47th Annual Denver X-ray Conference™
Program-At-A-Glance - August 3 -7, 1998SUN. eve.:
5:30-7:30 Welcoming Reception sponsored by: Bede Scientific, SPEX CertiPrep & Claisse Scientifique (Sum)Day & Time
XRD & XRF
XRD
XRF
MON. am: Workshops
W-1 Specimen Prep. I: Methods in XRD & XRF Buhrke/Jenkins/Smith (Sum. III)
W-2 The Design, Alignment, Calibration & Performance Characteristics of the Conventional Laboratory Diffractometer Cline/Cheary (Sum. I & II)
W-3 XRF Standards Brammer/Gilfrich
(LC)
MON. pm: Workshops
W-4 Specimen Prep. II: Methods in XRD & XRF Buhrke/Jenkins/Smith
(Sum. III)
W-5 Use of Total Pattern Fitting for Quantitative Phase Analysis Toraya/Smith (Sum. I & II)
W-6 Reflectometry for Surface & Thin-Film Characterization-
Huang/Snyder/Goebel/
Lengeler (FR)
W-7 Working Close to Detection Limits: XRF- Sieber/Holynska/Currie/
Van Grieken
(LC)
MON. eve.:
6:30-8:30 Bruker AXS, Inc. Reception and XRF Poster Session. Sponsored by: Bruker AXS, Inc. (Sum)TUE. am: Workshops
W-8 Principles & Use of Microdiffraction & Microfluorescence I Eatough/Tissot (Sum. III)
W-9 Conclusions from the Intensity Round Robin: XRD Jenkins/Rafaja/Taylor
(Sum. I & II)
W-10 Applications of TXRF Wobrauschek/Pianetta/
Streli
(LC)
TUE. pm: Workshops
W-11 Principles & Use of Microdiffraction & Microfluorescence II Eatough/Tissot (Sum. III)
W-12 Diffractometer Optics Noyan/Goldsmith (Sum. I & II)
W-13 High Temperature XRD
Hubbard/Payzant/Misture
(FR)
W-14 Quantitative Techniques & Errors in XRF Anzelmo/Jenkins/Mauser
(LC)
TUE. eve:
6:30-8:30 MDI and Rigaku/USA Reception and XRD Poster Session. Sponsored by: MDI & RIGAKU/USA (Sum)WED. am: 8:30-12:00 Noon Plenary Session: "XRD/XRF: Now What?" Zaitz/Snyder. ( Sum) WED. pm: Sessions
C-1 Synchrotron Applications of XRD & XRF Harlow/Hart (LC)
C-2 Developments in Detectors for X-ray Analysis
Martinis/Blanton (Sum. I)
D-1 Residual Stresses Hauk/Predecki (FR)
D-2 Diffraction Applications
Smith/Barton (Sum. III)
F-1 Application of XRF to the Analysis of Thin Films Wilson/Madden
(Sum II)
WED. eve:
6:30-8:30 ICDD Technical Committee Meeting. All are invited; refreshments will be served. (Sum)THURS. am: Sessions
C-3 Recent Advances in X-ray Optics 1 MacDonald/TBA (Sum. I)
C-4 Recent Developments in Instrumentation & Data Treatment I
Buhrke/Vrebos (Sum. III)
D-3 Thin Films I: Orientation, Stress, Thickness Noyan/Rafaja (FR)
D-4 Innovative Applications of Rietveld Analysis
Young/Bish (LC)
F-2 Practical Problems in XRF 1
Kocman/Feret
(Sum. II)
THURS. pm: Sessions
C-5 Recent Advances in X-ray Optics II Goebel/Gibson (Sum. I)
C-6 Recent Developments in Instrumentation & Data Treatment II
Havrilla/O'Connor (Sum III)
D-5 Thin Films II: Orientation, Stress Thickness Huang/Scardi (FR)
D-6 Impact of Rietveld Analysis & Use of Calculated Patterns in Quantitative Phase Analysis
Snyder/Jenkins (LC)
F-3 Practical Problems in XRF II
Harding/Piorek
(Sum. II)
THURS. eve:
7:00 Conference Dinner (Sum)FRI. am: Sessions
C-7 Micro XRF/XRD Carpenter/Goldsmith
(Sum. III)
D-7 Materials Process Characterization by Diffraction Hubbard/Misture (FR)
F-4 Environmental Applications of XRF Holynska/Gilfrich
(Sum. I)
Meeting Rooms: Sum = Summit, LC = Learning Center, FR = Freemont
