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48th Annual (1999) Denver X-ray Conference™
Tuesday, 3 August
XRD Poster Sessions (Sunshine Peak)
(6:30 p.m. – 8:30 p.m., authors present)
The XRF Poster Session will be held in conjunction with the MDI and Rigaku/USA mixer.

Chairs: P.K. Predecki, University of Denver, Denver, CO
R.L. Snyder, The Ohio State University, Columbus, OH

Session chairs will select the three best papers for awards.

High Temperature and Nonambient Applications:
D-094 HIGH TEMPERATURE NEUTRON POWDER DIFFRACTION STUDY OF Mo 5 SiB 2 and MoSi 2

C.J. Rawn, C.M. Hoffmann, C.R. Hubbard, J.H. Schneibel, Oak Ridge National Laboratory, Oak Ridge, TN

D-062 INTERNAL STANDARDS IN HIGH TEMPERATURE XRD
M. Mantler, G. Hammerschmid, Vienna University of Technology, Austria

D-009 IN-SITU STUDIES OF THE FORMATION AND STABILITY OF THE NEGATIVE THERMAL EXPANSION MATERIAL CUBIC ZrMo 2 O 8
C. Lind, A.P. Wilkinson, Georgia Institute of Technology, Atlanta, GA
E.A. Payzant, W.D. Porter, C. Rawn, Oak Ridge National Laboratory, Oak Ridge, TN

D-022 VARIABLE TEMPERATURE POWDER X-RAY DIFFRACTOMETRY USING A SCINTAG LOW-HIGH TEMPERATURE STAGE: VARIATIONS IN SAMPLE HEIGHT DUE TO THERMAL EXPANSION
C. Lind, A.P. Wilkinson, Georgia Institute of Technology, Atlanta, GA

D-093 ANALYSIS OF POSITION, PROFILE AND INTENSITY ERRORS IN A LINEAR PSD BASED HTXRD SYSTEM
E.A. Payzant, Oak Ridge National Laboratory, Oak Ridge, TN

D-021 CHARACTERIZATION OF PHASE TRANSITIONS DURING FREEZE-DRYING OF CEFAZOLIN SODIUM
A. Pyne, R. Suryanarayanan, University of Minnesota, Minneapolis, MN

Instrumentation:
D-053 PARALLEL BEAM POLYCAPILLARY OPTICS: AN ENABLING TECHNOLOGY FOR PLANETARY EXPLORATION

J.B. Ullrich, X-ray Optical Systems, Inc., Albany, NY

D-103 LOW POWER POLYCAPILLARY BASED SYSTEM FOR X-RAY PROTEIN CRYSTALLOGRAPHY
F.A. Hofmann, W.M. Gibson, C.A. MacDonald, University at Albany, SUNY, Albany, NY
D.A. Carter, J.X. Ho, J.R. Ruble, New Century Pharmaceuticals, Inc., Huntsville, AL

D-013 NARROW ROCKING CURVE MULTILAYER X-RAY MIRRORS
S. Owens, R.D. Deslattes, National Institute of Standards and Technology, Gaithersburg, MD
J. Pedulla, J. Pedulla & Associates, Silver Spring, MD

D-012 REALIZATION OF AN ASYMMETRIC MULTILAYER X-RAY MIRROR
S. Owens, R.D. Deslattes, National Institute of Standards and Technology, Gaithersburg, MD J. Pedulla, J. Pedulla & Associates, Silver Spring, MD

D-027 TUNABLE MULTILAYER-MIRROR OPTICS FOR TABLE-TOP X-RAY MICROTOMOGRAPHY
N. Gurker, R. Nell, Vienna University of Technology, Austria
W. Backfrieder, University of Vienna, Austria

D-099 NANOSTAR: A SCANNING SMALL ANGLE X-RAY SCATTERING SYSTEM
K.L. Smith, Bruker Analytical X-ray Systems, Inc., Madison, WI
H.F. Jakob, Bruker AXS GmbH, Germany

D-058 AN INNOVATION IN TRANSMISSION COEFFICIENT MEASUREMENT
B.B. He, K.L. Smith, Bruker Analytical X-ray Systems, Inc., Madison, WI

D-064 A NEW SIMULTANEOUS MEASURING INSTRUMENT FOR XRD AND DSC, AND ITS APPLICATION TO PHARMACEUTICAL ANALYSIS
A. Kishi, T. Arii, Y. Kobayashi, Y. Yamada, M. Nakayama, S. Munekawa, Rigaku Corporation, Japan

Stress Determination, Texture:
D-082 NEUTRON STRESS MEASUREMENT USING NEUTRON IMAGING PLATE

T. Sasaki, Y. Hirose, Kanazawa University, Japan
N. Minagawa, Y. Morii, N. Niimura, Japan Atomic Energy Research Institute, Japan

D-113 DEFORMATION BEHAVIOR OF TWO-PHASE COMPOSITES MATERIAL USING MICROMECHANICS MODEL
Y. Shirasuna, Seisen Jogakuin College, Japan
Y. Hirose, Kanazawa University, Japan

D-005 INFLUENCE OF REHEATING TEMPERATURE ON RESIDUAL STRESS IN NITRIDED HOT WORK DIE STEEL (H13)
K. Yatsushiro, M. Hihara, Yamanashi Industrial Technology Center, Japan
M. Kuramoto, Polytechnic University, Japan

D-078 X-RAY STRESS MEASUREMENT OF Al-Si-X P/M ALLOYS USING RAPIDLY SOLIDIFIED POWDERS
T. Saito, T. Sasaki, Y. Hirose, Kanazawa University, Japan

D-080 X-RAY STRESS MEASUREMENT FOR TITANIUM ALUMINIDE INTERMETALLIC COMPOUND
T. Kondoh, Aichi Institute of Technology, Japan

T. Goto, T. Sasaki, Y. Hirose, Kanazawa University, Japan

D-112 STUDY ON X-RAY STRESS MEASUREMENT Ni-Al SYSTEM INTERMETALLIC COMPOUND
Y. Hirose, Y. Shirasuna, T. Goto, Kanazawa University, Japan

D-084 X-RAY MEASUREMENT OF TRIAXIAL RESIDUAL MACRO- AND MICROSTRESS IN Fe-Cr STEEL/TiN SYSTEM COMPOSITE MATERIALS PREPARED BY POWDER METALLURGY
S. Takago, T. Sasaki, Y. Hirose, Kanazawa University, Japan
M. Miyano, RIKEN Corporation, Japan

D-079 THE RESEARCH OF FATIGUE FRACTURE MECHANISM OF SHOT-PEENED MATERIAL
S. Takahashi, Y. Hirose, Kanazawa University, Japan
M. Hashimoto, Sumitomo Heavy Industries, Japan

D-088 STUDY ON THE FATIGUE FRACTURE SURFACE REGION OF STEELS BY MICROBEAM SYNCHROTRON X-RAY DIFFRACTION
Y. Yoshioka, Musashi Institute of Technology, Japan
K. Akita, H. Suzuki, Tokyo Metropolitan University, Japan
T. Sasaki, Kanazawa University, Japan

D-037 DEFORMATION BEHAVIOR OF DUAL PHASE STAINLESS STEEL
H. Hirose, Kinjo College, Japan
T. Sasaki, Kanazawa University, Japan

D-114 X-RAY STRESS MEASUREMENT OF COMPOSITE PLATING (Ni-Co-P/a-Si 3 N 4 )
H. Masuda, S. Takago, T. Sasaki, Y. Hirose, Kanazawa University, Japan

D-046 MEASUREMENT AND ANALYSIS OF RESIDUAL STRESS IN IRON NITRIDE (Fe 3 N) LAYERS AS A FUNCTION OF DEPTH
T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN
R.D. England, C. Klepser, Cummins Engine Company, Columbus, IN
N. Jarayaman, University of Cincinnati, Cincinnati, OH

D-111 DEPTH PROFILING RESIDUAL STRESSES IN THIN TUNGSTEN FILMS
T. Ely, P.K. Predecki, University of Denver, Denver, CO
I.C. Noyan, IBM, Yorktown Heights, NY

D-081 SIMULTANEOUS MEASUREMENT OF PLURAL POLE FIGURES USING IMAGING PLATE
T. Goto, T. Sasaki, Kanazawa University, Japan
H. Hirose, Kinjyo College, Japan

Structure Characterization, Quantitative Phase Analysis:
D-107 X-RAY POWDER DIFFRACTION FROM BIOLOGICAL MACROMOLECULES

F.J. Rotella, N.E.C. Duke, Argonne National Laboratory, Argonne, IL
J.A. Kaduk, BP-Amoco Research, Naperville, IL

D-002 SKIP (SMALL CRYSTAL INTERFERENCE PROGRAM): AN IMPROVED ALGORITHM FOR THE COMPUTATION OF X-RAY POWDER DIFFRACTION PATTERNS
J.L. Schlenker, B.K. Peterson, Mobil Technology Company, Paulsboro, NJ

D-032 POWDER X-RAY STUDY OF Sr 2 RGaCu 2 O 7 (R=Pr, Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb AND Y) BY RIETVELD REFINEMENT TECHNIQUE
W. Wong-Ng, National Institute of Standards and Technology, Gaithersburg, MD
J.A. Kaduk, Amoco Corp., Naperville, IL
W. Greenwood, J. Dillingham, University of Maryland, Gaithersburg, MD

D-043 GLIDE TWINNING OF CHALCOPYRITE-TYPE AgGaS 2 : MORPHOLOGY AND FORMATION MECHANISM
H.E. Kitahara, National Research Institute for Metals, Japan
N. Ishizawa, Tokyo Institute of Technology, Japan
Y. Noda, Shimane University, Japan

D-083 CHARACTERIZATION OF LOCAL LAYER STRUCTURE IN A SURFACE STABILIZED FERROELECTRIC LIQUID CRYSTAL USING SYNCHROTRON X-RAY MICRO-DIFFRACTION
A. Iida, Photon Factory, Japan
T. Noma, H. Miyata, Canon Research Center, Japan

D-035 QUANTIFICATION OF FLY ASH MAGNETIC SEPARATIONS
S.L. Lerach, R.S. Winburn, G.J. McCarthy, North Dakota State University, Fargo, ND
J.D. Cathcart, U.S. Geological Survey, Denver, CO

D-097 QUANTITATIVE PHASE ANALYSIS OF RAW MATERIALS, CEMENTITIOUS MATERIALS AND MULTICOMPONENT ALLOYS
A.A. Brovkin, A.Y. Boyko, M.I. Ermolova, B.N. Kodess, I.L. Kommel, V.K.
Ovcharov, A.Y. Gadayev, VNIIMS, Russia; ICS&E, Denver, CO

D-118 USE OF XRD FOR THE QUANTITATION OF CRYSTALLINITY IN SUBSTANTIALLY AMORPHOUS PHARMACEUTICALS
R. Surana, R. Suryanarayanan, University of Minnesota, Minneapolis, MN

D-126 IMPROVING THE METALS & ALLOYS SUBFILE OF ICDD’S POWDER DIFFRACTION FILE
P.L. Wallace, Dos Arroyos Enterprises, Marina, CA
J.N. Dann, OSRAM SYLVANIA Products, Inc., Towanda, PA
H. Jones, Pratt & Whitney, West Palm Beach, FL
W.E. Mayo, Rutgers University, Piscataway, NJ
A.C. Roberts, Geological Survey of Canada, Canada

Thin Films:
D-018 HIGH-RESOLUTION X-RAY DIFFRACTION (HRXRD) AND SIMULATION STUDY OF STRAIN-COMPENSATED 1.55 mm DFB LASER STRUCTURES REGARDING HIGH NUMBERS OF QUANTUM WELLS

W. Görtz, S. Jochum, E. Kuphal, S. Hansmann, Deutsche Telekom AG, Germany

D-006 APPLICATION OF GENETIC ALGORITHM TO THE REFINEMENT OF STRUCTURE PARAMETERS FROM X-RAY REFLECTIVITY DATA: SUPERLATTICES AND THIN SOLID FILMS
A. Ulyanenkov, J. Harada, Rigaku Corporation, Japan

D-070 ULTRATHIN FILM REFERENCE SAMPLES PRODUCED BY DUAL ION BEAM ASSISTED DEPOSITION AND CHARACTERIZED BY GRAZING INCIDENCE X-RAY SCATTERING
J. Pedulla, J. Pedulla Associates, Silver Spring, MD
S.M. Owens, R.D. Deslattes, National Institute of Standards and Technology, Gaithersburg, MD

D-029 X-RAY POWDER DIFFRACTION (XRPD) AND SCANNING ELECTRON MICROSCOPY (SEM) STUDY OF ORIENTED ANTIMONY AND BISMUTH THIN FILMS DEPOSITED VIA ORGANOMETALLIC CHEMICAL VAPOR DEPOSITION (OMCVD)
M.P. Remington, Jr., D.G. Grier, R.S. Winburn, P. Boudjouk, G.J. McCarthy, North Dakota State University, Fargo, ND

D-068 GRAZING INCIDENCE X-RAY DIFFRACTION CHARACTERISATION OF CORROSION DEPOSITS INDUCED BY CARBON DIOXIDE ON MILD STEEL
S. Sembiring, B. O’Connor, D. Li, A. van Riessen, R. De Marco, Curtin University of Technology, Perth, Australia