1999 Denver X-ray Conference™ Report 48th Annual (1999) Denver X-ray Conference Steamboat Springs, Colorado, was the site of the 48th Annual Denver X-ray Conference The conference took place 2-6 August 1999 at the Sheraton Steamboat Resort. The conference hosted 370 registered attendees and 230 exhibitors who represented 43 companies. Fifty-four exhibit booths and four tabletop displays, where vendors displayed products and services relating to X-ray powder diffraction and X-ray fluorescence spectrometry, were available for perusal throughout the week. TECHNICAL PROGRAM The technical program offered two days of tutorial workshops, followed by three days of special and contributed sessions on a variety of topics. XRF and XRD poster sessions were also held on Monday and Tuesday evening week. The workshops included: XRD & XRF XRD XRF W-1 Use of the Web as a Resource Kottenhahn/Faber W-2 ISO 9000 and Standards – XRD Goldsmith W-3 How to Set Up an XRF Analytical Process Kocman/Buhrke   W-4 Two Dimensional Detectors Blanton W-5 Quantitative XRF – Standardless Methods Anzelmo W-6 Accuracy Through Optimum Calibration Jenkins/Snyder W-7 Public Domain Software Faber/Huang W-8 ISO 9000 and Standards - XRF Zaitz/Havrilla W-9 Surface Analysis Ebel/Ebel/Streli   W-10 Rietveld Analysis Young/Bish W-11 Polymer Data Analysis Murthy W-12 Computational Methods for XRF Lachance/Criss W-13 Specimen Preparation – XRF Buhrke et al The plenary session, "X-rays in Space", began this year’s technical sessions. Chaired by Randy Barton of DuPont Experimental Station, Delaware, and Vic Buhrke of The Buhrke Company, Portola Valley, California, the plenary session included the following invited presentations: THE ORIGIN OF X-RAYS IN SPACE H. Gursky, Naval Research Laboratory, Washington, DC REMOTE X-RAY DIFFRACTION AND X-RAY FLUORESCENCE ANALYSIS ON PLANETARY SURFACES D.F. Blake, NASA Ames Research Center, Moffett Field, CA THE INTERNATIONAL SPACE STATION X-RAY CRYSTALLOGRAPHY FACILITY L.J. DeLucas, University of Alabama – Birmingham, Birmingham, AL RECENT PROGRESS IN HIGH-RESOLUTION X-RAY SPECTROSCOPY OF ASTROPHYSICAL SOURCES S.M. Kahn, Columbia University, New York, NY Other technical sessions included: XRD & XRF XRD XRF C-1 Grazing Beam X-ray Analysis Snyder/Huang C-2 Topography & Absorption Analysis Stock/Ebel D-1 Applications of Diffraction to Pharmaceutical Analysis Rendle/Stephenson D-2 Rietveld Applications I Bish/Smith D-3 Polymers I: Diffraction Studies of Industrial Polymer-Based Materials Platforms Schwartz/Blanton F-1 Applications of XRF to Industrial Problems Jenkins/Hagopian-Babikian C-3 Synchrotron Applications Jordan-Sweet/O’Connor D-4 Rietveld Applications II Misture/McCarthy D-5 Polymers II: In Situ Scattering/Diffraction Characterization of Polymers Hsiao/Barton D-6 Diffraction Stress Analysis I Noyan/Sasaki F-2 Analysis of Thin Films by XRF Wilson/Havrilla F-3 Mathematical Methods for XRF Mantler/Lachance   D-7 High Resolution XRD Mooney/Kavanagh D-8 Polymers III: Characterization of Complex Mesostructures Using Small Angle Scattering Bunning/Vaia D-9 Diffraction Stress Analysis II Kämpfe/Hirose /Noyan F-4 TXRF: Semiconductor Applications, Micro/Chemical Applications, Instrumentation/Thin Films Wobrauschek/Zaitz/Prange C-4 Non-Traditional Paradigms in Data Processing Noyan/Wern C-5 X-ray Instrumentation & Other applications Berti/Broton   F-5 Applications of XRF: Environmental Problems, Low Detection Gohshi/Dando POSTER AWARD WINNERS: XRF Poster Session: FAST X-RAY FLUORESCENCE CAMERA K. Sakurai and H. Eba, National Research Institute for Metals, Japan THE INFLUENCE OF SPECIMEN SIZE AND BEAM DIVERGENCES ON QUANTITATIVE XRF BY FUNDAMENTAL PARAMETER METHODS M. Mantler and B. Hochleitner, Vienna University of Technology, Austria RECENT DEVELOPMENT OF DOUBLY – CURVED CRYSTAL FOCUSING OPTICS AND THEIR APPLICATION FOR MICRO X-RAY FLUORESCENCE Z. Chen and M. Haller, X-ray Optical Systems, Inc., Albany, NY XRD Poster Session: INTERNAL STANDARDS IN HIGH TEMPERATURE XRD M. Mantler and G. Hammerschmid, Vienna University of Technology, Austria REALIZATION OF AN ASYMMETRIC MULTILAYER X-RAY MIRROR S. Owens, R.D. Deslattes, National Institute of Standards and Technology, Gaithersburg, MD, J. Pedulla, J. Pedulla & Associates, Silver Spring, MD NEUTRON STRESS MEASUREMENT USING NEUTRON IMAGING PLATE T. Sasaki, Y. Hirose, Kanazawa University, Japan, N. Minagawa, Y. Morii and N. Niimura, Japan Atomic Energy Research Institute, Japan RIETVELD QUANTITATIVE X-RAY DIFFRACTION ANALYSIS OF LANDFILLED NORTH DAKOTA CLASS C FLY ASH R.B. Peterson, M.A. Wisdom, S.L. Lerach, R.S. Winburn, D.G. Grier, and G.J. McCarthy, North Dakota State University, Fargo, ND MEASUREMENT AND ANALYSIS OF RESIDUAL STRESS IN IRON NITRIDE (Fe3N) LAYERS AS A FUNCTION OF DEPTH T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN, R.D. England, C. Klepser, Cummins Engine Company, Columbus, IN and N. Jarayaman, University of Cincinnati, Cincinnati, OH X-RAY DIFFRACTION OF EPITAXIAL PEROVSKITE Pb(ZrxTi1-x)O3 FILMS GROWN UNDER MILD HYDROTHERMAL CONDITIONS K. Mikulka-Bolen, W.E. Mayo, R.E. Riman, Rutgers University, Piscataway, NJ, T.W. Ryan, Philips Analytical, Mahwah, NJ, L.E. McCandish, Ceramaré Inc., Highland Park, NJ AWARDS At the Plenary Session, Cam Hubbard presented the 1999 Barrett Award to Howard McMurdie of NIST, Gaithersburg, Maryland. Howard McMurdie was recognized for his contributions to the field of X-ray diffraction. SOCIAL ACTIVITIES Social activities included several evening mixers sponsored by various vendors. On Sunday, Bede Scientific, Claisse Scientifique, and SPEX CertiPrep sponsored the welcoming reception. Monday’s social was sponsored by Bruker AXS, which was held in conjunction with the XRF Poster Session. The XRD Poster Session, held on Tuesday, was held in conjunction with a reception given by Rigaku/USA and MDI. The social activities culminated with the conference dinner on Thursday evening. ICDD MEETINGS ICDD held its task group, subcommittee, and technical committee meetings during the week, in conjunction with the conference.