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48th Annual (1999) Denver X-ray Conference™
Thursday, 5 August Sessions
a.m. Sessions
p.m. Sessions

Morning Sessions

Session, Thursday a.m. (Buddy’s Run)

XRD & XRF:
Session C-3
SYNCHROTRON APPLICATIONS

Organized by: J.L. Jordan-Sweet, IBM Research, Upton, NY
B. O’Connor, Curtin University of Technology, Western Australia
8:30 D-069 INTERPLANETARY DUST PARTICLES STUDIED BY SYNCHROTRON RADIATION — Invited
K. Ohsumi, Institute of Materials Structure Science, KEK, Japan
M.E. Zolensky, NASA, Johnson Space Center
9:00 D-044 X-RAY MICRODIFFRACTION STUDIES OF DISLOCATIONS IN SiGe/Si HETEROSTRUCTURES
P.M. Mooney, J.L. Jordan-Sweet, I.C. Noyan, S.K. Kaldor, IBM Research Division, T.J. Watson Research Center, Yorktown Heights, NY
9:20 D-098 DIFFRACTION ANOMALOUS FINE STRUCTURE MEASUREMENTS OF BURIED-LAYER Ga 1-x In x As
J.C. Woicik, C.E. Bouldin, B.A. Ravel, National Institute of Standards and Technology, Gaithersburg, MD
9:40 D-108 IN SITU MONITORING OF THIN FILM REACTIONS: LOWERING THE TEMPERATURE OF THE C49-C54 PHASE TRANSFORMATION OF TiSi 2 — Invited
C. Lavoie, C. Cabral, Jr., L.A. Clevenger, J.M.E. Harper, F.M. d’Heurle, J.L. Jordan-Sweet, R.A. Roy, K.L. Saenger, IBM T.J. Watson Research Center, Yorktown Heights, NY
R.W. Mann, G.L. Miles, J.S. Nakos, IBM Microelectronics, Essex Junction, VT
A. Quintero, M.R. Libera, Stevens Institute of Technology, Hoboken, NJ
10:10 Break  
10:40 C-6 APPLICATIONS OF XRF & XRD AT MICRON AND SUBMICRON SPATIAL RESOLUTION — Invited
B. Lai, Z. Cai, W. Yun, J. Maser, D. Legnini, P. Ilinski, W. Rodrigues, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
11:10 D-071 SYNCHROTRON X-RAY MICRODIFFRACTION STUDY OF EPITAXIAL OXIDE FILMS ON TEXTURED NICKEL SUBSTRATES
J.D. Budai, G.E. Ice, B.C. Larson, N. Tamura, J.-S. Chung, J.Z. Tischler, D.P. Norton, Oak Ridge National Laboratory, Oak Ridge, TN
E.L. Williams, W.P. Lowe, Howard University, Washington, DC
11:30 F-24 CHEMICAL CHARACTERIZATION OF TRACE ELEMENTS BY X-RAY FLUORESCENCE WITH 3 rd GENERATION SYNCHROTRON RADIATION
H. Eba, K. Sakurai, National Research Institute for Metals, Japan
J. Ihara, Sumitomo Electric Industries, LTD., Japan
 

Session, Thursday a.m. (Sunshine Peak)

XRD:
Session D-4
RIETVELD APPLICATIONS II

Organized by: D.L. Bish, Los Alamos National Laboratory, Los Alamos, NM
D.K. Smith, Emeritus, The Pennsylvania State University, University Park, PA
Chairs: S.T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY
G.J. McCarthy, North Dakota State University, Fargo, ND
9:00 D-067 ATTAINING 1% ACCURACY IN ABSOLUTE PHASE COMPOSITION LEVELS BY RIETVELD ANALYSIS
B. O’Connor, D. Li, H. Sitepu, Curtin University of Technology, Australia
9:20 D-030 TOWARD IMPROVED QUANTITATIVE PHASE ANALYSIS OF COAL COM-BUSTION BY-PRODUCTS THROUGH RIETVELD QXRD
D.G. Grier, M.A. Wisdom, S.L. Lerach, R.B. Peterson, J.J. Walsh, R.S.
Winburn, G.J. McCarthy, North Dakota State University, Fargo, ND
9:40 D-061 QUANTITATIVE XRD ANALYSIS OF COAL COMBUSTION BY-PRODUCTS BY THE RIETVELD METHOD III. NIST SRM FLY ASHES
R.S. Winburn, J.L. Parker, G.J. McCarthy, North Dakota State University, Fargo, ND
10:00 Break  
10:20 D-045 USING THE RIETVELD REFINEMENT METHOD AS A PHASE FILTER FOR XRD SAMPLE ANALYSIS
D.E. Simon, DES Consulting, The Woodlands, TX
R.W. Morton, Phillips Petroleum Company, Bartlesville, OK
10:40 D-089 X-RAY DIFFRACTION ANALYSIS OF PORTLAND CEMENT: PART 1 — REFERENCE INTENSITY RATIO METHOD (RIR)
W.G. McPherson, Halliburton Energy Services, Duncan, OK
D.E. Simon, DES Consulting, The Woodlands, TX
11:00 D-090 X-RAY DIFFRACTION ANALYSIS OF PORTLAND CEMENT: PART 2 — RIETVELD REFINEMENT METHOD
D.E. Simon, DES Consulting, The Woodlands, TX
W.G. Halliburton Energy Services, Duncan, OK
 

Session, Thursday a.m. (Rainbow)

XRD:
Session D-5
POLYMERS II: IN-SITU SCATTERING/DIFFRACTION CHARACTERIZATION OF POLYMERS

Organized by: B. Hsiao, State University of New York at Stony Brook, Stony Brook, NY
R. Barton, Jr., DuPont Experimental Station, Wilmington, DE
8:30 D-121 IN-SITU X-RAY CHARACTERIZATION OF STRUCTURE DEVELOPMENT DURING FIBER PROCESSING (SPINNING/DRAWING/AGING) — Invited
J.M. Schultz, University of Delaware, Newark, DE
9:00 D-023 SYNCHROTRON STUDIES OF POLYMERS AT HIGH SPATIAL AND TEMPORAL RESOLUTION — Invited
A. Mahendrasingam, C. Martin, S. Bingham, R. Bhagat, W. Fuller, Keele University, UK
D.J. Blundell, R.J. Oldman, ICI Research and Technology Centre, UK
J.L. Harvie, D.H. MacKerron, DuPont UK Ltd, United Kingdom
9:30 D-066 MORPHOLOGICAL CHANGES DURING CRYSTALLIZATION AND MELTING OF FLEXIBLE AND STIFF POLYMERS STUDIED BY SYNCHROTRON X-RAY
B.B. Sauer, DuPont Experimental Station, Wilmington, DE
B.S. Hsiao, Z-G. Wang, State University of New York at Stony Brook, Stony Brook, NY
9:50 D-105 THE NATURE OF SECONDARY CRYSTALLIZATION IN POLY(ETHYLENE TEREPHTHALATE)
B.S. Hsiao, Z.G. Wang, State University of New York at Stony Brook, Stony Brook, NY
B.B. Sauer, H. Chang, DuPont CR&D, Wilmington, DE
J.M. Schultz, University of Delaware, Newark, DE
10:10 D-074 TIME-RESOLVED X-RAY SCATTERING STUDIES ON MELTING OF POLY(TETRAMETHYLENE SUCCINATE)
H.H. Song, Hannam University, Korea
E.S. Yoo, J.S. Shin, S.S. Im, Hanyang University, Korea
10:30 Break  
10:50 D-124 CHARACTERISATION OF POLYMER CRYSTALLISATION BY X-RAY SCATTERING TECHNIQUES — Invited
J.P.A. Fairclough, A.J. Ryan, University of Sheffield, UK
N.J. Terrill, CCLRC, Daresbury Laboratory, UK
C. Booth, S.-M. Mai, University of Manchester, UK
11:20 D-060 IN-SITU SCATTERING CHARACTERIZATION OF HOMOPOLYMERS IN SUPERCRITICAL FLUIDS
Y.B. Melnichenko, G.D. Wignall, Oak Ridge National Laboratory, Oak Ridge, TN
J.D. Londono, DuPont Central Research & Development Experimental Station, Wilmington, DE
K.D. Heath, S. Salaniwal, H.D. Cochran, Oak Ridge National Laboratory and University of Tennessee, Knoxville, TN
E. Kiran, University of Maine, Orono, ME
M. Stamm, Max Planck-Institut für Polymer Forschung, Germany
11:40 D-059 SMALL ANGLE NEUTRON SCATTERING FROM BLOCK COPOLYMER MICELLES IN SUPERCRITICAL CARBON DIOXIDE
G.D. Wignall, J.D. Londono, Y.B. Melnichenko, Oak Ridge National Laboratory, Oak Ridge, TN
R. Triolo, University of Palermo, Italy
J.B. McClain, D.E. Betts, J.M. DeSimone, University of North Carolina, Chapel Hill, NC
12:00 D-106 PHASE STRUCTURES AND MORPHOLOGIES DETERMINED BY SELF-ORGANIZATION, CRYSTALLIZATION AND VITRIFICATION IN POLY(ETHYLENE OXIDE) -b-POLYSTYRENE DIBLOCK COPOLYMERS
S.Z.D. Cheng, L. Zhu, R.P. Quirk, The University of Akron, Akron, OH
B.S. Hsiao, F. Yeh, The State University of New York at Stony Brook, Stony Brook, NY
 

Session, Thursday a.m. (Skyline)

XRD:
Session D-6
DIFFRACTION STRESS ANALYSIS I

Organized by: I.C. Noyan, IBM, Yorktown Heights, NY
T. Sasaki, Kanazawa University, Japan
9:00 D-038 INVESTIGATIONS OF SOLID STATE REACTIONS AND PHASE TRANSITIONS IN CERAMIC MATERIALS USING NEUTRON SCATTERING — Invited
E. Ustundag, California Institute of Technology, Pasadena, CA
9:30 D-051 A LOOK AT RESIDUAL STRESS FROM VOID REGIONS IN INTEGRATED CIRCUITS
R.G. Tissot, Sandia National Laboratories, Albuquerque, NM
9:50 D-087 EFFECTS OF SUBSTRATE COATING WITH METAL SPRAYING ON THE PROPERTIES OF SPUTTERED TITANTUM-NITRIDE FILM
Y. Miyoshi, H. Tanabe, The University of Shiga Prefecture, Japan
T. Sameshima, T. Ejima, K. Ueda, Neos LTD., Japan
10:10 Break  
10:40 D-039 RESIDUAL STRESSES IN BULK METALLIC GLASSES
E. Ustundag, J.C. Hanan, V. Scruggs, California Institute of Technology, Pasadena, CA
B. Clausen, M.A.M. Bourke, Los Alamos National Laboratory, Los Alamos, NM
R.A. Winholtz, University of Missouri, Columbia, MO
J.W. Richardson, Argonne National Laboratory, Argonne, IL
11:00 D-095 IN-SITU NEUTRON DIFFRACTION MEASUREMENT OF THE RESIDUAL STRESS IN COMPOSITE TUBING AT ELEVATED TEMPERATURES
X.-L. Wang, C.M. Hoffmann, C.H. Hsueh, G. Sarma, C.R. Hubbard, J.R.
Keiser, Oak Ridge National Laboratory, Oak Ridge, TN
11:20 D-073 RESIDUAL STRESS ANALYSIS OF GRAPHITE/POLYMER COMPOSITES USING THE CONCEPT OF METALLIC INCLUSIONS
D. Dragoi, P. Predecki, M. Kumosa, University of Denver, Denver, CO
M. Castelli, OAI/NASA Lewis Research Center
 

Session, Thursday a.m. (Twilight)

XRF:
Session F-2
ANALYSIS OF THIN FILMS BY XRF

Organized by: R. Wilson, Rigaku/USA, Inc., Danvers, MA
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
9:00 F-59 BARIUM STRONTIUM TITANATE THIN FILM ANALYSIS — Invited
T. Remmel, Motorola, Inc., Tempe, AZ
M. Schulbert, Novellus, San Jose, CA
K. Singh, Applied Materials, Santa Clara, CA
S. Fujimura, Rigaku Industrial Corporation, Japan
S. Owens, R. Deslattes, National Institute of Standards and Technology, Gaithersburg, MD
J. Pedulla, J. Pedulla Associates, Silver Spring, MD
J. Averitt, Philips Electronic Instruments Co., Tempe, AZ
9:30 F-44 MAPPING SiO 2 THICKNESS ON Si WAFERS USING A POLYCAPILLARY-OPTIC- BASED X-RAY FLUORESCENCE ANALYSIS SYSTEM
N. Gao, R. Kerr, Q. Xiao, X-ray Optical Systems, Inc., Albany, NY
9:50 F-43 QUALITY CONTROL IN LAYER THICKNESS TESTING WITH MICRO X-RAY FLUORESCENCE SPECTROSCOPY
A. Wittkopp, M. Haschke, U. Theis, W. Scholz, Röntgenanalytik Messtechnik GmbH, Germany
B. Scruggs, EDAX Inc., NJ
10:10 Break  
10:40 F-11 COMPOSITION ANALYSIS OF BST/SRO STACKED FILMS BY GIXRF
S. Terada, H. Furukawa, H. Murakami, K. Nishihagi, TECHNOS Co., Ltd., Japan
11:00 F-04 RESEARCH IN QUANTITATIVE X-RAY FLUORESCENCE MICROANALYSIS OF PATTERNED THIN FILMS
M. Lankosz, University of Mining and Metallurgy, Poland
J.R. Sieber, J. Pedulla, National Institute of Standards and Technology, Gaithersburg, MD
11:20 F-02 APPLICATION OF MICRO-BEAM X-RAY FLUORESCENCE SPECTROMETRY FOR QUANTITATIVE ELEMENTAL MAPPING AND CHARACTERIZATION OF THE HOMOGENEITY OF ELEMENTS DISTRIBUTION IN POLYMER FOILS
D. Wegrzynek, B. Holyñska, University of Mining and Metallurgy, Poland
 

Session, Thursday a.m. (Sunset)

XRF:
Session F-3
MATHEMATICAL METHODS FOR XRF

Organized by: M. Mantler, Vienna University of Technology, Austria
J. Criss, Criss Software, Largo, MD
8:10 F-61 ED-XRF SPECTRUM EVALUATION AND QUANTITATIVE ANALYSIS USING MULTIVARIATE AND NONLINEAR TECHNIQUES — Invited
P. Van Espen, P. Lemberge, Micro and Trace Analysis Center (MiTAC), University of Antwerp, Belgium
8:40 F-45 AN UPDATE TO NRLXRF AND NBSGSC
W.T. Elam, Naval Research Laboratory, Washington, DC
J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD
9:00 F-36 VIRTUAL-XRF: A PACKAGE OF COMPUTER PROGRAMS FOR TEACHING (AND LEARNING) XRFA
M. Mantler, Vienna University of Technology, Vienna, Austria
9:20 F-30 THE EFFECT OF DIFFERENT STANDARD PREPARATION TECHNIQUES FOR NARROW RANGE X-RAY FLUORESCENCE CALIBRATION
S.H. Nettles, Construction Technology Laboratories, Inc., Skokie, IL
9:40 F-21 IMPROVEMENTS IN MXRF QUANTIFICATION USING DRIED SPOT METHODOLOGY
G.J. Havrilla, L. Colletti, Los Alamos National Laboratory, Los Alamos, NM
10:00 Break  
10:20 F-23 QUANTITATIVE ELEMENTAL IMAGING OF URANIUM ALLOY
G.J. Havrilla, C. Worley, Los Alamos National Laboratory, Los Alamos, NM
10:40 F-26 SIGNAL PROCESSING TECHNIQUES FOR PROPORTIONAL COUNTER BASED XRF MEASUREMENT SYSTEM
T. He, CMI International Corporation, Elk Grove Village, IL
11:00 F-12 THE CONCEPT OF THE INFLUENCE COEFFICIENT IN XRF ANALYSIS
R.M. Rousseau, Geological Survey of Canada, Canada
11:20 F-13 THE USE OF MONITORS FOR THE INSTRUMENTAL DRIFT CORRECTION
R.M. Rousseau, Geological Survey of Canada, Canada
11:40 F-14 SOME REFLECTIONS ON DETECTION LIMITS
R.M. Rousseau, Geological Survey of Canada, Canada
Afternoon Sessions

Session, Thursday p.m. (Sunshine Peak)

XRD:
Session D-7
HIGH RESOLUTION XRD

Organized by: P.M. Mooney, IBM T.J. Watson Research Center, Yorktown Heights, NY
K. Kavanagh, University of California–San Diego, LaJolla, CA
1:30 D-109 SPECULAR AND DIFFUSE X-RAY SCATTERING FROM THE SURFACES AND INTERFACES OF EPITAXIAL FILMS — Invited
P.F. Miceli, University of Missouri–Columbia, Columbia, MO
2:00 D-052 THERMAL EXPANSION OF GaN AND SUBSTRATES AT HIGH TEMPERATURES AND RESULTING EPITAXIAL MISFITS
C.J. Rawn, Oak Ridge National Laboratory, Oak Ridge, TN
J. Chaudhuri, Wichita State University, Wichita, KS
2:20 D-119 THE IMPACT OF MISORIENTATION AND DOPING ON THE RELAXATION OF InGaAs EPILAYERS GROWN ON InP
P.P. Larrabure, K.L. Kavanagh, H.H. Wieder, University of California–San Diego, La Jolla, CA
2:40 D-019 CHARACTERIZATION OF SEMICONDUCTOR HETEROSTRUCTURES ON SUBSTRATES HAVING HIGH DEFECT DENSITIES USING TRIPLE-AXIS X-RAY DIFFRACTION
P.M. Mooney, J.O. Chu, J.A. Ott, J.L. Jordan-Sweet, IBM T.J. Watson Research Center, Yorktown Heights, NY
3:00 Break  
3:30 D-024 HIGH RESOLUTION X-RAY MEASUREMENTS OF STRAIN-MEDIATED DIFFUSION IN CuInSe 2 — Invited
P. Fons, S. Niki, A. Yamada, H. Oyanagi, Electrotechnical Laboratory, Optoelectronics Division, Japan
4:00 D-063 CHARACTERIZATION OF THE SILICON ON INSULATOR (SOI) FILM IN BONDED WAFERS BY HIGH RESOLUTION X-RAY DIFFRACTION
G.M. Cohen, P.M. Mooney, E.C. Jones, K.K. Chan, P.M. Solomon, H-S.P. Wong, IBM T.J. Watson Research Center, Yorktown Heights, NY
4:20 D-125 OVER-RELAXATION OF Al .52 In .48 Sb GROWN ON InSb
J.A. Olsen, E.L. Hu, University of California–Santa Barbara, Santa Barbara, CA
 

Session, Thursday p.m. (Rainbow)

XRD:
Session D-8
POLYMERS III: CHARACTERIZATION OF COMPLEX MESOSTRUCTURES USING SMALL ANGLE SCATTERING

Organized by: T.J. Bunning, Air Force Research Laboratory, WPAFB, OH
R.A. Vaia, Air Force Research Laboratory, WPAFB, OH
2:00 D-123 UNIFIED ANALYSIS OF USAXS/SAXS: NANO-STRUCTURAL SCALING REGIMES — Invited
G.Beaucage, University of Cincinnati, Cincinnati, OH
2:30   PHASE BEHAVIOR OF BLOCK COPOLYMER BLENDS — Invited
R. Krishnamoorti, University of Houston, Houston, TX
3:00 D-010 SELF-ORGANIZED AND FIELD ASSISTED HIERARCHICAL STRUCTURES IN LIQUID CRYSTALLINE AND SEMICRYSTALLINE BLOCK COPOLYMERS
E.L. Thomas, C. Osuji, C. Park, C. DeRosa, M.I.T. Cambridge, MA
3:20 D-036 STATIC AND DYNAMIC SAXS/SEMS INVESTIGATIONS OF POLYMER DISPERSED LIQUID CRYSTAL FILMS
D.W. Tomlin, M.D. Schulte, T.J. Bunning, R.A. Vaia, Air Force Research Laboratory, Wright-Patterson AFB, OH
3:40 Break  
4:00 D-016 FRUSTRATED POLYMER CRYSTAL STRUCTURES — Invited B. Lotz, Institut Charles Sadron, France
4:30   INFLUENCE OF NANOSCALE INORGANIC LAYERS ON THE STRUCTURE OF SEMI-CRYSTALLINE POLYMERS
D.M. Lincoln, R.A. Vaia, Air Force Research Laboratory, Wright-Patterson AFB, OH
R. Krishnamoorti, University of Houston, Houston, TX
4:50 D-040 STUDIES OF THE EFFECTS OF STRAIN AND TEMPERATURE ON THE LAMELLAR STRUCTURE OF POLYMERS USING SMALL-ANGLE X-RAY SCATTERING
N.S. Murthy, AlliedSignal, Inc., Morristown, NJ
D.T. Grubb, Cornell University, Ithaca, NY
B. Hsiao, Z-G. Wang, State University of New York at Stony Brook, Stony Brook, NY
 

Session, Thursday p.m. (Buddy’s Run)

XRD:
Session D-9
DIFFRACTION STRESS ANALYSIS II

Organized by: I.C. Noyan, IBM, Yorktown Heights, NY
Chairs: A. Kämpfe, Universität Karlsruhe, Germany
Y. Hirose, Kanazawa University, Japan
2:00 D-015 RESIDUAL STRESS ANALYSIS, A USEFUL TOOL TO ACCESS THE FATIGUE BEHAVIOR OF STRUCTURAL COMPONENTS — Invited
B. Scholtes, University of Kassel, Germany
2:30 D-120 TWO-DIMENSIONAL DETECTORS FOR X-RAY STRESS ANALYSIS ON POLYCRYSTALLINE MATERIALS — Invited
A. Kämpfe, B. Eigenmann, E. Macherauch, D. Löhe, Universität Karlsruhe (TH), IWKI, Germany
B. Kämpfe, FHG IZM, Germany
S. Goldenbogen, ddp goldenbogen, Germany
3:00 D-085 X-RAY STUDY OF INHOMOGENITY OF SURFACE RESIDUAL STRESSES AFTER SHOT-PEENING TREATMENT
V. Monin, Saint Petersburg Technical University, Russia
R.J. Teodosio, T. Gurova, Universidade Federal do Rio de Janeiro, Brazil
J.T. Assis, Instituto Politécnico da Universidade Estadual do Rio de Janeiro, Brazil
3:20 Break  
3:40 D-042 THE USE OF PARALLEL BEAM OPTICS IN X-RAY STRESS ANALYSIS
B. Houtman, J. te Nijenhuis, A.C. Vermeulen, Philips Analytical, The Netherlands
4:00 D-096 NEW PORTABLE DIFFRACTOMETER AND RESIDUAL STRESS ANALYSIS OF THE FATIGUE BEHAVIOUR OF STRUCTURAL COMPONENTS
A.V. Lutsau, B.N. Kodess, V.K. Ovcharov, A.Y. Boyko, A.V. Gollandtsev, D.B. Matveyev, A.V. Kotelkin, A.D. Zvonko, VNIIMS, Moscow, Russia; ICS&E, Denver, CO; MTU, Moscow, Russia
4:20 D-057 OVERVIEW OF RESIDUAL STRESS MEASUREMENT WITH 2D DETECTORS
B.B He, K.L. Smith, U. Preckwinkel, Bruker Analytical X-ray Systems, Inc., Madison, WI
4:40 D-086 THE PORTABLE X-RAY APPARATUS BOTH FOR STRESS MEASUREMENTS AND PHASE ANALYSIS “IN-FIELD” CONDITIONS
V. Monin, Saint Petersburg Technical University, Russia
R.J. Teodosio, T. Gurova, Universidade Federal do Rio de Janeiro, Brazil
 

Session, Thursday p.m. (Twilight)

XRF:
Session F-4
TXRF: SEMICONDUCTOR APPLICATIONS, MICRO/CHEMICAL APPLICATIONS, INSTRUMENTATION/THIN FILMS

Organized by: P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Vienna, Austria
M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY
A. Prange, GKSS Research Center, Germany
1:30 F-60 TXRF MAPPING TO IDENTIFY VARIOUS PATTERNS OF SURFACE METAL CONTAMINATION — Invited
M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY
2:00 F-09 PRESENT STATE OF THE ART OF THE DETERMINATION OF ULTRA-TRACE CONTAMINANTS ON SILICON WAFER SURFACES USING TXRF— Invited
S. Pahlke, L. Fabry, L. Kotz, T. Ehmann, Wacker Siltronics AG, Germany
2:30 F-25 DEFINITIVE STUDY OF THE POTENTIAL INTERFERENCES TO LIGHT ELEMENT TXRF USING W-Ma EXCITATION
M. Funahashi, H. Kohno, M. Matsuo, Rigaku Industrial Corporation, Japan
R. Wilson, Rigaku/USA, Danvers, MA
2:50 Break  
3:10 F-07 EXTENDED FIELDS OF APPLICATION USING A NEW TECHNICAL CONCEPT FOR TXRF INCLUDING ANALYTICAL QUALITY ASSURANCE — Invited
A. Prange, GKSS – Research Centre, Institute for Physical and Chemical Analysis, Germany
3:40 F-18 TXRF OF LOW Z ELEMENTS — IMPROVEMENTS AND APPLICATIONS
C. Streli, P. Wobrauschek, P. Kregsamer, Atominstitut der Österreichischen Universitäten, Austria
P. Pianetta, Stanford Synchrotron Radiation Lab., Stanford, CA
S. Pahlke, L. Fabry, Wacker Siltronic, Germany
L. Palmetshofer, University of Linz, Austria
L. Brehm, DOW Chemical, Midland, MI
4:00 F-57 ANALYSIS OF NATURAL WATERS BY TXRF USING AN ELECTROCHEMICAL PRECONCENTRATION METHOD — Invited
A. Ritschel, P. Wobrauschek, Atominstitut der Österreichischen Universitäten, Austria
E. Chinea, Centro de Estudios Aplicados al Desarolla Nuclear, Cuba
4:30 F-47 THIN-LAYER ANALYSIS OF SILICON WAFERS BY TXRF — Invited R. Klockenkämper, A. von Bohlen, Institute für Spektrochemie und Angewandte Spectroskopie — ISAS, Germany
5:00 F-28 THE ANALYTICAL POSSIBILITIES OF A PORTABLE TXRF-SPECTROMETER
U. Waldschläger, INTAX GmbH, Germany