47th Annual (1998) Denver X-ray Conference™ XRF Poster Session TXRF - XRF Instrumentation and Techniques - Applications of XRF Monday, 3 August, 1998 (Summit I, II & III) (6:30 p.m. – 8:30 p.m., authors present) The XRF Poster Session will be held in conjunction with the Bruker AXS, Inc. mixer. Chairs: H. Ebel, Technische Universität Wien, Austria P. Wobrauschek, Atominstitut of the Austrian Universities, Austria Session chairs will select the three best papers for awards. TXRF: F-1 Analysis of Silicon Carbide Using Total Reflection X-ray Fluorescence (TXRF) D. Werho and T. Wetteroth, Motorola, Inc., Mesa, AZ F-44 Use of Multiple Reflection Method in TXRF M.A. Kumakhov, Institute for Roentgen Optics, Russia F-23 Suppression of Spurious Peaks Appearing on TXRF Spectra S. Terada and K. Nishihagi, Technos Co., Ltd., Japan F-4 Thin Film Sorbents for TXRF Analysis A.P. Morovov, L.D. Danilin, V.V. Zhmailo, Yu. V. Ignat'ev, A.E. Lakhtikov, V.V. Nazarov, M.G. Vasin, V.V. Chulkov and V.N. Funin, RFNC-VNIIEF, Russia F-68 SR-TXRF of low Z-Elements - Applications and Results C. Streli, P. Wobrauschek, P. Kregsamer, H. Gatterbauer, R. Görgl, Atominstitut of the Austrian Universities, Austria, P. Pianetta, Stanford University, Stanford, CA, S. Pahlke, L. Fabry, Wacker SILTRONIC, Germany, L. Palmetshofer, University of Linz, Austria, M. Schmeling, University of Antwerp, Belgium and L. Brehm, DOW Chemical, Midland, MI XRF Instrumentation and Techniques: F-2 Wide Angle Geometry EDXRF Spectrometers with Secondary Target Mode B. Yokhin, Jordan Valley AR, Israel F-66 High Resolution X-ray Detectors based on Al/AlxOy/Al Tunnel Junctions and Superconducting Ir/Au Phase Transition Thermometers J. Höhne, M. Altmann, G. Angloher, P. Hettl, J. Jochum, T. Nüßle, S. Pfnür, M.L. Sarsa, J. Schnagl, S. Wänninger and F.v. Feilitzsch, Technical University Munich, Germany F-26 On The Energy Dependence of the Detector Efficiency of a Si-PIN Diode H. Ebel, M. Mantler, S. Saxinger, R. Svagera, B. Wernsperger, Technische Universität Wien, Austria, P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Austria and A.C. Huber, AMPTEK, Inc., Bedford, MA F-50 Chemin: A Miniaturized CCD-Based Instrument for Simultaneous X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) Analysis D.L. Bish, D.T. Vaniman, S.J. Chipera, Los Alamos National Laboratory, Los Alamos, NM, S.A. Collins, T. Elliott, Jet Propulsion Lab, Pasadena, CA and D.F. Blake, NASA Ames Research Center, Moffett Field, CA F-61 The Detection of Long Wavelength X-rays Using Synthetic Multilayer Analyzers T. Arai and T. Shoji, Rigaku Industrial Corp., Japan F-62 Ultra Soft X-ray Spectrometer for Compact Synchrotron Radiation Source J. Tsuji, K. Taniguchi, Osaka Electro-Communication University, Japan and S. Ikeda, Ritsumeikan University, Japan F-55 X-ray Energy Loss Spectrometry - A Possibility H.D. Pandey, Steel Authority of India Limited, India F-47 XEFS and EXEFS J. Kawai and K. Hayashi, Kyoto University, Japan F-51 Considerations on the Detection Limit of TEY (total electron yield) M. Ebel, H. Ebel and R. Svagera, Technische Universität Wien, Austria Applications of XRF: F-21 Analysis of Major and Minor Elements in Gold Jewelry by XRF Modified Proportional Factor Method C. Yuanpan, W. Hua and Y. Zhongping, China National Nonferrous Metals Industry Corporation, China F-3 Applications of Micro XRF for Analysis of Japanese Traditional Glass and Artifacts K. Sugihara, M. Satoh, Seiko Instruments, Inc., Japan, Y. Hayakawa, Tokyo National Research Institute of Cultural Properties, Japan, A. Saito, Science University of Tokyo, Japan and T. Sasaki, Tokyo National Museum, Japan F-22 Principles of Modified Proportional Factor Method in XRF Analysis C. Yuanpan, W. Hua and Y. Zhongping, China National Nonferrous Metals Industry Corporation, China F-36 Analysis of Metal Alloys by EDXRF, Its Accuracy and Reliability V.I. Smolniakov and I.A. Koltoun, Russian Academy of Sciences (PNPI RAS), Russia F-35 Experimental Investigations of Possibilities of High-Accuracy Analysis V.I. Smolniakov and I.A. Koltoun, Russian Academy of Sciences (PNPI RAS), Russia, I.K. Fadeeva, Nord-West Assay Office of the Russian Federation, Russia and G.I. Popovets, AAC "Minresursexpertiza" (MINEX), Russia F-24 Accuracy in Rapid, Routine Standardless WDXRF Analysis of Loose Powders R.F. Hamilton, Air Products and Chemicals, Inc., Allentown, PA F-59 Influence of Surface Roughness on the Angle Resolved Total X-ray Reflection Fluorescence of Thin Films C. Weiss, S. Taeubert, E. Zschech, AMD, Germany, T. Hossain, AMD, Austin, TX and H.-J. Ullrich, TU Dresden, Germany F-32 XRF Analysis of Fused Beads: A Unified Calibration Method for Various Dilutions and Fluxes M. Banzhaf and K. Mauser, Bruker AXS, GmbH, Germany