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48th Annual (1999) Denver X-ray Conference™
Monday, 2 August
Workshops
a.m. workshops: 9:00 a.m. – 12:00 noon
p.m. workshops: 2:00 p.m. – 5:00 p.m.

Workshops, Monday a.m.

XRD & XRF:
W-1 Use of the Web as a Resource (Twilight)

Organized by: M. Kottenhahn, ICDD, Newtown Square, PA
J. Faber, ICDD, Newtown Square, PA
Instructors: M. Kottenhahn, ICDD, Newtown Square, PA
J. Faber, ICDD, Newtown Square, PA
C.R. Hubbard, Oak Ridge National Laboratories, Oak Ridge, TN
This workshop will focus on concepts of mining the web for information using search engines, search indexes, and other resources. Getting 754,710 hits when you put “X-ray” into your search engine? Find out how to extract what you want and evaluate the found information. Receive tips to ensure that your web page is found. Program development tools that enhance internet communications in addition to an overview of X-ray related websites will be presented.

XRD:
W-2 ISO 9000 and Standards—XRD (Sunshine Peak)

Organized by: C. Goldsmith, IBM, Hopewell Junction, NY
Instructors: T.N. Blanton, Eastman Kodak Company, Rochester, NY
J.P. Cline, National Institute of Standards and Technology, Gaithersburg, MD
This workshop will cover the elements required of us, the end user in the X-ray laboratory, for certification under the ISO 9000 program. ISO 9000 requires calibration of the X-ray instruments, which in turn requires the pur-chase of certified standards for calibration. The preparation and certification of these standards will be described.

XRF:
W-3 How to Set up an XRF Analytical Process (Buddy’s Run)

Organized by: R. Jenkins, ICDD, Newtown Square, PA
Instructors: R. Jenkins, ICDD, Newtown Square, PA
V. Kocman, A.S.O. Design Inc., Canada
This workshop discusses the various aspects of the design and application of routine XRF analytical processes. The various steps include specimen preparation, selection and use of calibration standards, selection and testing of quantitative algorithms, establishment of long-term check standards.

Workshops, Monday p.m.

XRD:
W-4 Two-dimensional Detectors (Buddy’s Run)

Organized by: T.N. Blanton, Eastman Kodak Company, Rochester, NY
Instructors: T.N. Blanton, Eastman Kodak Company, Rochester, NY
U. Preckwinkel, Bruker AXS, Inc., Madison, WI
J. Ferrara, Molecular Structures Corporation, The Woodlands, TX
R. Durst, Bruker AXS, Inc., Madison, WI
This workshop covers the use of two-dimensional detectors for X-ray diffraction applications. Four detector systems will be discussed: X-ray film, image plate, multiwire, and CCD detectors. Future directions of detectors will also be presented.

XRF:
W-5 Quantitative XRF—Standardless Methods (Sunshine Peak)

Organized by: J.A. Anzelmo, Bruker AXS, Inc., Madison, WI
Instructors: J.A. Anzelmo, Bruker AXS, Inc., Madison, WI
K.M. Mauser, Bruker AXS GmbH, Germany
R. Yellepeddi, ARL, Switzerland
Two approaches have emerged as the methods of performing so-called Standardless Analysis. The two approaches are 1) scanning and 2) counting directly on peaks and backgrounds. This workshop will discuss various aspects of the two approaches such as the theory, data collection, data manipulation, calibration, sample preparation, and practical examples.