DXC HOMEPROCEEDINGS OF THE DXCSITEMAPSEARCHFEEDBACK FORMDXC SPONSOR

48th Annual (1999) Denver X-ray Conference™
Monday, 2 August
XRF Poster Sessions (Sunshine Peak)
(6:30 p.m. – 8:30 p.m., authors present)
The XRF Poster Session will be held in conjunction with the Bruker AXS, Inc. mixer.

Chairs: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
H. Ebel, Technische Universität Wien, Austria

Session chairs will select the three best papers for awards.

Combined XRF and XRD Instrumentation:
C-5 APPLICATIONS OF SCANNING INSTRUMENTS BY MEANS OF MICRO-XRF, XRD AND XRT

Y. Hosokawa, Horiba, Ltd., Japan
R. Wong, KevexSpectrace, Sunnyvale, CA

C-2 DATA COLLECTION STRATEGIES USING ENERGY-DISCRIMINATING CCD DETECTORS FOR SIMULTANEOUS XRD/XRF ANALYSES
S.J. Chipera, D. Bish, D. Vaniman, Los Alamos National Laboratory, Los Alamos, NM
P. Sarrazin, D. Blake, NASA Ames Research Center, Moffett Field, CA

C-1 IDENTIFICATION OF CuCl IN Si BY XRD–XRF ANALYSIS
C.-T. Li, L. Tarhay, Dow Corning Corporation, Midland, MI

C-4 ENERGY RESOLVED X-RAY DETECTION USING CHARGE-COUPLED DEVICES
A. Reyes-Mena, H.K. Pew, P. Moody, MOXTEK, Inc., Orem, UT
L.V. Knight, S. Cornaby, A. Stradling, E. Wilcox, BYU

X-ray Optics:
F-55 X-RAY FLUORESCENCE USING A FOCUSING CRYSTAL SPECTROMETER

L. Knight, Brigham Young University, Provo, UT
S. Voronov, MOXTEK, Inc., Orem, UT
A. Shevelko, P.N. Lebedev, Physical Institute of the Russian Academy of Sciences, Russia

F-54 POLYCAPILLARY X-RAY OPTICS FOR X-RAY ASTRONOMY
C.H. Russell, National Institute of Standards and Technology, Gaithersburg, MD
M. Gubarev, J. Kolodziejczak, M. Joy, NASA, Huntsville, AL
C.A. MacDonald, W.M. Gibson, University at Albany, SUNY, Albany, NY

F-19 APPLICATIONS OF POLYCAPILLARY OPTICS IN MICRO X-RAY FLUORESCENCE (MXRF) METROLOGY SYSTEM
W. Si, Ferrandino, Veeco Instruments, Inc., Ronkonkoma, NY

Environmental Applications:
F-35 INFLUENCE PHYSICAL FACTORS ON THE STRENGTH MERCURY, ARSENIC AND BISMUTH HUMATE COMPLEXES USED FOR X-RAY FLUORESCENCE ANALYSIS OF NATURAL WATER

L.P. Eksperiandova, Y.N. Makarovska, A.B. Blank, V.B. Naumenko, Institute for Single Crystals, Ukraine

D-102 X-RAY EMISSION ANALYSIS OF ATMOSPHERE PARTICLES OF THERAPEUTIC CAVES
S. Török, B. Alföldy, I. Balásházy, KFKI Atomic Energy Research Institute, Hungary
I. Balla, Astra Clinical Research Unit, Hungary

TXRF:
F-33 TXRF ANALYSIS OF THIN METALLIC FILMS

A.R. Ghatak-Roy, T.Z. Hossain, Advanced Micro Devices, Inc., Austin, TX

F-08 THE MODIFICATION OF TXRF-METHOD BY USE OF X-RAY SLINLESS COLLIMATOR
V.K. Egorov, A.P. Zuev, O.S. Kondratiev, Institute Problems Microelectronic Technology
RAS, Russia
E.V. Egorov, Moscow Engineering Physical Institute, Russia

XRF Instrumentation and Techniques:
F-37 THE INFLUENCE OF SPECIMEN SIZE AND BEAM DIVERGENCES ON QUANTITATIVE XRF BY FUNDAMENTAL PARAMETER METHODS

M. Mantler, B. Hochleitner, Vienna University of Technology, Austria

F-17 IMPROVEMENT OF THE QUANTIFICATION PROCEDURE FOR MERCURY DETERMINATION IN QUARTZ FILTER
S. Kurunczi, S. Török, KFKI Atomic Energy Research Institute, Hungary
J.W. Beal, Fairfield University, Fairfield, CT

F-46 AN IMPROVED AEROSOL GENERATION SYSTEM TO PREPARE AEROSOL LOADED FILTERS FOR XRF CALIBRATION
C. Vanhoof, N. De Brucker, Flemish Institute for Technological Research, Belgium

F-56 NON DESTRUCTIVE CHARACTERIZATION OF CELTIC-GLASSES BY EDXRF
P. Wobrauschek, G. Halmetschlager, S. Zamini, C. Jokubonis, Atominstitut der Öster-reichischen Universitäten, Austria
G. Trnka, M. Karwowski, Institut für Ur-und Frühgeschichte Universität Wien, Austria

F-53 INVESTIGATION OF ELECTRON EXCITED X-RAY SPECTRA IN DEPENDENCE ON THE ANGLE OF ELECTRON INCIDENCE
W. Dietrich, A. Dohr, C. Paul, R. Pelzer, M. Sander, M. Urschler, R. Svagera, J. Wernisch, H. Ebel, Technische Universität Wien, Austria

F-50 NEW CONCEPTS IN XRF: HIGHER PERFORMANCE AT LOWER POWER
K. Mauser, S. Uhlig, Bruker AXS GmbH, Germany

F-27 A COMPACT, LOW POWER TUBE WITH A FIELD EMISSION CATHODE
H.K. Pew, A. Reyes-Mena, A. Astle, MOXTEK, Inc., Orem, UT

F-40 CERTIFICATION OF STANDARD REFERENCE MATERIALS FOR CEMENTS
J.R. Sieber, A.F. Marlow, B.S. MacDonald, S.D. Leigh, National Institute of Standards and Technology, Gaithersburg, MD
D. Broton, Construction Technology Laboratories, Skokie, IL

F-29 TURNKEY APPLICATIONS SOLUTIONS FOR THE 21 st CENTURY: THE USE OF XRF APPLICATIONS PACKAGES TO AID IN THE SET UP AND CONTROL OF QUANTITATIVE XRF ANALYSIS
H. Kohno, M. Funahashi, Rigaku Industrial Corporation, Japan