Keep "in the know" by following our TwitterFacebook, and LinkedIn

Summary of 2016 DXC

Location, Dates & Attendance
The Denver X-ray Conference [DXC] visited Rosemont, Illinois, USA, for its 65th Annual Conference on Applications of X-ray Analysis. The conference took place 1-5 August 2016 at the Westin O’Hare Hotel. The move to the mid-west proved to be successful as attendance at the conference exceeded 300 attendees and over 250 technical presentations. The number of exhibit personnel reached over 160 people, bringing the total attendance to nearly 500 X-ray scientists, with 30% from outside the United States.

Workshops
Conference week began with nineteen half-day workshops held on Monday and Tuesday of conference week. Subjects focused on both beginner and advanced levels, with forty-two specialists invited to participate as workshop instructors. Workshop topics included:

XRD

XRF

Special Topics

Basic to Intermediate XRD – full day
Diffraction Contrast Imaging
Rietveld for Beginners
Advanced Rietveld
Structure Solution – full day
Two-dimensional Detectors

Basic XRF
Energy Dispersive XRF
Trace Analysis
Micro XRF
Quantitative Analysis – full day
Sample Preparation of XRF

Synergies between Laboratory &     Synchrotron X-ray Methods
Fundamentals of X-ray Absorption Spectroscopy
Amorphous & Disordered Materials – full day

Plenary Session
Technical sessions ran Wednesday through Friday of conference week, starting with the Plenary Session on Wednesday morning, “Imaging at Current and Next Generation Synchrotrons.” The session was chaired by Brian Toby of Argonne National Laboratory, Advanced Photon Source, and included a presentation of awards and four invited talks. The awards presented during the Plenary Session were:

  • The 2016 Birks Award was presented to Alan C. Huber, Amptek, Inc., and Jacob (Nate) Sherman (awarded posthumously).
  • The 2016 Robert L. Snyder Student Travel Awards were announced; nine recipients received awards for the following works:

Valentina Aguilar, Universidad Nacional Autonoma de Mexico                                               
ADIS: A New X-ray Diffraction & X-ray Fluorescence System for In Situ Material Characterization for Cultural Heritage

Quan Kuang, South China University of Technology
Structural Design and Characterization of Vanadium-Based Phosphates as Cathode Materials for Li-Ion Batteries

Yifeng Ling
Iowa State University
Microstructural Characterization of Fly Ash-based Geopolymer

Lara Maldanis
University of São Paulo
Micro-XRF Spectroscopy in Fossil Samples Providing Information about Preservation, Paleoecology and Evolution of Specimens

Scott McCormack
University of Illinois at Urbana-Champagin
In Situ Crystallographic Thermal Expansion Measurements of Compounds in the HfO2-Ta2O5-TiO2 Ternary System Using CTEAS

Adelita Mendoza
Northwestern University
Zinc Dynamics Regulate Germline Development in Caenorhabditis Elegans

Sixberth Mlowe
University of Zululand
High Temperature Phase Transformation of Iron Sulfide

Jing Zhang
Central South University
2 Crystal Structures and Properties of New Compounds in Mgo-In2O3-P2O5 Ternary Systems

He Zhang
Illinois Institute of Technology
XAFS Observation of Nucleation Mechanism in Deposition of WS2

  • The 2016 Hanawalt Award was presented to Matteo Leoni and Paolo Scardi, University di Trento, Trento, Italy.
    Dr. Leoni was present to receive the award. Dr. Scardi will accept his award and present his Hanawalt Award Lecture at the XTOP2016 Conference, Brno, Czech Republic, 4-8 September 2016.
  • The 2016 Jerome B. Cohen Student Award did not have a recipient.

The awards presentation was followed by four keynote speakers, the first being Timothy Fawcett of the International Centre for Diffraction Data, whose talk “100 Years of Powder Diffraction” celebrated the anniversary of the science.

The next two talks focused on the theme of the Plenary. Francesco De Carlo, Argonne National Laboratory, gave his lecture on, “X-ray Imaging at the Advanced Photon Source (APS) from Data Intensive to Data Driven: Opportunities with the APS Upgrade” and Stefan Vogt, also from Argonne National Laboratory, presented his talk, “X-ray Fluorescence Microscopy: Advances and Unique Opportunities.”

The fourth and final talk was the Hanawalt Award Lecture, presented by Matteo Leoni, Univerisity of Trento, “Detailed Microstructure Information from Powder Data: A Maze or Amazing?” It was noted that Paolo Scardi would present his Hanawalt Award Lecture at the XTOP 2016 – 13th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging, scheduled 4-8 September 2016 in Brno, Czech Republic.  

Special Sessions
Nineteen half-day special sessions (nearly 160 oral presentations) filled the remainder of the week. Thirty-six of the presentations were given by invited speakers – experts in their respective fields. Topics included:

XRD

XRF

Special Topics

High Energy X-ray Microscopy
Rietveld
Applied Materials – full day
General XRD
Stress

Trace Analysis
Industrial Applications of XRF
General XRF
Quantitative Analysis

New Developments in XRD & XRF Instrumentation – full day
X-ray Imaging – full day
Cultural Heritage
X-ray Optics

A unique group of sessions were also held at DXC that specialized in Biological Applications of X-ray Fluorescence Microscopy. Lead by Stefan Vogt of Argonne National Laboratory, the group ran three half-day sessions on Wednesday and Thursday of conference week:

Biological Applications of X-ray Fluorescence Microscopy

Biomedical Applications

Plant/Environmental/Microbial Science

Related Technique & Methods Development

 

Poster Sessions and Best Poster Awards
Over ninety posters were presented on Monday and Tuesday evening during the XRD and XRF poster sessions. Judges had a difficult time choosing the Best Poster Awards, as the competition was intense. Ultimately, the following presenters were named winners:
Monday XRD Best Poster Awards presented to:
X-ray Analysis for Quantifying Various Components in Poly(vinyl chloride) Plastics
P. Ricou, R. Smith, Arkema Inc., King of Prussia, PA, USA

Crystal Structures and Properties of New Compounds in Mgo-In2O3-P2O5 Ternary Systems
J. Zhang, G. Cai, Z. Jin, Central South University, Changsha, China

Best Student Poster: High Temperature Phase Transformation of Iron Sulfide
S. Mlowe*, N. Revaprasadu, University of Zulaland, kwa zulu natal, South Africa
S.S. Garje, University of Mumbai, Mumbai, India

Tuesday XRF Best Poster Awards presented to:
Developments in Equilibrium and Time-Resolved Small Angle X-ray Scattering
S. Chakravarthy, T. Irving, BioCAT/Illinois Institute of Technology, Chicago, IL, USA
S. Kathuria, O. Bilsel, U Mass. Medical School, Worcester, MA, USA

Combined Synchrotron X-ray Microprobe Analysis of Corrosion Deposits in Fuel Rods of Pressurized Water Reactors
V.A. Samson*, D. Grolimund, Swiss Light Source (SLS) Paul Scherrer Insitute, Villigen, Switzerland
M. Martin, H.D. Potthast, Nuclear Energy and Safety Department (NES) Paul Scherrer Insitute, Villigen, Switzerland

Best Student Poster: Investigation of Heavy Metal Deposition in Zebrafish by Total Reflection X-ray Fluorescence
M. Schmeling, J. Arroyo, R. Dale, E. Jamka*, K. Niaz, Loyola University Chicago, Chicago, IL, USA

Students
Over 40 students attended the Denver X-ray Conference. In addition to the Robert L. Snyder Student Travel Awards (please see section on the Plenary Session awards for details), students also received reduced registration, reduced housing, and a student pizza lunch with the Organizing Committee.

Exhibits
The exhibit hall was sold out of space as 45 companies shared their displays of various software, instruments and products for XRD and XRF analysis. Participating companies were:

AMPTEK Inc.
Angstrom, Inc.
Brightspec NV
Bruker
Cambridge University Press
Chemplex Industries, Inc.
Claisse
CSRRI @ Illinois Tech
DECTRIS Ltd
Heraeus Platinum Labware
Herzog Automation Corp.
Hitachi High-Technologies Science America, Inc.
HORIBA Scientifić
Huber Diffraction & AXO Dresden
ICDD
IFG / Fischer Technology, Inc.
Inrad Optics
IXRF Systems, Inc.
KETEK GmbH
Lyncean Technologies
Materials Data, Inc.
Materion Electrofusion
Micromatter Technologies, Inc.

Mikron Digital Instruments, Inc.
Moxtek, Inc.
Nannotek LLC
Navas Instruments
Oxford Cryosystems
Oxford Instruments
Oxford Instruments X-ray    Technology
PANalytical
PNDetector
PREMIER Lab Supply, Inc.
Proto Manufacturing, Inc.
Rigaku Americas Corporation
SGX Sensortech (MA) Ltd
Shimadzu Scientific Instruments
Sietronics Pty Ltd
Spectro Analytical Instruments
SPEX SamplePrep/Katanax
STOE & Cie GmbH
Thermo Fisher Scientific
XGLab
XIA LLC
XOS

Complete exhibit details including contact information and a description of products and services can still be viewed on the exhibit page of the Denver X-ray Conference website.

Social Event and Sponsorships
The premier sponsor at DXC was Bruker AXS. Their sponsorship had attendees dancing the night away on Tuesday evening, as they hosted a Chicago-themed party with the popular band, Blooze Brothers. If you haven’t seen pictures of the event, make sure to visit Bruker’s Facebook page, and see the merriment for yourself.

Chemplex Industries, Inc. and Premier Lab Supply both gave generous donations to the conference, earning them each Gold sponsorship. Their gift to the conference helps DXC provide attendees with a top-rate experience, and we are very grateful for their continued support.

2017 Denver X-ray Conference
The 66th annual conference will be held 31 July – 4 August 2017 in Big Sky, Montana, USA. Please be sure to monitor our website for tentative program information, and the Call for Papers, which will begin in January.

 

Photos:

Monday: XRD Poster Session Winners – The Monday Evening XRD Poster Session was held 5:00 pm – 7:00 pm in the Michigan Room, in conjunction with a Wine & Cheese Reception. Three "Best Poster" awards were given at the end of the session, including "Best Student Poster".

1
D-123 High Temperature Phase Transformation of Iron Sulfide
S. Mlowe*, N. Revaprasadu, University of Zulaland, kwa zulu natal, South Africa S.S. Garje, University of Mumbai, Mumbai, India

2
D-42 Crystal Structures and Properties of New Compounds in Mgo-In2O3-P2O5 Ternary Systems
J. Zhang, G. Cai, Z. Jin, Central South University, Changsha, China

3
D-8 X-ray Analysis for Quantifying Various Components in Poly(vinyl chloride) Plastics
P. Ricou, R. Smith, Arkema Inc., King of Prussia, PA, USA

Tuesday XRF Poster Session Winners: The Tuesday Evening XRF Poster Session was held 5:00 pm – 7:00 pm in the Michigan Room, in conjunction with a Wine & Cheese Reception. Three "Best Poster" awards were given at the end of the session, including "Best Student Poster".

1(photo - Elizabeth Jamka)
F-59 Investigation of Heavy Metal Deposition in Zebrafish by Total Reflection X-ray Fluorescence
M. Schmeling, J. Arroyo, R. Dale, E. Jamka, K. Niaz, Loyola University Chicago, Chicago, IL, USA

2(photo Srinivas Chakravarthy)
S-42 Developments in Equilibrium and Time-Resolved Small Angle X-ray Scattering
S. Chakravarthy, T. Irving, BioCAT/Illinois Institute of Technology, Chicago, IL, USA
S. Kathuria, O. Bilsel, U Mass. Medical School, Worcester, MA, USA

3(photo Vallerie Samson)
F-71 Combined Synchrotron X-ray Microprobe Analysis of Corrosion Deposits in Fuel Rods of Pressurized Water Reactors 
V.A. Samson*, D. Grolimund, Swiss Light Source (SLS) Paul Scherrer Insitute, Villigen, Switzerland M. Martin, H.D. Potthast, Nuclear Energy and Safety Department (NES) Paul Scherrer Insitute, Villigen, Switzerland

 


 

DXC in Chicago
photo by Westin O'Hare