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2014 Denver X-ray Conference Summary

Location, Dates & Attendance
Workshops
Sessions
Plenary – X-rays on Mars
Plenary Session Awards
Robert L. Snyder Student Travel Award
Best Poster Awards
Exhibits
Sponsorships
Student Incentives
Mobile DXC
DXC 2015 – Joint Meeting with TXRF
Denver X-ray Conference Organizing Committee
Connect With Us!
Acknowledgements

 

Location, Dates & Attendance
The 63rd Annual Denver X-ray Conference (DXC) was held in Big Sky, Montana at the Big Sky Resort from 28 July - 1 August 2014. This was the first time the conference was held in Big Sky, and only the second time it was held outside the state of Colorado. The meeting attracted over 300 registered attendees and close to 150 exhibit staff, all gathering to discuss applications, state-of-the-art techniques, and future developments in X-ray analysis. Twenty-seven percent of the attendees were from outside the United States representing the following countries: Australia, Austria, Belgium, Brazil, Canada, China, France, Germany, Indonesia, Israel, Italy, Japan, Mexico, Philippines, Saudi Arabia, South Korea, Spain, Switzerland, The Netherlands and the United Kingdom. Thank you very much to those attendees and exhibitors who traveled a great distance so that we could all share a wonderfully unique, international experience.

Workshops
Sixteen half-day tutorial workshops were held on Monday and Tuesday, with participation from forty-four instructors. Various subjects were covered to satisfy the needs of both the beginner and advanced attendee. Topics included:

XRD:
Rietveld
Two-dimensional Detectors
Electron Backscatter Diffraction
Introduction to Modulated Structures
Line Profile Analysis
Quantifying Crystalline and Amorphous Phases I & II
Texture                                           

XRF:
Basic XRF
Trace Analysis
Sample Preparation
XRF Imaging
Quantitative Analysis I & II
Energy Dispersive XRF
Micro XRF

The instructors were a mix of leaders in industry, government and academia who graciously volunteered to work with the attendees and answer their questions. We thank the instructors for their valuable time.

Sessions
Over two-hundred presentations were made during the oral and poster sessions at DXC. Poster sessions were held on Monday and Tuesday evening in conjunction with evening receptions. XRD posters were displayed on Monday and XRF posters were shown on Tuesday. Each evening offered authors a full two hours to show their work and network with their peers.

Sixteen half-day oral sessions were held Wednesday afternoon, Thursday, and Friday morning. Session Chairs were experts in their respective field of X-ray analysis, and enhanced the program by inviting cutting-edge speakers to kick off their sessions. Session topics included:

Special topics:
New Developments in XRD and XRF Instrumentation
Rechargeable Battery Characterization

XRD:
Texture Measurements with X-rays, Electrons and Neutrons
Nuclear Materials
Rietveld Analysis
Line Profile Analysis
Applied Materials Analysis
Stress Analysis
Small Angle X-ray Scattering for Nanomaterials Characterization

XRF:
General XRF
Micro XRF
Industrial & Hand Held Applications of XRF
Fast Element & Species-specific Imaging
Trace Analysis
Quantitative Analysis
Environmental & Geological Applications

Plenary – X-rays on Mars
The Plenary Session, X-rays on Mars, was held on Wednesday morning, and chaired by W. Tim Elam of the University of Washington and Tom Blanton of International Centre for Diffraction Data. Three keynote speakers presented their work.

David Bish from Indiana University, Bloomington, Indiana led the session with his talk, The First X-ray Diffraction Results from Mars. Dr. Bish’s Mars X-ray diffraction work began in 1991 through collaboration with David Vaniman and David Blake. He is currently a co-investigator on the CheMin Martian XRD instrument where he is responsible for analysis of the diffraction data.

J.L. Iain Campbell from the University of Guelph, Ontario, Canada was the secondspeaker, presenting his work, XRF Combines with PIXE in Curiosity's Alpha Particle X-ray Spectrometer. Dr. Campbell is a co-investigator on NASA’s Mars Science Laboratory mission, with responsibilities for spectrum analysis from the alpha-particle X-ray spectrometer (APXS).

Samuel Clegg of Los Alamos National Laboratory, Los Alamos, New Mexico, closed the session with his talk, Exploring Mars with ChemCam on the Curiosity Rover. Dr. Clegg is a member of the NASA Curiosity Rover Science Team and a co-investigator on the ChemCam instrument. All of his research involves the use of lasers to probe complex chemical systems.

Plenary Session Awards
Two awards were presented during the Plenary session. The 2014 Birks Awardwas presented to George Havrilla, Los Alamos National Laboratory for his many contributions to microXRF, especially the development of the confocal XRF microscope. Dr. Havrilla has been a leader in the field of analytical XRF; including 19 years on the Denver X-ray Conference Organizing Committee; nine years as North American Editor of X-ray Spectrometry; and six years as Co-Editor-in-Chief for Advances in X-ray Analysis.

The ICDD Fellow Award was presented to John Getty, Instructor in Geophysical Engineering and Principal Investigator in the Proppant Research Group at Montana Tech. John has played a key role in the planning and execution of the Denver X-ray Conference for more than 30 years! The continued success of the conference is largely due to his commitment and service to the X-ray community.

Robert L. Snyder Student Travel Award
ICDD honored the late Bob Snyder with the annual Robert L. Snyder Student Travel Awards. The awards offer travel support to enable graduate and undergraduate students to attend the Denver X-ray Conference. Seven students received the honor based on the relevancy and strength of their DXC presentation:

Florian Bachmann, TU Bergakademie Freiberg, Freiberg, SA, DE, Germany
Automated Generation of E_Cient Scanning Schemes for XRD Pole Figure Measurements with Area Detectors and
High Resolution Texture Measurements with X-ray Area Detectors and ODF Estimation

Joe Boesso, DePaul University, Glen Ellyn, IL, USA
The Atomic Structure of Partially Amorphous Indium Oxide Semiconductors
Yujia Ding, Illinois Institute of Technology, Chicago, IL, USA
XAFS of Lead-Free Piezoelectric Ceramics BZT-BCT

Sofia Marah Frias, University of the Philippines Diliman, Quezon City, Philippines
Application of X-ray Diffraction to Hydrothermal Alteration Mineral Characterization Using Laboratory-based XRD and Portable XRD/XRF

Kenta Ohtaki, University of California, Irvine, Irvine, CA, USA
XRD analysis of Doped Monoclinic LaPO4 (Monazite)

William Paxton, Rutgers, The State University of New Jersey, NJ, USA
In-situ Synchrotron Energy-Dispersive X-ray Diffraction as a Powerful Tool for Lithium-ion Battery Characterization

Frederik Vanmeert, Universiteit Antwerpen, Antwerpen, Belgium
Macroscopic XRF/XRPD Scanning System for Non-Destructive Examination of Oil Paintings and Other Cultural Heritage Artefacts

AXAA Students attend DXC
Congratulations also to an additional four students who were recipients of the Australian X-ray Analytical Association and the Denver X-ray Conference travel awards. Each of the following recipients’ travel to the Denver X-ray Conference was sponsored by ICDD’s Robert L. Snyder Student Travel Grants, ANSTO, CSIRO, Initiative Scientific Products or PANalytical:

Samuel Liu, The University of Sydney, Sydney, NSW, Australia (sponsored by ICDD & ANSTO)
Chemical Doping in Sillen-Aurivillius Phases: Perovskites in Low Dimensional Multi-layer Structure Types

Nathan Nagle, Macquarie University, Sydney, NSW, Australia (sponsored by ICDD & PANalytical)
Tracing Legacy Sediment and Contaminants from Historical Gold Mining using XRF, XRD and pOSL

Marek Rouillon, Macquarie University, Sydney, NSW, Australia (sponsored by ICDD & CSIRO)
Stand Back! What is a Safe Distance for Handheld XRF Measurements? and
Engaging with Urban Communities: Using Handheld XRFs to Provide Information on Domestic Garden Soils  

Henry Spratt, Queensland University of Technology, Brisbane, Queensland, Australia (sponsored by ICDD & Initiative Scientific Products)
Crystal Structures of Hydronium Jarosite and Ammoniojarosite: Location of Hydrogen Atoms and Orientational Disorder from Powder Diffraction

Best Poster Awards
Awards were named on Monday and Tuesday evening at the end of the XRD and XRF poster sessions. The following posters won awards:

XRD Best Poster Awards:

Statistical Calibration of ASTM C150 Phase Limits to Directly Determined Phases by Quantitative X-ray Powder Diffraction
Paul Stutzman, NIST, Gaithersburg, MD

Studying Ferroelectricity at the Nanoscale Using High Energy X-rays
Todd C. Monson, Sandia National Laboratories, Albuquerque, NM
S.H. Bang, N. Bean, J.C. de Sugny, R. Gambee, R. Haskell, A. Hightower, Harvey Mudd College, Claremont, CA
E. Puma, Pomona College, Claremont, CA
C. Shi, S. Billinge, Columbia University, New York, NY
Q. Ma, DND-CAT, APS, Argonne National Laboratory, Argonne, IL

Best XRD Student Poster

X-ray Diffraction, Thermodynamic and Phase Diagram Calculation Studies of Binary and Ternary Organic Thermal Energy Storage Materials
Renhai Shi, Wen-Ming Chien, Dhanesh Chandra, Amrita Mishra, Wesley Munson, University of Nevada, Reno, NV

XRF Best Poster Awards:

Development and Deployment of a Miniature X-ray Fluorescence Spectrometer for Radiological Glovebox Applications
D.M. Missimer, P.E. O’Rourke, R.L. Rutherford, Savannah River National Laboratory, Aiken, SC

Non-Scanning Type X-ray Fluorescence and X-ray Diffraction Imaging and the Applications
K. Sakurai, M. Mizusawa, National Institute for Materials Science, Ibaraki, Japan

Best XRF Student Poster:

XAS Study of Passivation Mechanism of Hybrid Sn3O2(OH)2/GnP Anodes for Li-ion Batteries
C.J. PelliccioneC.U. Segre, Illinois Institute of Technology, Chicago, IL
E.V. Timofeeva, Energy Systems Division, Argonne National Lab, Argonne, IL

Exhibits
Thirty-nine companies exhibited at the conference, displaying various products and services for X-ray diffraction and X-ray fluorescence. International countries represented were Canada, Germany, Switzerland and the United Kingdom. Companies participating as exhibitors were:

AMPTEK, Inc.
Angstrom, Inc.
AXO DRESDEN/Huber Diffraction Equipment
Bruker
Cambridge University Press
Chemplex
Claisse, Corporation Scientifique
Cold Edge Technologies, Inc.
DECTRIS, Ltd.
Fischer Technology, Inc./IFG
Glen Mills, Inc.
Hereaus, Inc.
Herzog Automation Corp.
Hitachi High-Technologies Science America, Inc.
HORIBA Scientifić
Inel, Inc.
International Centre for Diffraction Data
KETEK GmbH
KPL Scientific, Inc.
Materials Data, Inc.
Materion Electrofusion
Micromatter
Mikron Digital Instruments, Inc.
MOXTEK, Inc.
Multiwire Laboratories, Ltd.
Oxford Cryosystems
PANalytical
Premier Lab Supply, Inc.
Proto Manufacturing
Pulstec Industrial Co., Ltd.
Rigaku Americas Corp.
Rigaku Innovative Technologies
SGX Sensortech
Shimadzu
Spectro Analytical Instruments
SPEX Sample Prep
Thermo Scientific
XIA, LLC.
XOS


Complete exhibit details including contact information and a description of products and services can still be viewed on the exhibit page of the Denver X-ray Conference web site: www.dxcicdd.com.

Sponsorships
The Denver X-ray Conference Organizing Committee would like to give special thanks to the vendors who participated as sponsors at the conference. Premier Lab Supply, Inc., was the Platinum sponsor and Chemplex Industries, Inc., was a Silver sponsor. Their very generous sponsorship helped to enhance the conference, especially the poster sessions, and we thank them for their continued generosity and support of the DXC. Bruker also sponsored an evening event, Bruker’s Oktoberfest in July, inviting all the attendees to celebrate with them, and enjoy a beautiful evening outside in the mountains. Thank you, Premier Lab Supply, Bruker and Chemplex!

Student Incentives
In an effort to increase student attendance at the conference, ICDD offered all students reduced registration and housing. Eleven students were given travel grants, and two student awards were selected during the poster sessions. The Organizing Committee invited the students to lunch on the first day of the conference, introduced themselves and offered their assistance with networking. All leaders in academia are encouraged to send their students to DXC so that the X-ray community can continue to grow and flourish.

Mobile DXC
Attendees could also download a mobile App to enhance their conference experience by planning their day with a personalized schedule, browse the exhibitors, view maps, and learn all the latest announcements and updates. Special thanks to ICDD for sponsoring the App and enabling attendees to view conference information with great convenience.

DXC 2015 – Joint Meeting with TXRF

The 2015 DXC will be held 3-7 August at the Westin Westminster, Westminster, Colorado, USA. We are happy to announce that 2015 will be a joint conference with the 16th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2015). The Plenary session will be, TXRF around the World”.

Denver X-ray Conference Organizing Committee
Please join us in congratulating Don Broton of Construction Technology Labs, Skokie, IL, as a new member of the Denver X-ray Conference Organizing Committee. Don is a leading expert in the cement industry, and the entire committee welcomes him to the team.

If you have an idea for a workshop or session, please share it with the Organizing Committee by submitting your request here. For consideration in the 2016 program, proposals must be submitted by 1 March 2015.

Connect With Us!
Stay connected with DXC and ICDD by following us on Twitter, Facebook, Google+ and LinkedIn. Visit our web site or contact our Conference Coordinator, Denise Zulli. We are here to help you with any questions or concerns you may have, and hope to see everyone again next year in Westminster, Colorado. Web: www.dxcicdd.com; E-mail: zulli@icdd.com; Phone: 610-325-9814.

Acknowledgements
ICDD thanks all the volunteers who dedicated themselves to the X-ray community and the Denver X-ray Conference. The Organizing Committee, Session Chairs, Invited Speakers and Workshop Instructors are the reason DXC is successful. They willingly share their expertise, knowledge and experience. We are very grateful for their contributions.

 

 


For more information, please contact Denise Zulli

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