PROGRAM - (View PDF of Program) - Program at a glance - Presenter Guidelines


2015 TXRF Workshops

Tuesday Morning Workshop

9:00 am – 1:00 pm
Workshop: Introduction to TXRF Lake House

Organizers & Instructors
P. Wobrauschek, C. Streli, TU Wien, Atominstitut, Vienna, Austria, wobi@ati.ac.at, streli@ati.ac.at
M.A. Zaitz, IBM, Hopewell Junction, NY, Zaitz@ibm.com
U.E.A. Fittschen, Washington State University, Pullman, WA, ursula.fittschen@wsu.ed
H. Stosnach, Bruker Nano GmbH, Berlin, Germany, hagen.stosnach@bruker.com

TXRF is a well-established analytical method for trace element analysis with detection limits in the pg range with a large variety
of application, but specially suitable for samples where only small sample amounts are available. The quantification is easy as an
internal standard can be used and the calibration curves are linear. A general introduction to TXRF is given including instrumentation. Various fields of applications like in the semiconductor industry, environmental monitoring, medical and biochemical applications will be introduced. Special sample preparation methods will be presented. Finally Grazing Incidence XRF, a variant of TXRF measuring the fluorescence signal depending on the angle of incidence will be introduced. With GIXRF, implants in wafers and nanometer layers on wafers can be characterized. Using synchrotron radiation as excitation sources allows the further reduction of the detection limits down to the femtogram range, as well as the extension to XANES to perform speciation at trace levels. Examples will be given.

Tuesday Afternoon Workshop

2:00 pm – 4:00 pm
Workshop: TXRF Standardization Lake House

Organizer & Instructors:
K. Tsuji, Osaka City University, Osaka, Japan, tsuji@a-chem.eng.osaka-cu.ac.jp
Y. Mori, Horiba, Ltd., Kyoto, Japan, yoshihiro.mori@horiba.co
L. Borgese, University of Brescia– Via Branze, Brescia, Italy, laura.borgese@unibs.it

In order to ensure the data quality of TXRF in analyses, such as industrial and environmental, use of international standards will be helpful. In this workshop, quantification method of TXRF analysis and its standardization will be presented. Every analytical method requires reference materials for quantification. Intentionally contaminated reference materials were developed for quantitative TXRF analysis of Si wafers. International standards (ISO 14706 and ISO 17331) for TXRF analysis of Si wafer surface contamination have been published. Development history of these standard documents, including inter-laboratory cooperative studies, will be shown. The workshop will also overview the use of TXRF for elemental qualitative and quantitative analysis of biological and environmental samples and provide guidelines for their characterization. Sample preparation, experimental procedures, data analysis and interpretation will be presented. The VAMAS TWA2 A10 project and the results of the round robin test supported by IAEA on water samples will be discussed.

 

TXRF Poster Session – Tuesday Evening, 5:00 pm – 7:00 pm - Westminster Foyer

"Best Poster" awards will be chosen, including "Best Student Poster".
*Signifies Presenting Author, when noted

T6

Setup and Characterization of Synchrotron Radiation Induced Total Reflection X-ray Fluorescence X-ray
Absorption Near Edge Structures at BESSY II BAMLine

Z.P. Gotlib*, U.E.A. Fittschen, Washington State University, Pullman, WA
S. Böttger, D. Rosenberg, W. Jansen, M. Busker, Europe-University Flensburg, Flensburg, Germany
M. Menzel, University of Hamburg, Hamburg, Germany
A. Guilherme, M. Radtke, H. Riesemeier, Federal Institute for Materials Research and Testing, Berlin, Germany
P. Wobrauschek, C. Streli, Vienna University of Technology, Vienna, Austria

T8

WITHDRAWN - The Development of Grazing Incidence XAFS Method at SSRF XAFS Beamline
H. Yu, Y. Huang, X. Wei, L. Wang, SSRF, Shanghai, China

T12

Study of Establishment of a Method to Produce Gold Nanoparticles Using a Pyroelectric Crystal
S. Kusumoto, Y. Kaneko, S. Kunimura, Tokyo University of Science, Tokyo, Japan

T13

Investigation of the Possibility of Emission of Particulate Matter 2.5 (PM2.5) Originating from
Deterioration of Paint Containing TiO2 Photocatalyst

Y. Matsumoto, S. Kunimura, Tokyo University of Science, Tokyo, Japan

T18

Analysis of Impurities in Zirconium Alloys with Application in Nuclear Industry using TXRF
C.A. Tellería Narváez, G. Custo, M.L. Cerchietti, R. Servant, National Atomic Energy Commission, Buenos Aires,
Argentine

T36

WD-XRF Imaging with Polycapillary Optics under Glancing Incidence Geometry
Y. Takimoto*, M. Yamanashi, K. Tsuji, Osaka City University, Osaka, Japan
S. Kato, T. Shoji, Rigaku Corporation, Osaka, Japan

T41

Non-Destructive Compositional Characterization of Zircalloy-4 using Synchrotron Based TXRF
B. Kanrar, K. Sanyal, N.L. Misra, BARC, Mumbai, Maharashtra, India
A. Khooha, M.K. Tiwari, RRCAT, Indore, Madhya Pradesh, India

T42

Results from a New Low-Z High-Z TXRF Spectrometer
K. Sanyal, B. Kanrar, S. Dhara, N.L. Misra, BARC, Mumbai, Maharashtra, India
P. Wobrauschek, C. Streli, Atominstitut, Vienna, Austria

T44

Comparative Analysis of Airborne Particulate Matter Using TXRF and PIXE Techniques
S.M.Gaita*, J. Boman, University of Gothenburg, Gothenburg, Sweden
M. Mages, Helmholtz Centre for Environmental Research – UFZ, Magdeburg, Germany
J. Prost, C. Streli, Vienna University of Technology, Vienna, Austria
A. Wagner, Chalmers University of Technology, Gothenburg, Sweden
M.J. Gatari, University of Nairobi, Nairobi, Kenya

T46

Total Reflection X-ray Fluorescence Analysis of Indoor Aerosol Samples
J. Prost*, A. Windbichler, J. H. Sterba, P. Wobrauschek, C. Streli, Atominstitut, Vienna University of Technology,
Vienna, Austria
A. Karydas, IAEA Nuclear Science and Instrumentation Laboratory, Seibersdorf, Austria

T47

Shading in TXRF: Calculations and Experimental Validation using a Color X-ray Camera with
Subpixel Resolution

M. Menzel, A. Meyer, University of Hamburg, Hamburg, Germany
O. Scharf, S. Nowak, IFG Institute for Scientific Instruments GmbH, Berlin, Germany
M. Radtke, U. Reinholz, G. Buzanich, BAM Federal Institute for Materials Research and Testing, Berlin, Germany
P. Hischenhuber, C. Streli, Atominstitut TU Wien, Wien, Austria
V. Lopez, K. McIntosh, G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, USA
E.A.U. Fittschen*, Washington State University, Pullman, WA

T14

Elemental Pathways in Freshwater Biota - A Comparative Study on Trace Metal Concentrations in Aquatic Biota
A. Wagner, Chalmers University of Technology, Göteborg, Sweden
M. Mages*, Helmholtz Centre for Environmental Research GmbH - UFZ, Magdeburg, Germany

Post Deadline Posters

T49

Low Power Total Reflection X-ray Fluorescence Kit
J. Kawai, Kyoto University, Kyoto, Japan
S. Hiroshi, H. Nagai, Y. Nakajima, Ourstex Co., Ltd., Osaka, Japan

T51 

Comparison of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data Obtained at the XRF Beamline of the Elettra Sincrotrone Trieste and an Optimized Lab Spectrometer

D. Ingerle*, P. Wobrauschek, C. Streli, Vienna University of Technology, Vienna, Austria
G. Pepponi, Fondazione Bruno Kessler, Povo, Italy
J.J. Leani, A. Migliori, A.G. Karydas, International Atomic Energy Agency (IAEA), Seibersdorf, Austria
D.M. Eichert, W.H. Jark, Elettra - Sincrotrone Trieste, Basovizza, Trieste, Italy
J. Zecevic, F. Meirer, Utrecht University, Utrecht, Netherlands

T52

XAR-E200: The First Commercial Benchtop TXRF Spectrometer Manufactured in America                       
R.E. Ayala
, Fisichem Inc., Miami, FL, USA and Torre, Guatemala

Oral Sessions – Wednesday Morning

Plenary Session: TXRF Around the World - Standley Ballroom
Chair: Mary Ann Zaitz, IBM, Hopewell Junction, NY, USA
8:30  

Opening Remarks:
Chairman of the Denver X-ray Conference, W. Tim Elam, University of Washington APL, Seattle, WA, USA

Presentation of Awards:
2015 Barrett Award to Brian Toby, Advanced Photon Source, Argonne National Laboratory, Argonne, IL
Presented by Jim Kaduk, Poly Crystallography Inc., Naperville, IL

2015 Jenkins Award to Cev Noyan, Columbia University, New York, NY, USA
Presented by Tom Blanton, International Centre for Diffraction Data, Newtown Square, PA, USA

2015 Jerome B. Cohen Student Award
The winner will be announced at the session. Presented by Cev Noyan, Columbia University, New York, NY, USA

Plenary Session Remarks by the Session Chair, Mary Ann Zaitz, Hopewell Junction, NY, USA

9:00 T-3 Worldwide Distribution of TXRF - Its Capacity and Acceptance
Reinhold Klockenkämper, ISAS, Dortmund, Germany
9:45   Break
10:15 T-10 Total Reflection X-ray Fluorescence in Latin America
Cristina Vázquez, University of Buenos Aires, Argentinean Atomic Energy Commission, Buenos Aires, Argentina
11:00 T-33 Industrial Applications and Standardization of TXRF
Yoshihiro Mori, Horiba, Ltd., Kyoto, Japan

 

Oral Sessions – Wednesday Afternoon

Session: TXRF General Session - Meadowbrook
Chair: To be announced
1:00 T35 Invited - Development of Superconducting Series-junction Detectors
M. Kurakado*, K. Taniguchi, Techno-X, Higashi Nakajima, Osaka, Japan
1:30 T25 Invited - Recent Improvements of a Portable Total Reflection X-ray Fluorescence Spectrometer Using Weak White X-rays
S. Kunimura, Tokyo University of Science, Tokyo, Japan
2:00 T15 Table-top Technology for Multi-purpose TXRF and GIXRF Analysis
U. Waldschlaeger*, A. Gross, R. Grundman, Bruker Nano GmbH, Berlin, Germany
2:20 T26 A Vacuum TXRF Spectrometer with Sample Changer and Two Exchangeable Low Power Excitation Sources
P. Wobrauschek*, J. Prost, D. Ingerle, C. Streli, TU Wien, Vienna, Austria
2:40 T21 Comparison of Four Data Analysis Software for Combined X-ray Reflectivity and Grazing Incidence X-ray Fluorescence Measurements
B. Caby*, B. Detlefs, G. Picot, E. Nolot, CEA Leti, Grenoble, France
F. Brigidi, G. Pepponi, Fondazione Bruno Kessler, Povo, Italy
D. Ingerle, C. Streli, Atominstitut, Vienna, Austria
L. Lutterotti, D. Chateigner, Crismat-Ensicaen, Caen, France
M. Morales, Cimap, Caen, France
3:00   Break
3:30 T11 Invited- JGIXA – A Software Package for the Calculation and Fitting of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data for the Characterization of Nanometer-layers and Ultra-shallow-implants
D. Ingerle*, P. Wobrauschek, C. Streli, Atominstitut, Vienna University of Technology, Vienna, Austria
G. Pepponi, Fondazione Bruno Kessler, Povo, Italy
F. Meirer, Utrecht University, Utrecht, Netherlands
4:00 T30 Analysis of NASA Genesis Mission Samples by Total Reflection X-ray Fluorescence and Grazing Incidence X-ray Fluorescence
M. Schmeling, J. Davidson, Loyola University Chicago, Chicago, IL, USA
4:20 T39 TXRF of Low Z Elements – A Review
C. Streli*, M. Rauwolf, J. Prost, D. Ingerle, P. Wobrauschek, TU Wien, Vienna, Austria
4:40 T7 Composite PXWR Application for TXRF
E.M. Loukianchenko, N.N. Potrahov, SPbGETU "LETI", Saint Petersbourg, Russia
V.K. Egorov, E.V. Egorov, IMT RAS, Chernogolovka, Moscow District, Russia

 

Oral Sessions – Thursday Morning

Session: TXRF Environmental - Meadowbrook
Chair: To be announced
9:00 T4 Invited- Total Reflection X-ray Fluorescence as a Tool for Unveiling Solute Source in Streams During
a Rain Episode

C. Vázquez*, University of Buenos Aires, Atomic Energy Comission, Buenos Aires, Argentina
M.C. Rodríguez Castro, A. Giorgi, C. Vilches, A. Torremorell, National Council of Scientific Investigations (CONICET), National University of Luján, Buenos Aires, Argentina
9:30 T27 Invited - Total Reflection X-ray Fluorescence as a Tool in Food Production and Environment
L.M. Marcó Parra, D. Torres, B. Mendoza, Ú. Álvarez de Araya, Universidad Centroccidental Lisandro Alvarado, Barquisimeto, Venezuela
10:00 T16 A Modern Multi-Excitation Concept or How to Compete Against ICP
A. Gross, H. Stosnach, U. Waldschläger, Bruker Nano GmbH, Berlin, Germany
10:20   Break
10:50 T9 Invited- Foodstuffs Sample Preparation Strategies for Total Reflection X-ray Fluorescence Analysis
L. Borgese, R. Dalipi, F. Bilo, E. Bontempi, L.E. Depero, University of Brescia– Via Branze, Brescia, Italy
D. Eichert, ELETTRA – Sincrotrone Trieste, Basovizza, Italy
C. Zoani, ENEA - Italian National Agency for New Technologies, Casaccia, Italy
11:20 T32 TXRF Intensity of Dried Residue and Its Position on Glass Substrate
Y. Tabuchi, K. Tsuji*, Osaka City University, Osaka, Japan
11:40 T2 Metal Quantifications by TXRF in Solution with Large Matrices
T. Vander Hoogerstraete*, K. Binnemans, University of Leuven, Heverlee, Belgium
12:00 T34 TXRF of Metal Particles in used Machine Oils and Feasibility Research for Application of Principal
Component Analysis

T. Matsuno*, Y. Tabuchi, K. Tsuji, Osaka City University, Osaka, Japan

 

Oral Sessions – Thursday Afternoon

Session: TXRF Biological - Meadowbrook
Chair: To be announced

2:00 T31 TXRF Analysis of Eye Samples
M. Schmeling*, J. Arroyo, R. Dale, Loyola University Chicago, Chicago, IL, USA
B.I. Gaynes, S. Tidow-Kebritchi, Stritch School of Medicine, Loyola University Chicago, Maywood, IL, USA
2:20 T24 Issues with Arsenic Recovery in the Context of a Total Reflection X-ray Fluorescence Spectrometry-based Quantification of Biosample Digests
E. Da Silva, A. Mohammed, O. Dubova, D.V. Heyd, A. Pejović-Milić*, Ryerson University, Ontario, Canada
2:40 T17 TXRF Analysis of Plant Material after Slurry Preparation with an Optimized Calibration
H. Stosnach, Bruker Nano GmbH, Berlin, Germany
3:00 T43 Development of Pure Hydroxyapatite Bone Phantoms for the In Vivo Quantification of Metals in Bone by X-ray Fluorescence Spectrometry
E. Da Silva, D.V. Heyd, A. Pejović-Milić, Ryerson University, Ontario, Canada
3:20   Break

 

Oral Sessions – Thursday Afternoon

Session: SR-TXRF - Meadowbrook
Chair: To be announced

3:50 T40 Invited- GIXRF-XRR and TXRF-XANES Analytical Applications of a Multipurpose X-ray Spectrometry Facility at Elettra Sincrotrone Trieste
A.G. Karydas, J.J. Leani, A. Migliori, M. Bogovac, R. Padilla-Alvarez, N. Vakula, R.B. Kaiser, IAEA Laboratories, Seibersdorf, Austria
H. Sghaier, ISIMM, Monastir, Tunisia
P. Wrobel, AGH University of Science and Technology, Krakow, Poland
J. Osán, Hungarian Academy of Sciences Centre for Energy Research, Budapest, Hungary
4:20 T37 Optimisation of a Synchrotron X-ray Beam Transport System for Beam Purity and Stability at the X-ray
Fluorescence Beamline at Elettra – Sincrotrone Trieste for TXRF, GIXRF and XAS Experiments

D.M. Eichert*, A. Gambitta, W.H. Jark, Elettra - Sincrotrone Trieste, Basovizza, Trieste, Italy
L. Luehl, Elettra - Sincrotrone Trieste, Basovizza, Trieste, Italy and Technische Universität-Berlin, IOAP, Berlin, Germany
4:40 T22 Reference-free Quantification in X-ray Spectrometry of Drinking Water Samples
A. Nutsch, M. Müller, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
H. Stosnach, U. Waldschläger, A. Gross, Bruker Nano GmbH, Berlin, Germany
L. Depero, L. Borgese, Università degli Studi di Brescia, Brescia, Italy
A. Migliori, International Atomic Energy Agency, Vienna, Austria
Y.-S. Yeh, Industrial Technology Research Institute, Hsinchu, Taiwan

 

Oral Sessions – Friday Morning

Session: TXRF Semiconductor - Meadowbrook
Chair: To be announced
9:00 T38 Invited- Progress of TXRF Instruments for Semiconductor Industry
T. Yamada*, H. Kohno, M. Yamagami, K. Okuda, Rigaku Corporation, Osaka, Japan
9:30 T23 MedePy: A New Software for the Investigation of Depth-dependent Properties using X-rays
E. Nolot, B. Detlefs, G. Picot, H. Rotella, B. Caby, CEA-LETI, Grenoble, France
G. Pepponi, F. Brigidi, Fondazione Bruno Kessler, Trento, Italy
M. Müller, P. Hönicke, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Berlin, Germany
9:50   Break
10:10 T45 Invited - Analysis of EDXRF Spectra and GIXRF Measurements with the GIMPy
G. Peppponi*, F. Brigidi, Fondazione Bruno Kessler, Trento, Italy
10:40 T19 Modeling Depth Resolved XRF Data to Study Semiconductor-Oxide Thin Films Doped with Transition Metals Ions
V. Suárez*, Universidade Federal de Viçosa, Minas Gerais, Brazil & Brazilian Synchrotron Light Laboratory, Campinas, Brazil
C. Torres, Universidad Nacional de la Plata, Buenos Aires, Argentina
S.O. Ferreira, Universidade Federal de Viçosa, Minas Gerais, Brazil
C.A. Perez, Brazilian Synchrotron Light Laboratory, Campinas, Brazil
11:00 T20 Tiny Tools for (T)XRF – Thin Layers for Better Analyses
M. Krämer, R. Dietsch, T. Holz, D. Weißbach, AXO DRESDEN GmbH, Germany
B. Beckhoff, P. Hönicke, PTB, Berlin, Germany
U.E.A. Fittschen, Washington State University, Pullman, WA, USA & University of Hamburg, Hamburg, Germany
M. Menzel, University of Hamburg, Hamburg, Germany
M. Radtke, BAM, Berlin, Germany
A. von Bohlen, ISAS, Dortmund, Germany
11:20   Closing Remarks

 

 

2015 Denver X-ray Conference and TXRF 2015
3 – 7 August, Westin, Westminster, CO
Program-at-a-Glance

 

Monday Morning Workshops - 9:00 am – 12:00 Noon
  Standley I Standley II Cotton Creek Meadowbrook Lake House
XRD Basic to Advanced XRD I
(Misture/Blanton/Fawcett)
Structure Determination
from Laboratory
XRPD Data
(Kern/Madsen)
     
XRF     Basic XRF (Drews)    
Monday Afternoon Workshops - 1:30 – 4:30 pm
XRD Basic to Advanced XRD II
(Misture/Blanton/Fawcett)
Fundamentals of Neutron
Diffraction (Whitfield)
     
XRF     Energy Dispersive XRF
(Phillips)
Micro XRF (Havrilla)  
Monday Evening XRD Poster Session & Reception 5:00 – 7:00 pm. Westminster Foyer (Watkins)
           
Tuesday Morning Workshops - 9:00 am – 12:00 Noo
  Standley I Standley II Cotton Creek Meadowbrook Lake House
XRD Stress (Noyan) Quantifying Crystalline &
Amorphous Phases I
(Kern/Madsen)
     
XRF     Quantitative Analysis I
(Mantler)
Uncertainty in XRF (Kawai)  
TXRF2015         Introduction to TXRF
(Wobrauschek/Streli)
Tuesday Afternoon Workshops - 1:30 – 4:30 pm
XRD Synchrotron X-ray
Coherent Diffraction
Imaging and Ptychography
(Holt)
Quantifying Crystalline &
Amorphous Phases II
(Kern/Madsen)
     
XRF     Quantitative Analysis II
(Mantler)
Sample Preparation of XRF
(Anzelmo)
 
TXRF2015         TXRF Standardization
(Tsuji)
Tuesday Evening XRF & TXRF Poster Session & Reception 5:00 pm – 7:00 pm. Westminster Foyer (Broton/Anzelmo)
           
Wednesday Morning Plenary Session, TXRF Around The World (Zaitz).8:30 – 11:45. Standley Ballroom
Wednesday Afternoon Sessions
  Standley I Standley II Cotton Creek Meadowbrook Lake House
Special Topics New Developments in
XRD/XRF Instrumentation
(Blanton/Fawcett)
Extremely Bright: The
Future of X-ray Analysis
(Vogt/Murray)
     
XRF     Quantitative Analysis
(Brehm)
   
TXRF2015       TXRF General Session  
Wednesday Evening Vendor Sponsored Reception 5:30 pm – 7:00 pm. Exhibit Hall/Westminster Ballroom
           
Thursday Morning Sessions
  Standley I Standley II Cotton Creek Meadowbrook Lake House
XRD Stress
Analysis/Ptychography
(Watkins/Holt)
Applied Materials
(Fawcett/Blanton)
     
XRF     General XRF (Fittschen)    
TXRF2015       TXRF Environmental  
Thursday Afternoon Sessions
Special Topics Energy Materials
(Rodriguez)
General XRD (Murray)      
XRF     Environmental &
Geological (van
Grieken/Miranda)
   
TXRF2015       TXRF Biological
SR-TXRF
 
           
Friday Morning Sessions
  Standley I Standley II Cotton Creek Meadowbrook Lake House
XRD Rietveld (Antao)        
XRF   Micro XRF (Havrilla) Fusion & Industrial Apps
(Anzelmo/van der Haar)
   
TXRF2015       TXRF Semiconductor  

 

 

Two conferences for the price of one!
Click here to view DXC Program information . TXRF attendees are welcome to attend any DXC workshops and sessions.


For more information, please contact Denise Zulli

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