48th Annual (1999) Denver X-ray Conference™
Tuesday, 3 August
a.m. workshops: 9:00 a.m. – 12:00 noon
p.m. workshops: 2:00 p.m. – 5:00 p.m.

Workshops, Tuesday a.m.

W-6 Accuracy Through Optimum Calibration (Sunshine Peak)

Organized by: R. Jenkins, ICDD, Newtown Square, PA
R.L. Snyder, The Ohio State University, Columbus, OH
Instructors: R. Jenkins, ICDD, Newtown Square, PA
R.L. Snyder, The Ohio State University, Columbus, OH
G. Berti, Universita’ di Pisa, Italy
This workshop covers the need for correct and appropriate calibration procedures to be used in the X-ray analysis of materials. The impact of such calibration on instrument performance and data treatments will be discussed.

W-7 Public Domain Software (Rainbow)

Organized by: J. Faber, ICDD, Newtown Square, PA
T. Huang, Consultant/IBM, San Jose, CA
Description not available.

W-8 ISO 9000 and Standards—XRF (Buddy’s Run)

Organized by: G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM
M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY
Instructors: M.A. Zaitz, IBM Microelectronics, Hopewell Junction, NY
B. Benzel, Marathon Oil Company, Littleton, CO
J.R. Sieber, National Institute of Standards and Technology, Gaithersburg, MD
R.L. Watters, Jr., National Institute of Standards and Technology, Gaithersburg, MD
The workshop will involve discussion of quality issues in the laboratory in general, and specifics concerning the X-ray laboratory. The workshop will cover, using ISO 9000 in lab operations, what it means to meet ISO requirements, how they affect work processes and the impact they have on lab operations. There will also be mention of the ISO 14000 environmental standard. QA/QC operations in the X-ray lab will be discussed. A recent EPA audit will be reviewed and what happened as a result. This will address the impact on electronic data acquisition and the future of LIMS/electronic laboratory databases. A description of the national and inter-national efforts to streamline the acceptance of measurements in the global marketplace will be presented. This will involve the role of SRMs and what part ISO and Baldrige criteria play in overall national data quality.

W-9 Surface Analysis (Twilight)
Organizers & Instructors: H. Ebel, Technische Universität Wien, Austria
M.F. Ebel, Technische Universität Wien, Austria
C. Streli, Atominstitut of the Austrian Universities, Austria
This workshop will focus on the need for surface analysis and will include the definition and application of surface analysis, sampling depth and lateral resolution for surface analysis, and comparison of X-ray methods with associated techniques. Techniques discussed will include:
- X-ray excited electron emission with energy dispersive electron detection (X-ray Photoelectron Spectrometry: XPS or Electron Spectroscopy for Chemical Analysis: ESCA) - X-ray excited emission of characteristic x-radiation combined with variation of beam geometry towards total reflection (Total Reflection X-ray Fluorescence Analysis: TXRF) - X-ray excited electron emission with nondispersive electron detection (Total Electron Yield: TEY) Selected examples application will be discussed.
Workshops, Tuesday p.m.

Workshops, Tuesday p.m.

W-10 Rietveld Analysis (Buddy’s Run)

Organizers & Instructors: R.A. Young, Georgia Institute of Technology, Atlanta, GA
D.L. Bish, Los Alamos National Laboratory, Los Alamos, NM
This workshop provides recommendations on setting up a Rietveld refinement and getting it well started, work-ing in more complexity until the desired detail is obtained (or determined to be unattainable), avoiding or recov-ering from pitfalls, exploiting the correlation matrix, using constraints, using the detailed information in a Rietveld plot, evaluating the reliability of the results, and on collecting data worth using for Rietveld refinement.

W-11 Polymer Data Analysis (Twilight)
Organized by: N.S. Murthy, AlliedSignal, Inc., Research & Technology, Morristown, NJ
Instructors: N.S. Murthy, AlliedSignal, Inc., Research & Technology, Morristown, NJ
J. Blackwell, Case Western Reserve University, Cleveland, OH
B.S. Hsiao, State University of New York at Stony Brook, Stony Brook, NY
Techniques for analyzing wide- and small-angle X-ray diffraction data from polymers will be presented. Analysis of wide-angle X-ray diffraction data to determine the structure, crystallinity, crystal size, disorder, and the orientation of the crystalline and amorphous domains will be discussed. Analysis of the long-range order in semicrystalline polymers will be illustrated using the correlation function analysis of the small-angle X-ray scattering data obtained during melting and crystallization of semicrystalline polymers.

W-12 Computational Methods for XRF (Rainbow)

Organizers & Instructors: G. Lachance, Emeritus, Geological Survey of Canada, Canada
J. Criss, Criss Software, Largo, MD
A tutorial workshop that examines in detail the basic principles underlying computational methods in XRF analysis. The topic is addressed from the point of view of someone who is relatively new to this technique. The first half covers common mathematical expressions presently in use by analysts while the second half deals with methods, i.e., how these expressions are used in practice. Ample time is allocated for questions and discussion.

W-13 Specimen Preparation—XRF (Sunshine Peak)
Organized by: V.E. Buhrke, The Buhrke Company, Portola Valley, CA
Instructors: V. Kocman, A.S.O. Design Inc., Canada
N. Dando, ALCOA, Alcoa Technical Center, PA
D. Broton, Construction Technology Laboratories, Skokie, IL
Speakers’ talks will contain an eclectic mixture of practical information useful to beginners and experienced spectroscopists. Handouts will be available to attendees. There will be a discussion of the minimum specimen preparation equipment required, a discussion and sketch of a lab layout, plus a brief outline of some of the analysis procedures. Speakers’ discussions will, in some cases, also include photos of good and bad specimens. Recommendations will be made on paperwork useful to follow a sample from receipt in the lab to the report of the analysis. If time permits, there will be some discussion about ISO 9000 or A2LA.