Program-at-a-Glance
Workshops
Oral Sessions
Poster Sessions
*Poster Sessions will be held on Monday (XRD) and Tuesday (XRF) evenings
WORKSHOPS -
Monday & Tuesday 6 & 7 August
The exact date & time of each workshop will not be determined until May 2012, please see our website for updates.
XRD & XRF Workshops
X-ray Reflectivity
Organizer & Instructors:
K. Sakurai, National Institute for Materials Science (NIMS) and University of Tsukuba, Tsukuba, Japan, sakurai@yuhgiri.nims.go.jp
W.-L. Wu, NIST, Gaithersburg, MD
R. Matyi, University at Albany - SUNY, Albany, NY
V. Samson, University of Tsukuba, Tsukuba, Japan
K. Ueda, Hutachi Ltd, city, Japan
The workshop topics will include:
- What is X-ray Reflectivity?
- Application to Semiconductor and Magnetic Multilayers
- Application to Nano Technology
- Tips for data analysis
Cultural Heritage
Organizers & Instructors:
A. Karydas, International Atomic Energy Agency, Vienna, Austria, a.karydas@iaea.org
M.K. Donais, Saint Anselm College, Manchester, NH, mdonais@anselm.edu
A. Heginbotham, J. Paul Getty Museum, Los Angeles, CA
V.A. Solé, European Synchrotron Radiation Facility, Grenoble, France
T. Wolff, Analytische Roentgenphysik - Institut fuer Optik und Atomare Physik, Berlin, Germany
The workshop will review the current status and exploit the challenges and perspectives for XRF calibration and quantification of cultural heritage materials using fundamental parameter-based methodologies. Applications using handheld analyzers, laboratory or portable milli- or 2D/3D micro- XRF instrumentation for a variety of samples from paper to metals will be demonstrated to illustrate concepts. Best practices that can improve data reproducibility and assessment will be also discussed.
3D Imaging – Sponsored by Xradia
Organizer & Instructors:
B. Patterson, Los Alamos National Laboratory, Los Alamos, NM, bpatterson@lanl.gov
M. De Graef, Carnegie Mellon University, Pittsburgh, PA
R. Ketcham, The University of Texas at Austin, Austin, TX
R.M. Suter, Carnegie Mellon University, Pittsburgh, PA
The use of three dimensional X-ray imaging, especially computed tomography (CT), has exploded over the past 10 years. Many researchers use it, but few to no courses exist in the basics of operation. This workshop will focus on the basics of X-ray CT both laboratory and synchrotron sources, how radiography is collected at the different length scales, reconstructed into 3D data sets, and data sets processed. Building upon X-ray absorption imaging, 3D X-ray diffraction imaging will be explored.
XRD Workshops
Residual Stress
Organizer & Instructors:
I.C. Noyan, Columbia University, New York, NY, icn2@columbia.edu
C.E. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY
(Additional instructors may be assigned)
This workshop will cover the basic theory and experimental technique of stress/strain determination with X-ray and neutron diffraction. In addition, error analysis and techniques to check accuracy, precision and resolution of stress measurement instruments will be discussed.
Rietveld Analysis – Full Day
Organizers & Instructors:
J.A. Kaduk, Poly Crystallography Inc. and Illinois Institute of Technology, Naperville, IL, kaduk@polycrystallography.com
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY, misture@alfred.edu
T. Degen, PANalytical B.V., Almelo, The Netherlands
The workshop will cover the theory (briefly) and applications of Rietveld analysis. A broad range of applications will be covered, including: crystal structure and unit cell refinement, quantitative analysis, size and microstrain determination, texture analysis, and handling partially amorphous specimens. The instructors will provide not only traditional lectures but also will show live demonstrations of refinements, and will be happy to field questions during the demonstrations.
Two-Dimensional Detectors
Organizers & Instructors:
T.N. Blanton, Eastman Kodak Company Research Labs, Rochester, NY, thomas.blanton@kodak.com
B.B. He, Bruker AXS, Inc., Madison, WI, bob.he@bruker-axs.com
J. Ferrara, Rigaku Americas, The Woodlands, TX
M. Fransen, PANalytical B.V., Almelo, The Netherlands
Two-dimensional diffraction data contain abundant information about the atomic arrangement, microstructure, and defects of a solid or liquid material. In recent years, the use of two-dimensional detectors has dramatically increased in academic, government and industrial laboratories. This workshop covers recent progress in two-dimensional X-ray diffraction in terms of detector technology, data collection strategy, data evaluation algorithms and software, and instrument configurations. In addition to new hardware developments, various application examples, such as phase ID, texture, stress, crystallinity, combinational screening and thin film analysis will be discussed.
Nanostructures – Full Day
Organizer & Instructor:
V. Petkov, Central Michigan University, Mt. Pleasant, MI, petkov@phy.cmich.edu
This full day workshop will start with a brief introduction and continue with a hands–on training on the atomic pair distribution function analysis from XRD data reduction into atomic PDFs to structure determination based on atomic PDFs.
Attendees should install the following free software:
RAD: www.phy.cmich.edu/people/petkov/software.html
ISAACS: www.phy.cmich.edu/people/petkov/software.html
PDFgui: http://www.diffpy.org/download.shtml
…and come to the workshop with their laptops. Attendees are also encouraged to bring data sets of their own.
Phase Identification
Organizers & Instructors:
T.G. Fawcett, International Centre for Diffraction Data, Newtown Square, PA, fawcett@icdd.com
T.N. Blanton, Eastman Kodak Company Research Labs, Rochester, NY, thomas.blanton@kodak.com
C. Crowder, S.N. Kabekkodu, International Centre for Diffraction Data, Newtown Square, PA
Material identification methods using X-ray analyses have been known for over 75 years since the landmark 1936 publication of Hanawalt and Rinn. The fundamental principles have remained the same where unknown materials are compared to a series of reference materials, commonly referred to as a “fingerprint” technique. While the principles remain the same there has been evolutionary changes in the algorithms used, the quality of the data collected, the number of reference materials, and the accuracy and precision of both the experimental data and reference data. In general the evolution has been accomplished by integrating more information and more types of information in the phase identification process, using more powerful algorithms, and increasing the speed and accuracy of the analysis by using increasingly more powerful computers. Modern methods use total patterns, self analyzing and correcting software and sophisticated information filters and diagnostics. These tools are applied to both the experimental and reference data to obtain the best results. Overall, this results in having routine laboratory capabilities today that far exceed the capabilities of the method founders. In this workshop, we will discuss the evolutionary process, the best application of today’s methods, diagnostic tools, and end with a discussion on new developments feeding the next stages of evolution.
XRF Workshops
Basic XRF
Organizers & Instructors:
W.T. Elam, University of Washington APL, Seattle, WA, wtelam@apl.washington.edu
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, havrilla@lanl.gov
This workshop provides a basic introduction to the principles of XRF, and is specifically aimed at those new to the field. It will start with a general overview of the technique, followed by more specific details of the basic principles. The emphasis will be on understanding how to use XRF and what its capabilities are. In the second half of the workshop, a few selected applications will be presented. The focus of this segment will be to provide an understanding of how the basic principles affect actual practice.
Energy Dispersive XRF
Organizer & Instructors:
R. Phillips, Thermo Fisher Scientific, West Palm Beach, FL, rich.phillips@thermofisher.com
R. Cone, Thermo Fisher Scientific, West Palm Beach, FL
A. McWilliams, Research Triangle Institute, Research Triangle Park, NC
This workshop is designed to provide a discussion of the theoretical and practical aspects of EDXRF spectrometry providing a comprehensive review of the basic fundamentals for both the beginner and experienced X-ray spectroscopist. Topics to be covered include instrumentation, components, and applicability of EDXRF; ease of use; rapid qualitative analysis and material screening; calibration techniques for quantitative analysis; standard-less analysis; sensitivity of EDXRF for a wide variety of elements in various matrices; and sample preparation. A variety of applications will be presented as real-life examples where EDXRF is being used to solve complex analytical problems. The workshop will appeal to both the beginner and experienced spectroscopist. The major emphases will be applicability of EDXRF and the optimal protocol for generating and reporting of reliable experimental results.
Quantitative Analysis – Full Day
Organizer & Instructors:
M. Mantler, Rigaku Corporation, Purkersdorf, Austria, michael.mantler@rigaku.com
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, University of Washington APL, Seattle, WA
Morning: Basic Methods of Quantitative Analysis:
1. Theoretical and mathematical foundation: Classical fundamental parameter models.
2. Practical application: Working curves and influence coefficients, compensation methods.
Afternoon: Fundamental Parameters in XRF:
Fundamental parameters for XRF include all physical constants related to the excitation and measurement of x-rays such as attenuation coefficients (total, subshell, coherent/incoherent scattering), binding energies of electrons (hence also line energies), transition probabilities, probabilities for radiative and non-radiative transitions (Auger, Coster-Kronig) as well data related to interactions by electrons. By convention, also tube spectra are sometimes included.
The following topics intend to complement, at an introductory level, the special session dedicated to fundamental parameters during the regular scientific part of DXC 2012:
1. Available collections of fundamental parameters. Sources for download.
2. Reliability of data as a function of element and line-energy (and related sub-shells). This refers in particular to the range of light elements and low energy lines (L, M-lines).
3. The influence of chemical state.
4. Propagation of errors in fundamental parameters to the analytical result (classical methods with reference materials; reference free methods).
5. The International Initiative on X-ray Fundamental Parameters.
Trace/TXRF Analysis
Organizers & Instructors:
C. Streli, TU Wien, Atominstitut, Wien, Austria, streli@ati.ac.at
P. Wobrauschek, TU Wien, Atominstitut, Wien, Austria, wobi@ati.ac.at
K. Tsuji, Osaka City University, Osaka, Japan
This year´s trace analysis workshop will provide an introduction of basic fundamentals in XRF, interesting for both beginners and experienced X-ray spectroscopists. Main topics to be covered are presentations of most modern techniques and instrumentation for trace element analysis. Physical methods to improve minimum detection limits in XRF by background reduction will be discussed; Special emphasis will be on Synchrotron radiation as excitation source. Introduction to total reflection XRF (TXRF) and actual instrumentation is another point of interest and will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range down to light elements (e.g. Carbon). Confocal µ-XRF will be presented as method for 2D and 3D spatial resolved elemental imaging. Applications from interesting scientific fields as environment, microelectronics, forensic, and life science will show the successful use of the importance of the various XRF spectrometric techniques.
XRF Sample Preparation
Organizer & Instructors:
J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI, jaanzelmo@aol.com
P. Ricou, Arkema, Inc., King of Prussia, PA
M.E. Provencher, Corporation Scientifique Claisse, Quebec, Canada
This workshop will discuss basic and fundamental considerations with respect to specimen preparation for XRF by pressed powder and fusion with a special session devoted to the preparation of plastics.
SPECIAL SESSIONS - Wednesday, Thursday & Friday 8-10 August
The exact date and time of each session will not be determined until May 2012, please see our website for updates. The conference ends at 12 noon on Friday, 10 August.
PLENARY SESSION
New Frontiers in X-ray Analysis - Dedicated to the life and work of Robert L. Snyder
Chair:
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY
“Diffraction Analysis and Atomistic Modeling of the Real Structure of Nanocrystalline Materials”
Paolo Scardi, Luca Gelisio, University of Trento, Trento, Italy
“Milestones that gave Momentum to XRPD”
Herbert Goebel, Muenchen, Germany
“New Dimensions in X-ray Microscopy”
Janos Kirz, Advanced Light Source - Lawrence Berkeley National Laboratory, Berkeley, CA
XRD and XRF Sessions
New Developments in XRD & XRF Instrumentation
Chairs:
T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA, fawcett@icdd.com
T.N. Blanton, Eastman Kodak Company Research Labs, Rochester, NY, thomas.blanton@kodak.com
Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or a comparison with competitors' products can be included.
X-ray Imaging
Chair:
B. Patterson, Los Alamos National Laboratory, Los Alamos, NM, bpatterson@lanl.gov
“X-ray Fluorescence Elemental Imaging using Micro, Confocal and DCC Instrumentation”
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
“Nanoscale Chemical Imaging of Energy Materials with Full-field Transmission X-ray Microscopy”
J. Andrews Hayter, SSRL and CSU East Bay, Menlo Park, CA
“Title to be announced”
L. Vincze, Ghent University, Ghent, Belgium
Energy Materials
Chair:
M. Rodriguez, Sandia National Laboratories, Albuquerque, NM, marodri@sandia.gov
Invited speakers to be announced
Improved Fundamental Parameters
Chair:
T. Jach, National Institute of Standards & Technology, Gaithersburg, MD, terrence.jach@nist.gov
Co-chair:
W.T. Elam, University of Washington, Seattle, WA
"High-Resolution X-ray Emission Spectroscopy: A Powerful Technique for Inner-Shell Atomic Physics and Fundamental Parameters Determination"
J.-C. Dousse, University of Fribourg, Fribourg, Switzerland
“Comparing Existing MAC Tables - Hints to Possible Developments”
P. Caussin, Bruker-AXS, Champs sur Marne, France
Cultural Heritage
Chairs:
A. Karydas, International Atomic Energy Agency, Vienna, Austria, a.karydas@iaea.org
M.K. Donais, Saint Anselm College, Manchester, NH, mdonais@anselm.edu
“X-ray Fluorescence Integrated by Molecular Spectroscopies for the Non Invasive Studies of Paintings”
C. Miliani, CNR-ISTM, Universitá degli Studi di Perugia, Perugia, Italy
“PXRF and Archaeological Obsidian: Calibration, Quantification, and the Analysis of Small Samples”
J.R. Ferguson, University of Missouri Research Reactor Center, Columbia, MO
“Seeing What Others Cannot See: X-ray Based Imaging and Spectroscopy of Paintings and Painters Materials”
K. Janssens, University of Antwerp, Antwerp, Belgium
XRD Sessions
Stress Analysis
Chair:
D. Brown, Los Alamos National Laboratory, Los Alamos, NM, dbrown@lanl.gov
“Stresses in Mineralized Tissues”
S. Stock, Northwestern University, Chicago, IL
“Comparing Residual Stress Measurements using Diffraction and Mechanical Techniques”
A. Dewald, Hill Engineering, LLC, Rancho Cordova, CA
Industrial Applications
Chairs:
E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN, payzanta@ornl.gov
T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN, watkinstr@ornl.gov
“Size Matters: In this New Realm of Nanotechnology the Industrial X-ray Characterization Market Still Requires Macro Solutions”
P.J. LaPuma, Bruker AXS, Inc., Madison, WI
“XRD and XRF Techniques for Energy Storage Materials Analysis”
K. J. Rhodes, Ford Motor Company, Dearborn, MI
Rietveld Analysis - full day tentatively scheduled
Chair:
Q. Huang, National Institute of Standards & Technology, Gaithersburg, MD, qing.huang@nist.gov
“X-ray Powder Diffraction Structural Studies of Novel Hydrogen Storage Materials”
H. Wu, National Institute of Standards & Technology, Gaithersburg, MD
“Harnessing the Power of High-Resolution Synchrotron Powder Diffraction for (Your) Rietveld Analysis”
M. Suchomel, APS, Argonne National Laboratory, Argonne, IL
Line Profile Analysis
Chairs:
I. Cernatescu, Pratt and Whitney, East Hartford, CT, iuliana.cernatescu@pw.utc.com
T. Ungár, Eotvos University, Budapest, Hungary, ungar@ludens.elte.hu
“Beyond X-ray Line Profiles: Perceiving Dislocation Structures from High Resolution Reciprocal Space Mapping”
W. Pantleon, Technical University of Denmark, Risø Natl. Lab., Roskilde, Denmark
“Characterizing Twinning and Stacking Fault Activity by X-ray and Neutron Diffraction Line Profile Analysis”
L. Balogh, Los Alamos National Laboratory, Los Alamos, NM
“Extending Line-Profile-Analysis to Textured Materials and Neutron-Diffraction”
T. Ungár, Eotvos University, Budapest, Hungary
XRF Sessions
Micro XRF
Chair:
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, havrilla@lanl.gov
“Development of a Vacuum Confocal Micro-XRF Instrument and Its Applications”
K. Tsuji, Osaka City University, Osaka, Japan
Handheld XRF Applications
Chair:
K.A. Russell, Olympus Innov-X, Woburn, MA, kimberley.russell@olympusndt.com
“Overview of Handheld XRF Applications in Soil Science”
D. Weindorf, LSU AgCenter, Baton Rouge, LA
“Use of Handheld XRF for Consumer Product Testing in the Undergraduate Chemistry Curriculum”
P.T. Palmer, San Francisco State University, San Francisco, CA
Fusion & Industrial Applications of XRF
Chair:
J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI, jaanzelmo@aol.com
"Applications of XRF in the Specialty Glass/Ceramics Industry"
E.M. Fanning, Corning Incorporated, Corning, NY
Quantitative Analysis
Chair:
L.L. Brehm, Dow Chemical Company, Midland, MI, llbrehm@dow.com
“Quantitative XRF Analysis at Trace Level: Concepts and Approaches”
W.-Lung Shen, The Dow Chemical Company, Freeport, TX
“Residual Metals Analysis in the Pharmaceutical Industry: A comparison of ICP-MS, AA and XRF”
A.J. Jensen, Pfizer, Inc., Groton, CT
Trace Analysis
Chair:
M.A. Zaitz, IBM, Hopewell Junction, NY, Zaitz@us.ibm.com
“TXRF Analysis of Environmental and Biological Samples”
K. Tsuji, Osaka City University, Osaka, Japan
Poster Sessions
Poster sessions will be held on Monday (XRD posters) and Tuesday (XRF posters) from 5:30 – 7:30 pm, in the Evergreen Ballroom, in conjunction with the evening receptions. The poster boards used during the evening poster sessions will be 4’ high x 8’ wide boards; thumbtacks will be available if needed. Posters must be set 15 minutes prior to the start of the session, and can be removed at the end of the session. ICDD is not responsible for any posters left by the author(s).
For more information, please contact Denise Flaherty
