47th Annual (1998) Denver X-ray Conference™
XRD Poster Session
Non Ambient XRD - Stress - XRD Instrumentation - XRD Applications - Crystal Structures
Tuesday, 4 August , 1998
(Summit I, II & III)
(6:30 p.m. – 8:30 p.m., authors present)
The XRD Poster Session will be held in conjunction with the MDI and Rigaku/USA mixer.Chairs: D.K. Smith, Emeritus, The Pennsylvania State University, University Park, PA
T.N. Blanton, Eastman Kodak Company, Rochester, NY
Session chairs will select the three best papers for awards.
D-94 Thermal Characterization of a High Temperature XRD Furnace
E.A. Payzant and H. Wang, Oak Ridge National Laboratory, Oak Ridge, TND-93 Use of Low Temperature XRD to Study Phase Transitions During Freeze-Drying of Aqueous Mannitol Solutions
R.K. Cavatur and R. Suryanarayanan, University of Minnesota, Minneapolis, MND-37 High Temperature XRD Under Controlled Relative Humidity: Application in the Investigation of a Pharmaceutical Solid- State Reaction
S.K. Rastogi, R. Suryanarayanan, University of Minnesota, MN and M. Zakrzewski, Philips Analytical, The NetherlandsD-44 Phase Formation of the Pb-2223 High Temperature Superconductor in the (Bi, Pb)-Sr-Ca-Cu-O System
W. Wong-Ng and L.P. Cook, National Institute of Standards and Technology, Gaithersburg, MDD-7 An Improved Method for Analysis of Dislocation Densities in Heavily Deformed and Irradiated HCP Metals
R.D. Sage, J.E. Winegar and M. Griffiths, Chalk River Laboratories, CanadaD-76 X-ray Stress Measurement of Sintered Fe-Cr/TiN Composites
T. Sasaki, S. Takago, Y. Hirose, Kanazawa University, Japan and M. Miyano, RIKEN Corporation, JapanD-77 A Study of Fatigue Fracture Mechanism with Shot-Peened Material
S. Takahashi, Y. Hirose, Kanazawa University, Japan and M. Hashimoto, Sumitomo Heavy Industries LTD, JapanD-8 Effects of Thermal Cycles on Residual Stress for Nitrided and Sulphonitrided Hot Work Die Steel (SKD61)
K. Yatsushiro, M. Hihara, Yamanashi Industrial Technology Center, Japan, K. Okada, S. Yabuuchi, Yamanashi University, Japan and M. Kuramoto, Polytechnic University, JapanD-10 Measurements of Residual Stresses in Micron Regions by Using Synchrotron Excited KOSSEL-Diffraction
J. Brechbühl, J. Bauch and H.-J. Ullrich, TU Dresden, GermanyD-9 Further Applications of KOSSEL-Technique by Means of Synchrotron Beam Excitation
J. Bauch, J. Brechbühl, H.-J. Ullrich, TU Dresden, GermanyD-75 X-ray Fractographic Study of Sintered Fe-Cr steel/TiN System Composite Materials
S. Takago, T. Sasaki, Y. Hirose, Kanazawa University, Japan and M. Miyano, RIKEN Corporation, JapanD-50 A Direct Algorithm for Solving III-Conditioned Linear Algebraic Systems
X.J. Xue, S.K. Kurtz, The Pennsylvania State University, University Park, PA, K.J. Kozaczek and D.S. Kurtz, HyperNex, Inc., State College, PAF-39 Experimental Investigation of Kumakhov Polycapillary Lenses
S.V. Nikitina, N.S. Ibraimov, Institute for Roentgen Optics, Russia and V.Ya. Schovkoun, Kurchatov Institute of Atomic Energy, RussiaD-74 Proposal of Method to Make Pole Figure Using Imaging Plate
T. Goto, T. Sasaki, Y. Hirose, Kanazawa University, Japan and S. Nagasima, formerly Yokohama National University, JapanD-78 Laterally Graded Multilayer Mirrors
J. Pedulla, J. Pedulla and Associates, Silver Spring, MD, S.M. Owens and R.D. Deslattes, National Institute of Standards and Technology, Gaithersburg, MDD-96 An Electrochemical Cell for In-Situ X-ray Characterization
M. Rodriguez, D. Ingersoll and D.H. Doughty, Sandia National Laboratories, Albuquerque, NMD-3 Using Guinier Films to get Intensity Data Files
N.O. Ersson, Uppsala University, SwedenD-113 Diffraction-, Fluorescence-, and Phase Contrast Imaging with Micrometer Resolution at the ESRF Beamline ID22
M. Drakopoulus, C. Raven, A. Simionovici, I. Snigireva and A. Snigirev, ESRF, FranceD-4 X-ray Diffraction Studies of the PbO-SrO System
W. Wong-Ng, J.P. Cline, L.P. Cook, National Institute of Standards and Technology, Gaithersburg, MD and W. Greenwood, University of Maryland, College Park, MDD-111 Dynamic In Situ X-ray Characterization of High Tech- Alloys
M. Haller and R.L. Snyder, The Ohio State University, Columbus, OHD-5 Optical and XRD Screening of SiC Substrates
E. Fantner, T. Ryan, Philips Analytical, Mahwah, NJ and I. Ferguson, Emcore Corporation, Somerset, NJD-6 Application of X-ray Diffraction in Evaluating the Fate of Environmental Contaminants
D. Frank and B. Zavala, U.S. Environmental Protection Agency, Seattle, WAD-40 In-situ Diffraction Study of Brownmillerite-Type Mixed Conductors
S.A. Speakman and S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NYD-61 Characterization of Metal Benzotriazoles and Related Polymers
S.J. Wasson, U.S. Environmental Protection Agency, Research Triangle Park, NC, M.C. Kerzic, J.W. Hall, Wingate University, Wingate, NC, M.A. Cates and J.R. Wasson, Advanced Materials, New Hill, NCD-102 Quantitative X-ray Diffractometry and Structural Analysis of Magnesium Titanate Mixtures Using The Rietveld Refinement
G. Kimmel and J. Zabicky, Ben-Gurion University of the Negev, IsraelD-80 An XRD Morphology Index for Talcs
H.J. Holland and M.J. Murtagh, Corning Incorporated, Corning, NYD-108 An Increment Method for Quantitative X-ray Diffraction Phase Analysis of Samples Containing Amorphous Material
G. Chu, Fushun Petroleum Institute, P.R. ChinaD-81 Accurate Texture Measurements on Highly Textured Materials Using Single Line Rocking Curves
M. Vaudin, National Institute of Standards and Technology, Gaithersburg, MDD-65 GT-XTRA Website: Georgia Tech X-ray Diffraction Teaching Resource Archive
C. Bradford, D.Y. Chiang, M.A. Davidson, J.D. Haase, M.A. Langøy, T.A. Polley and S. Stock, Georgia Institute of Technology, Atlanta, GAD-2 Rietveld Crystal Structure Refinement for a Natural Specimen of the Mineral Chromite
D. Makuyana and B. O'Connor, Curtin University of Technology, AustraliaD-1 Crystal Structures and Reference X-ray Powder Patterns of Ba4Ti10Al2O27, Ba4Ti11MgO27 and Ba4Ti11ZnO27
J.A. Kaduk, Amoco Corporation, Naperville, IL, B.H. Toby, W. Wong-Ng, National Institute of Standards and Technology, Gaithersburg, MD and W. Greenwood, University of Maryland, College Park, MDD-79 Ab Initio Synchrotron Powder Structures of Metal Phosphonates
A. Cabeza, M.A.G. Aranda and S. Bruque, Universidad de Málaga, SpainD-29 Microstructure of Clay-Polymer Composites T.N. Blanton, D. Majumdar and S.M. Melpolder, Eastman Kodak Company, Rochester, NY
