47th Annual  (1998) Denver X-ray Conference™
Antlers Doubletree Hotel
Colorado Springs, CO

August 3-7, 1998

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47th Annual Denver X-ray Conference™
Program-At-A-Glance - August 3 -7, 1998
 

SUN. eve.
5:30-7:30 Welcoming Reception sponsored by: Bede Scientific, SPEX CertiPrep & Claisse Scientifique (Sum) 

Day & Time 

XRD & XRF 

XRD 

XRF 

MON. am: 

Workshops

W-1 Specimen Prep. I: Methods in XRD & XRF Buhrke/Jenkins/Smith 

(Sum. III)

W-2The Design, Alignment, Calibration & Performance Characteristics of the Conventional Laboratory Diffractometer 

Cline/Cheary (Sum. I & II)

W-3 XRF Standards 

Brammer/Gilfrich 

(LC)

MON. pm

Workshops

W-4 Specimen Prep. II: Methods in XRD & XRF 

Buhrke/Jenkins/Smith 

(Sum. III)

W-5 Use of Total Pattern Fitting for Quantitative Phase Analysis 

Toraya/Smith (Sum. I & II) 

W-6 Reflectometry for Surface & Thin-Film Characterization- 

Huang/Snyder/Goebel/ 

Lengeler (FR)

W-7 Working Close to Detection Limits: XRF- 

Sieber/Holynska/Currie/ 

Van Grieken 

(LC)

MON. eve.
6:30-8:30 Bruker AXS, Inc. Reception and XRF Poster Session. Sponsored by: Bruker AXS, Inc. (Sum)
TUE. am: 

Workshops

W-8 Principles & Use of Microdiffraction & Microfluorescence I 

Eatough/Tissot (Sum. III)

W-9 Conclusions from the Intensity Round Robin: XRD 

Jenkins/Rafaja/Taylor 

(Sum. I & II)

W-10 Applications of TXRF 

Wobrauschek/Pianetta/ 

Streli 

(LC)

TUE. pm: 

Workshops

W-11 Principles & Use of Microdiffraction & Microfluorescence II 

Eatough/Tissot (Sum. III) 

W-12 Diffractometer Optics 

Noyan/Goldsmith (Sum. I & II) 

W-13 High Temperature XRD 

Hubbard/Payzant/Misture 

(FR)

W-14 Quantitative Techniques & Errors in XRF 

Anzelmo/Jenkins/Mauser 

(LC)

TUE. eve
6:30-8:30 MDI and Rigaku/USA Reception and XRD Poster Session. Sponsored by: MDI & RIGAKU/USA (Sum)
WED. am: 8:30-12:00 Noon Plenary Session: "XRD/XRF: Now What?" Zaitz/Snyder. ( Sum) 
WED. pm: 

Sessions

C-1Synchrotron Applications of XRD & XRF 

Harlow/Hart (LC) 

C-2Developments in Detectors for X-ray Analysis 

Martinis/Blanton (Sum. I)

D-1Residual Stresses 

Hauk/Predecki (FR) 

D-2Diffraction Applications 

Smith/Barton (Sum. III)

F-1Application of XRF to the Analysis of Thin Films 

Wilson/Madden 

(Sum II)

WED. eve: 
6:30-8:30 ICDD Technical Committee Meeting. All are invited; refreshments will be served. (Sum)
THURS. am: 

Sessions

C-3Recent Advances in X-ray Optics 1 

MacDonald/TBA (Sum. I) 

C-4Recent Developments in Instrumentation & Data Treatment I 

Buhrke/Vrebos (Sum. III)

D-3Thin Films I: Orientation, Stress, Thickness 

Noyan/Rafaja (FR) 

D-4Innovative Applications of Rietveld Analysis 

Young/Bish (LC)

F-2Practical Problems in 

XRF 1 

Kocman/Feret 

(Sum. II)

THURS. pm: 

Sessions

C-5Recent Advances in X-ray Optics II 

Goebel/Gibson (Sum. I) 

C-6Recent Developments in Instrumentation & Data Treatment II 

Havrilla/O'Connor (Sum III)

D-5Thin Films II: Orientation, Stress Thickness 

Huang/Scardi (FR) 

D-6Impact of Rietveld Analysis & Use of Calculated Patterns in Quantitative Phase Analysis 

Snyder/Jenkins (LC)

F-3Practical Problems in 

XRF II 

Harding/Piorek 

(Sum. II)

THURS. eve: 
7:00 Conference Dinner(Sum)
FRI. am: 

Sessions

C-7Micro XRF/XRD 

Carpenter/Goldsmith 

(Sum. III)

D-7Materials Process Characterization by Diffraction 

Hubbard/Misture (FR)

F-4Environmental Applications of XRF 

Holynska/Gilfrich 

(Sum. I)