Andesite, MGL-AND and Ordinary Portland Cement, OPC-1
D.M. Missimer, R.L. Rutherford, Savannah River National Laboratory, Aiken, SC

F-70:

Pulsed X-ray Characterization of Stripline Microchannel Plate Gated Imager
F.J. Goldin, D. Morgan, K. Moy, National Security Technologies, LLC, North Las Vegas, NV

F-72:

Characterization of Sub-Micron Thin Films and Multilayers by Energy Dispersive X-ray Fluorescence
I. Queralt, Institute of Earth Sciences Jaume Almera, Barcelona, Spain
E. Margui, University of Girona, Girona, Spain
X. Llovet, Universitat de Barcelona, Barcelona, Spain
J. Pujol, Fischer Instruments SA, Barcelona, Spain
F.J. Piniella, Autonomous University of Barcelona, Barcelona, Spain

F-82:

Detection Limits of Optic-Enabled Field-Portable XRF Systems
B. Beumer, Z.W. Chen, XOS, East Greenbush, NY

Core Shell Spectroscopy

S6

Time Resolved In Situ QXAFS and DXAFS Studies on the Formation and Oxidation Mechanisms of Paradium-Zinc Bimetallic Nanoparticles
Y. Uemura, Y. Niwa, A. Yagishita, M. Nomura, KEK-PF, Ibaraki, Japan
Y. Inada, Ritsumeikan University
M. Kimura, Nippon Steel Corporation
K.K. Bando, AIST
Y. Iwasawa, Univ. Electro-Commun.

S7

In Situ XAFS Investigation of PT-FE and PT-NI Nano-Catalysts at XAFS Beamline of SSRF
Y. Huang, Z. Jiang, Shanghai Synchrotron Radiation Facility, Chinese Academy of Sciences, Shanghai, China
Q. Fu, X. Bao, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian, China

S10

2D Imaging Quick XAFS with Pixel Array Detector
H. Tanida, Y. Orikasa, H. Yamashige, K. Sato, D. Takamatsu, Y. Takanashi, T. Fujimoto, H. Murayama, M. Oishi, H. Arai, E. Matsubara, Y. Uchimoto, Z. Ogumi, Kyoto University, Kyoto, Japan

S12

Improvement in the Reduction Behavior of ZrO2-CeO2 Nanotubes by Incorporation of Pd
L.M. Acuña, F.F. Muñoz, M.D. Cabezas, R.O. Fuentes, CINSO, CONICET, Villa Martelli, Buenos Aires, Argentina
M.C.A. Fantini, Universidade de Sao Paulo, Sao Paulo, SP, Brazil
D.G. Lamas, FAIN, UNCOMA, and IDEPA-CONICET, Neuquén, Argentina
R.T. Baker, University of St. Andrews, North Haugh, St. Andrews, UK

SPECIAL SESSIONS / WEDNESDAY, THURSDAY & FRIDAY 3-5 AUGUST
WEDNESDAY am PLENARY SESSION

Foods & Drugs / Summit Ballroom: 4th floor of hotel

Chairs: T. G. Fawcett, International Centre for Diffraction Data, Newtown Square, PA
Mary Ann Zaitz, IBM, Hopewell Junction, NY

8:30

Chairman of the Denver X-ray Conference Opening Remarks
Robert L. Snyder, Georgia Institute of Technology, Atlanta, GA

PRESENTATION OF AWARDS:
 

2011 Barrett Award
Presented to: Dr. Juan Rodriguez-Carvajal, Lab. Leon Brillouin, CEA-CNRS, Gif Sur Yvette, France
Presented by: Cev Noyan, Columbia University, New York, NY

2011 Jenkins Award
Presented to: Dr. Paul K. Predecki, The University of Denver, Denver, CO
Presented by: T.G. Fawcett, International Centre for Diffraction Data, Newtown Square, PA
Plenary Session Remarks by the Chairs

9:00

D-104 Edible Nanostructutes – The Pleasures of Chocolate
Alejandro G. Marangoni, University of Guelph, Guelph, ON, Canada

9:45

F-31 From the Field to the Lab – FDA Use of XRF to Monitor Foods, Drugs and Other Consumer Products
Peter T. Palmer, San Francisco State University, San Francisco, CA
R. Jacobs, S. Yee, C. Qiu, M. Nausin, C. Castro, M. Muckenfuss, FDA, Alameda, CA

10:30

BREAK

11:00

F-76 What Else Are You Drinking When You Drink Whiskey or Wine?
Peter Wobrauschek, TU Wien, Atominstitut, Wien, Austria

11:45

D-111 X-ray Powder Diffraction in the Pharmaceutical Industry
G.A. Stephenson, Eli Lilly and Company, Indianapolis, IN

 

WEDNESDAY pm XRD AND XRF

Energy Storage & Harvesting / Pikes Peak 3 & 4

Chair: M.A. Rodriguez, Sandia National Laboratories, Albuquerque, NM

1:30

D-64 Invited – X-ray Diffraction Analyses of Lithium Battery Materials
A. Drews, Ford Motor Company, Dearborn, MI

2:00

D-25 Invited – Using Neutron Scattering to Study Lithium-Ion Batteries
N. Sharma, V.K. Peterson, The Bragg Institute, ANSTO, Kirrawee, Australia

2:30

C-22 XRS for Li-Ion Batteries
U. Boesenberg, J. Cabana, T. Richardson, R. Kostecki, LBNL, Berkeley, CA
D. Sokaras, T.C. Weng, D. Nordlund, SSRL, Menlo Park, CA

2:50


D-72 In-Situ X-ray Diffraction from Lithium Ion Batteries
J. Okasinski, Argonne National Laboratory, Argonne, IL
C. Hayner, H. Kung, Northwestern University, Evanston, IL

3:10

BREAK

3:40

D-9 Invited–Using In-Situ Techniques to Probe High Temperature Reactions: Thermochemical Cycles for the Production of Synthetic Fuels from CO2 and Water
E.N. Coker, M.A. Rodriguez, A. Ambrosini, J.E. Miller, Sandia National Laboratories, Albuquerque, NM

4:10

D-29 New Fast In-Situ XRD System Allows Growth Studies of Thin Films for Photovoltaics
A. Haase, M. Klatt, A. Schafmeister, R. Stabenow, GE Sensing & Inspection Technologies, Ahrensburg, Germany
I. Kötschau, Centrotherm Photovoltaics AG, Blaubeuren, Germany

4:30

F-57 EDXRF Analysis of Cu(In,Ga)(S,Se)2 Photovoltaic Films (The S-Mo Conundrum)
J.R. Bogert, Solar Metrology/PFT, Holbrook, NY

New Developments in XRD & XRF Instrumentation / Centennial

Chair: T.G. Fawcett, International Centre for Diffraction Data, Newtown Square, PA

1:00

C-11 “CUBE”, A Low-Noise CMOS Preamplifi er as Alternative to JFET Front-End For Silicon Drift Detectors
L. Bombelli, C. Fiorini, A. Longoni, Politecnico di Milano, Milano, Italy
T. Frizzi, R. Nava, XGLab SRL, Milano, Italy

1:15

C-12 SOLEX: A Comprehensive Tool for Energy-Dispersive Detectors Characterization
Y. Ménesguen, M.-C. Lépy, CEA-Saclay, France

1:30

C-13 Detectors for X-ray Imaging at the New Free Electron Laser Sources
J. Treis, PNDetector GmbH, Munich, Germany
S. Aschauer, R. Hartmann, K. Hermenau, P. Lechner, G. Lutz, P. Majewski, C. Sandow, H. Soltau, C. Thamm, PNSensor GmbH, Munich, Germany
L. Andricek, S. Herrmann, M. Porro, R. Richter, G. Schaller, F. Schopper, L. Strüder, G. de Vita, MPI Halbleiterlabor, Munich, Germany

1:45

C-15 Design and Measurement with a New Portable X-ray Camera
I. Ordavo, U. Weber, PNDetector GmbH, Munich, Germany
S. Ihle, R. Hartmann, H. Soltau, M. Lang, A. Liebel, C. Thamm, PNSensor GmbH, Munich, Germany
G. Schaller, L. Strüder, MPI Halbleiterlabor, Munich, Germany

2:00

C-17 Performance Improvements in Miniature X-ray Tubes
S. Cornaby, D. Reynolds, V. Jones, M. Heber, C. Jensen, Moxtek, Inc., Orem, UT

2:15

D-8 Liquid Metal Jet Micro-Focus X-ray Source: Highest Brilliance for Home Lab Instrumentation
C. Ollinger, A. Kern, Bruker AXS, Karlsruhe, Germany

2:30

D-19 Integration of High-Brilliance Laboratory SWAXS with Microcalorimetry
P. Laggner, M. Kriechbaum, IBN, Austrian Academy of Sciences, Graz, Austria
A. Hodzic, Research Center for Pharmaceutical Engineering, Graz, Austria
P. Le Parlouer, Setaram Instrumentation, Caluire, France

2:45

D-31 Pilatus Detectors–Next Generation Instruments for Advanced X-ray Diffraction Studies
M. Kobas, DECTRIS Ltd., Baden, Switzerland

3:00

BREAK

3:30

D-35 High-Brilliance Low-Maintenance Microfocus Sources for Diffractometry
B. Hasse, A. Kleine, J. Graf, J. Wiesmann, C. Michaelsen, Incoatec GmbH, Geesthacht, Germany

3:45

D-47 Computer-Aided Engineering Design of HTXRD Resistive Heating Strips To Minimize Sample Temperature Gradient
R. Chandrasekaran, A. Drews, Ford Motor Company, Dearborn, MI

4:00

D-56 New Instrumentation for X-ray Micro Diffraction
H.R. Ress, B. He, B. Jones, Bruker AXS, Madison, WI
C. Ollinger, G. Vanhoyland, Bruker AXS, Karlsruhe, Germany

4:15

D-94 Advanced Guinier-Type Powder Instrumentation
R. Dietsch, T. Holz, AXO DRESDEN GmbH, Dresden, Germany
S.J.H. Griessl, N. Huber, Huber Diff raktionstechnik GmbH & Co. KG, Rimsting, Germany
H. Borrmann, Max Planck Institute for Chemical Physics of Solids, Dresden, Germany

4:30

D-101 Improved Source and Multilayer Optics Integration for Fast and Local XRD Measurements
S. Rodrigues, P. Panine, P. Høghøj, Xenocs, Sassenage, France

4:45

F-13 560 mm² SDD Array
A. Pahlke, T. Eggert, R. Fojt, L. Höllt, J. Knobloch, S. Pahlke, O. Scheid, R. Stötter, F. Wiest, KETEK GmbH, Munich, Germany

5:00

F-19 Ultra-Fast Compact Multi-Channel Readout System for SDDs
R. Alberti, T. Frizzi, S. Moser, XGLab SRL, Milano, Italy
L. Bombelli, C. Fiorini, R. Quaglia, Politecnico di Milano, Milano, Italy

5:15

F-37 Coupling X-ray Spectroscopy and Scanning Probe Microscopy for Simultaneous Sample Topography and Chemical Mapping
M. Dehlinger, C. Fauquet, F. Jandard, D. Tonneau, Université de la Méditerranée, Marseille, France
J. Purans, University of Latvia, Latvia
D. Pailharey, S. Ferrero, Cie Axess Tech, Saint Cannat, France
B. Dahmani, Cie Lovalite, Besançon, France
A. Bjeoumikhov, IFG-GmbH, Berlin, Germany
I. Zizak, A. Erko, HZB-BESSY, Berlin, Germany

5:30

F-47 Simplified Biasing Schemes For Silicon Drift Detectors
D. Hullinger, K. Decker, Moxtek, Orem, UT
H. Matsuura, Osaka Electro-Communication University, Neyagawa, Osaka, Japan

5:45

D-115 From Sub-Monolayer to Monolayer Transition of Silver Nanoparticle Langmuir Film at the Air-Water Interface – Pilot Application of a New GISAXS Laboratory Set-Up
K. Vegso, P. Siffalovic, M. Weis, E. Majkova, M. Jergel, M. Benkovicova, S. Luby, Institute of Physics SAS, Bratislava, Slovakia
J. Wiesmann, Incoatec GmbH, Geesthacht, Germany
T. Kocsis, Polymer Institute SAS, Bratislava, Slovakia
K. Nygard, O. Konovalov, European Synchrotron Radiation Facility (ESRF), Grenoble, France


WEDNESDAY pm XRD

Line Profile Analysis / Pikes Peak 1 & 2

Chairs: M. Leoni, University of Trento, Trento, Italy
D. Balzar, University of Denver, Denver, CO

2:00

D-4 Invited – 3D Measurements of Dislocations and Strain Gradients in the Near Surface Microstructures via Polychromatic Microdiffraction
R.I. Barabash, ORNL, Oak Ridge, TN

2:30

D-17 Invited – Characterizing Local Strain Tensors, Crystallographic Orientations and Defects Using Sub-Micrometer X-ray Beams, and Comparison with Conventional Line Profi le Analysis
L.E. Levine, NIST, Gaithersburg, MD
B.C. Larson, J.Z. Tischler, Oak Ridge National Laboratory, Oak Ridge, TN
P. Geantil, M.E. Kassner, University of Southern California, Los Angeles, CA
W. Liu, Argonne National Laboratory, Argonne, IL

3:00

D-39 Invited – Structure/Microstructure Relationships in Defective and Nanostructured Materials
M. Leoni, University of Trento, Trento, Italy

3:30

BREAK

4:00

D-55 Peak Profiles From Faulting in Small Domains
K.R. Beyerlein, Georgia Institute of Technology, Atlanta, GA, and University of Trento, Trento, Italy
R.L. Snyder, Georgia Institute of Technology, Atlanta, GA
P. Scardi, University of Trento, Trento, TN, Italy

4:20

D-54 Dislocation Density, Character and Burgers Vector Types in Cubic and Hexagonal Close Packed Crystals Determined Together with Other Defects by Diffraction Line Profile Analysis Using Time of Flight Neutron Diffraction Measurements
L. Balogh, D.W. Brown, C.N. Tome, B. Clausen, Los Alamos National Laboratory, Los Alamos, NM

4:40

D-50 Validation of Fundamental Parameters Approach Software for Use in NIST SRM Certifi cation
K.M. Mullen, D. Windover, J.P. Cline, NIST, Gaithersburg, MD
D. L. Gil, Princeton University, Princeton, NJ

 

WEDNESDAY pm XRF

Fusion and Industrial Applications of XRF / Gold Camp

Chair: J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI

1:30

F-6 Invited – Applications of X-ray Fluorescence in the Copper Mining Industry
S.W. Bowe, Kennecott Utah Copper, South Jordan, UT

2:00

F-36 Picking Up the Challenge for Best Precision and Accuracy in Ferro Alloy Analysis
K. Behrens, R. Zucic, Bruker AXS, Karlsruhe, Germany
A. Seyfarth, Bruker AXS, Madison, WI
M. Bouchard, J. Anzelmo, M.-È. Provencher, Corporation Scientifi que Claisse, Quebec, Canada

2:20

F-29 Strategy of Fusion Bead Correction in XRF Analysis of Powders
H. Homma, H. Inoue, Y. Yamada, Y. Kataoka, Rigaku Corporation, Takatsuki, Osaka, Japan
M. Feeney, L. Oelofse, Rigaku Americas Corporation, The Woodlands, TX

2:40

F-9 Cement Applications with Handheld XRF
M. Cameron, Bruker Elemental, Kennewick, WA

3:00

BREAK

3:30

F-80 Invited – Applications of X-ray Fluorescence for the Electronics Industry
W.W. Brubaker, DuPont Central Research & Development, Wilmington, DE

4:00

F-20 Analysis of Minor and Trace Elements in Plutonium Using Polarized Energy Dispersive X-ray Fluorescence
C.G. Worley, Los Alamos National Laboratory, Los Alamos, NM

4:20

F-10 On-Stream XRF for Real-Time Monitoring of Trace Elements at Sub-Parts-Per-Million Levels
Y. Van Haarlem, G. Roach, J. Tickner, CSIRO, Lucas Heights, Australia

4:40

F-34 Flexibility and Performance for Process and Quality Control in Metal Production
K. Behrens, D. Porta, Bruker AXS, Karlsruhe, Germany
A. Seyfarth, Bruker AXS, Madison, WI

WEDNESDAY pm

Core Shell Spectroscopy Specialized Session / El Paso Room

Chair: C. Segre, Illinois Institute of Technology, Chicago, IL

2:00

S9 Nanoscale XANES Imaging of Battery Electrodes
J.C. Andrews, Y. Liu, P. Pianetta, SLAC National Accelerator Lab, Menlo Park, CA
F. Meirer, Fondazione Bruno Kessler, Povo, Italy
J. Cabana, U. Boesenberg, Lawrence Berkeley National Lab, Berkeley, CA

2:20

S3 Investigation of Magnetic Thin Films Using Polarization Dependent X-ray Absorption Near Edge Structure (XANES) Spectroscopy
C.-J. Sun, S.M. Heald, APS, Argonne National Laboratory, Argonne, IL

2:40

S14 Core-Level X-ray Absorption Spectroscopy Study of Actinide Intermetallics
Y. Jiang, C.H. Booth, Lawrence Berkeley National Laboratory, Berkeley, CA
D. Nordlund, Stanford Synchrotron Radiation Lightsource, Menlo Park, CA
E.D. Bauer, J.N. Mitchell, Los Alamos National Laboratory, Los Alamos, NM
M.A. Wall, P.G. Allen, Lawrence Livermore National Laboratory, Livermore, CA

3:00

BREAK

3:30

S13 Quantifi cation in Soft X-ray Absorption Spectroscopy from Partial Fluorescence Yields
T.Z. Regier, Canadian Light Source, Inc., Saskatoon, Saskatchewan, Canada
A.J. Achkar, D.G. Hawthorn, University of Waterloo, Waterloo, Ontario, Canada
E.J. Monkman, K.M. Shen, Cornell University, Ithica, NY

3:50

S11 The Location of Carbon in Low-Temperature Carburized Stainless Steels: An XAFS Study
W.E. O’Grady, P.M. Natishan, Naval Research Laboratory, Washington, DC
D.F. Roeper, EXCET, Inc., Springfi eld, VA
K.I. Pandya, SAIC, Brookhaven National Laboratory, Upton, NY

4:10

S8 EXAFS Analysis of U (IV) Phases Resulting From the Bio-Reduction of Nanoparticulate Uranyl Phosphate
X. Rui, B.A. Bunker, S. Dunham-Cheatham, J. Fein, University of Notre Dame, Notre Dame, IN
M. Boyanov, M.J. Kwon, E.J. O’Loughlin, K.M. Kemner, Argonne National Laboratory, Argonne, IL


THURSDAY am XRD & XRF

X-ray Imaging / Gold Camp

Chair: M. Schuster, Siemens AG, München, Germany
Co-chair: F. de Carlo, Argonne National Laboratory, Argonne, IL

8:30

C-4 Invited – Fourier X-ray Scattering Imaging and Biological Applications
H. Wen, V. Pai, S.K. Lynch, C.K. Kemble, E. Bennett, National Institutes of Health, Bethesda, MD
W.K. Lee, X. Xiao, L. Assoufi d, C. Liu, Argonne National Laboratory, Argonne, IL

9:00

D-37 X-ray Diffraction Nano-Tomography: Application to the Low Enriched Nuclear Fuels
A. Bonnin, H. Palancher, CEA, DEN, DEC, Cadarache, France and ESRF, Grenoble, France
R. Tucoulou, P. Cloetens, V. Honkimäki, ESRF, Grenoble, France
P. Bleuet, CEA, LETI, MINATEC, Grenoble, France

9:20

C-25 X-ray Refl ection Tomography –First Results on Surface Imaging
K. Sakurai, Univ. of Tsukuba, Ibaraki, Japan and National Institute for Materials Science, Ibaraki, Japan
V.A. Innis-Samson, University of Tsukuba, Ibaraki, Japan
M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan

9:40

C-23 Study of Microstructure and Hydraulic Properties of Geological Samples by Means of Microfocus X-ray Computed Tomography and Lattice Boltzmann Method
J. Bielecki, J. Lekki, Z. Stachura, W.M. Kwiatek, Polish Academy of Sciences, Krakow, Poland
S. Bozek, Polish Academy of Sciences and The Jagiellonian University Medical College, Krakow, Poland
J. Jarzyna, AGH University of Science and Technology, Krakow, Poland

10:00

D-65 High-Energy X-ray Scattering Tomography
S.R. Stock, Northwestern University, Chicago, IL
J.D. Almer, Argonne National Laboratory, Argonne, IL

10:20

BREAK

10:40

D-22 Invited – 4D Materials Science: In Situ X-ray Synchrotron Tomography of Deformation in Metallic Materials
N. Chawla, J.J. Williams, N.C. Chapman, M.Y. Wang, Arizona State University, Tempe, AZ
X. Xiao, F. De Carlo, Argonne National Laboratory, Argonne, IL

11:10

F-69 Gratings with Extreme Aspect Ratio for X-ray Phase Contrast Tomography at High Energies
J. Mohr, T. Grund, J. Kenntner, V. Altapova, T. Baumbach, Karlsruhe Institute of Technology, Karlsruhe, Germany
I. Zanette, European Synchrotron Radiation Facility, Grenoble, France
T. Weitkamp, Synchrotron Soleil, Gif-sur-Yvette, France

11:30

C-19 Multilayer Mirrors – Potentials for Monochromating, Collimating or Focusing Optics
R. Dietsch, M. Kraemer, T. Holz, D. Weissbach, AXO DRESDEN GmbH, Dresden, Germany
A. Rack, European Synchrotron Radiation Facility, Grenoble, France

11:50

C-3 Invited – High-Speed X-ray Full-Field Imaging Applications at the APS
K. Fezzaa, Argonne National Laboratory, Argonne, IL

12:20

C-20 Calibration of X-ray Imaging Devices for Accurate Intensity Measurement
M.J. Haugh, M. Charest, P.W. Ross, J. Lee, National Security Technologies, Livermore, CA
N. Palmer, M.B. Schneider, Lawrence Livermore National Laboratory, Livermore, CA

 

THURSDAY am XRD

Rietveld Analysis I / Pikes Peak 3 & 4

Chair: P.H.J. Mercier, National Research Council of Canada, Ottawa, Ontario, Canada

9:00

D-82 Invited – Software and Instrumentation for Rietveld Analysis: What’s New and Some Prognostication
B.H. Toby, APS, Argonne National Laboratory, Argonne, IL

9:30

D-5 Invited – Crystal Structure of Monoclinic Sr2.4Ca0.6Al2O6
J.A. Kaduk, Illinois Institute of Technology, Chicago, IL
W. Wong-Ng, NIST, Gaithersburg, MD
J. Golab, INEOS Technologies, Naperville, IL

10:00

D-108 Phase Stability Study of NiXMg1-XAl2O4 via XRD and Complementary Techniques
S.T. Misture, B.E. Hill, Alfred University, Alfred, NY
M.E. Miller, Excelerant Ceramics, Alfred, NY

10:20

BREAK

10:50

D-106 Crystal Structure Study of Nanocrystalline Phase: Ca1-XMXZr4P6O24 (M= Sr, Ba & x=0.0-1.0)
O.P. Shrivastava, R. Chourasia, Dr. H. S. Gour University, Sagar, India

11:10

D-74 Combined Rietveld Analysis of X-ray and Neutron Diffraction Data of Zinc Oxide Transparent Conductors
G.B. González Avilés, R. Mansourian, B. Hardnacke, A. Wesolik, J. Gardner, DePaul University, Chicago, IL
J.S. Okasinski, Argonne National Laboratory, Argonne, IL

11:30

D-62 Structural Analysis of Inhomogeneous SnOX Thin Films
I. Djerdj, D. Gracin, K. Juraić, D. Meljanac, Rudjer Boskovic Institute, Zagreb, Croatia
D. Balzar, University of Denver, Denver, CO

 

THURSDAY am XRF

Micro X-ray Analysis / Pikes Peak 1 & 2

Chair: U.E.A. Fittschen, Universität Hamburg, Hamburg, Germany

8:30

F-77 Invited – Applications of Full Field Micro-XRF Analysis Using a Prototype X-ray Colour Camera
L. Vincze, B. De Samber, K. De Schamphelaere, C. Janssen, Ghent University, Gent, Belgium
O. Scharf, A. Bjeoumikhov, N. Langhoff, IfG-Institute for Scientifi c Instruments GmbH, Berlin, Germany
R. Wedell, Institut für Angewandte Photonik e.V. (IAP), Berlin, Germany
H. Riesemeier, M. Radtke, BAM Federal Institute for Materials Research and Testing, Berlin, Germany

9:00

F-51 Invited – Decomposing Samples into Their Parts with Multivariate Statistics
G. Wellenreuther, DESY, Hamburg, Germany
G. Silversmit, Ghent University, Ghent, Belgium

9:30

F-11 Improved Quantifi cation of Objects Imaged in 3D Using X-ray Micro-Tomography
B.M. Patterson, C.E. Hamilton, E.K. Cerreta, J.P. Escobedo-Diaz, D. Dennis-Koller, Los Alamos National Laboratory, Los Alamos, NM

9:50

F-5 Coupling X-ray Spectroscopy and Scanning Probe Microscopy for Simultaneous Sample Topography and Chemical Mapping
M. Dehlinger, C. Fauquet, F. Jandard, D. Tonneau, CNRS-CINaM, Marseille, France
J. Purans, University of Latvia, Latvia
D. Pailharey, S. Ferrero, Cie Axess Tech, Saint Cannat, France
B. Dahmani, Cie Lovalite, Besançon, France
A. Bjeoumikhov, IFG-GmbH, Berlin, Germany
I. Zizak, A. Erko, HZB-BESSY, Berlin, Germany

10:10

BREAK

10:40

F-7 Invited – 3D-XRF Analysis of Several Forensic and Industrial Samples
K. Tsuji, C. Nishi, T. Nakazawa, K. Nakano, Osaka City University, Osaka, Japan
K. Otsuki, Y. Nishiwaki, Forensic Science Laboratory, Hyogo, Japan
H. Takenaka, NTT-Advanced Technology, Atsugi, Japan

11:10

F-15 Investigation of Pathological Mechanisms in Brain Cancers with the Use of Techniques Based on Synchrotron Radiation
M. Czyzycki, M. Szczerbowska-Boruchowska, A. Wandzilak, M. Czyzycki, K. Wolska, M. Lankosz, AGH-University of Science and Technology, Krakow, Poland
D. Adamek, E. Radwanska, Jagiellonian University, Krakow, Poland

11:30

F-22 High Resolution X-ray (hiRX) Detection of Plutonium
G. Havrilla, M. Collins, V. Montoya, Los Alamos National Laboratory, Los Alamos, NM
Z. Chen, F. Wei, M. Cusack, X-ray Optical Systems, East Greenbush, NY

11:50

F-58 Investigation of Porcelain Cards Using Combined Spectroscopic Techniques
A. Deneckere, B. Vekemans, L. de Vries, L. Van de Voorde, P. De Paepe, L. Vincze, L. Moens, P. Vandenabeele, Ghent University, Ghent, Belgium

12:10

F-74 Fast X-ray Imaging “On-the-fly” with a Benchtop μ-XRF Instrument
M. Haschke, U. Waldschläger, U. Rossek, R. Tagle, R. Erler, Bruker Nano GmbH, Berlin, Germany

 

THURSDAY am XRF

Past, Present and Future of Field-Portable XRF / Centennial

Chair: S. Piorek, Thermo Fisher Scientific, Billerica, MA

9:00

F-71 Evolution of Handheld ED-XRF Analyzers and Their Impact on Quality of Our Lives
S. Piorek, Thermo Niton Analyzers, LLC, Billerica, MA

9:20

F-73 Invited – The Challenges in Designing, Optimizing, and Manufacturing X-ray Detectors for Hand-Held XRF
J. Pantazis, A. Huber, T. Pantazis, R. Redus, Amptek Inc, Bedford, MA

9:50

F-75 Invited – Miniature X-ray Sources: A Look Back at a Decade of Breakthrough Development and a Look Forward to Future Opportunities for the Portables Market
M. Dinsmore, D.J. Caruso, Thermo Niton Analyzers, LLC, Billerica, MA

10:20

BREAK

10:50

C-10 Evaluation of Portable XRF and XRD Analyzers for Identification of Counterfeit Pharmaceutical Products
C.R. Bupp, H. Gregory, P.T. Palmer, San Francisco State University, San Francisco, CA
T. Jennison, InXitu, Campbell, CA

11:10

F-32 Development of a Palm-Sized Electron Probe X-ray Analyzer
S. Terada, S. Imashuku, J. Kawai, Kyoto University, Kyoto, Japan

11:30

F-49 Ultra-Compact X-ray Source for Handheld and Portable XRF Applications
D. Wang, S. Cornaby, D. Reynolds, J. Smith, C. Jensen, Moxtek, Inc., Orem, UT

THURSDAY pm XRD & XRF

Advances in Nanobeam Optics / Gold Camp

Chairs: H. Yan, Brookhaven National Laboratory, Upton, NY
L. Assoufi d, Argonne National Laboratory - X-ray Science Division, Argonne, IL

1:40

D-110 Invited – Breaking the 10NM Nanofocus Spot Size Barrier with New Approaches for Fresnel Zone Plates
M. Feser, E. Snyder, Y. Feng, A. Lyon, S. Chen, Xradia Inc., Pleasanton, CA

2:10

C-21 Invited – Multilayer Laue Lens Fabrication for X-ray Nanofocusing; Current Status and Future Perspectives
R. Conley, N. Bouet, H. Yan, Y. S. Chu, NSLS-II, Brookhaven National Laboratory, Upton, NY
A.T. Macrander, J. Maser, R. Divan, G.B. Stephenson, B. Shi, C. Liu, L. Assoufi d, Argonne National Laboratory, Argonne, IL
H. Kang, Chosun University, Gwangju, Republic of Korea

2:40

C-5 Application of Capillary X-ray Optics in Imaging Techniques
Z. Liu, Y. Li, X. Lin, P. Luo, Q. Pan, X. Ding, Z. Guo, Beijing Normal University, Beijing, China
T. Sun, Beijing Normal University, Beijing, China and State University of New York, Albany, NY
C. MacDonald, State University of New York, Albany, NY
G. Li, Q. Jia, D. Chen, Q. Yuan, W. Huang, P. Zhu, Q. Xu, Chinese Academy of Science, Beijing, China
X. Wei, Y. Huang, Chinese Academy of Science, Shanghai, China

3:00

F-14 Characterization of Electrochemically Deposited Thermoelectric Films
U.E.A. Fittschen, K. Reinsberg, M. Menzel, J.A.C. Broekaert, University of Hamburg, Hamburg, Germany
K. Appel, Deutsches Elektronen Synchrotron, Hamburg, Germany

3:20

BREAK

3:50

C-27 Invited – Fabrication, Metrology and Performance of Profi le-Coated K-B Mirrors for Hard X-ray Nanofocusing
L. Assoufi d, B. Shi, W. Liu, J. Qian, C. Liu, P. Zchack, R. Khachataryan, A.M. Khounsary, APS, Argonne National Laboratory, Argonne, IL
J. Tischler, G. Ice, Oak Ridge National Laboratory, Oak Ridge, TN

4:20

F-23 Actinide Characterization Using Ultra High Energy X-ray Fluorescence
G. Havrilla, M. Collins, V. Montoya, Los Alamos National Laboratory, Los Alamos, NM
Z. Chen, F. Wei, M. Cusack, X-ray Optical Systems, East Greenbush, NY

4:40

D-77 Background and Boundary Corrections in Micro-XRD Phase Scanning
C. Kong, Y. Wang, Analytical Centre, UNSW, Sydney, Australia
Q. X. Liu, ALS Mineral, Vancouver Branch, Canada


THURSDAY pm XRD

Stress Analysis / Pikes Peak 1 & 2

Chairs: C. Goldsmith, IBM, Hopewell Junction, NY
T. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN

1:40

D-80 Invited – Understanding Stress Gradients in Microelectronic Metallization
C.E. Murray, IBM, T.J. Watson Research Center, Yorktown Heights, NY

2:10

D-1 Invited – Algorithm and Strategy of Stress Analysis with 2D Detector
B.B. He, Bruker AXS, Madison, WI

2:40

D-46 Stresses in Ytterbium Silicate Multilayer Environmental Barrier Coatings
F. Stolzenburg, B.J. Harder, J. Ramirez-Rico, K.T. Faber, Northwestern University, Evanston, IL
K.N. Lee, Rolls-Royce Corporation, Indianapolis, IN
J.D. Almer, Argonne National Laboratory, Argonne, IL

3:00

BREAK

3:30

D-38 Invited – Residual Stresses in Aluminum Clad Uranium-10WT% Molybdenum Fuel Plates
D.W. Brown, B. Clausen, Los Alamos National Laboratory, Los Alamos, NM
M.A. Okuniewski, Idaho National Laboratory, ID

4:00

D-60 A Software Program for Calculating Diffraction Elastic Constants of Textured Materials
T. Gnäupel-Herold, University of Maryland, Gaithersburg, MD

4:20

D-61 An Investigation of the Accuracy of Diffraction Stress Evaluation of Textured Materials
T. Gnäupel-Herold, A. Creuziger, M. Iadicola, University of Maryland, Gaithersburg, MD

4:40

D-92 Residual Stress Analysis of Copper-Indium-Gallium-Selenium/Molybdenum Thin Film on Stainless Steel Substrate
Y. Shi, S. Rozeveld, The Dow Chemical Company, Midland, MI


THURSDAY pm XRD

Rietveld Analysis II / Pikes Peak 3 & 4

Chair: P.H.J. Mercier, National Research Council of Canada, Ottawa, Ontario, Canada

1:40

D-76 Invited – Exploring Variation in the Crystal Structure of Kieserite, MgSO4·H2O, Using X-ray Powder Diffraction and Charge Flipping
S.A. Wilson, D.L. Bish, H.-W. Wang, Indiana University, Bloomington, IN
R.E. Milliken, University of Notre Dame, Notre Dame, IN

2:10

D-2 Invited –Rietveld Quantitative Phase Analysis of Mineralogical Materials
M. Raudsepp, University of British Columbia, Vancouver, BC, Canada

2:40

D-7 Absorption Edge Modeling In Line Profi le Fitting Applications
A. Kern, A. Coelho, K. Knorr, Bruker AXS, Karlsruhe, Germany

3:00

BREAK

3:30

D-109 Composition-Dependent Negative Thermal Expansion in Tetracyanidoborate Materials
J.J. Chadbourne, D.J. Price, C.J. Kepert, University of Sydney, Australia
V.K. Peterson, The Bragg Institute, ANSTO, Australia

3:50

D-107 Order and Disorder in Layered Oxide Photocatalysts via X-ray and Neutron Powder Diffraction
J. Shi, E. J. Nichols, S.T. Misture, Alfred University, Alfred, NY

4:10

D-42 Use of the Rietveld Method for Describing Structure and Texture in X-ray Diffraction Data of Huntite [CaMg3(CO3)4], Dolomite [CaMg(CO3)2] and Magnesite [MgCO3] Powders
H. Sitepu, Saudi Aramco, Dhahran, Saudi Arabia



THURSDAY pm XRF

Quantitative Analysis / Centennial

Chair: W.T. Elam, University of Washington APL, Seattle, WA

2:00

F-3 Quantitative Characterization of Stratified Materials by Confocal 3D Micro-Beam X-ray Fluorescence Spectroscopy: Monte Carlo Simulation vs. Fundamental Parameters Model
M. Czyzycki, D. Wegrzynek, P. Wrobel, M. Lankosz, AGH University of Science and Technology, Kracow, Poland

2:20

F-4 Use of Monte Carlo Simulation Methods to Improve X-ray Detector Response Function
F. Li, X. Han, Baker Hughes, Houston, TX
R. Gardner, North Carolina State University, Raleigh, NC

2:40

F-43 Fundamental Parameter Determination for Improved XRF Quantifi cation in the Soft X-ray Range
M. Müller, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
B. Kanngießer, Technical University of Berlin, Berlin Germany

3:00

F-60 XRF Peak Deconvolution Using Peak Ratios Refi ned by Fundamental Parameters
S. Terada, X-Bridge Technologies Co., Ltd., Uji, Kyoto, Japan
H. Yamashita, Y. Araki, X-tec. Co., Ltd., Osaka, Osaka, Japan

3:20

BREAK

3:40

F-42 Trace Element Background Correction and Small Spot Analysis for Geological Samples with a New 4.2 KW XRF Spectrometer
R.M. Conrey, Washington State University, Pullman, WA

4:00

F-35 Determination of Doping Levels of Two-Dopant Phosphor Materials from X-ray Signal Intensity Ratios and Intensity Correction Analysis
G. Darsey, Cabot Superior MicroPowders, Albuquerque, NM
R. Cone, Thermo Fisher Scientifi c, Madison, WI

4:20

F-21 Standard Reference Material 2569 Lead in Paint for Consumer Products
J.R. Sieber, J.L. Molloy, K.E. Murphy, S.E. Long, S.D. Leigh, National Institute of Standards & Technology, Gaithersburg, MD
D. Cobb, U.S. Consumer Product Safety Commission, Gaithersburg, MD

4:40

F-78 Wavelength Dispersive XRF for Analysis of Small Amounts of Catalyst – How Small Can We Go?
L.L. Brehm, D.W. Burns, S.O. Yusuf, T. Hasan, C.G. Simon, The Dow Chemical Company, Midland, MI






FRIDAY am XRD & XRF

Nanomaterials Characterization / Pikes Peak 1&2

Chairs: A. Allen, National Institute of Standards & Technology, Gaithersburg, MD
B. Palosz, Institute of High Pressure Physics UNIPRESS Polish Academy of Sciences, Warsaw, Poland
T. Proffen, Oak Ridge National Laboratory, Oak Ridge, TN

8:00

C-26 Invited –Diffractive Imaging of Individual Nanostructures
J. Min. Zuo, J. Zhang, K. Ran, University of Illinois, Urbana, IL

8:30

D-93 Invited – Pair Distribution Function Studies of Gold Nanoparticle Ensembles: The Challenge and Importance of Moving Beyond Ensemble Averaged Structural Descriptions
J.A. Kurzman, R. Seshadri, University of California Santa Barbara, Santa Barbara, CA
K. Page, Los Alamos National Laboratory, Los Alamos, NM

9:00

C-16 X-ray Fluorescence and Diffraction Mapping of Dentin at 200 NM
S.R. Stock, A.C. Deymier-Black, A. Veis, E. Lux, A. Telser, Northwestern University, Chicago, IL
Z. Cai, Argonne National Laboratory, Argonne, IL

9:20

D-70 Core-Sheath Size of Nanoparticle Dispersions Studied by SAXS and Complementary Techniques
M.N. Martin, NIST, Gaithersburg, MD and University of Maryland, College Park, MD
A.J. Allen, R.I. MacCuspie, NIST, Gaithersburg, MD

9:40

BREAK

10:00

D-97 Invited – Structure and Dynamics at the Nanoscale Probed by X-ray Photon Correlation Spectroscopy
A.R. Sandy, S. Narayanan, M. Sikorski, Argonne National Laboratory, Argonne, IL
X. Lu, Brookhaven National Laboratory, Upton, NY
S.G.J. Mochrie, Yale University, New Haven, CT

10:30

D-14 Applications of Ultra-Small Angle X-ray Scattering in the Characterization of Nanomaterials
J. Ilavsky, Argonne National Laboratory, Argonne, IL

10:50

C-18 X-ray and Neutron Scattering Characterization of Nanomaterials to Address Measurement Challenges in Carbon Capture
A.J. Allen, M.L. Green, L. Espinal, W. Wong-Ng, NIST, Gaithersburg, MD

11:10

D-87 Characterization of Intercalant Nanoporous Materials with Atomic Pair Distribution Method
M.G. Shatnawi, Hashemite University, Zarqa, Jordan
S.J.L. Billinge, Columbia University, New York, NY
E.J. McKimmy, H. Kim, T.J. Pinnavaia, G. Paglia, J. Dye, K. Cram, Michigan State University, East Lansing, MI
M. Lefenfeld, SiGNa Chemistry, New York, NY

11:30

C-7 X-ray Measurements of Nanometer Thick TaxO1-X on Silicon Substrates for Thickness and Composition Determination
F.J. Cadieu, I. Vander, Y. Rong, R.W. Zuneska, Queens College of CUNY, Flushing, NY



FRIDAY am XRD

Industrial Applications of XRD / Centennial

Chairs: A. Payzant, T. Watkins, Oak Ridge National Labortory, Oak Ridge, TN

8:00

D-10 Investigation of the Structure of Aluminum and Gallium Doped Zinc Oxide Chemical Vapor Deposited Thin Films on Glass Using XRD and TEM
P. Ricou, R. Korotkov, L. Fang, Arkema Inc, King of Prussia, PA

8:20

D-20 Characterization of Structure Changes in Microporous Materials by In Situ X-ray Diffraction
R.W. Broach, UOP LLC, Des Plaines, IL

8:40

D-41 Electrolytic Phase Extraction: An Old Technique to Evaluate Precipitates in Nitinol
R.G. Baggerly, The Boeing Co., Seattle, WA

9:00

D-63 Micro X-ray Diffraction Orientation Analysis of Diamonds Used for Metal Roller Patterning
T. Blanton, C. Barnes, Eastman Kodak Company, Rochester, NY

9:20

BREAK

9:40

D-69 Applications for X-ray Microdiffraction
B. Jones, H. Cordes, M. Sunder, J. Giencke, B. He, Bruker AXS Inc., Madison, WI

10:00

D-71 Determining the Synergistic Effect of Organoclay and Carbon Black on the Morphology Structure, and Mechanical Properties of Epoxy-Polymer Using X-ray and AFM
P. Nawani, L.S. Faraji, R.P. Singh, Oklahoma State University, Tulsa, OK

10:20

D-21 Triads XRPD Indexing Algorithm and Its Use in Pharmaceutical Development
R.B. McClurg, SSCI, a Division of Aptuit, West Lafayette, IN

10:40

D-75 Rapid Triglyceride Polymorph Analysis Using a New Generation of 2D Benchtop pXRD
T.C. Jennison, InXitu Inc., Campbell, CA

11:00

D-79 Quantitative XRD Bulk and Clay Mineralogical Determination of Paleosol Section of Unayzah and Basal Khuff Clastics in Saudi Arabia
S. Shen, S.R. Zaidi, B.A. Mutairi, A.A. Shehry, S.A. Hamoud, F.S. Khaldi, F.A. Edhaim, Saudi Aramco, Dhahran, Saudi Arabia




FRIDAY am XRF

Environmental and Handheld XRF / Pikes Peak 3 & 4

Chairs: J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI
R. Van Grieken, University of Antwerp, Antwerp, Belgium

8:30

F-38 Invited – Application of XRF to Monitoring Heavy Metals in Soils and Sediments
S. Zhuo, A. Ji, Chinese Academy of Sciences, Shanghai, China

9:00

F-27 Spectral Interferences of Sulfur on Light Elements in XRF Analysis of Particulate Matter Samples
H. Indresand, A.M. Dillner, University of California, Davis, CA
M. Shen, Zhejiang University, Hangzhou, P.R. China

9:20

F-59 Near Real Time Aerosol Metals Monitoring at pg/m3 Concentrations Using Large Area Silicon Drift Detectors
S. Barkan, V.D. Saveliev, M. Takahashi, L. Feng, C.R. Tull, E.V. Damron, SII NanoTechnology USA Inc., Northridge, CA
J.A. Cooper, K.A. Petterson, T.C. Pittenger, Cooper Environmental Services LLC, Portland, OR

9:40

BREAK

10:00

F-79 Invited – The Excavations at Coriglia, Castel Viscardo, Italy: Use of Portable XRF for Phasing of Walls across Trenches
D.B. George, L. Rulman, M.K. Donais, Saint Anselm College, Manchester, NH

10:30

C-14 Evaluation of Hexavalent Chromium Extraction from Solids Using XANES and XRD
J.R. Sieber, P.E. Stutzman, W.C. Davis, R.P. Watson, S.E. Long, NIST, Gaithersburg, MD
J. Mahlerbe, Université de Pau et des Pays de l’Adour, Pau, France and NIST, Gaithersburg, MD
M.P. Isaure, O.F.X. Donard, Université de Pau et des Pays de l’Adour, Pau, France
F. Séby, Ultra Traces Analyses Aquitaine, Pau, France
P. Rodriguez-Gonzalez, Universidad Oviedo, Oviedo, Spain
C. Maurizio, European Synchrotron Radiation Facility, Grenoble, France
N. Unceta, University of the Basque Country, Vitoria-Gasteiz, Spain

10:50

F-83 Quantitative Analysis of Toxic Elements in Consumer Products and Environmental Samples by High Defi nition XRF
Z.W. Chen, S. Song, D. Li, A. Vershinin, XOS, East Greenbush, NY

11:10

F-86 HH XRF, From the Lab to the Field and Back! Using the Right Calibration for the Job at Hand
A. Seyfarth, Bruker AXS Inc., Madison, WI
E. Nummi, M. Cameron, Bruker Elemental, Kennewick, WA



FRIDAY am XRF

Trace Analysis / Gold Camp

Chair: G. Pepponi, Centre for Materials and Microsystems, Fondazione Bruno Kessler, Povo, Trento, Italy

8:30

F-81 Invited – Grazing Incidence X-ray Fluorescence Analysis in Shallow Dopant Distributions and Thin Films Characterisation
G. Pepponi, F. Meirer, D. Giubertoni, M. Bersani, CMM, Fondazione Bruno Kessler, Trento, Italy
D. Ingerle, C. Streli, Technical University of Vienna, Vienna, Austria
M.A. Sahiner, Seton Hall University, South Orange, NJ
M.A. Foad, Applied Materials Inc., Santa Clara, CA
J.C. Woicik, NIST, Gaithersburg, MD
A. Mehta, P. Pianetta, SLAC National Accelerator Laboratory, Menlo Park, CA

9:00

F-84 Invited – Sample Preparation Strategies for Trace and Speciation Analysis by TXRF Spectrometry: Past, Present and Future
E. Marguí, M. Hidalgo, University of Girona, Girona, Spain
I. Queralt, Institute of Earth Sciences “Jaume Almera”, CSIC, Barcelona, Spain
C. Streli, Atominstitut TU Wien, Wien, Austria

9:30

F-40 Towards Accurate Analyses of Genesis Solar Wind Samples: Evaluation of Surface Cleaning Methods Using Total Refl ection X-ray Fluorescence Spectrometry
M. Schmeling, Loyola University Chicago, Chicago, IL
M. Humayun, Florida State University, Tallahassee, FL
A.J.G. Jurewicz, Arizona State University, Tempe, AZ
I.V. Veryovkin, Argonne National Laboratory, Argonne, IL
D.S. Burnett, California Institute of Technology, Pasadena, CA

9:50

BREAK

10:10

F-56 Novel (Sub)-Nanometer XRF and TXRF Reference Samples
M. Kraemer, R. Dietsch, T. Holz, D. Weissbach, AXO DRESDEN GmbH, Dresden, Germany

10:30

F-33 Analytical Determination of Selenium in Medical Samples, Food, and Dietary Supplements by Means of Total Reflection X-ray Spectroscopy (TXRF)
M. Beauchaine, Bruker AXS Inc., Madison, WI
H. Stosnach, Bruker AXS Microanalysis GmbH, Berlin, Germany

10:50

F-61 Trace Analysis of Cadmium in Rice by the Selective Excitation of L Shell X-ray Fluorescence
S. Hayakawa, Y. Sugihara, T. Hirokawa, H. Namatame, Hiroshima University, Hiroshima, Japan



 

For more information, please contact Denise Flaherty