A joint conference of the 16th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2015) and the 64th Annual Conference on Applications of X-ray Analysis (DXC).
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PROGRAM NOW AVAILABLE Thank you to our Sponsors:
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TXRF 2015 Dinner
For Registered Attendees of the TXRF 2015 Conference
Sponsored by Rigaku Corporation and Techno-X

Registered attendees of the TXRF 2015 conference are invited to attend dinner on Wednesday, August 5th at 7:30 PM in the Lake House of the Westin Hotel Property. A dinner ticket will be given to each attendee at the time of registration, and attendees will be asked to confirm their attendance at the conference registration desk. One dinner ticket per attendee. Please note, you must be registered as a TXRF attendee to receive a dinner ticket.

Attention all TXRF 2015 Students!!
The TXRF 2015 Advisory Committee has financial support available for students presenting a poster or oral presentation. To qualify for a TXRF 2015 Student Grant, please email a letter of support from your supervisor to  Denise Zulli: Zulli@icdd.com, by Monday, August 3. Grant money will be awarded to the student post-conference.

16th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2015)
A joint meeting with the 64th Annual Denver X-ray Conference (DXC) – Two meetings for the price of one!!

TXRF 2015 will officially begin on Tuesday, August 4 with a full day of workshops and then continue Wednesday through Friday morning with oral sessions and one poster session on Tuesday evening. Please don’t wait until Tuesday to join us, TXRF attendees are welcome to attend any of the workshops or sessions of the DXC program, which begin on Monday, August 3 and run until Friday, August 7th.

Scope of the Conference

The aim of TXRF 2015 Conference is to bring together experts and users of Total Reflection X-ray Fluorescence analysis to present and discuss recent advances, research results, and perspectives in this field. Besides instrumentation of TXRF and related methods (X-ray reflectometry, grazing exit XRF, grazing X-ray diffraction, total reflection XAFS, etc.), emphasis will be placed on their potential applications such as semiconductor analysis, environmental analysis, forensic science, biology, etc. As in previous TXRF conferences, the 16th conference will bring together scientists, users, instrument manufacturers, and all who are interested in the chosen subjects. Substantial discussions and exchange of knowledge and experience are encouraged.

The TXRF 2015 is a joint international conference with the 64th annual Denver X-ray Conference. The Denver X-ray Conference, which is an internationally recognized conference, brings together experts, novices, and students in covering a wide range of X-ray analysis such as X-ray fluorescence (XRF), X-ray diffraction (XRD), X-ray Imaging, and other types of analysis methods using X-rays.

International Advisory Committee
of TXRF 2015:

  • A. von Bohlen (Germany)
  • J. Boman (Sweden)
  • M. L. de Carvalho (Portugal)
  • Y. Gohshi (Japan)
  • J. Kawai (Japan)
  • R. Klockenkämper (Germany)
  • G. Pepponi (Italy)
  • P. Pianetta (USA)
  • J. H. Sanchez (Argentina)
  • C. Streli (Austria)
  • K. Taniguchi (Japan)
  • K. Tsuji (Japan)
  • R. van Grieken (Belgium)
  • M. C. Vazquez (Argentina)
  • P. Wobrauschek (Austria)
  • M. A. Zaitz (USA)
  • G. Zaray (Hungary)

 


Featuring the Plenary Session: TXRF Around the World

Register here

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